TWI411016B - 離位摻雜之半導體傳送層 - Google Patents

離位摻雜之半導體傳送層 Download PDF

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Publication number
TWI411016B
TWI411016B TW096149078A TW96149078A TWI411016B TW I411016 B TWI411016 B TW I411016B TW 096149078 A TW096149078 A TW 096149078A TW 96149078 A TW96149078 A TW 96149078A TW I411016 B TWI411016 B TW I411016B
Authority
TW
Taiwan
Prior art keywords
semiconductor
dopant material
nanoparticles
nanoparticle
annealing
Prior art date
Application number
TW096149078A
Other languages
English (en)
Chinese (zh)
Other versions
TW200845149A (en
Inventor
Keith B Kahen
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of TW200845149A publication Critical patent/TW200845149A/zh
Application granted granted Critical
Publication of TWI411016B publication Critical patent/TWI411016B/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02612—Formation types
    • H01L21/02617—Deposition types
    • H01L21/02623—Liquid deposition
    • H01L21/02628—Liquid deposition using solutions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02521—Materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02587—Structure
    • H01L21/0259—Microstructure
    • H01L21/02601—Nanoparticles
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/89—Deposition of materials, e.g. coating, cvd, or ald
    • Y10S977/892—Liquid phase deposition

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Photovoltaic Devices (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Electroluminescent Light Sources (AREA)
TW096149078A 2007-02-22 2007-12-20 離位摻雜之半導體傳送層 TWI411016B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/677,794 US7375011B1 (en) 2007-02-22 2007-02-22 Ex-situ doped semiconductor transport layer

Publications (2)

Publication Number Publication Date
TW200845149A TW200845149A (en) 2008-11-16
TWI411016B true TWI411016B (zh) 2013-10-01

Family

ID=39370788

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096149078A TWI411016B (zh) 2007-02-22 2007-12-20 離位摻雜之半導體傳送層

Country Status (6)

Country Link
US (1) US7375011B1 (enExample)
EP (1) EP2122673B1 (enExample)
JP (1) JP5171848B2 (enExample)
CN (1) CN101611480B (enExample)
TW (1) TWI411016B (enExample)
WO (1) WO2008103161A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7785657B2 (en) * 2006-12-11 2010-08-31 Evident Technologies, Inc. Nanostructured layers, method of making nanostructured layers, and application thereof
US20090014423A1 (en) * 2007-07-10 2009-01-15 Xuegeng Li Concentric flow-through plasma reactor and methods therefor
US7718707B2 (en) * 2006-12-21 2010-05-18 Innovalight, Inc. Method for preparing nanoparticle thin films
US8968438B2 (en) * 2007-07-10 2015-03-03 Innovalight, Inc. Methods and apparatus for the in situ collection of nucleated particles
US8471170B2 (en) * 2007-07-10 2013-06-25 Innovalight, Inc. Methods and apparatus for the production of group IV nanoparticles in a flow-through plasma reactor
US20090053878A1 (en) * 2007-08-21 2009-02-26 Maxim Kelman Method for fabrication of semiconductor thin films using flash lamp processing
GB2461079A (en) 2008-06-19 2009-12-23 Mighton Products Ltd Sash window restrictor having a protruding member and retaining mechanism
EP2360289A1 (de) * 2010-02-23 2011-08-24 Saint-Gobain Glass France Vorrichtung und Verfahren zum Abscheiden einer aus mindestens zwei Komponenten bestehenden Schicht auf einem Gegenstand
CA3135785A1 (en) * 2019-05-05 2020-11-12 Yuguang C. Li Conversion of carbonate into syngas or c2+ products in electrolysis cell
TWI702405B (zh) * 2019-08-12 2020-08-21 久盛光電股份有限公司 光敏式薄膜電晶體及電磁波檢測裝置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050008880A1 (en) * 2003-07-08 2005-01-13 Klaus Kunze Compositions and methods for forming a semiconducting and/or silicon-containing film, and structures formed therefrom
US20060237719A1 (en) * 2002-10-30 2006-10-26 Hewlett-Packard Development Company, L.P. Electronic components
US20060292777A1 (en) * 2005-06-27 2006-12-28 3M Innovative Properties Company Method for making electronic devices using metal oxide nanoparticles

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5262357A (en) * 1991-11-22 1993-11-16 The Regents Of The University Of California Low temperature thin films formed from nanocrystal precursors
US6878871B2 (en) 2002-09-05 2005-04-12 Nanosys, Inc. Nanostructure and nanocomposite based compositions and photovoltaic devices
GB0409877D0 (en) * 2004-04-30 2004-06-09 Univ Manchester Preparation of nanoparticle materials
CN100387101C (zh) * 2005-07-01 2008-05-07 中山大学 一种提高有机电致发光器件寿命的方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060237719A1 (en) * 2002-10-30 2006-10-26 Hewlett-Packard Development Company, L.P. Electronic components
US20050008880A1 (en) * 2003-07-08 2005-01-13 Klaus Kunze Compositions and methods for forming a semiconducting and/or silicon-containing film, and structures formed therefrom
US20060292777A1 (en) * 2005-06-27 2006-12-28 3M Innovative Properties Company Method for making electronic devices using metal oxide nanoparticles

Also Published As

Publication number Publication date
JP2010519765A (ja) 2010-06-03
TW200845149A (en) 2008-11-16
CN101611480A (zh) 2009-12-23
JP5171848B2 (ja) 2013-03-27
EP2122673A1 (en) 2009-11-25
US7375011B1 (en) 2008-05-20
CN101611480B (zh) 2012-09-05
EP2122673B1 (en) 2013-02-13
WO2008103161A1 (en) 2008-08-28

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MM4A Annulment or lapse of patent due to non-payment of fees