TWI431133B - Vacuum film forming apparatus and vacuum film forming method - Google Patents

Vacuum film forming apparatus and vacuum film forming method Download PDF

Info

Publication number
TWI431133B
TWI431133B TW096126730A TW96126730A TWI431133B TW I431133 B TWI431133 B TW I431133B TW 096126730 A TW096126730 A TW 096126730A TW 96126730 A TW96126730 A TW 96126730A TW I431133 B TWI431133 B TW I431133B
Authority
TW
Taiwan
Prior art keywords
reflective film
substrate
bias
reflectance
vacuum
Prior art date
Application number
TW096126730A
Other languages
English (en)
Chinese (zh)
Other versions
TW200817527A (en
Inventor
Junpei Maruyama
Yasuhiro Koizumi
Original Assignee
Shinmaywa Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinmaywa Ind Ltd filed Critical Shinmaywa Ind Ltd
Publication of TW200817527A publication Critical patent/TW200817527A/zh
Application granted granted Critical
Publication of TWI431133B publication Critical patent/TWI431133B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C5/00Alloys based on noble metals
    • C22C5/06Alloys based on silver
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/32Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B11/00Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
    • G11B11/10Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field
    • G11B11/105Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field using a beam of light or a magnetic field for recording by change of magnetisation and a beam of light for reproducing, i.e. magneto-optical, e.g. light-induced thermomagnetic recording, spin magnetisation recording, Kerr or Faraday effect reproducing
    • G11B11/10582Record carriers characterised by the selection of the material or by the structure or form
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/266Sputtering or spin-coating layers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Manufacturing Optical Record Carriers (AREA)
TW096126730A 2006-08-01 2007-07-23 Vacuum film forming apparatus and vacuum film forming method TWI431133B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006210129A JP4864586B2 (ja) 2006-08-01 2006-08-01 真空成膜装置および真空成膜方法

Publications (2)

Publication Number Publication Date
TW200817527A TW200817527A (en) 2008-04-16
TWI431133B true TWI431133B (zh) 2014-03-21

Family

ID=38997093

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096126730A TWI431133B (zh) 2006-08-01 2007-07-23 Vacuum film forming apparatus and vacuum film forming method

Country Status (5)

Country Link
JP (1) JP4864586B2 (ja)
KR (1) KR101359826B1 (ja)
CN (1) CN101495665B (ja)
TW (1) TWI431133B (ja)
WO (1) WO2008015913A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104372296B (zh) * 2013-08-14 2016-09-21 北大方正集团有限公司 一种利用电子束蒸发制备金属薄膜的方法
TWI503433B (zh) * 2013-10-08 2015-10-11 不二越股份有限公司 成膜裝置及成膜方法
JP6379318B1 (ja) * 2017-06-14 2018-08-22 株式会社アルバック 成膜装置及び成膜方法並びに太陽電池の製造方法
CN111979517B (zh) * 2020-08-24 2022-12-20 京东方科技集团股份有限公司 温度调节方法及装置、蒸镀设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68916506T2 (de) * 1988-04-25 1994-10-13 Kawasaki Steel Co Stahlfeinblech mit einer dichten keramischen beschichtung von ausgezeichnete adhäsionseigenschaft, glattheit und korrosionsbeständigkeit und verfahren zu seiner herstellung.
JP3882483B2 (ja) * 2000-02-01 2007-02-14 三菱化学メディア株式会社 光記録媒体の製造方法
TW584905B (en) 2000-02-25 2004-04-21 Tokyo Electron Ltd Method and apparatus for depositing films
JP2002339084A (ja) * 2001-03-13 2002-11-27 Kiyousera Opt Kk 金属膜および金属膜被覆部材
JP3655907B2 (ja) * 2002-08-20 2005-06-02 株式会社神戸製鋼所 光情報記録媒体用反射膜と半透過反射膜、および光情報記録媒体
JP4009564B2 (ja) * 2003-06-27 2007-11-14 株式会社神戸製鋼所 リフレクター用Ag合金反射膜、及び、このAg合金反射膜を用いたリフレクター、並びに、このAg合金反射膜のAg合金薄膜の形成用のAg合金スパッタリングターゲット
JP4527624B2 (ja) * 2005-07-22 2010-08-18 株式会社神戸製鋼所 Ag合金反射膜を有する光情報媒体

Also Published As

Publication number Publication date
CN101495665A (zh) 2009-07-29
CN101495665B (zh) 2011-07-13
JP2008038161A (ja) 2008-02-21
KR101359826B1 (ko) 2014-02-07
WO2008015913A1 (fr) 2008-02-07
KR20090038866A (ko) 2009-04-21
JP4864586B2 (ja) 2012-02-01
TW200817527A (en) 2008-04-16

Similar Documents

Publication Publication Date Title
Mattox Physical vapor deposition (PVD) processes
JP3546246B2 (ja) プラズマ強化装置と電気アーク蒸着法
Homola et al. Plasma treatment of glass surfaces using diffuse coplanar surface barrier discharge in ambient air
CN105492653B (zh) 透明导电性膜及其制造方法
TWI431133B (zh) Vacuum film forming apparatus and vacuum film forming method
Hu et al. Understanding the preferred crystal orientation of sputtered silver in Ar/N2 atmosphere: A microstructure investigation
Beladiya et al. Plasma-enhanced atomic layer deposition of HfO2 with substrate biasing: thin films for high-reflective mirrors
Buschhaus et al. Ion-induced secondary electron emission of oxidized nickel and copper studied in beam experiments
JP2007533856A (ja) 真空蒸着方法
JP2008241292A (ja) 耐候性試験装置及び耐候性試験方法
Biberger et al. First of Their Kind: Solar Cells with a Dry‐Processed Perovskite Absorber Layer via Powder Aerosol Deposition and Hot‐Pressing
JP2018083971A (ja) マグネトロンスパッタリング装置及び透明導電性酸化物膜の形成方法
Goldstein et al. Coating and conductivity techniques for SEM and microanalysis
Gennardo Design, construction, and optimization of a magnetron sputtering system for urania deposition
Kormunda et al. Preparation of pulsed DC magnetron deposited Fe‐doped SnO2 coatings
Sakiew et al. Impact of ion species on ion beam sputtered Ta2O5 layer quality parameters and on corresponding process productivity: A preinvestigation for large-area coatings
US20110001041A1 (en) Method and apparatus allowing quantitative investigations of organic and inorganic sample by decoupling the sputtering process from the analysis process
Günster et al. Sputter material distribution in IBS deposition systems
Matsuda et al. Relation between plasma parameters and film properties in DC reactive magnetron sputtering of indium-tin-oxide
Echlin et al. Sample Surface Charge Elimination
Thöny et al. Improving Particle Performance in Plasma Enhanced Magnetron Sputtering
Schall et al. Excitation in low-energy Li+ collisions with cesiated W (110) surfaces: alignment and orientation of the collisionally excited Li (2 p) state
Allain et al. Debris-and radiation-induced damage effects on EUV nanolithography source collector mirror optics performance
Rupertus Ion beam spectrochemical analysis (IBSCA)
Trigg Review–Characterisation and analysis of surface engineered thin films

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees