TWI472466B - A pick-and-place device for ics - Google Patents
A pick-and-place device for ics Download PDFInfo
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Description
本發明係有關於一種取放裝置,特別是指一種積體電路晶片之取放裝置。The invention relates to a pick-and-place device, in particular to a pick-and-place device for an integrated circuit chip.
隨著科技的進步,各類型電子產品越來越普及,因此於電子產品內的積體電路(Integrate Circuit,IC)晶片的需求量越來越大。積體電路晶片在設置於電子產品前,必需經過燒錄(burning)的製程。燒錄的製程是將積體電路晶片放置於一燒錄機內進行燒錄,將預先定義好的程式燒入至積體電路晶片中,讓積體電路晶片能夠具有控制電子產品的其他元件的功能。為了減少積體電路晶片燒錄的作業時間,目前積體電路晶片燒錄普遍藉由一自動化晶片燒錄機來完成,其能減少積體電路晶片的整體燒錄製程時間,進而增加積體電路晶片的生產速度。With the advancement of technology, various types of electronic products are becoming more and more popular, so the demand for integrated circuit (IC) chips in electronic products is increasing. The integrated circuit wafer must be subjected to a burning process before being placed in the electronic product. The programming process is to place the integrated circuit chip in a burning machine for burning, and burn a pre-defined program into the integrated circuit chip, so that the integrated circuit chip can have other components for controlling the electronic product. Features. In order to reduce the working time of integrated circuit chip burning, the current integrated circuit chip burning is generally completed by an automatic wafer burning machine, which can reduce the overall burning recording time of the integrated circuit chip, thereby increasing the integrated circuit. The production speed of the wafer.
在燒錄作業的程序中,積體電路晶片會經由一取放裝置由備料區取放到燒錄機。當積體電路晶片燒錄完畢後,取放裝置會將燒錄完成的積體電路晶片放置到下一工作站中,例如將燒錄完畢的積體電路晶片經由取放裝置擺放至電子產品的晶片槽,或者擺放至用於測試積體電路晶片之測試單元的晶片槽。因為積體電路晶片放置於晶片槽係有方向限制。上述取放裝置在取放積體電路晶片至燒錄機、電子產品或者測試單元之晶片槽的過程中,多數狀況需要旋轉積體電路晶片,以便於將積體電路晶片正確的擺放於晶片槽。然而,習知可以旋轉積體電路晶片之取放裝置的結構複雜且體積大,造成維修不易且成本高,影響處理積體電路晶片的效率。且因為體積大佔用較大空間,造成設置上有一定限制。In the program of the burning operation, the integrated circuit chip is taken from the stocking area to the burning machine via a pick-and-place device. After the integrated circuit chip is burned, the pick-and-place device places the burned integrated circuit chip into the next workstation, for example, placing the burned integrated circuit wafer through the pick-and-place device to the electronic product. The wafer slot, or the wafer slot placed on the test unit for testing the integrated circuit chip. Because the integrated circuit wafer is placed in the wafer slot, there is a directional limit. In the process of picking up and dropping the integrated circuit chip to the wafer slot of the burner, the electronic product or the test unit, most of the conditions require rotating the integrated circuit chip so as to correctly place the integrated circuit chip on the wafer. groove. However, the structure of the pick-and-place device that can rotate the integrated circuit chip is complicated and bulky, which makes maintenance difficult and costly, and affects the efficiency of processing the integrated circuit chip. And because of the large volume and occupying a large space, there are certain restrictions on the setting.
因此本發明提供一種積體電路晶片之取放裝置,其結構簡單,而可同時或分別取放與旋轉多個積體電路晶片,如此可增加取放積體電路晶片之便利性,進而增加處理積體電路晶片的效率。Therefore, the present invention provides a pick-and-place device for an integrated circuit chip, which has a simple structure, and can simultaneously pick up and rotate a plurality of integrated circuit chips, thereby increasing the convenience of picking up and dropping the integrated circuit chip, thereby increasing processing. The efficiency of integrated circuit chips.
本發明目的之一在於:提供一種在取放積體電路晶片的過程中旋轉複數個積體電路晶片的取放裝置,以增加取放積體電路晶片的便利性。One of the objects of the present invention is to provide a pick-and-place device for rotating a plurality of integrated circuit wafers during the process of picking up and placing integrated circuit chips to increase the convenience of picking up and dropping integrated circuit chips.
本發明之另一目的在於:提供一種積體電路晶片之取放裝置,其結構簡單且體積小,所以便於維修、降低佔用空間與降低成本。Another object of the present invention is to provide a pick-and-place device for an integrated circuit chip which is simple in structure and small in size, so that it is easy to maintain, reduce space occupation and reduce cost.
本發明之積體電路晶片之取放裝置,其包含一基座、複數個取放結構、複數個旋轉結構、一傳動結構與一驅動結構。該些取放結構設於基座並分別具有一吸嘴,每一吸嘴可分別上下移動。該些旋轉結構設於基座並帶動該些吸嘴旋轉。傳動結構設於該些旋轉結構並驅動該些旋轉結構旋轉。驅動結構設於基座,用於驅動傳動結構,而帶動該些旋轉結構旋轉,進而驅使該些旋轉結構帶動該些吸嘴旋轉。如此,藉由該些旋轉結構帶動該些吸嘴旋轉,即可在取放積體電路晶片的過程中旋轉積體電路晶片,以增加取放積體電路晶片的便利性。The pick-and-place device for an integrated circuit of the present invention comprises a base, a plurality of pick-and-place structures, a plurality of rotating structures, a transmission structure and a driving structure. The pick-and-place structures are disposed on the base and respectively have a nozzle, and each nozzle can be moved up and down respectively. The rotating structures are disposed on the base and drive the nozzles to rotate. The transmission structure is disposed on the rotating structures and drives the rotating structures to rotate. The driving structure is disposed on the base for driving the transmission structure, and drives the rotating structures to rotate, thereby driving the rotating structures to drive the nozzles to rotate. In this way, by rotating the nozzles by the rotating structures, the integrated circuit wafer can be rotated during the process of picking up and placing the integrated circuit wafers, thereby increasing the convenience of picking up and dropping the integrated circuit chips.
茲為使 貴審查委員對本發明之結構特徵及所達成之功效有更進一步之瞭解與認識,謹佐以較佳之實施例及配合詳細之說明,說明如後:請參閱第一A圖與第一B圖本發明較佳實施例之積體電路晶片之取放裝置之不同視角的立體圖。如圖所示,本發明之積體電路晶片之取放裝置10包含基座12、複數個取放結構14、複數個旋轉結構16、傳動結構17與驅動結構18。基座12包含有基板122與背板123。基板122設於背板123上方。該些取放結構14設於基座12之背板123。該些取放結構14分別具有吸嘴142,以用於取放積體電路晶片。該些旋轉結構16設於基座12之基板122。旋轉結構16用於帶動吸嘴142旋轉。旋轉結構16之詳細結構示於第三圖,並詳述於後。For a better understanding and understanding of the structural features and the efficacies of the present invention, please refer to the preferred embodiment and the detailed description, as explained below: please refer to Figure A and Figure 1 Figure 4 is a perspective view of a different viewing angle of the pick-and-place device of the integrated circuit of the preferred embodiment of the present invention. As shown in the figure, the pick-and-place device 10 of the integrated circuit of the present invention comprises a susceptor 12, a plurality of pick-and-place structures 14, a plurality of rotating structures 16, a transmission structure 17, and a driving structure 18. The susceptor 12 includes a substrate 122 and a back plate 123. The substrate 122 is disposed above the back plate 123. The pick-and-place structures 14 are disposed on the back plate 123 of the susceptor 12. The pick-and-place structures 14 each have a nozzle 142 for picking up and dropping the integrated circuit chip. The rotating structures 16 are disposed on the substrate 122 of the susceptor 12 . The rotating structure 16 is used to drive the nozzle 142 to rotate. The detailed structure of the rotating structure 16 is shown in the third figure and is described in detail later.
傳動結構17設於該些旋轉結構16與該驅動結構18。傳動結構17用於驅動該些旋轉結構16旋轉。驅動結構18設於基座12之基板122。驅動結構18用於驅動傳動結構17帶動該些旋轉結構16旋轉。進一步使該些旋轉 結構16帶動該些吸嘴142旋轉。驅動結構18之一實施例可為一定位馬達。The transmission structure 17 is disposed on the rotating structure 16 and the driving structure 18. The transmission structure 17 is used to drive the rotating structures 16 to rotate. The driving structure 18 is disposed on the substrate 122 of the susceptor 12. The driving structure 18 is used to drive the transmission structure 17 to drive the rotating structures 16 to rotate. Further make the rotation The structure 16 drives the nozzles 142 to rotate. One embodiment of the drive structure 18 can be a positioning motor.
本發明僅藉由驅動結構18透過傳動結構17與該些旋轉結構16,即可帶動該些吸嘴142旋轉。所以本發明之取放裝置10結構簡單且體積小,如此即可便於維修與降低佔用空間和成本。此外,本發明之取放裝置10可同時取放多個積體電路晶片,且可在取放該些積體電路晶片的過程中旋轉該些積體電路晶片至正確方向,以確實放置於晶片槽。如此可增加取放該些積體電路晶片的便利性。The present invention can only drive the nozzles 142 to rotate by the transmission structure 18 passing through the transmission structure 17 and the rotating structures 16. Therefore, the pick-and-place device 10 of the present invention has a simple structure and a small size, so that maintenance can be facilitated and space and cost can be reduced. In addition, the pick-and-place device 10 of the present invention can simultaneously take a plurality of integrated circuit chips, and can rotate the integrated circuit chips to the correct direction during the process of picking up and dropping the integrated circuit chips to be surely placed on the wafer. groove. This can increase the convenience of handling these integrated circuit chips.
請一併參閱第二圖,本發明更包含複數個中空軸管20。每一中空軸管20分別穿設於每一旋轉結構16進而連接至吸嘴142。為了更方便將該些中空軸管20與外部之一真空裝置相連接,因此本發明更包含複數連接埠22。該些連接埠22分別連接該些中空軸管20上方。連接埠22之一實施例為一快速接頭,如此讓使用者更便捷的將真空裝置接設於中空軸管20。本發明之每一取放結構14包含吸嘴142、致動器144與傳動軸146。致動器144設於基座12之背板123。致動器144之一實施例為一氣壓缸。傳動軸146穿設於致動器144並連接於吸嘴142。傳動軸146為一中空管件。傳動軸146與中空軸管20相通。中空軸管20穿於旋轉結構16並連接傳動軸146,如此中空軸管20即連接於吸嘴142。每一致動器144用於分別驅動每一傳動軸146上下移動,以分別控制每一吸嘴142上下移動而吸取積體電路晶片。旋轉結構16用於帶動傳動軸146旋轉,以旋轉吸嘴142。Referring to the second figure together, the present invention further includes a plurality of hollow shaft tubes 20. Each hollow shaft tube 20 is respectively disposed in each of the rotating structures 16 and is connected to the suction nozzle 142. In order to facilitate the connection of the hollow shaft tubes 20 to one of the external vacuum devices, the present invention further includes a plurality of ports 22. The connecting ports 22 are respectively connected to the upper of the hollow shaft tubes 20. One embodiment of the port 22 is a quick connector, which allows the user to more easily attach the vacuum device to the hollow shaft tube 20. Each pick-and-place structure 14 of the present invention includes a suction nozzle 142, an actuator 144 and a drive shaft 146. The actuator 144 is disposed on the back plate 123 of the base 12. One embodiment of the actuator 144 is a pneumatic cylinder. The drive shaft 146 is disposed through the actuator 144 and is coupled to the suction nozzle 142. The drive shaft 146 is a hollow tubular member. The drive shaft 146 is in communication with the hollow shaft tube 20. The hollow shaft tube 20 is passed through the rotating structure 16 and connected to the transmission shaft 146, so that the hollow shaft tube 20 is connected to the suction nozzle 142. Each actuator 144 is used to drive each of the drive shafts 146 to move up and down, respectively, to control each nozzle 142 to move up and down to draw the integrated circuit wafer. The rotating structure 16 is used to drive the transmission shaft 146 to rotate to rotate the suction nozzle 142.
復參閱第一A圖與第一B圖,本發明之旋轉結構16包含至少一主旋轉結構162與至少一從屬旋轉結構164。驅動結構18帶動傳動結構17而帶動主旋轉結構162旋轉。主旋轉結構162帶動從屬旋轉結構164旋轉。傳動結構17包含一第一傳動單元172(如第一B圖所示)與一第二傳動單元174(如第一A圖所示)。第一傳動單元172設置於驅動結構18與主旋轉結構162。驅動結構18驅動第一傳動單元172而帶動主旋轉結構162旋轉。第二傳動單元174設置於主旋轉結構162與從屬旋轉結構164。當主旋轉結構162受控於第一傳動單元172旋轉時,第二傳動單元174將被主旋轉結構162帶動,而帶動從屬旋轉結構164旋轉,因此從屬旋轉結構164被主旋轉 結構162帶動旋轉。Referring to FIGS. 1A and 1B, the rotating structure 16 of the present invention includes at least one main rotating structure 162 and at least one subordinate rotating structure 164. The driving structure 18 drives the transmission structure 17 to drive the main rotating structure 162 to rotate. The main rotating structure 162 drives the slave rotating structure 164 to rotate. The transmission structure 17 includes a first transmission unit 172 (as shown in FIG. B) and a second transmission unit 174 (as shown in FIG. 1A). The first transmission unit 172 is disposed on the driving structure 18 and the main rotating structure 162. The drive structure 18 drives the first transmission unit 172 to drive the main rotating structure 162 to rotate. The second transmission unit 174 is disposed on the main rotating structure 162 and the slave rotating structure 164. When the main rotating structure 162 is controlled by the first transmission unit 172, the second transmission unit 174 will be driven by the main rotating structure 162 to drive the slave rotating structure 164 to rotate, so that the slave rotating structure 164 is rotated by the main. Structure 162 drives the rotation.
承接上述,第一傳動單元172包含驅動輪1722、複數第一主傳動輪1724與傳動帶1726。驅動輪1722設於驅動結構18。驅動結構18驅動驅動輪1722旋轉。如第一B圖與第三圖所示,第一主傳動輪1724設於主旋轉結構162之下方。傳動帶1726設於驅動輪1722與第一主傳動輪1724。如此當驅動結構18驅動驅動輪1722旋轉時,驅動輪1722會驅動傳動帶1726旋轉,而帶動第一主傳動輪1724旋轉。上述之驅動輪1722與該些第一主傳動輪1724之一實施例為皮帶輪。傳動帶1726之一實施例為皮帶。第二傳動單元174包含第二主傳動輪1742、從屬傳動輪1744與傳動帶1746。如第一A圖與第三圖所示,第二主傳動輪1742設置於主旋轉結構162之上方。從屬傳動輪1744如第一A圖與第二圖所示,則設置於從屬旋轉結構164之上方。傳動帶1746設置於第二主傳動輪1742與從屬傳動輪1744。如此當驅動結構18驅動主旋轉結構162旋轉時,主旋轉結構162之第二主傳動輪1742即會旋轉。第二主傳動輪1742將帶動傳動帶1746旋轉,而使從屬旋轉結構164之從屬傳動輪1744被帶動旋轉。因此從屬旋轉結構164即會被主旋轉結構162帶動旋轉。上述第一傳動單元172之傳動帶1726及第二傳動單元174之傳動帶1746僅為傳動件之一實施態樣。In response to the above, the first transmission unit 172 includes a drive wheel 1722, a plurality of first main drive wheels 1724, and a drive belt 1726. Drive wheel 1722 is provided to drive structure 18. The drive structure 18 drives the drive wheel 1722 to rotate. As shown in the first B and third figures, the first main drive wheel 1724 is disposed below the main rotating structure 162. The drive belt 1726 is disposed on the drive wheel 1722 and the first main drive wheel 1724. Thus, when the drive structure 18 drives the drive wheel 1722 to rotate, the drive wheel 1722 drives the drive belt 1726 to rotate, and drives the first main drive wheel 1724 to rotate. One of the above-described driving wheels 1722 and one of the first main transmission wheels 1724 is a pulley. One embodiment of the drive belt 1726 is a belt. The second transmission unit 174 includes a second main transmission wheel 1742, a slave transmission wheel 1744 and a transmission belt 1746. As shown in the first A and third figures, the second main drive wheel 1742 is disposed above the main rotating structure 162. The slave drive wheel 1744 is disposed above the slave rotation structure 164 as shown in the first A and second figures. The drive belt 1746 is disposed on the second main drive wheel 1742 and the slave drive wheel 1744. Thus, when the drive structure 18 drives the main rotating structure 162 to rotate, the second main drive wheel 1742 of the main rotating structure 162 will rotate. The second main drive wheel 1742 will rotate the drive belt 1746 to cause the slave drive wheel 1744 of the slave rotary structure 164 to be rotated. Therefore, the slave rotating structure 164 is rotated by the main rotating structure 162. The transmission belt 1726 of the first transmission unit 172 and the transmission belt 1746 of the second transmission unit 174 are only one embodiment of the transmission member.
請一併參閱第三圖、第四-A圖與第四B圖,其係本發明較佳實施例之旋轉結構16的結構示意圖、直線套筒166套設於中空軸管20之前視圖與俯視圖。如圖所示,本發明之每一旋轉結構16包含至少一直線套筒166與複數個旋轉軸承。旋轉軸承至少包含第一旋轉軸承1682、第二旋轉軸承1684。旋轉軸承168更可包含第三旋轉軸承1686,以增加穩固性。每一旋轉軸承分別具有一外環與一內環,該內環可旋轉。直線套筒166套設於中空軸管20。該些旋轉軸承1682、1684、1686分別藉由複數個軸承座124、126、128而設於基座12(如第五圖所示)。該些旋轉軸承1682、1684、1686分別套設於直線套筒166。Please refer to FIG. 3, FIG. 4A and FIG. 4B respectively, which are schematic structural diagrams of the rotating structure 16 of the preferred embodiment of the present invention, and the linear sleeve 166 is sleeved on the front view and the top view of the hollow shaft tube 20. . As shown, each of the rotating structures 16 of the present invention includes at least a linear sleeve 166 and a plurality of rotating bearings. The rotary bearing includes at least a first rotary bearing 1682 and a second rotary bearing 1684. The rotary bearing 168 may further include a third rotary bearing 1686 to increase the stability. Each of the rotary bearings has an outer ring and an inner ring, and the inner ring is rotatable. The linear sleeve 166 is sleeved on the hollow shaft tube 20. The rotary bearings 1682, 1684, and 1686 are respectively disposed on the base 12 (as shown in FIG. 5) by a plurality of bearing seats 124, 126, and 128. The rotary bearings 1682, 1684, and 1686 are respectively sleeved on the linear sleeve 166.
直線套筒166之一實施例為一花鍵軸承套筒,故如第四B圖所示,中空軸管20之外側形狀與直線套筒166之內側形狀相配合。因此直線套筒166 套設於中空軸管20。當直線套筒166轉動時,直線套筒166會帶動中空軸管20旋轉。進而帶動連接於中空軸管20之傳動軸146(如第二圖所示)旋轉。因此傳動軸146連接之吸嘴142會被帶動旋轉。One embodiment of the linear sleeve 166 is a splined bearing sleeve, so as shown in FIG. 4B, the outer side of the hollow shaft tube 20 has a shape that matches the inner shape of the linear sleeve 166. Therefore linear sleeve 166 The sleeve is sleeved on the hollow shaft tube 20. When the linear sleeve 166 is rotated, the linear sleeve 166 will drive the hollow shaft tube 20 to rotate. In turn, the drive shaft 146 (shown in the second figure) connected to the hollow shaft tube 20 is rotated. Therefore, the suction nozzle 142 to which the transmission shaft 146 is connected is driven to rotate.
復參閱第四A圖,直線套筒166之一側邊設有溝槽1662。柱體24之一端設於溝槽1662。溝槽1662之形狀必非必須為圖示之長形,圖示僅為本發明之一實施例。柱體24之另一端設於第二主傳動輪1742或/及第一主傳動輪1724之一側壁(如第三圖所示)。也就是說柱體24設於傳動結構17與旋轉結構16之直線套筒166。因此,主旋轉結構162之直線套筒166固定於傳動結構17之第二主傳動輪1742或/及第一主傳動輪1724。因此當第一主傳動輪1724受控而轉動時,主旋轉結構162中的直線套筒166會被帶動旋轉,進而帶動穿於主旋轉結構162的中空軸管20轉動。另外與上述中空軸管20連接的吸嘴142以及設於主旋轉結構162之第二主傳動輪1742也會被帶動。Referring to the fourth A diagram, one side of the linear sleeve 166 is provided with a groove 1662. One end of the cylinder 24 is disposed in the groove 1662. The shape of the groove 1662 must not necessarily be the elongated shape shown, and the illustration is only one embodiment of the present invention. The other end of the cylinder 24 is disposed on a side wall of the second main transmission wheel 1742 or/and the first main transmission wheel 1724 (as shown in the third figure). That is to say, the cylinder 24 is disposed on the linear sleeve 166 of the transmission structure 17 and the rotating structure 16. Thus, the linear sleeve 166 of the primary rotating structure 162 is secured to the second primary drive wheel 1742 or/and the first primary drive wheel 1724 of the transmission structure 17. Therefore, when the first main transmission wheel 1724 is controlled to rotate, the linear sleeve 166 in the main rotating structure 162 is driven to rotate, thereby driving the hollow shaft tube 20 passing through the main rotating structure 162 to rotate. Further, the suction nozzle 142 connected to the hollow shaft tube 20 and the second main transmission wheel 1742 provided in the main rotation structure 162 are also driven.
此外,從屬旋轉結構164之直線套筒166透過柱體24固定於傳動結構17之從屬傳動輪1744之側壁。以藉由從屬傳動輪1744帶動從屬旋轉結構164之直線套筒166旋轉。因此當從屬傳動輪1744受控於主旋轉結構162中的第二主傳動輪1742與傳動帶1746而轉動時,穿於從屬旋轉結構164之直線套筒166的中空軸管20與吸嘴142將被帶動旋轉。In addition, the linear sleeve 166 of the slave rotating structure 164 is secured to the sidewall of the slave drive wheel 1744 of the transmission structure 17 via the cylinder 24. The linear sleeve 166 of the slave rotating structure 164 is rotated by the slave drive wheel 1744. Therefore, when the slave drive wheel 1744 is controlled to rotate by the second main drive wheel 1742 and the drive belt 1746 in the main rotary structure 162, the hollow shaft tube 20 and the suction nozzle 142 that are passed through the linear sleeve 166 of the slave rotary structure 164 will be Drive the rotation.
另外,本發明更包含至少一間隔環169(如第三圖所示)。間隔環169套設於直線套筒166並位於第二主傳動輪1742與第一主傳動輪1724之間。間隔環169用於間隔第二主傳動輪1742與第一旋轉軸承1682以及第一主傳動輪1724與第二旋轉軸承1684,以分別避免第一旋轉軸承1682、第二旋轉軸承1684與第二主傳動輪1742以及第一主傳動輪1724產生摩擦。間隔環169套設於直線套筒166並設置於該些旋轉軸承1682、1684之內環。也就是說,該些旋轉軸承1682、1684透過間隔環169而設置於直線套筒166。直線套筒166旋轉時,該些旋轉軸承1682、1684之內環會受間隔環169帶動而旋轉。另外,當旋轉結構16更包含有第三旋轉軸承1686時,可另增設間隔環169於第三旋轉軸承1686之內環,以避免第一主傳動輪1724 與第三旋轉軸承1686產生摩擦。Additionally, the present invention further includes at least one spacer ring 169 (as shown in the third figure). The spacer ring 169 is sleeved on the linear sleeve 166 and located between the second main transmission wheel 1742 and the first main transmission wheel 1724. The spacer ring 169 is configured to space the second main transmission wheel 1742 and the first rotary bearing 1682 and the first main transmission wheel 1724 and the second rotary bearing 1684 to avoid the first rotary bearing 1682, the second rotary bearing 1684 and the second main, respectively. The drive wheel 1742 and the first main drive wheel 1724 create friction. The spacer ring 169 is sleeved on the linear sleeve 166 and disposed on the inner ring of the rotary bearings 1682 and 1684. That is, the rotary bearings 1682 and 1684 are provided in the linear sleeve 166 through the spacer ring 169. When the linear sleeve 166 rotates, the inner rings of the rotary bearings 1682, 1684 are rotated by the spacer ring 169. In addition, when the rotating structure 16 further includes the third rotating bearing 1686, a spacer ring 169 may be additionally added to the inner ring of the third rotating bearing 1686 to avoid the first main driving wheel 1724. Friction is generated with the third rotary bearing 1686.
請一併參閱第五圖本發明積體電路晶片之取放裝置之較佳實施例的前視圖。如圖所示,本發明包含有軸承座,軸承座包含有第一軸承座124與第二軸承座126,且可更包含有第三軸承座128。該些軸承座分別設於基座12之基板122。旋轉結構16(如第三圖所示)之第一旋轉軸承1682、第二旋轉軸承1684與第三旋轉軸承1686之外環分別設置於第一軸承座124、第二軸承座126與第三軸承座128。第二軸承座126位於第一軸承座124之下方。第三軸承座128位於第二軸承座126之下方。第二旋轉軸承1684可直接埋設於基板122內,所以基板122即用於作為第二軸承座126。Referring to FIG. 5, a front view of a preferred embodiment of the pick-and-place device of the integrated circuit chip of the present invention is shown. As shown, the present invention includes a bearing housing that includes a first bearing block 124 and a second bearing block 126, and may further include a third bearing block 128. The bearing housings are respectively disposed on the base plate 122 of the base 12 . The first rotating bearing 1682, the second rotating bearing 1684 and the third rotating bearing 1686 outer ring of the rotating structure 16 (as shown in the third figure) are respectively disposed on the first bearing seat 124, the second bearing seat 126 and the third bearing Block 128. The second bearing block 126 is located below the first bearing block 124. The third bearing block 128 is located below the second bearing block 126. The second rotary bearing 1684 can be directly embedded in the substrate 122, so the substrate 122 is used as the second bearing housing 126.
請一併參閱第六圖,其係本發明較佳實施例之積體電路晶片之取放裝置設置於移動裝置之立體圖。如圖所示,本發明更包含一移動裝置30。移動裝置30包含一水平移動結構32與一垂直移動結構34。取放裝置10之基座12設於移動裝置30之一移動座322。移動座322設於水平移動結構32。水平移動結構32可帶動移動座322移動於水平方向(X方向)。換句話說取放裝置10設於水平移動結構32,而水平移動結構32帶動取放裝置10移動於水平方向。水平移動結構32設於垂直移動結構34。垂直移動結構34帶動水平移動結構32於垂直方向(Y方向)移動。如此藉由移動裝置30之水平移動結構32與垂直移動結構34,即可以讓取放裝置10移動於水平方向(X方向)與垂直方向(Y方向),以增加取放積體電路晶片的便利性,而提高取放效率。Please refer to the sixth drawing, which is a perspective view of the pick-and-place device of the integrated circuit of the preferred embodiment of the present invention. As shown, the present invention further includes a mobile device 30. The mobile device 30 includes a horizontal moving structure 32 and a vertical moving structure 34. The base 12 of the pick-and-place device 10 is disposed on one of the mobile devices 30. The moving seat 322 is disposed on the horizontal moving structure 32. The horizontal moving structure 32 can move the moving base 322 in the horizontal direction (X direction). In other words, the pick-and-place device 10 is disposed in the horizontal moving structure 32, and the horizontal moving structure 32 drives the pick-and-place device 10 to move in the horizontal direction. The horizontal moving structure 32 is disposed on the vertical moving structure 34. The vertical movement structure 34 drives the horizontal movement structure 32 to move in the vertical direction (Y direction). Thus, by the horizontal moving structure 32 and the vertical moving structure 34 of the mobile device 30, the pick-and-place device 10 can be moved in the horizontal direction (X direction) and the vertical direction (Y direction) to increase the convenience of accessing the integrated circuit chip. Sex, and improve the efficiency of pick and place.
綜上所述,本發明之積體電路晶片之取放裝置,其包含取放結構、旋轉結構、傳動結構與驅動結構,本發明利用驅動結構驅動傳動結構,而帶動旋轉結構旋轉,如此旋轉結構即會帶動吸嘴旋轉。如此,本發明之取放裝置僅需藉由單一驅動結構即可驅使複數個吸嘴同時旋轉,如此可在該些吸嘴取放複數個積體電路晶片的過程中,同時旋轉該些積體電路晶片至正確方向,如此以增加取放該些積體電路晶片時的便利性。In summary, the pick-and-place device for the integrated circuit chip of the present invention comprises a pick-and-place structure, a rotating structure, a transmission structure and a driving structure. The present invention drives the transmission structure by using the driving structure, and drives the rotating structure to rotate, so that the rotating structure That will drive the nozzle to rotate. Therefore, the pick-and-place device of the present invention can drive a plurality of nozzles to rotate at the same time by a single driving structure, so that the plurality of integrated circuit chips can be rotated while the nozzles are being loaded and discharged. The circuit chip is in the correct direction, so as to increase the convenience when handling the integrated circuit chips.
故本發明係實為一具有新穎性、進步性及可供產業利用者,應符合我國專利法所規定之專利申請要件無疑,爰依法提出發明專利申請,祈 鈞 局早日賜准專利,至感為禱。Therefore, the present invention is a novelty, progressive and available for industrial use, and should conform to the patent application requirements stipulated in the Patent Law of China, and undoubtedly file an invention patent application according to law. The bureau gave patents as soon as possible, and felt prayed.
惟以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,舉凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。However, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and the shapes, structures, features, and spirits described in the claims are equivalently changed. Modifications are intended to be included in the scope of the patent application of the present invention.
10‧‧‧取放裝置10‧‧‧ pick and place device
12‧‧‧基座12‧‧‧ Pedestal
122‧‧‧基板122‧‧‧Substrate
123‧‧‧背板123‧‧‧ Backboard
124‧‧‧第一軸承座124‧‧‧First bearing housing
126‧‧‧第二軸承座126‧‧‧Second bearing
128‧‧‧第三軸承座128‧‧‧3rd bearing housing
14‧‧‧取放結構14‧‧‧ pick and place structure
142‧‧‧吸嘴142‧‧ ‧ nozzle
144‧‧‧致動器144‧‧‧Actuator
146‧‧‧傳動軸146‧‧‧ drive shaft
17‧‧‧傳動結構17‧‧‧ Transmission structure
172‧‧‧第一傳動單元172‧‧‧First transmission unit
1722‧‧‧驅動輪1722‧‧‧Drive wheel
1724‧‧‧第一主傳動輪1724‧‧‧First main drive wheel
1726‧‧‧傳動帶1726‧‧‧ drive belt
174‧‧‧第二傳動單元174‧‧‧second transmission unit
1742‧‧‧第二主傳動輪1742‧‧‧Second main drive wheel
1744‧‧‧從屬傳動輪1744‧‧‧Subordinate drive wheel
1746‧‧‧傳動帶1746‧‧‧ drive belt
18‧‧‧驅動結構18‧‧‧Drive structure
20‧‧‧中空軸管20‧‧‧ hollow shaft tube
16‧‧‧旋轉結構16‧‧‧Rotating structure
162‧‧‧主旋轉結構162‧‧‧Main rotating structure
164‧‧‧從屬旋轉結構164‧‧‧Subordinate rotating structure
166‧‧‧直線套筒166‧‧‧Line sleeve
1662‧‧‧溝槽1662‧‧‧ trench
1682‧‧‧第一旋轉軸承1682‧‧‧First rotary bearing
1684‧‧‧第二旋轉軸承1684‧‧‧Second rotary bearing
1686‧‧‧第三旋轉軸承1686‧‧‧3rd rotary bearing
169‧‧‧間隔環169‧‧‧ spacer ring
22‧‧‧連接埠22‧‧‧Connected
24‧‧‧柱體24‧‧‧Cylinder
30‧‧‧移動裝置30‧‧‧Mobile devices
32‧‧‧水平移動結構32‧‧‧ horizontal moving structure
322‧‧‧移動座322‧‧‧Mobile seat
34‧‧‧垂直移動結構34‧‧‧ Vertical mobile structure
第一A圖為本發明積體電路晶片之取放裝置之較佳實施例的立體圖;第一B圖為第一A圖之取放裝置之另一視角的立體圖;第二圖為本發明之中空軸管、旋轉結構、傳動結構以及取放結構連結之較佳實施例的立體圖;第三圖為本發明之旋轉結構之較佳實施例的結構示意圖;第四A圖為本發明之直線套筒套設於中空軸管之較佳實施例的前視圖;第四B圖為本發明之直線套筒套設於中空軸管之較佳實施例的俯視圖;第五圖為本發明之積體電路晶片之取放裝置之較佳實施例的前視圖;以及第六圖為本發明積體電路晶片之取放裝置設置於移動裝置之較佳實施例的立體圖。1 is a perspective view of a preferred embodiment of the pick-and-place device of the integrated circuit of the present invention; FIG. 1B is a perspective view of another view of the pick-and-place device of the first A; A perspective view of a preferred embodiment of a hollow shaft tube, a rotating structure, a transmission structure, and a pick-and-place structure; a third view of the preferred embodiment of the rotating structure of the present invention; and a fourth embodiment of the present invention A front view of a preferred embodiment of the hollow sleeve tube; a fourth embodiment of the present invention is a plan view of a preferred embodiment of the linear sleeve of the present invention, and a fifth embodiment of the present invention; A front view of a preferred embodiment of a pick-and-place device for a circuit chip; and a sixth view of a preferred embodiment of the pick-and-place device for an integrated circuit of the present invention disposed on the mobile device.
10‧‧‧取放裝置10‧‧‧ pick and place device
12‧‧‧基座12‧‧‧ Pedestal
122‧‧‧基板122‧‧‧Substrate
123‧‧‧背板123‧‧‧ Backboard
14‧‧‧取放結構14‧‧‧ pick and place structure
142‧‧‧吸嘴142‧‧ ‧ nozzle
144‧‧‧致動器144‧‧‧Actuator
146‧‧‧傳動軸146‧‧‧ drive shaft
16‧‧‧旋轉結構16‧‧‧Rotating structure
162‧‧‧主旋轉結構162‧‧‧Main rotating structure
164‧‧‧從屬旋轉結構164‧‧‧Subordinate rotating structure
17‧‧‧傳動結構17‧‧‧ Transmission structure
174‧‧‧第二傳動單元174‧‧‧second transmission unit
1742‧‧‧第二主傳動輪1742‧‧‧Second main drive wheel
1744‧‧‧從屬傳動輪1744‧‧‧Subordinate drive wheel
1746‧‧‧傳動帶1746‧‧‧ drive belt
18‧‧‧驅動結構18‧‧‧Drive structure
20‧‧‧中空軸管20‧‧‧ hollow shaft tube
22‧‧‧連接埠22‧‧‧Connected
Claims (17)
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TW98137357A TWI472466B (en) | 2009-11-04 | 2009-11-04 | A pick-and-place device for ics |
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TW201116467A TW201116467A (en) | 2011-05-16 |
TWI472466B true TWI472466B (en) | 2015-02-11 |
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CN111715542A (en) * | 2020-06-30 | 2020-09-29 | 安徽富信半导体科技有限公司 | Semiconductor element sorting and testing integrated machine |
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TWI283649B (en) * | 2005-08-10 | 2007-07-11 | Hon Tech Inc | IC test sorting machine |
TW200834791A (en) * | 2006-11-29 | 2008-08-16 | Intekplus Co Ltd | Apparatus of transferring semiconductor package |
TWM339398U (en) * | 2008-01-09 | 2008-09-01 | wei-jie Zhuang | Torque type rotation tool |
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TWI283649B (en) * | 2005-08-10 | 2007-07-11 | Hon Tech Inc | IC test sorting machine |
TW200834791A (en) * | 2006-11-29 | 2008-08-16 | Intekplus Co Ltd | Apparatus of transferring semiconductor package |
TWM339398U (en) * | 2008-01-09 | 2008-09-01 | wei-jie Zhuang | Torque type rotation tool |
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