TWI501627B - Display unevenness detection method and device thereof - Google Patents

Display unevenness detection method and device thereof Download PDF

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Publication number
TWI501627B
TWI501627B TW101116827A TW101116827A TWI501627B TW I501627 B TWI501627 B TW I501627B TW 101116827 A TW101116827 A TW 101116827A TW 101116827 A TW101116827 A TW 101116827A TW I501627 B TWI501627 B TW I501627B
Authority
TW
Taiwan
Prior art keywords
pixel
display
unevenness
value
pixel value
Prior art date
Application number
TW101116827A
Other languages
English (en)
Chinese (zh)
Other versions
TW201338502A (zh
Inventor
Kunihiro Mizuno
Keiichi Kurasho
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW201338502A publication Critical patent/TW201338502A/zh
Application granted granted Critical
Publication of TWI501627B publication Critical patent/TWI501627B/zh

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/66—Transforming electric information into light information
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0285—Improving the quality of display appearance using tables for spatial correction of display data
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
    • G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
TW101116827A 2012-03-01 2012-05-11 Display unevenness detection method and device thereof TWI501627B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/055271 WO2013128616A1 (ja) 2012-03-01 2012-03-01 表示デバイスの表示むら検出方法及びその装置

Publications (2)

Publication Number Publication Date
TW201338502A TW201338502A (zh) 2013-09-16
TWI501627B true TWI501627B (zh) 2015-09-21

Family

ID=49081860

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101116827A TWI501627B (zh) 2012-03-01 2012-05-11 Display unevenness detection method and device thereof

Country Status (5)

Country Link
JP (1) JP5919370B2 (ko)
KR (1) KR101637408B1 (ko)
CN (1) CN104137171B (ko)
TW (1) TWI501627B (ko)
WO (1) WO2013128616A1 (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013128617A1 (ja) * 2012-03-01 2013-09-06 株式会社日本マイクロニクス 表示デバイスの表示むら検出方法及びその装置
CN105244001B (zh) * 2015-11-09 2018-01-09 深圳市华星光电技术有限公司 一种确定mura补偿值的方法以及装置
CN105628344B (zh) * 2016-01-29 2019-02-01 深圳英伦科技股份有限公司 背光模组及其透光均匀性检测系统及其led混珠搭配方法
CN106500969B (zh) * 2016-11-17 2019-07-26 深圳Tcl新技术有限公司 显示屏均匀性测试方法及显示屏均匀性测试系统
CN106448524B (zh) * 2016-12-14 2020-10-02 深圳Tcl数字技术有限公司 显示屏亮度均匀性的测试方法及装置
KR102454986B1 (ko) * 2017-05-23 2022-10-17 삼성디스플레이 주식회사 얼룩 검출 장치 및 이를 이용한 얼룩 검출 방법
CN108281120B (zh) * 2018-01-27 2020-04-10 深圳市华星光电半导体显示技术有限公司 显示面板的Mura修补方法
JP2020086419A (ja) * 2018-11-28 2020-06-04 雄二 橋本 複数の制御対象のユニフォーミティを得るための調整方法、調整システムおよびコンベア装置、並びに調整された機器。
JP2020086409A (ja) * 2018-11-30 2020-06-04 株式会社イクス ムラ補正データ生成方法及びムラ補正データ生成システム
CN109493825B (zh) * 2019-01-16 2020-11-24 合肥鑫晟光电科技有限公司 一种画面参数计算方法、装置及存储介质
CN110299114A (zh) * 2019-06-25 2019-10-01 深圳Tcl新技术有限公司 显示均匀性的判断方法、装置及存储介质
CN111652865B (zh) 2020-05-29 2022-04-08 惠州市华星光电技术有限公司 Mura检测方法、装置及可读存储介质

Citations (5)

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Publication number Priority date Publication date Assignee Title
JP2005121724A (ja) * 2003-10-14 2005-05-12 Sankyo Kk 平面型表示装置の調整方法
JP2005331929A (ja) * 2004-04-19 2005-12-02 Semiconductor Energy Lab Co Ltd 画像解析方法、画像解析プログラム、及びそれらを有する画素評価システム
TW200706950A (en) * 2005-08-03 2007-02-16 Qi-Cheng Ye Detecting method of preventing the liquid crystal molecule of the LCD screen from generating gravity mura
TW200842339A (en) * 2007-04-19 2008-11-01 Au Optronics Corp Mura detection method and system
TW201022653A (en) * 2008-12-10 2010-06-16 Ind Tech Res Inst Inspection method and system for display

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JP2005150349A (ja) 2003-11-14 2005-06-09 Tdk Corp 積層型電子部品の製造方法
JP2005165387A (ja) * 2003-11-28 2005-06-23 Seiko Epson Corp 画面のスジ欠陥検出方法及び装置並びに表示装置
US8184923B2 (en) * 2004-04-19 2012-05-22 Semiconductor Energy Laboratory Co., Ltd. Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program
JP2006135381A (ja) * 2004-11-02 2006-05-25 Olympus Corp キャリブレーション方法およびキャリブレーション装置
US20080018630A1 (en) * 2006-07-18 2008-01-24 Yusuke Fujino Liquid crystal display device, liquid crystal display and method of driving liquid crystal display device
JP4681033B2 (ja) 2008-07-31 2011-05-11 株式会社イクス 画像補正データ生成システム、画像データ生成方法及び画像補正回路
JP5026545B2 (ja) 2010-03-30 2012-09-12 シャープ株式会社 表示装置、輝度ムラ補正方法、補正データ作成装置、および補正データ作成方法
WO2013128617A1 (ja) * 2012-03-01 2013-09-06 株式会社日本マイクロニクス 表示デバイスの表示むら検出方法及びその装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005121724A (ja) * 2003-10-14 2005-05-12 Sankyo Kk 平面型表示装置の調整方法
JP2005331929A (ja) * 2004-04-19 2005-12-02 Semiconductor Energy Lab Co Ltd 画像解析方法、画像解析プログラム、及びそれらを有する画素評価システム
TW200706950A (en) * 2005-08-03 2007-02-16 Qi-Cheng Ye Detecting method of preventing the liquid crystal molecule of the LCD screen from generating gravity mura
TW200842339A (en) * 2007-04-19 2008-11-01 Au Optronics Corp Mura detection method and system
TW201022653A (en) * 2008-12-10 2010-06-16 Ind Tech Res Inst Inspection method and system for display

Also Published As

Publication number Publication date
CN104137171B (zh) 2017-03-29
TW201338502A (zh) 2013-09-16
CN104137171A (zh) 2014-11-05
KR101637408B1 (ko) 2016-07-07
WO2013128616A1 (ja) 2013-09-06
KR20140133881A (ko) 2014-11-20
JPWO2013128616A1 (ja) 2015-07-30
JP5919370B2 (ja) 2016-05-18

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