TWM445179U - Offset shaft probe head and probe structure - Google Patents

Description

Off-axis probe head and probe structure

This case belongs to the field of probe structures for connecting devices, and more particularly to an off-axis probe head and its probe structure.

According to the general POGO PIN type probe structure, it is mostly used in electrical signal connectors, probe connectors, current pin connectors, and electrical signal test probes. The probe structure of the POGO PIN type mainly comprises a probe head, a conductive sleeve and an elastic element (spring). However, the elastic element used in the probe structure is a spring of equal diameter and equal winding density. The design is easy to cause elastic fatigue of the spring during use, and the entanglement between the spring coils is also the main cause of structural damage of the probe.

Therefore, a ball is formed between the off-axis probe head and the elastic member, and is formed by the surface of the ball and the off-axis probe head. interaction. For example, in the "Spring probe and method for biasing" case of U.S. Patent No. 5,801,544, the disclosure of which is incorporated herein by reference. As shown in the figure, the probe structure 1 is internally provided with a probe head 12, a ball 13 and an elastic member 14 inside a conductive sleeve 11, wherein the probe head 12 is adjacent to the ball 13 The face forms a tapered or inclined surface 121, and the ball 13 is pushed against the elastic member 14, so that the ball 13 abuts against the abutting surface of the probe head 12. Therefore, when the probe head 12 is pressed, the elastic member 14 is compressed, and the tapered surface or the inclined surface 121 is designed by the abutting surface, so that the probe head 12 has a significant deflection operation, that is, The large lateral force causes the probe head 12 to maintain effective contact with the inner wall of the conductive sleeve 11 to ensure stable current transmission after the probe head 12 is pressurized.

However, the ball 13 and the tapered surface or the inclined surface 121 are only contacted by a single point, so that the effect of generating the lateral force is not as effective as expected, and when the probe head 12 is pressed, The contact point cannot be effectively fixed, and it is easy to cause rotational wear between the probe head 12 and the conductive sleeve 11, so that it is necessary to improve.

In view of this, the creator provides an off-axis probe head and a probe structure thereof, wherein a probe head is provided with a recess for eccentrically disposing a top abutting component to be in contact with the original point. As a line contact, not only can the assembly be more convenient, but also can effectively increase the lateral force during use, so that the contact area of the off-axis probe head and a conductive sleeve is increased, thereby reducing the contact resistance and the transmission of a stable current. .

One of the aims of the present invention is to provide an off-axis probe head, wherein a bottom surface of a body of the off-axis probe head is provided with a recess from the axis of the shaft for receiving the top for use. A top-fitting element enhances the ease of assembly.

To achieve the above object, the off-axis probe head of the present invention comprises: a body having a first end and a second end, and the first end forms a bullet-shaped structure; a ring flange Provided on the second end of the body to form a base surface, and the base surface is a diameter R; and a groove formed on the base surface for receiving a topping member, and the groove The central axis has an offset distance from the central axis of the body, and the offset distance is 0.1 mm to 0.5*R.

In various embodiments, the groove is disposed as a conical groove body, and the cone angle of the conical groove body is 60-170 degrees; or the groove is disposed in a semi-circular groove shape, and the groove The arc angle of the semi-circular groove is 0.5~2 R; or the groove is set as a polygonal groove. The above various types of grooves can provide a moderate lateral force of the abutting element, thereby increasing the contact area between the off-axis probe head and the conductive sleeve, and greatly reducing the contact resistance and stabilizing the current. Transmission and other functions.

The second objective of the present invention is to provide a probe structure using the off-axis probe head, and after assembly, the off-axis design of the off-axis probe head is used to abut the top abutment element. Provides a large lateral force, which increases the contact area with a conductive sleeve, greatly reduces the contact resistance, and stabilizes the transmission of current.

In order to achieve the above object, the probe structure comprises: a conductive sleeve, the two ends of which form a set of ends and a closed end; the off-axis probe head is movably disposed in the conductive sleeve and Adjacent to one end of the socket end, the first end of the off-axis probe head passes through the conductive sleeve, and is clamped in the conductive sleeve by the ring flange; Provided on one side of the off-axis probe head, and one of the abutting members is received in the recess; and an elastic member is disposed on the other side of the abutting member and the elastic member The other end is opposite to the closed end, the elastic element is provided with the elastic force required by the abutting element to abut against the groove, and generates a lateral force, so that the off-axis probe head is stable to the conductive sleeve Reciprocating movement inside the cylinder.

In various embodiments, the groove is disposed as a conical groove body, and the cone angle of the conical groove body is 60-170 degrees; or the groove is disposed in a semi-circular groove shape, and the groove The arc angle of the semi-circular groove body is 0.5 to 2 R; or the groove is set as a polygonal groove. The above various types of grooves can provide a moderate lateral force of the abutting element, thereby increasing the contact area between the off-axis probe head and the conductive sleeve, and greatly reducing the contact resistance and stabilizing the current. Transmission and other functions.

In addition, in an embodiment, the abutting element is a ball, or the abutting element has a shaft to be sleeved in the elastic element, and the shaft is formed corresponding to one end of the groove. The half-spherical body has a shaft with a shaft that is sleeved in the elastic member. In order to correspond to the groove of the first conical groove type, the abutting element has a shaft to be sleeved in the elastic element, and the shaft corresponds to one end of the conical groove body. A conical body is formed to provide greater contact area and lateral force with the off-axis probe tip.

In order for your review board to have a clear understanding of the content of this creation, please use the following instructions to match the drawings.

Please refer to Figures 2, 3 and 4 for a schematic view of various embodiments of the preferred embodiment of the present invention. As shown in the figure, the off-axis probe head 2 of the present invention mainly comprises a body 21, a ring flange 22 and a groove 23.

The two ends of the body 21 respectively have a first end portion 211 and a second end portion 212, and the first end portion 211 forms a bullet-shaped structure body for abutting various electrical connecting elements; The edge 22 is disposed on the second end portion 212 of the body 21 to form a base surface, and the base surface is a diameter R. The groove 23 is formed on the base surface for receiving a top member (Fig. Not shown in the middle, and the central axis of the groove 23 has an offset distance d from the central axis of the body 21, and the offset distance is 0.1 mm to 0.5*R.

It should be noted that the grooves 23 can be of various types as follows, and refer to Figures 2, 3, and 4, respectively. As shown in FIG. 2, the groove 23 is provided as a conical groove body, and the cone angle of the conical groove body is 60-170 degrees, so when the top abutment element is placed in the groove 23, The surface of the abutment element is in arcuate line contact with the surface of the recess 23 to provide the lateral force required for the off-axis probe head 2 after assembly. As shown in FIG. 3, the groove 23 is disposed in a semi-circular arc groove, and the arc angle of the semi-circular groove body is 0.5 to 2 R. Therefore, when the abutting member 32 is placed in the concave portion In the case of the groove 23, the surface of the abutting member 32 forms a partial surface contact with the surface of the groove 23 or at least forms a curved line contact to provide the required position of the off-axis probe head 2 after assembly. lateral force. Or the groove 23 is provided as a polygonal groove body. Therefore, when the top abutting member is inserted into the groove 23, the surface of the abutting member 32 forms a multi-point contact with the surface of the groove 23, and The lateral force required for the off-axis probe head 2 after assembly is provided. The grooves 23 of the various types described above are capable of more contact with the abutment element and thus provide greater lateral force.

Referring again to Figures 5, 6, and 7, is a schematic illustration of various embodiments of the preferred embodiment of the present invention assembled into a probe structure. Referring to FIG. 2 together, as shown in the respective figures, when the off-axis probe head 2 is assembled into a probe structure 3, the probe structure 3 includes a conductive sleeve 31, and the bias The shaft probe head 2, a top abutting member 32 and an elastic member 33.

The two ends of the conductive sleeve 31 respectively form a connecting end 311 and a closed end 312. The sleeve end 311 is formed with a through hole, and the sleeve end 311 forms a necking design; the off axis The probe head 2 is disposed in the conductive sleeve 31 adjacent to one end of the sleeve end 311, and the first end portion 211 of the off-axis probe head 2 passes through the conductive sleeve 31. The through hole of the socket portion 311 is clamped in the conductive sleeve 31 by the ring flange 22 without falling off; the abutting member 32 is a ball and is movable on the off-axis probe One side of the head 2 (base surface), and a portion of the abutting member 32 is received in the recess 23; the elastic member 33 is selected from a common compression spring, and is disposed on the abutting member 32. The other end of the elastic member 33 is abutted against the closed end 312, and the elastic member 33 is used to provide the elastic force required for the abutting member 32 to be partially received and abutted against the In the groove 23, a lateral force is generated on the off-axis probe head 2, so that the off-axis probe head 2 stably reciprocates in the conductive sleeve 31 and contacts The area has been effectively increased.

In each embodiment, as shown in FIG. 6 , one end of the abutting member 32 forms a half-spherical body, and the other end has a shaft 321 , and the shaft 321 is sleeved in the elastic member 33 . This prevents the abutting member 32 from coming off the elastic member 33 and makes the movement smoother. Moreover, as shown in FIG. 7, in order to correspond to the groove 23 used in the conical groove type, the abutting member 32 and the conical groove body are adjacent to one end to form a conical body 322, which is in surface contact. The manner is accommodated in the recess 23 to provide a larger contact area and lateral force with the off-axis probe head 2.

In summary, the off-axis probe head 2 of the present invention utilizes the bottom surface of the body 21 to be offset from the axis of the shaft, and the concave portion exhibiting a conical groove, a circular arc groove or a polygonal groove structure is recessed inwardly. When the slot 23 is assembled into the probe structure 3, it is used to receive the abutting member 32 for abutting, thereby improving the convenience in assembly. Moreover, the off-axis design of the recess 23 of the off-axis probe head 2 provides a larger lateral force, thereby increasing the contact area between the off-axis probe head 2 and the conductive sleeve 31, Reduce contact resistance and stabilize current transfer.

However, the above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Therefore, it is common knowledge in the technical field or equivalent or easy to be familiar with the technology. The changes and modifications made by the changer without departing from the spirit and scope of this creation shall be covered by the scope of this creation.

[Practical]

1. . . Probe structure

11. . . Conductive sleeve

12. . . Probe head

121. . . Cone or bevel

13. . . Topping component

14. . . Elastic component

[This creation]

2. . . Off-axis probe head

twenty one. . . Ontology

211. . . First end

212. . . Second end

twenty two. . . Ring flange

twenty three. . . Groove

d. . . Offset distance

θ. . . Cone angle

3. . . Probe structure

31. . . Conductive sleeve

311. . . Socket

312. . . Closed end

32. . . Topping component

321. . . Shaft

322. . . Conical body

33. . . Elastic component

Figure 1 is a schematic view showing the structure of a conventional probe structure.

Figure 2 is a schematic view showing the structure of an embodiment of the preferred embodiment of the present invention.

Figure 3 is a schematic view showing the structure of a second embodiment of the preferred embodiment of the present invention.

Figure 4 is a block diagram showing another embodiment of the preferred embodiment of the present invention.

Figure 5 is a schematic illustration of one embodiment of a preferred embodiment of the present invention assembled into a probe structure.

Figure 6 is a schematic illustration of a second embodiment of a preferred embodiment of the present invention assembled into a probe structure.

Figure 7 is a schematic illustration of another embodiment of a preferred embodiment of the present invention assembled into a probe structure.

2. . . Off-axis probe head

twenty one. . . Ontology

211. . . First end

212. . . Second end

twenty two. . . Ring flange

twenty three. . . Groove

d. . . Offset distance

θ. . . Cone angle

Claims (11)

An off-axis probe head includes: a body having a first end and a second end, and the first end forms a bullet-shaped structure; a ring flange is disposed on the body a second end portion forms a base surface, and the base surface is a diameter R; and a groove is formed on the base surface to receive a top abutting member, and the central axis of the groove is coupled to the body There is an offset distance between the central axes, which is 0.1 mm~0.5*R. The off-axis probe head according to claim 1, wherein the groove is provided as a conical groove, and the cone angle of the conical groove is 60 to 170 degrees. The off-axis probe head according to claim 1, wherein the groove is provided by a semi-circular arc groove, and the arc angle of the semi-circular groove body is 0.5~2*R. The off-axis probe head of claim 1, wherein the groove is provided as a polygonal groove. A probe structure using the off-axis probe head according to claim 1, comprising: a conductive sleeve, the two ends of which form a set of ends and a closed end; the off-axis type a probe head is disposed in the conductive sleeve and adjacent to one end of the sleeve end, the first part of the off-axis probe head The one end portion passes through the conductive sleeve, and is clamped in the conductive sleeve by the ring flange; a top abutting member is disposed on one side of the off-axis probe head, and the top abutting member a portion of the coupling is disposed in the recess; and a resilient member is disposed on the other side of the abutting member and the other end of the resilient member abuts the closed end, the resilient member providing the abutting member The elastic force is required to abut against the groove, and a lateral force is generated to stably reciprocate the off-axis probe head in the conductive sleeve. The probe structure of claim 5, wherein the abutting element is a sphere. The probe structure of claim 5, wherein the abutting member has a shaft to be sleeved in the elastic member, and the shaft is adjacent to one end of the groove to form a half circle. Sphere. The probe structure of claim 5, wherein the groove is provided as a conical groove, and the cone angle of the conical groove is 60 to 170 degrees. The probe structure of claim 8, wherein the abutting member has a shaft for being sleeved in the elastic member, and the shaft is formed corresponding to one end of the conical groove body. a conical body. The probe structure of claim 5, wherein the groove is provided by a semi-circular arc groove, and the arc angle of the semi-circular groove body is 0.5 to 2*R. The probe structure of claim 5, wherein the groove is provided as a polygonal groove.