TWI448708B - - Google Patents

Info

Publication number
TWI448708B
TWI448708B TW101103399A TW101103399A TWI448708B TW I448708 B TWI448708 B TW I448708B TW 101103399 A TW101103399 A TW 101103399A TW 101103399 A TW101103399 A TW 101103399A TW I448708 B TWI448708 B TW I448708B
Authority
TW
Taiwan
Application number
TW101103399A
Other languages
Chinese (zh)
Other versions
TW201333494A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW101103399A priority Critical patent/TW201333494A/zh
Priority to US13/450,460 priority patent/US8884640B2/en
Priority to CN201210116993.XA priority patent/CN102759701B/zh
Priority to KR1020120044689A priority patent/KR101393175B1/ko
Publication of TW201333494A publication Critical patent/TW201333494A/zh
Application granted granted Critical
Publication of TWI448708B publication Critical patent/TWI448708B/zh
Priority to US14/506,146 priority patent/US9519010B2/en

Links

TW101103399A 2011-04-28 2012-02-02 整合式高速測試模組 TW201333494A (zh)

Priority Applications (5)

Application Number Priority Date Filing Date Title
TW101103399A TW201333494A (zh) 2012-02-02 2012-02-02 整合式高速測試模組
US13/450,460 US8884640B2 (en) 2011-04-28 2012-04-18 Integrated high-speed probe system
CN201210116993.XA CN102759701B (zh) 2011-04-28 2012-04-19 整合式高速测试模块
KR1020120044689A KR101393175B1 (ko) 2011-04-28 2012-04-27 집적 고속 프로브 시스템
US14/506,146 US9519010B2 (en) 2011-04-28 2014-10-03 Integrated high-speed probe system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101103399A TW201333494A (zh) 2012-02-02 2012-02-02 整合式高速測試模組

Publications (2)

Publication Number Publication Date
TW201333494A TW201333494A (zh) 2013-08-16
TWI448708B true TWI448708B (enExample) 2014-08-11

Family

ID=49479489

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101103399A TW201333494A (zh) 2011-04-28 2012-02-02 整合式高速測試模組

Country Status (1)

Country Link
TW (1) TW201333494A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI548880B (zh) * 2014-05-15 2016-09-11 漢民科技股份有限公司 探針卡之電路板

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070145988A1 (en) * 2005-12-22 2007-06-28 Touchdown Technologies, Inc. Probe card assembly
TW200813436A (en) * 2006-09-13 2008-03-16 Microelectonics Technology Inc High frequency cantilever probe card

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070145988A1 (en) * 2005-12-22 2007-06-28 Touchdown Technologies, Inc. Probe card assembly
TW200813436A (en) * 2006-09-13 2008-03-16 Microelectonics Technology Inc High frequency cantilever probe card

Also Published As

Publication number Publication date
TW201333494A (zh) 2013-08-16

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