TWI477215B - Net detecting method - Google Patents

Net detecting method Download PDF

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TWI477215B
TWI477215B TW102143882A TW102143882A TWI477215B TW I477215 B TWI477215 B TW I477215B TW 102143882 A TW102143882 A TW 102143882A TW 102143882 A TW102143882 A TW 102143882A TW I477215 B TWI477215 B TW I477215B
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stitch
length
confirmed
recognized
stitches
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TW102143882A
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TW201521527A (en
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Yung Chien Cheng
Chiu Feng Tsai
Yi Hsin Hsieh
Yu Chuan Chang
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Inventec Corp
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線跡檢查方法Stitch inspection method

一種線跡檢查方法,特別有關於一種適於印刷電路板的線跡檢查方法。A stitch inspection method, particularly relating to a stitch inspection method suitable for a printed circuit board.

一般來說,在印刷電路板(Printed Circuit Board,PCB)之佈局圖(Layout)設計完成後,還需要進一步對佈局圖上的線路進行檢查,以確認這些線路是否都符合佈局所需的規範。以往,在對佈局圖上的線路檢查時,都需要以人工的方式一一進行,如此將會花費更多人力及時間。In general, after the layout of the Printed Circuit Board (PCB) is completed, it is necessary to further check the lines on the layout to confirm whether the lines meet the specifications required for the layout. In the past, when checking the lines on the floor plan, it was necessary to do it manually, which would cost more manpower and time.

有鑑於此,已有許多廠商提出印刷電路板佈局設計的軟體檢查功能,以改善上述以人工進行檢測的問題。但是,上述檢查功能多半針對檢查印刷電路板產生問題與訊號設計錯誤方面。然而,對於目前越來越細的線路佈局來說,有些線路之線長的計算是非常的麻煩,還是需要人工一小段一小段的加總,且人工逐一加總計算需要花費較長的時間,因而對於研發時間有限的研發人員而言,此工作費工費時,卻又占有相當作要的地位。因此,印刷電路板佈局的線路檢查仍有改善的空。In view of this, many manufacturers have proposed a software inspection function for printed circuit board layout design to improve the above-mentioned manual detection problem. However, most of the above inspection functions are directed to checking printed circuit boards for problems and signal design errors. However, for the current thinner circuit layout, the calculation of the line length of some lines is very troublesome, or it is necessary to manually add a short period of a small sum, and it takes a long time to manually add the total calculation one by one. Therefore, for R&D personnel with limited research and development time, this work has a relatively high cost. Therefore, the line inspection of the printed circuit board layout still has improved air.

本發明在於提供一種線跡檢查方法,藉以提高線跡檢查的速度以及精確性。The present invention is directed to a stitch inspection method for improving the speed and accuracy of stitch inspection.

本發明提供一種線跡檢查方法,適於一印刷電路板,此印刷電路板具有多條線跡,這些線跡耦接一電子元件。此線跡檢查方法包括下列步驟。取得待確認線跡,其中待確認線跡為線跡其中之一。以電子元件為一起點,沿待確認線跡至預設長度,以取得結束點,其中預設長度包 括規範長度以及延伸長度。由結束點向電子元件檢查待確認線跡,判斷待確認線跡的寬度是否變小。若判斷出待確認線跡的寬度變小,產生檢查點,檢查點對應待確認線跡的寬度變小的位置。計算檢查點與起點之間的長度,以取得檢查長度。判斷檢查長度是否大於規範長度。若判斷檢查長度大於規範長度,標示待確認線跡。記錄待確認線跡。The present invention provides a stitch inspection method suitable for a printed circuit board having a plurality of stitches coupled to an electronic component. This stitch check method includes the following steps. A stitch to be confirmed is obtained, wherein the stitch to be confirmed is one of the stitches. Pointing the electronic components together, along the stitch to be confirmed to the preset length, to obtain the end point, wherein the preset length package Includes gauge length and extension length. From the end point, the electronic component is checked for the stitch to be confirmed, and it is judged whether or not the width of the stitch to be confirmed becomes small. If it is judged that the width of the stitch to be confirmed becomes small, a checkpoint is generated, and the checkpoint corresponds to a position where the width of the stitch to be confirmed becomes smaller. Calculate the length between the checkpoint and the starting point to get the length of the exam. Determine if the inspection length is greater than the specification length. If it is judged that the inspection length is greater than the specification length, the stitch to be confirmed is indicated. Record the stitch to be confirmed.

在一實施例中,前述線跡檢查方法更包括下列步驟。若判斷檢查長度未大於規範長度,則待確認線跡合格,並記錄待確認線跡。In an embodiment, the aforementioned stitch inspection method further includes the following steps. If it is judged that the inspection length is not greater than the specification length, the stitch to be confirmed is qualified, and the stitch to be confirmed is recorded.

在一實施例中,前述線跡檢查方法更包括下列步驟。判斷待確認線跡之周圍是否有多餘空間。若判斷待確認線跡之周圍未有多餘空間,則不調整待確認線跡的寬度。若判斷待確認線跡之周圍有多餘空間,則調整待確認線跡的寬度。In an embodiment, the aforementioned stitch inspection method further includes the following steps. Determine if there is extra space around the stitch to be confirmed. If it is judged that there is no extra space around the to-be-recognized stitch, the width of the stitch to be confirmed is not adjusted. If it is judged that there is excess space around the to-be-confirmed stitch, adjust the width of the stitch to be confirmed.

在一實施例中,前述以電子元件為起點,沿待確認線跡至預設長度,以取得結束點,其中預設長度包括規範長度以及延伸長度的步驟包括下列步驟。以電子元件為起點,沿待確認線跡至預設長度。判斷待確認線跡的線長是否大於預設長度。若判斷待確認線跡的線長大於預設長度,則調整延伸長度,並回到電子元件為起點,沿待確認線跡至預設長度的步驟。若判斷待確認線跡的線長未大於預設長度,則取得結束點。In an embodiment, the foregoing takes the electronic component as a starting point and follows the stitch to be confirmed to a preset length to obtain an end point, wherein the step of including the normal length and the extended length of the preset length includes the following steps. Starting with the electronic component, follow the stitch to be confirmed to the preset length. It is determined whether the line length of the stitch to be confirmed is greater than a preset length. If it is determined that the line length of the stitch to be confirmed is greater than the preset length, the extension length is adjusted, and the electronic component is returned to the starting point, along the step of confirming the stitch to the preset length. If it is determined that the line length of the stitch to be confirmed is not greater than the preset length, the end point is obtained.

在一實施例中,前述取得待確認線跡的步驟包括下列步驟。接收關鍵字。依據關鍵字,找尋與關鍵字相關的線跡,以產生待確認線跡群組。由待確認線跡群組,取得待確認線跡。In an embodiment, the step of obtaining the stitch to be confirmed includes the following steps. Receive keywords. According to the keyword, find a stitch related to the keyword to generate a stitch group to be confirmed. The stitch to be confirmed is obtained from the stitch group to be confirmed.

在一實施例中,前述在記錄待確認線跡的步驟之後更包括下列步驟。判斷待確認線跡群組中的所有線跡是否已檢查完畢。若判斷待確認線跡群組中的所有線跡未檢查完畢,則回到取得待確認線跡的步驟。In an embodiment, the foregoing step further includes the following steps after the step of recording the stitch to be confirmed. Determine whether all the stitches in the stitch group to be confirmed have been checked. If it is determined that all the stitches in the to-be-recognized stitch group have not been checked, the step of obtaining the stitch to be confirmed is returned.

本發明所揭露之線跡檢查方法,藉由以電子元件為起點,沿待確認線跡至預設長度,以取得結束點,再由結束點向電子元件檢查待確認線跡,判斷待確認線跡是否產生阻抗變化,而據以產生檢查點。接著,計算檢查點與起點之間的長度,以取得檢查長度,並判斷檢查長度是否大 於規範長度,而據以決定此待確認線跡是否符合規範。如此一來,可有效提高線跡檢查的速度以及精確性。The stitch inspection method disclosed in the present invention takes the electronic component as a starting point, follows the stitch to be confirmed to a preset length to obtain an end point, and then checks the to-be-confirmed stitch from the end point to the electronic component to determine the line to be confirmed. Whether the trace produces an impedance change, and accordingly generates a checkpoint. Next, calculate the length between the checkpoint and the starting point to obtain the inspection length and determine whether the inspection length is large. According to the length of the specification, it is determined whether the stitch to be confirmed conforms to the specification. In this way, the speed and accuracy of the stitch inspection can be effectively improved.

有關本發明的特徵與實作,茲配合圖式作實施例詳細說明如下。The features and implementations of the present invention are described in detail below with reference to the drawings.

100‧‧‧印刷電路板100‧‧‧Printed circuit board

110‧‧‧電子元件110‧‧‧Electronic components

120、130‧‧‧線跡120, 130‧‧‧ stitches

121、122‧‧‧線段121, 122‧‧ ‧ line segments

L1‧‧‧預設長度L1‧‧‧Preset length

L2‧‧‧檢查長度L2‧‧‧Check length

P1‧‧‧起點Starting point of P1‧‧

P2‧‧‧結束點P2‧‧‧ end point

P3‧‧‧檢查點P3‧‧‧ checkpoint

第1圖為本發明之印刷電路板之佈局的部分示意圖。Figure 1 is a partial schematic view showing the layout of a printed circuit board of the present invention.

第2圖為本發明之線跡檢查方法的示意圖。Fig. 2 is a schematic view showing the stitch inspection method of the present invention.

第3圖為第2圖之步驟S202的詳細流程圖。Fig. 3 is a detailed flowchart of step S202 of Fig. 2.

第4圖為第2圖之步驟S204的詳細流程圖。Fig. 4 is a detailed flowchart of step S204 of Fig. 2.

第5圖為接續第2圖及第3圖之步驟S204之後的流程圖。Fig. 5 is a flow chart subsequent to step S204 of Fig. 2 and Fig. 3.

請參考「第1圖」所示,其為本發明之印刷電路板之佈局的部分示意圖。本實施例之印刷電路板100包括有電子元件110與線跡(Net)120、130。線跡120、130與電子元件110耦接。並且,線跡120包括線段121及122,其中線段121的寬度小於線段122的寬度。另外,線跡130之線段的寬度一致。Please refer to FIG. 1 for a partial schematic view of the layout of the printed circuit board of the present invention. The printed circuit board 100 of the present embodiment includes electronic components 110 and traces (Net) 120, 130. The stitches 120, 130 are coupled to the electronic component 110. Also, the stitch 120 includes line segments 121 and 122, wherein the width of the line segment 121 is smaller than the width of the line segment 122. In addition, the line segments of the stitch 130 have the same width.

為了方便說明,在「第1圖」中,僅於印刷電路板100上繪示出1個電子元件110與2條線跡120,但本發明不限於此,電子元件110及線跡120的數量可由使用者是需求自行增加,電子元件110的數量亦可為2個或2個以上,而線跡的數量亦可為3條或3條以上,且電子元件110與線跡120的數量可以相同或不同。另外,「第1圖」之線跡120、130的走線是以直線來繪示,僅為本發明的一種實施範例,並非用以限定本發明之線跡120、130之走線方式。For convenience of description, in the "first drawing", only one electronic component 110 and two stitches 120 are drawn on the printed circuit board 100, but the present invention is not limited thereto, and the number of the electronic components 110 and the stitches 120 is limited. The number of the electronic components 110 may be two or more, and the number of the stitches may be three or more, and the number of the electronic components 110 and the stitches 120 may be the same. Or different. In addition, the traces of the stitches 120 and 130 of the "Fig. 1" are shown by straight lines, and are merely an embodiment of the present invention, and are not intended to limit the manner in which the stitches 120, 130 of the present invention are routed.

上述簡略說明了印刷電路板100中所包括的構件及其對應關係,以下將搭配線跡檢查方法來做進一步的說明。The components and their corresponding relationships included in the printed circuit board 100 are briefly described above, and will be further described below in conjunction with the stitch inspection method.

請參考「第2圖」所示,其為本發明之線跡檢查方法的示 意圖。在步驟S202中,取得待確認線跡,其中待確認線跡為線跡120、130其中之一。例如透過使用者對此具有線跡檢查方式的裝置輸入想要檢查的線跡,使得此裝置取得對應的線跡來作為待確認線跡,以進行後續線跡檢查的流程。Please refer to "Fig. 2", which is an illustration of the stitch inspection method of the present invention. intention. In step S202, a stitch to be confirmed is obtained, wherein the stitch to be confirmed is one of the stitches 120, 130. For example, the user inputs the stitch to be inspected by the device having the stitch check mode, so that the device obtains the corresponding stitch as the stitch to be confirmed to perform the subsequent stitch check process.

在步驟S204中,以電子元件110為起點P1,沿待確認線跡至預設長度L1,以取得結束點P2,其中預設長度L1包括規範長度以及延伸長度。在本實施例中,前述規範長度為規格書中定義電子元件110所連接之線跡的長度,而延伸長度可由使用者視其需求自行調整。並且,假設規範長度例如為500,而延伸長度例如200,因此預設長度L1則為700。In step S204, the electronic component 110 is used as the starting point P1 along the to-be-confirmed stitch to the preset length L1 to obtain the end point P2, wherein the preset length L1 includes the gauge length and the extended length. In this embodiment, the length of the specification is the length of the stitches to which the electronic component 110 is connected in the specification, and the extension length can be adjusted by the user according to his needs. Also, it is assumed that the gauge length is, for example, 500, and the extension length is, for example, 200, so the preset length L1 is 700.

因此,在取得待確認線跡後,會由起點P1且例如利用計算待確認線跡定義的座標來取得待確認線跡走線的長度,並將所取得之待確認線跡走線的長度進行累加,直到累加的長到達到預設長度L1,以找到前述結束點P2。Therefore, after the stitch to be confirmed is obtained, the length of the trace to be confirmed is obtained from the starting point P1 and, for example, by using coordinates calculated by calculating the stitch to be confirmed, and the length of the obtained trace to be confirmed is performed. The accumulation is continued until the accumulated length reaches the preset length L1 to find the aforementioned end point P2.

在步驟S206,取得結束點P2後,會由結束點P2開始,沿著待確認線跡向電子元件110的方向前進,讀出待確認線跡的寬度,以判斷出待確認線跡的寬度是否變小。After the end point P2 is obtained in step S206, the end point P2 is started, and the line to be confirmed is advanced in the direction of the electronic component 110, and the width of the stitch to be confirmed is read to determine whether the width of the stitch to be confirmed is Become smaller.

若判斷出待確認線跡的寬度變小,進入步驟S208,產生檢查點P3,此檢查點P3對應待確認線跡的寬度變小的位置。在步驟S210中,計算檢查點P3與起點P1之間的長度,以取得檢查長度L2,以作為判斷此待確認線跡是否符合規範。If it is judged that the width of the stitch to be confirmed becomes small, the process proceeds to step S208, and a check point P3 is generated, which corresponds to a position at which the width of the stitch to be confirmed becomes smaller. In step S210, the length between the check point P3 and the start point P1 is calculated to obtain the check length L2 as a judgment as to whether or not the stitch to be confirmed conforms to the specification.

在步驟S212中,判斷檢查長度L2是否大於規範長度。假設檢查長度為520,因此則會判斷出檢查長度L2(520)大於規範長度(500)。也就是說,若判斷檢查長度L2大於規範長度,則進入步驟S214,標示此待確認線跡,並計算檢查長度L2與規範長度之間的差值。舉例來說,標示此待確認線跡例如可以高亮度(Highlight)的方式進行標示。並且,前述差值例如為將檢查長度L2減去規範長度,即520-500=20。在步驟S216中,記錄待確認線跡。如此一來,使用者便可得知此待確認線跡不符合規範,需 要對此待確認線跡進行後續的處理。In step S212, it is judged whether or not the inspection length L2 is larger than the specification length. Assuming that the inspection length is 520, it is judged that the inspection length L2 (520) is larger than the gauge length (500). That is, if it is judged that the inspection length L2 is larger than the specification length, the process proceeds to step S214, the stitch to be confirmed is marked, and the difference between the inspection length L2 and the gauge length is calculated. For example, marking the to-be-confirmed stitch can be marked, for example, in a high-light manner. Also, the aforementioned difference is, for example, the inspection length L2 minus the gauge length, that is, 520-500=20. In step S216, the stitch to be confirmed is recorded. In this way, the user can know that the stitch to be confirmed does not meet the specifications and needs to be The subsequent processing of the stitch to be confirmed is to be performed.

另一方面,假設檢查長度為480,因此會判斷出檢查長度L2(480)未大於規範長度(500)。也就是說,承接上述步驟S212,會判斷出待確認線跡未大於規範長度,則進入步驟S218,此待確認線跡合格,並進入步驟S216,記錄此待確認線跡。如此一來,使用者便可得知此待確認線跡已符合規範,可再對其他的線跡進行此線跡檢查的流程。On the other hand, assuming that the inspection length is 480, it is judged that the inspection length L2 (480) is not larger than the gauge length (500). That is to say, if the above-mentioned step S212 is satisfied, it is determined that the to-be-recognized stitch is not greater than the specification length, then the process proceeds to step S218, the line to be confirmed is qualified, and the process proceeds to step S216 to record the to-be-confirmed stitch. In this way, the user can know that the to-be-confirmed stitch has been in compliance with the specification, and the flow of the stitch check can be performed on other stitches.

進一步來說,在本實施例中,在步驟S218之後,還可包括步驟S222、S224、226。在步驟S222中,判斷待確認線跡之周圍是否有多餘空間。也就是說,當上述待確認線跡不符合規範時,可以座標來計算待確認線跡與相鄰之線跡之間的是否還有多餘空間。若判斷待確認線跡之周圍未有多餘空間,則進入步驟S224,不調整待確認線跡的寬度。而若判斷待確認線跡之周圍有多餘空間,則進入步驟S226,調整檢查點P3至起點P1之間之待確認線跡的寬度,例如可以將如「第1圖」之線段121的寬度調整至如「第1圖」之線段122的寬度。Further, in this embodiment, after step S218, steps S222, S224, and 226 may be further included. In step S222, it is determined whether there is excess space around the stitch to be confirmed. That is to say, when the above-mentioned to-be-confirmed stitches do not conform to the specification, the coordinates can be used to calculate whether there is extra space between the to-be-confirmed stitch and the adjacent stitch. If it is determined that there is no excess space around the to-be-recognized stitch, the process proceeds to step S224, and the width of the stitch to be confirmed is not adjusted. If it is determined that there is excess space around the to-be-recognized stitch, the process proceeds to step S226, and the width of the to-be-confirmed stitch between the check point P3 and the starting point P1 is adjusted. For example, the width of the line segment 121 as shown in FIG. 1 can be adjusted. The width of the line segment 122 as shown in "Fig. 1".

承接步驟S206,若判斷出待確認線跡的寬度未變小,則進入步驟S220,此待確認線跡合格,並進入步驟S216,記錄此待確認線跡。也就是說,此待確認線跡的線跡符合規範,並無需對此待確認線跡進行調整。In step S206, if it is determined that the width of the to-be-recognized stitch has not become small, the process proceeds to step S220, the line to be confirmed is qualified, and the process proceeds to step S216, and the stitch to be confirmed is recorded. That is to say, the stitch of the stitch to be confirmed conforms to the specification, and it is not necessary to adjust the stitch to be confirmed.

請參考「第3圖」所示,其為「第2圖」之步驟S202的詳細流程圖。在步驟S302中,接收關鍵字,例如透過使用者對此具有線跡檢查方式的裝置輸入想要檢查之線跡對應的關鍵字,以便進行搜尋的動作。Please refer to "Figure 3", which is a detailed flowchart of step S202 of "Fig. 2". In step S302, a keyword is received, for example, by the user inputting a keyword corresponding to the stitch to be inspected by the device having the stitch check mode, in order to perform the search operation.

接著,在步驟S304中,依據關鍵字,找尋與關鍵字相關的線跡,以產生一待確認線跡群組。也就是說,前述裝置例如依據前述關鍵字,將線跡之名稱與此關鍵字相關的所有線跡找尋出來,並以這些線跡建立出待確認線跡群組。之後,在步驟S306中,由待確認線跡群組,取得待確認線跡。在取得待確認線跡之後,則可繼續「第2圖」之步驟S204~226的相關流程,故在此不再贅述。Next, in step S304, the stitches related to the keywords are searched according to the keywords to generate a to-be-confirmed stitch group. That is to say, the foregoing device finds all the stitches associated with the name of the stitch, for example, according to the aforementioned keywords, and establishes a group of stitches to be confirmed with these stitches. Thereafter, in step S306, the stitch to be confirmed is obtained from the stitch group to be confirmed. After the stitch to be confirmed is obtained, the related processes of steps S204 to 226 of "Fig. 2" can be continued, and therefore will not be described herein.

請參考「第4圖」所示,其為「第2圖」之步驟S204的詳細流程圖。在步驟S402中,以電子元件110為起點P1,沿待確認線跡至預設長度L1。在步驟S404,判斷待確認線跡的線長是否大於預設長度L1。Please refer to FIG. 4, which is a detailed flowchart of step S204 of "FIG. 2". In step S402, the electronic component 110 is used as the starting point P1 along the stitch to be confirmed to the preset length L1. In step S404, it is determined whether the line length of the stitch to be confirmed is greater than the preset length L1.

假設待確認線跡的線長小於預設長度L1,則進入步驟S406,調整延伸長度。在本實施例中,調整延伸長度的方式例如將延伸長度減去一長度,此長度可由使用者視其需求設定。接著,調整延伸長度之後,到回到步驟S404,以持續判斷待確認線跡是否大於預設長度L1,直到待確認線跡大於或等於預設長度L1為止,以便進行後續的線跡檢查流程。Assuming that the line length of the stitch to be confirmed is smaller than the preset length L1, the process proceeds to step S406 to adjust the extension length. In the present embodiment, the manner of adjusting the extension length is, for example, subtracting the extension length by a length which can be set by the user according to his needs. Then, after the extension length is adjusted, the process returns to step S404 to continuously determine whether the to-be-recognized stitch is greater than the preset length L1 until the stitch to be confirmed is greater than or equal to the preset length L1, so as to perform a subsequent stitch inspection process.

另外,假設待確認線跡的線長大於預設長度L1,則進入步驟S408,取得結束點。Further, assuming that the line length of the stitch to be confirmed is larger than the preset length L1, the process proceeds to step S408, where the end point is obtained.

請參考「第5圖」所示,其為接續「第2圖」及「第3圖」之步驟S204之後的流程圖。在步驟S502,判斷待確認線跡群組中的所有線跡是否已檢查完畢。若判斷待確認線跡群組中的所有線跡未檢查完畢,則回到如第3圖所示之步驟S306(對應「第2圖」之步驟S202),由待確認線跡群組,以再次取得需要進行檢查的待確認線跡。另一方面,若判斷待確認線跡群組中的所有線跡已檢查完畢,則結束此線跡檢查流程。Please refer to the flowchart shown in step 5 after the step S204 of "Fig. 2" and "Fig. 3". In step S502, it is determined whether all the stitches in the stitch group to be confirmed have been checked. If it is determined that all the stitches in the to-be-recognized stitch group have not been checked, the process returns to step S306 (corresponding to step S202 of "FIG. 2") as shown in FIG. 3, and the stitch group to be confirmed is Re-obtain the stitch to be confirmed that needs to be checked again. On the other hand, if it is judged that all the stitches in the stitch group to be confirmed have been checked, the stitch check process is ended.

本發明之實施例所提出的線跡檢查方法,其藉由以電子元件為起點,沿待確認線跡至預設長度,以取得結束點,再由結束點向電子元件檢查待確認線跡,判斷待確認線跡的寬度是否變小,而據以產生檢查點。接著,計算檢查點與起點之間的長度,以取得檢查長度,並判斷檢查長度是否大於規範長度,而據以決定此待確認線跡是否符合規範。如此一來,可有效提高線跡檢查的速度以及精確性。The stitch inspection method of the embodiment of the present invention takes the electronic component as a starting point, along the line to be confirmed to a preset length, to obtain an end point, and then checks the to-be-confirmed stitch from the end point to the electronic component. It is judged whether or not the width of the stitch to be confirmed becomes small, and a checkpoint is generated accordingly. Next, the length between the checkpoint and the starting point is calculated to obtain the inspection length, and it is determined whether the inspection length is greater than the specification length, and it is determined whether the to-be-confirmed stitch conforms to the specification. In this way, the speed and accuracy of the stitch inspection can be effectively improved.

雖然本發明以前述之實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。While the present invention has been described above in the foregoing embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of patent protection shall be subject to the definition of the scope of the patent application attached to this specification.

Claims (6)

一種線跡檢查方法,適於一印刷電路板,該印刷電路板具有多條線跡,該些線跡耦接一電子元件,該線跡檢查方法包括:取得一待確認線跡,其中該待確認線跡為該些線跡其中之一;以該電子元件為一起點,沿該待確認線跡至一預設長度,以取得一結束點,其中該預設長度包括一規範長度以及一延伸長度;由該結束點向該電子元件檢查該待確認線跡,判斷該待確認線跡的寬度是否變小;若判斷出該待確認線跡的寬度變小,產生一檢查點,該檢查點對應該待確認線跡的寬度變小的位置;計算該檢查點與該起點之間的長度,以取得一檢查長度;判斷該檢查長度是否大於該規範長度;若判斷該檢查長度大於該規範長度,標示該待確認線跡;以及記錄該待確認線跡。A stitch inspection method is suitable for a printed circuit board having a plurality of stitches, the stitches being coupled to an electronic component, the stitch inspection method comprising: obtaining a to-be-confirmed stitch, wherein the Confirming that the stitch is one of the stitches; taking the electronic component as a point together, along the stitch to be confirmed to a predetermined length, to obtain an end point, wherein the preset length includes a gauge length and an extension Length; checking the to-be-confirmed stitch from the end point to determine whether the width of the to-be-recognized stitch becomes small; if it is determined that the width of the to-be-recognized stitch becomes small, a check point is generated, the check point a position corresponding to the width of the stitch to be confirmed; calculating a length between the check point and the start point to obtain an inspection length; determining whether the inspection length is greater than the specification length; and determining that the inspection length is greater than the specification length , indicating the stitch to be confirmed; and recording the stitch to be confirmed. 如請求項1所述之線跡檢查方法,更包括:若判斷該檢查長度未大於該規範長度,則該待確認線跡合格,並記錄該待確認線跡。The stitch inspection method of claim 1, further comprising: if it is determined that the inspection length is not greater than the specification length, the to-be-recognized stitch is qualified, and the to-be-confirmed stitch is recorded. 如請求項2所述之線跡檢查方法,更包括:判斷該待確認線跡之周圍是否有一多餘空間;若判斷該待確認線跡之周圍未有該多餘空間,則不調整該待確認線跡的寬度;以及若判斷該待確認線跡之周圍有該多餘空間,則調整該待確認線跡的寬度。The stitch inspection method of claim 2, further comprising: determining whether there is excess space around the to-be-recognized stitch; if it is determined that the unnecessary space is not around the to-be-recognized stitch, the line to be confirmed is not adjusted. The width of the trace; and if it is determined that there is excess space around the trace to be confirmed, the width of the trace to be confirmed is adjusted. 如請求項1所述之線跡檢查方法,其中以該電子元件為該起點,沿該待確認線跡至該預設長度,以取得該結束點,其中該預設長度包括該規範長度以及該延伸長度的步驟包括: 以該電子元件為該起點,沿該待確認線跡至該預設長度;判斷待確認線跡的線長是否大於該預設長度;若判斷待確認線跡的線長大於該預設長度,則調整該延伸長度,並回到該電子元件為該起點,沿該待確認線跡至該預設長度的步驟;以及若判斷待確認線跡的線長未大於該預設長度,則取得該結束點。The stitch inspection method of claim 1, wherein the electronic component is the starting point along the to-be-recognized stitch to the preset length to obtain the end point, wherein the preset length includes the specification length and the The steps of extending the length include: Taking the electronic component as the starting point, along the to-be-recognized stitch to the preset length; determining whether the line length of the to-be-recognized stitch is greater than the preset length; if determining that the line length of the to-be-recognized stitch is greater than the preset length, Adjusting the extension length, and returning to the electronic component as the starting point, along the step of confirming the stitch to the preset length; and if it is determined that the line length of the to-be-recognized stitch is not greater than the preset length, obtaining the End point. 如請求項1所述之線跡檢查方法,其中取得該待確認線跡的步驟包括:接收一關鍵字;依據該關鍵字,找尋與該關鍵字相關的該些線跡,以產生一待確認線跡群組;由該待確認線跡群組,取得該待確認線跡。The stitch inspection method of claim 1, wherein the step of obtaining the to-be-recognized stitch comprises: receiving a keyword; searching for the stitches associated with the keyword according to the keyword to generate a to-be-confirmed a stitch group; the stitch to be confirmed is obtained from the stitch group to be confirmed. 如請求項5所述之線跡檢查方法,其中在記錄該待確認線跡的步驟之後更包括:判斷該待確認線跡群組中的所有該些線跡是否已檢查完畢;以及若判斷待確認線跡群組中的所有該些線跡未檢查完畢,則回到取得該待確認線跡的步驟。The stitch inspection method of claim 5, wherein after the step of recording the to-be-recognized stitch, the method further comprises: determining whether all of the stitches in the to-be-recognized stitch group have been checked; After confirming that all of the stitches in the stitch group have not been checked, the step of obtaining the stitch to be confirmed is returned.
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Publication number Priority date Publication date Assignee Title
TW200539763A (en) * 2004-05-28 2005-12-01 Hon Hai Prec Ind Co Ltd Method and system for net-width checking in a layout
TW200538919A (en) * 2004-05-21 2005-12-01 Hon Hai Prec Ind Co Ltd System and method for checking split plane of motherboard layout

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200538919A (en) * 2004-05-21 2005-12-01 Hon Hai Prec Ind Co Ltd System and method for checking split plane of motherboard layout
TW200539763A (en) * 2004-05-28 2005-12-01 Hon Hai Prec Ind Co Ltd Method and system for net-width checking in a layout

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