TWI472758B - 產生中紅外線雷射以用於超音波檢測之方法及裝置 - Google Patents
產生中紅外線雷射以用於超音波檢測之方法及裝置 Download PDFInfo
- Publication number
- TWI472758B TWI472758B TW98116319A TW98116319A TWI472758B TW I472758 B TWI472758 B TW I472758B TW 98116319 A TW98116319 A TW 98116319A TW 98116319 A TW98116319 A TW 98116319A TW I472758 B TWI472758 B TW I472758B
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- Prior art keywords
- wave
- optical
- wavelength
- laser
- converter
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 24
- 238000007689 inspection Methods 0.000 title description 2
- 238000002604 ultrasonography Methods 0.000 title description 2
- 230000003287 optical effect Effects 0.000 claims description 88
- 238000012360 testing method Methods 0.000 claims description 32
- 238000001514 detection method Methods 0.000 claims description 30
- 239000013078 crystal Substances 0.000 claims description 28
- 239000002131 composite material Substances 0.000 claims description 16
- 238000006073 displacement reaction Methods 0.000 claims description 12
- 230000005855 radiation Effects 0.000 claims description 4
- 239000000835 fiber Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 230000032798 delamination Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
- G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
- G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8472—Investigation of composite materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Acoustics & Sound (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/120,823 US7821646B2 (en) | 2008-05-15 | 2008-05-15 | Method and apparatus for generating mid-IR laser beam for ultrasound inspection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200951433A TW200951433A (en) | 2009-12-16 |
| TWI472758B true TWI472758B (zh) | 2015-02-11 |
Family
ID=40873363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98116319A TWI472758B (zh) | 2008-05-15 | 2009-05-15 | 產生中紅外線雷射以用於超音波檢測之方法及裝置 |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US7821646B2 (enExample) |
| EP (1) | EP2283340A1 (enExample) |
| JP (1) | JP5520933B2 (enExample) |
| KR (2) | KR101662334B1 (enExample) |
| CN (2) | CN106226401A (enExample) |
| BR (1) | BRPI0912675A2 (enExample) |
| CA (1) | CA2724314C (enExample) |
| IL (1) | IL209291A (enExample) |
| SG (1) | SG10201609520XA (enExample) |
| TW (1) | TWI472758B (enExample) |
| WO (1) | WO2009140458A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009043700B4 (de) * | 2009-10-01 | 2013-11-07 | Eads Deutschland Gmbh | Laser-Ultraschall-Messvorrichtung |
| US10839509B2 (en) | 2015-07-10 | 2020-11-17 | 3Scan Inc. | Spatial multiplexing of histological stains |
| JP6739836B2 (ja) * | 2016-06-01 | 2020-08-12 | 国立研究開発法人物質・材料研究機構 | レーザおよびそれを用いたレーザ超音波探傷装置 |
| CN105938087B (zh) * | 2016-06-29 | 2018-10-30 | 华南理工大学 | 一种基于多轴飞行器的激光超声检测系统与方法 |
| JP2023115852A (ja) * | 2022-02-08 | 2023-08-21 | 本田技研工業株式会社 | 車両用前照灯装置 |
| JP2023115856A (ja) | 2022-02-08 | 2023-08-21 | 本田技研工業株式会社 | 車両用前照灯装置 |
| US12416728B2 (en) | 2022-05-17 | 2025-09-16 | Northrop Grumman Systems Corporation | Quantum lidar system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5400173A (en) * | 1994-01-14 | 1995-03-21 | Northrop Grumman Corporation | Tunable mid-infrared wavelength converter using cascaded parametric oscillators |
| US5768302A (en) * | 1996-02-01 | 1998-06-16 | Lightwave Electronics Corporation | Multi quasi phase matched interactions in a non-linear crystal and method using same |
| TW451055B (en) * | 1999-07-27 | 2001-08-21 | Lockheed Corp | System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength |
| US6411390B1 (en) * | 1998-10-05 | 2002-06-25 | Kla-Tencor Corporation | Interferometric system for measurement disturbance of a sample |
| JP2006114642A (ja) * | 2004-10-14 | 2006-04-27 | Tohoku Univ | 赤外コヒーレント光源 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0376802U (enExample) * | 1989-11-28 | 1991-08-01 | ||
| US5355247A (en) | 1993-03-30 | 1994-10-11 | The Board Of Trustees Of The Leland Stanford, Jr. University | Method using a monolithic crystalline material for producing radiation by quasi-phase-matching, diffusion bonded monolithic crystalline material for quasi-phase-matching, and method for fabricating same |
| JP3465478B2 (ja) * | 1996-04-30 | 2003-11-10 | 理化学研究所 | 光パラメトリック発振装置 |
| US5911389A (en) | 1996-12-20 | 1999-06-15 | Lockheed Martin Corp. | Wave based satellite constellation |
| US6050525A (en) | 1997-04-29 | 2000-04-18 | Lockheed Martin Corporation | Asymmetric open rosette constellations |
| US6094447A (en) | 1998-06-12 | 2000-07-25 | Lockheed Martin Corporation | System and method for reducing wavefront distortion in high-gain diode-pumped laser media |
| US6633384B1 (en) | 1998-06-30 | 2003-10-14 | Lockheed Martin Corporation | Method and apparatus for ultrasonic laser testing |
| US6122060A (en) | 1998-06-30 | 2000-09-19 | Lockheed Martin Corporation | Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| US6657733B1 (en) | 1998-06-30 | 2003-12-02 | Lockheed Martin Corporation | Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| US6016214A (en) | 1998-09-11 | 2000-01-18 | Northrop Grumman Corporation | Quadruple grating period PPLN optical parametric oscillator difference frequency generator with common doubly resonant cavity |
| US7286241B2 (en) | 1999-06-24 | 2007-10-23 | Lockheed Martin Corporation | System and method for high-speed laser detection of ultrasound |
| US6483859B1 (en) | 1999-06-24 | 2002-11-19 | Lockheed Martin Corporation | System and method for high-speed laser detection of ultrasound |
| US6176135B1 (en) | 1999-07-27 | 2001-01-23 | Marc Dubois | System and method for laser-ultrasonic frequency control using optimal wavelength tuning |
| CA2411632C (en) | 2000-07-14 | 2013-09-17 | Lockheed Martin Corporation | System and method for locating and positioning an ultrasonic signal generator for testing purposes |
| IL153807A0 (en) | 2000-07-14 | 2003-07-31 | Lockheed Corp | A system and method of determining porosity in composite materials using ultrasound |
| US6937774B1 (en) | 2000-10-24 | 2005-08-30 | Lockheed Martin Corporation | Apparatus and method for efficiently increasing the spatial resolution of images |
| US6571633B1 (en) | 2001-01-19 | 2003-06-03 | Lockheed Martin Corporation | Remote laser beam delivery system and method for use with a gantry positioning system for ultrasonic testing purposes |
| US6711954B2 (en) | 2001-01-19 | 2004-03-30 | Lockheed Martin Corporation | Method and apparatus for improving the dynamic range of laser detected ultrasound in attenuative materials |
| JP2002228639A (ja) * | 2001-01-30 | 2002-08-14 | Nippon Steel Corp | レーザー超音波検査装置及びレーザー超音波検査方法 |
| US6668654B2 (en) | 2001-08-15 | 2003-12-30 | Lockheed Martin Corporation | Method and apparatus for generating specific frequency response for ultrasound testing |
| US6606909B2 (en) | 2001-08-16 | 2003-08-19 | Lockheed Martin Corporation | Method and apparatus to conduct ultrasonic flaw detection for multi-layered structure |
| US6649900B2 (en) | 2001-09-07 | 2003-11-18 | Lockheed Martin Corporation | Photoreceiver assembly for high-powered lasers |
| US7117134B2 (en) | 2001-10-18 | 2006-10-03 | Lockheed Martin Corporation | Method to optimize generation of ultrasound using mathematical modeling for laser ultrasound inspection |
| JP4087098B2 (ja) * | 2001-11-14 | 2008-05-14 | 株式会社東芝 | 超音波検査装置 |
| US6856918B2 (en) | 2001-11-26 | 2005-02-15 | Lockheed Martin Corporation | Method to characterize material using mathematical propagation models and ultrasonic signal |
| US6732587B2 (en) | 2002-02-06 | 2004-05-11 | Lockheed Martin Corporation | System and method for classification of defects in a manufactured object |
| US7277178B2 (en) | 2003-09-22 | 2007-10-02 | Celight, Inc. | Coherent photothermal interferometric spectroscopy system and method for chemical sensing |
| US7184200B2 (en) | 2004-12-16 | 2007-02-27 | Lockheed Martin Corporation | Passive broadband infrared optical limiter device based on a micro-optomechanical cantilever array |
| US7369250B2 (en) | 2005-03-25 | 2008-05-06 | Lockheed Martin Corporation | System and method to inspect components having non-parallel surfaces |
| CN101089609A (zh) * | 2007-06-28 | 2007-12-19 | 中国科学院安徽光学精密机械研究所 | 多谱段连续调谐高分辨红外激光光谱测量系统和方法 |
-
2008
- 2008-05-15 US US12/120,823 patent/US7821646B2/en active Active
-
2009
- 2009-05-14 JP JP2011509684A patent/JP5520933B2/ja not_active Expired - Fee Related
- 2009-05-14 WO PCT/US2009/043893 patent/WO2009140458A1/en not_active Ceased
- 2009-05-14 SG SG10201609520XA patent/SG10201609520XA/en unknown
- 2009-05-14 BR BRPI0912675A patent/BRPI0912675A2/pt not_active IP Right Cessation
- 2009-05-14 EP EP09747541A patent/EP2283340A1/en not_active Withdrawn
- 2009-05-14 CN CN201610702139.XA patent/CN106226401A/zh active Pending
- 2009-05-14 CA CA2724314A patent/CA2724314C/en not_active Expired - Fee Related
- 2009-05-14 KR KR1020107028047A patent/KR101662334B1/ko not_active Expired - Fee Related
- 2009-05-14 KR KR1020167016289A patent/KR20160075852A/ko not_active Withdrawn
- 2009-05-14 CN CN2009801254642A patent/CN102089642A/zh active Pending
- 2009-05-15 TW TW98116319A patent/TWI472758B/zh not_active IP Right Cessation
-
2010
- 2010-11-14 IL IL209291A patent/IL209291A/en not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5400173A (en) * | 1994-01-14 | 1995-03-21 | Northrop Grumman Corporation | Tunable mid-infrared wavelength converter using cascaded parametric oscillators |
| US5768302A (en) * | 1996-02-01 | 1998-06-16 | Lightwave Electronics Corporation | Multi quasi phase matched interactions in a non-linear crystal and method using same |
| US6411390B1 (en) * | 1998-10-05 | 2002-06-25 | Kla-Tencor Corporation | Interferometric system for measurement disturbance of a sample |
| TW451055B (en) * | 1999-07-27 | 2001-08-21 | Lockheed Corp | System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength |
| JP2006114642A (ja) * | 2004-10-14 | 2006-04-27 | Tohoku Univ | 赤外コヒーレント光源 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5520933B2 (ja) | 2014-06-11 |
| IL209291A0 (en) | 2011-01-31 |
| CA2724314A1 (en) | 2009-11-19 |
| KR101662334B1 (ko) | 2016-10-04 |
| KR20160075852A (ko) | 2016-06-29 |
| US20090284751A1 (en) | 2009-11-19 |
| CA2724314C (en) | 2013-11-26 |
| CN106226401A (zh) | 2016-12-14 |
| IL209291A (en) | 2013-03-24 |
| US7821646B2 (en) | 2010-10-26 |
| EP2283340A1 (en) | 2011-02-16 |
| TW200951433A (en) | 2009-12-16 |
| WO2009140458A1 (en) | 2009-11-19 |
| CN102089642A (zh) | 2011-06-08 |
| AU2009246358A1 (en) | 2009-11-19 |
| JP2011521230A (ja) | 2011-07-21 |
| SG10201609520XA (en) | 2016-12-29 |
| KR20110010111A (ko) | 2011-01-31 |
| BRPI0912675A2 (pt) | 2016-01-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |