TWI413774B - Light source testing device - Google Patents

Light source testing device Download PDF

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Publication number
TWI413774B
TWI413774B TW100108190A TW100108190A TWI413774B TW I413774 B TWI413774 B TW I413774B TW 100108190 A TW100108190 A TW 100108190A TW 100108190 A TW100108190 A TW 100108190A TW I413774 B TWI413774 B TW I413774B
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Taiwan
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light source
circuit board
pressure plate
emitting diode
test
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TW100108190A
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Chinese (zh)
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TW201237418A (en
Inventor
Chao Hsiung Chang
Chih Hsun Ke
Shiun Wei Chan
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Advanced Optoelectronic Tech
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Publication of TWI413774B publication Critical patent/TWI413774B/en

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

A light source detecting device used for detecting light-emitting diode light sources comprises a test table. A test pin is mounted in the test table, a light-emitting diode light source comprises a light-emitting diode and a circuit board, a circuit structure is arranged on the circuit board, the light-emitting diode is mounted on the circuit board and electrically connected with the circuit structure, the light-emitting diode light source is mounted on the test table, a first elastic press plate and a second elastic press plate are mounted on the test table and both provided with a fixing end and a suspension arm end, the fixing ends are fixed onto the test table, the suspension arm ends clamp the circuit board, and the circuit structure on the circuit board is electrically connected with the test pin. The light source detecting device is not restricted in sizes and shapes of light sources, and accordingly the light source detecting device can be used for detecting the light-emitting diode light sources various in sizes and shapes.

Description

光源檢測裝置 Light source detecting device

本發明涉及一種光源檢測裝置,特別涉及一種檢測發光二極體光源的光源檢測裝置。 The invention relates to a light source detecting device, in particular to a light source detecting device for detecting a light emitting diode light source.

習知的發光二極體光源檢測裝置通常包括測試臺、旋轉座以及用於檢測發光二極體光源的測試針。旋轉座連接於測試臺底面,該測試臺的頂面開設有一個固定形狀的凹槽,用於放置發光二極體光源。轉動旋轉座可將測試針從測試臺上表面穿設而出並與發光二極體光源的電極接觸,從而進行光源檢測。 Conventional light-emitting diode light source detecting devices generally include a test stand, a rotating base, and a test pin for detecting a light-emitting diode light source. The rotating base is connected to the bottom surface of the test bench, and the top surface of the test stand is provided with a fixed shape groove for placing the light emitting diode light source. Rotating the rotating base can pass the test pin out from the upper surface of the test stand and contact the electrode of the light emitting diode source to perform light source detection.

然而由於測試臺上用於放置發光二極體光源的凹槽其形狀及尺寸已經固定,故該檢測裝置只適用於檢測一定形狀和尺寸的發光二極體光源。此外由於發光二極體光源裝設於凹槽內,如果測試臺採用的材料不具備良好的熱傳導性,則發光二極體光源產生的熱量不易快速消散,從而對測試結果產生不良影響。 However, since the shape and size of the groove for placing the light-emitting diode light source on the test stand has been fixed, the detecting device is only suitable for detecting a light-emitting diode light source of a certain shape and size. In addition, since the light-emitting diode light source is installed in the groove, if the material used in the test bench does not have good thermal conductivity, the heat generated by the light-emitting diode light source is not easily dissipated quickly, thereby adversely affecting the test result.

有鑒於此,有必要提供一種能夠檢測多種形狀及尺寸發光二極體的光源檢測裝置。 In view of the above, it is necessary to provide a light source detecting device capable of detecting a plurality of shapes and sizes of light emitting diodes.

一種用於檢測發光二極體光源的光源檢測裝置,包括測試臺,所 述測試臺內裝設有測試針,所述發光二極體光源包括發光二極體和電路板,該電路板上設有電路結構,該發光二極體裝設於電路板上並與電路結構形成電性連接,所述發光二極體光源裝設於測試臺上,所述測試臺上裝設有具有彈性的第一壓板和第二壓板,該第一壓板和第二壓板均具有固定端和懸臂端,該固定端固定於測試臺上,該懸臂端夾持電路板,該電路板上的電路結構與測試針電性連接。 A light source detecting device for detecting a light emitting diode light source, comprising a test bench The test stand is provided with a test pin, the light emitting diode light source comprises a light emitting diode and a circuit board, and the circuit board is provided with a circuit structure, the light emitting diode is mounted on the circuit board and the circuit structure Forming an electrical connection, the light emitting diode light source is mounted on a test stand, and the test stand is provided with a first pressure plate and a second pressure plate having elasticity, and the first pressure plate and the second pressure plate each have a fixed end And a cantilever end, the fixed end is fixed on the test bench, the cantilever end holds the circuit board, and the circuit structure on the circuit board is electrically connected to the test pin.

採用第一壓板和第二壓板將發光二極體光源壓持固定於測試臺上,對發光二極體的尺寸和形狀不產生限制性作用,故該光源檢測裝置可用於檢測多種形狀和尺寸的發光二極體光源。 The first pressure plate and the second pressure plate are used to press and fix the light emitting diode light source on the test bench, and the size and shape of the light emitting diode are not restricted, so the light source detecting device can be used for detecting various shapes and sizes. Light-emitting diode source.

下面參照圖式,結合具體實施例對本發明作進一步的描述。 The invention will now be further described with reference to the specific embodiments thereof with reference to the drawings.

10、20‧‧‧光源檢測裝置 10, 20‧‧‧Light source detection device

11、21‧‧‧測試臺 11, 21‧‧‧ test bench

111、211‧‧‧頂面 111, 211‧‧‧ top

112‧‧‧底面 112‧‧‧ bottom

113、213‧‧‧通孔 113, 213‧‧‧through holes

114、214‧‧‧測試針 114, 214‧‧‧ test needle

115、215‧‧‧第一壓板 115, 215‧‧‧ first pressure plate

116、216‧‧‧第二壓板 116, 216‧‧‧ second pressure plate

117‧‧‧定位塊 117‧‧‧ Positioning block

12、22‧‧‧基座 12, 22‧‧‧ Pedestal

30‧‧‧發光二極體光源 30‧‧‧Lighting diode source

31‧‧‧發光二極體 31‧‧‧Lighting diode

32、34‧‧‧電路板 32, 34‧‧‧ circuit board

321、341‧‧‧上表面 321, 341‧‧‧ upper surface

322‧‧‧下表面 322‧‧‧ lower surface

323、343‧‧‧電路結構 323, 343‧‧‧ circuit structure

圖1為本發明第一實施方式的光源檢測裝置的俯視示意圖。 1 is a schematic plan view of a light source detecting device according to a first embodiment of the present invention.

圖2為圖1中的光源檢測裝置裝設有發光二極體光源的俯視示意圖。 2 is a top plan view showing the light source detecting device of FIG. 1 with a light emitting diode light source.

圖3為圖2中的光源檢測裝置裝設有發光二極體光源的側視示意圖。 3 is a side elevational view showing the light source detecting device of FIG. 2 equipped with a light emitting diode light source.

圖4為本發明第二實施方式的光源檢測裝置的俯視示意圖。 4 is a schematic plan view of a light source detecting device according to a second embodiment of the present invention.

圖5為圖4中的光源檢測裝置裝設有發光二極體光源的俯視示意圖。 FIG. 5 is a top plan view showing the light source detecting device of FIG. 4 equipped with a light emitting diode light source.

圖6為圖5中的光源檢測裝置裝設有發光二極體光源的側視示意圖 。 6 is a side view of the light source detecting device of FIG. 5 equipped with a light emitting diode light source. .

請一併參閱圖1至圖3,本發明第一實施方式提供的一種光源檢測裝置10包括測試臺11和基座12,用於對發光二極體光源30進行檢測。 Referring to FIG. 1 to FIG. 3 , a light source detecting device 10 according to a first embodiment of the present invention includes a test stand 11 and a susceptor 12 for detecting the light emitting diode light source 30 .

所述發光二極體光源30包括發光二極體31和電路板32。該發光二極體31裝設於電路板32上。該電路板32具有相對的上表面321和下表面322,以及自上表面321向下延伸至下表面322的電路結構323。該發光二極體31與電路結構323形成電性連接。在本實施例中,該電路結構323分為左右兩塊,兩者間距小於發光二極體31的尺寸,從而保證發光二極體31與電路板32的電性連接。 The light emitting diode light source 30 includes a light emitting diode 31 and a circuit board 32. The light emitting diode 31 is mounted on the circuit board 32. The circuit board 32 has opposing upper and lower surfaces 321 and 322, and a circuit structure 323 extending downwardly from the upper surface 321 to the lower surface 322. The light emitting diode 31 is electrically connected to the circuit structure 323. In this embodiment, the circuit structure 323 is divided into two blocks, and the spacing between the two is smaller than the size of the LEDs 31, thereby ensuring electrical connection between the LEDs 31 and the circuit board 32.

所述測試臺11用於放置發光二極體光源30。該測試臺11具有相對的頂面111和底面112,以及兩個貫穿該頂面111和底面112的通孔113。該測試臺11大致呈圓柱體。在本實施方式中,該通孔113的數量為兩個,當然在其他實施方式中,可根據需要設置通孔113的數量。該兩通孔113對稱分佈於該頂面111上,並與前述電路結構323的位置相對應。該通孔113用於裝設測試針114。 The test stand 11 is used to place the light emitting diode source 30. The test stand 11 has opposing top faces 111 and bottom faces 112, and two through holes 113 extending through the top face 111 and the bottom face 112. The test stand 11 is generally cylindrical. In the present embodiment, the number of the through holes 113 is two. Of course, in other embodiments, the number of the through holes 113 may be set as needed. The two through holes 113 are symmetrically distributed on the top surface 111 and correspond to the position of the foregoing circuit structure 323. The through hole 113 is for mounting the test pin 114.

所述測試針114穿設於該通孔113並露出於頂面111和底面112。在本實施方式中,測試針114的數量為兩個,分別穿設兩個通孔113。當測試臺11上裝設電路板32後,該測試針114藉由通孔113抵靠於與電路板32的電路結構323,從而與該電路板32形成電性連接,進而可對發光二極體31進行檢測。 The test pin 114 is disposed through the through hole 113 and exposed to the top surface 111 and the bottom surface 112. In the present embodiment, the number of the test pins 114 is two, and two through holes 113 are respectively bored. When the circuit board 32 is mounted on the test board 11, the test pin 114 is electrically connected to the circuit board 32 through the through hole 113, thereby forming an electrical connection with the circuit board 32, thereby enabling the light emitting diode Body 31 is tested.

所述測試臺11的頂面111上裝設有第一壓板115、第二壓板116和定位塊117。所述測試臺11的底面112與基座12的上表面貼合連接,以使所述測試臺11固定於該基座12上。 A first pressure plate 115, a second pressure plate 116, and a positioning block 117 are mounted on the top surface 111 of the test table 11. The bottom surface 112 of the test stand 11 is attached to the upper surface of the base 12 to fix the test stand 11 to the base 12.

所述第一壓板115和第二壓板116分別位於兩通孔113的外側,第一壓板115和第二壓板116兩者之間的距離大於所需放入的電路板32的寬度。第一壓板115和第二壓板116的遠離通孔113的一端固定於頂面111上形成固定端,未固定的一端形成懸臂端。該第一壓板115和第二壓板116可採用彈性材料,例如,具有彈性的金屬材料,從而使該懸臂端可上下撥動。當向上拉動懸臂端時,可使第一壓板115、第二壓板116與頂面111之間的間距增大,從而從側面將電路板32推置於第一壓板115和第二壓板116之下;然後鬆開懸臂端,使其將電路板32夾緊,由此限制電路板32沿第一壓板115和第二壓板116的連線方向的位移。在本實施方式中,第一壓板115和第二壓板116的固定方式為螺釘連接固定。在其他實施方式中,還可以採用焊接等方式將第一壓板115和第二壓板116的固定端固定於頂面111上。 The first pressure plate 115 and the second pressure plate 116 are respectively located outside the two through holes 113, and the distance between the first pressure plate 115 and the second pressure plate 116 is greater than the width of the circuit board 32 to be placed. One end of the first pressure plate 115 and the second pressure plate 116 away from the through hole 113 is fixed to the top surface 111 to form a fixed end, and the unfixed end forms a cantilever end. The first pressure plate 115 and the second pressure plate 116 may be made of an elastic material, for example, a resilient metal material, so that the cantilever end can be toggled up and down. When the cantilever end is pulled upward, the spacing between the first platen 115, the second platen 116, and the top surface 111 can be increased, thereby pushing the circuit board 32 from the side below the first platen 115 and the second platen 116. The cantilever end is then released to clamp the circuit board 32, thereby limiting the displacement of the circuit board 32 along the line direction of the first pressure plate 115 and the second pressure plate 116. In the present embodiment, the fixing manner of the first pressure plate 115 and the second pressure plate 116 is a screw connection. In other embodiments, the fixed ends of the first pressure plate 115 and the second pressure plate 116 may be fixed to the top surface 111 by welding or the like.

所述定位塊117裝設於頂面111上,並平行於第一壓板115和第二壓板116的連線。在將電路板32從側面推入第一壓板115和第二壓板116之下的過程中,當所述電路板32沿垂直於第一壓板115和第二壓板116連線的方向推動至抵靠於定位塊117後即不能再向前推動,從而對電路板32進行限位。 The positioning block 117 is mounted on the top surface 111 and parallel to the connection between the first pressure plate 115 and the second pressure plate 116. In the process of pushing the circuit board 32 from the side below the first pressure plate 115 and the second pressure plate 116, when the circuit board 32 is pushed to abut in a direction perpendicular to the line connecting the first pressure plate 115 and the second pressure plate 116 After the positioning block 117, it can no longer be pushed forward, thereby limiting the circuit board 32.

所述基座12的上表面與測試針114接觸連接並形成電性連接,並通向其他檢測元件(圖未示)。 The upper surface of the susceptor 12 is in contact with the test pin 114 and is electrically connected to other detecting elements (not shown).

採用本實施方式提供的光源檢測裝置10對發光二極體光源30進行檢測前,首先拉開第一壓板115和第二壓板116,使第一壓板115和第二壓板116與測試臺11的頂面111保持足以容納電路板32厚度的距離;然後從側面將電路板32推入第一壓板115和第二壓板116之下,並保持電路板32的電路結構323與露出於頂面111的測試針114相接觸;鬆開第一壓板115和第二壓板116,將電路板32固定於測試臺11上。此時測試針114與發光二極體31形成電性連接,操作電源等即可實現對發光二極體31的檢測。 Before the light source detecting device 10 of the present embodiment detects the light emitting diode light source 30, the first pressure plate 115 and the second pressure plate 116 are first pulled apart, so that the first pressure plate 115 and the second pressure plate 116 and the top of the test bench 11 are The face 111 maintains a distance sufficient to accommodate the thickness of the circuit board 32; then the circuit board 32 is pushed from below into the first platen 115 and the second platen 116, and the circuit structure 323 of the circuit board 32 is maintained and exposed to the top surface 111. The needles 114 are in contact; the first platen 115 and the second platen 116 are loosened to secure the circuit board 32 to the test stand 11. At this time, the test pin 114 is electrically connected to the light-emitting diode 31, and the detection of the light-emitting diode 31 can be realized by operating a power source or the like.

所述測試臺11的頂面111為一個開放的空間,只對電路板32進行卡持和限位,故對裝設於其上的發光二極體31的尺寸和形狀均不會產生限制性影響,因此該光源檢測裝置10可對多種發光二極體光源30進行檢測,更具通用性。此外,為了更加利於散熱的需要,可採用具有高散熱效率的材料製作電路板,從而避免了熱量對發光二極體光源30檢測的影響。 The top surface 111 of the test stand 11 is an open space, and only the circuit board 32 is clamped and limited, so that the size and shape of the LEDs 31 mounted thereon are not limited. Therefore, the light source detecting device 10 can detect a plurality of light emitting diode light sources 30, which is more versatile. In addition, in order to better facilitate the heat dissipation, the circuit board can be made of a material having high heat dissipation efficiency, thereby avoiding the influence of heat on the detection of the light-emitting diode light source 30.

本實施方式提供的光源檢測裝置10直接將電路板32與測試針114接觸,從而實現發光二極體31與基座12的電性連接,從而實現對發光二極體光源30的檢測。 The light source detecting device 10 provided in the present embodiment directly contacts the circuit board 32 and the test pin 114, thereby electrically connecting the light emitting diode 31 and the susceptor 12, thereby realizing detection of the light emitting diode light source 30.

請一併參閱圖4至圖6,本發明第二實施方式提供的一種光源檢測裝置20包括測試臺21和基座22,用於對發光二極體光源30進行檢測。 Referring to FIG. 4 to FIG. 6 , a light source detecting device 20 according to a second embodiment of the present invention includes a test stand 21 and a base 22 for detecting the light emitting diode light source 30 .

所述發光二極體光源30包括發光二極體31和電路板34。該電路板34的上表面341形成有電路結構343。 The light emitting diode light source 30 includes a light emitting diode 31 and a circuit board 34. The upper surface 341 of the circuit board 34 is formed with a circuit structure 343.

所述測試臺21與第一實施方式中的測試臺11的區別在於,該測試臺21自頂面211向下形成的兩通孔213之間的距離大於所需裝設的電路板34的寬度。所述測試臺21上裝設的第一壓板215和第二壓板216均採用導電材料製成,測試針214穿過頂面211抵靠於第一壓板215和第二壓板216的固定端並形成電性連接。該電路板32的上表面壓持於第一壓板215和第二壓板216的懸臂端之下,並藉由第一壓板215和第二壓板216使得電路結構343與測試針214形成電性連接。 The test stand 21 is different from the test stand 11 in the first embodiment in that the distance between the two through holes 213 formed by the test stand 21 from the top surface 211 is greater than the width of the circuit board 34 to be mounted. . The first pressure plate 215 and the second pressure plate 216 mounted on the test stand 21 are all made of a conductive material, and the test pin 214 passes through the top surface 211 against the fixed ends of the first pressure plate 215 and the second pressure plate 216 and is formed. Electrical connection. The upper surface of the circuit board 32 is pressed under the cantilever ends of the first pressure plate 215 and the second pressure plate 216, and the circuit structure 343 is electrically connected to the test pin 214 by the first pressure plate 215 and the second pressure plate 216.

第二實施方式提供的光源檢測裝置20將第一壓板215和第二壓板216作為導通電路板34和測試針214的中間元件,同樣使得發光二極體光源30與下部基座22形成電性連接,從而實現對發光二極體光源30的檢測。 The light source detecting device 20 provided by the second embodiment uses the first pressing plate 215 and the second pressing plate 216 as intermediate elements of the conducting circuit board 34 and the test pin 214, and also electrically connects the LED light source 30 and the lower base 22 . Thereby, detection of the light-emitting diode light source 30 is achieved.

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

111‧‧‧頂面 111‧‧‧ top surface

112‧‧‧底面 112‧‧‧ bottom

113‧‧‧通孔 113‧‧‧through hole

114‧‧‧測試針 114‧‧‧Test pin

115‧‧‧第一壓板 115‧‧‧First pressure plate

116‧‧‧第二壓板 116‧‧‧Second platen

12‧‧‧基座 12‧‧‧ Pedestal

30‧‧‧發光二極體光源 30‧‧‧Lighting diode source

31‧‧‧發光二極體 31‧‧‧Lighting diode

32‧‧‧電路板 32‧‧‧ boards

321‧‧‧上表面 321‧‧‧ upper surface

322‧‧‧下表面 322‧‧‧ lower surface

323‧‧‧電路結構 323‧‧‧Circuit structure

Claims (8)

一種光源檢測裝置,用於檢測發光二極體光源,包括測試臺,所述測試臺內裝設有測試針,所述發光二極體光源包括發光二極體和電路板,該電路板上設有電路結構,該發光二極體裝設於電路板上並與電路結構形成電性連接,所述發光二極體光源裝設於測試臺上,其改良在於:所述測試臺上裝設有具有彈性的第一壓板和第二壓板,該第一壓板和第二壓板均具有固定端和懸臂端,該固定端固定於測試臺上,該懸臂端夾持電路板,該電路板上的電路結構與測試針電性連接,所述發光二極體對應兩測試針,每一測試針穿設測試臺與發光二極體電性連接。 A light source detecting device for detecting a light emitting diode light source, comprising a test stand, wherein the test stand is provided with a test pin, the light emitting diode light source comprises a light emitting diode and a circuit board, and the circuit board is provided a circuit structure, the light emitting diode is mounted on the circuit board and electrically connected to the circuit structure, and the light emitting diode light source is mounted on the test bench, and the improvement is that the test bench is mounted a first pressure plate and a second pressure plate having elasticity, the first pressure plate and the second pressure plate each have a fixed end and a cantilever end, the fixed end is fixed on the test bench, the cantilever end clamps the circuit board, and the circuit on the circuit board The structure is electrically connected to the test pin. The light-emitting diodes correspond to two test pins, and each test pin passes through the test stand and is electrically connected to the light-emitting diode. 如申請專利範圍第1項所述的光源檢測裝置,其中,所述測試臺具有相對設置的頂面和底面,以及貫穿該頂面和底面的通孔,每一個測試針穿設於每一個通孔內並露出於頂面和底面。 The light source detecting device of claim 1, wherein the test stand has a top surface and a bottom surface disposed opposite to each other, and a through hole penetrating the top surface and the bottom surface, each of the test pins being disposed through each of the through holes The holes are exposed to the top and bottom surfaces. 如申請專利範圍第2項所述的光源檢測裝置,其中,所述通孔之間的距離小於電路板的寬度。 The light source detecting device of claim 2, wherein a distance between the through holes is smaller than a width of the circuit board. 如申請專利範圍第3項所述的光源檢測裝置,其中,所述電路結構自電路板裝設有發光二極管的上表面延伸至遠離上表面的下表面,所述測試針穿過測試臺的頂面抵靠於電路板的下表面並與電路結構形成電性連接。 The light source detecting device of claim 3, wherein the circuit structure extends from an upper surface of the circuit board on which the light emitting diode is mounted to a lower surface away from the upper surface, and the test pin passes through the top of the test bench. The surface abuts against the lower surface of the circuit board and is electrically connected to the circuit structure. 如申請專利範圍第1項所述的光源檢測裝置,其中,所述第一壓板和第二壓板採用金屬材料製成。 The light source detecting device according to claim 1, wherein the first pressure plate and the second pressure plate are made of a metal material. 如申請專利範圍第2項所述的光源檢測裝置,其中,所述通孔之 間的距離大於電路板的寬度。 The light source detecting device of claim 2, wherein the through hole The distance between them is greater than the width of the board. 如申請專利範圍第6項所述的光源檢測裝置,其中,所述電路結構形成於電路板的上表面,所述測試針穿過測試臺的頂面分別抵靠於第一壓板和第二壓板的固定端,所述第一壓板和第二壓板採用導電材料製成,所述該第一壓板和第二壓板的懸臂端壓持於電路板的上表面,並將電路結構與測試針電性連接。 The light source detecting device of claim 6, wherein the circuit structure is formed on an upper surface of the circuit board, and the test pins pass through the top surface of the test stand against the first pressure plate and the second pressure plate, respectively. The first pressure plate and the second pressure plate are made of a conductive material, and the cantilever ends of the first pressure plate and the second pressure plate are pressed against the upper surface of the circuit board, and the circuit structure and the test pin are electrically connected. connection. 如申請專利範圍第1項所述的光源檢測裝置,其中,所述測試臺上還裝設有一個定位塊,該定位塊平行於第一壓板和第二壓板的連線方向,所述電路板抵靠於該定位塊。 The light source detecting device of claim 1, wherein the test stand is further provided with a positioning block parallel to the connecting direction of the first pressing plate and the second pressing plate, the circuit board Resist on the positioning block.
TW100108190A 2011-03-09 2011-03-11 Light source testing device TWI413774B (en)

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