TW512275B - Display method for error detection of electronic components - Google Patents

Display method for error detection of electronic components Download PDF

Info

Publication number
TW512275B
TW512275B TW90105766A TW90105766A TW512275B TW 512275 B TW512275 B TW 512275B TW 90105766 A TW90105766 A TW 90105766A TW 90105766 A TW90105766 A TW 90105766A TW 512275 B TW512275 B TW 512275B
Authority
TW
Taiwan
Prior art keywords
scope
patent application
item
basic input
data processing
Prior art date
Application number
TW90105766A
Other languages
Chinese (zh)
Inventor
Johnson Lin
Original Assignee
Giga Byte Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Giga Byte Tech Co Ltd filed Critical Giga Byte Tech Co Ltd
Priority to TW90105766A priority Critical patent/TW512275B/en
Application granted granted Critical
Publication of TW512275B publication Critical patent/TW512275B/en

Links

Abstract

The present invention relates to an error detection display method for electronic components of data processing systems. Once a data processing system is powered on, the basic input-output system (BIOS) will start testing the data processing system, especially before the screen display of the monitor of the data processing system. If an error is found on any dynamic random access memory (DRAM), BIOS, or video graphics access (VGA) card, the light emitting diodes (LED) for power indication equipped on the case of the host of the data processing system will start flashing in various frequencies to indicate fault or improper installation of the components.

Description

發明領域 本案係有關於當資料處理 =(議)裝置開始進行資料處理系統測試,特別指= :二系;統ΐ;器可顯示畫面以,,當動態隨機存取記i )一土本輸入輪出系統、或顯示(VGA)卡發生錯誤 H於貧料處理系統主機外錄設1之t源蘊运發先二極 體(LED)以不同頻案閃爍,表示上述^件損壞或裝置錯誤 的方法。 N 發明背景 在資料處理系統的架構中,所謂的基本輸入輸出系統 (basic lnput-outpu1: system,BI〇s)是資料處理系統 機後所執行的第一到程式,為整個系統把守第一關,倘若 無法,完BIOS程式,通常代表某些硬體可能有問題。 每當我們將資料處理系統開機後,中央處理器(cpu) 便$自動執行一連串的指令,這些指令分成:(一)系統組 態为析(System Configuration Analysis) ··分析cpu 型 號、記憶體大小、軟硬碟機的數量與型式、是否安裝浮點 運算器等,作為後續動作的重要參考資料。(二)開機自我 測试(POST, P〇wer-on Self Test):測試記憶體、晶片 組、CMOS儲存資料、鍵盤和磁碟機等硬體。(三)載入作業 糸統·藉由一小段稱為「Bootstrap Loader」的程式,找 出作業系統(如MS DOS、Windows 2000/98)在硬碟位置並FIELD OF THE INVENTION This case is about when data processing = (negotiation) device starts data processing system test, especially =: second system; system; device can display screens, when dynamic random access records i) a native input An error occurred in the rotation system or the display (VGA) card. H The source diode 1 was recorded on the outside of the host of the lean material processing system. The forward diode (LED) flickered at different frequencies, indicating that the above items were damaged or the device was incorrect. Methods. N Background of the Invention In the architecture of the data processing system, the so-called basic input-output system (BI0s) is the first program to be executed after the data processing system, which guards the first system for the entire system. If this is not possible, completing the BIOS program usually means that some hardware may be defective. Whenever we turn on the data processing system, the central processing unit (cpu) automatically executes a series of instructions. These instructions are divided into: (a) System Configuration Analysis • Analysis of CPU model and memory size , The number and type of hard disk drives, whether to install floating-point arithmetic units, etc., as important reference materials for subsequent actions. (2) Power-on Self Test (POST): Tests hardware such as memory, chipset, CMOS storage data, keyboard, and drive. (C) Load operation System • With a short program called "Bootstrap Loader", find out the operating system (such as MS DOS, Windows 2000/98) and

載入之。 W 由於資料處理系統開機後,開機自我測試部分,基本Load it. W Since the data processing system is turned on, the self-test

第4頁 512275Page 4 512275

輸入輸出系統(bios)裝置測試系統依序為:首先動態隨機 存取記憶體(DRAM),基本輸入輸出系統(BI〇s)裝置本 身,顯示(VGA)卡然後其他週邊裝置測識…|★普在偵測 顯示卡之前發生錯誤則無從由監視器(m〇nit〇r)上得知包 括B 10S本身、動態隨機純取記憶體、顯示卡何者發生錯 誤,使用者必須將資料處理系統機殼拆開確認,即使送至 維Ο機構,若無法事先得知何項零件發生故障或裝置錯 誤,亦必須花費時間逐一檢測,造成使用者的困擾,^增 加維修人員之維修時間。 在解決上述之檢測問題上,習知故術方法 一 鳍,鑀 {£ 不,係於電腦開機後逐一測試機存取記憶體 BIOS本身1,顯示(VGA)卡3,告 ^ ,卞],备上述疋一件發生錯誤磚+則 透過系統晶片組中之南橋晶片4傳遞至象統揚聲器 、 (speaker)5分別發出不同頻f之蜂鳴聲,表示匕 項發生錯誤、然而事實上冑用者並不容“聲音分辨】: 異。 、友 i知二:方法一,如圖二所示,係在寘料㈣m 機板上,安裝不同藏色之發光二極體(15, κ,,於 開機後逐一、碟試機存取記憶體(DRAMM2,基本 輸出= 統裝置(RT0S)1]太身,顯示〇以)卡13,當上述元件發出生系 錯誤日夺,透過系統晶片組中之南撟晶月14傳邈至該主機 板上不—阁顏色,發光二極體⑴,1&,m,分別顯示不同: 件之正確I錯誤,然而此習知技術之方法必須增加發 極體,增加了製造及成太,1由於安裝於主機板上,僅; 512275 五、發明說明(3) 便生產測試階段之測試’在資料處理系統組裝完成交至消 費者手中後,消費者仍必須將資料處理系統機殼拆開後方 能-以-習知技翁方法抖斷是何—元♦發^ 便一 職是之故,吾人乃經悉心的試驗與研究,並秉持鍥而不捨 的研究精神,終創造出本案之資料處理系統基本輸入輸出 系統測試錯誤顯示方法。以下為本案的說明。 發明概述 本案也於提供二種不需额外增加發光二板體的條件 下,提供J吏用者以及維條或檢測人藝在不需拆間資嵙處理 系統機殼的情況下,在開機後,監視器顯示畫面前,藉由 位於資料處理系統外殼設置之發光二極體以不同頻率閃 爍,顯示基本輸入輸出系統測試於該階段發生之錯誤。 根據本案構想,在於提供一種電子 法,該 型電腦 外殼設 般開機 DEL 鍵) 極體之 置測試 測結果 斷該動 輪出系 遞第二 電子元#位於一資料處理系統(桌上型電腦或筆記 或伺服器)中,該資料處理系統具一主機,該主機 置一發光二極體,當資料處理系統開機時(包括一 、暖開機(同時按電腦鍵盤上2CTRL鍵、ALT鍵及 之或按電腦主機之重置(reset)鍵),將電源於光一 初始狀態設定為全亮狀態,以基本輪入輪也象線^ 第一種電子元件(例如動態隨機存取記憶體),如 ,錯誤(就動態隨機存取記憶體而言為無法正確、 態隨機存取記憶體之規格型號)時,則該基本輪入 統裝置傳遞第一訊號至一解礁裘置,該觫礁裝^ 邻喊至發光二極體使該發光二極體以第一頻率閃The input and output system (bios) device test system is as follows: first, dynamic random access memory (DRAM), the basic input and output system (BI0s) device itself, the display (VGA) card, and then other peripheral devices to detect ... | ★ If an error occurs before the video card is detected, it cannot be known from the monitor (monitor) that the B 10S itself, the dynamic random pure memory, and the video card have any errors. The user must use the data processing system The casing is opened and confirmed. Even if it is sent to the maintenance department, if it is impossible to know in advance which parts are faulty or the device is wrong, it must take time to test one by one, causing user confusion, and increasing the maintenance time of the maintenance staff. In solving the above-mentioned detection problems, I know a good way to do it. 鑀 {£ No, it is based on the test machine accesses the memory BIOS 1 and the display (VGA) card 3 after the computer is turned on one by one. 告, 卞], For the above, an error brick + is transmitted through the south bridge chip 4 in the system chipset to the elephant speaker, and (speaker) 5 emits beeps of different frequencies f, indicating that the dagger has an error, but in fact it is not used. The speaker does not allow "sound resolution": different. You two know: Method one, as shown in Figure two, is attached to the ㈣m machine board, install light-emitting diodes of different colors (15, κ ,, Yu After booting up, the disk test machine accesses the memory one by one (DRAMM2, basic output = system device (RT0S) 1), and displays 0 to 1. Card 13 When the above components issue a system error, they are captured by the system chipset. Nanxun Jingyue 14 was transmitted to the main board. No-cabinet color, light-emitting diodes, 1 &, m, show different: the correct I pieces are wrong, but the method of this conventional technology must increase the emitter , Increased manufacturing and Chengtai, 1 due to installation on the motherboard, only; 5 12275 V. Description of the invention (3) The test in the production test stage 'After the data processing system is assembled and delivered to the consumer, the consumer must still disassemble the housing of the data processing system to be able to-to-learn techniques What is the jitter? Yuan ♦ ^ It is the reason for my post. I have carefully experimented and researched, and persisted in the spirit of perseverance, and finally created the basic input and output system test error display method of the data processing system in this case. The following This case is a description of the present invention. Summary of the Invention This case also provides two types of cases without the need to add an additional light-emitting two-body body, as well as the user and the maintenance of the stripe or testing arts without the need to disassemble the housing of the system. Next, after the monitor is turned on, before the monitor displays the screen, the light-emitting diodes located on the housing of the data processing system flash at different frequencies to display the errors that occurred during the basic input-output system test at this stage. According to the idea of this case, it is to provide a Electronic method, the computer shell is equipped with the DEL key.) The test result of the polar body placement test indicates that the moving wheel is delivered to the second electronic unit # It is located in a data processing system (desktop computer or note or server). The data processing system has a host. The host is equipped with a light-emitting diode. When the data processing system is turned on (including a warm boot (simultaneously press 2CTRL key, ALT key on the computer keyboard, or press the reset key of the host computer), set the power supply to the initial state of the light to the full light state, the basic wheel into the wheel is also like a line ^ The first electronic component ( (Such as dynamic random access memory), for example, if the error (in the case of dynamic random access memory is not the correct, state random access memory specification model), the basic round-robin system device transmits the first signal to Once the reef is set, the reef is installed next to the light-emitting diode so that the light-emitting diode flashes at the first frequency.

第6頁 512275Page 6 512275

爍如可正確教斷遠動態隨機存取記憶體之規格型號時, 則檢查第二種電子元件(例如基本輪入輸出系統裝置)是否 錯誤 萬仏查結果-為錯誤(就基本輪入輪出系統裝置而言 為基本輪入輸出系統裝置内之程式,檢查該基本輸入輸出 系統裝置之檢總(Checksum)值錯誤)時,傳遞第三訊號至 忒解碼裝置,該解碼裝置傳遞第四訊號至發光二極體以第 一頻率閃爍,若檢查結果為正確(就基本輸入輸出系統裝 置而言為基本輸入輸出系統裝置内之程式,檢查該基本輸 入輸出系統裝置之檢總(Checksum)值正確)時,則測試第 二>種電^子元件(例如顯示卡)是否錯誤,如偵測結果為錯誤 (就顯不卡而言為無法正確判斷該顯示(VGA)卡之規格型 號)時^,傳遞第三訊號至該解碼裝置,該解碼裝置傳遞第 四訊^號至_該發光二極體以第三頻率閃爍,如良雇果為正確 時(就顯示卡而言為可正確判斷該VGA卡之規袼型號)時, 則繼續其他基本輸入輸出系統測試。 ^只要不是CPU錯誤且BIOS執行自我測試部分程式正 =,=I進行BIOS的自我測試程序;如果CPU錯誤或BI〇s 元全扣壞(無法進行自我測試)則由於電源LED之初始設定 2全亮,開機後若出現電源LED全亮而監視器沒有畫面的 p月況,則可知是CPU錯誤或M〇s完全損壞。至於卯媿、 BI 0S及VGA錯誤則可藉由本創作依電源LED閃爍頻率得知 ΪΓίΓί:,'試完成之後之電子元件測試則可由監 視器旦面獲传相關訊息。 本創t並不限疋基本輸入輸出系統測試之電子元件種If Shuo can correctly determine the specifications of the remote dynamic random access memory, check whether the second type of electronic components (such as the basic input / output system device) is incorrect. Check the result-for the error (the basic input / output) The system device is a program in the basic input-output system device. When checking the checksum value of the basic input-output system device, the third signal is transmitted to the 忒 decoding device, and the decoding device transmits the fourth signal to The light-emitting diode flashes at the first frequency, if the check result is correct (in the case of a basic input-output system device, it is a program in the basic input-output system device, and the checksum value of the basic input-output system device is correct) When the second > electrical sub-component (such as a graphics card) is wrong, if the detection result is an error (in the case of a display card, it is impossible to correctly determine the specification model of the display (VGA) card) ^ , The third signal is transmitted to the decoding device, and the decoding device transmits the fourth signal to the _. The light-emitting diode flashes at the third frequency. If the good result is correct (display When the card is correctly judged in terms of the VGA card gauge eligible models), then continue with other basic input output system testing. ^ As long as it is not a CPU error and the BIOS executes the self-test part of the program, =, = I performs the BIOS self-test procedure; if the CPU error or BI0s failure occurs (the self-test cannot be performed), the initial setting of the power LED is 2 On, if there is a p-month condition when the power LED is fully on and the monitor has no picture after powering on, it can be seen that the CPU error or M0s is completely damaged. As for shame, BI 0S and VGA errors, you can learn from this creation based on the blinking frequency of the power LED: , ΓίΓί: 'After the test is completed, the electronic components can be informed by the monitor. The original t is not limited to the types of electronic components for basic input and output system testing

512275 五、發明說明(5) 類數量,若一部分電子元件測試經由 另一部分電子元件測試經由其他 A爍頻率表示, 可。 方式表不(如蜂n鳥聲)亦 前述之解碼裝置在於將基本 令解碼轉換成硬體設備可讀取之硬體訊蘩了 :,傳遞之命 三、五訊號為命令訊號,前述第二、σ 丄刖述第一、 號。 一、四、六訊號為硬體訊 發光二極體閃爍頻率可為單一 次候緊接著連續亮3秒滅3秒3次)。 連、戈冗1秒滅1秒2 上述Ϊ 的由肉眼判斷其中的差異,故 相同彼此間相差兩倍以:為:u ^單-頻率則互不 i日车,内目ρ π a \ 母秒閃蝶次數超過20次以 超過2〇=“辨’故上述閃燦頻率以每秒閃燦次數不 電源資Γ處理系統主機外殼設置之發光二極體為 極體、了 Α ί體,其優點為不必另外增設新的發光二 體:不本::料處理系統主機外殼上之其他發光二極 體也不超脫本創作之構想範圍,·又 晶片組之南橋晶月、銓Α仏/Α、 解碼裝置為糸統 電路佈局。 輸輸出(1/0)晶片或具同效功能之 ,較佳實施例說明 偵洌四’其中圖三為本案之電子元件錯誤 貝’貝J顯不方法較佳實施例系統方塊圖’圖四為本案之電子 第8頁 五、發明說明(6) ------^-—- 凡件錯誤偵測顯示方法較佳實施例之流程圖。 一本案之電子元件錯誤偵測顯示方法,係用以偵測並顯 =包含:動態隨機存取記憶體1〇2、基本輸入輸出系統裝 1〇1、顯示卡103等電子元件是否錯誤,該電子元件係内 建於資料處理系統中(桌上型電腦或筆記型電腦或及伺服 器),該資料處理系統包括一主機,該主機外殼設置_發 j 了極體106,内部具至少一基本輸入輸出系統裝置1〇1及 一系統晶片組中俗稱南橋之晶片j 〇 5 (亦可為輸入輸出 〇/〇)晶片或等效之電路佈局),該偵測顯示方法包括·· 將外殼設置之發光二極體丨〇 β初始設定為全亮,當資料處 理系統開機後(步驟21),以該基本輸入輸出系統裝置1〇1 測試動態隨機存取記憶體丨〇2可否正確判斷其型號規袼(判 斷式22) ’如無法正確判斷該動態隨機存取記憶體1〇2之規 格型號時則該基本輸入輸出系統裝置丨〇丨傳遞第一訊號至 該晶片105,該晶片1〇5再傳遞第二訊號至該發光二極體 (步驟23)使該發光二極體以第一頻率(例如〇· 25赫茲)閃爍 (步驟24),若檢查結果為正確時則以位於該基本輸入輸出 系統裝置内之程式,檢查該基本輸入輸出系統裝置之檢她 (Checksum)值104是否錯誤(判斷式25),當檢查結果為錯^ 誤時則傳遞第三訊號至該晶片105,該晶片1〇5再傳遞第四 訊號至該該發光二極體(步驟26)使該發光二極體以第二頻 率(例如1赫兹)閃爍(步驟27),如可正確判斷該動態隨機 存取記憶體之規格型號時則測試顯示(VG A )卡丨〇 3可否正確 判斷其型號規格(判斷式28),如無法正確判斷該顯示 512275 五、發明說明σ) (VGA)卡103之規格型號時則傳遞第五訊號至該晶片1〇5, 該晶片105再傳遞第六訊號至該發光二極體(步驟29),使 該發光二-極體-以第—三頻Γ率(例如~1〇赫兹)閃爍(―步驟3〇),如 可正確判斷該顯示(VGA)卡103之規格型號時則繼續其他基 本輸入輸出系統測試(步驟31 )。 本案得由熟知此技術之人士任思匠思而為諸般修飾, 然接不脫如附申請專利範圍所保護者。512275 V. Description of the invention (5) The quantity of category, if part of the electronic component test passes another part of the A-blink frequency, it can be. The method means (such as bee-n-bird) that the aforementioned decoding device is to convert the basic decoding into a hardware signal that can be read by the hardware device. The third and fifth signals passed are command signals. , Σ describes the first and the number. The first, fourth, and sixth signals are hardware signals. The flashing frequency of the light-emitting diodes can be a single time, followed by continuous lighting for 3 seconds and off for 3 seconds. Lian and Ge redundant 1 second off 1 second 2 The difference between the above Ϊ is judged by the naked eye, so the difference between the two is the same as: u ^ single-frequency is not the same day, the inner eye ρ π a \ mother The number of flashes in the second is more than 20 times, and the number of flashes is more than 20. Therefore, the above-mentioned flashing frequency is based on the number of flashings per second. The advantage is that it is not necessary to add a new light-emitting diode: not this :: other light-emitting diodes on the main body shell of the material processing system are not beyond the scope of this creative concept, and the south bridge crystal moon of the chipset, 铨 Α 仏 / Α The decoding device is a conventional circuit layout. The input / output (1/0) chip or one with the same effect function is described in the preferred embodiment. Among them, Figure 3 shows the electronic component error in this case. System block diagram of the preferred embodiment 'Figure 4 This is the electronic version of this case Page 8 V. Description of the invention (6) ------ ^ ---- A flowchart of a preferred embodiment of a method for error detection and display of all items. Electronic component error detection and display method is used to detect and display = includes: dynamic random storage Take the memory 102, whether the basic input / output system is equipped with 101, the display card 103 and other electronic components are wrong. The electronic components are built into the data processing system (desktop computer or notebook computer or server) The data processing system includes a host. The host shell is provided with a polar body 106, which has at least one basic input / output system device 101 and a chip commonly known as the South Bridge in the system chipset. (Input / output 〇 / 〇) chip or equivalent circuit layout), the detection and display method includes: The light-emitting diode set in the housing is initially set to full light, when the data processing system is turned on (step 21) , With the basic I / O system device 101 to test the dynamic random access memory 丨 〇2 can correctly determine its model specifications (judgment formula 22) 'If the specifications of the dynamic random access memory 10 can not be correctly judged In the case of a model, the basic input / output system device transmits a first signal to the chip 105, and the chip 105 transmits a second signal to the light-emitting diode (step 23) so that the light-emitting diode starts with the first signal. frequency (For example, 0.25 Hz) blinking (step 24), if the check result is correct, check whether the checksum value 104 of the basic input-output system device is incorrect by using a program located in the basic input-output system device ( (Judgment formula 25), when the inspection result is incorrect, a third signal is transmitted to the chip 105, and the chip 105 transmits a fourth signal to the light emitting diode (step 26) to make the light emitting diode Flash at the second frequency (for example, 1 Hz) (step 27). If the specifications of the dynamic random access memory can be correctly judged, then the test display (VG A) card will be judged correctly. (3) 28), if the display cannot be judged correctly 512275 V. Description of the invention σ) (VGA) card 103 specifications, the fifth signal is passed to the chip 105, and the chip 105 is then passed the sixth signal to the light emitting diode (Step 29), the light-emitting diode-flashes at the third-frequency Γ rate (for example ~ 10 Hz) (-step 30), if the specification model of the display (VGA) card 103 can be correctly judged Then continue with other basic input-output system tests ( Step 31). This case can be modified by people who are familiar with this technology, but it can't be separated from the scope of the patent application.

第10頁Page 10

512275512275

圖一 圖二 W — 二 統方塊圖 圖四 程圖 ——一 间- 習知技術二之系統方塊圖。 之系 之流 本案之電子元件錯誤偵制廳+古i 土 吹谓凋顯不方法較佳實施分 %圖〇 •本案之電子元件錯誤伯、、目丨I gg +古、、上 成谓冽顯不方法較佳實施你 本案圖式中所包含之元件列示如下·· 1、 11、101 :基本輸入輸出系統(BIOS)裝置 2、 12、102 :態隨機存取記憶體(DRAM) 3、 13、103 :顯示(VGA)卡 104 ;檢總(Checksum)值 4、 14 、10 5 :晶片 106 :電源顯示發光二極體 15、16、17 :主機板上之發光二極體 5 :系統揚聲器Fig. 1 Fig. 2 W-Block diagram of the second system Fig. 4 Process diagram-1-Block diagram of the system of the conventional technique 2. The system's current electronic component error detection system + ancient i soil blowing prediction method is better to implement the sub-percentage. Figure 0 • electronic component error in this case, heading I gg + ancient, predecessor The display method is better implemented. The components included in the scheme of this case are listed as follows: 1. 11, 101: Basic Input Output System (BIOS) device 2, 12, 102: State Random Access Memory (DRAM) 3 13, 13, 103: Display (VGA) card 104; Checksum value 4, 14, 10 5: Chip 106: Power display light-emitting diode 15, 16, 17: Light-emitting diode 5 on the motherboard: System speakers

第11頁Page 11

Claims (1)

512275512275 六、申請專利範圍 " —-- 1 · 一種偵測顯示方法,用以偵測並顯示至少一種電子元 件是否錯誤’該電子元件係内建於資料處理系統中,該資 料處理系統包—括一主機,該主機外殼設亦=發光二極體, 主機内部具至少一基本輸入輸出系統裝置及一解碼裝置, 該偵測顯示方法包括: 以該基本輸入輪出系統裝置測試上述該第一種電子元件是 否錯誤; 若檢查結果為錯誤時,則該基本輸入輸出系統裝置傳遞第 一訊號至該解碼裝置,該解碼裝置傳遞第二訊號至該發光 二極體使該發光二極體以/特定頻率閃爍; 若檢查結果為正確時,則該基本輸入輸出系統裝置測試第 二電子元件。 2 ·如申請專利範圍第1項所述之方法,在於該資料處理系 統開機後,其監視器可顯示畫面前。 3 ·如申請專利範圍第1項所述之方法,其中該電子元件之 一為動態隨機存取記憶體(pRAM)。 4.如申請專利範圍第丨項所述之方法,其中該電子元件之 一為基本輸入輪出系統裝置(BIOS)。 5 ·如申請專利範圍第1項所述之方法,其中該電子元件之 一為顯示(VGA)卡。 、 6·如申請專利範圍第1項所述之方法,其中主機外殼設置 之發光二極體初始設定為全亮。 / 7·如申請專利範圍第1項所述之方法,其中該第一訊號係 一命令訊號。6. Scope of Patent Application " --- 1 · A detection and display method for detecting and displaying whether at least one electronic component is wrong. The electronic component is built into a data processing system, and the data processing system includes- A host, the host casing is also provided with a light-emitting diode, the host has at least one basic input output system device and a decoding device, and the detection and display method includes: testing the first type with the basic input wheel out system device. Whether the electronic component is wrong; if the check result is wrong, the basic input / output system device transmits a first signal to the decoding device, and the decoding device transmits a second signal to the light emitting diode to make the light emitting diode The frequency flickers; if the check result is correct, the basic I / O system device tests the second electronic component. 2 · The method described in item 1 of the scope of patent application is that after the data processing system is turned on, its monitor can display the screen. 3. The method according to item 1 of the scope of patent application, wherein one of the electronic components is a dynamic random access memory (pRAM). 4. The method according to item 丨 of the patent application scope, wherein one of the electronic components is a basic input wheel-out system device (BIOS). 5. The method according to item 1 of the scope of patent application, wherein one of the electronic components is a display (VGA) card. 6. The method as described in item 1 of the scope of patent application, wherein the light-emitting diode provided in the housing of the host is initially set to full light. / 7 · The method according to item 1 of the scope of patent application, wherein the first signal is a command signal. 第12頁 512275 六、申請專利範圍 8 ·如申請專利範圍第1項所述之方法 一硬體訊號。 9·如申請專利範圍第1項所述之方法 係依基本輸入輸出系統裝置預先規劃 決定。 I 0 ·如申請專利範圍第1項所述之方法 一頻率。 II ·如申請專利範圍第1項所述之方法 種(含)以上頻率之組合。 1 2 ·如申睛專利範圍第1項所述之方法 係指桌上型電腦。 1 3·如申請專利範圍第1項所述之方法 係指筆記型電腦。 1 4 ·如申請專利範圍第1項所述之方法 係指伺服器。 1 5.如申請專利範圍第3項所述之方法 存取s己憶體是否錯誤之方法為若遠基 可正確判斷該動態隨機存取記憶體之 確,反之則為錯誤。 1 6 ·如申請專利範圍第4項所述之方法 入輸出系統裝置是否錯誤的方法係以 系統裝置内之程式,檢查該基本輸入 ’其中該第 訊號係 ’其中_第二電子元件 電子元伴翁聲順序 所 ,其中閃爍頻率係單 ’其中閃爍頻率係兩 其中資料處理系統 ’其中資料處理系統 ’其中資料處理系統 ’其中測試動態隨機 本輸入輸出系統裝置 規格型號,則為正 ’其中檢查該基本輸 位於該基本輸入輸出 輸出系統裝置之檢總 (Checksum)值是否錯誤。 1 7 ·如申請專利範圍第5項所述之 方法,其中測試顯示卡是Page 12 512275 6. Scope of Patent Application 8 · Method as described in item 1 of the scope of patent application-Hardware signal. 9. The method described in item 1 of the scope of patent application is determined in advance according to the basic input and output system devices. I 0 · Method 1 frequency as described in item 1 of the scope of patent application. II. The method described in item 1 of the scope of patent application. 1 2 · The method described in item 1 of Shenjing's patent scope refers to desktop computers. 1 3. The method described in item 1 of the scope of patent application refers to a notebook computer. 1 4 · The method described in item 1 of the scope of patent application refers to the server. 1 5. The method described in item 3 of the scope of patent application is whether the method of accessing s memory is wrong if Yuanji can correctly determine the dynamic random access memory, otherwise it is an error. 1 6 · As described in item 4 of the scope of the patent application, whether the method of inputting and outputting the system device is wrong is to use the program in the system device to check the basic input 'where the first signal is' where_ the second electronic component electronic component companion Wengsheng Institute, where the flicker frequency is single, where the flicker frequency is two, where the data processing system is, where the data processing system is, where the data processing system is, where the test dynamic random input and output system device specification model is positive, where check the The checksum value of the basic input / output system device in the basic input / output system is incorrect. 1 7 · The method as described in item 5 of the scope of patent application, wherein the test display card is 512275 六、申請專利範圍 否錯誤之方法為若該基本輸入輸出系統裝置可正確判斷該 顯示卡之規格型號,則為正確,反之則為錯誤。 1 8.如申請專利範圍第1項所述之方法,其中位於資料處理 系統主機外殼設置之發光二極體係電源顯示發光二極體。 1 9.如申請專利範圍第1項所述之方法,其中所述之解碼裝 置係系統晶片組中之南橋晶片。 2 0.如申請專利範圍第1項所述之方法,其中所述之解碼裝 置係一輸入輸出(I/O)晶片。 21. —種偵測顯示方法,用以偵測並顯示資料處理系統 中,動態隨機存取記憶體、基本輸入輸出系統裝置及顯示 卡是否錯誤,該資料處理系統包括一主機,該主機外殼設 有一發光二極體,主機内部具至少一基本輸入輸出系統裝 置及一解碼裝置,該偵測顯示方法包括: 以該基本輸入輸出系統裝置測試該動態隨機存取記憶體是 否錯誤; 若檢查結果為錯誤時,則該基本輸入輸出系統裝置傳遞第 一訊號至該解碼裝置,該解碼裝置傳遞第二訊號至該發光 二極體使該發光二極體以第一頻率閃爍; 若檢查結果為正確時,則該基本輸入輸出系統裝置測試該 基本輸入輸出系統裝置是否錯誤; 若檢查結果為錯誤時,則該基本輸入輸出系統裝置傳遞第 三訊號至該解碼裝置,該解碼裝置傳遞第四訊號至該發光 二極體使該發光二極體以第二頻率閃爍; 若檢查結果為正確時^則該基本輸入輸出糸統裝置測試該512275 6. The scope of patent application is wrong. If the basic input / output system device can correctly judge the specifications and models of the display card, it is correct, otherwise it is an error. 1 8. The method as described in item 1 of the scope of patent application, wherein a light-emitting diode system power display light-emitting diode provided in the main body of the data processing system is provided. 19. The method according to item 1 of the scope of patent application, wherein the decoding device is a south bridge chip in a system chipset. 20. The method according to item 1 of the scope of patent application, wherein the decoding device is an input / output (I / O) chip. 21. —A detection and display method for detecting and displaying whether a dynamic random access memory, a basic input / output system device, and a graphics card are wrong in a data processing system. The data processing system includes a host, and the shell of the host is provided with There is a light-emitting diode, and the host has at least one basic input-output system device and a decoding device. The detection and display method includes: using the basic input-output system device to test whether the dynamic random access memory is wrong; if the check result is When the error occurs, the basic input / output system device transmits a first signal to the decoding device, and the decoding device transmits a second signal to the light emitting diode to make the light emitting diode blink at the first frequency; if the inspection result is correct , The basic input / output system device tests whether the basic input / output system device is wrong; if the check result is incorrect, the basic input / output system device passes a third signal to the decoding device, and the decoding device passes a fourth signal to the decoding device The light-emitting diode makes the light-emitting diode flicker at the second frequency; if the inspection result ^ Correct the basic input output system which means that the test 第14頁 512275 六、申請專利範圍 "^ ------ 顯示卡是否錯誤; 若檢查結果為錯誤時,則該基本輸入輸出系統裝置* 五訊號至該解碼裝置,該解碼裝置傳遞第六訊^至=遞第 二極體使該發光二極體以第三頻率閃爍; ~發光 若檢查結果為正確時,則該基本輸入輸出系統、 一電子元件。 、&夏剩試下 22·如申請專利範圍第21項所述之方法,其中該第—: 號、第三訊號及第五訊號係一命令訊號。 X ~訊 23·如申請專利範圍第21項所述之方法,其中該第一 _ 號、第四訊號及第六訊號係一硬體訊號。 訊 24·如申請專利範圍第21所述之方法,其中下一電子一 係依基本輸入輸出系統裝置預先規劃電子元 70件 T丨貝,順序所 決疋。 25·如申請專利範圍第21項所述之方法,其中閃爍頻率 單一頻率。 / ' 2 6 ·如申請專利範圍第2 1項所述之方法,其中閃爍頻率係 兩種(含)以上頻率之組合。 27·如申請專利範圍第25項所述之方法,其中第一頻率、 第二頻率及第三頻率後不相同且相差二倍以上。 2 8 如申請專利範圍第2 1項所述之方法,其中資料處理系 統係指桌上型電腦。 29·如申請專利範圍第21項所述之方法,其中資料處理系 統係指筆記型電腦。 3 0 ·如申請專利範圍第2 1項所述之方法,其中資料處理系Page 14 512275 VI. Scope of patent application " ^ ------ Whether the display card is wrong; if the check result is wrong, the basic I / O system device * five signals to the decoding device, the decoding device passes the first Liuxun ^ to = pass the second pole to make the light-emitting diode flicker at the third frequency; if the light-emitting result is correct, the basic input-output system and an electronic component. &Amp; Xia Yixia 22. The method as described in item 21 of the scope of patent application, wherein the No. :: No. 3, No. 3 and No. 5 signals are an order signal. X ~ News 23. The method as described in item 21 of the scope of patent application, wherein the first signal, the fourth signal and the sixth signal are hardware signals. Newsletter 24. The method as described in the scope of patent application No. 21, in which the next electronic system is based on the basic input and output system device planning 70 electronic components in advance, the order is determined. 25. The method according to item 21 of the scope of patent application, wherein the flicker frequency is a single frequency. / '2 6 · The method described in item 21 of the scope of patent application, wherein the flicker frequency is a combination of two or more frequencies. 27. The method according to item 25 of the scope of patent application, wherein the first frequency, the second frequency, and the third frequency are different from each other and the difference is more than twice. 2 8 The method as described in item 21 of the scope of patent application, wherein the data processing system refers to a desktop computer. 29. The method according to item 21 of the scope of patent application, wherein the data processing system refers to a notebook computer. 30. The method as described in item 21 of the scope of patent application, wherein the data processing is 第15頁 係如指伺服器。 機存 1申請專利範圍第21項所述之方法,复+ 置記憶體是否錯誤之方法為若該基本、中測試動態隨 了,確判斷該·態隨機存取記憶體之出系統装 反之則為錯誤。 現格型號,則為正 3 2 ·如申請專利範圍第2 1項所述之方法,甘 輪入輪出系統裝置是否錯誤的方法係以位、中檢查該基本 出系統裝置内之程式,檢查該基本輸 出,入輪 總(Checksum)值是否錯誤。 韻】出糸統裝置之檢 33.如申請專利範圍第21項所述之方法, 斷 是否錯f法為若該基本輸人輸㈠統//可 該顯不卡之規格型號,則為正確,反之則為錯誤。 34·如申請專利範圍第21項所述之方法’其、、、中曰位於資料處 理糸統主機外殼設置之發光二極體係電源顯示發光二極 體。 35·如申請專利範圍第21項所述之方法,其中所述之解碼 裝置係系統晶片組中之南橋晶片。 36·如申請專利範圍第21項所述之方法,其中所述之解碼 裝置係一輸入輸出(I/O)晶片。Page 15 Refers to the server. The method described in item 21 of the scope of the patent application for machine storage 1 is to reset the memory or not. If the basic and intermediate test dynamics are followed, make sure that the state of random access memory is installed. Otherwise, Is wrong. The current model is a positive 3 2 · As described in item 21 of the scope of patent application, the method of whether the wheel-in and wheel-out system is wrong is to check the program in the basic system out of place and check Check whether the basic output and checksum value are correct. Rhyme] Check out the system. 33. According to the method described in item 21 of the scope of patent application, the method of judging whether or not the f is wrong is that if the basic input is the same as the input model of the system and / or the display card, it is correct. , Otherwise it is an error. 34. The method described in item 21 of the scope of the patent application, which is located in the housing of the main body of the data processing system and is provided with a light emitting diode system power display light emitting diode. 35. The method as described in claim 21, wherein said decoding device is a south bridge chip in a system chipset. 36. The method as described in claim 21, wherein said decoding device is an input / output (I / O) chip. page
TW90105766A 2001-02-23 2001-02-23 Display method for error detection of electronic components TW512275B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW90105766A TW512275B (en) 2001-02-23 2001-02-23 Display method for error detection of electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW90105766A TW512275B (en) 2001-02-23 2001-02-23 Display method for error detection of electronic components

Publications (1)

Publication Number Publication Date
TW512275B true TW512275B (en) 2002-12-01

Family

ID=27731275

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90105766A TW512275B (en) 2001-02-23 2001-02-23 Display method for error detection of electronic components

Country Status (1)

Country Link
TW (1) TW512275B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100401263C (en) * 2005-12-20 2008-07-09 英业达股份有限公司 Error checking system and method after turn-on machine
CN102236596A (en) * 2010-05-05 2011-11-09 英业达股份有限公司 Display card state indication system
US8726088B2 (en) 2011-11-25 2014-05-13 Inventec Corporation Method for processing booting errors
CN105335276A (en) * 2014-06-13 2016-02-17 联想(北京)有限公司 Fault detection method and electronic device
CN113051141A (en) * 2019-12-27 2021-06-29 广达电脑股份有限公司 System and method for providing status information during a power-on self-test routine

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100401263C (en) * 2005-12-20 2008-07-09 英业达股份有限公司 Error checking system and method after turn-on machine
CN102236596A (en) * 2010-05-05 2011-11-09 英业达股份有限公司 Display card state indication system
US8726088B2 (en) 2011-11-25 2014-05-13 Inventec Corporation Method for processing booting errors
CN105335276A (en) * 2014-06-13 2016-02-17 联想(北京)有限公司 Fault detection method and electronic device
CN113051141A (en) * 2019-12-27 2021-06-29 广达电脑股份有限公司 System and method for providing status information during a power-on self-test routine
US11567843B2 (en) 2019-12-27 2023-01-31 Quanta Computer Inc. Method and system for indicating BIOS POST status from a chassis identifying LED

Similar Documents

Publication Publication Date Title
TWI300177B (en)
TWI362588B (en) Monitor apparatus, a monitoring method thereof and computer apparatus therewith
US20070234132A1 (en) System and method for indicating errors of a motherboard
TWI453596B (en) Device and method for outputting bios post code
US20120041707A1 (en) Cold boot test system and method for electronic devices
TWI685735B (en) Method of displaying bios messages in the early stages of power-on self-test of computer system
US20120137027A1 (en) System and method for monitoring input/output port status of peripheral devices
TWI611289B (en) Server and error detecting method thereof
TW201113697A (en) Test device
US8443234B2 (en) Bios refresh device and method using the same
TWI492045B (en) Method and fixture of measure for computer device
TW201337545A (en) Display device capable of displaying power on self test (POST) information
TW512275B (en) Display method for error detection of electronic components
US8250409B2 (en) Boot test apparatus and method of computer system
TWI526819B (en) Apparatus and method for computer debug
TW201527965A (en) System and method for detecting a BIOS test process of a computer
US20130166956A1 (en) Diagnostic card for recording reboot times of servers
TWM291039U (en) Device for detecting an error
TWI245987B (en) Automatic error-detection voice device on motherboard
TW201301023A (en) System and method for testing a mother board
TWI391816B (en) Computer debug method
TW530201B (en) Method and apparatus for alerting the error detection of electronic components
CN1170223C (en) Method for detecting and displaying errors of electronic package
US11194684B2 (en) Information handling system and methods to detect power rail failures and test other components of a system motherboard
TW201839544A (en) Debug device

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MK4A Expiration of patent term of an invention patent