201250255 ' 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種探針結構，尤指一種具有可拆卸針 頭之大電流探針結構。 【先前技術】 在許多電子產品的製作生產過程中，常常會需要利用 探針來做電性測試，例如汽車電池的電池活化即為一個很 好的例子，在測試時，必須以探針直接接觸汽車電池的電 極，以量測汽車電池之電流與電壓。 然而，由於許多電子產品所產生的電流係屬於大電 流，例如介於100A至300A之間，如此大的電流很容易造 成探針的溫度過高，甚至造成探針的毀損；此外，由於許 多電子產品於製作時存在公差，例如電極具有些許歪斜， 都會造成量測時探針無法完整得平貼於電極之上，而導致 探針的部份區域承受較大壓力，並造成快速磨損。 而習知的探針在磨損後若要進行更換，通常必須要將 連接探針的電路板進行拆解，才能夠將全新的探針組裝於 電路板之上，不僅耗費工時，亦造成探針原料的浪費。 【發明内容】 本發明所欲解決之技術問題與目的： 緣此，本發明之主要目的係提供一種大電流探針結 構，該大電流探針結構不僅能夠承受100A以上之電流， 3 201250255 更能夠供使用者於探針磨損時快速的更換受 磨損的探針針 本發明解決問題之技術手段： •:種大電流探針結構，係、包含探針本體以及可拆卸針 針本體係為導體材質所構成，並於該探針本體之— 端具有卡固部：可拆卸針頭係具有接觸面以及位於 :接觸面之相對-側的第二卡固部，該第二卡固部係用以 亥可拆卸針頭可拆卸地卡ϋ於該第-卡固部。 二本發月之車父佳實施例中，其中該第〆卡固部與該 卡固部係、為互相對應之螺紋結構。 -球明之—較佳實施例中，其中該[卡固部係為 體:1。構，且該第二卡固部係、為—對應該球狀結構之套 於本發明之一較佳實施 第二卡固部係為相對應形狀：固邛與該 *本發明之-較佳實施:二狀=雖狀套體。 該接觸面處開設有_第_子探針⑽+*可拆卸針頭係自 於本發明之一較佳實称 _於本㈣之-較佳實旬 ^料針開孔。 徑係介於8mm至12mm之間。八忒可拆卸針碩之直 於本發明之一較佳實施例 係介於 6mm至10mm之間。，其中該探針本體之直徑 201250255 本發明對照先前技術之功效： 綜上所述，相較於習知之探針，本發明之大電流探針 結構由於探針本體之直徑介於6mm至10mm之間，且可拆 卸針頭之直徑係介於8mm至12mm之間，因此能夠承受 100A以上之大電流，此外，由於本發明之大電流探針結構 具有可拆卸針頭，因此當可拆卸針頭磨損時，可以供使用 者快速的拆卸，並將新的可拆卸針頭組裝於探針本體之上。 本發明所採用的具體實施例，將藉由以下之實施例及 圖式作進一步之說明。 【實施方式】 本發明係關於一種探針結構，尤指一種具有可拆卸針 頭之大電流探針結構。以下茲列舉一較佳實施例以說明本 發明，然熟習此項技藝者皆知此僅為一舉例，而並非用以 限定發明本身。有關此較佳實施例之内容詳述如下。 請參閱第一圖與第二圖，第一圖係為本發明之大電流 探針結構之立體圖，第二圖係為本發明之大電流探針結構 之剖面圖。大電流探針結構100係包含探針本體11以及可 拆卸針頭12。 探針本體11係為導體材質所構成，並於該探針本體11 之一端具有一第一卡固部Ilia;於本發明之一較佳實施例 中，其中該探針本體11之直徑係介於6mm至1 Omm之間， 以使該大電流彳采針結構100能夠承受100A以上電流。 5 201250255 191可4拆卸相12係具有接觸面121以及位於該接觸面 之相對—側的第二卡固部】22a，該 二以供該可拆卸針頭12可拆卸地卡固於該第一卡固： 可二=貫施例中，第—卡固部⑴續第二卡固部】瓜 為相對應形狀之錐狀柱體與錐狀套體， 之Γ亥可拆卸針頭12之直徑可以是介… 以上^ 使該大電流探針結構100能夠承受謝 以自：佳實施例中，其中該可拆卸針頭】2可 =二妾觸面121處開設有一第一子探針開孔i2… 二第一子探針開孔123相對應之處開設有- 可以供= 當大電流探針結構10G在使用時， ’、 自第—子探針開孔U2尾端穿执g ^ 探針，以量測待測物之電壓。 ^穿叹另一較細的 a請參閱第三圖，第三圖係為大電流探針 二剖面圖。於本發明之一較佳實施例中，：匕 固部111b與該第二卡固部122b可以 -中以-卡 構，以供使用者利用f 疋互相對應之螺紋結 12。吏用者利射疋轉的方式拆卸或組裝該可拆卸針頭 請繼續參閱第四圖，第四圖係 三實施例剖面圖。於本發 伟/机抵針結構之第 固部仙可以為-球/施例中，該第-卡 為一對應該球狀結構之套體，此且一^構除卡固，咖可以 12 s 201250255 -定的範圍内轉動而服貼於該待測物表面。 請參閱第五圖，第五圖係 施例立體圖。雖然第—H ‘叶、、，吉構之第四實 頭12係為六角形H之探針本體11以及可拆卸探針 不纖影響，例如大電流探針結構20。：由】= :本？ 21以及可拆卸探針頭22所組成，亦可以大‘ ▲並提供快速拆裳可拆卸探針頭22之功效。 综上所述，相較於習知之探針，本 結構100與200由於探針本體η與η之直徑介於電^針 10mm之間，且可抵知私 ；mm至 12麵夕Μ η 與22之直徑係介於8峨至 12_之間，因此能夠承受職以上之大電流 於本發明之大電流探針結構丨⑻與具有可拆 與22,因此當可拆卸針 ，碩12 快速的抵與磨貝時，可以供使用者 _ 並將新的可拆卸針頭12與22組裳於掇# 體探針本體U與21之上。 f於铋針本 ，由以上|讀具體實施例之詳述’係希望能更加 二二’X明之特徵與精神，而並非以上述所揭 =來對本發明之範伽卿相反地，】= 各種改變及具相等性的安排於本發明所申： 之專利靶圍的範疇内。 曱5月 【圖式簡單說明】 第一圖係為本發明 第一圖係為本發明 之大電流探針結構之立體圖 之大電流探斜結構之剖面圖 7 201250255 第三圖係為大電流探針結構 第四圖係為大電流探針結構 第五圖係為大電流探針結構 之第=實施例剖面圖； 之第二貫施例剖面圖；以及 之第四實施例立體圖。 【主要元件符號說明】 大電流探針結構100、200 探針本體11、21 第一卡固部 111a、lllb、Ulc 第二子探針開孔112 可拆卸針頭12、22 接觸面121 第二卡固部 122a、122b、122c 第一子探針開孔123 8201250255 ' VI. Description of the Invention: TECHNICAL FIELD OF THE INVENTION The present invention relates to a probe structure, and more particularly to a large current probe structure having a detachable needle. [Prior Art] In the production and production of many electronic products, it is often necessary to use probes for electrical testing. For example, battery activation of automotive batteries is a good example. In testing, direct contact with probes is required. The electrode of a car battery to measure the current and voltage of the car battery. However, since the current generated by many electronic products is a large current, for example, between 100A and 300A, such a large current can easily cause the temperature of the probe to be too high, and even cause damage to the probe; in addition, due to many electrons There are tolerances in the production of the product. For example, the electrode has a slight skew, which may cause the probe to be completely flat on the electrode during measurement, which causes a large pressure on a part of the probe and causes rapid wear. However, if the conventional probe is to be replaced after being worn, it is usually necessary to disassemble the circuit board connecting the probes, so that the new probe can be assembled on the circuit board, which not only takes time and also causes exploration. Waste of needle raw materials. SUMMARY OF THE INVENTION The technical problems and objects to be solved by the present invention are: Accordingly, the main object of the present invention is to provide a high current probe structure capable of withstanding not only a current of more than 100 A, but also a 201250255. The invention can quickly replace the worn probe needle when the probe is worn. The technical means for solving the problem in the invention: • a large current probe structure, the system comprising the probe body and the detachable needle system is a conductor material And having a fastening portion at the end of the probe body: the detachable needle has a contact surface and a second fastening portion located at an opposite side of the contact surface, the second fastening portion is used for The detachable needle is detachably latched to the first-fastening portion. In the embodiment of the parent of the first month of the month, the third fastening portion and the fastening portion are threaded structures corresponding to each other. - Ball - in the preferred embodiment, wherein the [clamping portion is a body: 1. And the second fastening portion is a sleeve corresponding to the spherical structure. The second fastening portion of the present invention has a corresponding shape: a solid shape and a preferred embodiment of the present invention. Implementation: two-shaped = although a sleeve. The contact surface is provided with a ___ sub-probe (10) + * detachable needle is a preferred embodiment of the present invention - _ in this (four) - preferably a fine needle opening. The diameter is between 8mm and 12mm. The eight-way detachable needle is directly between 6 mm and 10 mm in a preferred embodiment of the invention. Wherein the diameter of the probe body 201250255 The present invention compares the efficacy of the prior art: In summary, the high current probe structure of the present invention has a diameter of the probe body of 6 mm to 10 mm compared to the conventional probe. And the diameter of the detachable needle is between 8mm and 12mm, so it can withstand a large current of 100A or more. In addition, since the high current probe structure of the present invention has a detachable needle, when the detachable needle is worn, It can be quickly removed by the user and the new detachable needle can be assembled on the probe body. Specific embodiments of the invention will be further illustrated by the following examples and drawings. [Embodiment] The present invention relates to a probe structure, and more particularly to a large current probe structure having a detachable needle. In the following, a preferred embodiment will be described to illustrate the invention, and it is to be understood by those skilled in the art that this invention is not intended to limit the invention. The contents of this preferred embodiment are detailed below. Referring to the first and second figures, the first figure is a perspective view of the high current probe structure of the present invention, and the second figure is a sectional view of the high current probe structure of the present invention. The high current probe structure 100 includes a probe body 11 and a detachable needle 12. The probe body 11 is made of a conductor material, and has a first fastening portion Ilia at one end of the probe body 11. In a preferred embodiment of the invention, the diameter of the probe body 11 is Between 6mm and 1Omm, the high current 彳 picking structure 100 can withstand more than 100A. 5 201250255 191 can be 4 disassembled phase 12 with a contact surface 121 and a second fastening portion 22a on the opposite side of the contact surface, the second for the detachable needle 12 to be detachably fastened to the first card Solid: can be two = in the example, the first - the fixed portion (1) continues the second fastening portion] the melon is the corresponding shape of the tapered cylinder and the tapered sleeve, the diameter of the detachable needle 12 can be The above-mentioned ^ enables the high-current probe structure 100 to withstand the following: In the preferred embodiment, the detachable needle 2 can be opened at the second contact surface 121 with a first sub-probe opening i2... The first sub-probe opening 123 is open corresponding to - can be used when the high-current probe structure 10G is in use, and the g ^ probe is pierced from the end of the first-sub-probe opening U2 to Measure the voltage of the analyte. ^Sighing another thinner a Please refer to the third figure. The third picture is the high current probe. In a preferred embodiment of the present invention, the securing portion 111b and the second securing portion 122b can be --framed for the user to utilize the threaded knot 12 corresponding to each other. Disassemble or assemble the detachable needle in a manner that the user uses the rifle. Please refer to the fourth figure, and the fourth figure is a cross-sectional view of the three embodiments. In the first solid part of the Benfawei/machine-to-needle structure, the ball can be a ball/case, and the first card is a pair of sleeves that should be spherical, and the structure can be 12 s 201250255 - Rotate within the specified range and apply to the surface of the object to be tested. Please refer to the fifth figure. The fifth figure is a perspective view of the embodiment. Although the fourth real head 12 of the first-H ‘leaf, the yoke is a hexagonal H probe body 11 and the detachable probe is not affected by fibers, such as the high current probe structure 20. : By] = : Ben? 21 and the detachable probe head 22, can also be large ▲ and provide the function of quickly disassembling the detachable probe head 22. In summary, compared with the conventional probe, the structures 100 and 200 have a diameter of the probe body η and η between the electrodes 10 mm, and are identifiable; mm to 12 face Μ η and The diameter of 22 is between 8峨 and 12_, so it can withstand the large current above the high current probe structure 丨(8) of the present invention with detachable and 22, so when the detachable needle, Shuo 12 fast When it comes to the grinding, it can be used by the user _ and the new detachable needles 12 and 22 are placed on the body probe bodies U and 21. f 铋 铋 , , , , , , , , , , , , , , , , , , , , , , , , , , , 读 读 读 读 读 读 读 读 读 读 读 读 读 读 读 读 读 读 读 铋The changes and equivalence arrangements are within the scope of the patented target of the present invention.曱May [Simplified illustration] The first picture is the cross-sectional view of the large current probe structure of the three-dimensional diagram of the large current probe structure of the present invention. 201250255 The third picture shows the large current probe. The fourth diagram of the needle structure is a large current probe structure. The fifth diagram is a cross-sectional view of the first embodiment of the large current probe structure; the second embodiment is a sectional view; and the fourth embodiment is a perspective view. [Main component symbol description] High current probe structure 100, 200 Probe body 11, 21 First fastening portion 111a, 111b, Ulc Second sub-probe opening 112 Removable needle 12, 22 Contact surface 121 Second card Solid portion 122a, 122b, 122c first sub-probe opening 12 8