201213810 六、發明說明： 【發明所屬之技術領域】 本毛月印刷電路板測試轉換設備」，涉及印刷電路 板測試用設備的創新，特別是複合利用垂直導電物與轉 換裝置之技術領域者。 【先前技術】 由於電子技術的高度發展，幾乎所有的電子產品内 部都可以看到印刷電路板的縱影。為確保產品運作正常 無誤’所有印刷電路板（⑽，print“it —d) 於製成後，都需要經過檢測程序，以檢測該印刷電路板 線路是否為良品。 以目前-般所熟知的印刷電路板測試機台來說，皆 係以探針進行印刷電路板測試點的接觸，㈣著印刷電 路板密度越來越高，探針的直徑趨於細微，探針的尖端 更加尖銳，導致高密度印刷電路板在經㈣針接觸後，201213810 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to the innovation of a printed circuit board test conversion device, and relates to an innovation of a device for testing a printed circuit board, particularly a composite use of a vertical conductor and a conversion device. [Prior Art] Due to the high development of electronic technology, the longitudinal direction of printed circuit boards can be seen inside almost all electronic products. To ensure that the product is functioning properly, all printed circuit boards ((10), print “it —d) are tested and tested to determine if the printed circuit board is a good one.” For the board test machine, the probes are used to make contact with the test points of the printed circuit board. (4) The density of the printed circuit board is getting higher and higher, the diameter of the probe tends to be fine, and the tip of the probe is sharper, resulting in high After the (four) needle contact, the density printed circuit board
往往殘留針痕傷害於測試點上，且因接觸面積小，也易 使連接效果不準確；—古|V水 改善方案。 直以，此缺失業界尚無理想之 再者，將高密度轉換成萬用型治具或抓灿或複 =治具時，也遭遇許多問題，例如成本因素、製作限 制等。 有鑑於現有測試之萬用型治具、固接式治真、飛針 測試及複合式治具测試以及轉換板 ： 二密度、設針轉換板及製作心 之问成本及長期製作等問題，發明人特研創成本案期[ 3 201213810 能藉本案之提出， 路板於進行測試時 俾改進現有缺失’期使高密度印刷 ，能—掃既有之缺點或限制。Often residual needle marks are damaged on the test points, and because of the small contact area, the connection effect is also inaccurate; - Ancient | V water improvement program. Straightforward, this lack of industry is still not ideal. When converting high density into universal fixtures or scratching or curing tools, many problems are encountered, such as cost factors and production restrictions. In view of the existing tests of universal fixtures, fixed-type telemetry, flying probe testing and composite fixture testing and conversion panels: two-density, needle-converting plates and the cost of making the heart and long-term production issues, The inventor's special research cost period [3 201213810 can be used in this case, the road board in the test to improve the existing missing" period to enable high-density printing, can sweep the existing shortcomings or limitations.
【發明内容】 货明，tp刷電 於.扭说 似叫珥锝換设備」，其主要目的在 %種創新的測試轉換設備，其有效解決習知缺 ;、二=杜絕針痕傷害，增加測試時接觸面積， 滿足鬲雄、度印刷電路板之測試用途。[Summary of the Invention] The goods, tp brushing electricity, twisting and saying that it is called 珥锝 change equipment", its main purpose is to innovate the test conversion equipment, which effectively solves the lack of conventional knowledge; Increase the contact area during testing to meet the test application of the male and female printed circuit boards.
本案之再一目的為··該種測試轉換設備，具有成本 “里，應用範圍彈性大等優點，適合連接轉換至各式治 具。 為達上述目的’本發明具體之内容，主要是在印刷 電路板的測試點與測試用治具間，設置有垂 轉換裝置。 進一步言，該轉換袭置±，設有相對於測試點位置 之測試部，各測試部又穿設有導通孔。 承上述，該治具之探針，可接觸導通孔而與對應之 垂直導電物接觸’且透過垂直導電物又再與印刷電路板 的測試點導通，藉以達成探針和測試點的間接導通關係 較佳的，前述垂直導電物為軟性物質’例如垂直導 電膠布。 如前所述’由於探針和測試點間設置有垂直導電物 ’因此探針未與測試點直接接觸，可有效避免針痕之產 生。 較佳的’本案之轉換裝置，係依據印刷電路板所需’t s] 4 201213810 測：的測試點，依原始Gerber資料製作成一片雙面板體 ’、、反面位置均以投影之方式製成-比-正反面位 位置形成有測試部，各測試部穿設有導通孔 使轉換扁置之’則试部正、反兩面互通；又該轉換裝置 外側面，依傳統之製作方式，轉換'成治具或 接式Dedicate治具，甚至可轉換成各種〇N Grid的複 a式治具連接於Universal的針床或另外製作—複合式 針床連接於其它的Dedicate測試機。A further object of the present invention is that the test conversion device has the advantages of "cost, large application range elasticity, etc., and is suitable for connection to various types of jigs. To achieve the above purpose, the specific content of the present invention is mainly in printing. A vertical conversion device is disposed between the test point of the circuit board and the test fixture. Further, the conversion is set to ±, and a test portion is provided with respect to the position of the test point, and each test portion is further provided with a through hole. The probe of the fixture can contact the via hole to be in contact with the corresponding vertical conductive material and pass through the vertical conductive material and then be connected to the test point of the printed circuit board, thereby achieving better indirect conduction relationship between the probe and the test point. The foregoing vertical conductive material is a soft substance such as a vertical conductive adhesive tape. As described above, "the vertical conductive material is disposed between the probe and the test point", so that the probe is not in direct contact with the test point, the occurrence of the needle mark can be effectively avoided. The preferred 'transformation device of this case is based on the test point required for the printed circuit board 'ts] 4 201213810 test, according to the original Gerber data to make a double panel ', the reverse surface position is made by projection - the ratio is - the front and back surface positions are formed with a test portion, and each test portion is provided with a through hole to make the conversion flat", and the test portion is connected to the front and the back; The outer side of the device is converted into a fixture or a Dedicate fixture according to the traditional production method. It can even be converted into a variety of 〇N Grid complex a-type fixtures connected to the Universal needle bed or made separately - compound needle bed Connect to other Dedicate testers.
【實施方式】 兹謹就本發明「印刷電路板測試轉換設備」之詳細 内谷&其所產生之功效’配合圖式，舉一本案之較佳 實施例詳細說明如下。 μ首請參閱第-圖所示’本案「印刷電路板測試轉換 設備」’應用於既有之印刷電路板3與治具4 fa1，該印刷 電路板3可為單面或雙面，#包括有若干測試點31 ;而 治具4，包括有若干對應於測試點31數量之探針41 ; 本案特徵在於，印刷電路板3與治具4間配置有： 一轉換裝置1，該轉換裝置丨上，設有相對於測試 點31位置之測試部n，各測試部n穿設有導通孔 ，該測試部11之位置係依據原始Gerber資料所製作， 藉由導通孔12可使轉換裝置丨之測試部丨丨兩端呈現互 通關係；該轉換裝置1之一側，配置有治具4與探針Ο ’該探針41對應至導通孔12且能接觸； 一垂直導電物2，夾設於印刷電路板3和轉換裝置i 間’特別是該垂直導電物2兩端能分別對應至相對應位 5 201213810 置處的印刷電路板3的測試點31和轉換裝置i之測試部 11處；該垂直導電物2，以軟性物質為佳，例如以垂直 導電膠布實施之，該垂4導電物2具有僅垂直方向能導 電、水平方向無法導電之特性。 藉由上述組構件之組合，本案實施時，如第二圖與 第三圖，該印刷電路板3之任一外側，依序設置有垂直 導電物2、轉換裝置！和治具4，·其中，印刷電路板3之 測試點3卜對應接觸至垂直導電物2，又該垂直導電物[Embodiment] The preferred embodiment of the "Printed Circuit Board Test Conversion Apparatus" of the present invention is described in detail below with reference to a preferred embodiment of the present invention. For the first μ, please refer to the 'Printed Circuit Board Test Conversion Equipment' in this case. It is applied to the existing printed circuit board 3 and fixture 4 fa1. The printed circuit board 3 can be single-sided or double-sided, #include There are a plurality of test points 31; and the jig 4 includes a plurality of probes 41 corresponding to the number of test points 31; the present invention is characterized in that: between the printed circuit board 3 and the jig 4: a conversion device 1 is provided, the conversion device The test portion n is disposed at a position relative to the test point 31, and each test portion n is provided with a through hole. The position of the test portion 11 is made according to the original Gerber data, and the switch device 12 can be used to make the conversion device The test unit has an intercommunication relationship at both ends; one side of the conversion device 1 is provided with a jig 4 and a probe Ο 'the probe 41 corresponds to the via hole 12 and can be in contact; a vertical conductive material 2 is sandwiched between Between the printed circuit board 3 and the conversion device i, in particular, the two ends of the vertical conductive material 2 can respectively correspond to the test point 31 of the printed circuit board 3 where the corresponding bit 5 201213810 is located and the test portion 11 of the conversion device i; Vertical conductive material 2, preferably soft material, for example, vertical According to the conductive tape, the vertical conductor 2 has a characteristic that it can conduct electricity only in the vertical direction and cannot conduct electricity in the horizontal direction. By the combination of the above-mentioned group members, in the present embodiment, as shown in the second and third figures, the outer side of the printed circuit board 3 is provided with a vertical conductive material 2 and a conversion device in sequence! And the fixture 4, wherein the test point 3 of the printed circuit board 3 corresponds to the vertical conductive material 2, and the vertical conductive material
2對應端又與治具4之探針41接觸，形成測試點31透 過垂直導電物2而與探針41間接接觸；如是，探針41 仵以就測試點31進行測試。而由於垂直導電物2之配置 ，可有效避免探針41和測試點3〗直接的接觸，因此， 能防止針痕之傷害。 么於轉換裳置！外侧面，可依需要，轉換成⑽”rsaI 治具或固接式D e d i c: a t e治具，甚至可轉換成各種〇 N g厂丄d :複合式治具連接於Universal的針床或另外製作一複 。式針床連接於其它的Dedicate測試機。 另如第四圖，係本案轉換裝置丨之測試部u的另一 :施例。該測試部U鄰接於探針41端具有延伸部以 ^木’十41接觸。此實施例中探針41與測試點w非位 於同一轴線上。 ^又如第五圖，係本案轉換裝置k測試部u的又_ =:。該測試部"鄰接於測試點31端具有延伸部， 試點31垂直導通。此實施例中探針Μ與㈣ ”"占31非位於同一軸線上。 第圖’、第五圖之實施例’目的在於可依據探針4 201213810 與測試點31之密度，位敕％私 — -位移調整出最適當配置位置。 綜上所述’本發明「 P刷電路板測試轉換設備」，依 現订專利法第四十四條招令 條規疋，未有違反同法第二十一條 二四(、'第二十六條、第三十條第-項、第二項 第一十條第二十二條或第四十九條第四項等規定 之it事本案在產業上確實得以利用於申請前未曾見 於刊物或公開使用，且非為公眾所知悉之技術。再者， 本案有解决先别技術中長期存在的問題並達成相關使The corresponding end is in contact with the probe 41 of the jig 4 to form a test point 31 which is in indirect contact with the probe 41 through the vertical conductor 2; if so, the probe 41 is tested for the test point 31. Due to the arrangement of the vertical conductive material 2, the direct contact between the probe 41 and the test point 3 can be effectively avoided, and therefore, the damage of the needle mark can be prevented. What is the conversion of the skirt! The outer side can be converted into (10) rsaI fixtures or fixed D edic: ate fixtures, and can even be converted into various 〇N g factories 丄d: composite fixtures are connected to Universal needle beds or made separately The needle bed is connected to other Dedicate testers. Another figure is another example of the test portion u of the conversion device of the present invention: the test portion U has an extension adjacent to the end of the probe 41 to ^木'十41 contact. In this embodiment, the probe 41 and the test point w are not on the same axis. ^ Also as shown in the fifth figure, the conversion device k test portion u is further _ =:. The test portion " Adjacent to the end of the test point 31, there is an extension, and the pilot 31 is vertically turned on. In this embodiment, the probes are not on the same axis as (4) "" The figures 'and the fifth embodiment' are intended to adjust the most appropriate configuration position based on the density of the probe 4 201213810 and the test point 31, in the % private shift. In summary, the "P brush circuit board test conversion equipment" of the present invention is in accordance with the provisions of Article 44 of the Patent Law, and there is no violation of Article 21 of the same law. The case of Article 6, Article 30, Item 2, Article 12, Article 22 or Item 49, Article 4, etc. is indeed used in the industry and has not been seen in the publication before the application. Or publicly available, and not known to the public. In addition, this case has solved the long-standing problems in the prior art and reached relevant
用者與消費者長期的需求，得佐證本發明並非能輕易完 成°本案7〇全符合專利法規定之「產業利用性」、「新賴 ’\」、，與「進步性」等要件，爰依法提請專利，懇請鈞 局洋查，並儘早為准予專利之審定，以保護申請人之智 慧財產權，俾勵創新。 本發明雖藉由前述實施例來描述，但仍可變化其形 態與細節，於不脫離本發明之精神而達成，並由熟悉I 項技藝之人士可了解。前述本案之較佳實施例，僅係藉 本案原理可以具體實施的方式之一，但並不以此為限制 ’應依後附之申請專利範圍所界定為準。 【圖式簡單說明】 第一圖：係為本發明之配置示意圖。 第二圖：係為本發明之實施狀態圖.。 第三圖：係為本發明局部放大之實施狀態圖。 第四圖：係為本發明局部放大之另一實施狀態圖。 第五圖··係為本發明局部放大之又一實施狀態圖。 201213810 【主要元件符號說明】 1--- 轉換裝置 11-- --測試部 12----導通孔 2--- --垂直導電物 3--- --印刷電路板 31-- --測試點 4--- _-治具 41-- --探針The long-term needs of users and consumers are supported by the fact that the present invention is not easily accomplished. The seven items in this case are all in line with the "industry utilization", "new Lai", and "progressive" requirements of the Patent Law. To apply for a patent in accordance with the law, please ask the bureau to conduct a foreign investigation and approve the patent as soon as possible to protect the intellectual property rights of the applicant and encourage innovation. The present invention has been described by the foregoing embodiments, but the invention may be modified by the spirit and scope of the invention, and can be understood by those skilled in the art. The preferred embodiment of the present invention is only one of the ways in which the present invention can be implemented, but is not limited thereto. [Simplified description of the drawings] The first figure is a schematic diagram of the configuration of the present invention. The second figure is a state diagram of the implementation of the present invention. The third figure is an implementation state diagram of a partial enlargement of the present invention. Fourth Figure: is another embodiment of a partial enlargement of the present invention. Fig. 5 is a view showing still another embodiment of the present invention. 201213810 [Description of main component symbols] 1--- Conversion device 11---Testing part 12----Through hole 2----Vertical conductive material 3----Printed circuit board 31-- -- Test point 4--- _- fixture 41-- -- probe