CN111715542A - An all-in-one machine for sorting and testing semiconductor components - Google Patents

Abstract

The invention discloses a semiconductor element sorting and testing integrated machine which comprises a base, wherein a support frame is fixedly arranged on the upper surface of the base, a cross beam is fixedly arranged at the top of the support frame through bolts, a movable plate is movably arranged on one side of the cross beam, a lifting arm is movably arranged on one side of the movable plate, a grabbing mechanism is fixedly arranged at the bottom end of the lifting arm, a socket plate is arranged on the upper surface of the base, a testing socket is arranged on the socket plate, a plurality of mounting grooves are formed in the testing socket, the grabbing mechanism comprises a mounting plate, a plurality of external splines are rotatably arranged on a first support seat, vent pipes are movably arranged on the inner sides of the external splines along the vertical direction, and suction; the invention can test a plurality of semiconductor elements at a time, has high working efficiency and is convenient for adjusting the angles of the semiconductor elements, thereby accurately placing the semiconductor elements into the mounting groove and having high mounting speed of the semiconductor elements.

Description

An all-in-one machine for sorting and testing semiconductor components

technical field

The invention relates to the technical field of semiconductor production equipment, in particular to an integrated machine for sorting and testing semiconductor components.

Background technique

The patent document (CN104096684B) discloses a sorting machine for testing semiconductor components. The sorting machine cannot adjust the angle of the semiconductor components when handling the semiconductor components during the test process, and requires manual adjustment. The installation accuracy is poor and the speed is slow. As a result, work efficiency is reduced.

SUMMARY OF THE INVENTION

The purpose of the present invention is to provide an all-in-one machine for sorting and testing semiconductor components, which solves the problem that the existing all-in-one machine for sorting and testing semiconductor components has a small number of single tests, cannot adjust the angle of semiconductor components, and has slow installation speed of semiconductor components and high working efficiency. Low technical issues.

The object of the present invention can be realized through the following technical solutions:

An integrated machine for sorting and testing semiconductor components, comprising a base, a support frame is fixedly installed on the upper surface of the base, a cross beam is fixedly installed on the top of the support frame by bolts, and a movable plate is movably installed on one side of the cross beam, A lifting arm is movably installed on one side of the moving plate along the vertical direction, and a grabbing mechanism is fixedly installed at the bottom end of the lifting arm;

A first motor is fixedly installed on one side of the moving plate, a gear is fixedly installed on the output shaft end of the first motor, a rack is fixedly installed on one side surface of the beam, and the gear is engaged with the rack. One side of the beam is provided with a transmission belt, the upper and lower ends of the transmission belt are respectively fixedly connected to the lifting arm through a fixed plate, and a second motor is fixedly installed on one side of the moving plate, and the output of the second motor is A transmission wheel is fixedly installed at the shaft end, and the transmission wheel is matched with the inner side of the transmission belt. One side of the moving plate is rotatably installed with two rotating rollers, and the two rotating rollers are respectively located above and below the transmission wheel. The rotating roller is closely matched with the outer surface of the transmission belt;

The grabbing mechanism includes a mounting plate, a support seat 1 is fixedly installed on one side of the mounting plate, a plurality of external splines are rotatably installed on the support seat 1, and the inner side of the external splines is movable in the vertical direction. A ventilation pipe is installed, a suction nozzle is fixedly installed at the bottom of the ventilation pipe, a support seat 2 is fixedly installed on one side of the mounting plate, the ventilation pipe runs through the support seat 2, and the ventilation pipe is slidably matched with the support seat 2 One side of the mounting plate is rotatably installed with several groups of pulleys, the number of each group of pulleys is two, the two pulleys are distributed up and down, and the belts pass between the two pulleys A transmission connection, a plurality of third motors are fixedly installed on the other side of the mounting plate, the output shaft end of the third motors is fixedly connected with one of the pulleys of each group, and the ventilation pipe is rotatably installed with a connection block, one side of the belt one is fixedly connected with the connecting block;

Several fourth motors are fixedly installed on the upper surface of the first support seat, and the second pulley is fixedly installed on the output shaft end of the fourth motor and the external spline, and the two belt pulleys are driven between the second belts. connect;

A socket board is fixedly installed on the upper surface of the base, the socket board is electrically connected to an external power supply, a test socket is fixedly installed on the upper surface of the socket board, and a plurality of test sockets are opened on the upper surface of the test socket for installation The mounting groove of the semiconductor element, the semiconductor element is electrically connected with the socket board through the test socket.

Further, a vertical groove is formed on the outer peripheral surface of the ventilation pipe, and the outer peripheral surface of the ventilation pipe is matched with the inner peripheral surface of the external spline.

Further, a plurality of vertical rods are vertically fixed between the first support base and the second support base, the vertical rods penetrate the upper and lower surfaces of the connecting block, and the vertical rods are slidably matched with the connecting block.

Further, two sliding rails are fixedly installed on one side of the beam, and two sliding blocks are fixedly installed on both ends of one side surface of the moving plate, and the moving plate is slidably connected to the beam through the sliding block and the sliding rail. .

Further, several indicator lights are provided on the upper surface of the test socket, and the indicator lights are used to judge whether the semiconductor element is energized. It is distributed in an equidistant linear array on the upper surface of the test socket.

Further, two sliding rails are vertically fixed on one side of the lifting arm, and two sets of sliding blocks are fixedly installed on one side of the moving plate, and the two sets of sliding blocks are respectively slidably connected with the two sliding rails, and each set of sliding blocks is slidably connected to the two sliding rails. The number of blocks is two.

Further, a control switch is fixedly installed on the upper surface of the base.

Further, the working steps of the semiconductor component sorting and testing integrated machine are:

Step 1. Start the first motor, the first motor drives the gear to rotate, and drives the moving plate to move, so that the grasping mechanism moves to the top of the semiconductor element, sucks the semiconductor element through the suction nozzle, and drives the semiconductor element to move to the test through the first motor. Above the socket, start the fourth motor, the fourth motor drives the second pulley to rotate, and drives the second belt to rotate, and drives the suction nozzle and the semiconductor element to rotate to adjust the angle of the semiconductor element;

Step 2, start the second motor, the second motor drives the transmission wheel to rotate, and pulls the lifting arm down through the transmission belt, starts the third motor, the third motor drives the pulley to rotate, and drives the belt to rotate, and drives the ventilation pipe to descend, The breather pipe drives the suction nozzle down, so that each semiconductor element enters the corresponding installation groove, and the suction nozzle loosens the semiconductor element;

Step 3: Turn on the control switch, energize the test socket, and the current passes through the semiconductor element. When the semiconductor element can be energized, the indicator light is on, and the product is qualified. When the semiconductor element cannot be energized, the indicator light is off and the product is unqualified.

Beneficial effects of the present invention:

In the present invention, a plurality of suction nozzles are arranged on the grabbing mechanism, and a plurality of semiconductor elements can be transported at a time. By opening a plurality of mounting slots on the test socket to place the semiconductor elements, the present invention can test a plurality of semiconductor elements at a time. The work efficiency is high, the present invention drives the second pulley to rotate through the fourth motor, and drives the second belt to rotate, and drives the suction nozzle and the semiconductor element to rotate, so as to adjust the angle of the semiconductor element, so that the semiconductor element can be accurately placed in the installation slot. , to ensure the smooth progress of the test, the installation speed of semiconductor components is fast, and the work efficiency is effectively improved.

Description of drawings

In order to facilitate the understanding of those skilled in the art, the present invention will be further described below with reference to the accompanying drawings.

1 is a three-dimensional structural diagram of an integrated machine for sorting and testing semiconductor components according to the present invention;

Fig. 2 is the three-dimensional structure diagram of the grasping mechanism of the present invention;

Fig. 3 is the three-dimensional structure diagram of another angle of the grasping mechanism of the present invention;

FIG. 4 is an assembly diagram of the socket board and the test socket of the present invention.

In the figure: 1. Base; 2. Supporting frame; 3. Beam; 4. Lifting arm; 5. Grabbing mechanism; 6. Moving plate; 7. First motor; 8. Rack; 9. Second motor; 10 , transmission wheel; 11, fixed plate; 12, transmission belt; 13, roller; 14, gear; 15, socket board; 16, test socket; 17, installation slot; 18, indicator light; 19, installation plate; 20, Support seat one; 21, ventilation pipe; 22, external spline; 23, suction nozzle; 24, pulley one; 25, belt one; 26, fourth motor; 27, pulley two; 28, belt two; 29, support seat Two; 30, connecting block; 31, longitudinal rod; 32, the third motor; 33, control switch.

Detailed ways

The technical solutions of the present invention will be clearly and completely described below with reference to the embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

As shown in Figures 1-4, an integrated machine for sorting and testing semiconductor components includes a base 1, a support frame 2 is fixedly installed on the upper surface of the base 1, and a beam 3 is fixedly installed on the top of the support frame 2 by bolts , one side of the beam 3 is movably installed with a moving plate 6, one side of the moving plate 6 is movably installed with a lifting arm 4 along the vertical direction, and the bottom end of the lifting arm 4 is fixedly installed with a grabbing mechanism 5;

A first motor 7 is fixedly installed on one side of the moving plate 6 , a gear 14 is fixedly installed on the output shaft end of the first motor 7 , a rack 8 is fixedly installed on one side surface of the beam 3 , and the gear 14 is engaged with the rack 8, one side of the beam 3 is provided with a transmission belt 12, the upper and lower ends of the transmission belt 12 are respectively fixedly connected to the lifting arm 4 through the fixed plate 11, and one side of the moving plate 6 A second motor 9 is fixedly installed, the output shaft end of the second motor 9 is fixedly installed with a transmission wheel 10, the transmission wheel 10 is matched with the inner side of the transmission belt 12, and one side of the moving plate 6 is rotatably installed with Two rotating rollers 13, the two rotating rollers 13 are respectively located above and below the transmission wheel 10, and the rotating rollers 13 are closely matched with the outer surface of the transmission belt 12;

The grabbing mechanism 5 includes a mounting plate 19, one side of the mounting plate 19 is fixedly mounted with a support seat 1 20, and a plurality of external splines 22 are rotatably mounted on the support seat one 20, and the external splines 22 The inner side of the mounting plate 19 is movably installed with a ventilation pipe 21 along the vertical direction, the bottom of the ventilation pipe 21 is fixedly installed with a suction nozzle 23, one side of the mounting plate 19 is fixedly installed with a support seat 29, and the ventilation pipe 21 penetrates through the support The second seat 29, the ventilation pipe 21 and the supporting seat 29 are slidably matched, one side of the mounting plate 19 is rotatably installed with several groups of pulleys 1 24, and the number of the first pulleys 24 in each group is two, and the two The first pulley 24 is distributed up and down, and the two pulleys 1 24 are connected by the belt 1 25. A number of third motors 32 are fixedly installed on the other side of the mounting plate 19. The third motor The output shaft end of 32 is fixedly connected with one of the pulleys one 24 of each group, a connecting block 30 is rotatably installed on the ventilation pipe 21, and one side of the belt one 25 is fixedly connected with the connecting block 30;

A plurality of fourth motors 26 are fixedly installed on the upper surface of the first support seat 20 , the second pulley 27 is fixedly installed on the output shaft end of the fourth motor 26 and the outer spline 22 , and two second pulleys 27 are fixedly installed. They are connected by belt two 28 transmission;

A socket board 15 is fixedly installed on the upper surface of the base 1, and the socket board 15 is electrically connected to an external power supply. A test socket 16 is fixedly installed on the upper surface of the socket board 15, and the upper surface of the test socket 16 is provided with There are several mounting slots 17 for mounting semiconductor components, and the semiconductor components are electrically connected to the socket board 15 through the test socket 16 .

A vertical groove is formed on the outer peripheral surface of the ventilation pipe 21 , and the outer peripheral surface of the ventilation pipe 21 is matched with the inner peripheral surface of the external spline 22 .

A plurality of vertical rods 31 are vertically fixed between the first support base 20 and the second support base 29 .

One side of the beam 3 is fixedly installed with two slide rails, and both ends of one side surface of the moving plate 6 are fixedly installed with two sliders, and the moving plate 6 slides with the beam 3 through the sliders, the slide rails connect.

The upper surface of the test socket 16 is provided with a plurality of indicator lights 18. The indicator lights 18 are used to judge whether the semiconductor element is powered on. The indicator lights 18 are distributed in an equidistant linear array on the upper surface of the test socket 16 .

One side of the lifting arm 4 is vertically fixed with two sliding rails, and one side of the moving plate 6 is fixedly installed with two sets of sliding blocks, and the two sets of sliding blocks are respectively slidably connected with the two sliding rails. The number is two.

A control switch 33 is fixedly mounted on the upper surface of the base 1 .

The top of the vent pipe 21 is connected to an external vacuum generator.

The working steps of the semiconductor component sorting and testing integrated machine are:

Step 1. Start the first motor 7, the first motor 7 drives the gear 14 to rotate, and drives the moving plate 6 to move, so that the grabbing mechanism 5 moves to the top of the semiconductor element, sucks the semiconductor element through the suction nozzle 23, and passes the first motor. 7. Drive the semiconductor element to move above the test socket 16, start the fourth motor 26, the fourth motor 26 drives the second pulley 27 to rotate, and drives the second belt 28 to rotate, and drives the suction nozzle 23 and the semiconductor element to rotate to adjust the angle of the semiconductor element ;

Step 2, start the second motor 9, the second motor 9 drives the transmission wheel 10 to rotate, and pulls the lifting arm 4 down through the transmission belt 12, starts the third motor 32, and the third motor 32 drives the pulley 1 to rotate, and drives the belt 1. 25 rotates, and drives the ventilation pipe 21 to descend, the ventilation pipe 21 drives the suction nozzle 23 to descend, so that each semiconductor element enters the corresponding mounting groove 17, and the suction nozzle 23 releases the semiconductor element;

Step 3. Turn on the control switch 33, the test socket 16 is energized, and the current passes through the semiconductor element. When the semiconductor element can be energized, the indicator light 18 is on, and the product is qualified; .

In the present invention, by setting a plurality of suction nozzles 23 on the grabbing mechanism 5, a plurality of semiconductor components can be transported at a time, and by opening a plurality of mounting slots 17 on the test socket 16 to place the semiconductor components, the present invention can handle a plurality of semiconductor components at a time. The component is tested, and the work efficiency is high. The present invention drives the second pulley 27 to rotate through the fourth motor 26, and drives the second belt 28 to rotate, and drives the suction nozzle 23 and the semiconductor component to rotate, so as to adjust the angle of the semiconductor component. The components are accurately placed into the mounting slot 17, which ensures the smooth progress of the test, and the mounting speed of the semiconductor components is fast, which effectively improves the work efficiency.

The above-disclosed preferred embodiments of the present invention are provided only to help illustrate the present invention. The preferred embodiments do not exhaust all the details, nor do they limit the invention to only the described embodiments. Obviously, many modifications and variations are possible in light of the content of this specification. The present specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can well understand and utilize the present invention. The present invention is to be limited only by the claims and their full scope and equivalents.

Claims (8)

1. An all-in-one machine for sorting and testing semiconductor components, characterized in that it comprises a base (1), a support frame (2) is fixedly installed on the upper surface of the base (1), and the top of the support frame (2) passes through A beam (3) is fixedly installed with bolts, a moving plate (6) is movably installed on one side of the beam (3), and a lifting arm (4) is movably installed on one side of the moving plate (6) along the vertical direction, A grabbing mechanism (5) is fixedly installed at the bottom end of the lift arm (4); A first motor (7) is fixedly installed on one side of the moving plate (6), a gear (14) is fixedly installed on the output shaft end of the first motor (7), and a surface of one side of the beam (3) is fixedly installed. A rack (8) is fixedly installed, the gear (14) is engaged with the rack (8), a transmission belt (12) is arranged on one side of the beam (3), and the upper part of the transmission belt (12) is The lower ends are respectively fixedly connected with the lifting arm (4) through the fixed plate (11), one side of the moving plate (6) is fixedly installed with a second motor (9), and the output shaft end of the second motor (9) A transmission wheel (10) is fixedly installed, the transmission wheel (10) is matched with the inner side of the transmission belt (12), and one side of the moving plate (6) is rotatably installed with two rotating rollers (13), two The rotating rollers (13) are respectively located above and below the transmission wheel (10), and the rotating rollers (13) are closely matched with the outer surface of the transmission belt (12); The grabbing mechanism (5) includes a mounting plate (19), a support seat one (20) is fixedly mounted on one side of the mounting plate (19), and a plurality of outer supports are rotatably mounted on the support seat one (20). Splines (22), the inner side of the outer splines (22) is movably installed with a ventilation pipe (21) along the vertical direction, and a suction nozzle (23) is fixedly installed at the bottom of the ventilation pipe (21). One side of the plate (19) is fixedly installed with a second support seat (29), the ventilation pipe (21) penetrates through the second support seat (29), and the ventilation pipe (21) is slidably matched with the second support seat (29), so One side of the mounting plate (19) is rotatably installed with several groups of pulley one (24), the number of each group of the pulley one (24) is two, and the two pulley one (24) are distributed up and down, The two first pulleys (24) are connected by a belt one (25), and the other side of the mounting plate (19) is fixedly installed with a plurality of third motors (32). The third motors (32) ) of the output shaft end is fixedly connected with one of the pulleys (24) of each group, a connecting block (30) is rotatably installed on the ventilation pipe (21), and one side of the belt one (25) is connected to the connecting block (21). 30) Fixed connection; Several fourth motors (26) are fixedly installed on the upper surface of the first support seat (20), and the second pulley (2) is fixedly installed on the output shaft end of the fourth motor (26) and the external splines (22). 27), the two belt pulleys (27) are connected by transmission through the belt two (28); A socket board (15) is fixedly installed on the upper surface of the base (1), the socket board (15) is electrically connected with an external power supply, and a test socket (16) is fixedly installed on the upper surface of the socket board (15). The upper surface of the test socket (16) is provided with a plurality of mounting grooves (17) for mounting semiconductor components, and the semiconductor components are electrically connected to the socket board (15) through the test socket (16). 2 . The all-in-one machine for sorting and testing semiconductor components according to claim 1 , wherein a vertical groove is formed on the outer peripheral surface of the ventilation pipe ( 21 ), and the outer peripheral surface of the ventilation pipe ( 21 ) and The inner peripheral surfaces of the external splines (22) are matched with each other. 3. The all-in-one machine for sorting and testing semiconductor components according to claim 1, wherein a plurality of vertical rods (31) are vertically fixed between the first support seat (20) and the second support seat (29). The longitudinal rod (31) penetrates through the upper and lower surfaces of the connecting block (30), and the longitudinal rod (31) is slidably matched with the connecting block (30). 4. The all-in-one machine for sorting and testing semiconductor components according to claim 1, wherein two sliding rails are fixedly installed on one side of the beam (3), and one side surface of the moving plate (6) is Two sliding blocks are fixedly installed on both ends of the moving plate (6), and the moving plate (6) is slidably connected with the beam (3) through the sliding block and the sliding rail. 5. The all-in-one machine for sorting and testing semiconductor components according to claim 1, wherein a plurality of indicator lights (18) are provided on the upper surface of the test socket (16), and the indicator lights (18) For judging whether the semiconductor element is energized, a plurality of the indicator lights (18) are in one-to-one correspondence with a plurality of installation slots (17), and the plurality of indicator lights (18) are equidistantly spaced on the upper surface of the test socket (16). Linear array distribution. 6 . The all-in-one machine for sorting and testing semiconductor components according to claim 1 , wherein two slide rails are vertically fixed on one side of the lifting arm ( 4 ), and two slide rails are vertically fixed on one side of the lifting arm ( 6 ). 7 . Two sets of sliding blocks are fixedly installed on one side, the two sets of sliding blocks are respectively slidably connected with the two sliding rails, and the number of each set of sliding blocks is two. 7 . The integrated machine for sorting and testing semiconductor components according to claim 1 , wherein a control switch ( 33 ) is fixedly installed on the upper surface of the base ( 1 ). 8 . 8. The all-in-one machine for sorting and testing semiconductor components according to claim 1, wherein the working steps of the all-in-one machine for sorting and testing semiconductor components are: Step 1. Start the first motor (7), the first motor (7) drives the gear (14) to rotate, and drives the moving plate (6) to move, so that the grab mechanism (5) moves to the top of the semiconductor element, through the suction nozzle (23) Suck the semiconductor element, drive the semiconductor element to move above the test socket (16) through the first motor (7), start the fourth motor (26), and the fourth motor (26) drives the second pulley (27) to rotate, And drive the second belt (28) to rotate, and drive the suction nozzle (23) and the semiconductor element to rotate, and adjust the angle of the semiconductor element; Step 2, start the second motor (9), the second motor (9) drives the transmission wheel (10) to rotate, and pulls the lifting arm (4) down through the transmission belt (12), starts the third motor (32), the third The motor (32) drives the pulley one (24) to rotate, and drives the belt one (25) to rotate, and drives the ventilation pipe (21) to descend, and the ventilation pipe (21) drives the suction nozzle (23) to descend, so that each semiconductor element enters the corresponding In the mounting groove (17) of the device, the suction nozzle (23) loosens the semiconductor element; Step 3. Turn on the control switch (33), the test socket (16) is energized, and the current passes through the semiconductor element. When the semiconductor element can be energized, the indicator light (18) is on, and the product is qualified. When the semiconductor element cannot be energized, the indicator light (18) ) is extinguished and the product is unqualified.

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