TWI416115B - - Google Patents

Info

Publication number
TWI416115B
TWI416115B TW98138864A TW98138864A TWI416115B TW I416115 B TWI416115 B TW I416115B TW 98138864 A TW98138864 A TW 98138864A TW 98138864 A TW98138864 A TW 98138864A TW I416115 B TWI416115 B TW I416115B
Authority
TW
Taiwan
Prior art keywords
probe
main body
insulation material
conductive
circuit board
Prior art date
Application number
TW98138864A
Other languages
English (en)
Chinese (zh)
Other versions
TW201118381A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98138864A priority Critical patent/TW201118381A/zh
Publication of TW201118381A publication Critical patent/TW201118381A/zh
Application granted granted Critical
Publication of TWI416115B publication Critical patent/TWI416115B/zh

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW98138864A 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card TW201118381A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Publications (2)

Publication Number Publication Date
TW201118381A TW201118381A (en) 2011-06-01
TWI416115B true TWI416115B (enExample) 2013-11-21

Family

ID=44935625

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98138864A TW201118381A (en) 2009-11-16 2009-11-16 Test device for high-frequency vertical probe card

Country Status (1)

Country Link
TW (1) TW201118381A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105588957A (zh) * 2014-11-12 2016-05-18 致伸科技股份有限公司 测试座

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109752574A (zh) * 2017-11-07 2019-05-14 特克特朗尼克公司 探头末端和探头组件
CN113092982B (zh) * 2020-01-09 2022-03-18 珠海格力电器股份有限公司 一种测试座以及测试设备
TWI799834B (zh) * 2020-05-22 2023-04-21 南韓商李諾工業股份有限公司 測試座以及其製造方法
TWI730806B (zh) * 2020-06-10 2021-06-11 中華精測科技股份有限公司 具有懸臂式探針的垂直式探針卡

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200617397A (en) * 2004-09-30 2006-06-01 Yokowo Seisakusho Kk Inspection unit
CN1281966C (zh) * 2002-10-02 2006-10-25 株式会社瑞萨科技 探针片、探针卡及半导体检查装置
TW200813458A (en) * 2006-09-12 2008-03-16 Yokowo Seisakusho Kk Socket for use in inspection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1281966C (zh) * 2002-10-02 2006-10-25 株式会社瑞萨科技 探针片、探针卡及半导体检查装置
TW200617397A (en) * 2004-09-30 2006-06-01 Yokowo Seisakusho Kk Inspection unit
TW200813458A (en) * 2006-09-12 2008-03-16 Yokowo Seisakusho Kk Socket for use in inspection

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105588957A (zh) * 2014-11-12 2016-05-18 致伸科技股份有限公司 测试座
CN105588957B (zh) * 2014-11-12 2019-03-22 致伸科技股份有限公司 测试座

Also Published As

Publication number Publication date
TW201118381A (en) 2011-06-01

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