TWI468916B - Testing apparatus - Google Patents

Testing apparatus Download PDF

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Publication number
TWI468916B
TWI468916B TW99147175A TW99147175A TWI468916B TW I468916 B TWI468916 B TW I468916B TW 99147175 A TW99147175 A TW 99147175A TW 99147175 A TW99147175 A TW 99147175A TW I468916 B TWI468916 B TW I468916B
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test
power supply
output
joint
connector
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TW99147175A
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Chinese (zh)
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TW201227256A (en
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Hui Li
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Hon Hai Prec Ind Co Ltd
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Priority to TW99147175A priority Critical patent/TWI468916B/en
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Publication of TWI468916B publication Critical patent/TWI468916B/en

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  • Tests Of Electronic Circuits (AREA)

Description

測試裝置 Test device

本發明關於一種測試裝置,尤其涉及一種在電腦系統中測試電源供應器的各項電氣參數的測試裝置。 The present invention relates to a test apparatus, and more particularly to a test apparatus for testing various electrical parameters of a power supply in a computer system.

電源是電腦主機的心臟,其將市電轉換為直流電以為電腦的穩定工作遠遠不斷提供能量。電源輸出包括±12V、+5V、+3.3V等電壓供中央處理器、硬碟、光碟機等使用。 The power source is the heart of the computer mainframe, which converts the utility power into direct current to provide energy for the stable operation of the computer. The power output includes ±12V, +5V, +3.3V and other voltages for CPU, hard disk, CD player, etc.

以+12V為例,其為硬碟、光碟機的主軸電機和尋道電機提供電源及為擴展插槽提供工作電壓。+12V的電壓輸出不正常時,常會造成硬碟、光碟機的讀盤性能不穩定。電壓偏低時,表現為光碟機轉速較低、硬碟的邏輯壞道增加,系統容易死機,無法正常使用;電壓偏高時,光碟機轉速過高,容易出現失控現象,較易出現炸盤現象,硬碟表現為失速、飛轉。因此,測量電源在電腦系統中的電氣參數變得非常重要。 Taking +12V as an example, it supplies power to the spindle motor and seek motor of the hard disk, the optical disk drive, and provides operating voltage for the expansion slot. When the voltage output of +12V is abnormal, it often causes unstable reading performance of the hard disk and the optical disk drive. When the voltage is low, the speed of the CD player is low, the logical bad sectors of the hard disk increase, the system is easy to crash, and it cannot be used normally. When the voltage is too high, the speed of the CD player is too high, and it is prone to runaway. Phenomenon, hard disk performance is stalled, flying. Therefore, measuring the electrical parameters of the power supply in the computer system becomes very important.

在將電源接入電腦主機上後,測量其輸出時一般利用萬用表進行測量,但是,由於電源與主機是通過接頭的方式進行連接,所以,測量比較困難。尤其是在測量輸出電壓的紋波(ripple)和雜訊(noise)時,沒有空間設置濾波電容,影響測試準確度。 After the power is connected to the computer mainframe, the measurement is generally performed by a multimeter when measuring the output. However, since the power supply and the host are connected by means of a joint, measurement is difficult. Especially when measuring the ripple (ripple) and noise of the output voltage, there is no space to set the filter capacitor, which affects the test accuracy.

一般外接濾波電容實現準確測試電壓,此種方式不僅耗時,而且 容易順壞電源和主板上的元件。 Generally, external filter capacitors can accurately test the voltage, which is not only time-consuming, but also It is easy to smash the power supply and components on the motherboard.

有鑒於此,有必要提供一種可方便測試電源供應器輸出的測試裝置。 In view of this, it is necessary to provide a test device that can easily test the output of the power supply.

一種測試裝置,其在電腦系統中連接電源供應器和電腦主板以測試所述電源供應器的電氣參數,所述電源供應器用於給電腦提供電能,所述電源供應器包括輸入端和輸出端,所述輸入端與外部電源相連,所述電源供應器的輸出端具有複數個輸出電壓,所述測試裝置包括輸入端、輸出端和連接所述輸入端和輸出端的複數組測試介面,所述測試裝置的輸入端與所述電源供應器的輸出端相連接,所述測試裝置的輸出端與所述電腦相連,每一組所述複數組測試介面與所述電源供應器的一個輸出電壓相對應以測試所述輸出電壓的電氣參數。 A testing device for connecting a power supply and a computer motherboard to test electrical parameters of the power supply in a computer system, the power supply for supplying power to a computer, the power supply comprising an input end and an output end, The input end is connected to an external power source, the output end of the power supply has a plurality of output voltages, and the testing device includes an input end, an output end, and a complex array test interface connecting the input end and the output end, the test An input end of the device is connected to an output end of the power supply, an output end of the test device is connected to the computer, and each set of the complex array test interface corresponds to an output voltage of the power supply To test the electrical parameters of the output voltage.

相較於先前技術,本發明實施例的測試裝置在其上設置需要測試專案的接頭及外設電子元器件,從而方便測試電源供應器輸出的各項電氣參數。 Compared with the prior art, the testing device of the embodiment of the present invention has a connector and peripheral electronic components that need to be tested on the test device, thereby facilitating testing of various electrical parameters output by the power supply.

10‧‧‧電腦主板 10‧‧‧Computer motherboard

11‧‧‧電路板 11‧‧‧ boards

12‧‧‧中央處理器 12‧‧‧Central processor

13‧‧‧北橋 13‧‧‧ North Bridge

14‧‧‧電子元器件 14‧‧‧Electronic components

15‧‧‧電源介面 15‧‧‧Power interface

20‧‧‧測試裝置 20‧‧‧Testing device

21‧‧‧電路板 21‧‧‧ boards

22‧‧‧輸入端 22‧‧‧ input

23‧‧‧輸出端 23‧‧‧ Output

24‧‧‧導線 24‧‧‧Wire

25‧‧‧測試介面 25‧‧‧Test interface

211‧‧‧第一接頭 211‧‧‧ first joint

212‧‧‧第二接頭 212‧‧‧Second joint

213‧‧‧第三接頭 213‧‧‧ third joint

214‧‧‧第四接頭 214‧‧‧fourth joint

30‧‧‧電源供應器 30‧‧‧Power supply

圖1是本發明實施例測試裝置、電源供應器與電腦主板的連接示意圖。 1 is a schematic diagram showing the connection of a test device, a power supply, and a computer motherboard according to an embodiment of the present invention.

下面將結合附圖對本發明實施例作進一步詳細說明。 The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

請參閱圖1,本發明實施例提供的測試裝置20用來連接電源供應器30和電腦主板10以測試電源供應器30各項輸出電壓的參數。 Referring to FIG. 1 , a test apparatus 20 provided by an embodiment of the present invention is used to connect a power supply 30 and a computer motherboard 10 to test parameters of various output voltages of the power supply 30 .

電腦主板10包括電路板11以及設置在電路板11上的中央處理器(簡稱CPU)12、北橋(NB,North Bridge)13、電子元器件14和電源介面15。電子元器件14包括電阻、電容和其他協助中央處理器12、北橋13實現電腦主板10功能的晶片。 The computer motherboard 10 includes a circuit board 11 and a central processing unit (CPU) 12, a north bridge (NB, North Bridge) 13, an electronic component 14, and a power supply interface 15 disposed on the circuit board 11. The electronic component 14 includes resistors, capacitors, and other wafers that assist the central processor 12 and the north bridge 13 in implementing the functions of the computer motherboard 10.

電源介面15用來連接電源供應器30以提供電能給電腦主板10。 The power interface 15 is used to connect the power supply 30 to provide power to the computer motherboard 10.

電腦主板10上的電源介面15包括24針、4針等不同標準的介面,不同的介面具有不同的電壓輸出值。 The power interface 15 on the computer motherboard 10 includes different standard interfaces such as 24-pin and 4-pin. Different interfaces have different voltage output values.

本實施例以24針的電源介面15為例進行說明,另外,24針的電源介面15具有多個電壓輸入口,該多個電壓輸入口用來向電腦主板10提供+12V、+3.3V、+5V、-12V和+5Vstand by共5個電壓值。電源供應器30用來將外部電源(一般為市電)轉換為電腦主板10所需要的電壓,其輸入端用來連接外部電源,輸出端對應電腦主板10的電源介面15具有24針、4針等各種規格。 In this embodiment, a 24-pin power interface 15 is taken as an example. In addition, the 24-pin power interface 15 has a plurality of voltage input ports for providing +12V, +3.3V, and + to the computer motherboard 10. 5V, -12V and +5Vstand by a total of 5 voltage values. The power supply 30 is used to convert an external power supply (generally a commercial power) into a voltage required by the computer motherboard 10, and an input terminal for connecting an external power supply, and an output terminal corresponding to the power supply interface 15 of the computer motherboard 10 having 24 pins, 4 pins, etc. Various specifications.

測試裝置20包括電路板21、輸入端22、輸出端23、測試介面25和導線24,輸入端22和輸出端23通過導線24連接測試介面25。其中,輸入端22用來連接電源供應器30的輸出端,輸出端23與電源介面15相連接以將電源供應器30的輸出輸入給中央處理器12、北橋13和電子元器件14使其正常工作。 The test device 20 includes a circuit board 21, an input terminal 22, an output terminal 23, a test interface 25 and a wire 24, and the input terminal 22 and the output terminal 23 are connected to the test interface 25 by wires 24. The input terminal 22 is used to connect to the output end of the power supply 30, and the output terminal 23 is connected to the power supply interface 15 to input the output of the power supply 30 to the central processing unit 12, the north bridge 13, and the electronic component 14 to make it normal. jobs.

測試介面25上包括各自獨立的第一接頭211、第二接頭212、第三接頭213和第四接頭214。由於電源介面15具有5個電壓值,所以,第一接頭211、第二接頭212、第三接頭213和第四接頭214的個數均為5個,即測試介面25上共設置5個第一接頭211、5個第二接頭212、5個第三接頭213和5個第四接頭214,簡言之,一組第一 接頭211、第二接頭212、第三接頭213和第四接頭214對應電源供應器30的一個電壓輸出值且通過輸入端22與相應電壓輸出端電連接。 The test interface 25 includes respective first joints 211, second joints 212, third joints 213, and fourth joints 214. Since the power interface 15 has five voltage values, the number of the first connector 211, the second connector 212, the third connector 213, and the fourth connector 214 is five, that is, a total of five first devices are provided on the test interface 25. Joint 211, 5 second joints 212, 5 third joints 213 and 5 fourth joints 214, in short, a group of first The connector 211, the second connector 212, the third connector 213, and the fourth connector 214 correspond to a voltage output value of the power supply 30 and are electrically coupled to the respective voltage output terminals via the input terminal 22.

當然,可以根據需要測試的電源介面15相應修改接頭的第一接頭211、第二接頭212、第三接頭213和第四接頭214;或者根據需要測試的專案增加或減少接頭。 Of course, the first joint 211, the second joint 212, the third joint 213, and the fourth joint 214 of the joint can be modified correspondingly according to the power interface 15 to be tested; or the joint can be added or removed according to the project to be tested.

第一接頭213用來測試電壓、第二接頭212用於在測量電壓的紋波和雜訊時設置濾波電容(一般為並聯的0.1uF和10uF)、第三接頭213用來測試電壓的紋波和雜訊、第四接頭214通過接入精密電阻可用多用表來測量主板消耗的功率。 The first connector 213 is used to test the voltage, and the second connector 212 is used to set a filter capacitor (typically 0.1 uF and 10 uF in parallel) when measuring voltage ripple and noise, and the third connector 213 is used to test the voltage pattern. The wave and noise, the fourth connector 214 can be used to measure the power consumed by the motherboard by using a precision resistor to access the multimeter.

也可以通過轉接線將第一接頭211、第二接頭212、第三接頭213和第四接頭214延長從而可適合遠距離測試。 The first joint 211, the second joint 212, the third joint 213, and the fourth joint 214 may also be extended by a patch cord to be suitable for long-distance testing.

測試裝置20在其上設置電源供應器30需要測試專案的測試介面,可以利用萬用表或者示波器進行測試,從而方便測試電源供應器輸出的各項電氣參數。 The testing device 20 has a test interface on which the power supply 30 is required to be tested, and can be tested by a multimeter or an oscilloscope, thereby facilitating testing of various electrical parameters of the power supply output.

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

10‧‧‧電腦主板 10‧‧‧Computer motherboard

11‧‧‧電路板 11‧‧‧ boards

12‧‧‧中央處理器 12‧‧‧Central processor

13‧‧‧北橋 13‧‧‧ North Bridge

14‧‧‧電子元器件 14‧‧‧Electronic components

15‧‧‧電源介面 15‧‧‧Power interface

20‧‧‧測試裝置 20‧‧‧Testing device

21‧‧‧電路板 21‧‧‧ boards

22‧‧‧輸入端 22‧‧‧ input

23‧‧‧輸出端 23‧‧‧ Output

24‧‧‧導線 24‧‧‧Wire

25‧‧‧測試介面 25‧‧‧Test interface

211‧‧‧第一接頭 211‧‧‧ first joint

212‧‧‧第二接頭 212‧‧‧Second joint

213‧‧‧第三接頭 213‧‧‧ third joint

214‧‧‧第四接頭 214‧‧‧fourth joint

30‧‧‧電源供應器 30‧‧‧Power supply

Claims (7)

一種測試裝置,其在電腦系統中連接電源供應器和電腦主板以測試所述電源供應器的電氣參數,所述電源供應器用於給電腦提供電能,所述電源供應器包括輸入端和輸出端,所述輸入端與外部電源相連,所述電源供應器的輸出端具有複數個輸出電壓,其改良在於,所述測試裝置包括輸入端、輸出端和連接所述輸入端和輸出端的複數組測試介面,所述測試裝置的輸入端與所述電源供應器的輸出端相連接,所述測試裝置的輸出端與所述電腦相連,每一組所述複數組測試介面與所述電源供應器的一個輸出電壓相對應以測試所述輸出電壓的電氣參數;其中,每一組所述接頭均包括各自獨立的第一接頭、第二接頭、第三接頭和第四接頭,所述第四接頭通過連接電阻用來測試輸出電壓的電流。 A testing device for connecting a power supply and a computer motherboard to test electrical parameters of the power supply in a computer system, the power supply for supplying power to a computer, the power supply comprising an input end and an output end, The input end is connected to an external power source, and the output end of the power supply has a plurality of output voltages. The improvement is that the testing device includes an input end, an output end, and a complex array test interface connecting the input end and the output end. The input end of the test device is connected to the output end of the power supply, the output end of the test device is connected to the computer, and each set of the complex array test interface and one of the power supply The output voltage corresponds to an electrical parameter for testing the output voltage; wherein each set of the joints includes a respective first, second, third, and fourth joint, the fourth joint being connected The resistor is used to test the current of the output voltage. 如申請專利範圍第1項所述之測試裝置,其中,所述第一接頭用來測試輸出電壓。 The test device of claim 1, wherein the first connector is used to test an output voltage. 如申請專利範圍第1項所述之測試裝置,其中,所述第二接頭用來設置濾波電容。 The test device of claim 1, wherein the second connector is used to set a filter capacitor. 如申請專利範圍第3項所述之測試裝置,其中,所述濾波電容包括並聯的0.1uF和10uFThe test apparatus of claim 3, wherein the filter capacitor comprises 0.1 uF and 10 uF in parallel. 如申請專利範圍第1項所述之測試裝置,其中,所述第三接頭用來測試輸出電壓的紋波和雜訊。 The test device of claim 1, wherein the third connector is used to test ripple and noise of the output voltage. 如申請專利範圍第3項所述之測試裝置,其中,所述測試裝置進一步包括一個電路板,所述濾波電容或電阻設置在所述電路板上。 The test apparatus of claim 3, wherein the test apparatus further comprises a circuit board, and the filter capacitor or resistor is disposed on the circuit board. 如申請專利範圍第1項所述之測試裝置,其中,所述測試裝置進一步包括一個電路板,所述電阻設置在所述電路板上。 The test apparatus of claim 1, wherein the test apparatus further comprises a circuit board, and the resistor is disposed on the circuit board.
TW99147175A 2010-12-31 2010-12-31 Testing apparatus TWI468916B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040085059A1 (en) * 2002-10-31 2004-05-06 Smith Edward E. Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment
TW200823479A (en) * 2006-11-27 2008-06-01 Hon Hai Prec Ind Co Ltd Power voltage testing circuit
US7424633B2 (en) * 2005-06-24 2008-09-09 Hon Hai Precision Industry Co., Ltd. Method for estimating power consumption of a CPU

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040085059A1 (en) * 2002-10-31 2004-05-06 Smith Edward E. Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment
US7424633B2 (en) * 2005-06-24 2008-09-09 Hon Hai Precision Industry Co., Ltd. Method for estimating power consumption of a CPU
TW200823479A (en) * 2006-11-27 2008-06-01 Hon Hai Prec Ind Co Ltd Power voltage testing circuit

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