CN106771969B - Open-Short testing device and method for flexible circuit board touch screen substrate - Google Patents
Open-Short testing device and method for flexible circuit board touch screen substrate Download PDFInfo
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- CN106771969B CN106771969B CN201611187547.2A CN201611187547A CN106771969B CN 106771969 B CN106771969 B CN 106771969B CN 201611187547 A CN201611187547 A CN 201611187547A CN 106771969 B CN106771969 B CN 106771969B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The application discloses flexible line way board touch-sensitive screen base plate Open-Short testing arrangement includes: the touch screen comprises a touch screen substrate, an induction plate, an extrusion component, a switch plate and a measuring instrument, wherein the induction plate is arranged between the touch screen substrate and the switch plate, the touch screen substrate and the induction plate are close to and parallel to each other, the touch screen substrate and the induction plate are mutually adsorbed to form a large capacitor, and N conductive areas of the induction plate and N touch induction areas of the touch screen substrate are in one-to-one correspondence to form N small capacitors; when the device is used for testing open circuit, the extrusion component descends, the conductive part of the extrusion component is in contact with the chip area to realize conduction, the measuring instrument is used for measuring the capacitance value of each small capacitor, when the device is used for testing short circuit, the extrusion component ascends, the conductive part of the extrusion component is separated from the chip area, the measuring instrument is used for measuring the capacitance value between every two small capacitors, whether the touch screen substrate is open circuit or short circuit is judged according to the capacitance value, the device is convenient and efficient to test, a probe is not needed, and the touch screen substrate is not damaged. Correspondingly, the application also discloses a method for testing the touch screen substrate Open-Short based on the testing device.
Description
Technical Field
The application relates to the field of electronic instruments, in particular to an Open-Short testing device and method for a flexible circuit board touch screen substrate.
Background
With the arrival of the intelligent era, the touch screen has more and more extensive applications, along with the increasing and strong functions, the internal circuit of the touch screen also becomes more complex, the requirements on the production process are higher and higher, and through the ring detection in the production and manufacturing process, defective products can be found in time, so that the phenomenon that the defective products flow into the subsequent processes and even flow into the market is avoided. Therefore, how to detect the defective products quickly and efficiently is a key link in the production and manufacturing process of products. In the field of testing, the Open-Short test is the most common and most important test item. The Open test is used for testing whether the wiring between two test points connected together on a circuit is broken, and the Short test is used for testing whether the wiring between two test points irrelevant to the circuit is Short-circuited.
The touch screen has wide application occasions and different types, different touch screens have different testing methods, the current testing field mainly adopts a probe to connect an external testing circuit into a tested touch screen substrate, but the general probe easily stabs a tested product, a high-precision imported probe with micro elasticity is expensive, and in addition, a smaller pin interval has higher requirements on a visual positioning system and a mechanical motion system, so that testing equipment capable of meeting the requirements is often expensive, and the testing time is very long.
Disclosure of Invention
The application provides an Open-Short testing device and method for a flexible circuit board touch screen substrate, an induction capacitance method is adopted to test the Open circuit/Short circuit condition of a single-layer flexible circuit board touch screen substrate, the Open-Short testing process of the touch screen substrate is convenient and efficient, and the influence on a tested product can be avoided.
According to the first aspect of this application, this application provides a flexible line way board touch-sensitive screen base plate Open-Short testing arrangement for to the touch-sensitive screen base plate Open circuit/Short circuit test, the touch-sensitive screen base plate is including being a N touch-sensitive district and a chip district that the matrix was arranged, and the pin in chip district links to each other with touch-sensitive district one by one, the touch-sensitive screen base plate only the chip district is exposed, and all insulating cover layers of other parts, its characterized in that includes: the testing device comprises an induction plate, a switch plate, an extrusion component and a measuring instrument;
the touch screen substrate comprises a touch sensing area, a sensing board and a plurality of conductive areas, wherein the number of the conductive areas is the same as that of the touch sensing area, the size of the conductive areas is equivalent to that of the touch sensing area, the conductive areas and the touch sensing area are arranged in the same way, when the touch screen substrate is placed on the sensing board for testing, the conductive areas and the touch sensing area correspond to one another to form N small capacitors, the first connector comprises N pins, and the N pins are respectively connected with the N conductive areas in a one-to-one correspondence manner;
the switch board comprises a second connector, N switches, a controller and an I/O interface, wherein the second connector comprises N pins, and the N pins are respectively connected with the first ends of the N switches in a one-to-one correspondence manner; each switch is connected with one conductive area through the second connector and the first connector in an opposite insertion mode, the controller is respectively connected with control electrodes of the N switches, the I/O interface comprises N pins, and the N pins are respectively connected with second ends of the N switches in a one-to-one corresponding mode; when testing is carried out, the controller selects one or two switches to be switched on and the other switches to be switched off;
the extrusion component is arranged above the induction plate and can move, the extrusion component comprises a conductive part, the conductive part of the extrusion component is contacted with the chip area through moving to realize conduction during an open circuit test, and the conductive part of the extrusion component is separated from the chip area through moving during a short circuit test;
the measuring instrument comprises a first terminal and a second terminal, wherein the first terminal is connected with the conductive part of the extrusion component, the second terminal is connected with the I/O interface, and in the measuring process, the measuring instrument provides electric potentials for the first terminal and the second terminal and judges whether the touch screen substrate is broken or short-circuited or not through measuring capacitance values.
In some embodiments, a suction part is arranged on one side of the sensing plate, which is close to the touch screen substrate, and the suction part can suck the touch screen substrate when the touch screen substrate is placed on the sensing plate.
In some embodiments, the suction member is a vacuum suction hole.
In some embodiments, the device further comprises a bakelite and a vacuum generator, the bakelite is a U-shaped groove and is placed between the induction plate and the switch plate, the bakelite is provided with a positioning hole for the second connector and the first connector to be inserted after penetrating through the bakelite, the bakelite is connected with the vacuum generator through an air pipe, the bakelite is provided with a vacuum suction hole, and when the vacuum generator works, air in the vacuum suction hole is sucked out to generate vacuum.
In some embodiments, the pressing member includes a cylinder, a copper block, and a conductive paste, the copper block and the conductive paste constituting the conductive portion; the cylinder is arranged on the upper part of the extrusion component to provide ascending or descending power for the extrusion component, the copper block is arranged in the middle of the extrusion component and connected with the measuring instrument through pins, the conductive adhesive is arranged on the lower part of the extrusion component, one end of the conductive adhesive is connected with the copper block, the conductive adhesive is connected with the chip area during a circuit breaking test, and all the pins of the chip area are in short circuit connection.
In some embodiments, the conductive paste is an omni-directional conductive paste, all directions being conductive.
In some embodiments, the conductive region is a conductive region.
In some embodiments, the conductive region is a copper clad region.
According to a second aspect of the present application, there is provided a method for performing an Open-Short test on a touch screen substrate by using the above test apparatus, including:
preparation of a test:
the touch screen substrate is placed on a test induction plate, the induction plate and the touch screen substrate are mutually adsorbed to form a large capacitor, and the conductive areas of the induction plate and the touch induction areas of the touch screen substrate are in one-to-one correspondence to form N small capacitors;
connecting a first terminal of a measuring instrument with the conductive area of the pressing part, and connecting a second terminal with the I/O interface of the switch board;
and (3) open circuit test:
the extrusion component is operated to descend, so that the conductive part of the extrusion component is in contact with the chip area of the induction plate to realize conduction, the first terminal of the measuring instrument is connected with the touch induction area of the touch screen substrate, the switch plate is operated to select any switch to be conducted, the second terminal of the measuring instrument is connected with the conductive area of the induction plate, and capacitance value measurement is carried out on the small capacitor;
operating the switch board to select each different switch to be respectively conducted, and sequentially completing the capacitance measurement of the N small capacitors;
if the capacitance value is close to zero, the touch screen substrate is broken, otherwise, the touch screen substrate is normal;
short circuit test:
the extrusion component is operated to rise, so that the conductive part of the extrusion component is contacted and separated with the chip area, any two switches are selected to be conducted by the operation switch board, the second terminal of the measuring instrument is connected with different conductive areas of the touch screen substrate, and the capacitance value between the two small capacitors is measured;
operating the switch board to select two switches to be conducted each time, and sequentially completing capacitance measurement between the N small capacitors;
and if the capacitance value is close to zero, the touch screen substrate is normal, otherwise, a short circuit exists.
In some embodiments, the mutually attracting the sensing plate and the touch screen substrate includes:
and starting a vacuum generator, sucking air in the vacuum suction holes of the induction plate, and generating vacuum so that the touch screen substrate is tightly adsorbed on the induction plate.
The beneficial effect of this application is: the utility model provides a flexible line way board touch-sensitive screen base plate Open-Short testing arrangement utilizes a big electric capacity that constitutes when touch-sensitive screen base plate and the tablet that awaits measuring adsorb each other ingeniously, N conduction areas of tablet and N touch-sensitive district one-to-one of touch-sensitive screen base plate constitute N minicapacitance, through carrying out the capacitance value measurement between every minicapacitance or two liang of minicapacitances, just can judge whether there is Open circuit or Short circuit in the inside line of walking of touch-sensitive screen base plate according to the size of capacitance value, testing method based on the device test process is convenient, high efficiency, compare prior art, there is not any influence to the touch-sensitive screen base plate that awaits measuring, need not to use the probe, can not harm the touch-sensitive screen base plate.
Drawings
Fig. 1 is a schematic diagram of a flexible printed circuit board touch screen substrate open circuit/short circuit testing device according to the present application during an open circuit test;
fig. 2 is a schematic diagram of the flexible printed circuit touch screen substrate open/short circuit testing device of the present application during open/short circuit testing;
fig. 3 is a schematic structural diagram of an extruding part of a flexible printed circuit board touch screen substrate open circuit/short circuit testing device provided in the embodiment of the present application;
fig. 4 is a schematic structural diagram of a tested touch screen substrate of the device for testing open circuit/short circuit of the flexible printed circuit board touch screen substrate according to the embodiment of the present application;
fig. 5 is a schematic structural diagram of a sensor board of an open circuit/short circuit testing apparatus for a flexible printed circuit board touch screen substrate according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of a switch board structure of an open circuit/short circuit testing device for a flexible printed circuit board touch screen substrate according to an embodiment of the present disclosure;
fig. 7 is a schematic structural view of a bakelite and a vacuum generator of an open circuit/short circuit testing device for a flexible printed circuit board touch screen substrate according to an embodiment of the present disclosure;
fig. 8 is a schematic diagram of the flexible printed circuit touch panel substrate open circuit/short circuit testing device of the present application during open circuit testing;
fig. 9 is a schematic diagram of the flexible printed circuit board touch panel substrate open/short circuit testing device of the present application during open circuit testing.
Detailed Description
The present application will be described in further detail with reference to the following detailed description and accompanying drawings.
Referring to fig. 1 and fig. 2, the Open-Short testing apparatus for a flexible printed circuit board touch panel substrate provided in the present application includes: the touch screen comprises a touch screen substrate 1, a sensing plate 2, a squeezing part 3, a switch plate 4 and a measuring instrument 5. The induction plate 2 is arranged between the touch screen substrate 1 to be tested and the switch plate 4, and the three are close to and parallel to each other; the touch screen substrate 1 and the induction plate 2 are mutually adsorbed, and the touch screen substrate and the induction plate form a large capacitor.
The pressing member 3 is disposed above the touch screen substrate 1 and is movable to be opposite to the chip region 12 of the touch screen substrate 1. As shown in fig. 3, the pressing member 3 includes a cylinder 31, a copper block 32, and a conductive paste 33; the cylinder 21 is arranged on the upper part of the extrusion part and provides ascending or descending power for the extrusion part 3; the copper block 32 is arranged in the middle of the extrusion component and is connected with the measuring instrument 5 through a pin during the open circuit test; the conductive adhesive 33 is disposed under the pressing member 3, and has one end connected to the copper block 32 and the other end connected to the chip area during the open circuit test, so as to short-circuit all the leads of the chip area 12. In a specific embodiment, the conductive adhesive 33 is an all-directional conductive adhesive, and all directions are conductive, so that each pin of the chip region 12 is ensured to be in contact with the conductive adhesive 33 to realize conductivity during the open circuit test. The extrusion component 3 moves to make the conductive part contact with the chip area 12 to realize the conduction during the open circuit test, and moves to separate the conductive part from the chip area 12 during the short circuit test;
the measuring instrument 5 comprises a first terminal and a second terminal, the first terminal is connected with the conductive part of the extrusion part, the second terminal is connected with the I/O interface 41 of the switch board 4, in the measuring process, the measuring instrument 5 provides electric potentials for the first terminal and the second terminal, and whether the touch screen substrate 1 is in open circuit or short circuit or not is judged through measuring capacitance values.
Fig. 4 is a schematic diagram of a touch screen substrate 1 to be tested, which is a single-layer flexible circuit board and includes N touch sensing areas 11 and a chip area 12 arranged in a matrix manner, and pins of the chip area 12 are connected to the touch sensing areas 11 one by one. It should be noted that the number N of the touch sensing areas 11 is determined by the touch accuracy of the touch screen, and the higher the touch accuracy is, the smaller the area of each touch sensing area is, and the larger the number N of touch sensing areas is. The touch sensitive area 11 is a conductive material, and in one embodiment, the touch sensitive area 11 is a copper-clad area. In a specific embodiment, only the chip region 12 of the touch screen substrate 1 is exposed, and the rest part is covered with an insulating layer, so that the electricity utilization safety in the test process is ensured.
Fig. 5 is a schematic diagram of an inductive board 2, which is made of a rigid PCB and includes N conductive regions 23 and first connectors 22, where the number of the conductive regions 23 is the same as that of the touch sensitive regions 11, and the conductive regions 23 and the touch sensitive regions 11 are arranged in the same manner, when the touch screen substrate 1 is placed on the inductive board 2 for testing, the conductive regions 23 and the touch sensitive regions 11 form N small capacitors in a one-to-one correspondence manner, and the first connectors 22 include N pins, which are respectively connected to the N conductive regions in a one-to-one correspondence manner; in a specific embodiment, the conductive region 23 is a conductive material, and in one embodiment, the conductive region 23 is a copper clad region.
Fig. 6 is a schematic diagram of the switch board 4, which includes a second connector 44, N switches 40, a controller 43, and an I/O interface 41, where the second connector 44 includes N pins, and the N pins are respectively connected to first ends of the N switches 40 in a one-to-one correspondence; the second connector 44 is inserted into the first connector 22, so that each switch 40 is connected to one conductive area 23, the controller 43 is connected to control electrodes of N switches, respectively, the I/O interface 41 includes N pins, and the N pins are connected to second ends of the N switches 40 in a one-to-one correspondence; during testing, the controller 43 selects one or two switches 40 to be on and the other switches to be off;
it should be noted that, in order to make the touch screen substrate 1 and the sensing board 2 adhere to each other more tightly, in some embodiments, as shown in fig. 7, the testing apparatus further includes a bakelite 6 and a vacuum generator 7, the bakelite 6 is a U-shaped groove and is placed between the sensing board 2 and the switch board 4, a positioning hole 61 is formed on the bakelite 6 for inserting the second connector 44 and the first connector 22 after passing through, the bakelite 6 is connected with the vacuum generator 7 through an air pipe 7, a vacuum suction hole 21 is formed on the sensing board 2, when the vacuum generator 7 is in operation, air in the vacuum suction hole 21 is sucked out to generate vacuum, and the touch screen substrate 1 is tightly adhered to the sensing board 2.
Fig. 8 is a schematic diagram of the Open test (Open test). During the open circuit test, a first terminal of the meter 5 is electrically connected to the chip area 12 and the touch sensitive area 11 by connecting to the copper block 32, i.e., the a-terminal, and the controller 43 controls a switch 40 to be turned on, and a second terminal is connected to a conductive area 23, i.e., the a + terminal, through the I/O interface 41. In order to determine whether there is an open circuit between the traces from the chip area 12 to the touch sensing area 11, the capacitance of each small capacitor is tested. Any one small capacitor C1 is selected for testing, the small capacitor C1 is composed of a first conductive area 231 and a first touch sensing area 111, an A-terminal is connected with the first conductive area 231, and an A + terminal is connected with the first touch sensing area 111. If there is no open circuit between the chip area 12 and the trace of the first touch sensing area 111, the capacitance measured by the measuring instrument 5 between a + and a-is larger; if there is an open circuit in the trace from chip area 12 to touch sensitive area 111, then the capacitance measured by meter 5 between A + and A-is close to zero.
Sequentially testing the capacitance value of each small capacitor, and when the measured capacitance value is larger, indicating that the internal wiring of the touch screen substrate 1 to be tested is normal; when the measured capacitance value is close to zero, it is indicated that the internal wiring of the touch screen substrate 1 to be tested has an open circuit, the switch 30 is switched by operating the switch board 4, different switches are selected to be switched on, the capacitance value of each small capacitor is sequentially tested by the measuring instrument 5, whether the touch screen substrate 1 to be tested has an open circuit and where the open circuit occurs can be judged, if the open circuit exists, the product is bad, and if the open circuit does not exist, the short circuit test is continuously performed.
Fig. 9 is a schematic diagram of the Short circuit test (Short test). During short circuit test, as the extrusion component 3 rises, the copper block 32 is separated from the chip area 12, and the first terminal of the measuring instrument 5 is not conducted with the induction area 11 any more; the controller 43 controls the two switches 40 to be conductive, and the second terminal of the measuring instrument 5 is connected to two different conductive areas through the I/O41 interface 41, i.e. one conductive area is the B + terminal and the other conductive area is the B-terminal. In order to test whether the wiring between the touch sensing areas is short-circuited, the capacitance value between every two small capacitors is tested. Any two small capacitors C2 and C3 are selected for testing, the capacitor C2 is formed by the second conductive region 232 and the second touch sensing region 112, the capacitor C3 is formed by the third conductive region 233 and the third touch sensing region 113, and can determine whether a short circuit exists between the touch sensing region 112 and the touch sensing region 113, the B + terminal is connected to the second conductive region 232, and the B-terminal is connected to the third conductive region 233. If the short circuit does not occur, any two capacitors C2 and C3 have no relation, and the capacitance measured between B + and B-by the measuring instrument 5 is very small and close to zero; if there is a short circuit, it is equivalent to capacitors C2 and C3 connected in series through the short circuit point, and then a larger capacitance is measured at the B + and B-measuring terminals.
The capacitance values between every two small capacitors are tested in sequence, when the measured capacitance value is close to zero, the fact that the wiring between the touch sensing areas corresponding to the two tested capacitors is normal is indicated, and when the measured capacitance value is large, the fact that the touch sensing areas corresponding to the two small capacitors are short-circuited is indicated. The switch 30 is switched by operating the switch board 4, different switches are selected to be switched on, the circuit between every two touch sensing areas 11 of the touch screen substrate 1 to be tested can be tested once in sequence, if a short circuit exists, the touch screen substrate is a defective product, and if the short circuit does not exist, the touch screen substrate is a good product.
Based on the testing device and the principle, the application provides an Open-Short testing method for the flexible circuit board touch screen substrate.
Based on the testing device and the principle, the following introduces the Open-Short testing method for the flexible circuit board touch screen substrate provided by the application.
Preparation of a test:
firstly, a touch screen substrate 1 to be tested is placed in a testing device and on an induction plate 2, the induction plate 2 and the touch screen substrate 1 are mutually adsorbed to form a large capacitor, and a conductive area 23 of the induction plate 2 and a touch induction area 11 are in one-to-one correspondence to form N small capacitors; in order to enable the touch screen substrate 1 and the induction plate 2 to be mutually adsorbed more tightly, the vacuum generator 7 is also started to suck out air in the vacuum suction hole 21 of the induction plate 2 and generate vacuum, so that the touch screen substrate 2 is tightly adsorbed on the induction plate 4; the first terminal of the measuring device 5 is connected to the copper block 32 of the pressing member 3, and the second terminal is connected to the I/O interface 41 of the switch board 4.
And (3) open circuit test:
the extrusion component 3 is operated to descend, so that the conductive adhesive 33 of the conductive part of the extrusion component is in contact with the chip area 12 to realize conductivity, the first terminal of the measuring instrument 5 is connected with the touch sensing area 11 of the touch screen substrate 1, the switch board 4 is operated to select any switch to be conducted, the second terminal of the measuring instrument 5 is connected with the conductive area 23 of the sensing board 2, and the measuring instrument 5 measures capacitance values of N small capacitors formed by any conductive area 23 and the touch sensing area 11; and the operation switch board 3 selects each different switch to be switched on respectively, the capacitance value measurement of the N small capacitors is sequentially completed, if the capacitance values are close to zero, the touch screen substrate 1 is broken, otherwise, the touch screen substrate is normal.
Short circuit test:
the extrusion component 3 is operated to rise, so that the conductive adhesive 33 of the conductive part of the extrusion component is separated from the chip area 12, the switch board 4 is operated to select any two switches to be conducted, the measuring instrument 5 is connected with different conductive areas of the touch screen substrate 1 through a second terminal, and the capacitance value between two small capacitors is measured; and operating the switch board 4 to switch on two switches at each time, sequentially measuring capacitance values between the N small capacitors, wherein if the capacitance values are close to zero, the touch screen substrate 1 is normal, otherwise, a short circuit exists.
To sum up, flexible line board touch-sensitive screen base plate Open-Short testing arrangement of this application includes a special tablet for touch-sensitive screen base plate Open-Short test design, utilize a big electric capacity that constitutes when touch-sensitive screen base plate and tablet that awaits measuring adsorb each other ingeniously, N conduction region of tablet and N touch-sensitive region one-to-one of touch-sensitive screen base plate constitute N minicapacitors, through carrying out the capacitance value measurement to every minicapacitor or between two liang of minicapacitors, just can judge according to the size of capacitance value whether touch-sensitive screen base plate inside is walked the line and is had the Open circuit or the Short circuit, the device test procedure is convenient, high efficiency, compare prior art, touch-sensitive screen base plate that awaits measuring does not have any influence, need not to use the probe, can not harm the touch-sensitive screen base plate.
The foregoing is a more detailed description of the present application in connection with specific embodiments thereof, and it is not intended that the present application be limited to the specific embodiments thereof. It will be apparent to those skilled in the art from this disclosure that many more simple derivations or substitutions can be made without departing from the inventive concepts herein.
Claims (7)
1. The utility model provides a flexible line way board touch-sensitive screen base plate Open-Short testing arrangement for Open circuit/Short circuit test to the touch-sensitive screen base plate, the touch-sensitive screen base plate is including N touch-sensitive district and a chip district that is the matrix and arranges, and the pin in chip district links to each other with touch-sensitive district one by one, the touch-sensitive screen base plate is only the chip district exposes, and all the other parts cover the insulating layer, its characterized in that includes: the testing device comprises an induction plate, a switch plate, an extrusion component and a measuring instrument;
the touch screen substrate comprises a touch sensing area, a sensing board and a plurality of conductive areas, wherein the number of the conductive areas is the same as that of the touch sensing area, the size of the conductive areas is equivalent to that of the touch sensing area, the conductive areas and the touch sensing area are arranged in the same way, when the touch screen substrate is placed on the sensing board for testing, the conductive areas and the touch sensing area correspond to one another to form N small capacitors, the first connector comprises N pins, and the N pins are respectively connected with the N conductive areas in a one-to-one correspondence manner;
the switch board comprises a second connector, N switches, a controller and an I/O interface, wherein the second connector comprises N pins which are respectively connected with the first ends of the N switches in a one-to-one correspondence manner; each switch is connected with one conductive area through the second connector and the first connector in an opposite insertion mode, the controller is respectively connected with control electrodes of the N switches, the I/O interface comprises N pins, and the N pins are respectively connected with second ends of the N switches in a one-to-one corresponding mode; when testing is carried out, the controller selects one or two switches to be switched on and the other switches to be switched off;
the extrusion component is arranged above the induction plate and can move, the extrusion component comprises a conductive part, the conductive part of the extrusion component is contacted with the chip area through moving to realize conduction during an open circuit test, and the conductive part of the extrusion component is separated from the chip area through moving during a short circuit test;
the measuring instrument comprises a first terminal and a second terminal, the first terminal is connected with the conductive part of the extrusion component, the second terminal is connected with the I/O interface, in the measuring process, the measuring instrument provides electric potentials for the first terminal and the second terminal, and whether the touch screen substrate is broken or short-circuited is judged by measuring a capacitance value;
an adsorption part is arranged on one surface, close to the touch screen substrate, of the induction plate, and the adsorption part can adsorb the touch screen substrate when the touch screen substrate is placed on the induction plate;
the extrusion component comprises a cylinder, a copper block and conductive adhesive, and the copper block and the conductive adhesive form the conductive part; the cylinder is arranged on the upper part of the extrusion component to provide ascending or descending power for the extrusion component, the copper block is arranged in the middle of the extrusion component and connected with the measuring instrument through pins, the conductive adhesive is arranged on the lower part of the extrusion component, one end of the conductive adhesive is connected with the copper block, the conductive adhesive is connected with the chip area during a circuit breaking test, and all the pins of the chip area are in short circuit connection.
2. The apparatus of claim 1, wherein the suction member is a vacuum suction hole.
3. The device as claimed in claim 2, further comprising a bakelite and a vacuum generator, wherein the bakelite is a U-shaped groove and is placed between the induction plate and the switch plate, the bakelite is provided with a positioning hole for inserting the second connector and the first connector after penetrating through the bakelite, the bakelite is connected with the vacuum generator through an air pipe, the bakelite is provided with a vacuum suction hole, and when the vacuum generator works, air in the vacuum suction hole is sucked out to generate vacuum.
4. The device of claim 1, wherein the conductive adhesive is an omni-directional conductive adhesive, conducting in all directions.
5. The device of claim 1, wherein the conductive region is a copper clad region.
6. The method for conducting Open-Short test on the touch screen substrate by using the test device of any one of claims 1 to 5, is characterized by comprising the following steps:
test preparation:
the touch screen substrate is placed on a test induction plate, the induction plate and the touch screen substrate are mutually adsorbed to form a large capacitor, and the conductive areas of the induction plate and the touch induction areas of the touch screen substrate are in one-to-one correspondence to form N small capacitors;
connecting a first terminal of a measuring instrument with the conductive area of the extrusion part, and connecting a second terminal with the I/O interface of the switch board;
and (3) open circuit test:
the extrusion component is operated to descend, so that the conductive part of the extrusion component is in contact with the chip area of the induction plate to realize conduction, the first terminal of the measuring instrument is connected with the touch induction area of the touch screen substrate, the switch plate is operated to select any switch to be conducted, the second terminal of the measuring instrument is connected with the conductive area of the induction plate, and capacitance value measurement is carried out on the small capacitor;
the switch board is operated to select each different switch to be conducted respectively, and capacitance value measurement of the N small capacitors is completed in sequence;
if the capacitance value is close to zero, the touch screen substrate is broken, otherwise, the touch screen substrate is normal;
short circuit test:
operating the extrusion component to rise to enable the conductive part of the extrusion component to be in contact with and separated from the chip area, operating a switch board to select any two switches to be conducted, connecting a second terminal of the measuring instrument with different conductive areas of the touch screen substrate, and measuring the capacitance value between the two small capacitors;
operating the switch board to select two switches to be conducted each time, and sequentially completing capacitance measurement between the N small capacitors;
and if the capacitance value is close to zero, the touch screen substrate is normal, otherwise, a short circuit exists.
7. The method of claim 6, wherein the causing the sensing plate and the touch screen substrate to adhere to each other comprises:
and starting a vacuum generator, sucking air in the vacuum suction holes of the induction plate, and generating vacuum so that the touch screen substrate is tightly adsorbed on the induction plate.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611187547.2A CN106771969B (en) | 2016-12-20 | 2016-12-20 | Open-Short testing device and method for flexible circuit board touch screen substrate |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611187547.2A CN106771969B (en) | 2016-12-20 | 2016-12-20 | Open-Short testing device and method for flexible circuit board touch screen substrate |
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| CN106771969A CN106771969A (en) | 2017-05-31 |
| CN106771969B true CN106771969B (en) | 2023-04-07 |
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| CN108710052A (en) * | 2018-04-28 | 2018-10-26 | 深圳市友基技术有限公司 | A kind of antenna board measuring method, system and device |
| CN109444650B (en) * | 2018-12-28 | 2021-07-30 | 深圳市欧珀达科技有限公司 | Open-short circuit testing method and device for single film of oversized capacitive screen |
| CN112212782B (en) * | 2019-06-25 | 2023-01-17 | 合肥欣奕华智能机器股份有限公司 | Glass substrate detection method, device and system |
| CN110749815B (en) * | 2019-11-22 | 2021-10-22 | 南宁影联医学工程有限公司 | Detection method of anti-collision panel of medical equipment |
| CN111537867B (en) * | 2020-06-03 | 2023-05-02 | 安徽方兴光电新材料科技有限公司 | Detection method for preventing disassembly winding short circuit and open circuit of touch screen |
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| CN205484599U (en) * | 2016-02-04 | 2016-08-17 | 深圳精智达技术股份有限公司 | Testing arrangement of touch -sensitive screen |
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