TWI447376B - Method for measuring sealant strength of lcd panel and measuring apparatus thereof - Google Patents

Method for measuring sealant strength of lcd panel and measuring apparatus thereof Download PDF

Info

Publication number
TWI447376B
TWI447376B TW100116327A TW100116327A TWI447376B TW I447376 B TWI447376 B TW I447376B TW 100116327 A TW100116327 A TW 100116327A TW 100116327 A TW100116327 A TW 100116327A TW I447376 B TWI447376 B TW I447376B
Authority
TW
Taiwan
Prior art keywords
substrate
thrust mechanism
exposed surface
suction device
suction
Prior art date
Application number
TW100116327A
Other languages
Chinese (zh)
Other versions
TW201245688A (en
Inventor
Cheng Lung Wei
You Wang
Po Wen Teng
Shi I Lu
Chiao Chung Huang
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW100116327A priority Critical patent/TWI447376B/en
Priority to CN201110186701.5A priority patent/CN102262049B/en
Publication of TW201245688A publication Critical patent/TW201245688A/en
Application granted granted Critical
Publication of TWI447376B publication Critical patent/TWI447376B/en

Links

Landscapes

  • Adhesives Or Adhesive Processes (AREA)
  • Liquid Crystal (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

面板框膠強度檢測方法與檢測設備Panel frame glue strength detection method and testing equipment

本發明係有關一種檢測方法與檢測設備,尤指一種檢測面板框膠強度的檢測方法與檢測設備。The invention relates to a detection method and a detection device, in particular to a detection method and a detection device for detecting the frame glue strength of a panel.

傳統的面板單元(cell)的框膠強度的測試方式是在面板單元的兩片基板(彩色濾光片玻璃基板以及薄膜電晶體陣列玻璃基板)的兩側分別黏上拉力機構的測頭,其中一側的測頭固定不動,另一側的測頭則以固定速度向外拉動直到基板分開(peeling)時,記錄拉力機構所讀取的數值即為面板框膠的強度。The test method of the frame strength of a conventional panel unit is to apply a probe of a tension mechanism on both sides of a two-piece substrate (a color filter glass substrate and a thin film transistor array glass substrate) of the panel unit, wherein The probe on one side is fixed, and the probe on the other side is pulled outward at a fixed speed until the substrate is peeled. The value read by the tension mechanism is the strength of the panel seal.

進行框膠強度測試前,於拉力機構的測頭固定程序中,首先需將面板單元的上下偏光板移除,並以酒精擦拭基板中欲測試的位置以及拉力機構的測頭部分。接著在測頭上以人工塗上瞬間膠後,將一測頭黏於彩色濾光片玻璃基板上,另一測頭黏於薄膜電晶體陣列玻璃基板上,並輕壓一定時間。這樣的測試方式要求兩測頭的中心應在同一中心軸上,然而這種以人工黏合的方式,往往無法確保基板兩側的測頭準確位於同一中心軸上。請參考第1圖,第1圖即為先前技術的拉力機構的測頭固定於面板單元的基板上的示意圖。在第1圖中,拉力機構的一測頭32黏合於第一基板10上,另一測頭34黏合於第二基板20上,雖然在黏合拉力機構的測頭32、34時,需注意讓兩測頭32、34的中心盡量在同一中心軸上,但如第1圖的配置1所示,由於人工黏合所產生的誤差,往往使測頭32的軸線A1 與測頭34的軸線A2 無法位於同一中心軸上。另一方面,測頭32、34與基板10、20之間的瞬間膠用量以及均勻度也無法獲得有效的標準化控制,點膠的不均勻也會造成拉力機構的測頭32、34歪斜,無法以垂直於基板10、20的方向黏合,如第1圖的配置2中,測頭32以及測頭34的軸線A3 、A4 即因點膠不均勻而彼此歪斜,無法位於同一中心軸上。Before performing the frame glue strength test, in the probe fixing procedure of the tension mechanism, firstly, the upper and lower polarizing plates of the panel unit are removed, and the position to be tested in the substrate and the probe portion of the tension mechanism are wiped with alcohol. Then, after manually applying the instant glue on the probe, a probe is adhered to the color filter glass substrate, and the other probe is adhered to the thin film transistor array glass substrate and pressed for a certain time. Such a test method requires that the centers of the two probes should be on the same central axis. However, in the case of manual bonding, it is often impossible to ensure that the probes on both sides of the substrate are exactly on the same central axis. Please refer to FIG. 1 , which is a schematic diagram of the probe of the prior art tension mechanism fixed on the substrate of the panel unit. In the first figure, a probe 32 of the tension mechanism is bonded to the first substrate 10, and the other probe 34 is bonded to the second substrate 20. Although the probes 32 and 34 of the tension mechanism are bonded, care must be taken. The centers of the two probes 32, 34 are as close as possible to the same central axis, but as shown in the configuration 1 of Fig. 1, the axis A 1 of the probe 32 and the axis A of the probe 34 are often caused by errors caused by manual bonding. 2 cannot be on the same center axis. On the other hand, the instantaneous amount of glue and the uniformity between the probes 32, 34 and the substrates 10, 20 cannot be effectively standardized. The unevenness of the dispensing may also cause the probes 32, 34 of the tension mechanism to be skewed. Bonding in a direction perpendicular to the substrates 10, 20, as in the arrangement 2 of Fig. 1, the axes A 3 and A 4 of the probe 32 and the probe 34 are skewed from each other due to uneven dispensing, and cannot be located on the same central axis. .

此外,這種在測頭與基板之間以瞬間膠黏合的方式,為確保拉力機構的測頭能牢固黏合在基板上,當黏合時需要以人工施加特定的力量一段時間,且接著需等候測頭上的瞬間膠風乾一小時以上,使測頭與基板之間黏合效果更佳才能進行框膠強度的測試。以上的問題均會影響基板之間的框膠強度的量測結果,同時增加測試所需的時間。In addition, in the manner of instant adhesive bonding between the probe and the substrate, in order to ensure that the probe of the tension mechanism can be firmly adhered to the substrate, it is necessary to manually apply a specific force for a certain period of time when bonding, and then wait for the test. The instant glue on the head is dried for more than one hour, so that the bonding effect between the probe and the substrate is better to test the seal strength. All of the above problems will affect the measurement results of the sealant strength between the substrates, and increase the time required for the test.

本發明提供一種面板框膠強度檢測方法。於一面板單元中包含一第一基板以及一第二基板,該第一基板的一第一側以及該第二基板的一第二側間以框膠接合。該檢測方法包含有:以一吸引裝置沿一第一方向吸引該第一基板上相對於該第一側的一第三側以固定該第一基板;以一推力機構沿著該第一方向之相反方向推抵該第二基板的該第二側;以及當該推力機構推抵該第二基板直到該第二基板自該第一基板剝離時,記錄該推力機構的一力量數值。The invention provides a method for detecting the strength of a panel sealant. A first substrate and a second substrate are included in a panel unit, and a first side of the first substrate and a second side of the second substrate are joined by a frame. The detecting method includes: attracting a third side of the first substrate relative to the first side in a first direction to fix the first substrate; and a thrust mechanism along the first direction The opposite direction is pushed against the second side of the second substrate; and when the thrust mechanism pushes against the second substrate until the second substrate is peeled off from the first substrate, a force value of the thrust mechanism is recorded.

本發明另提供一種面板框膠強度的檢測設備。於一面板單元中包含一第一基板以及一第二基板,該第一基板的一第一側以及該第二基板的一第二側間以框膠接合。該檢測設備包含有一吸引裝置以及一推力機構。該吸引裝置用來沿一第一方向吸引該第一基板上相對於該第一側的一第三側以固定該第一基板。該推力機構用來沿該第一方向之相反方向推抵該第二基板的該第二側,並直到該第二基板自該第一基板剝離時,產生一力量數值。The invention further provides a device for detecting the strength of a panel seal. A first substrate and a second substrate are included in a panel unit, and a first side of the first substrate and a second side of the second substrate are joined by a frame. The detection device includes a suction device and a thrust mechanism. The attracting device is configured to attract a third side of the first substrate relative to the first side in a first direction to fix the first substrate. The thrust mechanism is configured to push against the second side of the second substrate in the opposite direction of the first direction, and generate a force value until the second substrate is peeled off from the first substrate.

本發明所提供的檢測設備以及檢測方法,在使用真空吸引裝置以及推力機構沿著相反方向作動於面板單元的兩個基板時,即可獲得具有低誤差的膠框強度測試結果。真空吸引裝置的固定方式免去以人工上膠產生的誤差,真空吸引裝置及推力機構在面板單元同一側也由於不需同軸作用下,以更簡單的固定方式獲得更準確的結果。The detecting device and the detecting method provided by the present invention can obtain the frame strength test result with low error when the vacuum suction device and the thrust mechanism are used to act on the two substrates of the panel unit in opposite directions. The fixing method of the vacuum suction device eliminates the error caused by manual sizing, and the vacuum suction device and the thrust mechanism also obtain more accurate results in a simpler fixing manner on the same side of the panel unit as there is no need for coaxial action.

請參考第2圖,第2圖為面板單元100的第一基板40以及第二基板50以框膠60黏合後的示意圖。第一基板40較佳地為彩色濾光層(color filter,CF)基材,第二基板50較佳地為薄膜電晶體陣列(thin film transistor,TFT)基材,在第一基板40的一第一側41以及第二基板50的一第二側52的相對應四周之間塗佈框膠60,使第一基板40的第一側41以及第二基板50的第二側52沿著F1 F2 方向彼此接合以形成面板單元100。第一基板40相對第一側41具有一第三側43,在第二基板50的第二側52上則具有一露出面55。當第一基板40與第二基板50接合時,第一基板40不會覆蓋於露出面55上。Please refer to FIG. 2 . FIG. 2 is a schematic view showing the first substrate 40 and the second substrate 50 of the panel unit 100 bonded by the sealant 60 . The first substrate 40 is preferably a color filter (CF) substrate, and the second substrate 50 is preferably a thin film transistor (TFT) substrate, one of the first substrate 40 The sealant 60 is applied between the first side 41 and the corresponding circumference of a second side 52 of the second substrate 50 such that the first side 41 of the first substrate 40 and the second side 52 of the second substrate 50 follow the F The 1 F 2 directions are joined to each other to form the panel unit 100. The first substrate 40 has a third side 43 opposite the first side 41 and an exposed side 55 on the second side 52 of the second substrate 50. When the first substrate 40 is bonded to the second substrate 50, the first substrate 40 does not cover the exposed surface 55.

請參考第3圖以及第4圖,其中第3圖為本發明所揭露的一檢測設備200作用於面板單元100的側視示意圖,第4圖則為第3圖中沿著一第二方向F2 面對第一基板40的第三側43以及第二基板50的露出面55的正視示意圖。在本發明的實施例中,檢測設備200包含有一吸引裝置70以及一推力機構80,吸引裝置70較佳地為利用真空產生吸力的真空吸引裝置,其可以真空轉換器將壓縮空氣系統中的CDA(clean/compressed dry air)轉換成真空,以吸住面板單元100的基板。如第3圖以及第4圖所示,吸引裝置70可具有一吸盤72,針對如第2圖所示的面板單元100,吸盤72在一第一軸線A5 上,沿著圖中的第一方向F1 吸住第一基板40的第三側43以固定第一基板40。從第4圖的正視示意圖可看到,吸引裝置70的吸盤72較佳地設置在第一基板40的第三側43鄰近於第二基板50的露出面55的兩個端角46、47其中一端角,例如在第4圖的實施例中,吸盤72設置在端角46上,且吸盤72的邊緣與第一基板40形成端角46的相鄰兩側邊44、45實質上切齊。由於實務上,圓形吸盤72可容易切齊第一基板40的相鄰側邊44、45,如此一來,吸引裝置70的吸盤72可快速且有效地設置在第一基板40的塗佈框膠的邊緣,而其以形成真空吸力的方式固定第一基板40亦可達到以相當短的時間即可有效固定的作用。Please refer to FIG. 3 and FIG. 4 , wherein FIG. 3 is a side view of a detecting device 200 for the panel unit 100 according to the present invention, and FIG. 4 is a second direction F of FIG. 3 . 2 is a front view showing the third side 43 of the first substrate 40 and the exposed surface 55 of the second substrate 50. In an embodiment of the invention, the detecting device 200 includes a suction device 70 and a thrust mechanism 80, which is preferably a vacuum suction device that utilizes vacuum to generate suction, which can vacuum the CDA in the compressed air system. (clean/compressed dry air) is converted into a vacuum to suck the substrate of the panel unit 100. As shown in Figures 3 and 4, the suction device 70 can have a suction cup 72. For the panel unit 100 as shown in Fig. 2, the suction cup 72 is on a first axis A 5 along the first line in the figure. The direction F 1 attracts the third side 43 of the first substrate 40 to fix the first substrate 40. As can be seen from the front view of Fig. 4, the suction cup 72 of the suction device 70 is preferably disposed at the two end angles 46, 47 of the third side 43 of the first substrate 40 adjacent to the exposed face 55 of the second substrate 50. At one end angle, for example, in the embodiment of Fig. 4, the suction cup 72 is disposed at the end angle 46, and the edge of the suction cup 72 is substantially aligned with the adjacent side edges 44, 45 of the first substrate 40 forming the end angle 46. In practice, the circular suction cup 72 can easily align the adjacent sides 44, 45 of the first substrate 40, so that the suction cup 72 of the suction device 70 can be quickly and efficiently disposed on the coating frame of the first substrate 40. The edge of the glue, which is fixed to the first substrate 40 in a vacuum suction manner, can also be effectively fixed in a relatively short period of time.

當吸引裝置70固定第一基板40後,接著利用檢測設備200中的推力機構80,以人工或設備自動化的方式,在一第二軸線A6 上,沿著第3圖中的第一方向F1 之相反方向(即第二方向F2 )推抵第二基板50的第二側52。更具體而言,推力機構80推抵第二側52上的露出面55。隨著推力機構80沿著第二方向F2 的推抵力量增加(同時吸引裝置70沿著第一方向F1 吸引固定第一基板40),第一基板40以及第二基板50之間的框膠60承受逐漸增大的外在應力,直到超過框膠黏合兩基板40、50的臨界強度時,第二基板50自第一基板40剝離(如第3圖中的虛線所示),此時推力機構80所測得的力量數值即可代表面板框膠的強度。When the suction device 70 is fixed a first substrate 40, and then using the detection apparatus 200 in the thrust mechanism 80, the device manually or automated manner, on a second axis A 6, along the first direction F in FIG. 3 The opposite direction of 1 (i.e., the second direction F 2 ) is pushed against the second side 52 of the second substrate 50. More specifically, the thrust mechanism 80 pushes against the exposed face 55 on the second side 52. As the pushing force of the thrust mechanism 80 along the second direction F 2 increases (while the attraction device 70 attracts and fixes the first substrate 40 along the first direction F 1 ), the frame between the first substrate 40 and the second substrate 50 The adhesive 60 is subjected to a gradually increasing external stress until the critical strength of the two substrates 40, 50 is adhered, and the second substrate 50 is peeled off from the first substrate 40 (as indicated by a broken line in FIG. 3). The force value measured by the thrust mechanism 80 can represent the strength of the panel seal.

特別說明的是,本發明的檢測設備200中的吸引裝置70設置在第一基板40靠近露出面55的端角46上,而推力機構80在面板單元100的同一邊推抵第二基板50的露出面55。由圖可看出,吸引裝置70與推力機構80分別設置在兩個相異的第一軸線A5 以及第二軸線A6 上,且沿著相反的方向分別對兩基板40、50作用,在推力機構80對第二基板50施力以獲得框膠的臨界強度過程中,由於相異軸施力導致框膠受到明顯力矩,故對框膠臨界強度的檢測更加敏感,因此可有效針對框膠強度進行測試。Specifically, the suction device 70 in the detecting device 200 of the present invention is disposed on the end angle 46 of the first substrate 40 near the exposed surface 55, and the thrust mechanism 80 is pushed against the second substrate 50 on the same side of the panel unit 100. The face 55 is exposed. As can be seen from the figure, the suction device 70 and the thrust mechanism 80 are respectively disposed on the two different first axis A 5 and the second axis A 6 , and respectively act on the opposite substrates 40 and 50 in opposite directions. When the thrust mechanism 80 applies the force to the second substrate 50 to obtain the critical strength of the sealant, the frame glue is subjected to the obvious moment due to the different axial force, so the detection of the critical strength of the sealant is more sensitive, so the frame glue can be effectively targeted. Strength is tested.

請參考第5圖,第5圖即為使用本發明所揭露的檢測設備以檢測面板的框膠強度的檢測方法300流程示意圖,其步驟如下:步驟302:利用吸引裝置70沿著第一方向F1 吸引第一基板40的第三側43以固定第一基板40;步驟304:利用推力機構80沿著第二方向F2 推抵第二基板50的第二側52;步驟306:當第二基板50自第一基板40剝離時,記錄推力機構80的一力量數值。Please refer to FIG. 5 , which is a schematic flowchart of a method 300 for detecting the strength of the sealant of the panel by using the detecting device disclosed in the present invention. The steps are as follows: Step 302: using the suction device 70 along the first direction F 1 attracting the third side 43 of the first substrate 40 to fix the first substrate 40; Step 304: pushing the second side 52 of the second substrate 50 along the second direction F 2 by the thrust mechanism 80; Step 306: When the second When the substrate 50 is peeled off from the first substrate 40, a force value of the thrust mechanism 80 is recorded.

其中在步驟302,如前所述,吸引裝置70係於第一軸線A5 上可以吸盤72吸引第一基板40的端角46,吸盤72實質上與形成端角46的兩相鄰側邊44、45切齊。而步驟304中的推力機構80係推抵第二基板50的第二側52上的露出面55。In step 302, as described above, the suction device 70 is attached to the first axis A 5 so that the suction cup 72 can attract the end angle 46 of the first substrate 40. The suction cup 72 substantially forms two adjacent sides 44 of the end angle 46. 45 cut. The thrust mechanism 80 in step 304 is pushed against the exposed surface 55 on the second side 52 of the second substrate 50.

本發明所揭露的面板框膠檢測設備以及檢測方法,可利用一吸引裝置以真空吸盤在第一軸線上沿著第一方向吸引固定面板單元的第一基板的第三側的端角。利用一推力機構以人工或設備自動化的方式,在第二軸線上沿著第一方向的相反方向推抵第二基板的第二側上的露出面。當第二基板自第一基板剝離時,再記錄推力機構所產生的力量數值,如此可以簡易且精確的方式測得面板框膠的強度。The panel sealant detecting device and the detecting method disclosed in the present invention can utilize a suction device to attract the end angle of the third side of the first substrate of the fixed panel unit in the first direction by the vacuum chuck on the first axis. The exposed surface on the second side of the second substrate is urged in the opposite direction of the first direction on the second axis by a thrust mechanism in a manual or device automated manner. When the second substrate is peeled off from the first substrate, the value of the force generated by the thrust mechanism is recorded, so that the strength of the panel seal can be measured in a simple and accurate manner.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

1、2...配置1, 2. . . Configuration

10、40...第一基板10, 40. . . First substrate

20、50...第二基板20, 50. . . Second substrate

32、34...測頭32, 34. . . Probe

41...第一側41. . . First side

43...第三側43. . . Third side

44、45...側邊44, 45. . . Side

46、47...端角46, 47. . . End angle

52...第二側52. . . Second side

55...露出面55. . . Exposed face

60...框膠60. . . Frame glue

70...吸引裝置70. . . Suction device

72...吸盤72. . . Suction cup

80...推力機構80. . . Thrust mechanism

100...面板單元100. . . Panel unit

200...檢測設備200. . . Testing Equipment

300...檢測方法300. . . Detection method

302~306...步驟302~306. . . step

A1 ~A4 ...軸線A 1 ~ A 4 . . . Axis

A5 ...第一軸線A 5 . . . First axis

A6 ...第二軸線A 6 . . . Second axis

F1 ...第一方向F 1 . . . First direction

F2 ...第二方向F 2 . . . Second direction

第1圖為習知的拉力機構的測頭與面板單元的相對配置示意圖。FIG. 1 is a schematic diagram showing the relative arrangement of a probe and a panel unit of a conventional tension mechanism.

第2圖為面板單元的第一基板以及第二基板的示意圖。2 is a schematic view of the first substrate and the second substrate of the panel unit.

第3圖為本發明的檢測設備作用於面板單元的側視示意圖。Fig. 3 is a side elevational view showing the detecting device of the present invention acting on the panel unit.

第4圖為第3圖設備的正視示意圖。Figure 4 is a front elevational view of the apparatus of Figure 3.

第5圖為面板框膠強度檢測方法的流程示意圖。Figure 5 is a schematic flow chart of the method for detecting the strength of the panel sealant.

40...第一基板40. . . First substrate

43...第三側43. . . Third side

50...第二基板50. . . Second substrate

55...露出面55. . . Exposed face

70...吸引裝置70. . . Suction device

72...吸盤72. . . Suction cup

80...推力機構80. . . Thrust mechanism

100...面板單元100. . . Panel unit

200...檢測設備200. . . Testing Equipment

A5 ...第一軸線A 5 . . . First axis

A6 ...第二軸線A 6 . . . Second axis

F1 ...第一方向F 1 . . . First direction

F2 ...第二方向F 2 . . . Second direction

Claims (11)

一種面板框膠強度檢測方法,於一面板單元中包含一第一基板以及一第二基板,該第一基板的一第一側以及該第二基板的一第二側問以框膠接合,該檢測方法包含有:以一吸引裝置沿一第一方向吸引該第一基板上相對於該第一側的一第三側以固定該第一基板;以一推力機構沿著該第一方向之相反方向推抵該第二基板的該第二側;以及當該推力機構推抵該第二基板直到該第二基板自該第一基板剝離時,記錄該推力機構的一力量數值。A panel frame adhesive strength detecting method includes a first substrate and a second substrate in a panel unit, wherein a first side of the first substrate and a second side of the second substrate are joined by a frame glue, The detecting method comprises: attracting a third side of the first substrate relative to the first side in a first direction to fix the first substrate; and a thrust mechanism is opposite to the first direction The direction is pushed against the second side of the second substrate; and when the thrust mechanism pushes against the second substrate until the second substrate is peeled off from the first substrate, a force value of the thrust mechanism is recorded. 如請求項1所述的方法,其中該第二基板之該第二側具有一露出面,當該第一基板與該第二基板接合時,該第一基板未覆蓋於該露出面,且該推力機構係沿該第一方向之相反方向推抵該第二基板於該第二側上的該露出面。The method of claim 1, wherein the second side of the second substrate has an exposed surface, and when the first substrate is bonded to the second substrate, the first substrate does not cover the exposed surface, and the first substrate The thrust mechanism pushes against the exposed surface of the second substrate on the second side in a direction opposite to the first direction. 如請求項2所述的方法,其中該吸引裝置係沿該第一方向吸引該第一基板鄰近該露出面的其中一端角,該吸引裝置具有一吸盤,該吸盤與該第一基板該端角的相鄰兩側邊實質切齊。The method of claim 2, wherein the attracting device attracts the first substrate adjacent to an end corner of the exposed surface along the first direction, the attracting device has a suction cup, the suction cup and the first substrate The adjacent sides are substantially aligned. 如請求項1所述的方法,其中以該吸引裝置沿該第一方向吸引該第一基板的該第三側係以一真空吸引裝置吸引該第一基板的該第三側。The method of claim 1, wherein the third side of the first substrate is attracted by the suction device in the first direction to attract the third side of the first substrate by a vacuum suction device. 如請求項1所述的方法,其中該吸引裝置以及該推力機構係於相異軸線上分別作用於該第一基板以及該第二基板上。The method of claim 1, wherein the attraction device and the thrust mechanism are respectively applied to the first substrate and the second substrate on different axes. 一種面板框膠強度的檢測設備,於一面板單元中包含一第一基板以及一第二基板,該第一基板的一第一側以及該第二基板的一第二側間以框膠接合,該檢測設備包含有:一吸引裝置,用來沿一第一方向吸引該第一基板上相對於該第一側的一第三側以固定該第一基板;以及一推力機構,用來沿該第一方向之相反方向推抵該第二基板的該第二側,並直到該第二基板自該第一基板剝離時,產生一力量數值。A panel frame adhesive strength detecting device includes a first substrate and a second substrate in a panel unit, and a first side of the first substrate and a second side of the second substrate are joined by a frame glue. The detecting device includes: a suction device for attracting a third side of the first substrate relative to the first side to fix the first substrate in a first direction; and a thrust mechanism for The opposite direction of the first direction pushes against the second side of the second substrate, and a force value is generated until the second substrate is peeled off from the first substrate. 如請求項6所述的檢測設備,其中該第二基板之該第二側具有一露出面,當該第一基板與該第二基板接合時,該第一基板未覆蓋於該露出面,該推力機構係用來沿該第一方向之相反方向推抵該第二基板於該第二側上的該露出面。The detecting device of claim 6, wherein the second side of the second substrate has an exposed surface, and the first substrate does not cover the exposed surface when the first substrate is bonded to the second substrate, The thrust mechanism is configured to urge the exposed surface of the second substrate on the second side in an opposite direction of the first direction. 如請求項7所述的檢測設備,其中該吸引裝置係用來沿該第一方向吸引該第一基板鄰近該露出面的其中一端角,該吸引裝置具有一吸盤,該吸盤與該第一基板該端角的相鄰兩側邊實質切齊。The detecting device of claim 7, wherein the suction device is configured to attract the first substrate adjacent to an end of the exposed surface in the first direction, the suction device has a suction cup, the suction cup and the first substrate The adjacent sides of the end corner are substantially aligned. 如請求項6所述的檢測設備,其中該吸引裝置為一真空吸引裝置。The detecting device of claim 6, wherein the suction device is a vacuum suction device. 如請求項6所述的檢測設備,其中該吸引裝置以及該推力機構係設置於相異軸線上。The detecting device of claim 6, wherein the suction device and the thrust mechanism are disposed on different axes. 如請求項6所述的檢測設備,其中該第一基板為彩色濾光層基材,該第二基板為薄膜電晶體陣列基材。The detecting device according to claim 6, wherein the first substrate is a color filter layer substrate, and the second substrate is a thin film transistor array substrate.
TW100116327A 2011-05-10 2011-05-10 Method for measuring sealant strength of lcd panel and measuring apparatus thereof TWI447376B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW100116327A TWI447376B (en) 2011-05-10 2011-05-10 Method for measuring sealant strength of lcd panel and measuring apparatus thereof
CN201110186701.5A CN102262049B (en) 2011-05-10 2011-06-28 Method and equipment for detecting strength of panel frame glue

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100116327A TWI447376B (en) 2011-05-10 2011-05-10 Method for measuring sealant strength of lcd panel and measuring apparatus thereof

Publications (2)

Publication Number Publication Date
TW201245688A TW201245688A (en) 2012-11-16
TWI447376B true TWI447376B (en) 2014-08-01

Family

ID=45008761

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100116327A TWI447376B (en) 2011-05-10 2011-05-10 Method for measuring sealant strength of lcd panel and measuring apparatus thereof

Country Status (2)

Country Link
CN (1) CN102262049B (en)
TW (1) TWI447376B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104075990B (en) * 2013-03-28 2016-08-24 中国建筑科学研究院 Durability evaluation method for existing building curtain wall silicone structure sealant
CN105068284B (en) * 2015-08-28 2018-07-17 深圳市华星光电技术有限公司 The black matrix attachment force detection method and system of display panel
CN105785614B (en) * 2016-05-20 2019-03-15 深圳市华星光电技术有限公司 A kind of test fixture and test method of bonding force
CN105892112B (en) * 2016-06-20 2018-12-25 深圳市华星光电技术有限公司 A kind of frame glue bonding force checking device for liquid crystal display
CN105974621B (en) * 2016-07-01 2019-06-25 深圳市华星光电技术有限公司 A kind of nothing is staggered side liquid crystal cell center glue bond force checking device and method
CN107121799B (en) * 2017-06-28 2020-05-19 武汉华星光电技术有限公司 Positioning jig for panel frame glue peeling test
CN107589571A (en) * 2017-10-19 2018-01-16 深圳市华星光电技术有限公司 The detection means and detection method of panel frame glue intensity
CN109445144B (en) * 2019-01-25 2019-04-19 南京中电熊猫平板显示科技有限公司 A kind of liquid crystal display detection device and its detection method
CN111538176B (en) * 2020-05-25 2023-06-27 Tcl华星光电技术有限公司 Adhesive force test fixture and test method thereof
CN112098324A (en) * 2020-10-26 2020-12-18 枚林优交(上海)新材料开发有限公司 Method for testing peel strength of electronic adhesive and adhered PC (polycarbonate) substrate sample

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW582083B (en) * 2003-04-17 2004-04-01 Advanced Semiconductor Eng Fixture for die-pull test
TWI245890B (en) * 2004-11-08 2005-12-21 Chunghwa Picture Tubes Ltd Testing tool, testing method, and method for improving reliability of display panel
CN100485363C (en) * 2006-06-06 2009-05-06 青岛理工大学 Tensile bond strength testing method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6952959B2 (en) * 2003-06-20 2005-10-11 Kazuo Hishinuma Method of designing a heat seal width
US6955092B2 (en) * 2003-12-31 2005-10-18 The Boeing Company Method for testing stress-relaxation properties of sealing materials
FR2891365B1 (en) * 2005-09-28 2007-11-23 Airbus France Sas TRACTION PLOT FOR DEVICE FOR TESTING ADHESION OF A COATING ON A SUBSTART
CN101051021B (en) * 2006-04-07 2011-07-27 鸿富锦精密工业(深圳)有限公司 Filter adhesion detecting device and method
CN101694452B (en) * 2009-07-24 2012-06-13 扬中市江南砂布有限公司 Method for testing peeling strength of coated abrasive tool

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW582083B (en) * 2003-04-17 2004-04-01 Advanced Semiconductor Eng Fixture for die-pull test
TWI245890B (en) * 2004-11-08 2005-12-21 Chunghwa Picture Tubes Ltd Testing tool, testing method, and method for improving reliability of display panel
CN100485363C (en) * 2006-06-06 2009-05-06 青岛理工大学 Tensile bond strength testing method

Also Published As

Publication number Publication date
TW201245688A (en) 2012-11-16
CN102262049B (en) 2015-08-05
CN102262049A (en) 2011-11-30

Similar Documents

Publication Publication Date Title
TWI447376B (en) Method for measuring sealant strength of lcd panel and measuring apparatus thereof
TWI498542B (en) Optical inspection device
US10105930B2 (en) Laminated film and film attachment method
CN106153535B (en) The detection method of fluorine element release film
CN105334160A (en) Thin film adhesion testing equipment and thin film adhesion testing method
CN105911727B (en) Drawing property test fixture and full fitting display device drawing property test method
KR20100122636A (en) Method for testing adhesion strength of thin film formed on flexible substrate
US10046543B2 (en) Laminated film and film attachment method
JP6405045B2 (en) Film pasting method
WO2008016767A3 (en) Array testing method using electric bias stress for tft array
JP2009186497A (en) Apparatus for manufacturing liquid crystal display panel and method of manufacturing liquid crystal display panel
TWI487896B (en) Method for inspecting dies on wafer
KR100903585B1 (en) Vacuum Chuck for Inspecting Apparatus of Polarizing Film
CN110794598B (en) Catching jig
TWI334028B (en) Test apparatus for chip strength
JP6480582B2 (en) Film pasting device and film pasting unit
JP2015169589A (en) Semiconductor testing device
JP2010044304A (en) Inspection method for substrate having protective film
US9090461B2 (en) Temporary optical wave diffusion-promoting film adhered to lidded MEMS wafer for testing using interferometer
JP2009210852A (en) Method for manufacturing liquid crystal display device
JP2006039238A (en) Sticking device for functional film such as polarizing plate and ar film
JP2007210265A (en) Apparatus for sticking optical film, method for sticking optical film and manufacturing method of display panel
US7405828B2 (en) Method for measuring the degree of crosslinking of pressure sensitive adhesive
WO2023048042A1 (en) Glass plate production method and glass plate inspection method
CN114216794A (en) Method for testing and calculating bending strength of flexible part

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees