BRPI0912675A2 - método e sistema de teste ultra-sônico a laser - Google Patents
método e sistema de teste ultra-sônico a laserInfo
- Publication number
- BRPI0912675A2 BRPI0912675A2 BRPI0912675A BRPI0912675A BRPI0912675A2 BR PI0912675 A2 BRPI0912675 A2 BR PI0912675A2 BR PI0912675 A BRPI0912675 A BR PI0912675A BR PI0912675 A BRPI0912675 A BR PI0912675A BR PI0912675 A2 BRPI0912675 A2 BR PI0912675A2
- Authority
- BR
- Brazil
- Prior art keywords
- testing method
- ultrasonic testing
- laser ultrasonic
- laser
- ultrasonic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
- G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
- G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8472—Investigation of composite materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/120,823 US7821646B2 (en) | 2008-05-15 | 2008-05-15 | Method and apparatus for generating mid-IR laser beam for ultrasound inspection |
PCT/US2009/043893 WO2009140458A1 (en) | 2008-05-15 | 2009-05-14 | Method and apparatus for generating mid-ir laser for ultrasound inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
BRPI0912675A2 true BRPI0912675A2 (pt) | 2016-01-26 |
Family
ID=40873363
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0912675A BRPI0912675A2 (pt) | 2008-05-15 | 2009-05-14 | método e sistema de teste ultra-sônico a laser |
Country Status (11)
Country | Link |
---|---|
US (1) | US7821646B2 (pt) |
EP (1) | EP2283340A1 (pt) |
JP (1) | JP5520933B2 (pt) |
KR (2) | KR101662334B1 (pt) |
CN (2) | CN106226401A (pt) |
BR (1) | BRPI0912675A2 (pt) |
CA (1) | CA2724314C (pt) |
IL (1) | IL209291A (pt) |
SG (1) | SG10201609520XA (pt) |
TW (1) | TWI472758B (pt) |
WO (1) | WO2009140458A1 (pt) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009043700B4 (de) * | 2009-10-01 | 2013-11-07 | Eads Deutschland Gmbh | Laser-Ultraschall-Messvorrichtung |
KR20170007181A (ko) | 2015-07-10 | 2017-01-18 | 3스캔 인크. | 조직학적 염색제의 공간 다중화 |
JP6739836B2 (ja) * | 2016-06-01 | 2020-08-12 | 国立研究開発法人物質・材料研究機構 | レーザおよびそれを用いたレーザ超音波探傷装置 |
CN105938087B (zh) * | 2016-06-29 | 2018-10-30 | 华南理工大学 | 一种基于多轴飞行器的激光超声检测系统与方法 |
JP2023115856A (ja) | 2022-02-08 | 2023-08-21 | 本田技研工業株式会社 | 車両用前照灯装置 |
JP2023115852A (ja) * | 2022-02-08 | 2023-08-21 | 本田技研工業株式会社 | 車両用前照灯装置 |
US20230375708A1 (en) * | 2022-05-17 | 2023-11-23 | Northrop Grumman Systems Corporation | Quantum lidar system |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0376802U (pt) * | 1989-11-28 | 1991-08-01 | ||
US5355247A (en) | 1993-03-30 | 1994-10-11 | The Board Of Trustees Of The Leland Stanford, Jr. University | Method using a monolithic crystalline material for producing radiation by quasi-phase-matching, diffusion bonded monolithic crystalline material for quasi-phase-matching, and method for fabricating same |
US5400173A (en) | 1994-01-14 | 1995-03-21 | Northrop Grumman Corporation | Tunable mid-infrared wavelength converter using cascaded parametric oscillators |
US5640405A (en) | 1996-02-01 | 1997-06-17 | Lighthouse Electronics Corporation | Multi quasi phase matched interactions in a non-linear crystal |
JP3465478B2 (ja) * | 1996-04-30 | 2003-11-10 | 理化学研究所 | 光パラメトリック発振装置 |
US5911389A (en) | 1996-12-20 | 1999-06-15 | Lockheed Martin Corp. | Wave based satellite constellation |
US6050525A (en) | 1997-04-29 | 2000-04-18 | Lockheed Martin Corporation | Asymmetric open rosette constellations |
US6094447A (en) | 1998-06-12 | 2000-07-25 | Lockheed Martin Corporation | System and method for reducing wavefront distortion in high-gain diode-pumped laser media |
US6633384B1 (en) | 1998-06-30 | 2003-10-14 | Lockheed Martin Corporation | Method and apparatus for ultrasonic laser testing |
US6657733B1 (en) | 1998-06-30 | 2003-12-02 | Lockheed Martin Corporation | Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
US6122060A (en) | 1998-06-30 | 2000-09-19 | Lockheed Martin Corporation | Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
US6016214A (en) | 1998-09-11 | 2000-01-18 | Northrop Grumman Corporation | Quadruple grating period PPLN optical parametric oscillator difference frequency generator with common doubly resonant cavity |
WO2000020841A1 (en) * | 1998-10-05 | 2000-04-13 | Kla-Tencor Corporation | Interferometric system for measurement disturbance of a sample |
US7286241B2 (en) | 1999-06-24 | 2007-10-23 | Lockheed Martin Corporation | System and method for high-speed laser detection of ultrasound |
US6483859B1 (en) | 1999-06-24 | 2002-11-19 | Lockheed Martin Corporation | System and method for high-speed laser detection of ultrasound |
US6176135B1 (en) | 1999-07-27 | 2001-01-23 | Marc Dubois | System and method for laser-ultrasonic frequency control using optimal wavelength tuning |
US6335943B1 (en) | 1999-07-27 | 2002-01-01 | Lockheed Martin Corporation | System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength |
CA2411628C (en) | 2000-07-14 | 2009-12-01 | Lockheed Martin Corporation | A system and method of determining porosity in composite materials using ultrasound |
JP4874499B2 (ja) | 2000-07-14 | 2012-02-15 | ロッキード マーティン コーポレイション | 試験目的の超音波信号発生装置を配置し位置決めするためのシステムおよび方法 |
US6937774B1 (en) | 2000-10-24 | 2005-08-30 | Lockheed Martin Corporation | Apparatus and method for efficiently increasing the spatial resolution of images |
US6711954B2 (en) | 2001-01-19 | 2004-03-30 | Lockheed Martin Corporation | Method and apparatus for improving the dynamic range of laser detected ultrasound in attenuative materials |
US6571633B1 (en) | 2001-01-19 | 2003-06-03 | Lockheed Martin Corporation | Remote laser beam delivery system and method for use with a gantry positioning system for ultrasonic testing purposes |
JP2002228639A (ja) * | 2001-01-30 | 2002-08-14 | Nippon Steel Corp | レーザー超音波検査装置及びレーザー超音波検査方法 |
US6668654B2 (en) | 2001-08-15 | 2003-12-30 | Lockheed Martin Corporation | Method and apparatus for generating specific frequency response for ultrasound testing |
US6606909B2 (en) | 2001-08-16 | 2003-08-19 | Lockheed Martin Corporation | Method and apparatus to conduct ultrasonic flaw detection for multi-layered structure |
US6649900B2 (en) | 2001-09-07 | 2003-11-18 | Lockheed Martin Corporation | Photoreceiver assembly for high-powered lasers |
US7117134B2 (en) | 2001-10-18 | 2006-10-03 | Lockheed Martin Corporation | Method to optimize generation of ultrasound using mathematical modeling for laser ultrasound inspection |
JP4087098B2 (ja) * | 2001-11-14 | 2008-05-14 | 株式会社東芝 | 超音波検査装置 |
US6856918B2 (en) | 2001-11-26 | 2005-02-15 | Lockheed Martin Corporation | Method to characterize material using mathematical propagation models and ultrasonic signal |
US6732587B2 (en) | 2002-02-06 | 2004-05-11 | Lockheed Martin Corporation | System and method for classification of defects in a manufactured object |
US7277178B2 (en) | 2003-09-22 | 2007-10-02 | Celight, Inc. | Coherent photothermal interferometric spectroscopy system and method for chemical sensing |
JP2006114642A (ja) * | 2004-10-14 | 2006-04-27 | Tohoku Univ | 赤外コヒーレント光源 |
US7184200B2 (en) | 2004-12-16 | 2007-02-27 | Lockheed Martin Corporation | Passive broadband infrared optical limiter device based on a micro-optomechanical cantilever array |
US7369250B2 (en) | 2005-03-25 | 2008-05-06 | Lockheed Martin Corporation | System and method to inspect components having non-parallel surfaces |
CN101089609A (zh) * | 2007-06-28 | 2007-12-19 | 中国科学院安徽光学精密机械研究所 | 多谱段连续调谐高分辨红外激光光谱测量系统和方法 |
-
2008
- 2008-05-15 US US12/120,823 patent/US7821646B2/en active Active
-
2009
- 2009-05-14 JP JP2011509684A patent/JP5520933B2/ja not_active Expired - Fee Related
- 2009-05-14 EP EP09747541A patent/EP2283340A1/en not_active Withdrawn
- 2009-05-14 WO PCT/US2009/043893 patent/WO2009140458A1/en active Application Filing
- 2009-05-14 BR BRPI0912675A patent/BRPI0912675A2/pt not_active IP Right Cessation
- 2009-05-14 CA CA2724314A patent/CA2724314C/en not_active Expired - Fee Related
- 2009-05-14 KR KR1020107028047A patent/KR101662334B1/ko active IP Right Grant
- 2009-05-14 SG SG10201609520XA patent/SG10201609520XA/en unknown
- 2009-05-14 CN CN201610702139.XA patent/CN106226401A/zh active Pending
- 2009-05-14 CN CN2009801254642A patent/CN102089642A/zh active Pending
- 2009-05-14 KR KR1020167016289A patent/KR20160075852A/ko not_active Application Discontinuation
- 2009-05-15 TW TW98116319A patent/TWI472758B/zh not_active IP Right Cessation
-
2010
- 2010-11-14 IL IL209291A patent/IL209291A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN102089642A (zh) | 2011-06-08 |
US7821646B2 (en) | 2010-10-26 |
JP2011521230A (ja) | 2011-07-21 |
IL209291A0 (en) | 2011-01-31 |
TW200951433A (en) | 2009-12-16 |
EP2283340A1 (en) | 2011-02-16 |
WO2009140458A1 (en) | 2009-11-19 |
TWI472758B (zh) | 2015-02-11 |
US20090284751A1 (en) | 2009-11-19 |
KR20160075852A (ko) | 2016-06-29 |
IL209291A (en) | 2013-03-24 |
AU2009246358A1 (en) | 2009-11-19 |
CN106226401A (zh) | 2016-12-14 |
JP5520933B2 (ja) | 2014-06-11 |
CA2724314C (en) | 2013-11-26 |
SG10201609520XA (en) | 2016-12-29 |
KR20110010111A (ko) | 2011-01-31 |
CA2724314A1 (en) | 2009-11-19 |
KR101662334B1 (ko) | 2016-10-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] | ||
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |