CN107121799B - Positioning jig for panel frame glue peeling test - Google Patents
Positioning jig for panel frame glue peeling test Download PDFInfo
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- CN107121799B CN107121799B CN201710505458.6A CN201710505458A CN107121799B CN 107121799 B CN107121799 B CN 107121799B CN 201710505458 A CN201710505458 A CN 201710505458A CN 107121799 B CN107121799 B CN 107121799B
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- workbench
- hole
- retaining wall
- barricade
- positioning jig
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention provides a positioning jig for a panel frame glue peeling test, which comprises a first workbench and a first stop block, wherein the first stop block is provided with a first retaining wall, one side of two side wall surfaces of the first retaining wall, which is opposite to the first workbench, is provided with first grooves which are arranged along the length direction of the wall surfaces and are inwards concave, and the two first grooves are communicated with each other to form a first V-shaped insertion opening; the utility model discloses a set up the workstation, including first workstation, second workstation, first barricade and second barricade, lie in first dog department on the first workstation and be equipped with bellied boss, be equipped with on the boss with the V-arrangement of first barricade shape looks adaptation the second barricade on first workstation and lie in second barricade department and still be equipped with first through-hole, the first through-hole sets up with the junction of the both sides wall of second barricade is adjacent. Compared with the prior art, the method has the advantages that the color filter substrate and the thin film transistor substrate are adhered to the testing stud at the end side of the outer pin end, the alignment can be axially and concentrically achieved, the operation is simple, the error is reduced, and the testing efficiency and the accuracy are improved.
Description
Technical Field
The invention relates to a display panel detection technology, in particular to a positioning jig for a panel frame glue peeling test.
Background
The color filter substrate (CF substrate) and the thin film transistor substrate (TFT substrate) of the small-size panel in the display panel are combined into a box through frame glue, and the frame glue seals Liquid Crystal (LC) between the color filter substrate and the thin film transistor substrate to avoid overflow of the liquid crystal.
The general panel needs to be tested for frame glue peeling resistance (peeling), and the testing principle is that a cylindrical stainless steel testing stud is respectively adhered to the surface fixing positions of the color filter substrate and the thin film transistor substrate, and after glue is cured, the force value is obtained by measuring the force value when the testing stud is stretched in two directions until the color filter substrate and the thin film transistor substrate are separated, namely the peeling force value of the frame glue. To ensure the accuracy of the peel test, the following two requirements are typically noted: 1. the position of the stud paste to be tested needs to be accurately positioned; 2. the test studs on the surface of the color filter substrate and the surface of the thin film transistor substrate are coaxial and have no offset. However, it is difficult for the actual field personnel to meet the above requirements during operation, because the general tft substrate has an Outer Lead Bonding (OLB) which extends to the outside of the color filter substrate, so that one side of the color filter substrate located at the outer lead bonding is not flush with the outer lead bonding of the tft substrate, when the test stud is pasted, it is more easy to align the test stud coaxially with the test stud located at one side of the outer lead bonding of the color filter substrate (as shown in fig. 10) because there is not enough pairs as a reference, which may cause an error in the peeling test result and affect the type selection determination of the sealant.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a positioning jig for panel frame glue peeling test, which enables the surfaces of a color filter substrate and a thin film transistor substrate to be positioned on the axial concentric alignment of test studs pasted on the end sides of outer pins, reduces test errors caused by difference of the test studs, and improves test efficiency and accuracy.
The invention provides a positioning jig for a panel frame glue peeling test, which comprises a first workbench and a first stop block arranged on the first workbench, wherein at least one V-shaped first retaining wall is arranged on the first stop block, an included angle between two side wall surfaces of the first retaining wall is 90 degrees, first grooves which are arranged along the length direction of the wall surfaces and are concave inwards are arranged on one side of the two side wall surfaces of the first retaining wall, which is opposite to the first workbench, and the two first grooves are communicated with each other, so that a first V-shaped insertion hole is formed in the first retaining wall; the utility model discloses a set up the workstation, including first workstation, second workstation, first barricade, first through-hole and second barricade, lie in first dog department on the first workstation and be equipped with bellied boss, be equipped with the second barricade with the V-arrangement of first barricade shape looks adaptation on the boss, the quantity of second barricade equals with the quantity of first barricade, lies in second barricade department on first workstation and still is equipped with first through-hole, and first through-hole sets up with the junction of the both sides wall of second barricade is adjacent, the quantity of first through-.
Further, the surface of the first workbench is an inclined plane, and the first retaining wall faces the highest point of the surface of the first workbench.
Further, the first through hole is a rectangular hole, and two side hole walls adjacent to two side wall surfaces of the second retaining wall in the first through hole are flush with two side wall surfaces of the second retaining wall.
Further, positioning jig still includes the second workstation that sets up with first workstation symmetry, locates the second dog on the second workstation, be equipped with the third barricade of at least one V-arrangement on the second dog, the contained angle between the both sides wall of third barricade is 90 degrees, the both sides wall of third barricade is equipped with the second recess that sets up and the indent along the length direction of wall with the one side that the second workstation is relative, and two second recesses communicate each other, form second V-arrangement inserted hole on the third barricade.
Furthermore, a second through hole is further formed in the position, located on the third retaining wall, of the second workbench, the second through hole is adjacent to the connecting position of the wall surfaces on the two sides of the second retaining wall, and the number of the second through holes is equal to that of the third retaining wall.
Further, the surface of the second workbench is an inclined plane, and the third blocking wall faces the highest point of the surface of the second workbench.
Further, the second through-hole is a rectangular hole, and two side hole walls adjacent to two side wall surfaces of the third retaining wall in the second through-hole are flush with two side wall surfaces of the third retaining wall.
Further, the height of the first groove and the second groove is larger than 0.2 mm.
Further, the first stop block is arranged at the lowest point of the surface of the first workbench.
Further, the second stop block is arranged at the lowest point of the surface of the second workbench.
Compared with the prior art, the invention has the advantages that the first stop block is arranged on the first working platform, the first stop block is provided with at least one V-shaped first retaining wall, the first retaining wall is provided with the first groove, the first stop block is provided with the boss with the second retaining wall, and the first working platform is also provided with the first through hole at the second retaining wall, so that when the test stud is pasted on the outer pin end side of the surface of the thin film transistor substrate, the second retaining wall blocks one side of the color filter substrate, which is positioned at the outer pin end, so that the outer pin end side of the thin film transistor substrate is inserted into the first groove, the color filter substrate and the test stud pasted on the outer pin end side of the surface of the thin film transistor substrate can be axially aligned concentrically, the operation is simple, the error is reduced, and the test efficiency and the accuracy are improved.
Drawings
FIG. 1 is an external structural view of the present invention;
FIG. 2 is a schematic perspective exploded view of the present invention;
FIG. 3 is a side schematic view of the present invention;
FIG. 4 is a schematic view of the first stop of the present invention;
FIG. 5 is a schematic view of a second stop according to the present invention;
FIG. 6 is an enlarged view of a portion of the first table of the present invention;
FIG. 7 is a schematic view of the use of the first stage of the present invention;
FIG. 8 is a first schematic view of a second stage of the present invention;
FIG. 9 is a second schematic illustration of the use of the second table of the present invention;
FIG. 10 is a schematic view of two test studs in corresponding positions in axial concentric misalignment;
FIG. 11 is a schematic view of two test studs in corresponding positions in axial concentric alignment.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples.
As shown in fig. 1, 2 and 6, the positioning fixture for panel frame adhesive peeling test of the present invention at least includes a first worktable 1, a first stop block 2 disposed on the first worktable 1, the first worktable 1 is a rectangular plate structure, the first stop block 2 is provided with at least one V-shaped first retaining wall 3, an included angle between two side wall surfaces of the first retaining wall 3 is 90 degrees, one side of the two side wall surfaces of the first retaining wall 3 opposite to the first worktable 1 is provided with a first groove 4 (shown in fig. 4) disposed along a length direction of the wall surface and recessed inwards, the two first grooves 4 are communicated with each other, a first V-shaped insertion opening 7 (shown in fig. 4) is formed on the first retaining wall 3, and the two first grooves 4 also form a V shape; a raised boss 5 is arranged on the first workbench 1 at the first stop block 2, a V-shaped second retaining wall 8 matched with the first retaining wall 3 in shape is arranged on the boss 5, the number of the second retaining walls 8 is equal to that of the first retaining walls 3, and specifically, the surface shape of the boss 5 is matched with that of the first stop block 2;
the position of the second retaining wall 8 on the first workbench 1 is also provided with a first through hole 6, the connecting positions of the first through hole 6 and the wall surfaces on two sides of the second retaining wall 8 are arranged adjacently, the number of the first through holes 6 is equal to that of the first retaining walls 3, and the first through holes 6 are used for avoiding the test studs 21 on one side of the outer pin ends of the color filter substrate.
When the test stud is adhered to the surface of the tft substrate at the end of the outer lead, as shown in fig. 7 and 11, assuming that the long side of the two side panel edges of the tft substrate at the test stud 20 at the end of the outer lead in fig. 7 is the first edge 17 and the short side is the second edge 18, the two side wall surfaces of the first retaining wall are defined as the first wall surfaces 3A and 3B, the test stud 21 on the surface of the color filter substrate 15 is first placed into the first through hole 6, then the second edge 18 of the tft substrate 16 is inserted into the first groove 4 of the first wall surface 3A through the first V-shaped insertion hole 7, and the first edge 17 abuts against the first wall surface 3B, since the second retaining wall 8 limits the color filter substrate 15, the second edge 18 of the tft substrate 16 is inserted into the first groove 4, the position corresponding to the connection position of the thin film transistor substrate surface and the first wall surface 3A and the first wall surface 3B is the installation position of the test stud 20, so that the test stud 21 on the color filter substrate 15 and the test stud 20 on the thin film transistor substrate 16 are ensured to be aligned in an axial concentric manner, the test error caused by the alignment difference of the test studs 20 and 21 is reduced, and the alignment difficulty is reduced.
As shown in fig. 3, the surface of the first table 1 is a slope, wherein the first dam 3 is directed toward the highest point of the surface of the first table 1, and preferably, the first stopper 2 is provided at the lowest point of the surface of the first table 1, by setting the first table 1 as a slope, when the panel is placed in the first retaining wall 3, by placing one side edge of the panel on the test stud against the wall surface of the first retaining wall 3, the panel naturally slides downwards under the action of gravity, the side edge of the end side of the outer pin of the final panel and the other side edge of the panel positioned on the testing stud are aligned with the two side wall surfaces of the first retaining wall 3, the testing stud after being coated with glue is placed on the thin film transistor substrate and slides to the joint of the two side wall surfaces of the first retaining wall 3 through the self gravity, therefore, the alignment error between the test stud on the surface of the thin film transistor substrate 16 and the test stud on the side of the outer pin end on the surface of the color filter substrate is further reduced.
As shown in fig. 1 and 2, in order to ensure the accuracy of the stud paste on the side of the outer lead end of the color filter substrate surface, the positioning fixture also comprises a second worktable 14 which is arranged symmetrically with the first worktable 1, and a second stop block 9 which is arranged on the second worktable 14, the second worktable 14 is also in a rectangular plate structure, the size of the baffle plate is the same as that of the first workbench 1, at least one V-shaped third baffle wall 10 is arranged on the second baffle block 9, the included angle between the two side wall surfaces of the third baffle wall 10 is 90 degrees, the wall surfaces at two sides of the third retaining wall 10 opposite to the second workbench 14 are provided with second grooves 11 (shown in fig. 5) which are arranged along the length direction of the wall surface and are concave inwards, the two second grooves 11 are communicated with each other, a second V-shaped insertion opening 12 (shown in fig. 5) is formed in the third blocking wall 10, and the two second grooves 11 are also formed in a V-shape.
Before the test stud is adhered to the surface of the thin film transistor substrate, which is located at the outer pin end side, the test stud may be adhered to the surface of the color filter substrate 15, which is located at the outer pin end side, as shown in fig. 8, 9 and 11, still assuming that the long side of the edges of the two side panels, which are located at the test stud 20 located at the outer pin end side, of the thin film transistor substrate surface in fig. 8 is the first edge 17, and the short side is the second edge 18, the two side wall surfaces of the third baffle wall 10 are defined as the second wall surfaces 10A and 10B, the second edge 18 is inserted into the second groove 11 located at the second wall surface 10A through the first V-shaped insertion opening 7, and the first edge 17 is abutted against the second wall surface 10B, and after the second edge 18 is inserted into the second groove 11, the position, which is connected to the second wall surface 10A and the second wall surface 10B, where the color filter substrate 15 is located at the outer pin end side, is abutted against the second wall surface 10A The mounting position of the test stud 21 on the outer lead end side of the surface of the optical filter substrate 15 is ensured to be accurate, the test stud 21 is coated with glue and pushed to the joint of the second wall surface 10A and the second wall surface 10B, and the pasting is completed.
As shown in fig. 3, the surface of the second worktable 14 is also an inclined plane, the inclined angle of the surface of the second worktable 14 is the same as the inclined angle of the surface of the first worktable 1, wherein the third retaining wall 10 faces the highest point of the surface of the second worktable 14, as a preferred choice, the second stopper 9 is arranged at the lowest point of the surface of the second worktable 14, by arranging the second worktable 14 as an inclined plane, when the panel is placed in the third retaining wall 10, the panel naturally slides down by the action of gravity by placing one side edge of the panel on the side of the outer pin of the panel and the other side edge of the panel on the side of the test stud against the wall surfaces of the third retaining wall 10, finally the side edge on the side of the outer pin of the panel and the other side edge of the panel on the side of the test stud are aligned with the two side wall surfaces of the third retaining wall 10, the glued test stud is placed on the color filter substrate, and slides to the joint of the two side wall surfaces of, therefore, the pasting accuracy of the testing stud on the side, located at the outer pin end, of the surface of the color filter substrate is further improved.
In the present invention, as shown in fig. 1 and 3, the first table 1 and the second table 14 are symmetrically disposed and connected to each other by a connecting portion 19.
As shown in fig. 2, in order to avoid the need of explicitly limiting the installation sequence of the test studs, second through holes 13 are further provided on the second worktable 14 at the third baffle wall 10, the second through holes 13 are disposed adjacent to the joints of the two side wall surfaces of the second baffle wall 10, and the number of the second through holes 13 is equal to the number of the third baffle walls 10.
As shown in fig. 6, the first through hole 6 is a rectangular hole, so that it is not necessary to align the testing stud accurately, and a sufficient moving space is provided for the testing stud, specifically, two side hole walls adjacent to two side wall surfaces of the second retaining wall 8 in the first through hole 6 are flush with two side wall surfaces of the second retaining wall 8, thereby ensuring accuracy.
As shown in fig. 8, the second through hole 13 is a rectangular hole, which can eliminate the need for accurate alignment of the test stud and provide sufficient movement space for the test stud, specifically, two side hole walls of the second through hole 13 adjacent to two side wall surfaces of the third retaining wall 10 are flush with two side wall surfaces of the third retaining wall 10.
The first through hole 6 and the second through hole 13 have the same diameter.
In the invention, the height of the boss 5 can be determined according to the thickness of the color filter substrate in the panel, the boss 5 is only required to be provided with a raised surface to limit the color filter substrate, and the heights of the first groove 4 and the second groove 11 are required to be more than 0.2mm, so that the thin film transistor substrate can be inserted.
As shown in fig. 1, as an embodiment of the present invention, five first retaining walls 3 are provided, such that the first stopper 2 is formed in a rack shape, the first stopper 2 is provided along the length direction of the first table 1, and correspondingly, five second retaining walls 8 are provided on the boss 5, such that the boss 5 is formed in a rack shape, the surface shape of the boss 5 is the same as the surface shape of the first stopper 2 (shown in fig. 2), and five first through holes 6 are provided; five third retaining walls 10 are also arranged, so that the second retaining block 9 is in a rack shape, and the second retaining block 9 is parallel to the first retaining block 2.
While the invention has been shown and described with reference to certain embodiments, those skilled in the art will understand that: various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents.
Claims (10)
1. The utility model provides a positioning jig for panel frame glue peels off test which characterized in that: the positioning jig comprises a first workbench (1) and a first stop block (2) arranged on the first workbench (1), wherein at least one V-shaped first retaining wall (3) is arranged on the first stop block (2), an included angle between two side wall surfaces of the first retaining wall (3) is 90 degrees, one side of the two side wall surfaces of the first retaining wall (3) opposite to the first workbench (1) is provided with a first groove (4) which is arranged along the length direction of the wall surface and is concave inwards, the two first grooves (4) are communicated with each other, and a first V-shaped insertion hole (7) is formed in the first retaining wall (3); lie in first dog (2) department on first workstation (1) and be equipped with bellied boss (5), be equipped with on boss (5) with second barricade (8) of the V-arrangement of first barricade (3) shape looks adaptation, the quantity of second barricade (8) equals with the quantity of first barricade (3), lie in second barricade (8) department on first workstation (1) and still be equipped with first through-hole (6), first through-hole (6) set up adjacent with the junction of the both sides wall of second barricade (8), the quantity of first through-hole (6) equals with the quantity of first barricade (3).
2. The positioning jig for the panel frame glue peeling test according to claim 1, characterized in that: the surface of the first workbench (1) is an inclined surface, and the first V-shaped insertion opening (7) faces to the highest point of the surface of the first workbench (1).
3. The positioning jig for the panel frame glue peeling test according to claim 1, characterized in that: the first through hole (6) is a rectangular hole, and two side hole walls adjacent to two side wall surfaces of the second retaining wall (8) in the first through hole (6) and two side wall surfaces of the second retaining wall (8) are flushed.
4. The positioning jig for panel sealant peeling test according to any one of claims 1 to 3, wherein: the positioning jig further comprises a second workbench (14) symmetrically arranged with the first workbench (1), and a second stop block (9) arranged on the second workbench (14), wherein the second stop block (9) is provided with at least one V-shaped third retaining wall (10) on the second stop block (9), an included angle between two side wall surfaces of the third retaining wall (10) is 90 degrees, two side wall surfaces of the third retaining wall (10) are provided with a second groove (11) which is arranged along the length direction of the wall surface and is concave relative to the second workbench (14), the two second grooves (11) are communicated with each other, and a second V-shaped insertion hole (12) is formed in the third retaining wall (10).
5. The positioning jig for the panel frame glue peeling test according to claim 4, wherein: the position of the third retaining wall (10) on the second workbench (14) is also provided with a second through hole (13), the second through hole (13) is adjacent to the joint of the two side wall surfaces of the second retaining wall (10), and the number of the second through holes (13) is equal to that of the third retaining wall (10).
6. The positioning jig for the panel frame glue peeling test according to claim 5, wherein: the surface of the second workbench (14) is an inclined surface, and the second V-shaped insertion opening (12) faces to the highest point of the surface of the second workbench (14).
7. The positioning jig for the panel frame glue peeling test according to claim 6, wherein: the second through hole (13) is a rectangular hole, and two side hole walls adjacent to two side wall surfaces of the third retaining wall (10) in the second through hole (13) and two side wall surfaces of the third retaining wall (10) are flushed.
8. The positioning jig for the panel frame glue peeling test according to claim 7, wherein: the height of the first groove (4) and the height of the second groove (11) are larger than 0.2 mm.
9. The positioning jig for the panel frame glue peeling test according to claim 8, wherein: the first stop block (2) is arranged at the lowest point of the surface of the first workbench (1).
10. The positioning jig for the panel frame glue peeling test according to claim 9, wherein: the second stop block (9) is arranged at the lowest point of the surface of the second workbench (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710505458.6A CN107121799B (en) | 2017-06-28 | 2017-06-28 | Positioning jig for panel frame glue peeling test |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710505458.6A CN107121799B (en) | 2017-06-28 | 2017-06-28 | Positioning jig for panel frame glue peeling test |
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| Publication Number | Publication Date |
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| CN107121799A CN107121799A (en) | 2017-09-01 |
| CN107121799B true CN107121799B (en) | 2020-05-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201710505458.6A Active CN107121799B (en) | 2017-06-28 | 2017-06-28 | Positioning jig for panel frame glue peeling test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114354600B (en) * | 2021-12-29 | 2022-09-16 | 常州中端电器有限公司 | Automatic optical detection equipment for electronic instrument |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004118012A (en) * | 2002-09-27 | 2004-04-15 | Takatori Corp | Method for sticking polarizing plate to liquid crystal panel |
| KR100793699B1 (en) * | 2007-09-17 | 2008-01-09 | 주식회사 지엔티시스템즈 | Test jig of fpd modual |
| TWI447376B (en) * | 2011-05-10 | 2014-08-01 | Au Optronics Corp | Method for measuring sealant strength of lcd panel and measuring apparatus thereof |
| CN103513461A (en) * | 2012-06-25 | 2014-01-15 | 苏州工业园区赫光科技有限公司 | Self-induction-type liquid crystal display stripping structure |
| CN105511130B (en) * | 2016-02-01 | 2019-09-06 | 京东方科技集团股份有限公司 | The stripping off device and stripping means of display base plate |
| CN105892112B (en) * | 2016-06-20 | 2018-12-25 | 深圳市华星光电技术有限公司 | A kind of frame glue bonding force checking device for liquid crystal display |
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