JP2901402B2 - Contact tester and continuity test device using the same - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a contact tester and a continuity test apparatus using the same, and more particularly, to a contact tester used for a continuity test of an internal circuit such as a printed circuit board for an electronic circuit and a continuity using the same. It relates to a test device.

[0002]

2. Description of the Related Art A conventional contact tester used for conducting a continuity test of an internal circuit such as a printed circuit board for an electronic circuit is:
The tip of the pin head is brought into mechanical contact with the measurement point of the continuity test on the printed circuit board for electronic circuit, etc., which is the test object, and the contact tester and the printed circuit board for electronic circuit, etc. are electrically connected. It has been used for conducting a continuity test of an electric circuit such as a printed circuit board for an electronic circuit. A test signal is added to a test location on an electric circuit such as a printed circuit board for an electronic circuit via the contact tester, and when the test signal can be extracted from another test location, it is determined that there is continuity, and the signal cannot be extracted. Sometimes it was determined that there was no continuity.

[0003]

In the conventional contact tester described above, poor contact between the contact portion and the test object occurs due to physical distortion such as warpage of the test object such as a printed circuit board for an electronic circuit. Occurs, and the result of the continuity test is that the continuity is judged to be "poor", unless the physical distortion such as warpage of the test object is clearly visible visually. This is not considered to be caused by poor contact with the object, but is considered to be a conduction failure in the electric circuit of the test object, resulting in erroneous determination.

[0004] An object of the present invention is to provide a method for testing the internal circuit of a test object when a test signal applied to a test point of the test object cannot be extracted from another test point. Provided is a contact tester and a continuity test device using the contact tester, which can determine whether the defect is caused by a failure of an electric circuit of the test object or a defective contact state between the contact tester and the test object. It is in.

[0005]

According to a first aspect of the present invention, there is provided a contact tester, wherein a contact portion formed of a conductor is brought into contact with an electric circuit of a test object to form a continuity test circuit. ) said contact tester relay terminals used for transmission relay test signals exchanged between the contact portion and the electric circuit of the test object, is connected to (B) end to the contact portion, the other end A test signal transmission cable connected to the relay terminal; and (C) a contact portion for supporting the contact portion when a contact surface of the contact portion with the test object is pressed against a test location of the test object. A spring acting to press the contact portion against a test portion of the test object by a repulsive force via a support structure; and (D) a first switch provided on the contact portion support structure and constituting one of the contacts of a mechanical switch. (E) the spring and A second electrode that is provided in a contact portion holding housing that houses one end of the contact portion support structure and that is paired with the first electrode and that constitutes the mechanical switch; And display means connected at the other end to the second electrode.

According to a second aspect of the present invention, there is provided a continuity test device, wherein (A) a circuit is formed between the test object and the relay terminal via the conductor of the contact portion when the contact portion is pressed against the test object. Then, a test signal input from the relay terminal is sent to the test object, and a built-in mechanical switch is operated so that the test object and the contact portion are in contact with each other with a sufficient pressure. A first contact tester, which is the contact tester according to claim 1, wherein the first contact tester outputs a first ON signal notifying the fact.
(B) When the contact portion is pressed against the test object, a circuit is formed between the test object and the relay terminal via the conductor of the contact portion, and the circuit is input from the test object. A second ON signal that outputs a test signal from the relay terminal and informs that the built-in mechanical switch is operated and the test object and the contact portion are in contact with each other with sufficient pressure. 2. A second contact tester, which is a contact tester according to claim 1, wherein (C) the presence or absence of the first ON signal received from the first contact tester is determined by a level change of a logic level signal. A first contact detection signal processing unit for outputting as a first contact good / bad detection signal, and (D) a level change of a logical level signal based on whether or not the second ON signal received from the second contact tester is received. And the second contact quality detection signal A second contact detection signal processing unit for outputting, (E) outputting the test signal to the first contact tester, and receiving the first contact quality detection signal from the first contact detection signal processing unit A first test signal processing unit that determines whether the contact state between the test object and the first contact tester is good or not and outputs a first contact good or bad report signal indicating the good or bad contact state; F) receiving the test signal from the second contact tester and receiving the second contact pass / fail detection signal from the second contact detection signal processing unit to perform a second contact test with the test object; A second test signal processing unit that determines the quality of the contact state with the device and outputs a second contact quality report signal indicating the quality of the contact state; (G) the first test signal processing unit Outputting a test signal; and instructing the second test signal processing unit to output the test signal. Instructing the test signal output from the test signal processing unit to be received from the second contact tester, and receiving the first contact pass / fail report signal from the first test signal processing unit; And a contact tester control unit that receives a second contact quality report signal from the second test signal processing unit and determines whether or not the continuity test is successful.

[0007]

Next, a first embodiment of the first invention will be described with reference to the drawings.

FIG. 1 is a sectional view of a connection tester showing a first embodiment of the first invention.

The contact tester shown in FIG. 1 has a pin head 6 having a contact portion 13 for contacting an electric circuit of a test object, a contact portion support structure 5 for supporting the pin head 6, and an electric circuit (not shown) of the test object. ), A terminal (relay terminal) 2 used for transmission relay of an electric signal transmitted and received via the pin head 6, a terminal 3a connected to an external power supply, one end connected to the pin head 6, and the other end When the contact surface 13 of the signal cable (test signal transmission cable) 9 and pin head 6 connected to the terminal 2 and the pin head 6 is pressed against the test portion of the test object, the pin head 6 is repelled by the contact portion support structure 5. A spring 12 acting to press against a test portion of a test object, a pin electrode (first electrode) 11a provided on the contact portion support structure 5 and constituting one of contacts of a mechanical switch,
11b, a spring 12 and a contact part holding housing 4 for accommodating one end of the contact part supporting structure 5, and a contact electrode holding housing 4 having the other end paired with the pin electrode 11a to form a mechanical switch that constitutes a mechanical switch. A terminal 1 connected to an external power supply, a housing electrode (second electrode) 15 provided on the contact portion holding housing 4 and paired with the pin electrode 11b to constitute a mechanical switch; LED electrode 1 having one end connected to housing electrode 15 and the other end connected to terminal 3a
6 comprises an LED lamp 17 mounted on the LED lamp 6.

Next, the operation of this embodiment will be described.

FIG. 2 is a sectional view showing an operation state of the connection tester shown in FIG.

In FIG. 2, first, the user holds the contact portion holding housing 4 and presses the contact surface 13 of the pin head 6 against a test object 7 such as a printed circuit board for an electronic circuit. As a result, the contact portion support structure 5 is pushed up, and the spring 12 is pressed and contracted by the insulating top plate portion 14 of the contact portion support structure 5. By this operation, the pin electrode 11a and the pin electrode 11b contact the housing electrode 10a and the housing electrode 15, respectively, and the terminal 1
A circuit is formed between the terminal and the terminal 3a. Therefore, terminal 1
When power is supplied from the outside between the power supply and the terminal 3a, the power supply causes the LED lamp 17 mounted on the LED electrode 16 to be turned on.
Lights up. By this lighting, it is confirmed that the contact portion is in contact with a certain pressure so that the signal supplied from the terminal 2 is transmitted to the test object via the pin head 6. FIG. 2 shows that the LED lamp 17 is turned on by the pressurization, the signal cable 9 is bent by the contraction of the spring 12, and the pin head 6 is in contact with the tester. When the pen head 6 is released from the test object, the spring 12 returns to the original state, and the LED lamp 17 is turned off.

Next, a second embodiment of the first invention will be described with reference to the drawings.

FIG. 3 is a sectional view of a connection tester showing a second embodiment of the first invention.

The contact tester shown in FIG. 3 has the same configuration as the contact tester shown in FIG. 1 except for a part. That is, when showing the different points, in the contact tester shown in FIG.
LED terminal 17 between the terminal 3a of the
3 is connected, whereas the contact tester shown in FIG. 3 does not have the LED electrode 16 on which the LED lamp 17 is mounted, and the terminal 3b corresponding to the terminal 3a has another end at the housing. An electrode 10b (corresponding to the housing electrode 15 in FIG. 1) is formed, and the housing electrode 10
b.

Next, the operation of this embodiment will be described.

FIG. 4 is a sectional view showing an operation state of the connection tester shown in FIG.

In the operation of the contact tester in FIG. 4, by pressing the contact surface 13 of the pin head 6 against the test object, the housing electrode 10a comes into contact with the pin electrode 11a, and the housing electrode 10b and the pin electrode 11b come into contact with each other. The contact is similar to the operation of the contact tester in FIG. The difference from the operation of the contact tester in FIG. 2 is that the contact between the terminal 1 and the terminal 3b in FIG. 13
Is to be able to take out as electrical signals the information that the object has been securely pressed against the test object. That is, by this conduction,
A part of the circuit connected between the terminal 1 and the terminal 3b is short-circuited. By detecting this short circuit, it can be confirmed that the contact portion is in contact with a sufficient pressure so that the signal supplied to the terminal 2 is transmitted to the test object via the pin head 6.

As described above, in the embodiment shown in FIG. 1, whether or not the contact portion is in contact with a certain pressure is indicated by blinking of the LED lamp 17, but in the embodiment shown in FIG. It is taken out to the outside depending on the presence or absence of conduction between 1 and the terminal 3b.

Next, an embodiment of the second invention will be described with reference to the drawings.

FIG. 5 is a block diagram showing an embodiment of the continuity test device 32 constituted by using the connection tester shown in FIG.

The continuity test device 32 shown in FIG. 5 forms a circuit between the test object and the relay terminal via the conductor of the contact portion when the contact portion is pressed against the test object, and forms a circuit from the relay terminal. The input test signal is sent to the test object, and a built-in mechanical switch is operated to output an ON signal indicating that the test object and the contact portion are in contact with each other with sufficient pressure. The contact tester 22a forms a circuit between the test object and the relay terminal via the conductor of the contact portion when the contact portion is pressed against the test object, and relays a test signal input from the test object. A contact tester 22b and a contact tester 22a that output from a terminal and output an ON signal indicating that a test object and a contact portion are in contact with each other with a sufficient pressure by operating a built-in mechanical switch. Of the ON signal received from A contact detection signal processing unit 24a which indicates the presence or absence of communication by a level change of a logical level signal and outputs it as a contact quality detection signal, and indicates the presence or absence of an ON signal received from the contact tester 22b by a level change of the logic level signal Contact detection signal processing unit 24 that outputs as a detection signal
b, a test signal is output to the contact tester 22a, and a contact quality detection signal is received from the contact detection signal processor 24a to determine the quality of the contact state between the test object and the contact tester 22a. A test signal processing unit 26a that outputs a contact quality report signal indicating the quality of the state, a test signal is received from the contact tester 22b, and a contact quality detection signal is received from the contact detection signal processing unit 24b to make contact with the test object. Tester 22b
A test signal processing unit 26b that determines whether the contact state is good or not and outputs a contact good or bad report signal indicating the good or bad contact state;
The test signal processing unit 26a is instructed to output a test signal, and the test signal processing unit 26b is instructed to output the test signal.
The test signal output from the test signal processing unit 26a is instructed to be received from the test signal processing unit 26a, and the contact quality report signal is received from the test signal processing unit 26b. A contact tester control unit 28 for determining whether or not the test is successful, a test data input device 31 for inputting test data, a display 29 for outputting test results,
It comprises a printer 30 for outputting test results.

In FIG. 5, first, test data is input to the test data input device 31 of the continuity test device 32. The input test data is sent to the contact tester control unit 28,
It is converted into a test signal by the contact tester control unit 28. Also,
The contact tester control unit 28 selects a predetermined contact tester among the contact testers 22a and 22b as a contact tester for transmitting test data. Here, it is assumed that the contact tester 22a is selected. Furthermore, it is assumed that the contact portions of both of the contact test devices 22a and 22b are pressed against the test object 7.

Since the contact tester 22a has been selected,
The contact tester control unit 28 sends a test signal 55a to the test signal processing unit 26a. Further, a direction control signal 56a is transmitted to the test signal processing unit 26a to inform the test signal processing unit 26a that the test signal 55a is a signal output from the contact tester 22a to the test object 7. The test signal processing unit 26a outputs the received test signal 55a as a test signal 54a to the test signal input / output terminal 42a (terminal 2 in FIGS. 3 and 4) of the contact tester 22a according to the direction control signal 56a. The test signal 54a is further transmitted to the test object 7 via the contact tester 22a.

FIG. 6 is a diagram showing a connection state of a circuit between the contact detection signal processing unit and the contact tester of the continuity test device shown in FIG. You.

As shown in FIG. 6A, the current supplied from the power supply Vcc of the contact detection signal processing unit 24a is a resistance R
However, since the housing electrode 10a and the pin electrode 11a inside the contact tester 22a and the housing electrode 10b and the pin electrode 11b are separated from each other, no current flows, and the logic circuit AND Only flows into the gate. AN
As for the input level of the D gate, since the current flows, the “H” level is input, the output of the AND gate is also at the “H” level, and the output of the contact detection signal processing unit 24a is also at the “H” level. It is output as a pass / fail detection signal.
That is, in this case, "H" indicating that there is no contact
A level signal is output.

Next, as shown in FIG. 6B, when the contact tester 22a is in a state where the contact portion is pressed against the test object 7, the housing electrode 10a inside the contact tester 22a is pressed.
And the pin electrode 11a and the housing electrode 10b and the pin electrode 11b are in contact with each other and short-circuited. That is,
The contact tester 22a outputs the ON signal to the contact detection signal processor 24.
a. Housing electrode 10a and pin electrode 1
1a and the short circuit between the housing electrode 10b and the pin electrode 11b form a circuit from the power supply Vcc to the ground, and the current supplied from the power supply Vcc contacts the resistor R as the current 51a. Terminal 4 of tester 22a
1a (terminal 1 in FIGS. 3 and 4), and furthermore, the housing electrode 10a and the pin electrode 1 inside the contact tester 22a.
1a, pin electrode 11b, and housing electrode 10b, terminal 43a of contact tester 22a (terminal 3 in FIGS. 3 and 4).
b), flows again as a current 52a in the ground direction, so that the input of the AND gate is at the "L" level, the output of the AND gate is also at the "L" level, and the test signal processing of the contact detection signal processing unit 24a is performed. The output signal 53a to the unit 26a also changes from "H" level to "L" level.
In this case, an "L" level is output as the contact quality detection signal, indicating that the contact state is good.

FIG. 7 is a circuit diagram showing one embodiment of the circuit of the test signal processing section of the continuity test apparatus shown in FIG.

The signal 53a transmitted to the test signal processing unit 26a and output from the contact detection signal processing unit 24a as a contact quality detection signal is input to the decoder 68 of the test signal processing unit 26a as shown in FIG. You. Also, from the test signal processing circuit 67 to which the test signal 55a and the direction control signal 56a have been input, a signal 58 indicating that the test signal 54a has been transmitted to the contact tester 22a is provided.
Conveyed to.

In the decoder 68, the transmitted signal 53a
Based on the two signals, signal 58 and signal 58, two events are determined as to whether a test signal has been sent to contact tester 22a, and whether contact between contact tester 22a and test object 7 has been performed. It determines which of the four results in total, and transmits a signal 57a indicating the determination result to the contact tester controller 28 as a contact quality report signal.

On the other hand, since the contact tester 22b is also pressed against and touches the test target 7, the test signal 54b transmitted to the test target 7 receives the test signal 54b via the contact portion of the contact tester 22b. 22b. Contact tester 22
b and the test signal is sent to the test signal processing unit 26b as the test signal signal 54b.

The contact detection signal processor 2 of the contact tester 22b
4b, the power supply V inside the contact detection signal processing unit 24b is also used.
When the current supplied from the cc flows in from the terminal 41b of the contact tester 22b as the current 51b and flows out as the current 52b from the terminal 43b, it is detected that the contact is good. A signal 53 which is a contact quality detection signal output from the contact detection signal processing section 24b to the test signal processing section 26b.
b also changes from the “H” level to the “L” level. The signal 53b transmitted to the test signal processing unit 26b is input to the decoder 68 of the test signal processing unit 26b. The test signal 54b is a direction control signal 56b that informs the contact tester 22b that it is a test signal output from the test object 7.
Is transmitted from the contact tester control unit 28 to the test signal processing unit 26b, so that the test signal 54b and the direction control signal 56b
Is transmitted from the test signal processing circuit 67 of the test signal processing unit 26b to the test signal processing unit 2b.
6b to the decoder 68.

The decoder 68 of the test signal processor 26b determines whether or not a test signal is received from the contact tester 22b based on the transmitted two signals, the signal 53b and the signal 59. A judgment is made as to which one of the four results is obtained by combining the two events indicating whether or not the contact with the object 7 is made, and a signal 57b indicating the judgment result is sent to the contact tester control unit 28 to report the quality of the contact. Communicate as a signal.

Next, in the contact tester control section 28, the signals 57a, 57 transmitted from the test signal processing sections 26a, 26b are transmitted.
7b and the test data transmitted from the test data input device 31, pass / fail of the continuity test is determined, and the contents of the pass / fail test and the contact state between the contact testers 22a and 22b and the test object 7 are displayed. 29 and the printer 30
Output.

The contact testers 22a and 22b and the contact detection signal processing sections 24a and 24a shown in FIGS.
24b, the contact detection signal processing unit 24a,
The ground side of the power supply 24b is connected to the terminal 3b side of the contact testers 22a and 22b, and the contact detection signal processing unit 24
a, 24b are connected to the contact testers 22a, 22b.
Although it is connected to the terminal 3b side of 2b, the polarity of this connection may of course be reversed.

FIG. 8 is a diagram showing the types of logic gates for contact detection used in the contact detection signal processing section of the continuity test apparatus shown in FIG.

FIGS. 6A and 6B use the AND gate 33 shown in FIG. 8A as an embodiment of the electric circuit of the contact detection signal processing unit. The NAND gate 34 in FIG. 8B and the O in FIG.
The R gate 35 and the NOR gate 36 shown in FIG. 8D may be used.

As described above, a switch which can operate by the contact pressure between the contact portion and the test object and can output a contact output indicating that the contact portion is in a good contact state is provided inside the contact tester. In the continuity test of the internal circuit of the test object, it is possible to determine whether the contact state between the contact portion and the test object is good or not and to output the information. Even when the test signal supplied to the test point of the object cannot be extracted from the other test points of the test object, it may be due to a defect in the internal circuit of the test object or the contact part and the test object It can be determined whether the contact state is due to a defective contact state.

[0039]

As described above, according to the present invention, the contact tester operates by the contact pressure between the contact portion and the test object and outputs a contact output indicating that the contact is good. By configuring a switch that can perform the continuity test of the internal circuit of the test object, it is possible to determine whether the contact state between the contact portion and the test object is good or not and output the information, During the test, if the test signal applied to the test point of the test object could not be extracted from another test point, it may be due to a defect in the internal circuit of the test object or the contact part and the test object This has the effect that it can be determined whether or not the contact state is bad.

[Brief description of the drawings]

FIG. 1 is a cross-sectional view of a connection tester showing a first embodiment of the first invention.

FIG. 2 is a sectional view showing an operation state of the connection tester shown in FIG.

FIG. 3 is a sectional view of a connection tester showing a second embodiment of the first invention.

FIG. 4 is a sectional view showing an operation state of the connection tester shown in FIG.

FIG. 5 is a block diagram showing one embodiment of a continuity test device configured using the connection tester shown in FIG. 2;

FIG. 6 is a diagram showing a connection state of a circuit between a contact detection signal processing unit and a contact tester of the continuity test device shown in FIG. 5;

FIG. 7 is a circuit diagram showing one embodiment of a circuit of a test signal processing unit of the continuity test device shown in FIG. 5;

8 is a diagram showing types of logic gates for contact detection used in a contact detection signal processing unit of the continuity test device shown in FIG.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 terminal 2 terminal 3a, 3b terminal 4 contact part holding housing 5 contact part support structure 6 pin head 7 test object 9 signal cable 10a, 10b housing electrode 11a, 11b pin electrode 12 spring 13 contact surface 14 insulating top plate part 15 pin electrode Reference Signs List 16 LED electrode 17 LED lamp 18 Holder LED electrode 22a, 22b Contact tester 24a, 24b Contact detection signal processor 26a, 26b Test signal processor 28 Contact tester controller 29 Display 30 Printer 31 Test data input device 32 Continuity test device

Claims (6)

(57) [Claims] 1. A contact tester for forming a continuity test circuit by bringing a contact portion made of a conductor into contact with an electric circuit of a test object, wherein (A) a contact portion of the contact test device and the test object (B) a test signal transmission cable having one end connected to the contact portion and the other end connected to the relay terminal, C) When the contact surface of the contact portion with the test object is pressed against a test portion of the test object, the contact portion is subjected to the test by a repulsive force via a contact portion support structure that supports the contact portion. (D) a first electrode provided on the contact portion support structure and constituting one of the contacts of a mechanical switch; (E) the spring and the contact portion support structure Contact to accommodate one end of A second electrode that is provided on the housing and is paired with the first electrode to form the mechanical switch; (F) one end is connected to the first electrode, and the other end is the second electrode And a display means connected to the contact tester. (A) When the contact portion is pressed against the test object, a circuit is formed between the test object and the relay terminal via the conductor of the contact portion, and a circuit is input from the relay terminal. A first test signal is transmitted to the test object, and a built-in mechanical switch is operated to indicate that the test object and the contact portion are in contact with each other with sufficient pressure.
2. A first contact tester, which is the contact tester according to claim 1, which outputs an ON signal of (B), when the contact portion is pressed against the test object, the test is performed via a conductor of the contact portion. A circuit is configured between the object and the relay terminal to output a test signal input from the test object from the relay terminal, and the built-in mechanical switch operates to operate the test object and the The second contact tester as the contact tester according to claim 1, wherein the second contact tester outputs a second ON signal indicating that the contact portions are in contact with each other with a sufficient pressure. (C) The first contact A first contact detection signal processing unit which indicates whether or not the first ON signal received from the tester has been received by indicating a level change of a logic level signal and outputs the first contact detection signal as a first pass / fail detection signal; Receiving the second ON signal received from the contact tester (E) outputting the test signal to the first contact tester, and outputting the test signal to the first contact tester; The first contact detection signal processing unit receives the first contact quality detection signal to determine the quality of the contact between the test object and the first contact tester, and indicates the quality of the contact. (F) receiving the test signal from the second contact tester, and outputting the second test signal from the second contact detection signal processing unit; Receiving a contact quality detection signal from the test object and determining the quality of the contact state between the test object and the second contact tester, and outputting a second contact quality report signal indicating the quality of the contact state. (G) the first test signal processing unit performs the test Instructs to output No., the relative second test signal processor, said first test signal processing the test signal output from the unit the second
From the contact tester of
A contact tester control unit for receiving a first contact pass / fail report signal from the test signal processing unit, receiving a second contact pass / fail report signal from the second test signal processing unit, and determining whether or not the continuity test is successful; A continuity test device comprising: 3. The continuity test device according to claim 2, wherein
The first and second contact detection signal processing means include a resistor having one end connected to a power supply, and an AND circuit connected to an input terminal short-circuited to the other end of the resistor. A logic signal level to be output is changed when the input terminal of the circuit and the ground side of the power supply are short-circuited and when the input terminal of the AND circuit and the ground side of the power supply are opened by the external circuit. A continuity test device characterized by being configured as follows. 4. The continuity test device according to claim 2, wherein
The first and second contact detection signal processing units each include a resistor having one end connected to a power supply, and a NAND circuit having an input terminal short-circuited to the other end of the resistor, and an NAND circuit connected to an external circuit. A logic signal level to be output is changed when the input terminal of the circuit and the ground side of the power supply are short-circuited and when the input terminal of the NAND circuit and the ground side of the power supply are opened by the external circuit. A continuity test device characterized by being configured as follows. 5. The continuity test device according to claim 2, wherein
The first and second contact detection signal processing means include a resistor having one end connected to a power supply, and an OR circuit having an input terminal short-circuited to the other end of the resistor, and an OR circuit connected to an external circuit. A logic signal level to be output is changed when the input terminal of the circuit and the ground side of the power supply are short-circuited and when the input terminal of the OR circuit and the ground side of the power supply are opened by the external circuit. A continuity test device characterized by being configured as follows. 6. The continuity test device according to claim 2, wherein
The first and second contact detection signal processing means include a resistor having one end connected to a power supply, and a NOR circuit having an input terminal short-circuited to the other end of the resistor, and an NOR circuit connected to an external circuit. The logic signal level to be output is changed when the input terminal of the circuit and the ground side of the power supply are short-circuited and when the input terminal of the NOR circuit and the ground side of the power supply are opened by the external circuit. A continuity test device characterized by being configured as follows.