BRPI0912675A2 - método e sistema de teste ultra-sônico a laser - Google Patents

método e sistema de teste ultra-sônico a laser

Info

Publication number
BRPI0912675A2
BRPI0912675A2 BRPI0912675A BRPI0912675A BRPI0912675A2 BR PI0912675 A2 BRPI0912675 A2 BR PI0912675A2 BR PI0912675 A BRPI0912675 A BR PI0912675A BR PI0912675 A BRPI0912675 A BR PI0912675A BR PI0912675 A2 BRPI0912675 A2 BR PI0912675A2
Authority
BR
Brazil
Prior art keywords
testing method
ultrasonic testing
laser ultrasonic
laser
ultrasonic
Prior art date
Application number
BRPI0912675A
Other languages
English (en)
Portuguese (pt)
Inventor
John B Deaton Jr
Marc Dubois
Peter W Lorraine
Robert Filkins
Thomas E Drake Jr
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of BRPI0912675A2 publication Critical patent/BRPI0912675A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
BRPI0912675A 2008-05-15 2009-05-14 método e sistema de teste ultra-sônico a laser BRPI0912675A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/120,823 US7821646B2 (en) 2008-05-15 2008-05-15 Method and apparatus for generating mid-IR laser beam for ultrasound inspection
PCT/US2009/043893 WO2009140458A1 (en) 2008-05-15 2009-05-14 Method and apparatus for generating mid-ir laser for ultrasound inspection

Publications (1)

Publication Number Publication Date
BRPI0912675A2 true BRPI0912675A2 (pt) 2016-01-26

Family

ID=40873363

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0912675A BRPI0912675A2 (pt) 2008-05-15 2009-05-14 método e sistema de teste ultra-sônico a laser

Country Status (11)

Country Link
US (1) US7821646B2 (enExample)
EP (1) EP2283340A1 (enExample)
JP (1) JP5520933B2 (enExample)
KR (2) KR101662334B1 (enExample)
CN (2) CN106226401A (enExample)
BR (1) BRPI0912675A2 (enExample)
CA (1) CA2724314C (enExample)
IL (1) IL209291A (enExample)
SG (1) SG10201609520XA (enExample)
TW (1) TWI472758B (enExample)
WO (1) WO2009140458A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009043700B4 (de) * 2009-10-01 2013-11-07 Eads Deutschland Gmbh Laser-Ultraschall-Messvorrichtung
US10839509B2 (en) 2015-07-10 2020-11-17 3Scan Inc. Spatial multiplexing of histological stains
JP6739836B2 (ja) * 2016-06-01 2020-08-12 国立研究開発法人物質・材料研究機構 レーザおよびそれを用いたレーザ超音波探傷装置
CN105938087B (zh) * 2016-06-29 2018-10-30 华南理工大学 一种基于多轴飞行器的激光超声检测系统与方法
JP2023115852A (ja) * 2022-02-08 2023-08-21 本田技研工業株式会社 車両用前照灯装置
JP2023115856A (ja) 2022-02-08 2023-08-21 本田技研工業株式会社 車両用前照灯装置
US12416728B2 (en) 2022-05-17 2025-09-16 Northrop Grumman Systems Corporation Quantum lidar system

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JPH0376802U (enExample) * 1989-11-28 1991-08-01
US5355247A (en) 1993-03-30 1994-10-11 The Board Of Trustees Of The Leland Stanford, Jr. University Method using a monolithic crystalline material for producing radiation by quasi-phase-matching, diffusion bonded monolithic crystalline material for quasi-phase-matching, and method for fabricating same
US5400173A (en) 1994-01-14 1995-03-21 Northrop Grumman Corporation Tunable mid-infrared wavelength converter using cascaded parametric oscillators
US5640405A (en) * 1996-02-01 1997-06-17 Lighthouse Electronics Corporation Multi quasi phase matched interactions in a non-linear crystal
JP3465478B2 (ja) * 1996-04-30 2003-11-10 理化学研究所 光パラメトリック発振装置
US5911389A (en) 1996-12-20 1999-06-15 Lockheed Martin Corp. Wave based satellite constellation
US6050525A (en) 1997-04-29 2000-04-18 Lockheed Martin Corporation Asymmetric open rosette constellations
US6094447A (en) 1998-06-12 2000-07-25 Lockheed Martin Corporation System and method for reducing wavefront distortion in high-gain diode-pumped laser media
US6633384B1 (en) 1998-06-30 2003-10-14 Lockheed Martin Corporation Method and apparatus for ultrasonic laser testing
US6122060A (en) 1998-06-30 2000-09-19 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
US6657733B1 (en) 1998-06-30 2003-12-02 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
US6016214A (en) 1998-09-11 2000-01-18 Northrop Grumman Corporation Quadruple grating period PPLN optical parametric oscillator difference frequency generator with common doubly resonant cavity
WO2000020841A1 (en) * 1998-10-05 2000-04-13 Kla-Tencor Corporation Interferometric system for measurement disturbance of a sample
US7286241B2 (en) 1999-06-24 2007-10-23 Lockheed Martin Corporation System and method for high-speed laser detection of ultrasound
US6483859B1 (en) 1999-06-24 2002-11-19 Lockheed Martin Corporation System and method for high-speed laser detection of ultrasound
US6176135B1 (en) 1999-07-27 2001-01-23 Marc Dubois System and method for laser-ultrasonic frequency control using optimal wavelength tuning
US6335943B1 (en) * 1999-07-27 2002-01-01 Lockheed Martin Corporation System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength
CA2411632C (en) 2000-07-14 2013-09-17 Lockheed Martin Corporation System and method for locating and positioning an ultrasonic signal generator for testing purposes
IL153807A0 (en) 2000-07-14 2003-07-31 Lockheed Corp A system and method of determining porosity in composite materials using ultrasound
US6937774B1 (en) 2000-10-24 2005-08-30 Lockheed Martin Corporation Apparatus and method for efficiently increasing the spatial resolution of images
US6571633B1 (en) 2001-01-19 2003-06-03 Lockheed Martin Corporation Remote laser beam delivery system and method for use with a gantry positioning system for ultrasonic testing purposes
US6711954B2 (en) 2001-01-19 2004-03-30 Lockheed Martin Corporation Method and apparatus for improving the dynamic range of laser detected ultrasound in attenuative materials
JP2002228639A (ja) * 2001-01-30 2002-08-14 Nippon Steel Corp レーザー超音波検査装置及びレーザー超音波検査方法
US6668654B2 (en) 2001-08-15 2003-12-30 Lockheed Martin Corporation Method and apparatus for generating specific frequency response for ultrasound testing
US6606909B2 (en) 2001-08-16 2003-08-19 Lockheed Martin Corporation Method and apparatus to conduct ultrasonic flaw detection for multi-layered structure
US6649900B2 (en) 2001-09-07 2003-11-18 Lockheed Martin Corporation Photoreceiver assembly for high-powered lasers
US7117134B2 (en) 2001-10-18 2006-10-03 Lockheed Martin Corporation Method to optimize generation of ultrasound using mathematical modeling for laser ultrasound inspection
JP4087098B2 (ja) * 2001-11-14 2008-05-14 株式会社東芝 超音波検査装置
US6856918B2 (en) 2001-11-26 2005-02-15 Lockheed Martin Corporation Method to characterize material using mathematical propagation models and ultrasonic signal
US6732587B2 (en) 2002-02-06 2004-05-11 Lockheed Martin Corporation System and method for classification of defects in a manufactured object
US7277178B2 (en) 2003-09-22 2007-10-02 Celight, Inc. Coherent photothermal interferometric spectroscopy system and method for chemical sensing
JP2006114642A (ja) * 2004-10-14 2006-04-27 Tohoku Univ 赤外コヒーレント光源
US7184200B2 (en) 2004-12-16 2007-02-27 Lockheed Martin Corporation Passive broadband infrared optical limiter device based on a micro-optomechanical cantilever array
US7369250B2 (en) 2005-03-25 2008-05-06 Lockheed Martin Corporation System and method to inspect components having non-parallel surfaces
CN101089609A (zh) * 2007-06-28 2007-12-19 中国科学院安徽光学精密机械研究所 多谱段连续调谐高分辨红外激光光谱测量系统和方法

Also Published As

Publication number Publication date
JP5520933B2 (ja) 2014-06-11
IL209291A0 (en) 2011-01-31
CA2724314A1 (en) 2009-11-19
KR101662334B1 (ko) 2016-10-04
KR20160075852A (ko) 2016-06-29
US20090284751A1 (en) 2009-11-19
CA2724314C (en) 2013-11-26
CN106226401A (zh) 2016-12-14
IL209291A (en) 2013-03-24
US7821646B2 (en) 2010-10-26
EP2283340A1 (en) 2011-02-16
TW200951433A (en) 2009-12-16
WO2009140458A1 (en) 2009-11-19
CN102089642A (zh) 2011-06-08
AU2009246358A1 (en) 2009-11-19
JP2011521230A (ja) 2011-07-21
TWI472758B (zh) 2015-02-11
SG10201609520XA (en) 2016-12-29
KR20110010111A (ko) 2011-01-31

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]