CN110398681B - Double-strip-line inspection method and related device - Google Patents
Double-strip-line inspection method and related device Download PDFInfo
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- 238000004364 calculation method Methods 0.000 claims description 19
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/304—Contactless testing of printed or hybrid circuits
Abstract
The application discloses a double-strip line inspection method, which comprises the following steps: acquiring a signal line to be inspected; screening out double-strip lines in the signal line to be inspected, and calculating the overlapping length of the double-strip lines; calculating the maximum overlapping length according to the running speed of the signal line to be detected; judging whether the coincidence length is smaller than the maximum coincidence length; if so, generating a check passing message. The double-strip line is inspected by screening out the double-strip line part of the signal line to be inspected, calculating the overlapping length of the overlapping part, calculating the maximum overlapping length according to the running speed, and finally judging, so that the double-strip line is inspected, and the inspection efficiency is improved. The application also discloses a double-strip-line inspection device, computer equipment and a computer-readable storage medium, which have the beneficial effects.
Description
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a dual strip line inspection method, a dual strip line inspection apparatus, a computer device, and a computer-readable storage medium.
Background
At present, as the integration of electronic information systems is higher, in order to provide more traces in a PCB (Printed Circuit Board), and simultaneously keep the thickness of the PCB fixed, a stacked structure of double-strip lines is introduced, so as to increase the number of traces in the PCB. However, as the signal rate is higher and higher, the requirement for crosstalk between two layers of wires is more and more strict, so that in order to avoid the serious crosstalk between two layers of signal wires in the dual-band wire, certain wiring requirements are imposed on the wiring, such as cross wiring, parallel wiring, a certain distance is required, or the length of the overlapped wiring is in a certain range, and other different wiring rules. Regardless of the wiring rule, the double strip lines are strictly checked after the wiring is completed.
In the prior art, a manual method is generally adopted to inspect double strip lines in a PCB. However, the dual strip line structure in the PCB is dense, and meanwhile, the routing in the PCB is more and more dense along with the development of the technology. The manual inspection is adopted, so that a large amount of time cost and labor cost are wasted, and missing inspection and subjective errors caused by manual inspection cannot be avoided. The efficiency of the process is reduced and the precision and accuracy of the inspection cannot be maintained.
Therefore, how to improve the efficiency of the double strip line inspection, and to maintain the accuracy and precision of the inspection is a major concern to those skilled in the art.
Disclosure of Invention
The application aims to provide a double-strip line inspection method, a double-strip line inspection device, computer equipment and a computer readable storage medium.
In order to solve the above technical problem, the present application provides a double strip line inspection method, including:
acquiring a signal line to be inspected;
screening out double-strip lines in the signal line to be inspected, and calculating the overlapping length of the double-strip lines;
calculating the maximum overlapping length according to the running speed of the signal line to be detected;
judging whether the coincidence length is smaller than the maximum coincidence length;
if so, generating a check passing message.
Optionally, screen out double-strip line in the signal line of examining includes:
judging whether the layer surface of the signal line to be detected is a double-belt-line layer;
when the layer of the signal line to be checked is a double-strip-line layer, judging whether a corresponding signal line exists in the other layer of the double-strip-line layer;
and when a corresponding signal line exists in the other layer of the double-strip line layer, taking the corresponding signal line and the signal line to be detected as the double-strip line.
Optionally, calculating the overlapping length of the double strip lines includes:
and determining corresponding calculation operation according to the type of the double-strip line, and executing the calculation operation to obtain the overlapping length.
Optionally, determining a corresponding calculation operation according to the type of the dual-strip line, and executing the calculation operation to obtain the overlapping length includes:
and when the type of the double-strip line is a straight line, calculating according to the initial coordinate of the double-strip line to obtain the overlapping length.
Optionally, determining a corresponding calculation operation according to the type of the dual-strip line, and executing the calculation operation to obtain the overlapping length includes:
and when the type of the double-strip line is an arc line, calculating according to the angle and the radius of the double-strip line to obtain the overlapping length.
The present application further provides a double strip line inspection device, including:
the target signal line acquisition module is used for acquiring a signal line to be inspected;
the double-strip line screening module is used for screening out double-strip lines in the signal lines to be inspected;
the overlapping length calculation module is used for calculating the overlapping length of the double-strip line;
the maximum length calculation module is used for calculating the maximum overlapping length according to the running speed of the signal line to be detected;
the length judging module is used for judging whether the coincidence length is smaller than the maximum coincidence length;
and the check passing module is used for generating a check passing message when the coincidence length is smaller than the maximum coincidence length.
Optionally, the dual strip line screening module includes:
a double-strip-line layer judgment unit for judging whether the layer of the signal line to be inspected is a double-strip-line layer;
a layer-to-layer signal line judging unit, configured to judge whether a corresponding signal line exists in another layer of the double-strip-line layer when the layer of the signal line to be inspected is the double-strip-line layer;
and the double-strip-line acquisition unit is used for taking the corresponding signal line and the signal line to be inspected as the double-strip line when the corresponding signal line exists in the other layer of the double-strip-line layer.
Optionally, the overlapping length calculating module is specifically configured to determine a corresponding calculating operation according to the type of the dual-band line, and execute the calculating operation to obtain the overlapping length.
The present application further provides a computer device, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the dual strip line inspection method as described above when executing the computer program.
The present application also provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the dual strip line inspection method as described above.
The application provides a double-strip-line inspection method, which comprises the following steps: acquiring a signal line to be inspected; screening out double-strip lines in the signal line to be inspected, and calculating the overlapping length of the double-strip lines; calculating the maximum overlapping length according to the running speed of the signal line to be detected; judging whether the coincidence length is smaller than the maximum coincidence length; if so, generating a check passing message.
The double-strip line is screened out from the obtained signal line to be inspected, the overlapping length of the double-strip line is calculated, the overlapping length of the signal line is not obtained manually, the efficiency and the precision of obtaining the overlapping length of the double-strip line are improved, the allowable maximum overlapping length is further calculated according to the running speed of the signal line to be inspected, and finally the judgment is carried out according to the overlapping length and the maximum overlapping length, so that the double-strip line is inspected, the inspection efficiency and the inspection precision are improved, and the inspection accuracy is maintained.
The application also provides a double-strip line inspection device, a computer device and a computer readable storage medium, which have the above beneficial effects and are not described herein again.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a flowchart of a dual strip line inspection method according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a dual strip line inspection apparatus according to an embodiment of the present disclosure.
Detailed Description
The core of the application is to provide a double-strip line inspection method, a double-strip line inspection device, computer equipment and a computer readable storage medium, wherein the double-strip line inspection method, the double-strip line inspection device, the computer equipment and the computer readable storage medium are used for screening out the part of the double-strip line of a signal line to be inspected, calculating the overlapping length of the overlapping part, calculating the maximum overlapping length according to the running speed, and finally judging to realize the inspection of the double-strip line and improve the inspection efficiency.
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the prior art, a manual method is generally adopted to inspect double strip lines in a PCB. However, the dual strip line structure in the PCB is dense, and meanwhile, the routing in the PCB is more and more dense along with the development of the technology. The manual inspection is adopted, so that a large amount of time cost and labor cost are wasted, and missing inspection and subjective errors caused by manual inspection cannot be avoided. The efficiency of the process is reduced and the precision and accuracy of the inspection cannot be maintained.
Therefore, the double-strip line inspection method provided by the application has the advantages that the double-strip lines are screened out from the acquired signal lines to be inspected, the overlapping length of the double-strip lines is calculated, the overlapping length of the signal lines is acquired in an artificial mode instead of the overlapping length of the signal lines, the efficiency and the accuracy of acquiring the overlapping length of the double-strip lines are improved, the allowable maximum overlapping length is further calculated according to the running speed of the signal lines to be inspected, the judgment is finally carried out according to the overlapping length and the maximum overlapping length, the double-strip lines are inspected, the inspection efficiency and the inspection accuracy are improved, and the inspection accuracy is maintained.
Referring to fig. 1, fig. 1 is a flowchart illustrating a dual strip line inspection method according to an embodiment of the present disclosure.
In this embodiment, the method may include:
s101, acquiring a signal line to be inspected;
the method aims to acquire the signal line to be inspected which needs to be subjected to double-strip line inspection. In the prior art, the PCB is generally inspected manually, so that a technician is required to manually observe a signal line to be inspected from an actual diagram by naked eyes, and then perform subsequent inspection operation on the signal line to be inspected. However, the way of selection by the naked eye is prone to overlooking and subjective mistakes. Therefore, in this embodiment, the data of the signal line to be inspected is directly sent to the computer, that is, the signal line to be inspected is obtained, and the problem caused by manpower is avoided.
S102, screening out double-strip lines in the signal line to be inspected, and calculating the overlapping length of the double-strip lines;
on the basis of S101, the method aims to screen double-strip lines from the signal lines to be inspected and then calculate the overlapping length of the double-strip lines.
Generally, a dual strip line is located in a dual strip line layer in a PCB board, and the dual strip line has a trace of the other side corresponding thereto. Therefore, each section of the wire of the signal wire to be checked can be judged so as to determine whether the wire is a double-strip wire. The double-strip line is not searched from the signal line to be checked in a manual mode, so that the double-strip line is automatically screened, the efficiency of screening the double-strip line is improved, and careless omission and subjective errors caused by manual screening are avoided.
Optionally, screening out the double-strip line in the signal line to be inspected in this step may include:
judging whether the layer surface of a signal line to be inspected is a double-belt line layer;
step two, when the layer surface of the signal line to be inspected is a double-strip-line layer, judging whether a corresponding signal line exists in the other layer of the double-strip-line layer;
and step three, when the other layer of the double-strip line layer has a corresponding signal line, taking the corresponding signal line and the signal line to be detected as the double-strip line.
Therefore, in the alternative, a specific description is mainly given to how to screen out the double-strip lines. Specifically, whether the layer of the signal line is a double-strip line layer is judged firstly, if so, whether a corresponding signal line exists is judged, and if so, the signal line is a double-strip line. Further inspection of the overlapping portion of the signal line is required in order to determine whether the standard of the double-strip line is satisfied.
Optionally, the calculating the overlapping length of the double-strip line in this step may include:
and determining corresponding calculation operation according to the type of the double-strip line, and executing the calculation operation to obtain the overlapping length.
Therefore, the alternative scheme is mainly to calculate the length of the overlapped part of the double-strip lines so as to judge whether the length meets the standard or not.
Specifically, the method may further include: and when the type of the double-strip line is a straight line, calculating according to the initial coordinates of the double-strip line to obtain the overlapping length. The method can also comprise the following steps: and when the type of the double-strip line is an arc line, calculating according to the angle and the radius of the double-strip line to obtain the coincidence length.
Therefore, when the double-strip lines are judged to be the different types of routing lines respectively, different length calculation modes are executed so as to deal with the complex routing environment, the inspection precision and accuracy are improved, and the efficient inspection process is realized.
S103, calculating the maximum overlapping length according to the running speed of the signal line to be detected;
on the basis of S102, this step is intended to calculate the maximum length of coincidence corresponding to the running speed of the signal line to be inspected.
Since the interference is related to the operation rate, the maximum coincidence length can be obtained by calculating the operation rate. For example, the maximum overlap length is equal to 400/user input signal run rate, i.e., the run rate of the signal line.
In addition, in this embodiment, the maximum overlapping length may also be determined by a value input by a user, or may also be determined by an empirical value.
S104, judging whether the coincidence length is smaller than the maximum coincidence length;
on the basis of S103, this step is intended to determine whether the overlapping length meets the requirement, that is, whether the overlapping length is smaller than the maximum overlapping length.
And S105, if yes, generating a check passing message.
On the basis of S104, this step indicates that the signal line to be inspected passes through, and generates a corresponding check-through message.
It should be noted that the implementation steps of the dual strip line inspection method shown in fig. 1 are only one implementation form provided by the embodiments of the present application, and are not exclusive. Therefore, the execution sequence of each step can be set according to actual requirements, which is not limited in the present application.
In summary, in the embodiment, the double-strip lines are screened out from the obtained signal lines to be inspected, the overlapping length of the double-strip lines is calculated, instead of manually obtaining the overlapping length of the signal lines, the efficiency and the precision for obtaining the overlapping length of the double-strip lines are improved, the allowable maximum overlapping length is further calculated according to the running speed of the signal lines to be inspected, and finally, the judgment is performed according to the overlapping length and the maximum overlapping length, so that the double-strip lines are inspected, the efficiency and the precision of the inspection are improved, and the accuracy of the inspection is maintained.
The dual strip line inspection method provided herein is further illustrated by a specific example.
In this embodiment, the method is mainly implemented by a plurality of units, including:
and the selection signal line unit is used for acquiring a signal line to be inspected. The user clicks a signal line selection button, a data line to be checked is input according to the checking requirement of the user, keywords can be input for rapid filtering, and the filtered signal line is selected for subsequent checking. The complete signal line name can also be entered for subsequent checking.
And the user sets a rule unit for acquiring the check rule. The user enters the signal line operating rate, e.g., PCIe Gen3 is entered at 8.
And the checking unit is used for checking the signal line to be checked according to the checking rule.
Firstly, extracting the lamination information of the PCB to obtain the name of each signal layer, and whether a reference layer exists between the signal layers, if not, the two signal layers are double-strip lines and are recorded in a database for later use. Then according to the selected signal line, the program extracts the ID information of the signal line, further inquires the routing information of each small section of the signal line, and goes through all the small sections of information. Including the ID, starting coordinates, line width, level, etc. of this small piece of trace. Then, judging whether the small section of routing is routed on a double-tape layer or not;
if not, continuing to check the next small section of routing;
if yes, searching whether the other layer of the double-tape-wire layer has the wire or not by using the space occupied by the small section of the wire;
if not, continuing to check the next small section of routing;
if so, the wire length of the trace is calculated, as well as the wire length of the trace on the other layer of the dual tape layer. If the routing is straight routing, calculating the length of the routing according to the initial coordinate; if the trace is a radian trace, then the radius is used.
And finally, according to the length of the shorter wire in the two sections as the overlapping length of the small section of wire, comparing the length with the rule: 400/the signal input by the user runs at a speed (mil), for example 400/4-100 mil, if the wire length value is less than or equal to the regular value, the wiring meets the requirement, and the wiring is recorded in the database; if the wire length is larger than the rule value, the wiring does not meet the requirement and is recorded in the database. Until all small segments of all signal lines input by the user are checked.
And the result display unit is used for displaying the inspection result. After inspection, all trace information can be displayed in the result unit.
And the inspection report generating unit is used for generating an inspection report. After the examination, the examination result can be stored in the text document, so that the subsequent reference is facilitated.
According to the embodiment, the double-strip line is screened out from the acquired signal line to be inspected, the overlapping length of the double-strip line is calculated, the overlapping length of the signal line is not acquired manually, the efficiency and the accuracy for acquiring the overlapping length of the double-strip line are improved, the allowable maximum overlapping length is further calculated according to the running speed of the signal line to be inspected, and finally, the judgment is carried out according to the overlapping length and the maximum overlapping length, so that the double-strip line is inspected, the inspection efficiency and the inspection accuracy are improved, and the inspection accuracy is maintained.
In the following, a dual strip line inspection apparatus provided in an embodiment of the present application is described, and a dual strip line inspection apparatus described below and a dual strip line inspection method described above may be referred to in correspondence.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a dual strip line inspection apparatus according to an embodiment of the present disclosure.
In this embodiment, the apparatus may include:
a target signal line acquisition module 100, configured to acquire a signal line to be inspected;
a double-strip line screening module 200 for screening out double-strip lines in the signal lines to be inspected;
a coincidence length calculating module 300 for calculating the coincidence length of the double-strip line;
a maximum length calculating module 400, configured to calculate a maximum overlapping length according to the operation rate of the signal line to be inspected;
a length judgment module 500, configured to judge whether the coincidence length is smaller than the maximum coincidence length;
and a check passing module 600 configured to generate a check passing message when the coincidence length is smaller than the maximum coincidence length.
Optionally, the dual strip line screening module 200 may include:
a double-strip-line layer judgment unit for judging whether the layer of the signal line to be inspected is a double-strip-line layer;
the layer signal line judging unit is used for judging whether a corresponding signal line exists in the other layer of the double-strip-line layer when the layer of the signal line to be detected is the double-strip-line layer;
and a double-strip line acquisition unit for, when a corresponding signal line exists in the other layer of the double-strip line layer, taking the corresponding signal line and the signal line to be inspected as the double-strip lines.
Optionally, the overlapping length calculating module 300 is specifically configured to determine a corresponding calculating operation according to the type of the dual-band line, and execute the calculating operation to obtain the overlapping length.
An embodiment of the present application further provides a computer device, including:
a memory for storing a computer program;
a processor for implementing the steps of the dual strip line inspection method as described in the above embodiments when executing the computer program.
The present application further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the dual-strip line inspection method according to the above embodiments are implemented.
The computer-readable storage medium may include: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The dual strip line inspection method, the dual strip line inspection apparatus, the computer device, and the computer readable storage medium provided by the present application are described in detail above. The principles and embodiments of the present application are explained herein using specific examples, which are provided only to help understand the method and the core idea of the present application. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
Claims (10)
1. A dual strip line inspection method, comprising:
acquiring a signal line to be inspected;
screening out double-strip lines in the signal line to be inspected, and calculating the overlapping length of the double-strip lines;
calculating the maximum overlapping length according to the running speed of the signal line to be detected;
judging whether the coincidence length is smaller than the maximum coincidence length;
if so, generating a check passing message.
2. The double strip line inspection method according to claim 1, wherein screening out the double strip lines in the signal lines to be inspected includes:
judging whether the layer surface of the signal line to be detected is a double-belt-line layer;
when the layer of the signal line to be checked is a double-strip-line layer, judging whether a corresponding signal line exists on the other side of the double-strip-line layer;
and when a corresponding signal line exists on the other side of the double-strip line layer, taking the corresponding signal line and the signal line to be detected as the double-strip line.
3. The double-strip-line inspection method according to claim 1, wherein calculating the overlapping length of the double-strip line includes:
and determining corresponding calculation operation according to the type of the double-strip line, and executing the calculation operation to obtain the overlapping length.
4. The double strip line inspection method according to claim 3, wherein a corresponding calculation operation is determined according to the type of the double strip line, and the performing of the calculation operation to obtain the overlapping length comprises:
and when the type of the double-strip line is a straight line, calculating according to the initial coordinate of the double-strip line to obtain the overlapping length.
5. The double strip line inspection method according to claim 3, wherein a corresponding calculation operation is determined according to the type of the double strip line, and the performing of the calculation operation to obtain the overlapping length comprises:
and when the type of the double-strip line is an arc line, calculating according to the angle and the radius of the double-strip line to obtain the overlapping length.
6. A dual strip line inspection device, comprising:
the target signal line acquisition module is used for acquiring a signal line to be inspected;
the double-strip line screening module is used for screening out double-strip lines in the signal lines to be inspected;
the overlapping length calculation module is used for calculating the overlapping length of the double-strip line;
the maximum length calculation module is used for calculating the maximum overlapping length according to the running speed of the signal line to be detected;
the length judging module is used for judging whether the coincidence length is smaller than the maximum coincidence length;
and the check passing module is used for generating a check passing message when the coincidence length is smaller than the maximum coincidence length.
7. The dual strip line inspection apparatus of claim 6, wherein the dual strip line screening module comprises:
a double-strip-line layer judgment unit for judging whether the layer of the signal line to be inspected is a double-strip-line layer;
a layer-matching signal line judging unit, configured to judge whether a corresponding signal line exists on the other side of the double-strip line layer when the layer of the signal line to be inspected is a double-strip line layer;
and the double-strip-line obtaining unit is used for taking the corresponding signal line and the signal line to be inspected as the double-strip line when the corresponding signal line exists on the other side of the double-strip-line layer.
8. The dual strip line inspection apparatus according to claim 6, wherein the overlapping length calculating module is specifically configured to determine a corresponding calculating operation according to the type of the dual strip line, and execute the calculating operation to obtain the overlapping length.
9. A computer device, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the dual strip line inspection method according to any one of claims 1 to 5 when executing the computer program.
10. A computer-readable storage medium, characterized in that a computer program is stored thereon, which computer program, when being executed by a processor, carries out the steps of the dual strip line inspection method according to any one of claims 1 to 5.
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| CN105205260A (en) * | 2015-09-24 | 2015-12-30 | 浪潮电子信息产业股份有限公司 | Low cost and anti-interference dual mode laminated design method |
| CN107809838A (en) * | 2017-09-29 | 2018-03-16 | 曙光信息产业(北京)有限公司 | Mainboard and server |
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2019
- 2019-07-26 CN CN201910684151.6A patent/CN110398681B/en active Active
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