TWI491674B - A resin composition for a light-emitting semiconductor element, and a light-emitting device - Google Patents

A resin composition for a light-emitting semiconductor element, and a light-emitting device Download PDF

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TWI491674B
TWI491674B TW100119819A TW100119819A TWI491674B TW I491674 B TWI491674 B TW I491674B TW 100119819 A TW100119819 A TW 100119819A TW 100119819 A TW100119819 A TW 100119819A TW I491674 B TWI491674 B TW I491674B
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resin composition
semiconductor element
optical semiconductor
light
encapsulating
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TW100119819A
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TW201213442A (en
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Katsuyuki Imazawa
Tsutomu Kashiwagi
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Shinetsu Chemical Co
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L83/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
    • C08L83/04Polysiloxanes
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/12Polysiloxanes containing silicon bound to hydrogen
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/40Glass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • H01L23/295Organic, e.g. plastic containing a filler
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2201/00Properties
    • C08L2201/02Flame or fire retardant/resistant
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00Polymer mixtures characterised by other features
    • C08L2205/02Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Description

光半導體元件封閉用樹脂組成物及發光裝置Resin composition for optical semiconductor element sealing and light-emitting device

本發明係關於一種聚矽氧系之光半導體元件封閉用樹脂組成物,及藉由該樹脂組成物之硬化物所封閉的發光裝置。The present invention relates to a resin composition for sealing a polyfluorene-based optical semiconductor element, and a light-emitting device sealed by a cured product of the resin composition.

於發光二極體(LED)等之光半導體元件之被覆保護用樹脂組成物中,該樹脂組成物之硬化物被要求具有透明性,該組成物一般而言,係使用含有雙酚A型環氧樹脂或脂環式環氧樹脂等之環氧樹脂與酸酐系硬化劑之環氧樹脂組成物(請參照專利文獻1:日本特許第3241338號公報、專利文獻2:日本特開平7-25987號公報)。In the resin composition for coating protection of an optical semiconductor element such as a light-emitting diode (LED), the cured product of the resin composition is required to have transparency, and the composition generally uses a bisphenol A-type ring. An epoxy resin composition such as an epoxy resin or an alicyclic epoxy resin and an acid anhydride-based curing agent (refer to Patent Document 1: Japanese Patent No. 3241338, Patent Document 2: Japanese Patent Laid-Open No. 7-25987 Bulletin).

但,上述環氧樹脂組成物之硬化物,由於對短波長的光之光線透過性低,故有耐光耐久性低,或是因光劣化而著色的缺點。因此,提案有一種光半導體元件之被覆保護用樹脂組成物,其係含有:一分子中至少含有2個SiH基與具有反應性之碳-碳雙鍵之有機化合物、及一分子中至少含有2個SiH基之矽化合物、以及氫化矽烷化觸媒(請參照專利文獻3:日本特開2002-327126號公報、專利文獻4:日本特開2002-338833號公報)。However, since the cured product of the epoxy resin composition has low light transmittance to short-wavelength light, it has low light durability and coloring due to photodegradation. Therefore, there is proposed a resin composition for coating protection of an optical semiconductor element, which comprises an organic compound containing at least two SiH groups and a reactive carbon-carbon double bond in one molecule, and at least 2 molecules in one molecule. For example, JP-A-2002-327126, and JP-A-2002-338833, JP-A-2002-338833, and JP-A-2002-338833.

但,相較於以往之環氧樹脂組成物之硬化物,上述聚矽氧樹脂組成物之硬化物,特別是折射率不滿1.45的聚矽氧樹脂組成物之硬化物,係有著氣體透過性大,而導致存在於保管環境及使用環境中之含硫氣體穿透的缺點。因此,因穿透聚矽氧樹脂組成物之硬化物而來的含硫氣體,而使LED封裝基板的引線框架之鍍銀表面變化成被硫化的硫化銀,其結果,產生了鍍銀表面黑化的問題。However, compared with the cured product of the conventional epoxy resin composition, the cured product of the above polyoxyxylene resin composition, particularly the cured product of the polyoxyxylene resin composition having a refractive index of less than 1.45, has a high gas permeability. The disadvantage of penetrating the sulfur-containing gas present in the storage environment and the use environment. Therefore, the sulfur-plated surface of the lead frame of the LED package substrate is changed to the vulcanized silver sulfide by the sulfur-containing gas which penetrates the hardened material of the polyoxymethylene resin composition, and as a result, a silver-plated surface black is produced. Problem.

一般而言,聚矽氧樹脂組成物之硬化物的氣體透過性為20g/m2 ‧24hr以上,特別是折射率不滿1.45的聚矽氧樹脂組成物之硬化物的氣體透過性為50g/m2 ‧24hr以上,因此能讓存在外部環境中的含硫氣體容易地穿透。就存在於外部環境中之含硫氣體而言,可列舉:大氣中的氧化硫(SOX )、或紙箱等之梱色材料中所含的硫成分。此外,由光的反射效率之觀點來看,LED封裝之引線框架表面,一般而言,被實施有鍍銀處理。於上述之鍍銀引線框架上,將折射率為不滿1.45的聚矽氧樹脂組成物之硬化物所封閉的發光二極體,放置於存在含硫氣體之環境的情況下,含硫氣體會穿透聚矽氧樹脂組成物之硬化物,並進行銀之硫化反應。其結果,在引線框架表面產生硫化銀。因該硫化銀的生成,而使LED封裝基板表面黑化,且光的反射效率會明顯地降低,而成為無法保有長期信賴性的主要原因之一。In general, the gas permeability of the cured product of the polyoxyxene resin composition is 20 g/m 2 ‧24 hr or more, and particularly, the cured product of the polyoxyxylene resin composition having a refractive index of less than 1.45 has a gas permeability of 50 g/m. 2 ‧ 24 hr or more, so that the sulfur-containing gas in the external environment can be easily penetrated. Examples of the sulfur-containing gas present in the external environment include sulfur oxides in the atmosphere (SO X ), and sulfur components contained in a ochre material such as a carton. Further, from the viewpoint of light reflection efficiency, the lead frame surface of the LED package is generally subjected to silver plating treatment. On the silver-plated lead frame described above, the light-emitting diode enclosed by the cured product of the polyoxynoxy resin composition having a refractive index of less than 1.45 is placed in the presence of a sulfur-containing gas, and the sulfur-containing gas is worn. The cured product of the silicone resin composition is permeable and subjected to a sulfurization reaction of silver. As a result, silver sulfide is generated on the surface of the lead frame. Due to the formation of the silver sulfide, the surface of the LED package substrate is blackened, and the light reflection efficiency is remarkably lowered, which is one of the main reasons why long-term reliability cannot be maintained.

因此,就硫化對策而言,近年來提案有:藉由使用氣體透過性較小,且硬化後之折射率為1.45以上的聚矽氧樹脂組成物,來解決上述鍍銀表面之硫化問題。但,相較於折射率不滿1.45的聚矽氧樹脂組成物之硬化物,折射率1.45以上的聚矽氧樹脂組成物之硬化物較脆,且強度低,故在進行吸濕回流及熱衝擊試驗等之熱應力試驗時,會產生樹脂龜裂,且有信賴性試驗無法合格的狀況。Therefore, in recent years, proposals have been made to solve the problem of vulcanization of the silver-plated surface by using a polyoxyxylene resin composition having a small gas permeability and a refractive index of 1.45 or more after curing. However, compared with the cured product of the polyoxyxene resin composition having a refractive index of less than 1.45, the cured product of the polyoxynoxy resin composition having a refractive index of 1.45 or more is brittle and has low strength, so that moisture absorption reflow and thermal shock are performed. In the thermal stress test such as the test, resin cracking occurs and the reliability test fails.

一般而言,為了增強聚矽氧樹脂組成物之硬化物的強度,已知有使用二氧化矽填料作為填充材料的方式。但,二氧化矽填料的形狀為同向性,且將含有上述二氧化矽填料的聚矽氧樹脂組成物,使用於第1圖所示之預成型封裝之封閉劑的情況,雖相較於以往,信賴性試驗的不良率被改善,但吸濕回流及熱衝擊試驗等之熱應力,係對封閉樹脂複雜地作用,僅增強二氧化矽填料的效果,非但無法耐熱應力,且導致樹脂本體裂開的不良產生,而難以使不良率為零。而且,第1圖係顯示習知型發光裝置之一實施形態的剖面圖,1表示光半導體元件、2表示導電性線、3表示鍍銀引線框架、4表示光半導體元件封閉用樹脂、5表示成型封裝基板、6表示二氧化矽填料。In general, in order to enhance the strength of the cured product of the polyoxymethylene resin composition, a method of using a ceria filler as a filler is known. However, the shape of the cerium oxide filler is the same, and the polyfluorene resin composition containing the above cerium oxide filler is used in the case of the pre-molding sealing agent shown in Fig. 1, although In the past, the defect rate of the reliability test was improved, but the thermal stress such as moisture absorption reflow and thermal shock test was complicated for the sealing resin, and only the effect of the cerium oxide filler was enhanced, and not only the heat resistant stress but also the resin body was caused. The badness of cracking occurs, and it is difficult to make the defect rate zero. 1 is a cross-sectional view showing an embodiment of a conventional light-emitting device, wherein 1 denotes an optical semiconductor element, 2 denotes a conductive line, 3 denotes a silver-plated lead frame, 4 denotes an optical semiconductor element sealing resin, and 5 denotes The molded package substrate and 6 represent a ruthenium dioxide filler.

[先前技術文獻][Previous Technical Literature] [專利文獻][Patent Literature]

[專利文獻1]日本特許第3241338號公報[Patent Document 1] Japanese Patent No. 3241338

[專利文獻2]日本特開平7-25987號公報[Patent Document 2] Japanese Patent Laid-Open No. 7-25987

[專利文獻3]日本特開2002-327126號公報[Patent Document 3] Japanese Patent Laid-Open Publication No. 2002-327126

[專利文獻4]日本特開2002-338833號公報[Patent Document 4] Japanese Patent Laid-Open Publication No. 2002-338833

本發明係為了解決上述問題點而開發完成,其目的為提供一種:硬化後之折射率為1.45以上,耐硫化性優異,且可確保能耐吸濕回流或熱衝擊試驗等熱應力試驗之長期信賴性的光半導體元件封閉用樹脂組成物及藉由該光半導體元件封閉用樹脂組成物之硬化物所封閉的發光裝置。The present invention has been developed in order to solve the above problems, and an object of the present invention is to provide a long-term reliability of a thermal stress test such as a moisture repellent reflow or a thermal shock test, which is excellent in sulfuric acid resistance after curing, and has a refractive index of 1.45 or more. A light-emitting device in which a resin composition for sealing an optical semiconductor element and a cured product of the resin composition for sealing the optical semiconductor element are sealed.

本發明者們為了解決上述課題而精心研究的結果發現,使用含有:(A)具有含脂肪族不飽和鍵之一價烴基之有機聚矽氧烷、(B)於一分子中含有2個以上鍵結於矽原子的氫原子之有機氫聚矽氧烷、(C)鉑系觸媒、以及(D)具有長寬比為1.1~50之異向性形狀之玻璃填料的光半導體元件封閉用樹脂組成物之硬化物所封閉的發光裝置,其耐硫化性優異,且可確保能耐吸濕回流或熱衝擊試驗等熱應力試驗之長期信賴性,而完成本發明。As a result of intensive studies to solve the above problems, the present inventors have found that (A) an organic polyoxyalkylene having one hydrocarbon group having an aliphatic unsaturated bond and (B) containing two or more molecules in one molecule are used. An optical semiconductor element for sealing an organic hydrogen polyoxyalkylene bonded to a hydrogen atom of a halogen atom, (C) a platinum-based catalyst, and (D) a glass filler having an anisotropic shape having an aspect ratio of 1.1 to 50 The light-emitting device in which the cured product of the resin composition is sealed is excellent in vulcanization resistance, and can ensure long-term reliability against thermal stress tests such as moisture absorption reflow or thermal shock test, and the present invention has been completed.

因此,本發明係提供下述光半導體元件封閉用樹脂組成物及發光裝置。Therefore, the present invention provides the following resin composition for encapsulating an optical semiconductor element and a light-emitting device.

申請專利範圍1:Patent application scope 1:

一種光半導體元件封閉用樹脂組成物,其特徵為含有:(A)具有含脂肪族不飽和鍵之一價烴基之有機聚矽氧烷、(B)於一分子中含有2個以上鍵結於矽原子的氫原子之有機氫聚矽氧烷、(C)鉑系觸媒、以及(D)具有長寬比為1.1~50之異向性形狀之玻璃填料,且硬化物之折射率為1.45以上。A resin composition for encapsulating an optical semiconductor element, comprising: (A) an organopolyoxane having a monovalent hydrocarbon group containing an aliphatic unsaturated bond, and (B) having two or more bonds in one molecule An organic hydrogen polyoxyalkylene of a hydrogen atom of a halogen atom, (C) a platinum-based catalyst, and (D) a glass filler having an anisotropic shape having an aspect ratio of 1.1 to 50, and a refractive index of the cured product of 1.45 the above.

申請專利範圍2:Patent application scope 2:

如申請專利範圍第1項所記載之光半導體元件封閉用樹脂組成物,其中上述(A)成分為選自下述式之有機聚矽氧烷,The resin composition for encapsulating an optical semiconductor element according to the first aspect of the invention, wherein the component (A) is an organopolysiloxane selected from the group consisting of

【化1】【化1】

(式中,k、m係滿足0≦k+m≦500之整數,0≦(k+m)≦0.5)。(wherein k and m satisfy an integer of 0≦k+m≦500, 0≦(k+m)≦0.5).

申請專利範圍3:Patent application scope 3:

如申請專利範圍第1項或第2項所記載之光半導體元件封閉用樹脂組成物,其中上述(D)具有異向性形狀之玻璃填料,係長寬比為1.1~50之鱗片狀玻璃或玻璃切割纖維。The resin composition for encapsulating an optical semiconductor element according to the first aspect or the second aspect of the invention, wherein the (D) glass filler having an anisotropic shape is a scaly glass or glass having an aspect ratio of 1.1 to 50. Cutting the fiber.

申請專利範圍4:Patent application scope 4:

如申請專利範圍第1項至第3項中任一項所記載之光半導體元件封閉用樹脂組成物,其係含有樹脂組成物整體之5~60質量%的上述(D)具有異向性形狀之玻璃填料。The resin composition for encapsulating an optical semiconductor element according to any one of the first to third aspects of the present invention, wherein the (D) having an anisotropic shape is contained in an amount of 5 to 60% by mass based on the entire resin composition. Glass filler.

申請專利範圍5:Patent application scope 5:

如申請專利範圍第1項至第4項中任一項所記載之光半導體元件封閉用樹脂組成物,其中上述(D)具有異向性形狀之玻璃填料的折射率為1.45~1.55,且上述硬化性聚矽氧樹脂組成物之硬化物的折射率為1.45~1.55。The resin composition for encapsulating an optical semiconductor element according to any one of the above-mentioned (D), wherein the glass filler having an anisotropic shape has a refractive index of 1.45 to 1.55, and the above The cured product of the curable polyoxynene resin composition has a refractive index of 1.45 to 1.55.

申請專利範圍6:Patent application scope 6:

一種發光裝置,其係藉由如申請專利範圍第1項至第5項中任一項所記載之光半導體元件封閉用樹脂組成物之硬化物所封閉。A light-emitting device which is closed by a cured product of a resin composition for encapsulating an optical semiconductor element according to any one of the first to fifth aspects of the invention.

申請專利範圍7:Patent application scope 7:

一種發光二極體裝置,其係使用具有搭載發光元件的引線框架之預成型封裝,並將發光元件搭載於引線框架,藉由封閉樹脂組成物之硬化物所封閉而成,上述封閉樹脂組成物為如申請專利範圍第1項至第5項中任一項所記載之樹脂組成物。A light-emitting diode device using a preform package having a lead frame on which a light-emitting element is mounted, and mounting the light-emitting element on a lead frame, which is closed by a cured product of a sealing resin composition, and the above-mentioned sealing resin composition The resin composition as described in any one of claims 1 to 5.

根據本發明,可得到耐硫化性優異,且可確保能耐吸濕回流或熱衝擊試驗等熱應力試驗之長期信賴性的光半導體元件封閉用樹脂組成物及藉由該光半導體元件封閉用樹脂組成物之硬化物所封閉的發光裝置。According to the present invention, it is possible to obtain a resin composition for encapsulating an optical semiconductor element which is excellent in vulcanization resistance and can ensure long-term reliability in thermal stress tests such as moisture absorption reflow or thermal shock test, and a resin for sealing the optical semiconductor element. A light-emitting device enclosed by a hardened material.

[實施發明之最佳形態][Best Mode for Carrying Out the Invention]

以下,將針對本發明進行詳細地說明。Hereinafter, the present invention will be described in detail.

本發明之光半導體元件封閉用樹脂組成物,係含有:The resin composition for encapsulating an optical semiconductor element of the present invention contains:

(A)具有含脂肪族不飽和鍵之一價烴基之有機聚矽氧烷、(A) an organopolyoxane having a monovalent hydrocarbon group containing an aliphatic unsaturated bond,

(B)於一分子中含有2個以上鍵結於矽原子的氫原子之有機氫聚矽氧烷、(B) an organohydrogen polyoxyalkylene containing two or more hydrogen atoms bonded to a halogen atom in one molecule,

(C)鉑系觸媒、以及(C) platinum-based catalyst, and

(D)具有異向性形狀之玻璃填料。(D) A glass filler having an anisotropic shape.

(A)成分(A) component

本發明之(A)成分,係具有含脂肪族不飽和鍵之烴基之有機聚矽氧烷,可適合使用下述一般式(1)所示者。The component (A) of the present invention is an organopolyoxyalkylene having a hydrocarbon group containing an aliphatic unsaturated bond, and can be suitably used as shown in the following general formula (1).

【化2】[Chemical 2]

(式中,R1 係含脂肪族不飽和鍵之一價烴基,R2 ~R7 係分別相同或不同之一價烴基,其中R4 ~R7 較佳為不具有脂肪族不飽和鍵之一價烴基,此外,R6 及/或R7 係芳香族一價烴基。a為0≦a≦500,較佳為10≦a≦500之整數;b為0≦b≦250,較佳為0≦b≦150之整數;0≦a+b≦500,較佳為10≦a+b≦500)。(Wherein, R 1 is based, one containing an aliphatic unsaturated bond monovalent hydrocarbon group, R 2 ~ R 7 are the same or different one-based monovalent hydrocarbon group, wherein R 4 ~ R 7 is preferably not contain an aliphatically unsaturated bond of a monovalent hydrocarbon group, further, R 6 and/or R 7 is an aromatic monovalent hydrocarbon group. a is 0 ≦ a ≦ 500, preferably an integer of 10 ≦ a ≦ 500; b is 0 ≦ b ≦ 250, preferably An integer of 0 ≦ b ≦ 150; 0 ≦ a + b ≦ 500, preferably 10 ≦ a + b ≦ 500).

此時,R1 係具有脂肪族不飽和鍵,特別是具有脂肪族不飽和雙鍵之較佳為碳數2~8,更佳為2~6之一價烴基。作為R1 之含脂肪族不飽和鍵之一價烴基,具體而言,以乙烯基、丙烯基(allyl)、丙烯基(propenyl)、丁烯基等之烯基為佳,以乙烯基、丙烯基(allyl)為特佳。In this case, R 1 has an aliphatic unsaturated bond, and particularly preferably has an aliphatic unsaturated double bond of 2 to 8 carbon atoms, more preferably 2 to 6 carbon monovalent hydrocarbon groups. The monovalent hydrocarbon group containing an aliphatic unsaturated bond of R 1 , specifically, an alkenyl group such as a vinyl group, an allyl group, a propenyl group or a butenyl group, preferably a vinyl group or a propylene group. The base (allyl) is especially good.

R2 ~R7 為一價烴基,以碳數為1~20,特別是1~10之範圍內者較為適合。R2 ~R7 之一價烴基,具體而言,雖可列舉:甲基、乙基、丙基、丁基等之烷基;乙烯基、丙烯基(allyl)、丙烯基(propenyl)、丁烯基等之烯基;苯基、甲苯基、二甲苯基等之芳基;苄基等之芳烷基等,但其中R4 ~R7 係以不具有烯基等之脂肪族不飽和鍵之基為佳,具體而言,以烷基、芳基、芳烷基等為佳。此外,R6 及/或R7 係以苯基、甲苯基等之碳數為6~12之芳基等之芳香族一價烴基為佳。R 2 to R 7 are monovalent hydrocarbon groups, and those having a carbon number of from 1 to 20, particularly from 1 to 10, are suitable. The monovalent hydrocarbon group of R 2 to R 7 may specifically be an alkyl group such as a methyl group, an ethyl group, a propyl group or a butyl group; a vinyl group, an allyl group, a propenyl group or a butyl group; An alkenyl group such as an alkenyl group; an aryl group such as a phenyl group, a tolyl group or a xylyl group; an aralkyl group such as a benzyl group; and the like, wherein R 4 to R 7 are an aliphatic unsaturated bond having no alkenyl group or the like. The base is preferred, and specifically, an alkyl group, an aryl group, an aralkyl group or the like is preferred. Further, R 6 and/or R 7 are preferably an aromatic monovalent hydrocarbon group such as an aryl group having 6 to 12 carbon atoms such as a phenyl group or a tolyl group.

上述一般式(1)所示之有機聚矽氧烷,雖可藉由例如:環狀二苯基聚矽氧烷、環狀甲基苯基聚矽氧烷等之環狀二有機聚矽氧烷,與構成末端基之二苯基四乙烯二矽氧烷、二乙烯四苯基二矽氧烷等之二矽氧烷的鹼平衡化反應而得,但此時,通常不含有矽醇基及氯。The organopolyoxane represented by the above general formula (1) may be a cyclic diorganopolyoxygen oxide such as a cyclic diphenyl polysiloxane or a cyclic methylphenyl polyoxyalkylene. The alkane is obtained by a base equilibrium reaction with a dioxane such as diphenyltetraethylenedioxane or diethylenetetraphenyldioxane which constitutes a terminal group, but in this case, usually does not contain a decyl group. And chlorine.

上述一般式(1)所示之有機聚矽氧烷,具體而言,係以下述結構式所示者為例示。The organopolyoxyalkylene represented by the above general formula (1) is specifically exemplified by the following structural formula.

【化3】[化3]

(於上述式中,k、m係滿足0≦k+m≦500之整數,較佳為5≦k+m≦250,且0≦m/(k+m)≦0.5)。(In the above formula, k and m satisfy an integer of 0≦k+m≦500, preferably 5≦k+m≦250, and 0≦m/(k+m)≦0.5).

(A)成分,除了具有上述一般式(1)所示之直鏈結構之有機聚矽氧烷之外,也可視需要併用具有包含3官能性矽氧烷單位、4官能性矽氧烷單位等之立體網狀結構之有機聚矽氧烷。In addition to the organopolyoxane having the linear structure represented by the above general formula (1), the component (A) may be optionally used in combination with a trifunctional azide unit, a tetrafunctional azide unit, or the like. An organic polyoxane of a three-dimensional network structure.

(A)成分中之含脂肪族不飽和鍵之一價烴基之含量,係以全一價烴基之1~50莫耳%為佳,較佳為2~40莫耳%,更佳為5~30莫耳%。含脂肪族不飽和鍵之一價烴基之含量,若低於1莫耳%,則無法得到硬化物;若高於50莫耳%,則機械特性會變差。The content of the monovalent hydrocarbon group containing an aliphatic unsaturated bond in the component (A) is preferably from 1 to 50 mol%, more preferably from 2 to 40 mol%, more preferably from 5 to 10% by mol of the monovalent hydrocarbon group. 30 moles %. When the content of the monovalent hydrocarbon group containing an aliphatic unsaturated bond is less than 1 mol%, the cured product cannot be obtained; if it is more than 50 mol%, the mechanical properties are deteriorated.

此外,(A)成分中之芳香族基之含量,係以全一價烴基之0~95莫耳%為佳,較佳為10~90莫耳%,更佳為20~80莫耳%。樹脂中適量地含有芳香族基者有機械特性佳且較容易製造的優點。此外,亦可列舉另一項優點,即:藉由芳香族基之導入而可控制折射率。Further, the content of the aromatic group in the component (A) is preferably from 0 to 95 mol%, more preferably from 10 to 90 mol%, still more preferably from 20 to 80 mol%, based on the total monovalent hydrocarbon group. An appropriate amount of an aromatic group in the resin has an advantage of being excellent in mechanical properties and being easy to manufacture. Further, another advantage can be cited in that the refractive index can be controlled by introduction of an aromatic group.

(B)成分(B) component

(B)成分係於一分子中含有2個以上鍵結於矽原子的氫原子之有機氫聚矽氧烷。上述有機氫聚矽氧烷,係作為交聯劑而作用者,藉由該有機氫聚矽氧烷中之SiH基與(A)成分之含脂肪族不飽和鍵之一價烴基(典型為烯基)加成反應,而形成硬化物。The component (B) is an organohydrogen polyoxyalkylene containing two or more hydrogen atoms bonded to a halogen atom in one molecule. The above-mentioned organohydrogen polyoxyalkylene is used as a crosslinking agent, and the monovalent hydrocarbon group (typically an alkene) of the SiH group in the organic hydrogen polyoxyalkylene and the aliphatic unsaturated bond of the component (A) The base is subjected to an addition reaction to form a hardened substance.

此外,上述有機氫聚矽氧烷,因具有芳香族烴基,故在具有上述(A)成分之含脂肪族不飽和鍵之一價烴基之有機矽化合物為高折射率的情況下,可提高相溶性,且賦予透明的硬化物。因此,於(B)成分之有機氫聚矽氧烷中,可以含有具苯基等之芳香族一價烴基之有機氫聚矽氧烷,來作為(B)成分之一部分或全部。Further, since the above-mentioned organic hydrogen polyoxyalkylene has an aromatic hydrocarbon group, when the organic ruthenium compound having one of the aliphatic unsaturated groups containing the aliphatic unsaturated bond of the above component (A) has a high refractive index, the phase can be improved. It is soluble and imparts a transparent cured product. Therefore, the organic hydrogen polyoxyalkylene of the component (B) may contain an organic hydrogen polyoxyalkylene having an aromatic monovalent hydrocarbon group such as a phenyl group as part or all of the component (B).

此外,於(B)成分之有機氫聚矽氧烷中,可含有具環氧丙基結構之有機氫聚矽氧烷,來作為(B)成分之一部分或全部,有機氫聚矽氧烷,因具有含環氧丙基結構之基,故可賦予與基板之黏著性高的光半導體元件封閉用樹脂組成物之硬化物。Further, in the organic hydrogen polyoxyalkylene of the component (B), an organohydrogen polyoxyalkylene having a glycidyl structure may be contained as a part or all of the component (B), an organohydrogenpolyoxane, Since the epoxy group-containing structure is provided, it is possible to provide a cured product of the resin composition for encapsulating the optical semiconductor element having high adhesion to the substrate.

有機氫聚矽氧烷,具體而言,雖不限於此等,但可列舉:1,1,3,3-四甲基二矽氧烷、1,3,5,7-四甲基環四矽氧烷、三(二甲基氫矽氧基)甲矽烷、三(二甲基氫矽氧基)苯基矽烷、1-環氧丙氧基丙基(glycidoxypropyl)-1,3,5,7-四甲基環四矽氧烷、1,5-環氧丙氧基丙基-1,3,5,7-四甲基環四矽氧烷、1-環氧丙氧基丙基-5-三甲氧基矽乙基(trimethoxysilylethyl)-1,3,5,7-四甲基環四矽氧烷、兩末端三甲基矽氧基封端甲基氫聚矽氧烷、兩末端三甲基矽氧基封端二甲基矽氧烷‧甲基氫矽氧烷共聚物、兩末端二甲基氫矽氧基封端二甲基聚矽氧烷、兩末端二甲基氫矽氧基封端二甲基矽氧烷‧甲基氫矽氧烷共聚物、兩末端三甲基矽氧基封端甲基氫矽氧烷‧二苯基矽氧烷共聚物、兩末端三甲基矽氧基封端甲基氫矽氧烷‧二苯基矽氧烷‧二甲基矽氧烷共聚物、三甲基氧矽烷聚合物、(CH3 )2 HSiO1/2 單位與SiO4/2 單位所構成之共聚物、(CH3 )2 HSiO1/2 單位與SiO4/2 單位與(C6 H5 )SiO3/2 單位所構成之共聚物等。The organic hydrogen polyoxyalkylene is specifically not limited thereto, and examples thereof include 1,1,3,3-tetramethyldioxane and 1,3,5,7-tetramethylcyclotetra Oxane, tris(dimethylhydroperoxy)methane, tris(dimethylhydroquinooxy)phenylnonane,glycidoxypropyl-1,3,5, 7-Tetramethylcyclotetraoxane, 1,5-glycidoxypropyl-1,3,5,7-tetramethylcyclotetraoxane, 1-glycidoxypropyl- 5-trimethoxysilylethyl-1,3,5,7-tetramethylcyclotetraoxane, two-terminal trimethylphosphonium-terminated methylhydrogenpolyoxyalkylene, two terminal three Methyl methoxy-terminated dimethyl oxane ‧ methyl hydrazine copolymer, two-terminal dimethyl hydroquinone-terminated dimethyl polyoxy siloxane, two-terminal dimethyl hydroquinone Base-terminated dimethyloxane ‧ methylhydroquinoxane copolymer, two-terminal trimethyl methoxy-terminated methyl hydroquinone ‧ diphenyl decane copolymer, two-terminal trimethyl矽oxy-terminated methylhydroquinoxane, diphenyloxane, dimethyl methoxy hydride copolymer, trimethyl oxane polymer, (CH 3 ) 2 HSiO 1/2 unit and SiO a copolymer composed of 4/2 units, a copolymer of (CH 3 ) 2 HSiO 1/2 unit, and a copolymer of SiO 4/2 unit and (C 6 H 5 )SiO 3/2 unit.

此外,亦可用使用以下述結構式所示之單位而得之有機氫聚矽氧烷。Further, an organohydrogenpolyoxyalkylene obtained by using the unit represented by the following structural formula may also be used.

【化4】【化4】

使用上述結構式所示之單位而得之有機氫聚矽氧烷,係列舉如下。The organohydrogen polyoxyalkylene obtained by using the unit shown by the above structural formula is as follows.

【化5】【化5】

上述有機氫聚矽氧烷之分子結構,為直鏈狀、環狀、分支狀、立體網狀結構中之任一者皆可,且可使用一分子中矽原子數(或聚合度)為2個以上,較佳為2~1,000,更佳為2~300左右者。The molecular structure of the above-mentioned organic hydrogen polyoxyalkylene may be any of linear, cyclic, branched, and three-dimensional network structures, and the number of germanium atoms (or polymerization degree) in one molecule may be 2 One or more, preferably 2 to 1,000, more preferably 2 to 300 or so.

上述有機氫聚矽氧烷之調配量,較佳為,能夠對於每1個(A)成分之含脂肪族不飽和鍵之一價烴基(典型為烯基)而賦予0.75~2.0個(B)成分中之矽原子鍵結氫原子(SiH基)的充足量。若少於成為0.75個的量,則會有硬度變低的情況,若多於成為2.0個的量,則會有SiH基殘留而隨著時間經過發生硬度變化的情況。The amount of the above-mentioned organic hydrogen polyoxyalkylene is preferably 0.75 to 2.0 (B) for one of the aliphatic unsaturated groups (typically alkenyl groups) of the aliphatic unsaturated bond per component (A). A sufficient amount of a hydrogen atom (SiH group) bonded to a ruthenium atom in the composition. When the amount is less than 0.75, the hardness may be lowered. When the amount is more than 2.0, the SiH group may remain and the hardness may change with time.

(C)成分(C) component

(C)成分為鉑系觸媒。鉑系觸媒,係可列舉具有氯鉑酸、醇變性氯鉑酸、螯合結構之鉑錯合物等。此等係可單獨,或組合2種以上使用。The component (C) is a platinum-based catalyst. Examples of the platinum-based catalyst include chloroplatinic acid, alcohol-modified chloroplatinic acid, and a platinum complex of a chelate structure. These may be used alone or in combination of two or more.

上述觸媒成分之調配量,即所謂的觸媒量,通常每上述(A)及(B)成分之合計量100質量份,以鉑族金屬之質量換算,以0.1~500ppm者為佳,特別是在0.5~100ppm之範圍內使用者為佳。The amount of the catalyst component to be added, that is, the amount of the catalyst, is usually 100 parts by mass of the total amount of the components (A) and (B), and is preferably 0.1 to 500 ppm in terms of the mass of the platinum group metal, particularly It is preferably in the range of 0.5 to 100 ppm.

(D)成分(D) component

(D)成分係具有長寬比為1.1~50之異向性形狀之玻璃瑱料。具有該異向性形狀之玻璃瑱料的長寬比,係以1.5~30為佳,以2~20為更佳。長寬比若超過50,則會有封閉樹脂時之吐出精度不穩定的情況。該玻璃填料,係適合使用鱗片狀玻璃、玻璃切割纖維等。此外,具有上述異向性形狀之玻璃填料的長度或平均粒徑,係適合使用較佳為1mm以下,更佳為0.005~0.5mm者。若超過1mm,則會有在封閉樹脂時之吐出精度不穩定的情況。此外,平均粒徑,為1~50μm,特別以10~20μm為佳。而且,長度或平均粒徑,係可利用顯微鏡觀察而求得,且為50個試片之平均值。The component (D) is a glass material having an anisotropic shape having an aspect ratio of 1.1 to 50. The aspect ratio of the glass crucible having the anisotropic shape is preferably from 1.5 to 30, more preferably from 2 to 20. When the aspect ratio exceeds 50, the discharge accuracy when the resin is sealed may be unstable. As the glass filler, scaly glass, glass cut fiber, or the like is suitably used. Further, the length or average particle diameter of the glass filler having the above anisotropic shape is preferably 1 mm or less, more preferably 0.005 to 0.5 mm. If it exceeds 1 mm, there is a case where the discharge accuracy is unstable when the resin is sealed. Further, the average particle diameter is preferably from 1 to 50 μm, particularly preferably from 10 to 20 μm. Further, the length or the average particle diameter can be obtained by observation with a microscope, and is an average value of 50 test pieces.

具有上述異向性形狀之玻璃填料的折射率,係以1.45~1.55為佳。若超出上述範圍,則會有與聚矽氧樹脂之折射率差變大,且損害混合物之透明性的情況。The refractive index of the glass filler having the above anisotropic shape is preferably 1.45 to 1.55. If it exceeds the above range, the difference in refractive index from the polyoxyxylene resin may increase, and the transparency of the mixture may be impaired.

作為具有上述異向性形狀之玻璃填料,係可使用市售品,例如,鱗片狀玻璃可適合使用日本板硝子(股)製之玻璃片(註冊商標)(製品編號:REF-600、REF-160、REF-015等)等。此外,玻璃切割纖維亦可適合使用日東紡績(股)製之磨碎纖維(製品編號:PFE-001、PFE-301等)等。As the glass filler having the above-described anisotropic shape, a commercially available product can be used. For example, a scaly glass can be suitably used for a glass sheet (registered trademark) manufactured by Nippon Sheet Glass Co., Ltd. (Product No.: REF-600, REF-160) , REF-015, etc.). In addition, the glass-cut fiber may be suitably used as the ground fiber (product number: PFE-001, PFE-301, etc.) manufactured by Nitto Denko.

於具有同向性之填料的情況,樹脂之線膨脹係數在面內方向及垂直方向不會產生差異。但,於填充有具異向性形狀之填料的情況,在樹脂之面內方向與垂直方向線膨脹係數不同,且面內方向之線膨脹係數會變得較垂直方向更小,而可緩和面內方向的應力。此外,於預成型封裝的情況,由於在面內方向金屬框架的線膨脹與成型材料的線膨脹相互複雜地作用,故對封閉劑之應力會變得比垂直方向更大。因此,於使用使具有如上述異向性形狀的填料分散之硬化性聚矽氧作為封閉樹脂的情況,由於可緩和面內方向的應力,因此認為對於吸濕回流或耐衝擊試驗等之熱應力試驗,可得到很大的效果。In the case of a filler having the same orientation, the linear expansion coefficient of the resin does not differ in the in-plane direction and the vertical direction. However, in the case of filling a filler having an anisotropic shape, the coefficient of linear expansion in the in-plane direction and the vertical direction of the resin is different, and the coefficient of linear expansion in the in-plane direction becomes smaller than the vertical direction, and the surface can be relaxed. Stress in the inner direction. Further, in the case of the preformed package, since the linear expansion of the metal frame in the in-plane direction and the linear expansion of the molding material are complicated, the stress on the sealant becomes larger than the vertical direction. Therefore, in the case of using a curable polyfluorene gas having a filler having an anisotropic shape as described above as a sealing resin, since the stress in the in-plane direction can be alleviated, it is considered that thermal stress for moisture absorption reflow or impact resistance test or the like is considered. The test can get a lot of results.

(E)其他成分(E) Other ingredients

本發明所使用之光半導體元件封閉用樹脂組成物,雖將上述之(A)~(D)成分作為必須成分,但為了提昇黏著性,亦可視需要進一步添加各種的矽烷偶合劑。In the resin composition for encapsulating an optical semiconductor element used in the present invention, the above-mentioned components (A) to (D) are essential components. However, in order to improve the adhesion, various decane coupling agents may be further added as needed.

矽烷偶合劑,可列舉例如:乙烯三甲氧矽烷、乙烯三乙氧矽烷、2-(3,4-環氧環己基)乙基三甲氧矽烷、3-環氧丙氧基丙基三甲氧矽烷、3-環氧丙氧基丙基甲基二乙氧矽烷、3-環氧丙氧基丙基三乙氧矽烷、3-甲基丙烯醯氧丙基甲基二甲氧矽烷、3-甲基丙烯醯氧丙基三甲氧矽烷、3-甲基丙烯醯氧丙基甲基二乙氧矽烷、3-甲基丙烯醯氧丙基三乙氧矽烷、N-2(胺基乙基)3-胺基丙基甲基二甲氧矽烷、N-2(胺基乙基)3-胺基丙基三甲氧矽烷、N-2(胺基乙基)3-胺基丙基三乙氧矽烷、3-胺基丙基三甲氧矽烷、3-胺基丙基三乙氧矽烷、N-苯基-3-胺基丙基三甲氧矽烷、3-硫醇基丙基三甲氧基矽烷等,或三甲氧基矽烷、四甲氧基矽烷及其寡聚物等。此等之矽烷偶合劑,係可以單獨或2種以上混合使用。Examples of the decane coupling agent include ethylene trimethoxy decane, ethylene triethoxy decane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxy decane, and 3-glycidoxypropyltrimethoxy decane. 3-glycidoxypropylmethyldiethoxydecane, 3-glycidoxypropyltriethoxydecane, 3-methylpropenyloxypropylmethyldimethoxydecane, 3-methyl Propylene oxime propyl trimethoxy decane, 3-methyl propylene oxiranyl methyl diethoxy decane, 3-methyl propylene oxypropyl triethoxy decane, N-2 (aminoethyl) 3- Aminopropyl methyldimethoxydecane, N-2 (aminoethyl) 3-aminopropyltrimethoxyoxane, N-2 (aminoethyl) 3-aminopropyltriethoxy decane, 3-aminopropyltrimethoxy decane, 3-aminopropyltriethoxy decane, N-phenyl-3-aminopropyltrimethoxy decane, 3-thiolpropyltrimethoxydecane, etc., or Trimethoxy decane, tetramethoxy decane, oligomers thereof, and the like. These decane coupling agents may be used singly or in combination of two or more kinds.

矽烷偶合劑之調配量,係組成物整體之10質量%以下(0~10質量%),特別是以5質量%以下(0~5質量%)者為佳。The blending amount of the decane coupling agent is preferably 10% by mass or less (0 to 10% by mass) based on the entire composition, and particularly preferably 5% by mass or less (0 to 5% by mass).

此外,本發明所使用之加成硬化型聚矽氧樹脂組成物,係在不使光半導體裝置的性能惡化的範圍內,視需要亦可添加例如:BHT、維生素B等之抗氧化劑、有機磷系防變色劑等之防變色劑、受阻胺等之光劣化防止劑、乙烯醚類、乙烯醯胺類、環氧樹脂、環氧丙烷類、鄰苯二甲酸烯丙酯類、己二酸乙烯等之活性稀釋劑、發煙二氧化矽或沉澱型二氧化矽等之補強性填充材料、難燃性提昇劑、螢光體、有機溶劑等。此外,因著色成分而著色亦無妨。In addition, the addition-hardening type polyoxo resin composition used in the present invention may contain, for example, an antioxidant such as BHT or vitamin B, or an organic phosphorus, in a range where the performance of the optical semiconductor device is not deteriorated. Anti-tarnishing agent such as anti-tarnishing agent, photo-deterioration inhibitor such as hindered amine, vinyl ether, vinyl decylamine, epoxy resin, propylene oxide, allyl phthalate, ethylene adipate Reinforcing fillers such as reactive diluents, fumed cerium oxide or precipitated cerium oxide, flame retardant enhancers, phosphors, organic solvents, and the like. In addition, it is possible to color by coloring ingredients.

本發明之光半導體元件封閉用樹脂組成物之硬化物,係用於光半導體元件之封閉者,光半導體雖不特別限定於該等,但可列舉例如:發光二極體、光電晶體、光二極體、CCD、太陽能電池模組、EPROM、光耦合器等,特別是對發光二極體之封閉有效。此時,就封閉方法而言,係採用對應於光半導體元件之種類的常法。The cured product of the resin composition for encapsulating an optical semiconductor element of the present invention is used for the sealing of an optical semiconductor element, and the optical semiconductor is not particularly limited thereto, and examples thereof include a light-emitting diode, a photoelectric crystal, and a photodiode. Body, CCD, solar cell module, EPROM, optocoupler, etc., especially for the sealing of the light-emitting diode. At this time, in terms of the sealing method, a conventional method corresponding to the kind of the optical semiconductor element is employed.

而且,本發明之光半導體元件封閉用樹脂組成物之硬化條件,雖可考慮在室溫至200℃左右的溫度範圍下,從數十秒起數日左右的時間範圍,但以80~180℃的溫度範圍下從1分鐘左右起10小時左右的時間範圍者為佳。Further, the curing conditions of the resin composition for encapsulating an optical semiconductor element of the present invention can be considered to be in the range of from room temperature to about 200 ° C for a period of several days from several tens of seconds, but at 80 to 180 ° C. It is better to have a time range of about 10 hours from about 1 minute in the temperature range.

此外,本發明之光半導體元件封閉用樹脂組成物之硬化物的折射率為1.45以上,較佳為1.45~1.55。若未達1.45,則會有氣體透過性變低,且耐硫化性下降的情況,若超過1.55,則會有耐熱性下降,且長期信賴性下降的情況。而且,硬化物的折射率,係可藉由依據(A)成分或情況來調整(B)成分中之苯基等之芳香族一價烴基之含量而調配成所期望的值。一般而言,若增加芳香族一價烴基之量,則折射率也會上昇。此外,硬化物之折射率與(D)成分之折射率的差為0~0.1,特別是以0~0.05為佳。Further, the cured product of the resin composition for encapsulating an optical semiconductor element of the present invention has a refractive index of 1.45 or more, preferably 1.45 to 1.55. If it is less than 1.45, the gas permeability may be lowered and the sulfidation resistance may be lowered. If it exceeds 1.55, the heat resistance may be lowered and the long-term reliability may be lowered. Further, the refractive index of the cured product can be adjusted to a desired value by adjusting the content of the aromatic monovalent hydrocarbon group such as a phenyl group in the component (B) according to the component (A) or the case. In general, if the amount of the aromatic monovalent hydrocarbon group is increased, the refractive index also rises. Further, the difference between the refractive index of the cured product and the refractive index of the component (D) is from 0 to 0.1, particularly preferably from 0 to 0.05.

第2圖係模式性顯示本發明發光裝置之一實施形態的剖面圖。於成型封裝基板5之凹部設置光半導體元件1,透過導電性線2而將鍍銀引線框架3與光半導體元件1連接。於設置有光半導體元件1之成型封裝基板5的凹部,倒入調配有具異向性形狀之玻璃填料7之光半導體元件封閉用樹脂組成物4,使其硬化而製造本發明之發光裝置。Fig. 2 is a cross-sectional view schematically showing an embodiment of a light-emitting device of the present invention. The optical semiconductor element 1 is provided in the concave portion of the molded package substrate 5, and the silver-plated lead frame 3 is connected to the optical semiconductor element 1 through the conductive wire 2. In the concave portion of the molded package substrate 5 on which the optical semiconductor element 1 is provided, the optical semiconductor element sealing resin composition 4 in which the glass filler 7 having an anisotropic shape is placed is cured and cured to produce the light-emitting device of the present invention.

以本發明之光半導體元件封閉用樹脂組成物之硬化物所被覆保護的光半導體裝置,其裝置之耐熱性、耐濕性、耐光性優異,且不會受外部環境的影響而讓基板表面變色,其結果,可提供信賴性優異的光半導體裝置,且產業上的優點極大。The optical semiconductor device protected by the cured product of the resin composition for encapsulating the optical semiconductor element of the present invention is excellent in heat resistance, moisture resistance, and light resistance, and is not affected by the external environment to discolor the surface of the substrate. As a result, an optical semiconductor device having excellent reliability can be provided, and industrial advantages are extremely large.

[實施例][Examples]

以下雖顯示實施例及比較例而對本發明進行具體地說明,但本發明並不受下述之實施例所限制。而且,在下述例示中,份係表示質量份,Me係表示甲基、Et係表示乙基,黏度係依據旋轉黏度計所得之測定值。The present invention will be specifically described below by showing examples and comparative examples, but the present invention is not limited by the following examples. Further, in the following examples, the parts represent the parts by mass, the Me system represents a methyl group, the Et system represents an ethyl group, and the viscosity is a measured value obtained by a rotational viscometer.

[基質化合物之調製][Modulation of matrix compounds]

將(A)成分,係下述式(I)The component (A) is the following formula (I)

【化6】【化6】

所示之兩末端二甲基乙烯基矽烷基封端二甲基二苯基聚矽氧烷(黏度3Pa‧s)100份、(B)成分,係下述式(II)The two-terminal dimethylvinyl fluorenyl terminated dimethyldiphenyl polyoxyalkylene (viscosity 3Pa ‧) 100 parts, (B) component, is the following formula (II)

【化7】【化7】

所示之兩末端二甲基氫矽烷基封端甲基氫聚矽氧烷(黏度15mPa‧a)2.5份、(C)成分,係氯鉑酸2-乙基己醇變性溶液(Pt濃度2質量%)0.03份、進而將乙炔基環己醇0.05份,及3-環氧丙氧基丙基三甲氧矽烷7份均勻攪拌而調製出折射率1.51之基質化合物。The two-terminal dimethyl hydroquinone-terminated methylhydropolysiloxane (viscosity 15mPa‧a), 2.5 parts, (C) component, is a chloroplatinic acid 2-ethylhexanol denaturing solution (Pt concentration 2 0.03 parts by mass, and further 0.05 parts of ethynylcyclohexanol and 7 parts of 3-glycidoxypropyltrimethoxydecane were uniformly stirred to prepare a matrix compound having a refractive index of 1.51.

[實施例1][Example 1]

於上述基質化合物中,將(D)成分為使折射率1.51之日本板硝子(股)製之玻璃片(註冊商標)(製品編號:REF-015、平均粒徑:15μm、長寬比:3~10)分散成為10質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned matrix compound, the component (D) is a glass piece (registered trademark) made of Nippon Sheet Glass Co., Ltd. having a refractive index of 1.51 (product number: REF-015, average particle diameter: 15 μm, aspect ratio: 3 ~) 10) The dispersion was made into a concentration of 10% by mass, filled in an unsealed light-emitting diode (LED), and solidified at 150 ° C for 4 hours to prepare an evaluation light-emitting diode.

[實施例2][Embodiment 2]

於上述基質化合物中,將(D)成分為使折射率1.51之日本板硝子(股)製之玻璃片(註冊商標)(製品編號:REF-015、平均粒徑:15μm、長寬比:3~10)分散成為50質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned matrix compound, the component (D) is a glass piece (registered trademark) made of Nippon Sheet Glass Co., Ltd. having a refractive index of 1.51 (product number: REF-015, average particle diameter: 15 μm, aspect ratio: 3 ~) 10) When the concentration was 50% by mass, the film was filled in an unsealed light-emitting diode (LED), and was solidified at 150 ° C for 4 hours to prepare an evaluation light-emitting diode.

[實施例3][Example 3]

於上述基質化合物中,將(D)成分為使折射率1.51之日東紡績(股)製之磨碎纖維(製品編號:PFE-301、微粉末狀玻璃纖維、平均粒徑:10μm、長寬比:1.1~10)分散成為10質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned matrix compound, the component (D) is a ground fiber made from Nitto Dough Co., Ltd. having a refractive index of 1.51 (product number: PFE-301, fine powdery glass fiber, average particle diameter: 10 μm, aspect ratio) : 1.1 to 10) The dispersion is 10% by mass, and is filled in an unsealed light-emitting diode (LED), and is finally hardened at 150 ° C for 4 hours to prepare an evaluation light-emitting diode.

[實施例4][Example 4]

於上述基質化合物中,將(D)成分為使折射率1.51之日東紡績(股)製之磨碎纖維(製品編號:PFE-301、微粉末狀玻璃纖維、平均粒徑:10μm、長寬比:1.1~10)分散成為50質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned matrix compound, the component (D) is a ground fiber made from Nitto Dough Co., Ltd. having a refractive index of 1.51 (product number: PFE-301, fine powdery glass fiber, average particle diameter: 10 μm, aspect ratio) : 1.1 to 10) When the concentration is 50% by mass, it is filled in an unsealed light-emitting diode (LED), and is hardened at 150 ° C for 4 hours to prepare an evaluation light-emitting diode.

[比較例1][Comparative Example 1]

僅將上述基質化合物填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。Only the above-mentioned matrix compound was filled in an unsealed light-emitting diode (LED), and it was hardened at 150 ° C for 4 hours to prepare an evaluation light-emitting diode.

[比較例2][Comparative Example 2]

於上述聚矽氧樹脂組成物中,將(股)龍森製球狀二氧化矽填料(商品名:高純度FF-L、平均粒徑:3μm)分散成為10質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned polyoxyxylene resin composition, a spheroidal cerium oxide filler (trade name: high purity FF-L, average particle diameter: 3 μm) produced by Ronson is dispersed to a concentration of 10% by mass, and is filled in The light-emitting diode (LED) was not sealed, and it was hardened under conditions of 150 ° C for 4 hours to prepare a light-emitting diode for evaluation.

[比較例3][Comparative Example 3]

於上述基質化合物中,將(股)龍森製球狀二氧化矽填料(商品名:高純度FF-L、平均粒徑:3μm)分散成為50質量%之濃度者,填充於未封閉發光二極體(LED),在150℃、4小時的條件下正式硬化而製作出評價用發光二極體。In the above-mentioned matrix compound, a spheroidal cerium oxide filler (trade name: high purity FF-L, average particle diameter: 3 μm) produced by Ronson is dispersed to a concentration of 50% by mass, and is filled in an unblocked luminescent second. The electrode body (LED) was hardened under conditions of 150 ° C for 4 hours to prepare a light-emitting diode for evaluation.

將上述實施例及比較例中所製作之評價用發光二極體,於85℃/60%RH之高溫高濕下放置168小時之後,在260℃下通過IR回流3次,利用實體顯微鏡觀察出樹脂之剝離、破裂之不良發生。接著,實施-40℃/30分~120℃/30分之熱衝擊試驗,同樣地利用實體顯微鏡觀察出樹脂之剝離、破裂之不良發生。此外,藉由通電試驗來實施點燈試驗。結果如表1所示。The evaluation light-emitting diodes produced in the above examples and comparative examples were allowed to stand under high temperature and high humidity of 85 ° C / 60% RH for 168 hours, and then refluxed by IR at 260 ° C for 3 times, and observed by a stereoscopic microscope. Defects in peeling and cracking of the resin occur. Next, a thermal shock test at -40 ° C / 30 minutes to 120 ° C / 30 minutes was carried out, and the occurrence of defects such as peeling and cracking of the resin was observed in the same manner using a stereoscopic microscope. In addition, the lighting test was carried out by a power-on test. The results are shown in Table 1.

於實施例1~4,在吸濕回流試驗及熱衝擊試驗中完全無樹脂之剝離、破裂等之不良,LED之不點燈不良亦無發生。但是,於比較例1,在吸濕回流試驗中,發生了樹脂之破裂。於比較例2,樹脂之破裂、樹脂之剝離皆有發生,於比較例3,樹脂之破裂雖無發生,但有發生樹脂之剝離。其結果,一部分之LED發生不點燈不良。In Examples 1 to 4, in the moisture absorption reflow test and the thermal shock test, there was no defect such as peeling or cracking of the resin, and no LED failure occurred. However, in Comparative Example 1, cracking of the resin occurred in the moisture absorption reflow test. In Comparative Example 2, both the cracking of the resin and the peeling of the resin occurred. In Comparative Example 3, although cracking of the resin did not occur, peeling of the resin occurred. As a result, some of the LEDs are not defective in lighting.

1...光半導體元件1. . . Optical semiconductor component

2...導電性線2. . . Conductive wire

3...鍍銀引線框架3. . . Silver plated lead frame

4...光半導體元件封閉用樹脂4. . . Optical semiconductor component sealing resin

5...成型封裝基板5. . . Molded package substrate

6...二氧化矽填料6. . . Ceria filler

7...具有異向性之玻璃填料7. . . Anisotropic glass filler

[第1圖]係顯示習知型發光裝置之一實施形態的剖面圖。[Fig. 1] is a cross-sectional view showing an embodiment of a conventional light-emitting device.

[第2圖]係顯示本發明發光裝置之一實施形態的剖面圖。Fig. 2 is a cross-sectional view showing an embodiment of a light-emitting device of the present invention.

1...光半導體元件1. . . Optical semiconductor component

2...導電性線2. . . Conductive wire

3...鍍銀引線框架3. . . Silver plated lead frame

4...光半導體元件封閉用樹脂4. . . Optical semiconductor component sealing resin

5...成型封裝基板5. . . Molded package substrate

7...具有異向性之玻璃填料7. . . Anisotropic glass filler

Claims (7)

一種光半導體元件封閉用樹脂組成物,其特徵為含有;(A)具有含脂肪族不飽和鍵之一價烴基之有機聚矽氧烷、(B)於一分子中含有2個以上鍵結於矽原子的氫原子之有機氫聚矽氧烷、(C)鉑系觸媒、以及(D)具有長寬比為1.1~50之異向性形狀之玻璃填料,且光半導體元件封閉用樹脂組成物之硬化物之折射率為1.45以上。 A resin composition for encapsulating an optical semiconductor element, characterized by containing (A) an organopolyoxane having a monovalent hydrocarbon group containing an aliphatic unsaturated bond, and (B) having two or more bonds in one molecule An organic hydrogen polyoxyalkylene of a hydrogen atom of a halogen atom, (C) a platinum-based catalyst, and (D) a glass filler having an anisotropic shape having an aspect ratio of 1.1 to 50, and a resin for encapsulating the optical semiconductor element The cured product of the object has a refractive index of 1.45 or more. 如申請專利範圍第1項所記載之光半導體元件封閉用樹脂組成物,其中上述(A)成分為選自下述式之有機聚矽氧烷, (式中,k、m係滿足5≦k+m≦500之整數,0≦m/(k+m)≦0.5)。The resin composition for encapsulating an optical semiconductor element according to the first aspect of the invention, wherein the component (A) is an organopolysiloxane selected from the group consisting of (wherein k and m satisfy an integer of 5≦k+m≦500, 0≦m/(k+m)≦0.5). 如申請專利範圍第1項或第2項所記載之光半導體元件封閉用樹脂組成物,其中上述(D)具有異向性形狀之玻璃填料,係長寬比為1.1~50之鱗片狀玻璃或玻璃切割纖維。 The resin composition for encapsulating an optical semiconductor element according to the first or second aspect of the invention, wherein the (D) glass filler having an anisotropic shape is a scaly glass or glass having an aspect ratio of 1.1 to 50. Cutting the fiber. 如申請專利範圍第1項或第2項所記載之光半導體元件封閉用樹脂組成物,其係含有樹脂組成物整體之5~60質量%的上述(D)具有異向性形狀之玻璃填料。 The resin composition for encapsulating an optical semiconductor element according to the first or second aspect of the invention is the glass filler of the above (D) having an anisotropic shape in an amount of 5 to 60% by mass of the entire resin composition. 如申請專利範圍第1項或第2項所記載之光半導體元件封閉用樹脂組成物,其中上述(D)具有異向性形狀之玻璃填料的折射率為1.45~1.55,且上述光半導體元件封閉用樹脂組成物之硬化物的折射率為1.45~1.55。 The resin composition for encapsulating an optical semiconductor element according to the first aspect or the second aspect of the invention, wherein the (D) glass filler having an anisotropic shape has a refractive index of 1.45 to 1.55, and the optical semiconductor element is sealed. The cured product of the resin composition has a refractive index of 1.45 to 1.55. 一種發光裝置,其係藉由如申請專利範圍第1項至第5項中任一項所記載之光半導體元件封閉用樹脂組成物 之硬化物所封閉。 A light-emitting device, which is a resin composition for encapsulating an optical semiconductor element according to any one of the first to fifth aspects of the invention. The hardened material is closed. 一種發光二極體裝置,其係使用具有搭載發光元件的引線框架之預成型封裝,並將發光元件搭載於引線框架,藉由封閉樹脂組成物之硬化物所封閉而成,上述封閉樹脂組成物為如申請專利範圍第1項至第5項中任一項所記載之樹脂組成物。 A light-emitting diode device using a preform package having a lead frame on which a light-emitting element is mounted, and mounting the light-emitting element on a lead frame, which is closed by a cured product of a sealing resin composition, and the above-mentioned sealing resin composition The resin composition as described in any one of claims 1 to 5.
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