CN107957523A

CN107957523A - Detection device

Info

Publication number: CN107957523A
Application number: CN201711179695.4A
Authority: CN
Inventors: 黄子信
Original assignee: Darfon Electronics Suzhou Co Ltd
Current assignee: Darfon Electronics Suzhou Co Ltd
Priority date: 2017-11-23
Filing date: 2017-11-23
Publication date: 2018-04-24

Abstract

A kind of detection device, is related to the detection device field of electronic device.It is related to field of display devices.The technical problem to be solved in the present invention is to provide a kind of equipment that can be tested electronic device and its subcomponent.The detection device of the present invention includes：Accommodation unit；The the first detection plate moved relative to the accommodation unit between contact position and vacant position；The the second detection plate moved relative to the described first detection plate between sync bit and separation point position；Start the first control units part of the first detection plate detection signal；Start the second control unit of the second detection plate detection signal；When the described first detection plate is located at the contact position and the second detection plate is located at the sync bit, the second control unit triggering；When the described first detection plate is located at the contact position and the second detection plate is located at the separation point position, the first control units part triggering.

Description

Detection device

【Technical field】

The present invention relates to a kind of detection device, more particularly to a kind of detection device of electronic device.

【Background technology】

Electronic device will carry out electrical detection before dispatching from the factory to it, to confirm that function is intact.Some electronic device sheets Body is made of multiple subcomponents, often also needs to individually test subcomponent.By taking the inverter for driving fluorescent tube as an example, It includes at least one coil, in addition to inverter overall performance to be tested, also the impedance of coil is being carried out before dispatching from the factory Test.It is to test the impedance of coil and the overall performance with inverter respectively using two equipment in existing production process, this With regard to needing two stations, human cost is high, and time-consuming for detection.

【The content of the invention】

Set the technical problem to be solved in the present invention is to provide a kind of to what electronic device and its subcomponent can be tested It is standby.It is an object of the present invention to provide a kind of detection device, it includes：Accommodation unit；Relatively described accommodation unit is contacting The the first detection plate moved between position and vacant position；Relatively described first detection plate is between sync bit and separation point position The second mobile detection plate；Start the first control units part of the first detection plate detection signal；Start second inspection Drafting board part detects the second control unit of signal；When the described first detection plate is positioned at the contact position and second detection plate When part is located at the sync bit, the second control unit triggering；When described first detection plate positioned at it is described contact position and When the second detection plate is located at the separation point position, the first control units part triggering.

As optional technical solution, the first control units part or the second control unit are travel switch, by described Second detection plate contradicts triggering.

As optional technical solution, the bottom surface of the first detection plate or the second detection plate has multiple surveys Sound out pin.

As optional technical solution, the detection device includes：Control it is described first detection plate contact position with The first depression bar assembly moved between vacant position；The second detection plate is controlled to be moved between sync bit and separation point position The second depression bar assembly.

As optional technical solution, the second detection plate is coil impedance test board；The first detection plate For inverter functional test plate.

It is a further object to provide a kind of electron device testing method, it includes：

Step 1：Above-mentioned detection device is provided, and initializes the first detection plate to the vacant position,

The second detection plate is initialized to the sync bit；

Step 2：Device under test is placed on the accommodation unit；

Step 3：The mobile first detection plate to the contact position, the second detection plate is maintained at the synchronization Position, to start the second detection plate detection signal；

Step 4：The mobile second detection plate is to the separation point position, to start the first detection plate detection news Number.

Benefit of the invention is to test electronic device and its subcomponent using an equipment, saves manpower And the time；And be avoided that two test between disturb, exclude damage device risk.

【Brief description of the drawings】

Fig. 1 is a kind of schematic elevation view of the detection device of one embodiment of the present invention under use state；

Fig. 2 is schematic elevation view of the detection device under another use state in Fig. 1；

Fig. 3 is schematic elevation view of the detection device under another use state in Fig. 1；

Fig. 4 is that the right side of the detection device in the Fig. 1 for depict the first depression bar assembly regards schematic diagram；

Fig. 5 is the schematic elevation view of the detection device in the Fig. 1 for depict the second depression bar assembly.

【Embodiment】

Please refer to Fig.1 to Fig. 3, Fig. 1 to Fig. 3 is the detection device of one embodiment of the present invention under three kinds of use states Schematic elevation view.The detection device of present embodiment includes：Accommodation unit 80, for carrying device under test 70；It is relatively described The first detection plate 10 that accommodation unit 80 moves between contact position and vacant position, the as shown in Figure 1 first detection plate phase It is in vacant position to accommodation unit 80, the first detection plate shown in Fig. 2 and Fig. 3 is in respect to accommodation unit 80 contacts position； The the second detection plate 20 moved relative to the described first detection plate 10 between sync bit and separation point position, such as Fig. 1 and Fig. 2 The relatively described first detection plate 10 of the second shown detection plate 20 is in sync bit, the second detection plate shown in Fig. 3 20 relatively described first detection plates 10 are in separation point position；Start the first control units of the first detection plate detection signal Part 31；Start the second control unit 32 of the second detection plate detection signal；Connect when the described first detection plate 10 is located at Touch position and the second detection plate 20 is when being located at sync bit, second control unit 32 triggers；When the first detection plate 10 When position is contacted and the second detection plate 20 is located at separation point position, the first control units part 31 triggers.In the present embodiment, first 31 or second control unit 32 of control unit is travel switch, and triggering is contradicted by the second detection plate 20.In the work shown in Fig. 2 Under state, the second detection plate 20 triggers the second control unit 32, at this moment detects signal generator (not illustrating) and passes through Circuit (not illustrating) provides detection signal to the second detection plate, and the subcomponent of device under test 70 is tested.Shown in Fig. 3 Working status under, second detection plate triggers the first control units part 31, at this moment detection signal generator pass through circuit Detection signal is provided to the first detection plate, device under test 70 carries out electrical testing.The first control units part 31 and second controls Component 32 controls the startup of the first detection plate detection signal and the second detection plate detection signal respectively, and by the second detection plate Part is triggered in diverse location to be started, and ensure that the first detection plate and the second detection plate will not work at the same time.To some electronics For device, while measurement device function (such as inverter function) and subcomponent parameter (such as coil impedance) can cause device Damage, the first detection plate and the second detection plate will not work at the same time that be advantageous in that can be to avoid such accident.At it In its embodiment, the first control units part and the second control unit can be other any switches in addition to travel switch, only Want it can be by the second detection plate triggering in specific location.

In the present embodiment, the bottom surface of the first detection plate or the second detection plate has multiple test probes 60, this Used to be connected with device under test, can be by testing probe and device to be measured when the first detection plate is in contact position The test point connection of part.When the first detection plate is in contact position, the second detection plate is in sync bit, the second detection plate Part can be connected by testing probe with subcomponent to be measured.Can be other realizations such as conductive rubber in other embodiments The material of conducting.

The detection device of present embodiment further includes the control first detection plate and is moved between contact position and vacant position Dynamic the first depression bar assembly (Fig. 1 is not illustrated into Fig. 3).Fig. 4 is refer again to, Fig. 4 is in the Fig. 1 for depict the first depression bar assembly The right side of detection device regard schematic diagram；First depression bar assembly includes the support column 41 being positioned on accommodation unit 80；It is positioned at One detects the driving column 42 on plate 10 and the handle 43 being respectively articulated with support column 41 and driving column 42.By pull-up and under Press the A ends of handle 43, so that it may so that the first detection 10 raising and lowering of plate.In addition detection device can also include several positioning Guide posts 44 on accommodation unit 80, guide posts make the first detection plate through the through hole (not illustrating) of the first detection plate 10 Part 10 will not occurred level movement during raising and lowering.The detection device of present embodiment further includes control described second The second depression bar assembly (not illustrated in Fig. 1 to Fig. 4) that detection plate 20 moves between sync bit and separation point position.Second pressure Bar assembly includes the support column 51 being positioned on the first detection plate 10；Be positioned at driving column 52 on the second detection plate 20 with And the handle 53 being respectively articulated with support column 51 and driving column 52.By the B ends for pulling up and pushing handle 53, so that it may so that second Detect opposite first detection, 10 raising and lowering of plate of plate 20.The structure of depression bar assembly has many kinds, numerous to list herein, And in other embodiments, it can realize the first detection plate and the second inspection using the lifting gear of any prior art The lifting of drafting board part, and be not limited to use depression bar assembly.

The electron device testing method of one embodiment of the present invention, it includes：

Step 1：The detection device of one embodiment of the present invention as shown in Figure 1 to Figure 3 is provided, and as shown in Figure 1 just The beginningization first detection plate 10 to the vacant position, initialization described second detects plate 20 to the sync bit；

Step 2：Device under test is placed as shown in Figure 1 on the accommodation unit 80；

Step 3：As shown in Fig. 2, the mobile first detection plate 10 to contact position, the second detection plate 20 is kept In sync bit, to start the detection signal of the second detection plate 20；

Step 4：The mobile second detection plate 20 is to the separation point position, to start the first detection plate 10 Detect signal.

Claims

A kind of 1. detection device, it is characterised in that including：

Accommodation unit；

First detection plate, is moved relative to the accommodation unit between contact position and vacant position；

Second detection plate, is moved relative to the described first detection plate between sync bit and separation point position；

The first control units part, to start the first detection plate detection signal；And

Second control unit, to start the second detection plate detection signal；

Wherein, when the described first detection plate is located at the sync bit positioned at the contact position and the second detection plate When, the second control unit triggering；When the described first detection plate is positioned at the contact position and the second detection plate position When the separation point position, the first control units part triggering.
2. detection device according to claim 1, it is characterised in that the first control units part or second control unit Part is travel switch, and triggering is contradicted by the described second detection plate.
3. detection device according to claim 1, it is characterised in that the first detection plate or second detection plate The bottom surface of part has multiple test probes.
4. detection device according to claim 1, it is characterised in that further include：

First depression bar assembly, the control first detection plate move between contact position and vacant position；And

Second depression bar assembly, control the second detection plate move between sync bit and separation point position.
5. detection device according to claim 1, it is characterised in that the second detection plate is tested for coil impedance Plate；The first detection plate is inverter functional test plate.