TWI416118B - High current probe structure - Google Patents

Abstract

An intense current probe structure comprises a probe body and a removable needle. The probe body is made of a conductor material. A first engagement part is provided at one end of the probe body. The removable needle has a contact surface and a second engagement part positioned at a side opposite to the contact surface, wherein the second engagement part is used to engage the removable needle with the first engagement part in a removable manner.

Description

High current probe structure

The present invention relates to a probe structure, and more particularly to a large current probe structure having a detachable needle.

In the production and production process of many electronic products, it is often necessary to use a probe for electrical testing. For example, battery activation of a car battery is a good example. In testing, the probe must be in direct contact with the electrode of the car battery. To measure the current and voltage of the car battery.

However, since the current generated by many electronic products is a large current, for example, between 100A and 300A, such a large current can easily cause the temperature of the probe to be too high, and even cause damage to the probe; in addition, due to many electrons There are tolerances in the production of the product. For example, the electrode has a slight skew, which may cause the probe to be completely flat on the electrode during measurement, which causes a large pressure on a part of the probe and causes rapid wear.

However, if the conventional probe is to be replaced after being worn, it is usually necessary to disassemble the circuit board connecting the probes, so that the new probe can be assembled on the circuit board, which not only takes time and also causes exploration. Waste of needle raw materials.

Accordingly, the main object of the present invention is to provide a high current probe structure capable of not only withstanding a current of more than 100 A, but also for quickly replacing a worn probe needle when the probe is worn. .

A high current probe structure comprising a probe body and a detachable needle; the probe system is made of a conductor material, and has a first fastening portion at one end of the probe body; the detachable needle has a contact surface And a second fastening portion on the opposite side of the contact surface, the second fastening portion is configured to detachably fix the detachable needle to the first fastening portion.

In a preferred embodiment of the present invention, the first fastening portion and the second fastening portion are mutually corresponding threaded structures.

In a preferred embodiment of the present invention, the first fastening portion is a spherical structure, and the second fastening portion is a pair of sleeves that should be spherical.

In a preferred embodiment of the present invention, the first fastening portion and the second fastening portion are correspondingly shaped tapered cylinders and tapered sleeves.

In a preferred embodiment of the present invention, the detachable needle defines a first sub-probe opening from the contact surface.

In a preferred embodiment of the present invention, the probe body has a second sub-probe opening corresponding to the opening of the first sub-probe.

In a preferred embodiment of the invention, the detachable needle has a diameter between 8 mm and 12 mm.

In a preferred embodiment of the invention, the probe body has a diameter of between 6 mm and 10 mm.

In summary, the high current probe structure of the present invention has a diameter of the probe body of between 6 mm and 10 mm, and the diameter of the detachable needle is between 8 mm and 12 mm, as compared with the conventional probe. Therefore, it can withstand a large current of 100 A or more. In addition, since the high current probe structure of the present invention has a detachable needle, when the detachable needle is worn, it can be quickly disassembled by the user, and the new detachable needle is assembled. Above the probe body.

The specific embodiments of the present invention will be further described by the following examples and drawings.

The present invention relates to a probe structure, and more particularly to a large current probe structure having a detachable needle. The invention is illustrated by the following description of the preferred embodiments of the invention, and is not intended to limit the invention. The contents of this preferred embodiment are detailed below.

Please refer to the first figure and the second figure. The first figure is a perspective view of the high current probe structure of the present invention, and the second figure is a sectional view of the high current probe structure of the present invention. The high current probe structure 100 includes a probe body 11 and a detachable needle 12.

The probe body 11 is formed of a conductor material and has a first fastening portion 111a at one end of the probe body 11. In a preferred embodiment of the present invention, the diameter of the probe body 11 is Between 6mm and 10mm, the high current probe structure 100 can withstand currents above 100A.

The detachable needle 12 has a contact surface 121 and a second fastening portion 122a on the opposite side of the contact surface 121. The second fastening portion 122a is for detachably securing the detachable needle 12 to the detachable needle 12 The first fastening portion 111a; in the embodiment, the first fastening portion 111a and the second fastening portion 122a may be correspondingly shaped tapered cylinders and tapered sleeves to engage with each other; further, The diameter of the detachable needle 12 may be between 8 mm and 12 mm to enable the high current probe structure 100 to withstand currents above 100 A.

In a preferred embodiment of the present invention, the detachable needle 12 can have a first sub-probe opening 123 from the contact surface 121, and the probe body 11 and the first sub-probe are opened. A second sub-probe opening 112 is defined in the corresponding position. When the high-current probe structure 100 is in use, the user can wear another thin probe from the end of the second sub-probe opening 112. A needle to measure the voltage of the object to be tested.

Please refer to the third figure, which is a cross-sectional view of a second embodiment of a high current probe structure. In a preferred embodiment of the present invention, the first fastening portion 111b and the second fastening portion 122b may be mutually corresponding threaded structures for the user to disassemble or assemble the detachable needle by rotation. 12.

Please continue to refer to the fourth figure, which is a cross-sectional view of a third embodiment of a high current probe structure. In a preferred embodiment of the present invention, the first fastening portion 111c may be a spherical structure, and the second fastening portion 122c may be a pair of sleeves that should have a spherical structure, and the structure can be The detachable needle 12 is quickly disassembled and assembled, and is more capable of rotating within a certain range to be applied to the surface of the object to be tested when contacting the object to be tested.

Please refer to the fifth figure, which is a perspective view of a fourth embodiment of the high current probe structure. Although the probe body 11 and the detachable probe head 12 in the first figure are hexagonal, the effect of the large current probe structure of the present invention is not affected by the shape, for example, the high current probe structure 200 is cylindrical. The probe body 21 and the detachable probe head 22 are also capable of withstanding large currents and providing the function of quickly disassembling the detachable probe head 22.

In summary, the high current probe structures 100 and 200 of the present invention have a diameter between the probe bodies 11 and 21 of between 6 mm and 10 mm, and the diameters of the detachable needles 12 and 22, compared to conventional probes. The system is between 8mm and 12mm and is therefore capable of withstanding large currents above 100A. Furthermore, since the high current probe structures 100 and 200 of the present invention have detachable needles 12 and 22, when the detachable needles 12 and 22 are worn It can be quickly disassembled by the user and the new detachable needles 12 and 22 are assembled on the probe body probe bodies 11 and 21.

The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed.

100, 200. . . High current probe structure

11, 21. . . Probe body

111a, 111b, 111c. . . First fastening part

112. . . Second sub-probe opening

12, 22. . . Removable needle

121. . . Contact surfaces

122a, 122b, 122c. . . Second fastening part

123. . . First sub-probe opening

The first figure is a perspective view of the high current probe structure of the present invention;

The second figure is a cross-sectional view of the high current probe structure of the present invention;

The third figure is a cross-sectional view of a second embodiment of a high current probe structure;

The fourth figure is a cross-sectional view of a third embodiment of a high current probe structure;

The fifth figure is a perspective view of a fourth embodiment of the high current probe structure.

11. . . Probe body

111a. . . First fastening part

112. . . Second sub-probe opening

12. . . Removable needle

121. . . Contact surfaces

122a. . . Second fastening part

123. . . First sub-probe opening

Claims (8)

A high current probe structure comprising: a probe body formed of a conductor material and having a first fastening portion at one end of the probe body; and a detachable needle having: a contact surface And a second fastening portion is located on the opposite side of the contact surface and is detachably fastened to the first fastening portion. The high current probe structure of claim 1, wherein the first fastening portion and the second fastening portion are mutually corresponding threaded structures. The high current probe structure of claim 1, wherein the first fastening portion is a spherical structure, and the second fastening portion is a pair of sleeves that should be spherical. The high current probe structure according to claim 1, wherein the first fastening portion and the second fastening portion are tapered prisms and a tapered sleeve corresponding to each other. The high current probe structure of claim 1, wherein the detachable needle has a first sub-probe opening from the contact surface. The high current probe structure of claim 5, wherein the probe body has a second sub-probe opening corresponding to the first sub-probe opening. The high current probe structure of claim 1, wherein the detachable needle has a diameter of between 8 mm and 12 mm. The high current probe structure of claim 1, wherein the probe body has a diameter of between 6 mm and 10 mm.