TWI456182B - 檢測太陽能面板之裝置及方法 - Google Patents

檢測太陽能面板之裝置及方法 Download PDF

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Publication number
TWI456182B
TWI456182B TW100125233A TW100125233A TWI456182B TW I456182 B TWI456182 B TW I456182B TW 100125233 A TW100125233 A TW 100125233A TW 100125233 A TW100125233 A TW 100125233A TW I456182 B TWI456182 B TW I456182B
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TW
Taiwan
Prior art keywords
solar panel
detecting device
disposed
sensor
vibration
Prior art date
Application number
TW100125233A
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English (en)
Other versions
TW201303281A (zh
Inventor
Kun Ta Lee
Original Assignee
Kun Ta Lee
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kun Ta Lee filed Critical Kun Ta Lee
Priority to TW100125233A priority Critical patent/TWI456182B/zh
Priority to US13/246,912 priority patent/US20130014557A1/en
Publication of TW201303281A publication Critical patent/TW201303281A/zh
Application granted granted Critical
Publication of TWI456182B publication Critical patent/TWI456182B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00—Vibration-testing of structures; Shock-testing of structures
    • G01M7/08—Shock-testing
    • G01N33/0095—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/0032—Generation of the force using mechanical means
    • G01N2203/0039—Hammer or pendulum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0262—Shape of the specimen
    • G01N2203/0278—Thin specimens
    • G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Photovoltaic Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Claims (10)

  1. 一種用以檢測一太陽能面板之檢測裝置，包含：至少一感應器，係設置於該太陽能面板之上；至少一撞擊鎚；以及至少一吸附元件，係吸附該太陽能面板；其中，該至少一吸附裝置適可穩固該太陽能面板，該至少一撞擊鎚係用以撞擊該太陽能面板以產生至少一振動，且該至少一感應器適可接收該至少一振動，並將其轉換為至少一數位訊號後輸出。
  2. 如請求項1所述之檢測裝置，其中，該至少一撞擊鎚係為四撞擊鎚，該四撞擊鎚於撞擊該太陽能面板時係相應產生四撞擊點，且該四撞擊點係對稱分佈於該太陽能面板之上。
  3. 如請求項2所述之檢測裝置，其中，該至少一感應器係為一加速規，且設置於該太陽能面板上之一中心。
  4. 如請求項3所述之檢測裝置，其中，該至少一吸附元件係為四吸盤，且沿該太陽能面板之該中心均勻設置。
  5. 如請求項1所述之檢測裝置，其中該至少一感應器係為一加速規，且設置於該太陽能面板之一邊緣之上。
  6. 如請求項1所述之檢測裝置，其中，該太陽能面板係可分割為複數均等區域，該些均等區域上分別設置至少一撞擊鎚、至少一感應器。
  7. 如請求項5所述之檢測裝置，其中，該至少一感應器為一加速規，且設置於該些均等區域之一中心。
  8. 如請求項1所述之檢測裝置，更包含一訊號轉換裝置，用以將該至少一感應器所接收之該至少一振動轉換為至少一數位訊號。
  9. 一種檢測一太陽能面板之方法，包含以下步驟：(a)撞擊該太陽能面板，以產生至少一振動；以及(b)將該至少一振動轉換為至少一數位訊號後輸出。
  10. 如請求項9所述之方法，更包含：(c)將該至少一數位訊號與一資料庫進行比對，以判斷該太陽能面板之良率。
TW100125233A 2011-07-15 2011-07-15 檢測太陽能面板之裝置及方法 TWI456182B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW100125233A TWI456182B (zh) 2011-07-15 2011-07-15 檢測太陽能面板之裝置及方法
US13/246,912 US20130014557A1 (en) 2011-07-15 2011-09-28 Apparatus and Method for Testing Solar Panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100125233A TWI456182B (zh) 2011-07-15 2011-07-15 檢測太陽能面板之裝置及方法

Publications (2)

Publication Number Publication Date
TW201303281A TW201303281A (zh) 2013-01-16
TWI456182B true TWI456182B (zh) 2014-10-11

Family

ID=47518137

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100125233A TWI456182B (zh) 2011-07-15 2011-07-15 檢測太陽能面板之裝置及方法

Country Status (2)

Country Link
US (1) US20130014557A1 (zh)
TW (1) TWI456182B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9447525B2 (en) 2014-02-18 2016-09-20 Eastman Chemical Company On-line detection of defects in fibrous members
CN108444844B (zh) * 2018-03-26 2019-02-26 贵州宇华瑞通科技有限公司 一种通信设备测试装置
CN114813404B (zh) * 2022-06-28 2022-09-06 徐州阳森建设科技有限公司 一种太阳能板的抗变形能力测试装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201040519A (en) * 2009-05-04 2010-11-16 Big Sun Energy Technology Inc Chip defect detecting apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3457427A (en) * 1965-08-20 1969-07-22 Westinghouse Electric Corp Lightweight solar cell panel structure
US3572089A (en) * 1969-02-04 1971-03-23 Nasa Peak acceleration limiter for vibrational tester
GB2144853B (en) * 1983-08-10 1987-01-14 Rolls Royce Component inspection by self generated transient stress wave detection
US6484580B2 (en) * 2000-03-15 2002-11-26 Ball Aerospace & Technologies Corp. In situ testing of a satellite or other object prior to development
US7426062B2 (en) * 2001-08-21 2008-09-16 Canon Kabushiki Kaisha Signal output apparatus, image forming apparatus and information output apparatus
US7900498B1 (en) * 2006-06-30 2011-03-08 The United States Of America As Represented By The Secretary Of The Navy Calibrated impact hammer
TWI443850B (zh) * 2008-05-09 2014-07-01 Ind Tech Res Inst 太陽能電池檢測機台
US8240214B2 (en) * 2009-05-25 2012-08-14 Kun-Ta Lee Impact testing device
TWI431271B (zh) * 2010-07-15 2014-03-21 Ind Tech Res Inst 瑕疵檢測系統及方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201040519A (en) * 2009-05-04 2010-11-16 Big Sun Energy Technology Inc Chip defect detecting apparatus

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Publication number Publication date
TW201303281A (zh) 2013-01-16
US20130014557A1 (en) 2013-01-17

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