TWI452284B - The method of detecting the mark of the multi-board, the method of detecting the device and the multi-board - Google Patents

The method of detecting the mark of the multi-board, the method of detecting the device and the multi-board Download PDF

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TWI452284B
TWI452284B TW097138681A TW97138681A TWI452284B TW I452284 B TWI452284 B TW I452284B TW 097138681 A TW097138681 A TW 097138681A TW 97138681 A TW97138681 A TW 97138681A TW I452284 B TWI452284 B TW I452284B
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board
plate
sub
mark
image
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TW097138681A
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TW201015062A (en
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D Tek Technology Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09936Marks, inscriptions, etc. for information
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

多聯板之標記的檢知方法、檢知裝置及多聯板的置件方法Method for detecting marking of multi-plate, detecting device and method for mounting multi-plate

本發明係有關於一種多聯板之標記的檢知方法,尤指一種完整擷取多聯板影像再加以分析多聯板上之子板的不良品標記、或多聯板上的定位標靶之檢知裝置方法,並將其檢知結果之資訊傳遞給後方之生產機台者。The invention relates to a method for detecting a mark of a multi-joint plate, in particular to a defect image of a sub-board that is completely captured and then analyzed, or a positioning target of the multi-plate. The device method is detected and the information of the detection result is transmitted to the production machine at the rear.

習知的電路板係為一種大面積的主板,例如電腦系統中的主機板,但隨著電子裝置如PDA、手機或數位相機的體積越來越小,電路基板的體積也跟著縮小。而為了生產的效率的考量,業者將多數個小型電路板(又稱為子板)合併成一片大型電路板(又稱為多聯板)以方便後續量產製程的進行。但由於生產的過程中該等小型電路板可能會由於製程上的變異而造成不符合電性導通(即開路、短路等電路特徵)的規格,故上述列為不良品的小型電路板就會以人工的方式將一不良品標記(bad mark)設置於該些小型電路板上,以使後續的取置製程能依據檢知取得相關資訊後,避開上述不良的電路板,以避免將元件裝設於該些不良子板上。另考量該多聯板上的兩兩子板之間需有一固定間距,以利後續表面黏著元件置件的精度需求,但該兩兩子板之間存在有製造與材料收縮率不同所產生的距離誤差,經多聯板合併之後所累積的誤差將會造成表面黏著元件的置件精度問題,是故後續的生產機台(如取置 機、die bonder等等)均需額外針對每片子板的定位標靶(local fiducial mark)進行視覺辨識處理,以校正上述之誤差值,但此一額外的視覺辨識處理時間將會大量降低生產線的稼動率(約10%-30%不等)。The conventional circuit board is a large-area motherboard, such as a motherboard in a computer system, but as electronic devices such as PDAs, cell phones, or digital cameras become smaller and smaller, the size of the circuit substrate also shrinks. In order to consider the efficiency of production, the industry combines most small circuit boards (also known as daughter boards) into a large circuit board (also known as multi-board) to facilitate the subsequent mass production process. However, since the small-sized circuit boards may be inconsistent with the electrical continuity (ie, circuit characteristics such as open circuit and short circuit) due to variations in the process during the manufacturing process, the small circuit boards listed as defective products will be Manually setting a bad mark on the small circuit boards, so that subsequent acquisition processes can obtain the relevant information according to the detection, and avoid the bad circuit board to avoid component loading. Set on the bad sub-boards. Another consideration is that there must be a fixed spacing between the two sub-boards on the multi-plate, in order to meet the precision requirements of the subsequent surface-adhesive component placement, but there is a difference between manufacturing and material shrinkage between the two sub-boards. Distance error, the accumulated error after the multi-plate combination will cause the placement accuracy of the surface-adhesive component, so the subsequent production machine (such as the acquisition) Machine, die bonder, etc.) need to additionally visually identify the local fiducial mark of each sub-board to correct the above error value, but this additional visual recognition processing time will greatly reduce the production line The rate of utilization (about 10%-30%).

另一方面,傳統上取置機會載入該多聯板,並利用一移動式攝影機先進行標靶(fiducial mark)的定位,再利用上述攝影機進行不良品標記的分析檢知作業或是定位標靶(local fiducial mark)的辨識檢測作業。換句話說,傳統取置機是利用同一具攝影機搭配XY滑台(XY stage)進行標靶與不良子板標記的分析及檢知,且該攝影機必須依靠XY載台的硬體動作以進行移動來一一擷取該大型電路板中的每一小型電路板上是否有不良記號,進行檢知不良板的資訊,接著才開始根據上述的檢知資訊進行後續的置件步驟,完成全部的置件後,最後再進行載出多聯板的動作。On the other hand, the traditional pick-up opportunity is loaded into the multi-plate, and a mobile camera is used to first perform the positioning of the fiducial mark, and then the camera is used to perform the analysis and detection of the defective product or the positioning target. Identification test of the target (local fiducial mark). In other words, the traditional pick-and-place machine uses the same camera with the XY stage to analyze and detect the target and the bad sub-board mark, and the camera must rely on the hardware action of the XY stage to move. To find out whether there is a bad mark on each small circuit board in the large circuit board, and to check the information of the bad board, and then start the subsequent setting step according to the above-mentioned detection information to complete all the settings. After the piece is finished, the action of loading the multi-plate is finally performed.

故,傳統取置機利用硬體移動方式進行上述之檢知不良子板的程序作業,對於聯板數越來越多的情況下,勢必會造成置件機台的生產時間大幅增加。Therefore, the conventional pick-and-place machine uses the hardware movement method to perform the above-mentioned program operation for detecting the defective sub-board. When the number of the joint boards is increased, the production time of the set machine is inevitably increased.

請參考第九圖,以目前的取置機來說,該攝影機進行單一小型電路板的影像擷取的時間大約為0.3秒,故考慮一個含有100個MICRO-SD的多聯板之檢知整體時間可估算為30秒(包含攝影機的移動時間等等),加上進片、出片、標靶檢知時間為4秒,再加上置件時間為40秒(假設一片子板置放4個元件、每一元件置放時間為0.1秒, 故當100片子板均為良品時,置件時間的計算為100片×4個元件×0.1秒/個=40秒),使得取置機的置件時間總和為74秒,而SMT生產線上的印刷機之作業時間為25秒,迴焊機台的作業時間則為25秒,故整條生產線的cycle time即為74秒,亦即取置機的作業就會成為整條生產線的生產瓶頸,而使得產線的生產產能受到限制。Please refer to the ninth figure. In the current device, the image capture time of the camera on a single small circuit board is about 0.3 seconds. Therefore, consider the detection of a multi-plate with 100 MICRO-SD. The time can be estimated to be 30 seconds (including the camera's movement time, etc.), plus the filming, filming, target detection time is 4 seconds, plus the set time is 40 seconds (assuming a daughter board is placed 4 The components and each component are placed for 0.1 second. Therefore, when 100 pieces of sub-boards are good, the calculation of the placement time is 100 pieces × 4 elements × 0.1 sec / piece = 40 seconds), so that the total time of the placement machine is 74 seconds, and the SMT production line The working time of the printing machine is 25 seconds, and the working time of the reflowing machine is 25 seconds, so the cycle time of the whole production line is 74 seconds, that is, the operation of the pick-up machine will become the production bottleneck of the entire production line. The production capacity of the production line is limited.

緣是,本發明人有感上述缺失之可改善,提出一種設計合理且有效改善上述缺失之本發明。The reason is that the inventors have felt that the above-mentioned deficiency can be improved, and proposes a present invention which is rational in design and effective in improving the above-mentioned deficiency.

本發明之主要目的,在於提供一種多聯板之標記的檢知方法,該檢知方法係利用一獨立的檢知裝置在相當短的時間(約小於一秒)進行多聯板的完整影像之擷取並進行影像分析,以判別該多聯板上的子板上是否出現不良品標記,再將該些子板的檢知資訊傳送至取置機,該取置機即可利用該檢知資訊進行置件作業,以使得置件產線的生產速度大幅提昇。故該檢知裝置係應用在置件步驟之前,以解決傳統利用取置機進行不良子板的檢知而導致相當長的閒置時間的問題。The main object of the present invention is to provide a method for detecting the marking of a multi-plate, which uses a separate detecting device to perform a complete image of the multi-plate in a relatively short time (about less than one second). Capture and perform image analysis to determine whether a defective product mark appears on the daughter board on the multi-panel board, and then transmit the detection information of the sub-boards to the pick-up machine, and the pick-up machine can utilize the detection The information is used for the placement operation, so that the production speed of the production line is greatly increased. Therefore, the detecting device is applied before the placing step to solve the problem that the conventional use of the pick-up machine for detecting the defective sub-board leads to a relatively long idle time.

為了達成上述之目的,本發明係提供一種多聯板的置件方法,包括以下步驟:(a)進行一多聯板之標記的檢知步驟,提供一獨立的多聯板之標記的檢知裝置擷取一多聯板的全影像,並檢知該多聯板的每一子板上是否有不良品標記,再輸出一檢知資料;以及(b)提供一取置機台, 該取置機台係根據該檢知資料於屬於良品的子板上進行一置件步驟。In order to achieve the above object, the present invention provides a method for placing a multi-plate, comprising the steps of: (a) performing a step of detecting a mark of a multi-plate, and providing detection of a mark of an independent multi-plate The device captures a full image of a multi-plate, and detects whether there is a defective product mark on each sub-board of the multi-panel, and then outputs a detection data; and (b) provides a pick-up machine. The pick-up machine performs a placing step on the sub-board that belongs to the good according to the detection data.

本發明在傳統取置機台前方提供一種多聯板之標記的檢知方法與裝置,包括以下步驟:(a)提供一多聯板,其包括複數個子板,其中該等子板中屬於不良品的子板上設有一不良品標記(bad mark);(b)提供一獨立的多聯板之標記的檢知裝置,該多聯板之標記的檢知裝置包括一影像擷取單元以及一運算單元,其中利用該影像擷取單元擷取該多聯板的全影像;以及(c)利用該運算單元依序檢知該多聯板之該等子板的影像,以判定每一子板上是否有該不良品標記,並將檢知資訊傳遞給後方的取置機合。The invention provides a method and device for detecting the marking of the multi-plate in front of the conventional pick-up machine, comprising the following steps: (a) providing a multi-plate comprising a plurality of sub-boards, wherein the sub-boards are not a bad mark is provided on the sub-board of the good product; (b) a detecting device for providing a mark of the independent multi-plate, the detecting device of the marking of the multi-board includes an image capturing unit and a An operation unit, wherein the image capturing unit captures a full image of the plurality of boards; and (c) sequentially using the computing unit to detect images of the plurality of boards of the plurality of boards to determine each daughter board Whether there is a mark of the defective product on the top, and the detection information is transmitted to the rear pick-and-place machine.

本發明具有以下有益的效果:本發明提出之檢知裝置及其方法係主要利用一較大視野(field of view,FOV)的影像擷取單元,進行多聯板的全影像擷取,故其可以擷取到該多聯板的完整影像以取代置件機中的移動式影像擷取單元針對單一的子板進行影像擷取,且再利用運算單元以軟體高速運算的方式對該多聯板的完整影像進行影像分析,藉此可快速得知子板上之不良品標記的檢知結果,並將檢知結果傳遞給後續的取置機,讓取置機不用花費時間進行不良子板的檢測,故可縮短取置機的產出時間(cycle time),例如在先前技術所提到的100個MICRO-SD的多聯板原需74秒,而使用本發明後僅需44秒,故可進一步提高整條生產線的產出效率。The invention has the following beneficial effects: the detecting device and the method thereof provided by the present invention mainly utilize a large field of view (FOV) image capturing unit to perform full image capturing of the multi-plate, so The complete image of the multi-panel can be captured to replace the mobile image capturing unit in the device for image capture of a single daughter board, and the multi-layer board is further operated by a high-speed operation unit by using an arithmetic unit. The complete image is image analyzed, so that the detection result of the defective product mark on the daughter board can be quickly known, and the detection result is transmitted to the subsequent pick-up machine, so that the pick-up machine does not take time to detect the bad sub-board. Therefore, the cycle time of the pick-up machine can be shortened. For example, the multi-plate of 100 MICRO-SD mentioned in the prior art originally takes 74 seconds, and only 44 seconds is used after the invention is used. Further improve the output efficiency of the entire production line.

為使能更進一步瞭解本發明之特徵及技術內容,請參 閱以下有關本發明之詳細說明與附圖,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。In order to further understand the features and technical contents of the present invention, please refer to The following detailed description of the invention and the annexed drawings

本發明係在取置機前方提供一種多聯板之標記的檢知裝置1,其係用以快速地、獨立地檢知該多聯板之複數個子板上的不良品標記(bad mark)或是定位標靶(local fiducial mark),並傳遞給後方取置機,讓後續的置件步驟能根據該標記的檢知裝置1所得到的檢知資料,針對屬於良品的子板進行置件,而使取置機的待機時間(包括進片、出片、標靶檢知時間及不良品標記的檢知時間)大幅縮短,不用在置件機上進行該項檢知作業,進而提升整體生產線的產能。請先參考第二圖,其為一種多聯板30態樣之示意圖,其包括複數個子板301,該些子板301在經過一定的判別步驟後便會被區分為良品及不良品,而屬於不良品的子板301就會以不良品標記(bad mark)31的方式標示之,該標記的檢知裝置1即能快速的檢知上述的不良品標記31,使取置機台40可以根據該標記的檢知裝置1所得到的檢知資料針對屬於良品的子板301進行置件,即取置機台不會將元件設置於不良的子板301上,進而達成節省材料的功效。而本發明即可有效率的判別何者為不良品的子板301,何者又為良品的子板301,並將資訊傳遞給後方取置機,節省了傳統取置機利用硬體機構進行移動以檢知不良子板所浪費的時間。The present invention is a detecting device 1 for providing a multi-plate mark in front of a pick-up machine for quickly and independently detecting a bad mark on a plurality of sub-boards of the multi-panel or It is a local fiducial mark and is transmitted to the rear access machine, so that the subsequent placing step can be placed on the sub-board belonging to the good product according to the detection data obtained by the detecting device 1 of the mark. The standby time of the pick-up machine (including the filming, filming, target detection time and the detection time of the defective product mark) is greatly shortened, and the inspection operation is not performed on the set machine, thereby improving the overall production line. Capacity. Please refer to the second figure, which is a schematic diagram of a multi-plate 30 embodiment, which includes a plurality of sub-boards 301 which are classified into good products and defective products after a certain discriminating step, and belong to The defective sub-board 301 is marked by a bad mark 31, and the detecting device 1 of the mark can quickly detect the defective product mark 31, so that the pick-up machine 40 can be based on The detection data obtained by the marking detecting device 1 is placed on the sub-board 301 which is a good product, that is, the taking-in machine does not set the component on the defective sub-board 301, thereby achieving material saving effect. However, the present invention can efficiently determine which is the defective sub-board 301, which is the good sub-board 301, and transmit the information to the rear access machine, thereby saving the traditional pick-up machine from using the hardware mechanism to move The time wasted to detect bad sub-boards.

請復參考第一圖,其為本發明之多聯板之標記的檢知裝置1之示意圖,其中該多聯板之標記的檢知裝置1包括一影像擷取單元10以及一運算單元20,其中該影像擷取單元10具有一預定解析度及一預定放大倍率且在一預定工作距離(working distance)WD下擷取該多聯板30之影像。本發明主要係利用較大視野的影像擷取單元10配合相對應的預定工作距離WD的條件進行多聯板30全影像之擷取工作。本發明以較大視野的影像擷取單元10配合預定工作距離WD,讓該影像擷取單元10可以一次性的抓取該多聯板30的完整影像,以解決傳統上必須移動影像擷取硬體而個別地進行單一子板301的影像擷取所造成的閒置時間的消耗。例如本發明所提出之影像擷取單元10之影像解析度(Image Resolution)可為768×576畫素(pixel),搭配鏡頭所形成的空間解析度(Spatial Resolution)可為0.25至0.5公厘/畫素(mm/pixel),而工作距離WD可為200至700公厘(mm)。又例如該影像擷取單元10也可為大型的線性掃瞄器,其工作距離WD可在20至300公厘(mm)的條件下擷取多聯板30的全影像。再者,在本具體實施例中,該影像擷取單元10更進一步包括複數個發光單元101,以提供該影像擷取單元10最佳的照明情況,該等發光單元101可為發光二極體或是日光燈管等。Please refer to the first figure, which is a schematic diagram of the detecting device 1 for marking the multi-plate of the present invention, wherein the detecting device 1 for marking the multi-board includes an image capturing unit 10 and an arithmetic unit 20, The image capturing unit 10 has a predetermined resolution and a predetermined magnification and captures an image of the multi-plate 30 at a predetermined working distance WD. The invention mainly uses the image capturing unit 10 of a larger field of view to cooperate with the corresponding predetermined working distance WD to perform the full image capturing operation of the multi-plate 30. The image capturing unit 10 of the larger field of view cooperates with the predetermined working distance WD, so that the image capturing unit 10 can capture the complete image of the multi-plate 30 at one time, so as to solve the problem that the image must be moved hard. The idle time consumption caused by the image capture of the single sub-board 301 is performed individually and separately. For example, the image resolution of the image capturing unit 10 proposed by the present invention may be 768×576 pixels, and the spatial resolution formed by the lens may be 0.25 to 0.5 mm/ The pixels (mm/pixel) and the working distance WD can be 200 to 700 mm (mm). For example, the image capturing unit 10 can also be a large linear scanner, and the working distance WD can capture the full image of the multi-plate 30 under the condition of 20 to 300 mm. In addition, in the embodiment, the image capturing unit 10 further includes a plurality of light emitting units 101 to provide optimal illumination of the image capturing unit 10, and the light emitting units 101 may be light emitting diodes. Or fluorescent tubes, etc.

而該多聯板之標記的檢知裝置1之運算單元20則用以接收該多聯板30之影像並利用影像分析軟體依序 檢視該多聯板30上之子板301的影像。請參考第三圖,運算單元20主要具有多種模組,包括一主模組201;一與該主模組201連接的開關模組202;一與該主模組201連接之控制模組203;一與該主模組201連接之輔助模組204;一與該主模組201連接之參數設定模組205;以及一與該主模組201連接之系統模組206,舉例來說該主模組201更包括主選單、工作設定等控制手段以讓該運算單元20進行接收並分析該多聯板30的完整影像;又如該參數設定模組205包括多聯板參數設定之手段、檢知參數之手段等,該多聯板參數設定之手段可設定待檢知多聯板30的尺寸規格,而該檢知參數之手段可設定不同的檢知條件,如光源大小等,使該運算單元20可以回饋控制該影像擷取單元10進行最佳的影像擷取。而該運算單元20的其他模組在於進行產品的選擇或系統調整等功能,在此不再贅述。The computing unit 20 of the detecting device 1 of the multi-plate is used to receive the image of the multi-board 30 and use the image analysis software to sequentially The image of the sub-board 301 on the multi-plate 30 is examined. Please refer to the third figure, the computing unit 20 mainly has a plurality of modules, including a main module 201; a switch module 202 connected to the main module 201; a control module 203 connected to the main module 201; An auxiliary module 204 connected to the main module 201; a parameter setting module 205 connected to the main module 201; and a system module 206 connected to the main module 201, for example, the main module The group 201 further includes a control means such as a main menu and a work setting to allow the computing unit 20 to receive and analyze the complete image of the multi-board 30; and if the parameter setting module 205 includes a multi-board parameter setting means, detecting The parameter means, etc., the means for setting the multi-plate parameter can set the size specification of the multi-plate 30 to be detected, and the means for detecting the parameter can set different detection conditions, such as the size of the light source, etc., so that the operation unit 20 The image capturing unit 10 can be feedback controlled to perform optimal image capturing. The other modules of the computing unit 20 are functions such as product selection or system adjustment, and are not described here.

另外該多聯板之標記的檢知裝置1可搭配一取置機台40,實際上該取置機台40可為晶片取置機或打線機,如die bonder等其他可用以進行晶片取置或線路連接的機台或設備(例如應用在BGA的封裝製程,可生產MICRO-SD、DDR Ⅱ等產品),而該取置機台40可以經由該運算單元20獲得檢知資料,該檢知資料可記錄有該多聯板上之子板的優劣情況,該取置機台40並可依據該檢知資料進行置件的作業。換句話說,該多聯板之標記的檢知裝置1可應用於SMD製程或是一般元件廠的打線製程。In addition, the detecting device 1 of the multi-plate label can be matched with a pick-up machine 40. In fact, the pick-up machine 40 can be a wafer pick-up machine or a wire-punching machine, such as a die bonder or the like, which can be used for wafer pick-up. Or a line-connected machine or device (for example, a packaging process of the BGA, which can produce products such as MICRO-SD, DDR II, etc.), and the access machine 40 can obtain the detection data through the operation unit 20, the detection The data can record the advantages and disadvantages of the daughter board on the multi-board, and the pick-up machine 40 can perform the work of the set according to the detection data. In other words, the marking device 1 of the multi-plate can be applied to the SMD process or the wire bonding process of a general component factory.

請參考第四圖,其為本發明所提出之多聯板之標記的檢知方法,其中包括以下步驟:步驟(a):提供一多聯板30,其包括複數個子板301,其中該等子板301中屬於不良品的子板301上設有一不良品標記(bad mark)31。而在步驟(a)之前更包括一標記步驟,係利用雷射或貼附的方法將該不良品標記31設置於屬於不良品的子板301上,以利後續製程之進行,其中該不良品標記31具有一預定尺寸,例如3×3(mm2)或4×4(mm2)等大小,且該不良品標記31的主要特徵需具有高度的反差,以利影像分析的準確度。Please refer to the fourth figure, which is a method for detecting the marking of the multi-plate according to the present invention, which includes the following steps: Step (a): providing a multi-plate 30 comprising a plurality of sub-boards 301, wherein A sub-board 301 belonging to the defective product in the sub-board 301 is provided with a bad mark 31. Further, before the step (a), a marking step is further included, and the defective product mark 31 is disposed on the sub-board 301 belonging to the defective product by a laser or attaching method to facilitate the subsequent process, wherein the defective product The mark 31 has a predetermined size, for example, a size of 3 × 3 (mm 2 ) or 4 × 4 (mm 2 ), and the main feature of the defective product mark 31 is required to have a high contrast to facilitate the accuracy of image analysis.

而該等子板301更可以是軟板,由於軟板材質的收縮以及軟板尺寸越來越小的情況下,軟板的偏移量就必須加以考慮,故每一子板301更設有定位標靶(local fiducial mark),根據定位標靶的位置,以決定所需要的偏移補償量。The sub-board 301 may be a soft board. Due to the shrinkage of the soft board material and the smaller and smaller size of the soft board, the offset of the soft board must be considered. Therefore, each sub-board 301 is further provided. A local fiducial mark is determined based on the position of the target to determine the amount of offset compensation required.

步驟(b):提供一獨立的多聯板之標記的檢知裝置1,該多聯板之標記的檢知裝置1包括一影像擷取單元10以及一運算單元20,其中利用該影像擷取單元10擷取該多聯板30的全影像,如前文所述,該影像擷取單元10具有一預定解析度及一預定放大倍率且在一預定工作距離(working distance)WD下擷取該多聯板30之完整影像。Step (b): a detecting device 1 for providing a mark of a separate multi-plate, the detecting device 1 for marking the multi-board includes an image capturing unit 10 and an arithmetic unit 20, wherein the image capturing unit is used The unit 10 captures the full image of the multi-plate 30. As described above, the image capturing unit 10 has a predetermined resolution and a predetermined magnification and captures the same under a predetermined working distance WD. The complete image of the board 30.

步驟(c)利用該運算單元20依序檢知該多聯板3 0之該等子板301的影像,以判定每一子板301上是否有該不良品標記31。在此步驟之前,使用者可利用該運算單元20中的參數設定模組205設定該子板301的尺寸,亦即進行一設定該子板301尺寸之之步驟,以使該運算單元20得以根據該子板尺寸依序檢知該多聯板30之該等子板301的影像。Step (c) sequentially detecting the multi-plate 3 by using the operation unit 20 The image of the sub-boards 301 of 0 determines whether or not the defective product mark 31 is present on each of the sub-boards 301. Before the step, the user can set the size of the daughter board 301 by using the parameter setting module 205 in the computing unit 20, that is, perform a step of setting the size of the daughter board 301, so that the computing unit 20 can be The sub-board size sequentially detects images of the sub-boards 301 of the multi-board 30.

另外,該運算單元20會先定義一檢知區域(range of interesting)ROI(請參考第五A圖),並將該檢知區域ROI移動至對應於該待分析之子板301影像上的位置,藉此,該運算單元20可分析該檢知區域ROI中是否出現不良品標記31,以判定此一子板301上是否有該不良品標記31;接著就得到一檢知結果。接下來該運算單元20會判定是否繼續進行下一個子板301的分析工作,直到分析完所擷取的多聯板30的影像中之最後一個子板301,再統整上述的檢知結果以輸出一檢知資料。由於本步驟中主要使用影像分析軟體等進行分析,故此一分析步驟所花費的時間甚小,如一秒或小於一秒。In addition, the computing unit 20 first defines a range of interesting ROI (please refer to FIG. 5A), and moves the detected area ROI to a position corresponding to the image of the daughter board 301 to be analyzed. Thereby, the arithmetic unit 20 can analyze whether the defective product mark 31 appears in the detection area ROI to determine whether the defective product mark 31 is present on the one sub-board 301; and then obtain a detection result. Next, the operation unit 20 determines whether to continue the analysis work of the next sub-board 301 until the last sub-board 301 in the image of the captured multi-plate 30 is analyzed, and the above-mentioned detection result is integrated. Output a detection data. Since the analysis is mainly performed using image analysis software or the like in this step, the time taken for this analysis step is very small, such as one second or less.

請參考第五圖至第五B圖,其顯示另一種態樣(BGA封裝,如附件二至附件六所示之實體照片)的多聯板30的檢知過程,在本實施例中該多聯板30包括十個子板301,且該多聯板30的尺寸約為245公厘(mm),而該等子板301僅有最左側端的上下兩個子板301上設有不良品標記31,當檢知步驟開始時,先利用該影像擷取單元10擷取該多聯板30的完整影像;接著該運算單 元20會先定義一檢知區域ROI對應該最左側端的子板301(如第五A圖),在本實施例中,該檢知區域ROI係定義於該子板301的左下角以對應該不良品標記31的位置(該檢知區域ROI的位置亦可由該運算單元20加以設定),而該運算單元20即可判讀出該最左側下端的子板301上設有不良品標記31,即該最左側下端的子板301係屬於不良品。接著,該運算單元20會將檢知區域ROI依序移動至其他的子板301影像上(如第五B圖),以判別其他子板301上是否有不良品標記31,最後即可輸出一檢知資料給後端的取置機台40,該取置機台40即可應用該檢知資料進行每一子板301的後端製作程序。Please refer to the fifth to fifth B drawings, which show the detection process of the multi-plate 30 of another aspect (BGA package, such as the physical photos shown in Annexes 2 to 6), which is more in this embodiment. The sub-board 30 includes ten sub-boards 301, and the multi-plate 30 has a size of about 245 mm. The sub-boards 301 have only the leftmost end of the upper and lower sub-boards 301 with defective marks 31. When the detecting step starts, the image capturing unit 10 is used to capture the complete image of the multi-plate 30; then the operation list is The element 20 first defines a sub-board 301 corresponding to the leftmost end of the detection area ROI (as shown in FIG. 5A). In this embodiment, the detection area ROI is defined in the lower left corner of the sub-board 301 to correspond to The position of the defective product mark 31 (the position of the detection area ROI can also be set by the arithmetic unit 20), and the arithmetic unit 20 can determine that the defective product mark 31 is provided on the lowermost lower sub-board 301, that is, The leftmost lower sub-board 301 is a defective product. Next, the computing unit 20 sequentially moves the detection area ROI to the other sub-board 301 image (as shown in FIG. 5B) to determine whether there is a defective product mark 31 on the other sub-board 301, and finally outputs one. The detection data is sent to the pick-up machine 40 of the back end, and the pick-up machine 40 can apply the detection data to perform the back-end creation process of each sub-board 301.

請參考第六圖,其顯示另一種態樣(MICRO-SD,如附件一所示之實體照片)的多聯板30的檢知過程,在本實施例中該多聯板30包括七十個子板301,且該多聯板30的尺寸約為330公厘(mm),而該等子板301僅有編號8、9、15、42及66的子板301上設有不良品標記31。當檢知步驟開始時,先利用該影像擷取單元10在鏡頭組、感測元件及其他適當條件的情況下擷取該多聯板30的完整影像;接著該運算單元20會先定義一檢知區域ROI對應該編號1的子板301,而該運算單元20即可判讀出該編號1的子板301上是否設有不良品標記31,即判斷該編號1的子板301是否屬於不良品。接著,該運算單元20會將檢知區域ROI依序移動至其他的子板 301影像上直到編號70的子板301為止,以判別其他子板301上是否有不良品標記31,最後即可輸出一檢知資料給後端的取置機台40,而表1則顯示最後的檢知資料,該取置機台40即可應用該檢知資料進行每一子板301的置件程序,例如該取置機台40並不會對歸類為不良品的子板301進行後續的置件作業,以達到節省材料成本的目的。Please refer to the sixth figure, which shows the detection process of the multi-plate 30 of another aspect (MICRO-SD, such as the physical photo shown in Annex I). In the embodiment, the multi-plate 30 includes seventy children. The plate 301 has a size of about 330 mm, and the sub-board 301 has only the sub-boards 301 of the numbers 8, 9, 15, 42 and 66 with defective marks 31. When the detecting step starts, the image capturing unit 10 is used to capture a complete image of the multi-plate 30 under the lens group, the sensing component and other suitable conditions; then the computing unit 20 first defines a check. It is known that the sub-board 301 of the number 1 corresponds to the sub-board 301 of the number 1, and the arithmetic unit 20 can determine whether or not the defective product mark 31 is provided on the sub-board 301 of the number 1, that is, whether the sub-board 301 of the number 1 is defective. . Then, the operation unit 20 sequentially moves the detection area ROI to other daughter boards. On the 301 image up to the sub-board 301 of the number 70, it is determined whether or not the defective product mark 31 is present on the other sub-board 301, and finally, a detection data is output to the pick-up machine 40 at the rear end, and the first display is shown in Table 1. For the detection data, the pick-up machine 40 can apply the detection data to perform the setting procedure of each sub-board 301. For example, the pick-up machine 40 does not follow the sub-board 301 classified as a defective product. The placement of the work to achieve the purpose of saving material costs.

在表1中,”-“表示該子板301的位置上並無不良品標記31,故該子板301係為良品;而”NG”則表示該子板301的位置上出現不良品標記31,故該子板301係為不良品,由表1與第六圖的比較可以得知本發明所提出之多聯板之標記的檢知裝置1及檢知方法可以有效判別出現不良品標記31的子板301;另外本發明之多聯板之標記的檢知裝置1僅花費1-2秒即可得到表1的結果,與傳統上以個別檢知的方式同樣進行檢知一百片子板301所需的時間相比(如MICRO-SD的多聯板之檢 知整體時間可估算為30秒),本發明可大幅提高檢知的效率,進而提高生產效能,例如以100個子板的情況下,檢知的時間可縮短至小於一秒。In Table 1, "-" indicates that there is no defective product mark 31 at the position of the sub-board 301, so the sub-board 301 is a good product; and "NG" indicates that the defective product mark 31 appears at the position of the sub-board 301. Therefore, the sub-board 301 is a defective product. It can be seen from the comparison between Table 1 and FIG. 6 that the detecting device 1 and the detecting method of the multi-plate label proposed by the present invention can effectively discriminate the defective product mark 31. The sub-board 301; in addition, the detecting device 1 of the multi-plate label of the present invention can obtain the results of Table 1 in only 1-2 seconds, and the same as the conventional detection in the same manner. 301 compared to the time required (such as the MICRO-SD multi-board inspection Knowing that the overall time can be estimated to be 30 seconds), the present invention can greatly improve the efficiency of detection, thereby improving production efficiency. For example, in the case of 100 daughter boards, the detection time can be shortened to less than one second.

而如步驟(a)所述,當該等子板301為軟板的情況下,該多聯板之標記的檢知裝置1亦可以利用定位標靶(local fiducial mark)的位置分析每一子板301的偏移量,並將其儲存於檢知資料中,而該取置機台40則可以根據檢知資料中的紀錄先進行偏移量的補償,再進行元件置件的步驟。而一般的情況下,軟板上的定位標靶之數量大於不良品標記的數量,故在此情況下,更可以凸顯出本發明對於置件產線之產能的提高。As described in the step (a), when the sub-boards 301 are soft boards, the detecting device 1 of the multi-boards can also analyze each sub-position using the position of the local fiducial mark. The offset of the board 301 is stored in the detection data, and the pick-up machine 40 can perform the offset of the offset according to the record in the detection data, and then perform the component placement step. In general, the number of positioning targets on the flexible board is greater than the number of defective products. Therefore, in this case, the improvement of the production capacity of the production line of the present invention can be highlighted.

請參考第七圖,其為本發明之另一實施例,係將該多聯板之標記的檢知裝置1應用於多條生產線的情況,第七圖僅繪出第一生產線(Line-1,第七圖上方之生產線)及第二生產線(Line-2,第七圖下方之生產線),但不以上述為限,其中第一生產線包括兩台取置機台40,第二生產線同樣也包括兩台取置機台40,但取置機台40可依照實際需要進行調配,例如該取置機台40可為晶片取置機、打線機等等。檢知而經過該多聯板之標記的檢知裝置1檢知的多聯板30則可以分別進入第一生產線或第二生產線進行相關製程,且每一生產線上的取置機台40可以連接至該資料庫單元50以得知待作業之多聯板30上的不良品子板301的位置,以正確的進行後端製程,每一取置機台40的作業情況也可以上傳至該資料庫單 元50,讓使用者清楚知道多聯板30在哪一條生產線上的哪一機台位置,以及該多聯板30上的子板301所經過的生產道次。Please refer to the seventh figure, which is another embodiment of the present invention, which is the case where the marking device of the multi-plate is applied to a plurality of production lines, and the seventh drawing only depicts the first production line (Line-1). , the production line above the seventh figure) and the second production line (Line-2, the production line below the seventh figure), but not limited to the above, the first production line includes two take-up machines 40, the second production line is also The two pick-up machines 40 are included, but the pick-up machine 40 can be configured according to actual needs. For example, the pick-up machine 40 can be a wafer pick-up machine, a wire machine, or the like. The multi-plate 30 detected by the detecting device 1 marked by the multi-plate can be respectively entered into the first production line or the second production line for related processes, and the fetching machine 40 of each production line can be connected. Go to the database unit 50 to know the position of the defective product board 301 on the multi-plate 30 to be operated, so as to correctly perform the back-end process, and the operation of each of the pick-up machines 40 can also be uploaded to the data. Library order Element 50 allows the user to know which machine position on which line the multi-plate 30 is located, and the production pass through which the sub-board 301 on the multi-plate 30 passes.

值得注意的是,由於本發明所提出之影像擷取單元10可以擷取到完整的多聯板30之全影像,故上述的多聯板之標記的檢知裝置1均是設置在取置機台40外側,亦即多聯板30係先經過多聯板之標記的檢知裝置1檢知之後再藉由輸送帶等裝置送進取置機台40進行製程。然而本發明之多聯板之標記的檢知裝置1亦可內建安裝於取置機台40中,僅需將取置機台40內部的空間架構進行相關規劃,例如取置機台40必須具有一定高度,以使該影像擷取單元10能有足夠的預定工作距離WD,該取置機台40也必須具有一定橫向長度,以避免機械構件等阻礙到發光單元101的照射光線而影響取像的品質。It should be noted that, since the image capturing unit 10 of the present invention can capture the full image of the complete multi-plate 30, the above-mentioned multi-plate marking detecting device 1 is disposed in the taking machine. The outside of the stage 40, that is, the multi-plate 30 is detected by the detecting device 1 which has been marked by the multi-plate, and then sent to the pick-up table 40 by a conveyor or the like for the process. However, the detecting device 1 for marking the multi-plate of the present invention can also be built and installed in the pick-up machine 40, and only the space structure inside the pick-up machine 40 needs to be related to the planning, for example, the pick-up machine 40 must be The image capturing unit 10 has a predetermined working distance WD, and the positioning machine 40 must also have a certain lateral length to prevent the mechanical component or the like from obstructing the illumination light of the light emitting unit 101. The quality of the image.

請參考第八圖,本發明更提出一種多聯板的置件方法,係利用前述的步驟先擷取多聯板30的全影像,再利用影像分析的技術在很短的時間內得到該多聯板30上每一子板301是否為不良品的資料;再將該檢知資料傳送給取置機台40,該取置機台40則可以根據檢知資料進行置件。而該多聯板的置件方法更包括一在檢知步驟之前的印刷步驟,以及一在置件步驟之後的迴焊(reflow)步驟。Referring to the eighth figure, the present invention further provides a method for placing a multi-plate, which uses the foregoing steps to first capture the full image of the multi-plate 30, and then uses image analysis technology to obtain the multi-shot in a short period of time. Whether each of the sub-boards 301 on the sub-board 30 is a defective product; the detection data is transmitted to the pick-up machine 40, and the pick-up machine 40 can perform the setting according to the inspection data. The method of placing the multi-plate further includes a printing step before the detecting step, and a reflow step after the placing step.

本發明可以有效縮短取置機台40的閒置時間中的不良品標記的檢知時間,故可以提高產線生產的效能。仍 然以100片的MICRO-SD的置件生產線來說,利用本發明之多聯板的置件方法的生產線,印刷機的作業時間仍為25秒,迴焊爐的作業時間也為25秒,而本發明的多聯板之標記的檢知裝置1的擷取影像、檢知不良品標記(包括定位標靶)的時間為1秒,晶片取置機的工作時間則為進片、退片、標靶檢知時間、置件時間的時間為44秒,故整條生產線的cycle time即為44秒;故可大幅提昇先前技術所述的生產cycle time(從74秒縮短至44秒),約提升40%的產能,以此提高的產能可計算出一年的產值提高的金額,以一年機台運作12個月、一個月25天、一天20小時,若工作效率為8成、每一元件置放時間為0.1秒、每一片收益0.1元為例,可用下列計算式12(月)××25(天)×20(小時)×3600(秒)×80%÷0.1(顆/秒)×0.1(元)×40%=6912000(元),亦即一年產值可以提升將近七百萬元。若一條生產線上有兩台取置機,傳統的生產線之印刷機的作業時間仍為25秒,迴焊爐的作業時間也為25秒,取置機的工作時間為4秒(進片、退片、標靶檢知時間)+(30/2)秒(不良品檢知時間)+(40/2)秒(置件時間)=39秒,故整條生產線的cycle time即為39秒;反之,運用本發明之置件方法,印刷機的作業時間仍為25秒,迴焊爐的作業時間也為25秒,多聯板之標記的檢知裝置1的擷取影像、檢知不良品標記(包括定位標靶)的時間為1秒,取置機的工作時間為4秒(進片、退片、標靶檢知時間)+(40/2)秒(置件時間)=24秒, 故整條生產線的cycle time即為25秒,相較之下生產效能也就提高了37%。The invention can effectively shorten the detection time of the defective product mark in the idle time of the pick-up machine 40, so that the production efficiency of the production line can be improved. still However, in the case of a 100-piece MICRO-SD part production line, the working time of the printing machine using the multi-plate mounting method of the present invention is still 25 seconds, and the working time of the reflow furnace is also 25 seconds. In the detection device 1 of the multi-plate of the present invention, the time for capturing the image, detecting the defective product mark (including the positioning target) is 1 second, and the working time of the wafer pick-up machine is feeding and unloading. The target detection time and the time of the placement time are 44 seconds, so the cycle time of the entire production line is 44 seconds; therefore, the production cycle time (from 74 seconds to 44 seconds) described in the prior art can be greatly improved. Increase the production capacity by 40%, and increase the production capacity to calculate the amount of output increase in one year. It will operate for 12 months a year, 25 days a month, 20 hours a day, if the work efficiency is 80%, each For example, if the component placement time is 0.1 second and the yield per chip is 0.1 yuan, the following calculation formula can be used: 12 (month) × 25 (days) × 20 (hours) × 3600 (seconds) × 80% ÷ 0.1 (pieces per second) ) × 0.1 (yuan) × 40% = 6912,000 (yuan), that is, the annual output value can be increased by nearly seven million yuan. If there are two pick-up machines on one production line, the working time of the printing machine of the traditional production line is still 25 seconds, the working time of the reflowing furnace is also 25 seconds, and the working time of the pick-up machine is 4 seconds. Film, target detection time) + (30 / 2) seconds (defective product detection time) + (40 / 2) seconds (set time) = 39 seconds, so the cycle time of the entire production line is 39 seconds; On the other hand, with the method of the present invention, the working time of the printing machine is still 25 seconds, and the working time of the reflowing furnace is also 25 seconds, and the image of the detecting device 1 marked by the multi-plate is used to detect the defective product. The time of the mark (including the positioning target) is 1 second, and the working time of the pick-up machine is 4 seconds (incoming film, unloading, target detection time) + (40/2) seconds (set time) = 24 seconds , Therefore, the cycle time of the entire production line is 25 seconds, which is a 37% increase in production efficiency.

綜上所述,本發明具有下列諸項優點:1、具有較佳的檢知效率,由於該影像擷取單元具有較大視野,使其得以擷取該多聯板的完整影像,再針對該完整影像進行每一子板影像的分析;亦即本發明係一次性的擷取完整的全影像,再利用運算單元的高速運算能力及影像分析技術判別每一子板上是否有不良品標記,藉此可輸出多聯板的上之不良子板的檢知資料,以使取置機台得以根據該檢知資料進行置件,以解決傳統取置機台必須先進行不良品檢知再進行置件所造成的閒置時間過長的問題。In summary, the present invention has the following advantages: 1. It has better detection efficiency, and the image capturing unit has a larger field of view, so that it can capture a complete image of the multi-plate, and then The complete image is used to analyze each sub-board image; that is, the present invention captures a complete full image at a time, and then uses the high-speed computing capability and image analysis technology of the computing unit to determine whether there is a defective product mark on each sub-board. Thereby, the detection data of the bad sub-board on the multi-plate can be output, so that the fetching machine can perform the setting according to the detection data, so as to solve the problem that the traditional fetching machine must first perform the defective product inspection. The problem of idle time caused by the placement is too long.

2、另一方面,本發明利用較有效率的檢知方法以快速判讀子板的優劣情況,使得後續的取置機台可以直接接收該不良品檢知裝置所得到的檢知資料,藉此可提高生產線的產能,例如每片產出時間就可以大幅的縮短。2. On the other hand, the present invention utilizes a more efficient detection method to quickly interpret the pros and cons of the sub-board, so that the subsequent fetching machine can directly receive the detection data obtained by the defective product detecting device, thereby It can increase the production capacity of the production line, for example, the production time per piece can be greatly shortened.

惟以上所述僅為本發明之較佳實施例,非意欲侷限本發明之專利保護範圍,故舉凡運用本發明說明書及圖式內容所為之等效變化,均同理皆包含於本發明之權利保護範圍內,合予陳明。The above is only the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Therefore, the equivalents of the present invention and the equivalents of the drawings are all included in the present invention. Within the scope of protection, it is given to Chen Ming.

1‧‧‧多聯板之標記的檢知裝置1‧‧‧Multi-plate marking detection device

10‧‧‧影像擷取單元10‧‧‧Image capture unit

101‧‧‧發光單元101‧‧‧Lighting unit

20‧‧‧運算單元20‧‧‧ arithmetic unit

201‧‧‧主模組201‧‧‧Main module

202‧‧‧開關模組202‧‧‧Switch Module

203‧‧‧控制模組203‧‧‧Control Module

204‧‧‧輔助模組204‧‧‧Auxiliary module

205‧‧‧參數設定模組205‧‧‧ parameter setting module

206‧‧‧系統模組206‧‧‧System Module

30‧‧‧多聯板30‧‧‧Multiple boards

301‧‧‧子板301‧‧‧ daughter board

31‧‧‧不良品標記31‧‧‧Don't mark

40‧‧‧取置機台40‧‧‧Receiving machine

50‧‧‧資料庫單元50‧‧‧Database unit

WD‧‧‧工作距離WD‧‧‧Working distance

ROI‧‧‧檢知區域ROI‧‧‧Detection area

第一圖係本發明之多聯板之標記的檢知裝置之示意圖。The first figure is a schematic view of the detecting device of the marking of the multi-plate of the present invention.

第二圖係第一種態樣之多聯板之示意圖。The second figure is a schematic diagram of the multi-plate of the first aspect.

第三圖係本發明之多聯板之標記的檢知裝置之運算單元之功能方塊圖。The third figure is a functional block diagram of the arithmetic unit of the detecting device of the marking of the multi-plate of the present invention.

第四圖係本發明之多聯板之標記的檢知方法之流程圖。The fourth figure is a flow chart of the method for detecting the marking of the multi-plate of the present invention.

第五圖係本發明之第二種態樣之多聯板之示意圖。The fifth drawing is a schematic view of a multi-plate of the second aspect of the present invention.

第五A圖至第五B圖係本發明利用一ROI依序檢知子板之示意圖。5A to 5B are schematic diagrams of the present invention for sequentially detecting a sub-board using an ROI.

第六圖係本發明之第三種態樣之多聯板之示意圖。The sixth drawing is a schematic view of a multi-plate of the third aspect of the present invention.

第七圖係本發明之多聯板之標記的檢知裝置應用於多生產線之示意圖。The seventh drawing is a schematic diagram of the detecting device of the marking of the multi-plate of the present invention applied to a multi-production line.

第八圖係本發明之多聯板之置件方法之流程圖。The eighth figure is a flow chart of the method for placing the multi-plate of the present invention.

第九圖係習知之多聯板之置件方法之流程圖。The ninth figure is a flow chart of a conventional method for placing a multi-plate.

附件一係MICRO-SD電路板之實體照片。Attachment 1 is a physical photo of the MICRO-SD board.

附件二至附件六係BGA封裝的電路板之實體照片。Attachment 2 to Annex 6 are physical photographs of the boards of the BGA package.

1‧‧‧多聯板之標記的檢知裝置1‧‧‧Multi-plate marking detection device

10‧‧‧影像擷取單元10‧‧‧Image capture unit

101‧‧‧發光單元101‧‧‧Lighting unit

20‧‧‧運算單元20‧‧‧ arithmetic unit

30‧‧‧多聯板30‧‧‧Multiple boards

40‧‧‧取置機台40‧‧‧Receiving machine

WD‧‧‧工作距離WD‧‧‧Working distance

Claims (12)

一種多聯板之標記的檢知裝置,其係用以檢知該多聯板之複數個子板上的不良品標記(bad mark),該等子板上更進一步包括有定位標靶(local fiducial mark),該定位標靶之數量大於該不良品標記的數量,該標記檢知裝置包括:一影像擷取單元,其具有一預定解析度且在一預定工作距離下一次性的擷取該多聯板之完整影像,該預定工作距離係為200至700公厘(mm);以及一運算單元,其接收該多聯板之影像並依序檢視該多聯板上之子板的影像,並根據該等定位標靶的位置,量測分析每一子板的偏移量,其中該等子板分別為一軟板,該運算單元包括一主模組;一與該主模組連接的開關模組;一與該主模組連接之控制模組;一與該主模組連接之輔助模組;一與該主模組連接之參數設定模組;以及一與該主模組連接之系統模組。 A detecting device for marking a multi-plate, which is used for detecting a bad mark on a plurality of sub-boards of the multi-plate, the sub-board further including a positioning target (local fiducial Mark), the number of the positioning target is greater than the number of the defective product mark, the mark detecting device comprises: an image capturing unit having a predetermined resolution and capturing the one time at a predetermined working distance a complete image of the joint plate, the predetermined working distance is 200 to 700 mm (mm); and an arithmetic unit that receives the image of the multi-plate and sequentially views the image of the sub-board on the multi-panel, and according to Positioning the target, measuring and analyzing the offset of each sub-board, wherein the sub-boards are respectively a soft board, the computing unit includes a main module; and a switching module connected to the main module a control module connected to the main module; an auxiliary module connected to the main module; a parameter setting module connected to the main module; and a system module connected to the main module group. 如申請專利範圍第1項所述之多聯板之標記的檢知裝置,其中該影像擷取單元係為一低解析度攝影機或一線性掃瞄器。 The detecting device of the marking of the multi-plate according to claim 1, wherein the image capturing unit is a low-resolution camera or a linear scanner. 如申請專利範圍第2項所述之多聯板之標記的檢知裝置,其中該影像擷取單元更進一步包括複數個發光單元。 The detecting device of the marking of the multi-plate as described in claim 2, wherein the image capturing unit further comprises a plurality of lighting units. 一種多聯板之標記的檢知方法,包括以下步驟: (a)提供一多聯板,其包括複數個子板,其中該等子板中屬於不良品的子板上設有一不良品標記(bad mark),其中該等子板上更進一步包括有定位標靶(local fiducial mark),該定位標靶之數量大於該不良品標記的數量;(b)提供一多聯板之標記的檢知裝置,該多聯板之標記的檢知裝置包括一影像擷取單元以及一運算單元,其中利用該影像擷取單元一次性的擷取該多聯板的全影像,該影像擷取單元係在一預定工作距離係為200至700公厘(mm)擷取該多聯板的完整影像;以及(c)透過該運算單元設定該子板尺寸,以使該運算單元係根據該子板尺寸依序檢知該多聯板之該等子板的影像,利用該運算單元分析該多聯板的影像,以檢知每一子板上是否有該不良品標記並根據該等定位標靶的位置,量測分析每一子板的偏移量,其中該等子板分別為一軟板。 A method for detecting a mark of a multi-panel includes the following steps: (a) providing a multi-plate comprising a plurality of sub-boards, wherein a sub-board belonging to the defective product is provided with a bad mark, wherein the sub-board further includes a positioning mark a local fiducial mark, the number of the positioning target is greater than the number of the defective product mark; (b) a detecting device for providing a mark of the multi-plate, the detecting device of the marking of the multi-plate includes an image Taking a unit and an operation unit, wherein the image capturing unit captures the full image of the multi-plate in one time, and the image capturing unit is taken at a predetermined working distance of 200 to 700 mm (mm) And (c) setting the size of the sub-board through the computing unit, so that the computing unit sequentially detects images of the sub-boards of the multi-board according to the sub-board size, and utilizes The operation unit analyzes the image of the multi-plate to detect whether there is a defective product mark on each sub-board and measures the offset of each sub-board according to the positions of the positioning targets, wherein the The sub-boards are each a soft board. 如申請專利範圍第4項所述之多聯板之標記的檢知方法,其中在步驟(a)之前包括一標記步驟,係利用雷射或貼附的方法將該不良品標記設置於屬於不良品的子板上。 The method for detecting a mark of a multi-plate as described in claim 4, wherein a step of marking is included before step (a), and the defective mark is set to be not by laser or attached method. Good product on the board. 如申請專利範圍第5項所述之多聯板之標記的檢知方法,其中該不良品標記具有一預定尺寸且為一高反差標記。 The method for detecting a mark of a multi-plate as described in claim 5, wherein the defective mark has a predetermined size and is a high contrast mark. 如申請專利範圍第5項所述之多聯板之標記的檢知方法,其中在步驟(b)中該影像擷取單元係在一預定工作距離擷取該多聯板的完整影像。 The method for detecting a mark of a multi-plate as described in claim 5, wherein in step (b), the image capture unit captures a complete image of the multi-plate at a predetermined working distance. 如申請專利範圍第7項所述之多聯板之標記的檢知方法,其中在步驟(c)該運算單元係定義一檢知區域(range of interesting,ROI)對應於該子板的影像,以判定每一子板上的該檢知區域中是否有該不良品標記。 The method for detecting a mark of a multi-board as described in claim 7 , wherein in the step (c), the operation unit defines a range of interesting (ROI) corresponding to the image of the daughter board. To determine whether there is a defective product mark in the detection area on each daughter board. 如申請專利範圍第8項所述之多聯板之標記的檢知方法,其中在步驟(c)之後更包括一檢知資料之輸出步驟。 The method for detecting the marking of the multi-plate according to claim 8 of the patent application, wherein the step of detecting the data is further included after the step (c). 一種多聯板的置件方法,包括以下步驟:(a)進行一多聯板之標記的檢知步驟,提供一多聯板之標記的檢知裝置,該多聯板之標記的檢知裝置包括一影像擷取單元以及一運算單元,利用該影像擷取單元一次性的擷取一多聯板的全影像,該影像擷取單元係在一預定工作距離係為200至700公厘(mm)擷取該多聯板的完整影像,透過該運算單元設定該子板尺寸,以使該運算單元係根據該子板尺寸依序檢知該多聯板之該等子板的影像,利用該運算單元分析該多聯板的影像,並檢知該多聯板的每一子板上是否有不良品標記,再輸出一檢知資料,該多聯板之標記的檢知裝置更進一步檢測該多聯板的每一子板上的定位標靶(local fiducial mark),且分析該多聯板的每一子板的偏移量,以將該偏移量記錄於該檢知資料,其中該定位標靶之數量大於該不良品標記的數量,該等子板分別為一軟板;以及(b)提供一取置機台,該取置機台係先根據該檢知資料進行多聯板的每一子板的偏移補償,再根據該檢知資料於屬於良品的子板上進行一置件步驟。 A method for placing a multi-plate, comprising the steps of: (a) performing a step of detecting a mark of a multi-plate, providing a detecting device for marking a multi-plate, and detecting the mark of the multi-plate An image capturing unit and an arithmetic unit are used to capture a full image of a multi-plate by using the image capturing unit at a predetermined working distance of 200 to 700 mm (mm) Taking a complete image of the multi-board, the sub-board size is set by the computing unit, so that the computing unit sequentially detects the images of the sub-boards of the multi-board according to the sub-board size, and uses the The operation unit analyzes the image of the multi-plate, and detects whether there is a defective product mark on each sub-board of the multi-plate, and then outputs a detection data, and the detecting device of the multi-plate is further detected. Positioning target on each daughter board of a multi-board (local fiducial Mark), and analyzing an offset of each sub-board of the multi-plate to record the offset in the detection data, wherein the number of the positioning targets is greater than the number of the defective products, the sub- The boards are respectively a soft board; and (b) providing a pick-up machine, the pick-up machine first performs offset compensation for each sub-board of the multi-board according to the detection data, and then according to the detection data Perform a placement step on the sub-board that belongs to the good product. 如申請專利範圍第10項所述之多聯板的置件方法,其中在步驟(a)之間更包括一印刷步驟。 The method of placing a multi-plate according to claim 10, wherein a printing step is further included between the steps (a). 如申請專利範圍第10項所述之多聯板的置件方法,其中在步驟(b)之後更包括一迴焊步驟。 The method of placing a multi-plate according to claim 10, wherein a step of re-welding is further included after the step (b).
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112340109A (en) * 2021-01-07 2021-02-09 深圳和美精艺半导体科技股份有限公司 Automatic forking machine device and forking method before packaging of packaging substrate

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102740667A (en) * 2011-04-11 2012-10-17 鸿骐新技股份有限公司 Placement method for integrating circuit board information
TWI449119B (en) * 2011-06-17 2014-08-11 D Tek Technology Co Ltd Circuit board placement method
CN102856214A (en) * 2011-06-27 2013-01-02 鸿骐新技股份有限公司 Circuit board mounting method
CN103364402A (en) * 2012-04-05 2013-10-23 川宝科技股份有限公司 System and method for judging assembling error of printed circuit board substrate
CN104411091B (en) * 2014-10-27 2017-08-08 苏州河图电子科技有限公司 A kind of circuit board denotation approach based on bad point Quick Response Code
JP7261952B2 (en) * 2019-02-06 2023-04-21 パナソニックIpマネジメント株式会社 Component mounting system and component mounting method
CN112083198B (en) * 2020-07-28 2022-11-29 苏州德祥电子有限公司 Notebook computer mainboard detection device and method

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0669699A (en) * 1992-08-21 1994-03-11 Sanyo Electric Co Ltd Parts assembly line
US6195881B1 (en) * 1997-10-08 2001-03-06 The Erie Ceramic Arts Company Multiple coated substrates
WO2002014885A2 (en) * 2000-08-15 2002-02-21 Siemens Energy & Automation, Inc. Defective circuit scanning device and method
TWI228020B (en) * 2003-12-02 2005-02-11 Jin-Chiuan Lai Method for replacing inter-connected defective printed circuit boards
KR20070037824A (en) * 2005-10-04 2007-04-09 삼성전자주식회사 Die bonder and bonding method for manufacturing boc semiconductor package
CN2922409Y (en) * 2006-06-21 2007-07-11 昶驎科技股份有限公司 Multi-gusset plate subquality product testing device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0669699A (en) * 1992-08-21 1994-03-11 Sanyo Electric Co Ltd Parts assembly line
US6195881B1 (en) * 1997-10-08 2001-03-06 The Erie Ceramic Arts Company Multiple coated substrates
WO2002014885A2 (en) * 2000-08-15 2002-02-21 Siemens Energy & Automation, Inc. Defective circuit scanning device and method
TWI228020B (en) * 2003-12-02 2005-02-11 Jin-Chiuan Lai Method for replacing inter-connected defective printed circuit boards
KR20070037824A (en) * 2005-10-04 2007-04-09 삼성전자주식회사 Die bonder and bonding method for manufacturing boc semiconductor package
CN2922409Y (en) * 2006-06-21 2007-07-11 昶驎科技股份有限公司 Multi-gusset plate subquality product testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112340109A (en) * 2021-01-07 2021-02-09 深圳和美精艺半导体科技股份有限公司 Automatic forking machine device and forking method before packaging of packaging substrate
CN112340109B (en) * 2021-01-07 2021-04-23 深圳和美精艺半导体科技股份有限公司 Automatic forking machine device and forking method before packaging of packaging substrate

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