TWI468916B - Testing apparatus - Google Patents

Testing apparatus Download PDF

Info

Publication number
TWI468916B
TWI468916B TW99147175A TW99147175A TWI468916B TW I468916 B TWI468916 B TW I468916B TW 99147175 A TW99147175 A TW 99147175A TW 99147175 A TW99147175 A TW 99147175A TW I468916 B TWI468916 B TW I468916B
Authority
TW
Taiwan
Prior art keywords
test
power supply
output
input
joint
Prior art date
Application number
TW99147175A
Other languages
Chinese (zh)
Other versions
TW201227256A (en
Inventor
Hui Li
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW99147175A priority Critical patent/TWI468916B/en
Publication of TW201227256A publication Critical patent/TW201227256A/en
Application granted granted Critical
Publication of TWI468916B publication Critical patent/TWI468916B/en

Links

Description

Test device

The present invention relates to a test apparatus, and more particularly to a test apparatus for testing various electrical parameters of a power supply in a computer system.

The power source is the heart of the computer mainframe, which converts the utility power into direct current to provide energy for the stable operation of the computer. The power output includes ±12V, +5V, +3.3V and other voltages for CPU, hard disk, CD player, etc.

Taking +12V as an example, it supplies power to the spindle motor and seek motor of the hard disk, the optical disk drive, and provides operating voltage for the expansion slot. When the voltage output of +12V is abnormal, it often causes unstable reading performance of the hard disk and the optical disk drive. When the voltage is low, the speed of the CD player is low, the logical bad sectors of the hard disk increase, the system is easy to crash, and it cannot be used normally. When the voltage is too high, the speed of the CD player is too high, and it is prone to runaway. Phenomenon, hard disk performance is stalled, flying. Therefore, measuring the electrical parameters of the power supply in the computer system becomes very important.

After the power is connected to the computer mainframe, the measurement is generally performed by a multimeter when measuring the output. However, since the power supply and the host are connected by means of a joint, measurement is difficult. Especially when measuring the ripple (ripple) and noise of the output voltage, there is no space to set the filter capacitor, which affects the test accuracy.

Generally, external filter capacitors can accurately test the voltage, which is not only time-consuming, but also It is easy to smash the power supply and components on the motherboard.

In view of this, it is necessary to provide a test device that can easily test the output of the power supply.

A testing device for connecting a power supply and a computer motherboard to test electrical parameters of the power supply in a computer system, the power supply for supplying power to a computer, the power supply comprising an input end and an output end, The input end is connected to an external power source, the output end of the power supply has a plurality of output voltages, and the testing device includes an input end, an output end, and a complex array test interface connecting the input end and the output end, the test An input end of the device is connected to an output end of the power supply, an output end of the test device is connected to the computer, and each set of the complex array test interface corresponds to an output voltage of the power supply To test the electrical parameters of the output voltage.

Compared with the prior art, the testing device of the embodiment of the present invention has a connector and peripheral electronic components that need to be tested on the test device, thereby facilitating testing of various electrical parameters output by the power supply.

10‧‧‧Computer motherboard

11‧‧‧ boards

12‧‧‧Central processor

13‧‧‧ North Bridge

14‧‧‧Electronic components

15‧‧‧Power interface

20‧‧‧Testing device

21‧‧‧ boards

22‧‧‧ input

23‧‧‧ Output

24‧‧‧Wire

25‧‧‧Test interface

211‧‧‧ first joint

212‧‧‧Second joint

213‧‧‧ third joint

214‧‧‧fourth joint

30‧‧‧Power supply

1 is a schematic diagram showing the connection of a test device, a power supply, and a computer motherboard according to an embodiment of the present invention.

The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

Referring to FIG. 1 , a test apparatus 20 provided by an embodiment of the present invention is used to connect a power supply 30 and a computer motherboard 10 to test parameters of various output voltages of the power supply 30 .

The computer motherboard 10 includes a circuit board 11 and a central processing unit (CPU) 12, a north bridge (NB, North Bridge) 13, an electronic component 14, and a power supply interface 15 disposed on the circuit board 11. The electronic component 14 includes resistors, capacitors, and other wafers that assist the central processor 12 and the north bridge 13 in implementing the functions of the computer motherboard 10.

The power interface 15 is used to connect the power supply 30 to provide power to the computer motherboard 10.

The power interface 15 on the computer motherboard 10 includes different standard interfaces such as 24-pin and 4-pin. Different interfaces have different voltage output values.

In this embodiment, a 24-pin power interface 15 is taken as an example. In addition, the 24-pin power interface 15 has a plurality of voltage input ports for providing +12V, +3.3V, and + to the computer motherboard 10. 5V, -12V and +5Vstand by a total of 5 voltage values. The power supply 30 is used to convert an external power supply (generally a commercial power) into a voltage required by the computer motherboard 10, and an input terminal for connecting an external power supply, and an output terminal corresponding to the power supply interface 15 of the computer motherboard 10 having 24 pins, 4 pins, etc. Various specifications.

The test device 20 includes a circuit board 21, an input terminal 22, an output terminal 23, a test interface 25 and a wire 24, and the input terminal 22 and the output terminal 23 are connected to the test interface 25 by wires 24. The input terminal 22 is used to connect to the output end of the power supply 30, and the output terminal 23 is connected to the power supply interface 15 to input the output of the power supply 30 to the central processing unit 12, the north bridge 13, and the electronic component 14 to make it normal. jobs.

The test interface 25 includes respective first joints 211, second joints 212, third joints 213, and fourth joints 214. Since the power interface 15 has five voltage values, the number of the first connector 211, the second connector 212, the third connector 213, and the fourth connector 214 is five, that is, a total of five first devices are provided on the test interface 25. Joint 211, 5 second joints 212, 5 third joints 213 and 5 fourth joints 214, in short, a group of first The connector 211, the second connector 212, the third connector 213, and the fourth connector 214 correspond to a voltage output value of the power supply 30 and are electrically coupled to the respective voltage output terminals via the input terminal 22.

Of course, the first joint 211, the second joint 212, the third joint 213, and the fourth joint 214 of the joint can be modified correspondingly according to the power interface 15 to be tested; or the joint can be added or removed according to the project to be tested.

The first connector 213 is used to test the voltage, and the second connector 212 is used to set a filter capacitor (typically 0.1 uF and 10 uF in parallel) when measuring voltage ripple and noise, and the third connector 213 is used to test the voltage pattern. The wave and noise, the fourth connector 214 can be used to measure the power consumed by the motherboard by using a precision resistor to access the multimeter.

The first joint 211, the second joint 212, the third joint 213, and the fourth joint 214 may also be extended by a patch cord to be suitable for long-distance testing.

The testing device 20 has a test interface on which the power supply 30 is required to be tested, and can be tested by a multimeter or an oscilloscope, thereby facilitating testing of various electrical parameters of the power supply output.

In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

10‧‧‧Computer motherboard

11‧‧‧ boards

12‧‧‧Central processor

13‧‧‧ North Bridge

14‧‧‧Electronic components

15‧‧‧Power interface

20‧‧‧Testing device

21‧‧‧ boards

22‧‧‧ input

23‧‧‧ Output

24‧‧‧Wire

25‧‧‧Test interface

211‧‧‧ first joint

212‧‧‧Second joint

213‧‧‧ third joint

214‧‧‧fourth joint

30‧‧‧Power supply

Claims (7)

  1. A testing device for connecting a power supply and a computer motherboard to test electrical parameters of the power supply in a computer system, the power supply for supplying power to a computer, the power supply comprising an input end and an output end, The input end is connected to an external power source, and the output end of the power supply has a plurality of output voltages. The improvement is that the testing device includes an input end, an output end, and a complex array test interface connecting the input end and the output end. The input end of the test device is connected to the output end of the power supply, the output end of the test device is connected to the computer, and each set of the complex array test interface and one of the power supply The output voltage corresponds to an electrical parameter for testing the output voltage; wherein each set of the joints includes a respective first, second, third, and fourth joint, the fourth joint being connected The resistor is used to test the current of the output voltage.
  2. The test device of claim 1, wherein the first connector is used to test an output voltage.
  3. The test device of claim 1, wherein the second connector is used to set a filter capacitor.
  4. The test apparatus of claim 3, wherein the filter capacitor comprises 0.1 uF and 10 uF in parallel.
  5. The test device of claim 1, wherein the third connector is used to test ripple and noise of the output voltage.
  6. The test apparatus of claim 3, wherein the test apparatus further comprises a circuit board, and the filter capacitor or resistor is disposed on the circuit board.
  7. The test apparatus of claim 1, wherein the test apparatus further comprises a circuit board, and the resistor is disposed on the circuit board.
TW99147175A 2010-12-31 2010-12-31 Testing apparatus TWI468916B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99147175A TWI468916B (en) 2010-12-31 2010-12-31 Testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99147175A TWI468916B (en) 2010-12-31 2010-12-31 Testing apparatus

Publications (2)

Publication Number Publication Date
TW201227256A TW201227256A (en) 2012-07-01
TWI468916B true TWI468916B (en) 2015-01-11

Family

ID=46933156

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99147175A TWI468916B (en) 2010-12-31 2010-12-31 Testing apparatus

Country Status (1)

Country Link
TW (1) TWI468916B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040085059A1 (en) * 2002-10-31 2004-05-06 Smith Edward E. Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment
TW200823479A (en) * 2006-11-27 2008-06-01 Hon Hai Prec Ind Co Ltd Power voltage testing circuit
US7424633B2 (en) * 2005-06-24 2008-09-09 Hon Hai Precision Industry Co., Ltd. Method for estimating power consumption of a CPU

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040085059A1 (en) * 2002-10-31 2004-05-06 Smith Edward E. Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment
US7424633B2 (en) * 2005-06-24 2008-09-09 Hon Hai Precision Industry Co., Ltd. Method for estimating power consumption of a CPU
TW200823479A (en) * 2006-11-27 2008-06-01 Hon Hai Prec Ind Co Ltd Power voltage testing circuit

Also Published As

Publication number Publication date
TW201227256A (en) 2012-07-01

Similar Documents

Publication Publication Date Title
JP6526394B2 (en) High-speed tester communication interface between test slice and tray
US8753146B1 (en) Universal test connector for connecting a SATA or USB data storage device to a data storage device tester
TWI441399B (en) Overvoltage protection circuit, interfacing system for providing overvoltage protection and overvoltage protection method in a data bus interface
KR100396972B1 (en) Manufacturing testing of hot-plug circuits on a computer backplane
US9753445B1 (en) DUT continuity test with only digital IO structures apparatus and methods associated thereof
TW567329B (en) Auto system-level test apparatus and method
US7382148B2 (en) System and method for testing an LED and a connector thereof
JP2004199796A (en) Method for connecting probe pin for measuring characteristics of thin-film magnetic head and method for measuring characteristics of thin-film magnetic head
US9575519B2 (en) Storage expansion system
US8133061B1 (en) Removable and replaceable dual-sided connector pin interposer
US20060044005A1 (en) System of simulating resistive loads
US8239581B2 (en) Data storage device compatible with multiple interconnect standards
US20050146346A1 (en) Method and an apparatus for testing transmitter and receiver
US7433800B2 (en) System and method for measuring performance of a voltage regulator module attached to a microprocessor
US8443130B2 (en) USB port detecting circuit
CN101039562A (en) Multiple configuration stackable instrument modules
US20010037418A1 (en) Direct processor access via an external multi-purpose interface
US20080122477A1 (en) Voltage test circuit for computer power supply
US7490176B2 (en) Serial attached SCSI backplane and detection system thereof
US7015714B2 (en) Testing device for printed circuit boards
US20050015213A1 (en) Method and apparatus for testing an electronic device
US20140160664A1 (en) Serial advanced technology attachment dual in-line memory module device and motherboard for supporting the same
CN103198033A (en) Apparatus and method of identifying a USB or an MHL device
US8064205B2 (en) Storage devices including different sets of contacts
US8612792B2 (en) Power measurement device

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees