TWI492045B - Method and fixture of measure for computer device - Google Patents

Method and fixture of measure for computer device Download PDF

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TWI492045B
TWI492045B TW102100793A TW102100793A TWI492045B TW I492045 B TWI492045 B TW I492045B TW 102100793 A TW102100793 A TW 102100793A TW 102100793 A TW102100793 A TW 102100793A TW I492045 B TWI492045 B TW I492045B
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test
signal
computer device
sleep
fixture
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TW102100793A
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TW201428483A (en
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Wu Hsiung Sun
Chu Hsiang Liao
Chi Lin Chang
wei ran Liao
Chih Hung Huang
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Giga Byte Tech Co Ltd
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檢測治具及電腦裝置的檢測方法Test fixture and computer device detection method

本發明系關於一種治具;特別關於一種適用於電腦裝置的檢測治具及檢測方法。The invention relates to a fixture; in particular to a detection fixture and a detection method suitable for a computer device.

在目前廣泛使用的作業系統中,已普遍在其作業系統中整合了進階組態與電源介面標準(Advanced Configuration and Power Interface,ACPI)的電源管理功能,藉此控制電腦系統中相關硬體的電源管理操作。在進階組態與電源介面(Advanced Configuration and Power Interface,ACPI)標準中,電腦系統的狀態除了工作狀態S0之外,更包括了消耗較少電源的休眠狀態(sleeping mode)。而根據耗電量以及回復速度的不同,休眠狀態可分為S1、S2、S3、S4及S5等數個等級。In the currently widely used operating systems, the power management functions of the Advanced Configuration and Power Interface (ACPI) have been integrated in their operating systems to control the related hardware in the computer system. Power management operations. In the Advanced Configuration and Power Interface (ACPI) standard, the state of the computer system includes a sleep mode that consumes less power than the operating state S0. According to the power consumption and the recovery speed, the sleep state can be divided into several levels such as S1, S2, S3, S4 and S5.

在S1(power on suspend)狀態下,電腦系統只將螢幕關機,停止供電至監視器及磁碟機,但仍供應電力至中央處理器、記憶體及風扇,所以能很快地回復至工作狀態。S2狀態是除了停止供電至監視器、磁碟機之外,亦停止供電至中央處理器與快取記憶體。而在稱之為記憶體休眠(suspend to ram)的S3狀態下,除了記憶體及其控制器需要電源來保持資料外,其餘裝置均停止供電。S4(suspend to disk)狀態是把記憶體中的資料儲存在硬碟,因此不再需要供電給所有的裝置及元件,但作業系統在電源關閉之前可將原開啟之資料及程式執行狀態予以儲存。而欲將休眠狀態之電腦系統喚醒回正常開機狀態時,只要簡易地壓按電源開關即可迅速恢復原先之狀態,而不需要重新執行冗長的系統啟動程序。而所謂的S5狀態即是關機狀態,此時僅保留非常少的待機電源至電腦系統。In the S1 (power on suspend) state, the computer system only shuts down the screen, stops supplying power to the monitor and the disk drive, but still supplies power to the CPU, memory and fan, so it can quickly return to work. . In the S2 state, in addition to stopping the supply of power to the monitor and the disk drive, the power supply to the central processing unit and the cache memory is also stopped. In the S3 state called suspend to ram, except for the memory and its controller that require power to hold the data, the rest of the devices stop supplying power. The S4 (suspend to disk) state stores the data in the memory on the hard disk, so there is no need to supply power to all devices and components, but the operating system can store the original open data and program execution status before the power is turned off. . To wake up the sleepy computer system back to the normal power-on state, simply press the power switch to quickly restore the original state without re-executing the lengthy system startup procedure. The so-called S5 state is the shutdown state, at which time only very little standby power is reserved to the computer system.

為了確保電腦裝置在使用者使用時得以正常執行各項功能,電腦產品在出貨之前必須經過多道品管測試,而在品管測試中,休眠喚醒測試是必不可少的項目之一。目前最常使用的測試方法是重覆執行開 機(boot)、待機(Standby)、休眠(Hibernation)、關閉電源(Shutdown)、及重開機(Reboot)之程序。In order to ensure that the computer device can perform various functions normally when the user uses it, the computer product must undergo multiple quality control tests before shipment, and in the quality control test, the sleep wake-up test is one of the essential items. The most commonly used test method at present is repeated execution. Programs for boot, standby, hibernation, Shutdown, and Reboot.

當透過人工方式按壓電腦電源按鈕來進行休眠喚醒測試時,測試人員必須重複的按壓電源按鈕,因此測試者需長時間待於測試機器前進行重覆的操作,且需自行記錄已經完成測試的資料,此種重複性勞動易使測試人員產生疲勞感。另外,上述習用的休眠模式測試方式,不但費時且極耗極大的人力成本,非常容易造成人員的誤操作,測試誤判率也較高,以人工方式也顯然不具效率。此外,因為測試人員在測試過程中皆以肉眼進行判斷,進而因為誤判導致不良品沒有被檢測出來,抑或是存在著正常品被判斷為不良品的可能性。When the sleep power-on test is performed by manually pressing the computer power button, the tester must repeatedly press the power button, so the tester needs to wait for a long time before the test machine to perform repeated operations, and needs to record the data that has been tested. This kind of repetitive work tends to make the tester feel tired. In addition, the above-mentioned sleep mode test method is not only time-consuming and extremely labor-intensive, but also very easy to cause personnel misoperation, the test misjudgment rate is also high, and the manual method is obviously not efficient. In addition, because the tester judges the naked eye during the test, and the defective product is not detected due to misjudgment, there is a possibility that the normal product is judged to be a defective product.

為了要克服前述習用測試電腦裝置上的技術問題,遂有業者開發出自動測試休眠模式的技術。但,習用的自動測試裝置必須限定於使用特定的軟體程式對待測電腦裝置的電路系統進行測試,因此,除了檢測成本相對昂貴之外,對於硬體測試設備的選擇也相對受限,導致在測試工作站的使用上亦缺乏彈性及適應性。In order to overcome the technical problems on the aforementioned conventional test computer devices, the industry has developed a technology for automatically testing the sleep mode. However, the conventional automatic test device must be limited to the test of the circuit system of the computer device to be tested using a specific software program. Therefore, in addition to the relatively high cost of the test, the selection of the hardware test device is relatively limited, resulting in the test. The use of workstations also lacks flexibility and adaptability.

鑒於以上的問題,本發明提供一種檢測治具及電腦裝置的檢測方法,藉以解決現有技術以人工方式測試電腦裝置容易產生誤判情形,以及以軟體程式測試電腦裝置的檢測成本昂貴,使用上也缺乏彈性及適應性等限制。In view of the above problems, the present invention provides a detection method for detecting a jig and a computer device, thereby solving the prior art that the computer device is easily tested by a manual test, and the detection of the computer device by the software program is expensive and the use is lacking. Resilience and adaptability.

本發明之檢測治具,適用於電腦裝置,檢測治具包括有一電路板、至少一顯示介面埠以及一控制介面,其中電路板具有一控制晶片,且控制晶片儲存有測試參數。顯示介面埠係電性設置於電路板上,並且電性連接於電腦裝置,顯示介面埠接收電腦裝置於休眠狀態所輸出的休眠訊號。控制介面係電性設置於電路板上,且控制介面電性連接一電磁鐵裝置。電磁鐵裝置鄰近於電腦裝置,當控制介面輸出一測試訊號至電磁鐵裝置,電磁鐵裝置被啟動並觸發電腦裝置進入休眠狀態。控制晶片根據設定的測試參數判斷是否接收到 休眠訊號,若控制晶片接收到休眠訊號,則確認電腦裝置進入休眠狀態。The test fixture of the present invention is applicable to a computer device. The test fixture includes a circuit board, at least one display interface, and a control interface. The circuit board has a control chip, and the control chip stores test parameters. The display interface is electrically disposed on the circuit board and electrically connected to the computer device, and the display interface receives the sleep signal output by the computer device in the sleep state. The control interface is electrically disposed on the circuit board, and the control interface is electrically connected to an electromagnet device. The electromagnet device is adjacent to the computer device. When the control interface outputs a test signal to the electromagnet device, the electromagnet device is activated and triggers the computer device to enter a sleep state. The control chip determines whether it is received according to the set test parameters. The sleep signal, if the control chip receives the sleep signal, confirms that the computer device enters a sleep state.

本發明另揭露一種電腦裝置的檢測方法,首先提供一檢測治具,並設定檢測治具的測試參數,接著電性連接檢測治具與電腦裝置。按壓檢測治具的測試按鈕,令檢測治具的控制介面輸出測試訊號,以啟動電磁鐵裝置觸發電腦裝置進入休眠狀態。以檢測治具判斷是否接收到電腦裝置於休眠狀態所輸出的休眠訊號,若檢測治具接收到休眠訊號,則確認電腦裝置進入休眠狀態。The invention further discloses a detection method of a computer device. Firstly, a detection fixture is provided, and test parameters of the detection fixture are set, and then the detection fixture and the computer device are electrically connected. Pressing the test button of the test fixture causes the control interface of the test fixture to output a test signal to activate the electromagnet device to trigger the computer device to enter a sleep state. The detection fixture determines whether the sleep signal output by the computer device in the sleep state is received. If the detection fixture receives the sleep signal, it confirms that the computer device enters the sleep state.

藉由本發明的測試治具及測試方法,以硬體設備即可達到自動化測試電腦裝置,大幅提高測試準確率與測試涵蓋率,同時降低檢測的人工成本與軟體程式開發成本。另外,本發明之測試治具可適用於各種規格的電腦裝置進行測試,並可在同時間對多台電腦裝置進行測試,有效提高檢測效率。With the test fixture and the test method of the invention, the automatic test computer device can be realized by the hardware device, the test accuracy and the test coverage rate are greatly improved, and the labor cost of the detection and the software program development cost are reduced. In addition, the test fixture of the present invention can be applied to computer devices of various specifications for testing, and can test multiple computer devices at the same time, thereby effectively improving the detection efficiency.

100‧‧‧檢測治具100‧‧‧Test fixture

110‧‧‧電路板110‧‧‧Circuit board

111‧‧‧控制晶片111‧‧‧Control chip

120‧‧‧顯示介面埠120‧‧‧Display interface埠

130‧‧‧控制介面130‧‧‧Control interface

140‧‧‧測試按鈕140‧‧‧Test button

150‧‧‧接腳150‧‧‧ feet

160‧‧‧電源接頭160‧‧‧Power connector

170‧‧‧顯示器170‧‧‧ display

180‧‧‧電連接埠180‧‧‧Electrical connection埠

190‧‧‧切換開關190‧‧‧Toggle switch

200‧‧‧測試指示燈200‧‧‧ test indicator

210‧‧‧蜂鳴器210‧‧‧ buzzer

220‧‧‧電池220‧‧‧Battery

300‧‧‧電腦裝置300‧‧‧ computer equipment

400‧‧‧電磁鐵裝置400‧‧‧Electromagnetic device

500‧‧‧現場即時資訊系統500‧‧‧On-site real-time information system

第1圖為本發明第一實施例之檢測治具的立體示意圖。Fig. 1 is a perspective view showing the detecting jig of the first embodiment of the present invention.

第2圖為本發明第一實施例之檢測治具的使用狀態示意圖。Fig. 2 is a schematic view showing the state of use of the detecting jig according to the first embodiment of the present invention.

第3圖為本發明第一實施例之電腦裝置的檢測方法的步驟流程圖。Fig. 3 is a flow chart showing the steps of the detecting method of the computer device according to the first embodiment of the present invention.

第4圖為本發明第二實施例之檢測治具的立體示意圖。Fig. 4 is a perspective view showing the detecting jig of the second embodiment of the present invention.

第5圖為本發明第二實施例之檢測治具的使用狀態示意圖。Fig. 5 is a view showing the state of use of the detecting jig according to the second embodiment of the present invention.

第6圖為本發明第二實施例之電腦裝置的檢測方法的步驟流程圖。Figure 6 is a flow chart showing the steps of a method for detecting a computer device according to a second embodiment of the present invention.

第7圖為本發明第三實施例之檢測治具的立體示意圖。Fig. 7 is a perspective view showing the detecting jig of the third embodiment of the present invention.

第1圖所示為本發明第一實施例之檢測治具的示意圖,以及第2圖所示為本發明第一實施例之檢測治具的使用狀態示意圖,並請同時參照第3圖所示之第一實施例之電腦裝置的檢測方法的步驟流程圖。1 is a schematic view showing a detecting jig according to a first embodiment of the present invention, and FIG. 2 is a schematic view showing a state of use of the detecting jig according to the first embodiment of the present invention, and referring to FIG. 3 at the same time. A flow chart of the steps of the detection method of the computer device of the first embodiment.

請參閱第1圖至第3圖,本發明第一實施例之檢測治具100係適用於電腦裝置300在出貨之前的品質檢測,本發明實施例的檢測治具100是用以檢測電腦裝置300是否可被觸發而確實的進入休眠狀態。另外,本發明所揭露各實施例的電腦裝置300可以是桌上型電腦、筆記型電腦、或是任何可連接電腦周邊裝置的電子產品,並不以此為限,以下本發明的詳細說明中,將以筆記型電腦做為本發明之最佳實施例,然而所附圖式僅提供參考與說明用,並非用以限制本發明。Referring to FIG. 1 to FIG. 3 , the detecting jig 100 of the first embodiment of the present invention is suitable for quality testing of the computer device 300 before shipment, and the detecting jig 100 of the embodiment of the present invention is for detecting a computer device. Whether 300 can be triggered and actually goes to sleep. In addition, the computer device 300 of the embodiments of the present invention may be a desktop computer, a notebook computer, or any electronic product that can be connected to a computer peripheral device, and is not limited thereto. In the following detailed description of the present invention, The notebook computer will be the preferred embodiment of the present invention, but the drawings are only for reference and explanation, and are not intended to limit the present invention.

本發明第一實施例之檢測治具100包括有一電路板110、一顯示介面埠120、一控制介面130及一測試按鈕140,其中電路板110電性設置有一控制晶片111,例如為8051單晶片,但並不以此為限。在測試程序開始之前,檢測人員可對檢測治具100的測試參數進行設定,並儲存在控制晶片111中做為預設參數,如第3圖所示的S500步驟。於本實施例中,係以待檢測的電腦裝置300之軟體程式設定(set)、重置(reload)、刪除(delete)例如治具版本、測試機種、接收訊號的間隔時間、啟動電磁鐵裝置400的間隔時間、測試記錄等測試參數,但不以此為限。The test fixture 100 of the first embodiment of the present invention includes a circuit board 110, a display interface 120, a control interface 130, and a test button 140. The circuit board 110 is electrically disposed with a control chip 111, such as an 8051 single chip. , but not limited to this. Before the test procedure begins, the tester can set the test parameters of the test fixture 100 and store them in the control wafer 111 as preset parameters, as shown in step S500 of FIG. In this embodiment, the software program of the computer device 300 to be detected is set, reloaded, deleted, for example, the fixture version, the test model, the interval between receiving signals, and the start of the electromagnet device. Test parameters such as interval time of 400, test record, etc., but not limited to this.

本實施例的顯示介面埠120係電性設置於電路板110上,其中本實施例的顯示介面埠120可為高解析度多媒體介面埠(HDMI,high-definition multimedia interface)或者是D-Sub埠等接收影音訊號的電性連接埠,但並不以本發明所揭露的連接埠種類為限。顯示介面埠120係電性連接於電腦裝置300,使得檢測治具100與電腦裝置300之間構成電性連接關係(如第3圖所示之S510步驟)。並且,顯示介面埠120接收電腦裝置300於休眠狀態所輸出的休眠訊號,而電腦裝置300的休眠訊號即為一影像訊號。The display interface 120 of the embodiment is electrically disposed on the circuit board 110. The display interface 120 of the embodiment may be a high-definition multimedia interface (HDMI) or a D-Sub port. The electrical connection of the audio and video signals is received, but is not limited to the type of connection disclosed in the present invention. The display interface 120 is electrically connected to the computer device 300 such that the detection fixture 100 and the computer device 300 form an electrical connection relationship (step S510 shown in FIG. 3). Moreover, the display interface 120 receives the sleep signal output by the computer device 300 in the sleep state, and the sleep signal of the computer device 300 is an image signal.

請參閱第1圖至第3圖,本實施例之控制介面130為一通用 型輸入輸出介面(GPIO,generator purpose input/output),控制介面130電性設置於電路板110上,且控制介面130電性連接一電磁鐵裝置400(electromagnet)。此一電磁鐵裝置400係藉由一支架而鄰近設置於電腦裝置300。Referring to FIG. 1 to FIG. 3, the control interface 130 of the embodiment is a general purpose. The control interface 130 is electrically disposed on the circuit board 110, and the control interface 130 is electrically connected to an electromagnet device 400 (electromagnet). The electromagnet device 400 is disposed adjacent to the computer device 300 by a bracket.

測試按鈕140是電性設置於電路板110上,並且可選擇性的被按壓。當測試按鈕140被按壓,即觸發控制介面130輸出一測試訊號至電磁鐵裝置400,而電磁鐵裝置400被啟動並且觸發電腦裝置300進入休眠狀態,如第3圖所示的S520步驟。The test button 140 is electrically disposed on the circuit board 110 and is selectively pressed. When the test button 140 is pressed, the trigger control interface 130 outputs a test signal to the electromagnet device 400, and the electromagnet device 400 is activated and triggers the computer device 300 to enter a sleep state, as shown in step S520 of FIG.

詳細而言,電腦裝置300的上蓋內藏有一感應器(圖中未示),電磁鐵裝置400即是鄰近設置於此一感應器,當電磁鐵裝置400透過通用型輸入輸出介面而接收到測試訊號後,電磁鐵裝置400即被啟動並產生一電磁訊號。位於電腦裝置300上蓋的感應器偵測到電磁鐵裝置400的電磁訊號後,感應器對應發出一訊號給電腦裝置300,命令電腦裝置300進入休眠狀態。In detail, the upper cover of the computer device 300 has a sensor (not shown), and the electromagnet device 400 is disposed adjacent to the sensor. When the electromagnet device 400 passes through the universal input/output interface, the test is received. After the signal, the electromagnet device 400 is activated and generates an electromagnetic signal. After the sensor located on the cover of the computer device 300 detects the electromagnetic signal of the electromagnet device 400, the sensor sends a signal to the computer device 300 to command the computer device 300 to enter a sleep state.

此時,檢測治具100的控制晶片111根據目前所設定的測試參數判斷是否有接收到電腦裝置300發出的休眠訊號,如第3圖所示的S530步驟。若控制晶片111接收到休眠訊號,則確認電腦裝置300確實進入休眠狀態,因此檢測人員可以得知此一電腦裝置300為正常的良品;若控制晶片111未接收到休眠訊號,則判斷電腦裝置300未依照電磁鐵裝置400的觸發而進入休眠狀態,因此檢測人員可以得知目前所檢測的電腦裝置300為不良品。At this time, the control chip 111 of the detecting jig 100 determines whether or not the sleep signal sent by the computer device 300 is received according to the currently set test parameter, as shown in step S530 of FIG. If the control chip 111 receives the sleep signal, it is confirmed that the computer device 300 is indeed in the sleep state, so the tester can know that the computer device 300 is a normal good product; if the control chip 111 does not receive the sleep signal, the computer device 300 is determined. The sleep state is not entered according to the trigger of the electromagnet device 400, so the tester can know that the currently detected computer device 300 is a defective product.

第4圖所示為本發明第二實施例之檢測治具的示意圖,第5圖為本發明第二實施例之檢測治具的使用狀態示意圖,以及第6圖所示之第二實施例之電腦裝置的檢測方法的步驟流程圖。在本發明所揭露的第二實施例中,其檢測治具100與第一實施例所揭露者在結構上大致相同,而第二實施例的檢測治具100更增加多個電子零組件,使本發明的檢測治具100得以具備更多元化的執行功能,申請人將於下述內容中清楚說明二實施例的不同之處。4 is a schematic view showing a detecting jig according to a second embodiment of the present invention, and FIG. 5 is a schematic view showing a state of use of the detecting jig according to the second embodiment of the present invention, and a second embodiment shown in FIG. A flow chart of the steps of the detection method of the computer device. In the second embodiment of the present invention, the detecting jig 100 is substantially identical in structure to the first embodiment, and the detecting jig 100 of the second embodiment further adds a plurality of electronic components. The test fixture 100 of the present invention is capable of having a more diverse execution function, and the Applicant will clearly clarify the differences between the two embodiments in the following.

請參閱第4圖至第6圖,本發明第二實施例之檢測治具100除了包括電路板110、二顯示介面埠120、控制介面130及測試按鈕140之 外,更包括有多組接腳150、一電源接頭160、一顯示器170、一電連接埠180(COM port)、一切換開關190、一測試指示燈200及一蜂鳴器210。Referring to FIG. 4 to FIG. 6 , the detecting jig 100 of the second embodiment of the present invention includes a circuit board 110 , two display interfaces 埠 120 , a control interface 130 , and a test button 140 . In addition, there are a plurality of sets of pins 150, a power connector 160, a display 170, an electrical port 180 (COM port), a switch 190, a test indicator 200, and a buzzer 210.

本實施例所述的二顯示介面埠120分別為高解析度多媒體介面埠及D-Sub埠,本實施例之檢測治具100可選擇以其中一顯示介面埠120與電腦裝置300電性連接,如第6圖所示的S610步驟,藉以做為接收電腦裝置300所傳輸之休眠訊號的通道。值得注意的是,熟悉此項技術的人員,可根據實際使用需求更換本發明之顯示介面埠120的種類,只要顯示介面埠120可以接收電腦裝置300所傳輸的影像訊號即可,並不以本發明所揭露之實施例為限。本實施例之多組接腳150電性設置於電路板110上,且這些接腳150是分別對應二顯示介面埠120。以本實施例為例,本實施例是採用五組接腳150,而各組接腳150是分別接收高解析度多媒體介面埠的電壓訊號、D-Sub埠的電壓訊號、D-Sub埠的VS訊號、D-Sub埠的Clock訊號或是D-Sub埠的Data訊號。藉由跳線器(jumper)插接在其中一組接腳150並電性導通,如第6圖所示的S640步驟,以指定對應此一電性導通之接腳150的顯示介面埠120接收電腦裝置300所傳送的休眠訊號。The display interface 100 of the present embodiment is a high-resolution multimedia interface and a D-Sub, respectively. The detection fixture 100 of the embodiment can be electrically connected to the computer device 300 by one of the display interfaces 120. The step S610 shown in FIG. 6 is used as a channel for receiving the sleep signal transmitted by the computer device 300. It should be noted that those skilled in the art can change the type of the display interface 120 of the present invention according to actual needs, as long as the display interface 120 can receive the image signal transmitted by the computer device 300, The embodiments disclosed in the invention are limited. The plurality of pins 150 of the embodiment are electrically disposed on the circuit board 110, and the pins 150 correspond to the two display interfaces 120, respectively. Taking this embodiment as an example, in this embodiment, five sets of pins 150 are used, and each set of pins 150 respectively receives a voltage signal of a high-resolution multimedia interface, a voltage signal of D-Sub埠, and a D-Sub埠. VS signal, D-Sub埠's Clock signal or D-Sub's Data signal. The jumper is plugged into one of the pins 150 and electrically turned on, as in step S640 shown in FIG. 6, to designate the display interface 埠120 corresponding to the pin 150 of the electrical continuity. The sleep signal transmitted by the computer device 300.

請參閱第4圖至第6圖,本實施例之電源接頭160係電性設置於電路板110上,檢測治具100係以電源接頭160與電腦裝置300相耦接,並且電腦裝置300透過電源接頭160將電能提供給檢測治具100,讓檢測治具100可順利的執行檢測工作。值得注意的是,本發明之檢測治具100除了接收電腦裝置300所提供的所需電能之外,更可以在電路板110上設置一電池220,如第7圖所示第三實施例之檢測治具的立體示意圖。本發明第三實施例的檢測治具100可以使用內建的電池提供所需的電能,不需要再耦接外部的電源。Referring to FIG. 4 to FIG. 6 , the power connector 160 of the embodiment is electrically disposed on the circuit board 110 , and the detecting fixture 100 is coupled to the computer device 300 by the power connector 160 , and the computer device 300 transmits power. The connector 160 supplies electric energy to the detecting jig 100, so that the detecting jig 100 can smoothly perform the detecting work. It should be noted that, in addition to receiving the required power provided by the computer device 300, the detecting fixture 100 of the present invention can further provide a battery 220 on the circuit board 110, as in the third embodiment shown in FIG. A three-dimensional diagram of the fixture. The test fixture 100 of the third embodiment of the present invention can provide the required power using a built-in battery without the need to couple an external power source.

另外,本實施例之顯示器170為一七段顯示器(seven-segment display),但並不以此為限。顯示器170電性設置於電路板110上,用以顯示當前儲存於控制晶片111內的測試參數(例如間隔時間或是計數次數),如第6圖所示的S650步驟。本實施例之電連接埠180係電性設置於電路板110上,且電連接埠180係電性連接於一現場即時資訊系統(SFIS)500。當控制晶片111接收到電腦裝置300發出的休眠訊號時,控制晶片111對應產生一測試通過訊號,藉由電連接埠180將此一測試通過訊號傳送至現場即時資訊 系統500,記錄最終的檢測結果,如第6圖所示的S660步驟;當控制晶片111未接收到電腦裝置300發出的休眠訊號時,控制晶片111對應產生一測試未通過訊號,藉由電連接埠180將此一測試未通過訊號傳送至現場即時資訊系統500,記錄最終的檢測結果,如第6圖所示的S660步驟。In addition, the display 170 of the embodiment is a seven-segment display, but is not limited thereto. The display 170 is electrically disposed on the circuit board 110 for displaying test parameters (such as interval time or number of counts) currently stored in the control wafer 111, as shown in step S650 of FIG. The electrical connection 180 of the embodiment is electrically disposed on the circuit board 110, and the electrical connection 180 is electrically connected to a live instant information system (SFIS) 500. When the control chip 111 receives the sleep signal from the computer device 300, the control chip 111 generates a test pass signal, and the test signal is transmitted to the live message through the electrical connection 埠180. The system 500 records the final detection result, as shown in step S660 of FIG. 6. When the control chip 111 does not receive the sleep signal from the computer device 300, the control chip 111 generates a test fail signal corresponding to the electrical connection. The 埠180 transmits the test untransferred signal to the live instant messaging system 500, and records the final detection result, as shown in step S660 of FIG.

另外,本實施例之切換開關190係電性設置於電路板111上,當測試程序開始之前,檢測人員可對檢測治具100的測試參數進行設定,如第6圖所示的S600步驟。即,觸發切換開關190為設定模式(setup mode),再搭配待檢測的電腦裝置300之軟體程式設定(set)、重置(reload)、刪除(delete)例如治具版本、測試機種、接收訊號的間隔時間、測試記錄等測試參數,最後將設定完成的測試參數儲存至控制晶片111中。In addition, the switch 190 of the embodiment is electrically disposed on the circuit board 111. Before the test program starts, the tester can set the test parameters of the test fixture 100, as shown in step S600 of FIG. That is, the trigger switch 190 is set to a setup mode, and is further configured with a software program set (set), reset (reload), delete (delete), for example, a fixture version, a test model, and a receive signal of the computer device 300 to be detected. The test parameters such as interval time, test record, etc., and finally the set test parameters are stored in the control chip 111.

如第4圖至第6圖所示,本實施例之測試指示燈200可為燈泡或是發光二極體(LED,light emitting diode),並不以此為限。測試指示燈200係電性設置於電路板110上,當控制介面130輸出測試訊號時,如第6圖所示的S620步驟,此時測試指示燈200是顯示第一指示訊號;當控制晶片111接收到休眠訊號時,此時測試指示燈200是顯示第二指示訊號;當控制晶片111在一段時間內未接收到休眠訊號時,此時測試指示燈200是顯示第三指示訊號。其中,本實施例所述的第一指示訊號為測試指示燈200發出綠色閃爍光線,第二指示訊號為測試指示燈200持續發出綠色光線,第三指示訊號為測試指示燈200持續發出紅色光線。本發明之測試指示燈200所產生的各指示訊號並不侷限上述的實施態樣,熟悉此項技術的人員可隨意更改指示訊號的警示方式。As shown in FIG. 4 to FIG. 6 , the test indicator 200 of the embodiment may be a light bulb or a light emitting diode (LED), and is not limited thereto. The test indicator 200 is electrically disposed on the circuit board 110. When the control interface 130 outputs the test signal, as shown in step S620 of FIG. 6, the test indicator 200 displays the first indication signal; when the control chip 111 is When the sleep signal is received, the test indicator 200 displays the second indication signal; when the control chip 111 does not receive the sleep signal for a period of time, the test indicator 200 displays the third indication signal. The first indication signal in the embodiment is that the test indicator 200 emits green flashing light, the second indication signal is that the test indicator 200 continuously emits green light, and the third indication signal is that the test indicator 200 continuously emits red light. The indication signals generated by the test indicator lamp 200 of the present invention are not limited to the above-described implementation manner, and those skilled in the art can freely change the warning mode of the indication signal.

另外,本實施例之蜂鳴器210係電性設置於電路板110上,當控制晶片111接收到休眠訊號時,此時蜂鳴器210是發出第一識別聲音訊號;當控制晶片111在一段時間內未接收到休眠訊號時,此時蜂鳴器210是顯示第二識別聲音訊號。其中,本實施例所述的第一識別聲音訊號為蜂鳴器210發出三聲嗶嗶聲響,第二識別聲音訊號為蜂鳴器210發出一聲長音的嗶嗶聲響。本發明之蜂鳴器210所產生的各識別聲音訊號並不侷限上述的實施態樣,熟悉此項技術的人員可隨意更改識別聲音訊號的警示方式。In addition, the buzzer 210 of the embodiment is electrically disposed on the circuit board 110. When the control chip 111 receives the sleep signal, the buzzer 210 emits the first identification sound signal; when the control chip 111 is in a section When the sleep signal is not received within the time, the buzzer 210 displays the second recognized sound signal at this time. The first recognized sound signal in the embodiment is that the buzzer 210 emits three beeps, and the second recognized sound signal is that the buzzer 210 emits a long beep. The identification sound signals generated by the buzzer 210 of the present invention are not limited to the above-described embodiments, and those skilled in the art can arbitrarily change the warning mode for recognizing the sound signals.

基於上述,本發明之測試治具及測試方法可適用於各種規格的電腦裝置,達到自動化執行檢測程序之目的,降低了檢測程序所需耗 費的成本。並且,本發明的測試治具及測試方法可同時對多台電腦裝置進行休眠模式的測試,並將測試結果記錄於現場即時資訊系統,亦可藉由指示燈及/或蜂鳴器提供警示訊號。Based on the above, the test fixture and the test method of the present invention can be applied to computer devices of various specifications, and the purpose of automatically executing the test program is achieved, and the cost of the test program is reduced. The cost of the fee. Moreover, the test fixture and the test method of the present invention can perform the sleep mode test on multiple computer devices at the same time, and record the test result in the on-site real-time information system, and provide the warning signal by the indicator light and/or the buzzer. .

雖然本發明之實施例揭露如上所述,然並非用以限定本發明,任何熟習相關技藝者,在不脫離本發明之精神和範圍內,舉凡依本發明申請範圍所述之形狀、構造、特徵及數量當可做些許之變更,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。Although the embodiments of the present invention are disclosed above, it is not intended to limit the present invention, and those skilled in the art, regardless of the spirit and scope of the present invention, the shapes, structures, and features described in the scope of the present application. And the number of modifications may be made, and the scope of patent protection of the present invention shall be determined by the scope of the patent application attached to the specification.

100‧‧‧檢測治具100‧‧‧Test fixture

110‧‧‧電路板110‧‧‧Circuit board

111‧‧‧控制晶片111‧‧‧Control chip

120‧‧‧顯示介面埠120‧‧‧Display interface埠

130‧‧‧控制介面130‧‧‧Control interface

140‧‧‧測試按鈕140‧‧‧Test button

150‧‧‧接腳150‧‧‧ feet

160‧‧‧電源接頭160‧‧‧Power connector

170‧‧‧顯示器170‧‧‧ display

180‧‧‧電連接埠180‧‧‧Electrical connection埠

190‧‧‧切換開關190‧‧‧Toggle switch

200‧‧‧測試指示燈200‧‧‧ test indicator

210‧‧‧蜂鳴器210‧‧‧ buzzer

Claims (20)

一種檢測治具,適用於一電腦裝置,該電腦裝置內部設置一感應器,用以偵測一電磁訊號後對應發出一休眠訊號至該電腦裝置;該檢測治具包括:一電路板,其具有一控制晶片,且該控制晶片儲存有一測試參數;至少一顯示介面埠,電性設置於該電路板上,該顯示介面埠電性連接於該電腦裝置,該顯示介面埠接收該電腦裝置於休眠狀態所輸出的一休眠訊號;以及一控制介面,電性設置於該電路板上,該控制介面電性連接一電磁鐵裝置,且該電磁鐵裝置鄰近於該電腦裝置的感應器,當該控制介面輸出一測試訊號至該電磁鐵裝置,該電磁鐵裝置被啟動並產生該電磁訊號,令該感應器偵測該電磁訊號而發出該休眠訊號以觸發該電腦裝置進入休眠狀態;其中,該控制晶片根據該測試參數判斷是否接收到該休眠訊號,若該控制晶片接收到該休眠訊號,確認該電腦裝置進入休眠狀態。 A detecting device is provided for a computer device, wherein the computer device is internally provided with a sensor for detecting an electromagnetic signal and correspondingly issuing a sleep signal to the computer device; the detecting fixture comprises: a circuit board having a control chip, and the control chip stores a test parameter; at least one display interface is electrically disposed on the circuit board, the display interface is electrically connected to the computer device, and the display interface receives the computer device to sleep a sleep signal outputted by the state; and a control interface electrically disposed on the circuit board, the control interface is electrically connected to an electromagnet device, and the electromagnet device is adjacent to the sensor of the computer device when the control The interface outputs a test signal to the electromagnet device, the electromagnet device is activated to generate the electromagnetic signal, and the sensor detects the electromagnetic signal to emit the sleep signal to trigger the computer device to enter a sleep state; wherein the control The chip determines whether the sleep signal is received according to the test parameter, and if the control chip receives the sleep signal, confirms the Cerebral device to sleep. 根據申請專利範圍第1項之檢測治具,其中更包括有二該顯示介面埠,分別為高解析度多媒體介面埠及D-Sub埠。 According to the test fixture of the first application of the patent scope, there are two display interfaces, namely a high-resolution multimedia interface and a D-Sub埠. 根據申請專利範圍第2項之檢測治具,其中更包括有至少二組接腳,電性設置於該電路板上,該二組接腳係分別對應該二顯示介面埠,並電性導通其中一組該接腳,令對應於該組接腳之該顯示介面埠接收該休眠訊號。 According to the test fixture of the second aspect of the patent application, the method further includes at least two sets of pins electrically disposed on the circuit board, and the two sets of pins respectively correspond to the display interface 埠, and electrically conductively A set of the pins causes the display interface corresponding to the set of pins to receive the sleep signal. 根據申請專利範圍第1項之檢測治具,其中該控制介面係為通用型輸入輸出介面。 According to the test fixture of the first application of the patent scope, the control interface is a general-purpose input/output interface. 根據申請專利範圍第1項之檢測治具,其中更包括有一電源接頭,電性設置於該電路板上,該電源接頭與該電腦裝置耦接,藉由該電源接頭提供一電能至該檢測治具。 The test fixture according to the first aspect of the patent application, further comprising a power connector electrically disposed on the circuit board, the power connector being coupled to the computer device, wherein the power connector provides an electric energy to the detection and treatment With. 根據申請專利範圍第1項之檢測治具,其中更包括有一電池,電性設置於該電路板上,該電池提供一電能至該檢測治具。 The test fixture of claim 1, further comprising a battery electrically disposed on the circuit board, the battery providing an electrical energy to the test fixture. 根據申請專利範圍第1項之檢測治具,其中更包括有一顯示器,電性設置於該電路板上,該顯示器用以顯示該測試參數。 The test fixture of claim 1, further comprising a display electrically disposed on the circuit board, the display being configured to display the test parameter. 根據申請專利範圍第1項之檢測治具,其中更包括有一電連接埠,電性設置於該電路板上,該電連接埠電性連接於一現場即時資訊系統,當該控制晶片接收到該休眠訊號,該控制晶片對應產生一測試通過訊號,當該控制晶片未接收到該休眠訊號,該控制晶片對應產生一測試未通過訊號,該電連接埠係傳送該測試通過訊號或該測試未通過訊號至該現場即時資訊系統。 According to the test fixture of claim 1, the method further includes an electrical connection, electrically disposed on the circuit board, the electrical connection is electrically connected to a live instant information system, and when the control chip receives the a sleep signal, the control chip correspondingly generates a test pass signal, and when the control chip does not receive the sleep signal, the control chip correspondingly generates a test fail signal, and the electrical connection transmits the test pass signal or the test fails Signal to the live instant messaging system. 根據申請專利範圍第1項之檢測治具,其中更包括有一測試按鈕,電性設置於該電路板上,當該測試按鈕被按壓,該控制介面輸出該測試訊號至該電磁鐵裝置,令電磁鐵裝置觸發該電腦裝置進入休眠狀態。 According to the test fixture of claim 1, the method further includes a test button electrically disposed on the circuit board, and when the test button is pressed, the control interface outputs the test signal to the electromagnet device to make the electromagnetic The iron device triggers the computer device to enter a sleep state. 根據申請專利範圍第1項之檢測治具,其中更包括有一切換開關,電性設置於該電路板上,當該切換開關被觸發, 藉由該電腦裝置之一軟體程式設定儲存於該控制晶片的該測試參數。 According to the test fixture of the first aspect of the patent application, the method further includes a switch, electrically disposed on the circuit board, when the switch is triggered, The test parameter stored in the control chip is set by a software program of the computer device. 根據申請專利範圍第1項之檢測治具,其中更包括有一測試指示燈,電性設置於該電路板上,當該控制介面輸出該測試訊號,該測試指示燈顯示一第一指示訊號;當該控制晶片接收到該休眠訊號,該測試指示燈顯示一第二指示訊號;當該控制晶片未接收到該休眠訊號,該測試指示燈顯示一第三指示訊號。 The test fixture according to the first aspect of the patent application, further comprising a test indicator electrically disposed on the circuit board, and when the control interface outputs the test signal, the test indicator light displays a first indication signal; The control chip receives the sleep signal, and the test indicator displays a second indication signal; when the control chip does not receive the sleep signal, the test indicator displays a third indication signal. 根據申請專利範圍第1項之檢測治具,其中更包括有一蜂鳴器,電性設置於該電路板上,當該控制晶片接收到該休眠訊號,該蜂鳴器發出一第一識別聲音訊號;當該控制晶片未接收到該休眠訊號,該蜂鳴器發出一第二識別聲音訊號。 The detecting fixture according to the first aspect of the patent application, further comprising a buzzer electrically disposed on the circuit board, and when the control chip receives the sleep signal, the buzzer emits a first identifying sound signal When the control chip does not receive the sleep signal, the buzzer sends a second identification sound signal. 一種電腦裝置的檢測方法,用以檢測一電腦裝置,該電腦裝置內部設置一感應器,用以偵測一電磁訊號後對應發出一休眠訊號至該電腦裝置;該檢測方法包含以下步驟:提供一檢測治具,並設定該檢測治具的測試參數;電性連接該檢測治具與一電腦裝置;按壓該檢測治具的一測試按鈕,令該檢測治具的一控制介面輸出一測試訊號,啟動一電磁鐵裝置產生該電磁訊號,令該感應器偵測該電磁訊號而發出該休眠訊號以觸發該電腦裝置進入休眠狀態;以及 以該檢測治具判斷是否接收到該電腦裝置於休眠狀態所輸出的一休眠訊號,若該檢測治具接收到該休眠訊號,確認該電腦裝置進入休眠狀態。 A computer device detecting method for detecting a computer device, wherein the computer device is internally provided with a sensor for detecting an electromagnetic signal and correspondingly issuing a sleep signal to the computer device; the detecting method comprises the following steps: providing a Detecting a fixture and setting test parameters of the test fixture; electrically connecting the test fixture to a computer device; pressing a test button of the test fixture to output a test signal to a control interface of the test fixture Activating an electromagnet device to generate the electromagnetic signal, causing the sensor to detect the electromagnetic signal to emit the sleep signal to trigger the computer device to enter a sleep state; The detection fixture determines whether a sleep signal output by the computer device in the sleep state is received, and if the detection fixture receives the sleep signal, confirms that the computer device enters a sleep state. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中更包括:電性導通該檢測治具的多組接腳之其中一組該接腳,令對應於該組接腳之一顯示介面埠接收該休眠訊號。 The method for detecting a computer device according to claim 13 , further comprising: electrically turning on one of the plurality of sets of pins of the detecting jig, and displaying an interface corresponding to one of the set of pins 埠Receive the sleep signal. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中於設定該檢測治具的測試參數之步驟中,係以該檢測治具的一切換開關與該電腦裝置的一軟體程式設定該檢測治具的測試參數。 According to the method for detecting a computer device according to claim 13, wherein in the step of setting the test parameter of the test fixture, the switch is set by a switch of the test fixture and a software program of the computer device Test parameters. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中更包括有以下步驟:以一顯示器顯示目前設定之測試參數。 The method for detecting a computer device according to claim 13 of the patent application, further comprising the step of: displaying the currently set test parameter by a display. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中於該檢測治具判斷是否接收到該休眠訊號的步驟之後,當該檢測治具接收到該休眠訊號,傳送一測試通過訊號至一現場即時資訊系統;當該檢測治具未接收到該休眠訊號,傳送一測試未通過訊號至該現場即時資訊系統。 According to the method for detecting a computer device according to claim 13, wherein after the detecting jig determines whether the sleep signal is received, when the detecting jig receives the sleep signal, transmitting a test pass signal to a site The instant information system; when the detection fixture does not receive the sleep signal, transmitting a test failure signal to the live instant information system. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中於該檢測治具輸出該測試訊號至該電腦裝置的步驟中,以一測試指示燈顯示一第一指示訊號。 The method for detecting a computer device according to claim 13 wherein, in the step of outputting the test signal to the computer device, the test indicator displays a first indication signal. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中於該檢測治具判斷是否接收到該休眠訊號的步驟中,當該檢測治具接收到該休眠訊號,以一測試指示燈顯示一第二指示訊號;當該檢測治具未接收到該休眠訊號,以該測試指示燈顯示一第三指示訊號。 The method for detecting a computer device according to claim 13 , wherein in the step of determining whether the detection fixture receives the sleep signal, when the detection fixture receives the sleep signal, displaying a test indicator The second indication signal; when the detection fixture does not receive the sleep signal, the test indicator displays a third indication signal. 根據申請專利範圍第13項之電腦裝置的檢測方法,其中 於該檢測治具判斷是否接收到該電腦裝置於休眠狀態所輸出的該休眠訊號的步驟中,當該檢測治具接收到該休眠訊號,以一蜂鳴器發出一第一識別聲音訊號;當該檢測治具未接收到該休眠訊號,以該蜂鳴器發出一第二識別聲音訊號。 According to the method for detecting a computer device according to claim 13 of the patent application scope, wherein In the step of determining whether the detection fixture receives the sleep signal output by the computer device in a sleep state, when the detection fixture receives the sleep signal, a buzzer sends a first identification sound signal; The detection fixture does not receive the sleep signal, and the buzzer sends a second identification sound signal.
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