TWI449885B - Light source testing device - Google Patents
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- TWI449885B TWI449885B TW100108651A TW100108651A TWI449885B TW I449885 B TWI449885 B TW I449885B TW 100108651 A TW100108651 A TW 100108651A TW 100108651 A TW100108651 A TW 100108651A TW I449885 B TWI449885 B TW I449885B
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Description
本發明涉及一種光源檢測裝置,特別涉及一種檢測發光二極體光源的光源檢測裝置。The invention relates to a light source detecting device, in particular to a light source detecting device for detecting a light emitting diode light source.
習知的發光二極體光源檢測裝置通常包括測試臺、旋轉座以及用於檢測發光二極體光源的測試針。旋轉座連接於測試臺底面,該測試臺的頂面開設有一個固定形狀的凹槽,用於放置發光二極體光源。轉動旋轉座可將測試針從測試臺上表面穿設而出並與發光二極體光源的電極接觸,從而進行光源檢測。Conventional light-emitting diode light source detecting devices generally include a test stand, a rotating base, and a test pin for detecting a light-emitting diode light source. The rotating base is connected to the bottom surface of the test bench, and the top surface of the test stand is provided with a fixed shape groove for placing the light emitting diode light source. Rotating the rotating base can pass the test pin out from the upper surface of the test stand and contact the electrode of the light emitting diode source to perform light source detection.
然,由於測試臺上用於放置發光二極體光源的凹槽其形狀及尺寸已經固定,故該檢測裝置只適用於檢測一定形狀和尺寸的發光二極體光源。此外由於發光二極體光源裝設於凹槽內,如果測試臺採用的材料不具備良好的熱傳導性,則發光二極體光源產生的熱量不易快速消散,從而對測試結果產生不良影響。However, since the shape and size of the groove for placing the light-emitting diode light source on the test stand has been fixed, the detecting device is only suitable for detecting a light-emitting diode light source of a certain shape and size. In addition, since the light-emitting diode light source is installed in the groove, if the material used in the test bench does not have good thermal conductivity, the heat generated by the light-emitting diode light source is not easily dissipated quickly, thereby adversely affecting the test result.
有鑒於此,有必要提供一種能夠檢測多種形狀及尺寸發光二極體的光源檢測裝置。In view of the above, it is necessary to provide a light source detecting device capable of detecting a plurality of shapes and sizes of light emitting diodes.
一種用於檢測發光二極體光源的光源檢測裝置,包括基座、升降臺,所述基座上設有電極,該升降臺上形成有導電區域,所述升降臺內裝設有測試針,該測試針穿設於升降臺並與導電區域連接固定,所述發光二極體光源包括發光二極體和電路板,該電路板上設有電路結構,該發光二極體裝設於電路板上並與電路結構形成電性連接,該發光二極體光源裝設於升降臺上並與導電區域電性連接,所述升降臺由彈性元件固定於基座上,藉由下壓該升降臺使測試針與基座上的電極接觸形成電性連接。A light source detecting device for detecting a light emitting diode light source comprises a base and an lifting platform, wherein the base is provided with an electrode, a conductive area is formed on the lifting platform, and a test pin is arranged in the lifting platform. The test pin is disposed on the lifting platform and is fixedly connected to the conductive area. The light emitting diode light source comprises a light emitting diode and a circuit board. The circuit board is provided with a circuit structure, and the light emitting diode is mounted on the circuit board. And electrically connected to the circuit structure, the light emitting diode light source is mounted on the lifting platform and electrically connected to the conductive region, and the lifting platform is fixed on the base by the elastic component, by pressing the lifting platform The test pin is brought into electrical contact with the electrode on the base.
將發光二極體光源固定於升降臺上,並利用彈性元件以及外力共同作用改變升降臺的高度,從而控制測試針與基座上的電極的導通與斷開,進而對升降臺上裝設的發光二極體光源進行檢測,並且不對裝設的發光二極體光源的形狀和尺寸進行限制,故該光源檢測裝置可用來檢測多種形狀和尺寸的發光二極體光源。Fixing the light-emitting diode light source on the lifting platform, and using the elastic element and the external force to jointly change the height of the lifting platform, thereby controlling the conduction and disconnection of the electrode on the test pin and the base, and then mounting on the lifting platform The light-emitting diode light source is detected, and the shape and size of the installed light-emitting diode light source are not limited, so the light source detecting device can be used to detect light-emitting diode light sources of various shapes and sizes.
下面參照圖式,結合具體實施例對本發明作進一步的描述。The invention will now be further described with reference to the specific embodiments thereof with reference to the drawings.
請一併參閱圖1和圖2,本發明的實施方式提供的一種光源檢測裝置100包括基座10、支撐柱20、升降臺30以及固定組件60。Referring to FIG. 1 and FIG. 2 , a light source detecting device 100 according to an embodiment of the present invention includes a base 10 , a support post 20 , a lifting platform 30 , and a fixing assembly 60 .
所述基座10位於該光源檢測裝置100的下部,用於承載和支撐該光源檢測裝置100。該基座10的上表面形成電極12,該電極12通向其他檢測元件(圖未示)。在本實施例中,該電極12分為左右兩塊鋪設於基座10的上表面。The susceptor 10 is located at a lower portion of the light source detecting device 100 for carrying and supporting the light source detecting device 100. The upper surface of the susceptor 10 forms an electrode 12 that leads to other sensing elements (not shown). In the present embodiment, the electrode 12 is divided into two parts, which are laid on the upper surface of the base 10.
所述支撐柱20安裝固定於基座10之上,該支撐柱20大致呈圓柱形,其中部形成有一個通孔21貫穿於該支撐柱20的遠離基座10的上表面和面向基座10的下表面。所述電極12容置於該通孔21中。該通孔21的形狀可為圓形、矩形或正方形等,在本實施例中,該通孔21為圓形。該通孔21的內壁的中間部分沿徑向向內延伸形成一個環形的支撐平臺22。該支撐平臺22將通孔21分隔形成分別位於支撐平臺22上部的第一容置區211和位於支撐平臺22下部的第二容置區212,該第一容置區211和第二容置區212經由支撐平臺22的中空孔洞213連通。該支撐平臺22上開設有小孔221,在本實施例中,該小孔221的數量為兩個,並對稱分佈於該支撐平臺22上,用於穿設測試針40。The support post 20 is mounted and fixed on the base 10 . The support post 20 is substantially cylindrical, and a through hole 21 is formed in the middle portion thereof to penetrate the upper surface of the support post 20 away from the base 10 and face the base 10 . The lower surface. The electrode 12 is received in the through hole 21. The through hole 21 may have a circular shape, a rectangular shape, a square shape, or the like. In the embodiment, the through hole 21 is circular. The intermediate portion of the inner wall of the through hole 21 extends radially inward to form an annular support platform 22. The support platform 22 partitions the through holes 21 into a first accommodating area 211 located at an upper portion of the support platform 22 and a second accommodating area 212 at a lower portion of the support platform 22, the first accommodating area 211 and the second accommodating area 212 is connected via a hollow hole 213 of the support platform 22. The support platform 22 is provided with a small hole 221. In the embodiment, the number of the small holes 221 is two and symmetrically distributed on the support platform 22 for penetrating the test pin 40.
所述升降臺30收容於通孔21的第一容置區211中,其形狀可根據所述支撐柱20的通孔21的形狀進行設計,在本實施例中,該升降臺30呈圓盤形。在其他實施例中,若所述支撐柱20的通孔21呈矩形,則該升降臺30也可相應設計為矩形,以配合裝設於該通孔21中。該升降臺30的遠離基座10的上表面形成有導電區域31。在本實施方式中,該導電區域31分為左右兩塊,並與基座10上的電極12相對應。該升降臺30自靠近基座10的下表面向上開設有盲孔32,該盲孔32對應導電區域31開設並使得導電區域31透過該盲孔32向下露出。該盲孔32的位置和大小與支撐平臺22上的小孔221相對應,用於穿設測試針40。The lifting platform 30 is received in the first accommodating area 211 of the through hole 21, and the shape thereof can be designed according to the shape of the through hole 21 of the supporting column 20. In the embodiment, the lifting table 30 is a disk. shape. In other embodiments, if the through hole 21 of the support post 20 is rectangular, the lifting platform 30 can also be correspondingly designed to be rectangular in shape to fit in the through hole 21 . A conductive region 31 is formed on the upper surface of the lifting platform 30 away from the base 10. In the present embodiment, the conductive region 31 is divided into two blocks, and corresponds to the electrode 12 on the susceptor 10. The lifting platform 30 is provided with a blind hole 32 from the lower surface of the base 10, and the blind hole 32 is opened corresponding to the conductive region 31 and the conductive region 31 is exposed downward through the blind hole 32. The blind hole 32 has a position and size corresponding to the small hole 221 on the support platform 22 for penetrating the test pin 40.
所述測試針40具有相對的頂端41和底端42,該底端42的面積大於頂端41的面積。由於該底端42的面積較大,從而使該測試針40更容易與基座10的電極12接觸以形成良好的電性連接。該測試針40的頂端41分別穿設支撐平臺22的小孔221和升降臺30的盲孔32與導電區域31固定連接。The test pin 40 has an opposite top end 41 and a bottom end 42 having an area greater than the area of the top end 41. Due to the large area of the bottom end 42, the test pin 40 is more easily contacted with the electrode 12 of the base 10 to form a good electrical connection. The top end 41 of the test pin 40 is fixedly connected to the conductive area 31 through the small hole 221 of the support platform 22 and the blind hole 32 of the lifting platform 30, respectively.
該升降臺30由一個彈性元件支撐於基座10之上。在本實施例中,該彈性元件為一個彈簧50,該彈簧50穿設於孔洞213中,其上端和下端分別連接升降臺30和基座10。當然,在其他實施例中,該彈性元件還可為其他具有相同效果的元件。當無其他外力作用於該升降臺30時,該升降臺30在重力作用下壓持於彈簧50之上,並使彈簧50稍微壓縮,此時彈簧50的彈力使得該升降臺30與支撐柱20的上表面大致水準,測試針40的底端42距基座10的電極12的距離與升降臺30的下表面距支撐平臺22的上表面的距離大致相當。The lifting platform 30 is supported on the base 10 by an elastic member. In this embodiment, the elastic member is a spring 50. The spring 50 is disposed in the hole 213, and the upper end and the lower end are respectively connected to the lifting platform 30 and the base 10. Of course, in other embodiments, the elastic element may also be other elements having the same effect. When no external force acts on the lifting platform 30, the lifting platform 30 is pressed against the spring 50 under the force of gravity, and the spring 50 is slightly compressed. At this time, the elastic force of the spring 50 causes the lifting platform 30 and the supporting column 20 The upper surface is substantially level, and the distance from the bottom end 42 of the test pin 40 to the electrode 12 of the base 10 is substantially the same as the distance from the lower surface of the lift table 30 from the upper surface of the support platform 22.
請一併參閱圖3和圖4,所述發光二極體光源70包括發光二極體71和電路板72。該發光二極體71裝設於電路板72上。該電路板72具有相對的上表面和下表面,以及自上表面向下延伸至下表面的電路結構721。該發光二極體71與電路結構721形成電性連接。在本實施例中,該電路結構721分為左右兩塊,並與升降臺30的導電區域31相對應。該兩塊電路結構721之間的間距小於發光二極體71的尺寸,從而保證發光二極體71與電路板72形成良好的電性連接。當然,為了防止電路板72在檢測過程中移位從而影響檢測結果,還可以在電路板72以及升降臺30的相對應位置開設銷釘孔(圖未視),採用銷釘連接固定電路板72的放置位置。Referring to FIG. 3 and FIG. 4 together, the LED light source 70 includes a light emitting diode 71 and a circuit board 72. The light emitting diode 71 is mounted on the circuit board 72. The circuit board 72 has opposing upper and lower surfaces, and a circuit structure 721 extending downwardly from the upper surface to the lower surface. The light emitting diode 71 is electrically connected to the circuit structure 721. In the present embodiment, the circuit structure 721 is divided into two blocks, and corresponds to the conductive region 31 of the lifting platform 30. The spacing between the two circuit structures 721 is smaller than the size of the LEDs 71, thereby ensuring a good electrical connection between the LEDs 71 and the circuit board 72. Of course, in order to prevent the circuit board 72 from being displaced during the detection process and affecting the detection result, a pin hole (not shown) may be opened at a corresponding position of the circuit board 72 and the lifting platform 30, and the pin is used to fix the placement of the circuit board 72. position.
該發光二極體光源70由固定組件60固定於升降臺30上。所述固定組件60包括絕緣壓板61和固定器62。所述絕緣壓板61呈環形,其內圓611直徑小於電路板72的尺寸且大於發光二極體71的尺寸,其外圓612大於支撐柱20的通孔21的直徑並小於支撐柱20的外徑。當然,在其他事實例中,該絕緣壓板61還可為其他中間具有孔洞的板件,其形狀及大小可根據需要進行設定。所述固定器62包括第一旋轉條621和第二旋轉條622、將該第一旋轉條621和第二旋轉條622樞轉連接的中軸623以及鎖定元件(圖未視)。該第一旋轉條621可繞第二旋轉條622轉動,且兩者可在相互呈90°角時經鎖定組件鎖定。所述第二旋轉條622可採用螺釘連接等方式預先固定於支撐柱20的外壁。The light emitting diode light source 70 is fixed to the lifting platform 30 by a fixing assembly 60. The fixing assembly 60 includes an insulating platen 61 and a holder 62. The insulating platen 61 has a ring shape, and the inner circle 611 has a diameter smaller than that of the circuit board 72 and larger than the size of the light emitting diode 71, and the outer circle 612 is larger than the diameter of the through hole 21 of the support column 20 and smaller than the outer side of the support column 20. path. Of course, in other facts, the insulating platen 61 may be other plates having holes in the middle thereof, and the shape and size thereof may be set as needed. The holder 62 includes a first rotating bar 621 and a second rotating bar 622, a central shaft 623 that pivotally connects the first rotating bar 621 and the second rotating bar 622, and a locking member (not shown). The first rotating strip 621 is rotatable about the second rotating strip 622, and both can be locked by the locking assembly when at an angle of 90[deg.] to each other. The second rotating bar 622 may be pre-fixed to the outer wall of the support post 20 by means of a screw connection or the like.
採用本實施方式提供的光源檢測裝置100對發光二極體光源70進行檢測前,先將發光二極體光源70放置於升降臺30上,並使發光二極體光源70的電路板72與升降臺30的導電區域31接觸,從而形成電性連接;再將絕緣壓板61壓持於電路板72的上表面,並將電路板72向下壓,向下的壓力使得彈簧50進一步壓縮,直至升降臺30的下表面與支撐平臺22的上表面接觸,並被支撐平臺22所擋持,此時測試針40的底端42與基座10的電極12緊密接觸,完成電極12與所裝設的發光二極體光源70的電性連接,升降臺30此時亦不能再向下降;最後用固定器62將絕緣壓板61與支撐柱20連接固定,轉動第一旋轉條621使其擋持於絕緣壓板61的上表面,並用鎖定元件將第一旋轉條621鎖定,使絕緣壓板61緊貼於支撐柱20的上表面,從而形成穩定且牢固的電性通路,完成檢測發光二極體光源70之前的安裝準備工作。Before the light source detecting device 100 provided by the present embodiment detects the light emitting diode light source 70, the light emitting diode light source 70 is placed on the lifting platform 30, and the circuit board 72 of the light emitting diode light source 70 is lifted and lowered. The conductive region 31 of the stage 30 is in contact to form an electrical connection; the insulating platen 61 is pressed against the upper surface of the circuit board 72, and the circuit board 72 is pressed downward, and the downward pressure causes the spring 50 to be further compressed until the lift The lower surface of the table 30 is in contact with the upper surface of the support platform 22 and is held by the support platform 22. At this time, the bottom end 42 of the test pin 40 is in close contact with the electrode 12 of the base 10, and the electrode 12 and the mounted electrode 12 are completed. The electrical connection of the light-emitting diode light source 70, the lifting platform 30 can not be lowered again at this time; finally, the insulating platen 61 is fixedly connected with the supporting column 20 by the fixing device 62, and the first rotating strip 621 is rotated to be insulated. The upper surface of the pressure plate 61 is locked with the locking member to lock the first rotating strip 621 so that the insulating pressing plate 61 is in close contact with the upper surface of the support post 20, thereby forming a stable and firm electrical path, before the detection of the light emitting diode light source 70 is completed. Installation standard jobs.
所述升降臺30的上表面為一個開放的空間,藉由向下壓電路板72並對其進行固定從而完成測試針40與電極12的接觸,故對裝設於其上的發光二極體71的尺寸和形狀均不會產生過多的限制,因此該光源檢測裝置100可對多種發光二極體光源70進行檢測,更具通用性。此外,為了更加利於散熱的需要,可採用具有高散熱效率的材料製作電路板72,從而避免了熱量對發光二極體光源70檢測的影響。The upper surface of the lifting platform 30 is an open space, and the contact between the test pin 40 and the electrode 12 is completed by pressing down the circuit board 72 and fixing it, so that the light-emitting diodes mounted thereon are The size and shape of the body 71 are not excessively limited, so the light source detecting device 100 can detect a plurality of light emitting diode light sources 70, which is more versatile. In addition, in order to facilitate the heat dissipation, the circuit board 72 can be made of a material having high heat dissipation efficiency, thereby avoiding the influence of heat on the detection of the LED light source 70.
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
100...光源檢測裝置100. . . Light source detecting device
10...基座10. . . Pedestal
12...電極12. . . electrode
20...支撐柱20. . . Support column
21...通孔twenty one. . . Through hole
211...第一容置區211. . . First accommodating area
212...第二容置區212. . . Second accommodating area
213...孔洞213. . . Hole
22...支撐平臺twenty two. . . Support platform
221...小孔221. . . Small hole
30...升降臺30. . . Lifts
31...導電區域31. . . Conductive area
32...盲孔32. . . Blind hole
40...測試針40. . . Test pin
41...頂端41. . . top
42...底端42. . . Bottom end
50...彈簧50. . . spring
60...固定組件60. . . Fixed component
61...絕緣壓板61. . . Insulating pressure plate
611...內圓611. . . Inner circle
612...外圓612. . . Outer circle
62...固定器62. . . Holder
621...第一旋轉條621. . . First rotating strip
622...第二旋轉條622. . . Second rotating strip
623...中軸623. . . Central axis
70...發光二極體光源70. . . Light-emitting diode source
71...發光二極體71. . . Light-emitting diode
72...電路板72. . . Circuit board
721...電路結構721. . . Circuit configuration
圖1為本發明實施方式的光源檢測裝置的側視示意圖。1 is a side elevational view of a light source detecting device according to an embodiment of the present invention.
圖2為圖1中的光源檢測裝置的俯視示意圖。2 is a top plan view of the light source detecting device of FIG. 1.
圖3為圖1中的光源檢測裝置裝設有發光二極體光源的側視示意圖。3 is a side elevational view showing the light source detecting device of FIG. 1 equipped with a light emitting diode light source.
圖4為圖3中的光源檢測裝置的俯視示意圖。4 is a top plan view of the light source detecting device of FIG. 3.
100...光源檢測裝置100. . . Light source detecting device
10...基座10. . . Pedestal
12...電極12. . . electrode
20...支撐柱20. . . Support column
21...通孔twenty one. . . Through hole
211...第一容置區211. . . First accommodating area
212...第二容置區212. . . Second accommodating area
213...孔洞213. . . Hole
22...支撐平臺twenty two. . . Support platform
221...小孔221. . . Small hole
30...升降臺30. . . Lifts
31...導電區域31. . . Conductive area
32...盲孔32. . . Blind hole
40...測試針40. . . Test pin
41...頂端41. . . top
42...底端42. . . Bottom end
50...彈簧50. . . spring
60...固定組件60. . . Fixed component
Claims (10)
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CN201110058159.5A CN102680913B (en) | 2011-03-11 | 2011-03-11 | Light source detection device |
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TW201237375A TW201237375A (en) | 2012-09-16 |
TWI449885B true TWI449885B (en) | 2014-08-21 |
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TW100108651A TWI449885B (en) | 2011-03-11 | 2011-03-15 | Light source testing device |
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CN (1) | CN102680913B (en) |
TW (1) | TWI449885B (en) |
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CN105157955B (en) * | 2015-09-29 | 2018-11-13 | 佛山市国星光电股份有限公司 | A kind of test device and test method of LED light source |
CN105222990B (en) * | 2015-10-13 | 2018-07-31 | 广州万孚生物技术股份有限公司 | Light-emitting component measurement jig |
CN111537068B (en) * | 2020-05-29 | 2024-03-01 | 福建吉艾普光影科技有限公司 | Portable spectrum detection equipment for lamp panel |
Citations (5)
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JP2007024664A (en) * | 2005-07-15 | 2007-02-01 | Japan Electronic Materials Corp | Vertical coil spring probe, and probe unit using the same |
JP2010078432A (en) * | 2008-09-25 | 2010-04-08 | Nidec-Read Corp | Substrate inspection jig and contactor |
TW201020567A (en) * | 2008-11-24 | 2010-06-01 | Horng Terng Automation Co Ltd | Light emitting diode carrier blade and electricity test platform thereof |
TW201024709A (en) * | 2008-12-19 | 2010-07-01 | Hon Hai Prec Ind Co Ltd | Testing device |
TW201044698A (en) * | 2009-06-01 | 2010-12-16 | Koyotechnos Corp | Electrical contact and inspection fixture with the electrical contact |
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JP2901402B2 (en) * | 1990-12-14 | 1999-06-07 | 群馬日本電気株式会社 | Contact tester and continuity test device using the same |
CN2872364Y (en) * | 2005-12-15 | 2007-02-21 | 郑晓明 | Large-power light emitting diodes measuring tool |
US7812624B1 (en) * | 2009-05-26 | 2010-10-12 | High Power Lighting Corp. | Testing method for LED module |
CN201589834U (en) * | 2009-12-15 | 2010-09-22 | 亚旭电脑股份有限公司 | Detection jig |
CN201583562U (en) * | 2009-12-31 | 2010-09-15 | 郑晓明 | Measuring clamp for bottom surface base pin LED |
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2011
- 2011-03-11 CN CN201110058159.5A patent/CN102680913B/en not_active Expired - Fee Related
- 2011-03-15 TW TW100108651A patent/TWI449885B/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007024664A (en) * | 2005-07-15 | 2007-02-01 | Japan Electronic Materials Corp | Vertical coil spring probe, and probe unit using the same |
JP2010078432A (en) * | 2008-09-25 | 2010-04-08 | Nidec-Read Corp | Substrate inspection jig and contactor |
TW201020567A (en) * | 2008-11-24 | 2010-06-01 | Horng Terng Automation Co Ltd | Light emitting diode carrier blade and electricity test platform thereof |
TW201024709A (en) * | 2008-12-19 | 2010-07-01 | Hon Hai Prec Ind Co Ltd | Testing device |
TW201044698A (en) * | 2009-06-01 | 2010-12-16 | Koyotechnos Corp | Electrical contact and inspection fixture with the electrical contact |
Also Published As
Publication number | Publication date |
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TW201237375A (en) | 2012-09-16 |
CN102680913B (en) | 2014-11-05 |
CN102680913A (en) | 2012-09-19 |
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