TWI500950B - Optical displacement sensor - Google Patents

Optical displacement sensor Download PDF

Info

Publication number
TWI500950B
TWI500950B TW101140266A TW101140266A TWI500950B TW I500950 B TWI500950 B TW I500950B TW 101140266 A TW101140266 A TW 101140266A TW 101140266 A TW101140266 A TW 101140266A TW I500950 B TWI500950 B TW I500950B
Authority
TW
Taiwan
Prior art keywords
light
value
light receiving
measurement
allowable range
Prior art date
Application number
TW101140266A
Other languages
Chinese (zh)
Other versions
TW201321784A (en
Inventor
Soji Ohmae
Hoshibumi Ichiyanagi
Hideyoshi Nakamura
Kenta Yamakawa
Takahiro Oikawa
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of TW201321784A publication Critical patent/TW201321784A/en
Application granted granted Critical
Publication of TWI500950B publication Critical patent/TWI500950B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06Systems determining position data of a target
    • G01S17/46Indirect determination of position data
    • G01S17/48Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves

Description

光學式位移感測器Optical displacement sensor

本發明係關於一種光學式位移感測器,其包括:一光投射部,其投射用於偵測之光;一光接收部,其接收來自一待量測之物件的反射之光,該光自該光投射部投射至該物件;及一量測處理部,其基於該光接收部之一光接收狀態而量測該待量測之物件之一位移以輸出該量測結果。The present invention relates to an optical displacement sensor comprising: a light projection portion that projects light for detecting; and a light receiving portion that receives reflected light from an object to be measured, the light Projecting from the light projection portion to the object; and a measurement processing portion measuring a displacement of the object to be measured based on a light receiving state of the light receiving portion to output the measurement result.

基於三角量測之光學式位移感測器包括:一光投射部,其包括一發光裝置,諸如,雷射二極體;及一光接收部,其包括一維或二維配置之光接收裝置。光接收部接收來自待量測之物件的反射之光,該光自該光投射部投射至該物件。接著,光接收量分佈資料之峰值的座標接著被偵測且轉換成位移以用於輸出。The optical displacement sensor based on the triangulation measurement includes: a light projection portion including a light emitting device such as a laser diode; and a light receiving portion including a light receiving device in a one-dimensional or two-dimensional configuration . The light receiving portion receives the reflected light from the object to be measured, and the light is projected from the light projecting portion to the object. Then, the coordinates of the peak of the light reception amount distribution data are then detected and converted into displacements for output.

光學式位移感測器之其他實例包括:使用飛行時間(TOF,Time of Flight)系統之感測器,該TOF系統使用自光投射至光接收之時間長度;使用相位差測距系統之感測器,該相位差測距系統使用投射之光與接收的反射之光之間的相位差;使用PN碼測距系統之感測器,其投射經受藉由PN碼進行之強度調變的光且使用其投射之光與接收之光之間的相關性計算之結果來執行量測;及類似者。Other examples of optical displacement sensors include: sensors using a Time of Flight (TOF) system that uses the length of time from light projection to light reception; sensing using a phase difference ranging system The phase difference ranging system uses a phase difference between the projected light and the received reflected light; a sensor using a PN code ranging system that projects light that undergoes intensity modulation by a PN code and The measurement is performed using the results of the correlation calculation between the projected light and the received light; and the like.

為使上述光學式位移感測器執行穩定量測,有必要頻繁調 整敏感性,以便維持某一光接收量,而與待量測之物件之反射率或其反射狀態無關。就此而言,例如,日本未審查專利公開案第2006-133051號描述基於三角量測之光學式位移感測器調整快門打開時間(曝光時間)以便使反射之光的接收量飽和、偵測光接收量資料中的飽和像素群之中心位置作為光接收量之峰值位置並將峰值位置轉換成高度資料的技術。In order for the above optical displacement sensor to perform stable measurement, it is necessary to frequently adjust The sensitivity is adjusted to maintain a certain amount of light received regardless of the reflectivity of the object to be measured or its reflection state. In this regard, for example, Japanese Unexamined Patent Publication No. 2006-133051 describes an optical displacement sensor based on triangulation to adjust a shutter open time (exposure time) to saturate the amount of reflected light and detect light. The technique of the center position of the saturated pixel group in the received amount data as the peak position of the light receiving amount and converting the peak position into the height data.

亦存在應用位移量測之上述原理以判定在預定參考距離處是否存在一物件之感測器。舉例而言,日本未審查專利公開案第2007-221491號描述藉由在至少一個方向上配置之複數個光接收裝置接收來自被光自光投射部投射之物件的反射之光、對照每一光接收裝置中的光接收量分佈之峰值位置與預定參考位置以判定物件之存在/不存在的技術。日本未審查專利公開案第2007-221491號進一步描述多個反射被判定為已當複數個峰值自光接收量分佈被偵測到時發生。There is also a method of applying the above-described principle of displacement measurement to determine whether an object is present at a predetermined reference distance. For example, Japanese Unexamined Patent Publication No. Publication No. 2007-221491 describes the use of a plurality of light receiving devices arranged in at least one direction to receive reflected light from an object projected by light from a light projecting portion, in contrast to each light. A technique of determining a peak position of a light reception amount distribution in a device and a predetermined reference position to determine the presence/absence of an object. Japanese Unexamined Patent Publication No. 2007-221491 further describes that a plurality of reflections are determined to have occurred when a plurality of peaks are detected from the light reception amount distribution.

為使上述光學式位移感測器確保量測準確性,需要僅將來自感測器之量測區域的反射之光導引至光接收部。然而,取決於感測器之使用狀態或周圍環境之狀況,來自偵測區域外之光可進入光接收部,而導致錯誤處理。此實例將參考圖6至圖8來描述。In order for the above-described optical displacement sensor to ensure measurement accuracy, it is necessary to guide only the reflected light from the measurement area of the sensor to the light receiving portion. However, depending on the state of use of the sensor or the condition of the surrounding environment, light from outside the detection area may enter the light receiving portion, resulting in erroneous processing. This example will be described with reference to FIGS. 6 to 8.

圖6說明使用基於三角量測之光學式位移感測器的應用之一實例。此應用旨在在預定高度位置處偵測板狀工件,該 等板狀工件在分別安裝於調色板20上且向下移動之狀態下配置成兩列。感測器1及1相對於各別列之偵測位置橫向地裝設。在每一列中,具有不同厚度之兩個工件W1及W2按隨機次序傳送。感測器1用以量測穿過偵測位置的物件(工件W1、工件W2、及調色板20)之邊緣表面與感測器1之間的距離,且已傳遞工件W1及W2中哪一者係基於對應於工件之量測值被獲得期間之時間長度來判定。Figure 6 illustrates an example of an application using an optical displacement sensor based on triangulation. This application is intended to detect a plate-like workpiece at a predetermined height position, which The plate-like workpieces are arranged in two columns in a state of being mounted on the palette 20 and moving downward. The sensors 1 and 1 are mounted laterally with respect to the detection positions of the respective columns. In each column, two workpieces W1 and W2 having different thicknesses are transferred in a random order. The sensor 1 is configured to measure the distance between the edge surface of the object (the workpiece W1, the workpiece W2, and the palette 20) passing through the detection position and the sensor 1, and has transferred the workpieces W1 and W2. One is determined based on the length of time during which the measured value corresponding to the workpiece is obtained.

圖7及圖8說明可在上述應用中發生的錯誤偵測之一實例。在圖7之一實例中,工件之缺少發生在右列中。因此,自右側感測器1斜向上行進之光依序在處於缺少部分上方之調色板20、鄰近列中之工件W2、及處於缺少部分下方之工件W1處反射,且在反射後之光(雜散光)進入右側感測器1。7 and 8 illustrate an example of error detection that can occur in the above applications. In one example of Figure 7, the absence of a workpiece occurs in the right column. Therefore, the light traveling obliquely upward from the right sensor 1 is sequentially reflected in the palette 20 above the missing portion, the workpiece W2 in the adjacent column, and the workpiece W1 below the missing portion, and the reflected light (Stray light) enters the right sensor 1.

在圖8之一實例中,工件W1及W2配置成一列,且具有高反射率之構件(鏡體)30被裝設於關於工件列與感測器1相對之位置處。在此實例中,缺少發生於工件W1及W2之配置中。因此,自感測器1發射且穿過工件W之缺少部分的光規則地在鏡體之表面處反射,且規則反射之光進入感測器1。In an example of FIG. 8, the workpieces W1 and W2 are arranged in a row, and a member (mirror body) 30 having a high reflectance is disposed at a position opposite to the sensor column with respect to the workpiece row. In this example, the lack of configuration occurs in the configurations of workpieces W1 and W2. Therefore, light emitted from the sensor 1 and passing through the missing portion of the workpiece W is regularly reflected at the surface of the mirror body, and the regularly reflected light enters the sensor 1.

圖7及圖8之實例說明缺少發生於工件W1及W2之配置中的情況。然而,在無缺少發生之情況下,在待量測之工件尚未到達偵測位置之狀態下,類似的雜訊光可進入感測器。 另外,可能存在在周圍區域中突然產生之光可能進入感測器之情況。另外,在偵測位置在窗口附近之情況下,在某一時區,穿過窗口進來的陽光可進入感測器。The examples of Figures 7 and 8 illustrate the absence of conditions that occur in the configuration of workpieces W1 and W2. However, in the absence of a defect, similar noise light can enter the sensor in a state where the workpiece to be measured has not yet reached the detection position. In addition, there may be cases where light suddenly generated in the surrounding area may enter the sensor. In addition, in the case where the detection position is near the window, sunlight entering through the window can enter the sensor in a certain time zone.

若雜訊光進入感測器1,則感測器1輸出對應於與待量測之物件不同的物件之距離資料。在此距離資料不指示至工件W1或工件W2之距離的情況下,故障可能不發生;然而,在雜訊光進入指示至工件W1或工件W2之距離的位置周圍之情況下,感測器1輸出對應於工件W1及W2中之一者的量測值,此可導致錯誤處理。If the noise light enters the sensor 1, the sensor 1 outputs distance data corresponding to the object different from the object to be measured. In the case where the distance data does not indicate the distance to the workpiece W1 or the workpiece W2, the failure may not occur; however, in the case where the noise light enters around the position indicating the distance to the workpiece W1 or the workpiece W2, the sensor 1 The output corresponds to the measured value of one of the workpieces W1 and W2, which may result in error handling.

日本未審查專利公開案第2007-221491號揭示類似於圖6至圖8之實例的應用。在此應用中,在複數個峰值在光接收量分佈中被觀測到之情況下,判定峰值反映多次反射,且工件之邊緣未被偵測到(見日本未審查專利公開案第2007-221491號,段落0073至0074及圖19)。然而,藉由此處理,若雜訊光進入指示至工件W1或工件W2之距離的位置周圍,而無複數個峰值之伴隨產生,則發生誤偵測。An application similar to the examples of FIGS. 6 to 8 is disclosed in Japanese Unexamined Patent Publication No. 2007-221491. In this application, in the case where a plurality of peaks are observed in the light receiving amount distribution, it is determined that the peak reflects multiple reflections, and the edge of the workpiece is not detected (see Japanese Unexamined Patent Publication No. 2007-221491 No., paragraphs 0073 to 0074 and Figure 19). However, by this processing, if the noise light enters around the position indicating the distance to the workpiece W1 or the workpiece W2 without the occurrence of a plurality of peaks, erroneous detection occurs.

在如上所述之雜訊光接收於用於量測物件之位移之目的的感測器中之情況下,可出現同樣的問題。亦即,若量測係針對雜訊光執行,則量測準確性不能得到確保。The same problem can occur in the case where the noise light as described above is received in a sensor for measuring the displacement of the object. That is, if the measurement system is performed for the noise light, the measurement accuracy cannot be ensured.

已使本發明聚焦於上述問題,且其目標在於防止歸因於進入光接收部之雜訊光而執行錯誤量測以確保量測準確性。The present invention has been made to focus on the above problems, and its object is to prevent false measurement from being performed due to noise light entering the light receiving portion to ensure measurement accuracy.

本發明適用於一種光學式感測器,其包括:一光投射部,其投射用於量測之光;一光接收部,其接收來自一待量測之物件的反射之光,該光自該光投射部投射至該物件;及一量測處理部,其基於該光接收部之一光接收狀態而量測該待量測之物件且輸出該量測之一結果。根據本發明之一個態樣的該量測處理部包括:一判定部分,其判定指示由該光接收部接收的一光接收量之一變化的一參數之一值或指示待根據該光接收量之一增加或減少而調整之敏感性的一參數之一值是否落入一預定容許範圍內;及一控制器,其執行控制以使得當該判定部分判定該待判定之參數之該值落入該容許範圍內時該量測結果被輸出,且使得當該判定部分判定該待判定之參數之該值落在該容許範圍外時該量測結果不被輸出。The present invention is applicable to an optical sensor comprising: a light projection portion that projects light for measurement; and a light receiving portion that receives reflected light from an object to be measured, the light from The light projection portion is projected to the object; and a measurement processing portion that measures the object to be measured based on a light receiving state of the light receiving portion and outputs a result of the measurement. The measurement processing section according to an aspect of the present invention includes: a determination section that determines a value indicating a change in one of the light reception amounts received by the light receiving section or indicates a value to be received according to the light reception amount Whether one of the values of one of the parameters of the sensitivity of the adjustment is increased or decreased falls within a predetermined tolerance; and a controller that performs control such that the determination portion determines that the value of the parameter to be determined falls within The measurement result is outputted within the allowable range, and the measurement result is not output when the determination portion determines that the value of the parameter to be determined falls outside the allowable range.

通常,在此類型之感測器中,敏感性係在量測之開始前調整,以使得來自待量測之物件的反射之光在適合於量測之強度下被接收,且敏感性亦在量測期間基於光接收量按需要調整。因此,如圖6所說明,在量測係藉由設定為偵測目標之標準化物件(工件W1、工件W2、及調色板20)執行之情況下,在來自物件的反射之光被適當接收之狀態期間,光接收量之大改變不大可能發生。Typically, in this type of sensor, the sensitivity is adjusted prior to the start of the measurement so that the reflected light from the object to be measured is received at an intensity suitable for the measurement, and the sensitivity is also The measurement is adjusted as needed based on the amount of light received. Therefore, as illustrated in FIG. 6, in the case where the measurement system is executed by the normalized object (workpiece W1, workpiece W2, and palette 20) set as the detection target, the reflected light from the object is properly received. During the state, a large change in the amount of light received is unlikely to occur.

另一方面,在如圖7所說明之各種位置處反射後進入感測器之雜訊光變得比來自工件W1、工件W2、或調色板20的 反射之光弱。另外,如圖8所說明的來自鏡體30的正反射之光被視為比來自工件W1、工件W2、或調色板20的反射之光強。On the other hand, the noise light entering the sensor after being reflected at various positions as illustrated in FIG. 7 becomes more than that from the workpiece W1, the workpiece W2, or the palette 20. The light of reflection is weak. In addition, the specular reflection light from the scope 30 as illustrated in FIG. 8 is considered to be stronger than the reflection from the workpiece W1, the workpiece W2, or the palette 20.

如上所述,來自感測器之量測區域的反射之光之強度與來自量測區域外的雜訊光之強度之間的大的差有可能出現。鑒於此點,在本發明中,控制被執行以使得當判定指示光接收量之變化的參數(例如,在由一維配置之光接收裝置獲得的光接收量分佈中之峰值之變化)之值或指示待根據光接收量之增加或減少而調整之敏感性的參數之值落入容許範圍內時量測結果被輸出,且使得當判定參數值落在容許範圍外時量測結果不被輸出。藉由以上方法,若雜訊光進入光接收部,則光接收量及基於光接收量而調整之敏感性之大的改變發生,藉此防止對應於雜訊光之量測資料被輸出。As described above, a large difference between the intensity of the reflected light from the measurement area of the sensor and the intensity of the noise light from outside the measurement area is likely to occur. In view of this, in the present invention, the control is performed such that when determining a parameter indicating a change in the amount of received light (for example, a change in a peak value in a light receiving amount distribution obtained by the one-dimensionally configured light receiving device) Or the value of the parameter indicating the sensitivity to be adjusted according to the increase or decrease of the light receiving amount falls within the allowable range, and the measurement result is output, and the measurement result is not output when the determined parameter value falls outside the allowable range . According to the above method, when the noise light enters the light receiving portion, a large change in the amount of light received and the sensitivity based on the amount of received light is generated, thereby preventing the measurement data corresponding to the noise light from being output.

以上感測器被組態成當(例如)判定部分判定參數值落入容許範圍內時執行量測,且輸出獲得之量測資料。或者,感測器可被組態成每當光投射及光接收被執行時執行量測,且僅當判定部分判定參數值落在容許範圍外時停止量測結果之輸出。The above sensor is configured to perform the measurement when, for example, the determination portion determines that the parameter value falls within the allowable range, and outputs the obtained measurement data. Alternatively, the sensor may be configured to perform measurement each time light projection and light reception are performed, and stop outputting the measurement result only when the determination portion determines that the parameter value falls outside the allowable range.

在該感測器之一個具體例中,該量測處理部進一步包括一敏感性調整部分,其根據由該光接收部獲取的該光接收量之該增加或減少而改變界定該光投射部及該光接收部之一操作週期的一曝光時間、該光投射部之一光發射強度、及該光 接收部之一光接收增益中之至少一者。回應於由該敏感性調整部分執行之處理,該判定部分使用在該敏感性調整部分之該處理後獲得的該曝光時間、該光投射強度及該光接收增益來計算指示待藉由該曝光時間、該光投射強度及該光接收增益調整的該敏感性之一等級的一評估值,且將該計算之評估值與該容許範圍之預定上限值及下限值比較以判定該評估值是否落入該容許範圍內。In a specific example of the sensor, the measurement processing portion further includes a sensitivity adjustment portion that changes and defines the light projection portion according to the increase or decrease of the light reception amount acquired by the light receiving portion. An exposure time of one of the operation periods of the light receiving portion, a light emission intensity of the light projection portion, and the light At least one of the light receiving gains of one of the receiving sections. In response to the processing performed by the sensitivity adjusting portion, the determining portion uses the exposure time obtained after the processing of the sensitivity adjusting portion, the light projection intensity, and the light receiving gain to calculate the indication to be used by the exposure time And an estimated value of the light projection intensity and the sensitivity of the light receiving gain adjustment, and comparing the calculated evaluation value with a predetermined upper limit value and a lower limit value of the allowable range to determine whether the evaluation value is Fall within this tolerance.

根據以上具體例,每當三個敏感性參數(曝光時間、光發射強度及光接收增益)中之至少一者被改變時,在改變後指示待藉由該等參數調整的敏感性之等級之評估值得以計算,且關於評估值是否落入容許範圍內之判定得以進行。因此,舉例而言,藉由先前計算在來自偵測區域的反射之光被接收到之狀態下關於待調整之敏感性的評估值之變化,且界定上限值及下限值以使得變化之範圍包括於容許範圍中,高度確定性地判定與雜訊光之接收一起調整的敏感性之評估值落在容許範圍外,藉此防止錯誤量測結果被輸出。According to the above specific example, whenever at least one of the three sensitivity parameters (exposure time, light emission intensity, and light receiving gain) is changed, the level of sensitivity to be adjusted by the parameters is indicated after the change. The evaluation is worth calculating, and the determination as to whether the evaluation value falls within the allowable range is made. Thus, for example, by varying the evaluation of the sensitivity of the sensitivity to be adjusted in the state in which the reflected light from the detection area is received, and defining the upper and lower limits to cause the change The range is included in the allowable range, and the evaluation value of the sensitivity adjusted with the reception of the noise light is determined to fall out of the allowable range with a high degree of certainty, thereby preventing the erroneous measurement result from being output.

在以上具體例中,該量測處理部進一步包括一設定部分,其執行以下處理:使光投射部、光接收部及調整部分重複操作以便分別使光接收量、曝光時間、光發射強度及光接收增益之值穩定的處理;使用穩定化之曝光時間、穩定化之光發射強度及穩定化之光接收增益來計算評估值之參考值的處理;及基於計算之參考值判定界定容許範圍之上限值及下限 值的處理。根據設定部分,可在量測處理前調整敏感性以便能夠獲得適合於量測之光接收量,且接著基於調整後的敏感性之評估值判定容許範圍之上限值及下限值。In the above specific example, the measurement processing section further includes a setting portion that performs a process of repeatedly operating the light projection section, the light receiving section, and the adjustment section to respectively make the light receiving amount, the exposure time, the light emission intensity, and the light a process of receiving a stable value of the gain; a process of calculating a reference value of the evaluation value using the stabilized exposure time, the stabilized light emission intensity, and the stabilized light receiving gain; and determining the allowable range based on the calculated reference value Limit and lower limit The processing of values. According to the setting portion, the sensitivity can be adjusted before the measurement processing so that the light receiving amount suitable for the measurement can be obtained, and then the upper limit value and the lower limit value of the allowable range are determined based on the estimated value of the adjusted sensitivity.

在設定部分之一個具體例中,計算之參考值乘以大於1之預定係數α,藉此容許範圍之上限值可被計算出,且參考值乘以係數α之倒數1/α,藉此容許範圍之下限值可被計算出。另外,輸入係數α之值的輸入部分可得以設置。在此情況下,可調整容許範圍直至達到不執行錯誤處理之狀態,或亦可回應於待量測之物件的改變而改變容許範圍。In a specific example of the setting section, the calculated reference value is multiplied by a predetermined coefficient α greater than 1, whereby the upper limit of the allowable range can be calculated, and the reference value is multiplied by the inverse of the coefficient α by 1/α, thereby The lower limit of the allowable range can be calculated. In addition, the input portion of the value of the input coefficient α can be set. In this case, the allowable range can be adjusted until the state in which the error processing is not performed is reached, or the allowable range can be changed in response to the change of the object to be measured.

在感測器之另一具體例中,判定部分將指示光接收量之變化的參數之值或待根據光接收量之增加或減少而調整之敏感性的參數之值與界定容許範圍之上限值及下限值比較以判定參數值是否落入容許範圍內。此具體例之感測器包括:一輸入部分,其輸入用於設定該上限值及該下限值之資料;及一設定部分,其設定基於該判定部分中之該輸入資料獲得之該上限值及該下限值。In another specific example of the sensor, the determination section sets the value of the parameter indicating the change in the amount of received light or the value of the parameter to be adjusted according to the increase or decrease in the amount of received light, and the upper limit of the allowable range. The value and the lower limit are compared to determine whether the parameter value falls within the allowable range. The sensor of this specific example includes: an input portion that inputs data for setting the upper limit value and the lower limit value; and a setting portion that is set based on the input data in the determination portion Limit and the lower limit.

待在來自待量測之物件的接收之光之接收期間產生的光接收量之變化取決於各種環境元素(諸如,待量測之物件之材料、量測之基底表面(未發生位移之表面)與感測器之間的距離)而變化,且敏感性調整之狀態對應地改變。在以上具體例中,用於界定待由判定部分使用的容許範圍之上限值及下限值可根據輸入來設定,藉此提高了感測器之方便性及多 功能性。The change in the amount of light received during reception of the received light from the object to be measured depends on various environmental elements (such as the material of the object to be measured, the surface of the substrate measured (the surface that has not been displaced) The distance from the sensor varies, and the state of the sensitivity adjustment changes correspondingly. In the above specific example, the upper limit value and the lower limit value for defining the allowable range to be used by the determination portion can be set according to the input, thereby improving the convenience of the sensor and more. Feature.

根據本發明,可防止關於光接收部的歸因於不同於來自待量測之物件的入射光之光(雜訊光)之入射的量測結果之輸出,藉此穩定地執行量測。According to the present invention, the output of the measurement result due to the incidence of the light (noise light) different from the incident light from the object to be measured can be prevented with respect to the light receiving portion, whereby the measurement is stably performed.

圖1說明本發明將被應用的光學式位移感測器之一組態。Figure 1 illustrates one configuration of an optical displacement sensor to which the present invention is to be applied.

本發明之具體例之光學式位移感測器1(下文僅被稱作「位移感測器1」或「感測器1」)包括:一光投射部101,其包括一發光裝置(雷射二極體)11;及一光接收部102,其包括一維配置之光接收裝置12(在本具體例中為CMOS)。除了發光裝置11之外,光投射部101亦包括一光投射控制電路13。除了光接收裝置12之外,光接收部102亦包括用於處理由光接收裝置12產生之影像信號的一信號處理電路14及一A/D轉換電路15。The optical displacement sensor 1 (hereinafter simply referred to as "displacement sensor 1" or "sensor 1") of the specific example of the present invention includes: a light projection portion 101 including a light-emitting device (laser) A diode 11; and a light receiving portion 102 including a one-dimensionally arranged light receiving device 12 (in this embodiment, CMOS). In addition to the light-emitting device 11, the light projecting portion 101 also includes a light projection control circuit 13. In addition to the light receiving device 12, the light receiving portion 102 also includes a signal processing circuit 14 and an A/D conversion circuit 15 for processing image signals generated by the light receiving device 12.

此外,感測器1包括一CPU 10、一記憶體16、一顯示部17、一操作部18、一I/O介面19及類似者。光投射部101及光接收部102包含於圖2所說明之感測器頭100中,且其他組件設置於稱作「放大器部」之輔助外殼(未說明)中。感測器之組態不限於此,而所有組件可設置於一個外殼中。Further, the sensor 1 includes a CPU 10, a memory 16, a display portion 17, an operation portion 18, an I/O interface 19, and the like. The light projection unit 101 and the light receiving unit 102 are included in the sensor head 100 illustrated in Fig. 2, and other components are provided in an auxiliary casing (not illustrated) called an "amplifier unit". The configuration of the sensor is not limited thereto, and all components may be disposed in one housing.

CPU 10根據儲存於記憶體16中之程式執行量測處理及關於敏感性調整之處理。量測之結果顯示於顯示部17上,以及經由I/O介面19輸出至外部裝置。操作部18用於在偵測 處理前進行各種設定。The CPU 10 performs measurement processing and processing regarding sensitivity adjustment based on the program stored in the memory 16. The result of the measurement is displayed on the display unit 17, and is output to the external device via the I/O interface 19. The operation unit 18 is configured to detect Make various settings before processing.

圖2例示性地說明感測器頭100之一組態及量測處理之原理。FIG. 2 exemplarily illustrates the principle of one configuration and measurement processing of the sensor head 100.

在此實例中之感測器頭100經設置以使得發光裝置11之光軸被設定至位於工件W之路徑L上的偵測位置。在待上下移動之工件被量測之情況下,感測器頭100可相對於工件路徑橫向地裝設(如在圖6所說明),以便量測工件之邊緣表面與感測器頭100之間的距離。The sensor head 100 in this example is arranged such that the optical axis of the illumination device 11 is set to a detection position on the path L of the workpiece W. In the case where the workpiece to be moved up and down is measured, the sensor head 100 can be laterally mounted relative to the workpiece path (as illustrated in FIG. 6) to measure the edge surface of the workpiece and the sensor head 100. The distance between them.

自發光裝置11發射之雷射光穿過光投射透鏡111,在待偵測之物件處反射,且經由光接收透鏡122進入光接收裝置12。因此,峰值出現於由一維反射之光影像(其由光接收裝置12產生)指示之光接收量分佈中對應於反射之光之入射位置的位置處。峰值位置取決於反射雷射光的物件之表面之高度而變化。The laser light emitted from the light-emitting device 11 passes through the light-projecting lens 111, is reflected at the object to be detected, and enters the light-receiving device 12 via the light-receiving lens 122. Therefore, the peak appears at a position corresponding to the incident position of the reflected light in the light receiving amount distribution indicated by the one-dimensional reflected light image (which is generated by the light receiving device 12). The peak position varies depending on the height of the surface of the object that reflects the laser light.

基於以上原理,CPU 10藉由恆定間隔循環移動光投射部101及光接收部102,量測在週期內即時出現於由光接收部102產生之光接收分佈型樣中的最大峰值之形心,且使用在記憶體16中暫存之轉換表將座標轉換成距離資料。另外,每當光被投射以及光被接收時,CPU 10根據光接收量之最大峰值之增加或減少調整敏感性,以便按穩定方式執行量測。Based on the above principle, the CPU 10 cyclically moves the light projecting portion 101 and the light receiving portion 102 at a constant interval, and measures the centroid of the maximum peak which appears in the light receiving distribution pattern generated by the light receiving portion 102 in a period, The coordinates are converted into distance data using a conversion table temporarily stored in the memory 16. In addition, each time the light is projected and the light is received, the CPU 10 adjusts the sensitivity in accordance with the increase or decrease of the maximum peak value of the light receiving amount to perform the measurement in a stable manner.

自最大峰值之形心之座標轉換的距離資料表示將來自光 投射部之雷射光朝向形心位置反射的物件與感測器頭100之間的距離,且光接收裝置12中之每一者之座標與距離資料之間的關係被暫存於轉換表中。注意,最大峰值之形心之座標可不僅被轉換成距離資料,且亦可被轉換成表示反射雷射光的物件之高度之資料。Distance data from the coordinates of the centroid of the largest peak will be from the light The distance between the object reflected by the projection portion toward the centroid position and the sensor head 100, and the relationship between the coordinates of each of the light receiving devices 12 and the distance data is temporarily stored in the conversion table. Note that the coordinates of the centroid of the largest peak can be converted not only into distance data, but also into data representing the height of the object that reflects the laser light.

以上量測處理使進行工件W不存在於環境區域之狀態與工件W存在於其中之狀態之間的區別成為可能。另外,在待量測之工件W具有如在圖2之實例中所說明之梯級的情況下,可偵測構成該梯級的兩個表面之高度差。The above measurement processing makes it possible to distinguish between the state in which the workpiece W does not exist in the environmental region and the state in which the workpiece W exists. Further, in the case where the workpiece W to be measured has a step as illustrated in the example of Fig. 2, the difference in height between the two surfaces constituting the step can be detected.

然而,出現於光接收量分佈中之所有峰值未必由來自量測區域的反射之光產生,而可存在峰值係歸因於在周圍區域中產生的雜訊光之入射而產生之情況。However, all of the peaks appearing in the light receiving amount distribution are not necessarily generated by the reflected light from the measuring region, but there may be a case where the peak is due to the incidence of the noise light generated in the surrounding region.

鑒於以上內容,在本具體例中,在光接收量型樣中之峰值位置經偵測以用於量測前,指示待基於峰值調整之敏感性的評估值得以計算。當評估值落入預定容許範圍內時,量測處理被執行以輸出距離資料。另一方面,當評估值落入容許範圍外時,距離資料未被輸出,而是錯誤輸出得以進行。In view of the above, in this specific example, before the peak position in the light receiving amount pattern is detected for measurement, the evaluation value indicating the sensitivity based on the peak adjustment is calculated. When the evaluation value falls within a predetermined allowable range, the measurement process is performed to output the distance data. On the other hand, when the evaluation value falls outside the allowable range, the distance data is not output, but the error output is performed.

以下描述在本具體例中執行之敏感性調整。The sensitivity adjustment performed in this specific example is described below.

在本具體例中,三個參數(曝光時間、待投射的雷射光之強度(下文被稱作「光投射強度」)及光接收量之增益(下文被稱作「光接收增益」))被調整以調整敏感性,以使得光接收量展現靠近預定目標值之值。此外,在量測開始前,在工件 W裝設於量測區域中之狀態下,光投射及光接收被重複以調整每一敏感性參數,以使得基於來自工件W的反射之光的光接收量之峰值展現足夠強度。此調整係在稍後待描述之「調諧處理」中執行。In this specific example, three parameters (exposure time, intensity of laser light to be projected (hereinafter referred to as "light projection intensity"), and gain of light reception amount (hereinafter referred to as "light receiving gain") are The adjustment is made to adjust the sensitivity such that the amount of light received exhibits a value close to a predetermined target value. In addition, before the measurement starts, in the workpiece In a state where W is mounted in the measurement area, light projection and light reception are repeated to adjust each sensitivity parameter so that the peak of the light reception amount based on the reflected light from the workpiece W exhibits sufficient intensity. This adjustment is performed in the "tuning process" to be described later.

在調諧處理後,甚至在量測處理開始後,敏感性參數取決於每次光接收量分佈之最大峰值來調整。After the tuning process, even after the start of the measurement process, the sensitivity parameter is adjusted depending on the maximum peak value of each light reception amount distribution.

在本具體例中,使光投射部101之光投射週期及光接收部102之光接收週期相互重合,且將執行光投射及光接收的週期之長度定義為曝光時間。然而,不需要始終使兩個週期相互重合。舉例而言,光投射週期可開始得比光接收週期早,且光接收週期可終止得比光投射週期晚。在此情況下,自光投射週期之開始至光接收週期之終止的時間之長度被定義為曝光時間。In this specific example, the light projection period of the light projection unit 101 and the light reception period of the light receiving unit 102 are overlapped with each other, and the length of the period in which light projection and light reception are performed is defined as the exposure time. However, it is not necessary to always make the two cycles coincide with each other. For example, the light projection period may begin earlier than the light reception period, and the light reception period may terminate later than the light projection period. In this case, the length from the start of the light projection period to the end of the light receiving period is defined as the exposure time.

在調整光投射強度過程中,光投射強度自最大值1開始按預定比率逐步減小。在調整光接收增益過程中,光接收增益自最小值1開始按預定比率逐步增大。在本具體例中,調整控制資料由針對光投射強度及光接收增益兩者之放大率表示。In the process of adjusting the light projection intensity, the light projection intensity is gradually decreased from the maximum value 1 by a predetermined ratio. In the process of adjusting the light receiving gain, the light receiving gain is gradually increased from the minimum value 1 by a predetermined ratio. In this specific example, the adjustment control data is represented by a magnification ratio for both the light projection intensity and the light reception gain.

原則上,敏感性調整係基於曝光時間之調整來執行。特定言之,當光接收量分佈中之最大光接收量減小時,曝光時間根據其減小速率而增加,且當最大光接收量增大時,曝光時間根據其增大速率而減少。然而,曝光時間需要在自光投射 /光接收所需之最小時間長度至對應於處理之預期用途的最大時間長度之範圍內調整。下文,調整範圍之上限被稱作「最大曝光時間」,且其下限被稱作「最小曝光時間」。在本具體例中,在即使曝光時間被設定至最小曝光時間而最大光接收量亦飽和之情況下,光投射強度或光接收增益減小,且在即使曝光時間被設定至最大曝光時間而最大光接收量亦不展現足夠強度之情況下,光投射強度或光接收增益增大。In principle, sensitivity adjustments are performed based on adjustments in exposure time. Specifically, when the maximum light receiving amount in the light receiving amount distribution is decreased, the exposure time is increased according to the decreasing rate thereof, and when the maximum light receiving amount is increased, the exposure time is decreased according to the increasing rate thereof. However, the exposure time needs to be projected from the light / Minimum time required for light reception to be adjusted within the range of the maximum length of time corresponding to the intended use of the process. Hereinafter, the upper limit of the adjustment range is referred to as "maximum exposure time", and the lower limit is referred to as "minimum exposure time". In this specific example, the light projection intensity or the light reception gain is reduced even if the exposure time is set to the minimum exposure time and the maximum light reception amount is saturated, and is maximized even if the exposure time is set to the maximum exposure time In the case where the amount of light received does not exhibit sufficient intensity, the light projection intensity or the light receiving gain increases.

圖3說明待執行以便導出用於敏感性調整之三個參數的處理之程序。此導出處理被整合為如圖4所說明之偵測處理之部分,且被反覆執行。在本具體例中,敏感性參數基於在當前處理循環中偵測到之最大光接收量P(t)與預定光接收量目標值之間的比率來調整,且調整之結果被應用至接著的第二個偵測處理循環。Figure 3 illustrates the procedure to be performed in order to derive the processing of the three parameters for sensitivity adjustment. This derivation process is integrated into the portion of the detection process as illustrated in FIG. 4 and is executed repeatedly. In this specific example, the sensitivity parameter is adjusted based on a ratio between the maximum light receiving amount P(t) detected in the current processing cycle and the predetermined light receiving amount target value, and the result of the adjustment is applied to the subsequent The second detection processing loop.

參數導出處理將參考圖3之流程圖來描述,其中ST為曝光時間,D為光投射強度,且G為光接收增益。待應用至當前處理循環的各別敏感性參數之值(在倒數第二個處理循環中計算之值)被定義為ST(t)、D(t)及G(t),且其待應用至接著的第二個處理循環的值被定義為ST(t+2)、D(t+2)、及G(t+2)。The parameter derivation process will be described with reference to the flowchart of FIG. 3, where ST is the exposure time, D is the light projection intensity, and G is the light reception gain. The values of the respective sensitivity parameters to be applied to the current processing loop (the values calculated in the penultimate processing loop) are defined as ST(t), D(t), and G(t), and are to be applied to The values of the next second processing loop are defined as ST(t+2), D(t+2), and G(t+2).

在步驟S101中,CPU 10將應用至當前處理循環之曝光時間ST(t)乘以藉由將光接收量目標值P0除以當前最大光接收量P(t)而獲得之值P0/P(t)以計算接著的第二個循環之曝 光時間ST(t+2)。In step S101, the CPU 10 multiplies the exposure time ST(t) applied to the current processing cycle by the value P0/P obtained by dividing the light reception amount target value P0 by the current maximum light reception amount P(t) ( t) to calculate the exposure of the second cycle Light time ST(t+2).

隨後,CPU 10將因此計算之曝光時間ST(t+2)與以上提到之最小曝光時間及最大曝光時間比較。當ST(t+2)落入最小曝光時間與最大曝光時間之間的範圍內(在兩個步驟S102及S103中皆為「否」)時,CPU 10判定ST(t+2)之值,且分別在接著的第二個循環之光投射強度D(t+2)及接著的第二個循環之光接收增益G(t+2)中設定D(t)及G(t)(步驟S108)。Subsequently, the CPU 10 compares the thus calculated exposure time ST(t+2) with the above-mentioned minimum exposure time and maximum exposure time. When ST(t+2) falls within the range between the minimum exposure time and the maximum exposure time ("NO" in both steps S102 and S103), the CPU 10 determines the value of ST(t+2), And setting D(t) and G(t) in the light projection intensity D(t+2) of the second cycle and the subsequent light receiving gain G(t+2) of the second cycle (step S108). ).

亦即,曝光時間根據峰值光接收量P(t)之百分比改變而調整,同時光投射強度或光接收增益之值被設定至與倒數第二個循環之值相同的值。That is, the exposure time is adjusted in accordance with the percentage change of the peak light receiving amount P(t), and the value of the light projection intensity or the light receiving gain is set to the same value as the value of the penultimate cycle.

另一方面,當曝光時間ST(t+2)小於最小曝光時間(在步驟S102中為「是」),則CPU 10將ST(t+2)之值改變至最小曝光時間(步驟S104)。另外,CPU 10根據在關於最小曝光時間之改變前ST(t+2)之偏差度,將光投射強度D(t+2)及光接收增益G(t+2)設定至比其當前值低的放大率(步驟S105)。On the other hand, when the exposure time ST(t+2) is smaller than the minimum exposure time (YES in step S102), the CPU 10 changes the value of ST(t+2) to the minimum exposure time (step S104). Further, the CPU 10 sets the light projection intensity D(t+2) and the light reception gain G(t+2) to be lower than its current value according to the degree of deviation of ST(t+2) before the change with respect to the minimum exposure time. The magnification (step S105).

當曝光時間ST(t+2)大於最大曝光時間(在步驟S102中為「否」且在步驟S103中為「是」),則CPU 10將ST(t+2)之值改變至最大曝光時間(步驟S106)。另外,CPU 10根據在關於最大曝光時間之改變前ST(t+2)之偏差度,將光投射光強度D(f+2)及光接收增益G(t+2)設定至比其當前 值高的放大率(步驟S107)。When the exposure time ST(t+2) is greater than the maximum exposure time (NO in step S102 and YES in step S103), the CPU 10 changes the value of ST(t+2) to the maximum exposure time. (Step S106). In addition, the CPU 10 sets the light projection light intensity D(f+2) and the light reception gain G(t+2) to be higher than its current value according to the degree of deviation of ST(t+2) before the change with respect to the maximum exposure time. The magnification of the value is high (step S107).

根據以上處理,當最大光接收量P(t)相當大地增加時,曝光時間ST(t+2)減小至最小曝光時間,且光投射強度及光接收增益之值減小。另一方面,當最大光接收量P(t)相當大地減少時,曝光時間ST(t+2)增大至最大曝光時間,且光投射強度及光接收增益之值增大。在任一情況下,當具有與P(t)相同之強度之雷射光已在兩個循環後被接收到時,敏感性被調整,以使得在彼時之光接收量變為目標值P0。According to the above processing, when the maximum light receiving amount P(t) is considerably increased, the exposure time ST(t+2) is reduced to the minimum exposure time, and the values of the light projection intensity and the light receiving gain are decreased. On the other hand, when the maximum light receiving amount P(t) is considerably reduced, the exposure time ST(t+2) is increased to the maximum exposure time, and the values of the light projection intensity and the light receiving gain are increased. In either case, when the laser light having the same intensity as P(t) has been received after two cycles, the sensitivity is adjusted so that the light receiving amount at that time becomes the target value P0.

最大光接收量P(t)之增加或減少速率愈大,光投射強度及光接收增益中之每一者的放大率之變化變得愈大。The larger the increase or decrease rate of the maximum light receiving amount P(t), the larger the change in the magnification of each of the light projection intensity and the light receiving gain becomes.

以下參考圖4描述量測處理之一個循環之程序。The procedure of one cycle of the measurement process will be described below with reference to FIG.

在步驟S1中,CPU 10自記憶體16讀出待應用至當前循環之敏感性參數ST(t)、D(t)、及G(t),且使光投射部101與光接收部102以藉由此等參數而調整之敏感性來操作(步驟S1及S2)。In step S1, the CPU 10 reads out the sensitivity parameters ST(t), D(t), and G(t) to be applied to the current cycle from the memory 16, and causes the light projecting portion 101 and the light receiving portion 102 to The sensitivity is adjusted by the adjustment of such parameters (steps S1 and S2).

隨後,CPU 10將由光接收裝置12產生的反射之光影像輸入至其,且自由反射之光影像指示之光接收量分佈偵測具有大於預定值之振幅(微小振幅)(步驟S3)。在偵測到峰值後(在步驟S4中為「是」),CPU 10獲取對應於偵測之峰值間的最大峰值之最大光接收量P(t)(步驟S5)。Subsequently, the CPU 10 inputs the reflected light image generated by the light receiving device 12 thereto, and the light receiving amount distribution detected by the freely reflected light image detects an amplitude (small amplitude) larger than a predetermined value (step S3). After the peak is detected (YES in step S4), the CPU 10 acquires the maximum light reception amount P(t) corresponding to the maximum peak value between the detected peaks (step S5).

步驟S6指示圖3所說明之處理(步驟S101至S108)。藉由此處理,接著的第二個循環之敏感性參數ST(t+2)、D(t +2)、及G(t+2)係基於在步驟S5中獲取之最大光接收量P(t)與預定光接收量目標值P0之間的比率而導出。Step S6 indicates the processing illustrated in Fig. 3 (steps S101 to S108). By this processing, the sensitivity parameter ST(t+2), D(t) of the second cycle that follows +2), and G(t+2) are derived based on the ratio between the maximum light receiving amount P(t) acquired in step S5 and the predetermined light receiving amount target value P0.

在步驟S7中,CPU 10將在以上處理中計算之敏感性參數ST(t+2)、D(t+2)、及G(t+2)相乘以計算表示由此等敏感性參數調整的敏感性等級之評估值R。在步驟S8中,CPU 10將評估值R與預定下限值RA 及上限值RB 比較。當評估值R落入下限值RA 與上限值RB 之間的範圍內時(在步驟S8中為「是」),CPU 10計算包括最大光接收量P(t)出現之位置的最大峰值之形心之座標g(t)(步驟S9)。另外,CPU 10使用以上提到之轉換表將座標g(t)轉換成距離資料(步驟S10),且輸出距離資料(步驟S11)。In step S7, the CPU 10 multiplies the sensitivity parameters ST(t+2), D(t+2), and G(t+2) calculated in the above processing to calculate the sensitivity parameter adjustment The evaluation value of the sensitivity level R. In step S8, the CPU 10 compares the evaluation value R with the predetermined lower limit value R A and the upper limit value R B . When the evaluation value R falls within the range between the lower limit value R A and the upper limit value R B (YES in step S8), the CPU 10 calculates the position including the occurrence of the maximum light receiving amount P(t). The centroid g(t) of the centroid of the largest peak (step S9). Further, the CPU 10 converts the coordinate g(t) into the distance data using the conversion table mentioned above (step S10), and outputs the distance data (step S11).

當評估值R小於下限值RA 或大於上限值RB 時(在步驟S8中為「否」),則CPU 10不執行步驟S9、S10及S11,但進行錯誤輸出(步驟S12)。當自光投射部101投射的雷射光之反射之光因為一些原因而不能被接收到時,無峰值在步驟S3之處理中被偵測到(在步驟S4中為「否」)。亦在此情況下,CPU 10進展至步驟S12且進行錯誤輸出,如上所述。When the evaluation value R is smaller than the lower limit value R A or larger than the upper limit value R B (NO in step S8), the CPU 10 does not execute steps S9, S10, and S11, but performs error output (step S12). When the reflected light of the laser light projected from the light projecting portion 101 cannot be received for some reason, no peak is detected in the processing of step S3 (NO in step S4). Also in this case, the CPU 10 proceeds to step S12 and performs error output as described above.

為了達成工件W之穩定量測,在本具體例中,在敏感性參數預先調整後,圖4所說明之處理開始,以使得基於來自工件W的反射之光的光接收量之峰值展現最佳強度。因此,當在S3或S5之處理中擷取的光接收量之最大峰值由來自量測區域中之物件(工件W或其支撐表面)的反射之光 產生時,最大光接收量P(t)無顯著改變,惟緊接在引起反射的物件之類型之改變後除外。另外,緊接在引起反射的物件之類型之改變後出現的變化可被保持至比較小的範圍。因此,在光接收量之最大峰值自來自量測區域之光產生之情況下,在多數情況下,僅調整曝光時間ST係足夠的,且在光投射強度或光接收增益需要加以調整之情況下,調整範圍小。In order to achieve stable measurement of the workpiece W, in this specific example, after the sensitivity parameter is adjusted in advance, the process illustrated in FIG. 4 is started so that the peak of the light receiving amount based on the reflected light from the workpiece W is optimal. strength. Therefore, the maximum peak value of the light reception amount taken in the processing of S3 or S5 is reflected light from the object (workpiece W or its supporting surface) in the measurement area. When produced, the maximum light receiving amount P(t) does not change significantly, except immediately after the change in the type of the object causing the reflection. In addition, changes occurring immediately after the change in the type of the object causing the reflection can be maintained to a relatively small range. Therefore, in the case where the maximum peak of the light receiving amount is generated from the light from the measurement area, in most cases, only the adjustment of the exposure time ST is sufficient, and in the case where the light projection intensity or the light receiving gain needs to be adjusted. The adjustment range is small.

然而,在並非來自工件W的反射之光而是雜訊光進入之情況下,最大峰值之顯著改變高度可能會發生。舉例而言,如在圖7之以上實例中,在偏離感測器1之主光傳遞行進之弱光在複數個位置處反射後返回至感測器1之情況下,基於雜訊光之峰值光接收量P(t)變得顯著低,結果為基於目標值P0與P(t)之間的比率計算之曝光時間ST(t+2)顯著超過最大曝光時間。因此,在此情況下,曝光時間ST(t+2)改變至最大曝光時間,且光投射強度D及光接收增益G顯著增加。由此可見,作為敏感性參數之整合值的評估值R變大。However, in the case where the reflected light is not from the workpiece W but the noise light enters, a significant change in the maximum peak height may occur. For example, as in the above example of FIG. 7, in the case where the weak light traveling away from the main light of the sensor 1 is reflected back at a plurality of positions and returned to the sensor 1, based on the peak of the noise light The light receiving amount P(t) becomes significantly low, with the result that the exposure time ST(t+2) calculated based on the ratio between the target values P0 and P(t) significantly exceeds the maximum exposure time. Therefore, in this case, the exposure time ST(t+2) is changed to the maximum exposure time, and the light projection intensity D and the light receiving gain G are significantly increased. From this, it can be seen that the evaluation value R of the integrated value as the sensitivity parameter becomes large.

另外,在具有高強度的規則反射之光進入之情況下(如在圖8之實例中),最大峰值可能飽和,使得待藉由作為P(t)的最大峰值之飽和度導出之曝光時間ST(t+2)顯著低於最小曝光時間。因此,在此情況下,曝光時間ST(t+2)改變至最小曝光時間,且光投射強度D及光接收增益G顯著減小。由此可見,評估值R變小。In addition, in the case where regular reflected light having high intensity enters (as in the example of Fig. 8), the maximum peak may be saturated, so that the exposure time ST to be derived by the saturation as the maximum peak of P(t) (t+2) is significantly lower than the minimum exposure time. Therefore, in this case, the exposure time ST(t+2) is changed to the minimum exposure time, and the light projection intensity D and the light receiving gain G are significantly reduced. It can be seen that the evaluation value R becomes small.

對於評估值R之容許範圍,評估值R的變化之範圍係基於在光接收量之最大峰值自來自量測區域的反射之光產生之條件下產生的各別敏感性參數之變化而計算。接著,以上下限值RA 及上限值RB 經判定以使得變化包括於容許範圍中,且此後,判定之RA 及RB 被暫存於記憶體16中。藉由使用暫存之下限值RA 及上限值RB 執行圖4之量測處理,基於雜訊光之光接收量被作為最大光接收量偵測。在此情況下,即使基於此偵測結果調整之敏感性參數展現顯著改變,在步驟S8中亦進行「否」之判定,以使得不存在歸因於雜訊光之入射而引起的錯誤距離資料被計算且輸出之可能性。因此,可執行穩定且準確的量測。For the allowable range of the evaluation value R, the range of variation of the evaluation value R is calculated based on the change in the respective sensitivity parameter generated under the condition that the maximum peak of the light reception amount is generated from the reflected light from the measurement region. Next, the upper lower limit value R A and the upper limit value R B are determined such that the change is included in the allowable range, and thereafter, the determined R A and R B are temporarily stored in the memory 16 . By performing the measurement processing of FIG. 4 using the temporary lower limit value R A and the upper limit value R B , the light receiving amount based on the noise light is detected as the maximum light receiving amount. In this case, even if the sensitivity parameter adjusted based on the detection result exhibits a significant change, the determination of "NO" is performed in step S8 so that there is no error distance data due to the incidence of the noise light. The possibility of being calculated and output. Therefore, stable and accurate measurement can be performed.

如上所述,在本具體例中,接著的第二個循環之敏感性參數係基於在重複光投射及光接收時在每一循環中的最大光接收量與目標值之間的比率導出。同時,用於判定導出之敏感性參數是否適當之評估值被計算出,且判定計算之評估值是否落入容許範圍內。然而,接著的第二個循環之敏感性參數之導出為甚至當偵測處理之循環比較短時仍穩定地執行敏感性調整之措施,且若CPU 10之操作速度被允許,則隨後循環之敏感性參數可被導出,且接著可判定基於此等敏感性參數之評估值R是否落入容許範圍內。As described above, in the present specific example, the sensitivity parameter of the next second cycle is derived based on the ratio between the maximum light receiving amount and the target value in each cycle at the time of repeating light projection and light reception. At the same time, the evaluation value for determining whether the derived sensitivity parameter is appropriate is calculated, and it is determined whether the calculated evaluation value falls within the allowable range. However, the sensitivity parameter of the second loop that follows is derived so that the sensitivity adjustment measure is stably performed when the loop of the detection processing is relatively short, and if the operating speed of the CPU 10 is allowed, then the sensitivity of the loop is subsequently The parameter can be derived and it can then be determined whether the evaluation value R based on these sensitivity parameters falls within the allowable range.

在圖4之處理中,在曝光時間之變化落在於下限值RA 與上限值RB 之間界定的容許範圍外之情況下,量測處理自身 不被執行。然而,或者,量測處理自身始終被執行但若評估值R偏離容許範圍R則量測資料之輸出停止的組態可為可能的。In the process of FIG. 4, in the case where the change in exposure time falls outside the allowable range defined between the lower limit value R A and the upper limit value R B , the measurement process itself is not performed. However, alternatively, the measurement process itself is always executed, but if the evaluation value R deviates from the allowable range R, a configuration in which the output of the measurement data is stopped may be possible.

另外,以下方法可用以提高量測準確性。亦即,並非藉由單一光投射/光接收操作量測的距離資料之計算而是藉由複數個先前循環量測的距離資料之平均值之計算(移動平均值計算)被執行,且計算之平均值被作為量測結果輸出。且,在此情況下,需要每當光投射及光接收被執行時執行敏感性調整及評估值R之計算,且若評估值R落在容許範圍外則停止移動平均值計算或平均值之輸出。在評估值R在一旦在容許範圍外後返回至容許範圍之情況下,移動平均值計算或平均值之輸出可恢復,但在評估值R在容許範圍外期間之時間期間獲得的距離資料需要被排除在移動平均值計算之外。In addition, the following methods can be used to improve measurement accuracy. That is, the calculation of the distance data measured by the single light projection/light receiving operation is not performed by the calculation of the average value of the distance data measured by the plurality of previous cycles (the moving average calculation), and the calculation is performed. The average value is output as a measurement result. Moreover, in this case, it is necessary to perform the sensitivity adjustment and the calculation of the evaluation value R each time the light projection and the light reception are performed, and stop the moving average calculation or the output of the average value if the evaluation value R falls outside the allowable range. . In the case where the evaluation value R returns to the allowable range once it is outside the allowable range, the output of the moving average calculation or the average value can be recovered, but the distance data obtained during the time during which the evaluation value R is outside the allowable range needs to be Excluded from moving average calculations.

本具體例之感測器1設有在量測處理前判定需要用於在重複光投射及光接收之同時量測的條件之功能。基於此功能之處理為以上提到之「調諧」處理。The sensor 1 of this specific example is provided with a function of determining conditions required for measurement while repeating light projection and light reception before the measurement processing. The processing based on this function is the "tuning" process mentioned above.

調諧處理包括調整敏感性之處理,使得光接收量之最大峰值停留在以上目標值P0周圍。因此,藉由在工件W之模型裝設於量測區域中之狀態下執行調諧處理,可使基於來自工件W的反射之光的光接收量之峰值靠近目標值P0。The tuning process includes a process of adjusting the sensitivity such that the maximum peak of the light receiving amount stays around the above target value P0. Therefore, by performing the tuning process in a state where the model of the workpiece W is mounted in the measurement region, the peak value of the light receiving amount based on the reflected light from the workpiece W can be brought close to the target value P0.

另外,本具體例之感測器1具有複數個量測模型,該等量 測模型具有不同回應時間,且預設量測條件係針對每一量測模型而暫存。回應時間為CPU 10回應於在某一點執行之光投射及光接收而輸出量測結果所需要的時間之長度,且取決於光投射及光接收被執行之週期(下文被稱作「量測週期」)、最大曝光時間、以上移動平均值計算之次數或類似者而變化。取決於量測模式,藉由以上調諧處理設定的敏感性參數不同。In addition, the sensor 1 of this specific example has a plurality of measurement models, and the same amount The measurement model has different response times, and the preset measurement conditions are temporarily stored for each measurement model. The response time is the length of time required for the CPU 10 to output a measurement result in response to light projection and light reception performed at a certain point, and depends on the period during which light projection and light reception are performed (hereinafter referred to as "measurement period" "), the maximum exposure time, the number of times the above moving average is calculated, or the like. Depending on the measurement mode, the sensitivity parameters set by the above tuning process are different.

另外,在本具體例中,下限值RA 及上限值RB 可基於在調諧處理中執行的敏感性調整之結果而計算,以用於暫存。Further, in this particular embodiment, the lower limit value of the upper limit value of R A and R B may be performed based on a result of the sensitivity adjustment processing in the tuner is calculated, for temporary storage.

圖5為說明下限值RA 及上限值RB 之調諧處理及暫存處理之流程圖。每一處理之處理流程將在以下參考圖5來描述。FIG. 5 is a flow chart for explaining the tuning process and the temporary storage process of the lower limit value R A and the upper limit value R B . The processing flow of each process will be described below with reference to FIG.

在執行調諧處理前,使用者選擇操作模式中之一者,將工件W裝設於偵測位置處,且指導經由操作部18的調諧處理之開始。結果,圖5之處理開始。Before performing the tuning process, the user selects one of the operating modes, mounts the workpiece W at the detecting position, and instructs the start of the tuning process via the operating portion 18. As a result, the process of Figure 5 begins.

在此處理之第一步驟S20中,對應於選定量測模式之預設量測條件被讀出。量測條件包括光投射強度及光接收增益中之每一者之量測週期、最小曝光時間、最大曝光時間及最大放大率(可經受在選定量測模式下之調整的最大放大率)。In a first step S20 of this process, the preset measurement conditions corresponding to the selected measurement mode are read. The measurement conditions include a measurement period, a minimum exposure time, a maximum exposure time, and a maximum magnification of each of the light projection intensity and the light receiving gain (the maximum magnification that can be adjusted in the selected measurement mode).

在步驟S21中,曝光時間ST、光投射強度D及光接收增益G在預設量測條件之範圍內被初始化。舉例而言,預設最小曝光時間被設定至曝光時間ST,且光投射強度D及光 接收增益G分別被設定至1。In step S21, the exposure time ST, the light projection intensity D, and the light receiving gain G are initialized within the range of the preset measurement conditions. For example, the preset minimum exposure time is set to the exposure time ST, and the light projection intensity D and light The reception gain G is set to 1 respectively.

此後,直至達到最大光接收量停留在目標值P0周圍且敏感性參數ST、D及G分別停留在實質上某些值之狀態,光投射/光接收處理及敏感性調整處理被重複(與在圖3之步驟S101至S108之處理相同的處理)。Thereafter, until the maximum light receiving amount stays around the target value P0 and the sensitivity parameters ST, D, and G respectively stay at substantially certain values, the light projection/light receiving processing and the sensitivity adjustment processing are repeated (and The processing of steps S101 to S108 of Fig. 3 is the same processing).

在最大光接收量及敏感性參數已變得穩定後(在步驟S23及S24中為「是」),流程繼續進行至步驟S26,在步驟S26,穩定化之曝光時間ST、穩定化之光投射強度D及穩定化之光接收增益G分別被設定至ST0、D0及G0,且量測條件基於此等值來判定。此時判定之量測條件亦包括光投射強度及光接收增益中之每一者的量測週期、最小曝光時間、最大曝光時間及最大放大率。除此之外,以上提到之移動平均值計算的資料之數目(等於或大於1之數目)亦被添加至量測條件。After the maximum light receiving amount and the sensitivity parameter have become stable (YES in steps S23 and S24), the flow proceeds to step S26, in which the stabilized exposure time ST and the stabilized light projection are performed. The intensity D and the stabilized light receiving gain G are set to ST0, D0, and G0, respectively, and the measurement conditions are determined based on the values. The measurement conditions determined at this time also include a measurement period, a minimum exposure time, a maximum exposure time, and a maximum magnification of each of the light projection intensity and the light receiving gain. In addition to this, the number of data (the number equal to or greater than 1) calculated by the moving average mentioned above is also added to the measurement condition.

在本具體例之記憶體16中,量測條件表被暫存,自該量測條件表,經驗上導出之量測條件可將曝光時間之值用作密鑰而被讀出。在步驟S26中,量測條件表由穩定化之曝光時間ST0參考,且對應於ST0之量測條件被讀出且暫存以用於該量測。In the memory 16 of this specific example, the measurement condition table is temporarily stored, and from the measurement condition table, the empirically derived measurement condition can be read using the value of the exposure time as a key. In step S26, the measurement condition table is referred to by the stabilized exposure time ST0, and the measurement condition corresponding to ST0 is read out and temporarily stored for the measurement.

在量測條件表中所暫存的量測條件中之任一者中,最小曝光時間及最大曝光時間被設定,以便不落在於對應的量測模式下設定之預設曝光時間之容許範圍外。類似地,量測週期 或光投射強度被設定,以便比其預設值小。然而,可能存在光接收增益超過其預設值之情況。另外,移動平均值計算的資料之數目(等於、大於1之整數)係在滿足在對應的量測模式下之回應時間或最大曝光時間之範圍中計算的,且被添加至量測條件。In any one of the measurement conditions temporarily stored in the measurement condition table, the minimum exposure time and the maximum exposure time are set so as not to fall outside the allowable range of the preset exposure time set in the corresponding measurement mode. . Similarly, the measurement cycle Or the light projection intensity is set to be smaller than its preset value. However, there may be cases where the light receiving gain exceeds its preset value. In addition, the number of pieces of data (equal to, greater than 1) calculated by the moving average is calculated in a range satisfying the response time or the maximum exposure time in the corresponding measurement mode, and is added to the measurement condition.

在於步驟S26中判定了量測條件後,流程繼續進行至步驟S27,在步驟S27,穩定化之曝光時間ST0、穩定化之光投射強度D0及穩定化之光接收增益G0相乘,以計算敏感性參數之評估值R的參考值R0。參考值R0指示較佳的敏感性值。After the measurement condition is determined in step S26, the flow proceeds to step S27, in which the stabilized exposure time ST0, the stabilized light projection intensity D0, and the stabilized light reception gain G0 are multiplied to calculate sensitivity. The reference value R0 of the evaluation value R of the sexual parameter. The reference value R0 indicates a preferred sensitivity value.

在步驟S28中,參考值R0乘以預定係數α(α>0)以計算評估值R之上限值RB 。另外,參考值R0乘以α之倒數1/α以計算評估值R之下限值RA 。接著,在步驟S29中,RA 及RB 被暫存於記憶體16中,藉此此常式結束。In step S28, the reference value R0 is multiplied by a predetermined coefficient α (α>0) to calculate an upper limit value R B of the evaluation value R. Further, the reference value R0 is multiplied by the reciprocal 1/α of α to calculate the lower limit value R A of the evaluation value R. Next, in step S29, R A and R B are temporarily stored in the memory 16, whereby the routine ends.

在於上述調諧處理後轉變至選定量測模式後,量測處理根據圖4之程序來執行。藉由調諧處理計算之下限值RA 及上限值RB 用於針對每一循環之敏感性調整來判定評估值R之處理(步驟S8)中。After the above-described tuning process is shifted to the selected measurement mode, the measurement process is performed according to the procedure of FIG. The lower limit value R A and the upper limit value R B are calculated by the tuning process for determining the evaluation value R for each cycle sensitivity adjustment (step S8).

根據圖5之處理,基於在於來自工件W的反射之光被接收之條件下執行的敏感性調整之完成後獲得的敏感性參數ST0、D0及G0之評估值R被設定為參考值R0,且接著足夠大於及小於參考值R0之值可分別被暫存為上限值RB 及 下限值RA 。因此,與基於來自工件W的反射之光之光接收量極其不同的光接收量落在界定於上限值RB 與下限值RA 之間的容許範圍外。According to the processing of FIG. 5, the evaluation values R of the sensitivity parameters ST0, D0, and G0 obtained based on the completion of the sensitivity adjustment performed under the condition that the reflected light from the workpiece W is received are set as the reference value R0, and Then, values sufficiently larger than and smaller than the reference value R0 can be temporarily stored as the upper limit value R B and the lower limit value R A , respectively . Therefore, the light receiving amount which is extremely different from the light receiving amount based on the reflected light from the workpiece W falls outside the allowable range defined between the upper limit value R B and the lower limit value R A .

用於導出RA 及RB 的α之值可按需要改變。舉例而言,若故障由於在基於α之預設值的RA 及RB 之計算後執行的實驗量測已出現,則α之值改變,以便重新計算RA 及RB ,接著為實驗量測之另一個執行。藉由重複以上程序,當達到歸因於雜訊光之錯誤量測不發生之狀態時,RA 及RB 之值可得以判定。The value of α used to derive R A and R B can be varied as needed. For example, if the fault has occurred due to the experimental measurement performed after the calculation of R A and R B based on the preset value of α, the value of α is changed to recalculate R A and R B , followed by the experimental amount. Another implementation of the test. By repeating the above procedure, the values of R A and R B can be determined when the state in which the error measurement due to the noise light does not occur is reached.

或者,RA 及RB 之值可根據不使用α或R0但在於調諧處理後改變RA 及RB 之值的同時執行實驗量測之方法來判定。Alternatively, the values of R A and R B may be determined based on a method in which experimental measurement is performed while α or R0 is not used but the values of R A and R B are changed after the tuning process.

在於改變α之值或RA 及RB 之值的同時執行實驗量測之情況下,待新設定之數值可經由操作部18輸入。或者,待新設定之數值可經由外部裝置(諸如,個人電腦)輸入,同時經由圖1所說明之I/O介面19連接。在此情況下,可在實驗量測期間改變輸入值,同時監視至外部裝置的感測器輸入之偵測信號,且與偵測錯誤之存在/不存在一致。In the case where the experimental measurement is performed while changing the value of α or the values of R A and R B , the value to be newly set can be input via the operation unit 18. Alternatively, the value to be newly set may be input via an external device such as a personal computer while being connected via the I/O interface 19 illustrated in FIG. In this case, the input value can be changed during the experimental measurement while monitoring the detection signal input to the sensor of the external device, and is consistent with the presence/absence of the detection error.

在移動工件W被量測之情況下,可在與正常量測處理之條件相同的條件下在移動工件W之同時執行敏感性調整以計算評估值R且接著基於評估值R之變化判定RA 及RB 之值。藉由此方法,RA 及RB 之值可亦考慮歸因於來自工件W之支撐表面的光之入射之敏感性改變來判定。另外,在工件 W具有梯級或具有不同反射率之部分之情況下,RA 及RB 之值可考慮在一個工件穿過待偵測之區域期間產生的光接收量之變化來判定。In the case where the moving workpiece W is measured, sensitivity adjustment can be performed while moving the workpiece W under the same conditions as the normal measurement processing to calculate the evaluation value R and then determine R A based on the change of the evaluation value R And the value of R B . By this method, the values of R A and R B can also be determined by considering the change in sensitivity of the incidence of light from the support surface of the workpiece W. Further, in the case where the workpiece W has steps or portions having different reflectances, the values of R A and R B can be determined by considering the change in the amount of light received during the passage of a workpiece through the region to be detected.

在複數個工件W待被偵測之情況下,針對工件之每一類型計算RA 及RB 之值,且將該等值之組合與工件之識別資訊相關聯地暫存於記憶體16中。藉由此方法,當待量測之工件改變至另一者時,使用者可藉由選擇對應於另一工件之識別資訊針對量測進行適當設定。In the case where a plurality of workpieces W are to be detected, the values of R A and R B are calculated for each type of the workpiece, and the combination of the values is temporarily stored in the memory 16 in association with the identification information of the workpiece. . By this method, when the workpiece to be measured is changed to the other, the user can appropriately set the measurement by selecting the identification information corresponding to the other workpiece.

在以上具體例中,藉由三個敏感性參數調整的敏感性之等級表示為稱作評估值R之參數,且評估值R是否落入容許範圍內被設定為關於工件W之量測值是否被輸出之判定條件。然而,或者,替代評估值R,在複數個量測循環間的最大光接收量之變化可被計算出,且可判定變化是否落入容許範圍內。指示光接收量之變化的參數之實例包括最後一個循環或倒數第二個循環之最大光接收量與最近最大光接收量之間的比率及目標值與最大光接收量之間的比率。In the above specific example, the level of sensitivity adjusted by the three sensitivity parameters is expressed as a parameter called the evaluation value R, and whether the evaluation value R falls within the allowable range is set as the measurement value with respect to the workpiece W. The judgment condition to be output. However, alternatively, instead of the evaluation value R, the change in the maximum light receiving amount between the plurality of measurement cycles can be calculated, and it can be determined whether the change falls within the allowable range. Examples of the parameter indicating the change in the amount of received light include the ratio between the maximum light receiving amount of the last cycle or the penultimate cycle and the most recent maximum light receiving amount, and the ratio between the target value and the maximum light receiving amount.

在使用光接收量之變化進行判定之情況下,與光接收裝置12不同的另一光接收裝置可被設置以便量測光接收量。In the case where the determination is made using the change in the light receiving amount, another light receiving device different from the light receiving device 12 can be set to measure the light receiving amount.

偵測工件W之存在/不存在同時判定評估值R或光接收量之變化的功能不需要始終在作用中。舉例而言,操作部18可經組態以接收在作用中與非作用中之間切換功能之操作。在此情況下,可採用圖4之步驟S9、S10、及S11始終 被執行而當進行使該功能不在作用中之操作時不執行步驟S7及S8之組態。切換可不僅回應於經由操作部18之操作且亦回應於來自外部裝置的切換信號之輸入來達成。The function of detecting the presence/absence of the workpiece W while determining the change of the evaluation value R or the amount of light reception does not always have to be active. For example, the operating portion 18 can be configured to receive operations that switch functions between active and inactive. In this case, steps S9, S10, and S11 of FIG. 4 may be employed. It is executed and the configuration of steps S7 and S8 is not performed when an operation that makes the function inactive is performed. The switching can be achieved not only in response to the operation via the operating portion 18 but also in response to the input of a switching signal from the external device.

或者,以上功能通常被保持在不在作用中且當符合預定條件時(例如,當錯誤發生之次數超過容許值時)使其在作用中之組態可為可能的。另外,或者,在於某一時區中雜訊光(例如,穿過窗口進來的陽光)可進入之情況下,可按規則時間間隔或當基於內部計時器而達到設定時間時使以上功能在作用中,且在預定時間週期消逝後再次使其不在作用中。Alternatively, the above functions are typically kept inactive and when the predetermined conditions are met (eg, when the number of times the error occurs exceeds the allowable value), it may be possible to configure it in effect. In addition, or in the case that the noise light in a certain time zone (for example, sunlight coming in through the window) can enter, the above functions can be made active at regular time intervals or when the set time is reached based on the internal timer. And again make it inactive after the predetermined time period has elapsed.

雖然以上具體例之感測器1為基於三角量測之感測器,但感測器類型不限於此。甚至對於根據不同於三角量測之方法量測位移之感測器而言,可藉由判定待在計算處理中使用的光接收量之變化或根據光接收量之改變調整的敏感性參數之變化是否落入容許範圍內且接著當判定以上變化落入容許範圍內時執行計算來準確偵測待偵測之物件,而不受雜訊光影響。Although the sensor 1 of the above specific example is a sensor based on triangulation, the type of sensor is not limited thereto. Even for a sensor that measures displacement according to a method different from the triangulation measurement, it is possible to determine a change in the amount of received light to be used in the calculation process or a change in sensitivity parameter adjusted according to a change in the amount of received light. Whether to fall within the allowable range and then perform calculations when determining that the above changes fall within the allowable range to accurately detect the object to be detected without being affected by the noise light.

1‧‧‧光學式感測器1‧‧‧Optical sensor

10‧‧‧CPU10‧‧‧CPU

11‧‧‧發光裝置(雷射二極體)11‧‧‧Lighting device (laser diode)

12‧‧‧光接收裝置(CMOS)12‧‧‧Light Receiver (CMOS)

13‧‧‧光投射控制電路13‧‧‧Light projection control circuit

14‧‧‧信號處理電路14‧‧‧Signal Processing Circuit

15‧‧‧A/D轉換電路15‧‧‧A/D conversion circuit

16‧‧‧記憶體16‧‧‧ memory

17‧‧‧顯示部17‧‧‧Display Department

18‧‧‧操作部18‧‧‧Operation Department

19‧‧‧I/O介面19‧‧‧I/O interface

100‧‧‧感測器頭100‧‧‧ sensor head

101‧‧‧光投射部101‧‧‧Light Projection Department

102‧‧‧光接收部102‧‧‧Light Receiving Department

111‧‧‧光投射透鏡111‧‧‧Light projection lens

122‧‧‧光接收透鏡122‧‧‧Light receiving lens

W‧‧‧工件W‧‧‧Workpiece

圖1為說明光學式位移感測器之一組態實例之方塊圖;圖2為說明感測器及偵測原理之一使用實例之例示性視圖;圖3為說明敏感性參數偏差處理之流程圖;圖4為說明量測處理之一個循環之流程圖; 圖5為說明在量測處理前執行的設定處理之流程圖;圖6為使用光學式位移感測器之應用之一實例之視圖;圖7為說明雜訊光產生於以上應用中之一實例之視圖;及圖8為說明雜訊光得以產生之另一實例之視圖。1 is a block diagram showing a configuration example of an optical displacement sensor; FIG. 2 is an exemplary view illustrating a use example of the sensor and the detection principle; and FIG. 3 is a flow chart illustrating the sensitivity parameter deviation processing. Figure 4 is a flow chart illustrating a cycle of the measurement process; 5 is a flow chart illustrating a setting process performed before the measurement process; FIG. 6 is a view showing an example of an application using an optical displacement sensor; and FIG. 7 is an example illustrating the generation of noise light in the above application. FIG. 8 is a view illustrating another example in which noise light is generated.

1‧‧‧光學式感測器1‧‧‧Optical sensor

10‧‧‧CPU10‧‧‧CPU

11‧‧‧發光裝置(雷射二極體)11‧‧‧Lighting device (laser diode)

12‧‧‧光接收裝置(CMOS)12‧‧‧Light Receiver (CMOS)

13‧‧‧光投射控制電路13‧‧‧Light projection control circuit

14‧‧‧信號處理電路14‧‧‧Signal Processing Circuit

15‧‧‧A/D轉換電路15‧‧‧A/D conversion circuit

16‧‧‧記憶體16‧‧‧ memory

17‧‧‧顯示部17‧‧‧Display Department

18‧‧‧操作部18‧‧‧Operation Department

19‧‧‧I/O介面19‧‧‧I/O interface

101‧‧‧光投射部101‧‧‧Light Projection Department

102‧‧‧光接收部102‧‧‧Light Receiving Department

Claims (8)

一種光學式位移感測器,其包含:一光投射部,其被組態成投射用於量測之光;一光接收部,其被組態成接收自一物件反射之光;一量測處理部,其被組態成基於該接收的反射之光而量測該物件且輸出該量測之一結果,該量測處理部具有一判定部分,該判定部分被組態成判定一參數之一值是否在一容許範圍內,該參數之該值具有指示由該光接收部接收的一光接收量之一變化的一參數之一值或指示待根據該光接收量之一增加或減少而調整之敏感性的一參數之一值;及一敏感性調整部分,其被組態成根據由該光接收部接收的該光接收量之該增加或減少來改變一曝光時間、由該光接收部投射的一光發射強度、及該光接收部之一光接收增益中之至少一者,其中,該曝光時間界定該光投射部及該光接收部之一操作週期,以及該判定部分被組態成計算一評估值,且將該評估值與該容許範圍之上限值及下限值比較以判定該評估值是否落入該容許範圍內,且該評估值指示基於由該敏感性調整部分改變之該曝光時間、該光發射強度及該光接收增益的該敏感性之一等級。 An optical displacement sensor comprising: a light projection portion configured to project light for measurement; a light receiving portion configured to receive light reflected from an object; a measurement a processing portion configured to measure the object based on the received reflected light and output a result of the measurement, the measurement processing portion having a determination portion configured to determine a parameter Whether a value is within an allowable range, the value of the parameter has a value indicating a change in one of the light receiving amounts received by the light receiving portion or indicates that the value to be increased or decreased according to one of the light receiving amounts a value of one parameter of the sensitivity of the adjustment; and a sensitivity adjustment portion configured to change an exposure time according to the increase or decrease of the amount of received light received by the light receiving portion, and receive by the light At least one of a light emission intensity projected by the portion and a light receiving gain of the light receiving portion, wherein the exposure time defines an operation period of the light projection portion and the light receiving portion, and the determination portion is grouped State calculation And comparing the evaluation value with the upper limit value and the lower limit value of the allowable range to determine whether the evaluation value falls within the allowable range, and the evaluation value indicates that the exposure time is changed based on the sensitivity adjustment portion, The light emission intensity and the sensitivity of the light receiving gain are one of the levels. 如申請專利範圍第1項之光學式位移感測器,該量測處 理部進一步包含:一控制器,其被組態成控制輸出該量測之該結果,且當參數之該值在該容許範圍內時,該量測之該結果被輸出,且當參數之該值不在該容許範圍內時,該量測之該結果不被輸出。 Such as the optical displacement sensor of claim 1 of the patent scope, the measurement section The management department further includes: a controller configured to control the output of the measurement, and when the value of the parameter is within the allowable range, the result of the measurement is output, and when the parameter is When the value is not within the allowable range, the result of the measurement is not output. 如申請專利範圍第1項之光學式位移感測器,該量測處理部進一步包含:一設定部分,其被組態成執行一處理以藉由調整該光投射部、該光接收部及該敏感性調整部分來使該光接收量、該曝光時間、該光發射強度之值穩定化。 The optical displacement sensor of claim 1, wherein the measurement processing portion further includes: a setting portion configured to perform a process to adjust the light projection portion, the light receiving portion, and the The sensitivity adjustment section stabilizes the value of the light receiving amount, the exposure time, and the light emission intensity. 如申請專利範圍第3項之光學式位移感測器,其中,該設定部分執行一處理以計算該評估值之一參考值,且該參考值係藉由該光接收量、該曝光時間及該光發射強度之該等穩定化之值計算。 The optical displacement sensor of claim 3, wherein the setting portion performs a process to calculate a reference value of the evaluation value, and the reference value is obtained by the light receiving amount, the exposure time, and the The values of these stabilizations of the light emission intensity are calculated. 如申請專利範圍第4項之光學式位移感測器,其中,該設定部分執行一處理以基於該參考值判定該容許範圍之上限值及下限值。 The optical displacement sensor of claim 4, wherein the setting portion performs a process to determine the upper limit and the lower limit of the allowable range based on the reference value. 如申請專利範圍第5項之光學式位移感測器,其中,該設定部分將該參考值乘以大於1之一預定係數α,以計算該容許範圍之該上限值,且將該參考值乘以該係數α之一倒數1/α,以計算該容許範圍之該下限值。 The optical displacement sensor of claim 5, wherein the setting portion multiplies the reference value by a predetermined coefficient α greater than one to calculate the upper limit value of the allowable range, and the reference value is The inverse of the allowable range is calculated by multiplying the inverse of the coefficient α by 1/α. 如申請專利範圍第6項之光學式位移感測器,其進一步 包含:一輸入部分,其被組態成輸入該係數α之一值。 Such as the optical displacement sensor of claim 6 of the patent scope, further Contains: an input portion configured to input a value of the coefficient a. 如申請專利範圍第1項之光學式位移感測器,其進一步包含:一輸入部分,其被組態成輸入用於設定上限值及下限值之資料以判定該容許範圍,及一設定部分,其被組態成在該判定部分中設定該上限值及該下限值。 The optical displacement sensor of claim 1, further comprising: an input portion configured to input data for setting an upper limit value and a lower limit value to determine the allowable range, and a setting Partially configured to set the upper limit value and the lower limit value in the determination portion.
TW101140266A 2011-11-30 2012-10-31 Optical displacement sensor TWI500950B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011262537A JP5903855B2 (en) 2011-11-30 2011-11-30 Optical displacement sensor

Publications (2)

Publication Number Publication Date
TW201321784A TW201321784A (en) 2013-06-01
TWI500950B true TWI500950B (en) 2015-09-21

Family

ID=48535194

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101140266A TWI500950B (en) 2011-11-30 2012-10-31 Optical displacement sensor

Country Status (3)

Country Link
JP (1) JP5903855B2 (en)
TW (1) TWI500950B (en)
WO (1) WO2013080726A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI683085B (en) * 2018-10-12 2020-01-21 國立交通大學 Optical displacement sensing system

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7057655B2 (en) * 2017-12-15 2022-04-20 キヤノン株式会社 Measuring equipment, lithography equipment, manufacturing method of goods, and measuring method
JP2020003659A (en) * 2018-06-28 2020-01-09 オリンパス株式会社 Enlargement observation device
JP7152730B2 (en) * 2020-10-28 2022-10-13 大成建設株式会社 Spray thickness control device and tunnel construction method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW428079B (en) * 1998-12-24 2001-04-01 Sharp Kk Thickness measurement apparatus of thin film using light interference method
CN1564996A (en) * 2001-10-03 2005-01-12 阿诺托股份公司 An optical sensor device and a method of controlling its exposure time
JP2007101215A (en) * 2005-09-30 2007-04-19 Sunx Ltd Shape measurement method, shape measurement system and shape measurement device
TW200942814A (en) * 2008-04-01 2009-10-16 Beyond Innovation Tech Co Ltd Optical device and calibration method thereof
CN102003954A (en) * 2010-09-25 2011-04-06 武汉理工大学 Automatic-configuring system for digital photogrammetric optical parameters

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000172897A (en) * 1998-12-04 2000-06-23 Hitachi Asahi Electronics Co Ltd Method for adjusting light emitted from sensor of optical two-sheet detecting device
JP3951087B2 (en) * 2000-03-31 2007-08-01 オムロン株式会社 Optical displacement meter
JP4139936B2 (en) * 2001-06-28 2008-08-27 オムロン株式会社 Optical displacement sensor
JP3827557B2 (en) * 2001-11-01 2006-09-27 松下電器産業株式会社 Optical measuring device and optical measuring method
JP2008051556A (en) * 2006-08-22 2008-03-06 Sii Nanotechnology Inc Optical displacement detecting mechanism, and surface information measuring device using the same
JP5046296B2 (en) * 2007-12-27 2012-10-10 パナソニック デバイスSunx株式会社 Displacement sensor
JP5178393B2 (en) * 2008-08-20 2013-04-10 シャープ株式会社 Optical distance measuring sensor and electronic device
JP2010122127A (en) * 2008-11-21 2010-06-03 Sunx Ltd Optical displacement sensor system, console, controller and program

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW428079B (en) * 1998-12-24 2001-04-01 Sharp Kk Thickness measurement apparatus of thin film using light interference method
CN1564996A (en) * 2001-10-03 2005-01-12 阿诺托股份公司 An optical sensor device and a method of controlling its exposure time
JP2007101215A (en) * 2005-09-30 2007-04-19 Sunx Ltd Shape measurement method, shape measurement system and shape measurement device
TW200942814A (en) * 2008-04-01 2009-10-16 Beyond Innovation Tech Co Ltd Optical device and calibration method thereof
CN102003954A (en) * 2010-09-25 2011-04-06 武汉理工大学 Automatic-configuring system for digital photogrammetric optical parameters

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI683085B (en) * 2018-10-12 2020-01-21 國立交通大學 Optical displacement sensing system

Also Published As

Publication number Publication date
JP2013113796A (en) 2013-06-10
TW201321784A (en) 2013-06-01
WO2013080726A1 (en) 2013-06-06
JP5903855B2 (en) 2016-04-13

Similar Documents

Publication Publication Date Title
US8786837B2 (en) Distance measuring apparatus
TWI500950B (en) Optical displacement sensor
JP5711925B2 (en) Optical distance measuring device
US9651663B2 (en) Distance measurement apparatus
JP5925390B1 (en) Displacement sensor, displacement detection device, and displacement detection method
JP5974561B2 (en) Optical sensor and setting method for sensitivity adjustment control
JP2010286448A (en) Optical range finder
EP2615414B1 (en) Displacement sensor
FR3038987A1 (en) LASER MEASURING DEVICE
US9677873B2 (en) Apparatus, method and computer program for determining a distance to an object using a determined peak width of a self-mixing interference (SMI) signal
JP5602554B2 (en) Optical distance measuring device
JP2013535676A5 (en)
JP5760938B2 (en) Optical sensor
JP5740858B2 (en) Optical phase difference detection type object detection sensor
JP2009085658A (en) Distance measuring device
JP4973836B2 (en) Displacement sensor with automatic measurement area setting means
JP2010133712A (en) Shape measuring device
JP7329943B2 (en) Detection device and movement device
JP2023106904A (en) Measurement device and measurement method
WO2018016447A1 (en) Gas detection system
JP2013246010A (en) Information acquisition device and object detection device
JPH07286811A (en) Optical device
JP2022139823A (en) Optical sensor, control method for optical sensor, and control program for optical sensor
JP2010159986A (en) Photoelectric sensor device
JP2018105796A5 (en)