TWI410293B - Method of flattening volcano crater edges formed by laser - Google Patents

Method of flattening volcano crater edges formed by laser Download PDF

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Publication number
TWI410293B
TWI410293B TW100103674A TW100103674A TWI410293B TW I410293 B TWI410293 B TW I410293B TW 100103674 A TW100103674 A TW 100103674A TW 100103674 A TW100103674 A TW 100103674A TW I410293 B TWI410293 B TW I410293B
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micro
substrate
recess
periphery
laser processing
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TW100103674A
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TW201231204A (en
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Jiunhau Ie
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Global Lighting Technology Inc
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Abstract

A method of flattening volcano crater edges formed by laser includes a step of providing a substrate, a step of processing a laser-carving step on a surface of the substrate to form at least one micro notch with at least one protrusion at the periphery of the micro notch, and a step of removing the protrusion of the micro notch so as to reduce the height of the protrusion after the laser-carving step.

Description

雷射加工火山口之平整方法Laser processing method for crater processing

本發明有關於一種雷射加工火山口之平整方法。The invention relates to a method for leveling a laser processing crater.

傳統在利用雷射光束對一基材表面進行高溫轟擊而形成一凹孔時,將無可避免地導致基材之熔渣噴濺現象,以致各凹孔處形成火山口(volcano crater)之外觀,意即於凹孔之周緣形成一或多個不規則之突起物。此些突起物對於此基材之後續使用上造成不便的負擔。Conventionally, when a high-temperature bombardment of a substrate surface by a laser beam is used to form a recessed hole, the slag splashing phenomenon of the substrate is inevitably caused, so that the appearance of a volcano crater is formed at each recessed hole. That is, one or more irregular protrusions are formed on the periphery of the concave hole. Such protrusions impose an inconvenient burden on the subsequent use of the substrate.

舉例而言,傳統在導光板表面製作光學微結構時,係利用雷射光束對印壓模具形成許多微型凹孔,以便利用印壓模具表面上之此些微型凹孔,於導光板之表面印壓出對應之光學微結構。For example, when optical micro-structures are conventionally fabricated on the surface of a light guide plate, a plurality of micro-recessed holes are formed in the stamping die by using a laser beam to print on the surface of the light guide plate by using the micro-recess holes on the surface of the stamping die. The corresponding optical microstructure is extruded.

然而,當印壓模具對導光板印壓多次,使得微型凹孔周緣之突起物因此而彎折或崩塌而掉落至微型凹孔內而填補微型凹孔時,將導致印壓模具無法完整地印壓出完整的光學微結構圖案,進而導致導光板之導光性能的劣化。However, when the stamping die presses the light guide plate a plurality of times, so that the protrusion of the periphery of the micro recessed hole is bent or collapsed and falls into the micro recessed hole to fill the micro recessed hole, the stamping die cannot be completed. The ground prints out a complete optical microstructure pattern, which in turn leads to deterioration of the light guiding performance of the light guide plate.

由此可見,上述印壓模具之結構仍存在不便與缺陷,而有待加以進一步改良。為了解決上述問題,相關領域莫不費盡心思來謀求解決之道,但長久以來一直未見適用的方式被發展完成。It can be seen that the structure of the above-mentioned printing die still has inconvenience and defects, and needs to be further improved. In order to solve the above problems, the relevant fields have not exhausted their efforts to seek solutions, but the methods that have not been applied for a long time have been developed.

因此,如何能提供有效解決上述問題之結構,避免再現上述之後果,實屬當前重要研發課題之一,亦成為當前相關領域亟需改進的目標。Therefore, how to provide a structure that effectively solves the above problems and avoid reappearing the above-mentioned consequences is one of the current important research and development topics, and has become an urgent need for improvement in related fields.

本發明揭露一種雷射加工火山口之平整方法,用以提供一具多個微型凹孔之基材。The invention discloses a method for leveling a laser processing crater for providing a substrate with a plurality of micro recesses.

本發明揭露一種雷射加工火山口之平整方法,用以降低微型凹孔周緣之突起物因脫落而填補微型凹孔之機會。The invention discloses a method for leveling a laser processing crater, which is used for reducing the chance of the protrusion of the periphery of the micro concave hole filling the micro concave hole due to falling off.

本發明揭露一種雷射加工火山口之平整方法。此方法包含步驟為提供一基材,對基材之表面進行雷射加工,以致基材之表面形成至少一個微型凹孔,其中微型凹孔之開口周緣具有至少一個突起物,以及於雷射加工完畢後,移除微型凹孔開口周緣之突起物,以致平整化微型凹孔之周緣。The invention discloses a method for leveling a laser processing crater. The method comprises the steps of providing a substrate, performing laser processing on the surface of the substrate such that the surface of the substrate forms at least one micro-recessed hole, wherein the opening of the micro-recessed hole has at least one protrusion and laser processing After completion, the protrusions on the periphery of the micro-recess opening are removed, so that the periphery of the micro-recess is flattened.

本發明之一第一實施例,移除微型凹孔周緣之突起物之步驟可包含步驟為藉由刀具切除微型凹孔周緣之突起物。此第一實施例中之一變化中,沿平行基材表面之方向,藉由刀具僅切除基材表面上之微型凹孔周緣之突起物。此第一實施例中之另一變化中,沿平行基材表面之方向,藉由刀具刨除基材之表面,以切除基材之表面包含微型凹孔周緣之突起物。其中刀具切除基材之表面之厚度範圍為1微米-5微米。而且,此第一實施例中之刀具為鑽石刀或碳纖維刀。In a first embodiment of the present invention, the step of removing the protrusions around the periphery of the micro-recess holes may include the step of cutting the protrusions around the periphery of the micro-recess holes by the cutter. In one variation of this first embodiment, only the protrusions of the periphery of the micro-recess holes on the surface of the substrate are cut by the cutter in the direction parallel to the surface of the substrate. In another variation of this first embodiment, the surface of the substrate is removed by a cutter in a direction parallel to the surface of the substrate to cut off the surface of the substrate comprising protrusions around the periphery of the microrecess. The thickness of the surface of the cutting substrate of the cutter ranges from 1 micrometer to 5 micrometers. Moreover, the tool in this first embodiment is a diamond knife or a carbon fiber knife.

本發明之一第二實施例,移除微型凹孔周緣之突起物之步驟可包含步驟為藉由一酸性溶液侵蝕各微型凹孔周緣之突起物,以致消除各微型凹孔周緣之突起物,其中基材為一金屬模組。具體來說,藉由酸性溶液侵蝕各微型凹孔周緣之突起物之步驟更包含步驟為將基材浸泡於一磷酸溶液中,其中磷酸溶液之濃度為10%。In a second embodiment of the present invention, the step of removing the protrusions around the periphery of the micro-recess holes may include the steps of etching the protrusions around the periphery of each of the micro-recess holes by an acidic solution, so as to eliminate the protrusions on the periphery of each of the micro-recess holes. The substrate is a metal module. Specifically, the step of etching the protrusions around the periphery of each of the micro-recess holes by the acidic solution further comprises the step of immersing the substrate in a monophosphoric acid solution, wherein the concentration of the phosphoric acid solution is 10%.

本發明之一第三實施例,移除微型凹孔周緣之突起物之步驟可包含步驟為噴出高壓砂粒以撞擊基材之表面。此第三實施例中,高壓砂粒為玻璃砂、金剛砂、白砂或紅砂。此第三實施例中,高壓砂粒之行進速度為15-30公尺/分鐘。此第三實施例中,高壓砂粒之壓力為0.003-0.3兆帕(MPA)。In a third embodiment of the present invention, the step of removing the protrusions around the periphery of the micro-recess holes may include the step of ejecting the high-pressure sand particles to strike the surface of the substrate. In this third embodiment, the high pressure sand is glass sand, corundum, white sand or red sand. In this third embodiment, the high speed grit travels at a speed of 15-30 meters per minute. In this third embodiment, the pressure of the high pressure grit is 0.003 - 0.3 MPa (MPA).

本發明之一第四實施例,移除微型凹孔周緣之突起物之步驟可包含步驟為藉由一研磨工具研磨基材之表面。In a fourth embodiment of the present invention, the step of removing the protrusions around the periphery of the micro-recess may include the step of grinding the surface of the substrate by an abrasive tool.

本發明之一第五實施例,移除微型凹孔周緣之突起物之步驟可包含步驟為藉由一壓迫工具貼合於基材之表面,以及使壓迫工具開始沿一垂直基材之表面之方向壓迫基材之表面,以致壓扁各微型凹孔周緣之突起物。In a fifth embodiment of the present invention, the step of removing the protrusions around the periphery of the micro-recess holes may include the steps of bonding the surface of the substrate by a pressing tool and starting the pressing tool along the surface of a vertical substrate. The direction presses the surface of the substrate so as to collapse the protrusions around the periphery of each of the micro-recess holes.

綜上所述,本發明雷射加工火山口之平整方法可降低或甚至避免微型凹孔周緣之突起物因脫落而填補微型凹孔之機會,進而避免基材,例如為導光板於製作完成後,導致其導光性能之劣化;或是基材,例如為金屬材質之印壓模具後續對導光板進行光學微結構圖案之印壓工作時,無法於導光板表面印壓出正確的光學微結構圖案,更進一步來說,也提高印壓模具之產品壽命。In summary, the method for leveling the laser processing crater of the present invention can reduce or even avoid the opportunity for the protrusions around the periphery of the micro-recess to fill the micro-recessed holes, thereby avoiding the substrate, for example, after the light guide plate is manufactured. , causing deterioration of its light guiding performance; or when the substrate, for example, a metal stamping die, is subjected to the printing operation of the optical microstructure pattern of the light guide plate, the correct optical microstructure cannot be printed on the surface of the light guide plate. The pattern, and further, also increases the product life of the stamping die.

以下將以圖示及詳細說明清楚說明本發明之精神,如熟悉此技術之人員在瞭解本發明之實施例後,當可由本發明所教示之技術,加以改變及修飾,其並不脫離本發明之精神與範圍。The present invention will be apparent from the following description and the detailed description of the embodiments of the present invention, which may be modified and modified by the teachings of the present invention without departing from the invention. The spirit and scope.

如上所述,有鑑於利用雷射光束對基材表面進行高溫照射將無可避免地導致熔渣噴濺現象,以致於各微型凹孔處形成火山口之外觀,將導致火山口周緣之突起物可能掉落微型凹孔內,而不利後續基材之壓模工作或者影響導光板之光學效能。As described above, in view of the high-temperature irradiation of the surface of the substrate by the laser beam, the slag splash phenomenon is inevitably caused, so that the appearance of the crater at each of the micro-recess holes will result in a projection of the periphery of the crater. It may fall into the micro-recessed hole, which may hinder the work of the subsequent substrate or affect the optical performance of the light guide plate.

為此,請參閱第1圖至第3圖所示,第1圖繪示本發明雷射加工火山口之平整方法之流程圖。第2圖繪示本發明基材於一實施例之示意圖及其中一微型凹孔210之局部放大圖。第3圖繪示第2圖之3-3剖視圖。To this end, please refer to FIGS. 1 to 3, and FIG. 1 is a flow chart showing a method for leveling the laser processing crater of the present invention. 2 is a partial enlarged view of a substrate of the present invention and a micro-recess 210 therein. Fig. 3 is a cross-sectional view taken along line 3-3 of Fig. 2.

本發明提供一種雷射加工火山口之平整方法,步驟包含:步驟(101)提供一基材100。The invention provides a method for leveling a laser processing crater, the step comprising: step (101) providing a substrate 100.

此步驟中,基材100呈板狀,可例如為一金屬模具、擴散膜片或一導光板。金屬模具,例如印壓模具,可由不鏽鋼、銅、鐵或鋁等材質所製成。導光板例如由聚對苯二甲酸乙二酯(polyethylene Terephthalate,PET)、聚碳酸酯(polycarbonate,PC)或聚甲基丙烯酸甲酯(Poly(methyl methacrylate),PMMA)等透明材料所製成。In this step, the substrate 100 has a plate shape and may be, for example, a metal mold, a diffusion film or a light guide plate. Metal molds, such as stamping dies, can be made of stainless steel, copper, iron or aluminum. The light guide plate is made of, for example, a transparent material such as polyethylene terephthalate (PET), polycarbonate (PC), or poly(methyl methacrylate) (PMMA).

步驟(102)對基材100之表面110進行雷射加工,以致基材100之表面110形成一或多個具火山口形狀之微型凹孔210,其中各微型凹孔210之開口周緣具有一或多個突起物220(第3圖)。由於此些凹孔之口徑具微米級尺寸大小,故稱之為微型凹孔210。Step (102) performs laser processing on the surface 110 of the substrate 100 such that the surface 110 of the substrate 100 forms one or more micro-recesses 210 having a crater shape, wherein each of the micro-recessed holes 210 has an opening circumference or A plurality of protrusions 220 (Fig. 3). Since the diameter of the recessed holes has a micron size, it is called a micro recess 210.

舉例而言,此步驟是依據一圖案設計,藉由雷射產生器分別輸出多個雷射光束至基材100之表面110,使得雷射光束分別轟擊基材100之表面110以熔融出許多微型凹孔210(第2圖),此些微型凹孔210於基材100之表面110形成一微孔聚集圖案200。For example, this step is based on a pattern design in which a plurality of laser beams are respectively outputted to the surface 110 of the substrate 100 by the laser generator, so that the laser beams respectively bombard the surface 110 of the substrate 100 to melt a plurality of miniatures. The recessed holes 210 (Fig. 2), the micro recessed holes 210 form a microporous pattern 200 on the surface 110 of the substrate 100.

步驟(103)於雷射加工完畢後,移除各微型凹孔210之火山口外緣。Step (103), after the laser processing is completed, the outer edge of the crater of each of the micro recesses 210 is removed.

此步驟中係於雷射加工製程完成後,利用物理或化學之方式移除各微型凹孔210開口周緣之突起物220,以致消除各微型凹孔210之火山口外緣;甚至,移除各微型凹孔210開口周緣之突起物220以致於平整化各微型凹孔210之周緣,意即使各微型凹孔210開口周緣與基材100之表面110大致齊平。In this step, after the laser processing process is completed, the protrusions 220 of the peripheral edges of the micro-recess holes 210 are physically or chemically removed, so as to eliminate the outer edges of the craters of the micro-recess holes 210; The protrusions 220 of the periphery of the micro-recess holes 210 are so as to flatten the circumference of each of the micro-recess holes 210, even if the periphery of the opening of each of the micro-recess holes 210 is substantially flush with the surface 110 of the substrate 100.

此外,當基材100為金屬模具130且於完成本發明雷射加工火山口之平整方法後,其中一用途可利用上述之微孔聚集圖案200,以用來對一導光板之表面印壓出一光學結構圖案。當基材100為一導光板且於完成本發明雷射加工火山口之平整方法後,可安裝至一背光模組中以提供導光性能。In addition, when the substrate 100 is the metal mold 130 and after completing the flattening method of the laser processing crater of the present invention, one of the applications can utilize the above-mentioned micropore collection pattern 200 for printing out the surface of a light guide plate. An optical structure pattern. When the substrate 100 is a light guide plate and after completing the flattening method of the laser processing crater of the present invention, it can be mounted into a backlight module to provide light guiding performance.

本發明以下更揭露更多實施例以進一步闡明本發明雷射加工火山口之平整方法之各種辦法。Further embodiments of the present invention are further disclosed below to further clarify various methods of the flattening method of the laser processing crater of the present invention.

請參閱第4圖及第5A圖所示,第4圖繪示第1圖之步驟103於一第一實施例中之細部流程圖。第5A圖繪示本發明第一實施例之操作示意圖(I)。Please refer to FIG. 4 and FIG. 5A. FIG. 4 is a detailed flow chart of step 103 of FIG. 1 in a first embodiment. Fig. 5A is a schematic view (I) of the operation of the first embodiment of the present invention.

此第一實施例之基材100可為一導光板、金屬模具或一擴散膜片時,於步驟103中可具體地包含步驟(103A1 )及步驟(103A2 )如下。When the substrate 100 of the first embodiment can be a light guide plate, a metal mold or a diffusion film, the step (103A 1 ) and the step (103A 2 ) can be specifically included in the step 103 as follows.

步驟(103 A1 ):切除微型凹孔210周緣之此些突起物220。Step (103 A 1 ): cutting out the protrusions 220 on the periphery of the micro recess 210.

此步驟於第一實施例中,可藉由刀具300僅將各微型凹孔210周緣之此些突起物220予以切除。In this step, in the first embodiment, only the protrusions 220 on the periphery of each of the micro-recess holes 210 can be cut by the cutter 300.

此步驟於第一實施例之一變化下(第5A圖),係指藉由刀具300於基材100之表面110上,沿平行基材100之表面110之方向R1 滑行,僅刮除各微型凹孔210周緣之此些突起物220,而不破壞基材100之表面110;較佳地,此步驟於第一實施例之一變化下可使微型凹孔210周緣與基材100之表面110大致齊平。This step is changed in one of the first embodiments (Fig. 5A), which means that the cutter 300 slides on the surface 110 of the substrate 100 along the direction R 1 of the surface 110 of the parallel substrate 100, and only scrapes each The protrusions 220 on the periphery of the micro-recess 210 do not damage the surface 110 of the substrate 100; preferably, this step allows the periphery of the micro-recess 210 and the surface of the substrate 100 to be changed in one of the first embodiments. 110 is roughly flush.

步驟(103 A2 ):清洗基材100。Step (103 A 2 ): The substrate 100 is washed.

此步驟中,係藉由清洗液沖洗基材100之表面110,使得基材100上已脫離之突起物220、顆粒或料屑可隨清洗液遠離基材100。清洗程序可例如為超音波洗淨。清洗液可例如為純水、酒精或異丙醇(IPA)等。In this step, the surface 110 of the substrate 100 is washed by the cleaning liquid so that the protrusions 220, particles or chips that have been detached from the substrate 100 can be separated from the substrate 100 with the cleaning liquid. The cleaning procedure can be, for example, ultrasonic cleaning. The cleaning liquid may be, for example, pure water, alcohol or isopropyl alcohol (IPA) or the like.

此外,請參閱第5B圖所示,第5B圖繪示本發明第一實施例之操作示意圖(II)。上述步驟(103 A1 )於另一變化下(第5B圖),係指藉由刀具300沿平行基材100之表面110之方向R1 ,刨除基材100之表面110之一外層L,使得刀具可依序地橫向通過各微型凹孔210,以一併去除基材100之表面110包含其上之各微型凹孔210周緣之突起物220;較佳地,此另一變化可使微型凹孔210周緣與基材100之一新表面120大致齊平。In addition, referring to FIG. 5B, FIG. 5B is a schematic view (II) of the operation of the first embodiment of the present invention. The above step (103 A 1 ) is another variation (Fig. 5B), which means that the outer layer L of one surface 110 of the substrate 100 is removed by the cutter 300 in the direction R 1 parallel to the surface 110 of the substrate 100. The cutters may sequentially pass through the respective micro-recess holes 210 to collectively remove the protrusions 220 of the surface 110 of the substrate 100 including the periphery of each of the micro-recess holes 210; preferably, the other variation may make the micro-concave The perimeter of the aperture 210 is substantially flush with a new surface 120 of the substrate 100.

具體而言,此另一變化中,刀具300切除基材100之外層L之厚度範圍大致為1微米-5微米之間。此外,所述之刀具300可為一飛剪刀(Flycut),係以垂直基材100之表面110之方向為軸,自轉地刮除基材100之表面110或突出於基材100之表面110之物體(突起物220)。此外,上述之刀具300含鑽石或碳纖維材質,為鑽石刀或碳纖維刀。Specifically, in this other variation, the cutter 300 cuts the outer layer L of the substrate 100 to a thickness ranging from approximately 1 micrometer to 5 micrometers. In addition, the cutter 300 may be a fly cutter that rotates the surface 110 of the substrate 100 or protrudes from the surface 110 of the substrate 100 by taking the direction of the surface 110 of the vertical substrate 100 as a shaft. Object (projection 220). In addition, the cutter 300 described above is made of diamond or carbon fiber and is a diamond knife or a carbon fiber knife.

請參閱第6圖及第7圖所示,第6圖繪示第1圖之步驟103於一第二實施例中之細部流程圖。第7圖繪示本發明第二實施例之操作示意圖。Please refer to FIG. 6 and FIG. 7. FIG. 6 is a detailed flow chart of step 103 of FIG. 1 in a second embodiment. Figure 7 is a schematic view showing the operation of the second embodiment of the present invention.

此第二實施例之基材100可為金屬模具130時,於步驟103中可具體地包含步驟(103B1 )及步驟(103B2 )如下。When the substrate 100 of the second embodiment can be the metal mold 130, the step (103B 1 ) and the step (103B 2 ) can be specifically included in the step 103 as follows.

步驟(103B1 ):藉由一酸性溶液400侵蝕各微型凹孔210周緣之此些突起物220,以致消除各微型凹孔210周緣之此些突起物220。Step (103B 1 ): the protrusions 220 on the periphery of each of the micro-recess holes 210 are eroded by an acidic solution 400 so that the protrusions 220 on the periphery of each of the micro-recess holes 210 are eliminated.

此步驟於第二實施例中,可將金屬模具130浸泡於一具有酸性溶液400之容器410中,使得金屬模具130之表面110之各微型凹孔210周緣之此些突起物220漸漸被侵蝕後而不致如此突出。較佳地,此步驟於第二實施例中可使微型凹孔210周緣與金屬模具130之表面110大致齊平。In this step, in the second embodiment, the metal mold 130 can be immersed in a container 410 having an acidic solution 400, so that the protrusions 220 on the periphery of each of the micro-recess holes 210 of the surface 110 of the metal mold 130 are gradually eroded. Not so prominent. Preferably, this step allows the circumference of the micro-recess 210 to be substantially flush with the surface 110 of the metal mold 130 in the second embodiment.

舉例而言,酸性溶液400例如為一磷酸溶液,磷酸溶液之濃度為10%,當金屬模具130浸泡於磷酸溶液中30分鐘後,各微型凹孔210周緣之此些突起物220漸漸受到磷酸溶液之腐蝕而漸漸溶解於酸性溶液400中,進而脫離金屬模具130之表面(即各微型凹孔210之周緣)。然而,雖然上例中所使用的為磷酸調配液,但操作人員將可隨著金屬模具材料的種類不同(如鍍鎳、鋁、銅等)而改變。For example, the acidic solution 400 is, for example, a monophosphoric acid solution, and the concentration of the phosphoric acid solution is 10%. After the metal mold 130 is immersed in the phosphoric acid solution for 30 minutes, the protrusions 220 on the periphery of each of the micro-recess holes 210 are gradually subjected to a phosphoric acid solution. The corrosion gradually dissolves in the acidic solution 400, and is further separated from the surface of the metal mold 130 (i.e., the periphery of each of the micro recesses 210). However, although the phosphoric acid blending solution used in the above example, the operator may vary depending on the type of the metal mold material (e.g., nickel plating, aluminum, copper, etc.).

需說明的是,由於酸鹼性(PH值)、濃度及時間之設定,可控制僅各微型凹孔210周緣之此些突起物220受到作用,而大致脫離金屬模具130之表面(即各微型凹孔210之周緣),不致對金屬模具130之表面或各微型凹孔210之內壁造成太大傷害。It should be noted that, due to the setting of acidity and alkalinity (pH value), concentration and time, only the protrusions 220 of the periphery of each of the micro-recess holes 210 can be controlled to be substantially separated from the surface of the metal mold 130 (ie, each micro The periphery of the recess 210 does not cause too much damage to the surface of the metal mold 130 or the inner walls of the micro recess 210.

而且操作人員可依據金屬模具130之不同材質,選擇合適設定之酸性溶液400,以移除各微型凹孔210周緣之此些突起物220。Moreover, the operator can select an appropriately set acidic solution 400 according to different materials of the metal mold 130 to remove the protrusions 220 on the periphery of each of the micro recesses 210.

步驟(103 B2 ):清洗金屬模具130。Step (103 B 2 ): cleaning the metal mold 130.

此步驟中,係藉由清洗液沖洗金屬模具130之表面110,使得金屬模具130上已脫離之突起物220、顆粒、料屑及酸性溶液400可隨清洗液遠離金屬模具130。清洗程序可例如為超音波洗淨。清洗液可例如為純水、酒精或異丙醇(IPA)等。In this step, the surface 110 of the metal mold 130 is washed by the cleaning liquid, so that the protrusions 220, particles, chips and the acidic solution 400 which have been detached from the metal mold 130 can be separated from the metal mold 130 with the cleaning liquid. The cleaning procedure can be, for example, ultrasonic cleaning. The cleaning liquid may be, for example, pure water, alcohol or isopropyl alcohol (IPA) or the like.

請參閱第8圖及第9圖所示,第8圖繪示第1圖之步驟103於一第三實施例中之細部流程圖。第9圖繪示本發明第三實施例之操作示意圖。Please refer to FIG. 8 and FIG. 9. FIG. 8 is a detailed flow chart of step 103 of FIG. 1 in a third embodiment. Figure 9 is a schematic view showing the operation of the third embodiment of the present invention.

此第三實施例之基材100可為於導光板、金屬模具或一擴散膜片時,於步驟103中可具體地包含步驟(103C1 )及步驟(103C2 )如下。When the substrate 100 of the third embodiment can be a light guide plate, a metal mold or a diffusion film, the step (103C 1 ) and the step (103C 2 ) can be specifically included in the step 103 as follows.

步驟(103C1 ):噴出高壓砂粒510以撞擊基材100之表面,藉此扁平化各微型凹孔210周緣之此些突起物220。Step (103C 1 ): The high-pressure sand particles 510 are sprayed to strike the surface of the substrate 100, thereby flattening the protrusions 220 on the periphery of each of the micro-recess holes 210.

此步驟於第三實施例中,藉由噴砂工具500所噴出之高壓砂粒510以撞擊基材100之表面110之各微型凹孔210周緣之此些突起物220,如此,基材100之表面110之各微型凹孔210周緣之此些突起物220可被撞擊而扁平化後而不致如此突出。較佳地,此步驟於第三實施例中可使微型凹孔210周緣與基材100之表面110大致齊平。In the third embodiment, the high pressure grit 510 ejected by the blasting tool 500 strikes the protrusions 220 on the periphery of each of the micro recesses 210 of the surface 110 of the substrate 100. Thus, the surface 110 of the substrate 100 The protrusions 220 on the periphery of each of the micro-recess holes 210 can be impacted and flattened without being so protruded. Preferably, this step allows the periphery of the micro-recess 210 to be substantially flush with the surface 110 of the substrate 100 in the third embodiment.

舉例而言,所述之砂粒可例如為玻璃砂、金剛砂、白砂或紅砂等等。所述高壓砂粒510之行進速度可例如為15-30公尺/分鐘。所述高壓砂粒510之壓力可例如為0.003-0.3兆帕(MPA)。For example, the grit may be, for example, glass sand, silicon carbide, white sand or red sand, and the like. The traveling speed of the high pressure grit 510 may be, for example, 15 to 30 meters per minute. The pressure of the high pressure grit 510 can be, for example, 0.003-0.3 megapascals (MPA).

需說明的是,當所述高壓砂粒510噴塗於基材100之表面110後,使得基材100之表面恰可呈現出凸出顆粒狀。步驟(103 C2 ):清洗基材100。It should be noted that when the high-pressure sand 510 is sprayed on the surface 110 of the substrate 100, the surface of the substrate 100 may be convexly granulated. Step (103 C 2 ): The substrate 100 is washed.

此步驟中,係藉由清洗液沖洗基材100之表面110,使得基材100上已脫離之突起物220、顆粒、料屑或殘餘之高壓砂粒510可隨清洗液遠離基材100。清洗程序可例如為超音波洗淨。清洗液可例如為純水、酒精或異丙醇(IPA)等。In this step, the surface 110 of the substrate 100 is rinsed with a cleaning solution such that the detached protrusions 220, particles, chips or residual high pressure grit 510 on the substrate 100 can be separated from the substrate 100 with the cleaning solution. The cleaning procedure can be, for example, ultrasonic cleaning. The cleaning liquid may be, for example, pure water, alcohol or isopropyl alcohol (IPA) or the like.

如此,當基材100於此實施例應用於導光板上時,導光板表面呈現出凸出顆粒狀恰可提供形成霧化處理,以供均勻化所輸之光線。同樣地,當基材100於此實施例應用於金屬模具時,可對一導光板之表面進行光學結構圖案之印壓,其中金屬模具表面110之凸出顆粒狀恰可使此導光板之表面形成霧化處理。Thus, when the substrate 100 is applied to the light guide plate in this embodiment, the surface of the light guide plate exhibits a convex grain shape to provide an atomization process for homogenizing the light to be transmitted. Similarly, when the substrate 100 is applied to the metal mold in this embodiment, the surface of the light guide plate can be printed with an optical structure pattern, wherein the surface of the metal mold surface 110 is convex and the surface of the light guide plate can be made. An atomization process is formed.

另外,操作人員可依據各微型凹孔210周緣之此些突起物220之凸出程度,選擇合適之噴砂工具500,以確實扁平化各微型凹孔210周緣之此些突起物220。In addition, the operator can select a suitable blasting tool 500 according to the degree of protrusion of the protrusions 220 on the periphery of each of the micro-recess holes 210 to surely flatten the protrusions 220 of the periphery of each of the micro-recess holes 210.

請參閱第10圖及第11圖所示,第10圖繪示第1圖之步驟103於一第四實施例中之細部流程圖。第11圖繪示本發明第四實施例之操作示意圖。Please refer to FIG. 10 and FIG. 11 . FIG. 10 is a detailed flow chart of step 103 of FIG. 1 in a fourth embodiment. Figure 11 is a schematic view showing the operation of the fourth embodiment of the present invention.

此第四實施例之基材100可應用於導光板、金屬模具或一擴散膜片上,特別於步驟103中可具體地包含步驟(103D1 )及步驟(103D2 )如下。The substrate 100 of the fourth embodiment can be applied to a light guide plate, a metal mold or a diffusion film. Specifically, in step 103, the step (103D 1 ) and the step (103D 2 ) can be specifically included as follows.

步驟(103 D1 ):研磨基材100之表面,以移除各微型凹孔210周緣之此些突起物220。Step (103 D 1 ): grinding the surface of the substrate 100 to remove the protrusions 220 of the periphery of each of the micro-recess holes 210.

此步驟於第四實施例中,可藉由一研磨工具600,例如砂輪機將各微型凹孔210周緣之此些突起物220予以磨除;較佳地,此步驟於第四實施例中可使微型凹孔210周緣與基材100之表面110大致齊平。In this step, in the fourth embodiment, the protrusions 220 on the periphery of each of the micro recesses 210 can be removed by a grinding tool 600, such as a grinder; preferably, this step can be performed in the fourth embodiment. The periphery of the micro-recess 210 is substantially flush with the surface 110 of the substrate 100.

步驟(103 D2 ):清洗基材100。Step (103 D 2 ): The substrate 100 is washed.

此步驟中,係藉由清洗液沖洗基材100之表面110,使得基材100上已脫離之突起物220、顆粒或料屑可隨清洗液遠離基材100。清洗程序可例如為超音波洗淨。清洗液可例如為純水、酒精或異丙醇(IPA)等。In this step, the surface 110 of the substrate 100 is washed by the cleaning liquid so that the protrusions 220, particles or chips that have been detached from the substrate 100 can be separated from the substrate 100 with the cleaning liquid. The cleaning procedure can be, for example, ultrasonic cleaning. The cleaning liquid may be, for example, pure water, alcohol or isopropyl alcohol (IPA) or the like.

如此,當基材100於此實施例應用於導光板上時,導光板表面被研磨後可提供形成霧化處理,以供均勻化所輸之光線。As such, when the substrate 100 is applied to the light guide plate in this embodiment, the surface of the light guide plate is ground to provide an atomization process for homogenizing the transmitted light.

請參閱第12圖及第13圖所示,第12圖繪示第1圖之步驟103於一第五實施例中之細部流程圖。第13圖繪示本發明第五實施例之操作示意圖。Referring to FIG. 12 and FIG. 13, FIG. 12 is a detailed flow chart of step 103 of FIG. 1 in a fifth embodiment. Figure 13 is a schematic view showing the operation of the fifth embodiment of the present invention.

此第四實施例之基材100可應用於導光板、金屬模具或一擴散膜片上,特別於步驟103中可具體地包含步驟(103E1 )及步驟(103E2 )如下。The substrate 100 of the fourth embodiment can be applied to a light guide plate, a metal mold or a diffusion film. Specifically, in step 103, the step (103E 1 ) and the step (103E 2 ) can be specifically included as follows.

步驟(103 E1 ):藉由一壓迫工具700壓扁基材100之微型凹孔210周緣之此些突起物220。Step (103 E 1 ): the protrusions 220 on the periphery of the micro-recess 210 of the substrate 100 are flattened by a pressing tool 700.

此步驟於第五實施例中,藉由一壓迫工具700將各微型凹孔210周緣之此些突起物220壓扁,使得各微型凹孔210周緣之此些突起物220可不致如此突出。In this step, in the fifth embodiment, the protrusions 220 on the periphery of each of the micro-recess holes 210 are flattened by a pressing tool 700, so that the protrusions 220 on the periphery of each of the micro-recess holes 210 are not so protruded.

具體而言,第五實施例可藉由一壓迫工具700先貼合於基材100具微型凹孔210之表面(第13圖(a)),之後,使此壓迫工具700沿一垂直基材100之表面之方向R2 開始壓迫基材100之表面,以致壓扁此微型凹孔210周緣之此些突起物220(第13圖(b));較佳地,此步驟於第五實施例中可使微型凹孔210周緣與基材100之表面110大致齊平。Specifically, the fifth embodiment can be first attached to the surface of the substrate 100 having the micro recess 210 by a pressing tool 700 (FIG. 13(a)), and then the pressing tool 700 is placed along a vertical substrate. The direction R 2 of the surface of 100 begins to press the surface of the substrate 100 such that the protrusions 220 of the periphery of the micro-recess 210 are flattened (Fig. 13(b)); preferably, this step is in the fifth embodiment. The periphery of the micro-recess 210 may be substantially flush with the surface 110 of the substrate 100.

步驟(103 E2 ):清洗基材100。Step (103 E 2 ): The substrate 100 is washed.

此步驟中,係藉由清洗液沖洗基材100之表面110,使得基材100上已脫離之突起物220、顆粒或料屑可隨清洗液遠離基材100。清洗程序可例如為超音波洗淨。清洗液可例如為純水、酒精或異丙醇(IPA)等。In this step, the surface 110 of the substrate 100 is washed by the cleaning liquid so that the protrusions 220, particles or chips that have been detached from the substrate 100 can be separated from the substrate 100 with the cleaning liquid. The cleaning procedure can be, for example, ultrasonic cleaning. The cleaning liquid may be, for example, pure water, alcohol or isopropyl alcohol (IPA) or the like.

綜上所述,由於上述各實施例皆可迫使各微型凹孔210周緣之此些突起物220不致如此突出,本發明雷射加工火山口之平整方法可降低或甚至避免微型凹孔210周緣之突起物220因脫落而填補微型凹孔210之機會,進而避免基材100,例如導光板製作完成後,導致其導光性能之劣化;或是基材100,例如金屬材質之印壓模具後續對導光板進行光學微結構圖案之印壓工作時,無法於導光板表面印壓出正確的光學微結構圖案,更進一步來說,也提高印壓模具之產品壽命。In summary, since the above embodiments can force the protrusions 220 of the periphery of each micro-recess 210 to be not so protruded, the method for leveling the laser processing crater of the present invention can reduce or even avoid the periphery of the micro-recess 210. The protrusion 220 fills the micro-recess 210 by falling off, thereby preventing the substrate 100, for example, after the light guide is completed, causing deterioration of its light guiding performance; or the substrate 100, for example, a metal stamping die When the light guide plate performs the printing operation of the optical microstructure pattern, the correct optical microstructure pattern cannot be printed on the surface of the light guide plate, and further, the product life of the stamping mold is also improved.

本發明所揭露如上之各實施例中,並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。The present invention is not limited to the embodiments of the present invention, and various modifications and refinements may be made without departing from the spirit and scope of the present invention. This is subject to the definition of the scope of the patent application.

100...基材100. . . Substrate

110...表面110. . . surface

120...新表面120. . . New surface

130...金屬模具130. . . Metal mold

200...微孔聚集圖案200. . . Micropore aggregation pattern

210...微型凹孔210. . . Miniature recess

220...突起物220. . . Protrusion

300...刀具300. . . Tool

400...酸性溶液400. . . Acid solution

410...容器410. . . container

500...噴砂工具500. . . Sandblasting tool

510...高壓砂粒510. . . High pressure sand

600...研磨工具600. . . Grinding tool

700...壓迫工具700. . . Compression tool

L...外層L. . . Outer layer

R1 、R2 ...方向R 1 , R 2 . . . direction

101-103...步驟101-103. . . step

103A1 -103A2 ...步驟103A 1 -103A 2 . . . step

103B1 -103B2 ...步驟103B 1 -103B 2 . . . step

103C1 -103C2 ...步驟103C 1 -103C 2 . . . step

103D1 -103D2 ...步驟103D 1 -103D 2 . . . step

103E1 -103E2 ...步驟103E 1 -103E 2 . . . step

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之詳細說明如下:The above and other objects, features, advantages and embodiments of the present invention will become more apparent and understood.

第1圖繪示本發明雷射加工火山口之平整方法之流程圖。FIG. 1 is a flow chart showing a method for leveling a laser processing crater of the present invention.

第2圖繪示本發明基材於一實施例之示意圖及其中一微型凹孔之局部放大圖。2 is a partial enlarged view of a substrate according to an embodiment of the present invention and a micro-recessed hole therein.

第3圖繪示第2圖之3-3剖視圖。Fig. 3 is a cross-sectional view taken along line 3-3 of Fig. 2.

第4圖繪示第1圖之步驟103於一第一實施例中之細部流程圖。FIG. 4 is a detailed flow chart of step 103 of FIG. 1 in a first embodiment.

第5A圖繪示本發明第一實施例之操作示意圖(I)。Fig. 5A is a schematic view (I) of the operation of the first embodiment of the present invention.

第5B圖繪示本發明第一實施例之操作示意圖(II)。Fig. 5B is a schematic view (II) showing the operation of the first embodiment of the present invention.

第6圖繪示第1圖之步驟103於一第二實施例中之細部流程圖。FIG. 6 is a detailed flow chart of step 103 of FIG. 1 in a second embodiment.

第7圖繪示本發明第二實施例之操作示意圖。Figure 7 is a schematic view showing the operation of the second embodiment of the present invention.

第8圖繪示第1圖之步驟103於一第三實施例中之細部流程圖。FIG. 8 is a detailed flow chart of step 103 of FIG. 1 in a third embodiment.

第9圖繪示本發明第三實施例之操作示意圖。Figure 9 is a schematic view showing the operation of the third embodiment of the present invention.

第10圖繪示第1圖之步驟103於一第四實施例中之細部流程圖。FIG. 10 is a detailed flow chart of step 103 of FIG. 1 in a fourth embodiment.

第11圖繪示本發明第四實施例之操作示意圖。Figure 11 is a schematic view showing the operation of the fourth embodiment of the present invention.

第12圖繪示第1圖之步驟103於一第五實施例中之細部流程圖。Figure 12 is a flow chart showing the details of step 103 of Figure 1 in a fifth embodiment.

第13圖繪示本發明第五實施例之操作示意圖。Figure 13 is a schematic view showing the operation of the fifth embodiment of the present invention.

101-103...步驟101-103. . . step

Claims (12)

一種雷射加工火山口之平整方法,適於製作一光學微結構圖案,該方法包含:提供一基材,其中該基材為一導光板或一擴散膜片;依據一圖案設計,對該基材之一外表面進行雷射加工,以致該基材之該外表面形成多個微型凹孔,其中每一該些微型凹孔之開口周緣具有至少一個突起物;以及於雷射加工完畢後,移除每一該些微型凹孔開口周緣之該突起物,以致平整化該微型凹孔之周緣,使得該些微型凹孔形成該光學微結構圖案。 A method for leveling a laser processing crater, which is suitable for fabricating an optical microstructure pattern, the method comprising: providing a substrate, wherein the substrate is a light guide plate or a diffusion film; One of the outer surfaces of the material is subjected to laser processing such that the outer surface of the substrate forms a plurality of micro-recessed holes, wherein each of the micro-recessed holes has at least one protrusion at the periphery of the opening; and after the laser processing is completed, The protrusions of the periphery of each of the micro-recess openings are removed such that the periphery of the micro-recess holes is planarized such that the micro-recess holes form the optical microstructure pattern. 如請求項1所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一刀具切除該微型凹孔周緣之該突起物,其係使該刀具沿平行該基材之該外表面之方向,刨除該基材之該外表面之厚度範圍為1微米~5微米,以切除該基材之該外表面包含該微型凹孔周緣之該突起物。 The method for leveling a laser processing crater according to claim 1, wherein the step of removing the protrusion of each of the micro-recess holes comprises: cutting the protrusion of the periphery of the micro-recess by a cutter Providing the tool in a direction parallel to the outer surface of the substrate, the outer surface of the substrate being cut to a thickness ranging from 1 micrometer to 5 micrometers, to remove the outer surface of the substrate comprising the micro recess The protrusion of the circumference. 如請求項1所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:噴出高壓砂粒以撞擊該基材之表面,其中該高壓砂粒為玻璃砂、金剛砂、白砂或紅砂。 The method for leveling a laser processing crater according to claim 1, wherein the step of removing the protrusion of each of the micro-recess holes comprises: spraying high-pressure sand particles to strike a surface of the substrate, wherein the high voltage The sand is glass sand, corundum, white sand or red sand. 如請求項3所述之雷射加工火山口之平整方法,其中該高壓砂粒之行進速度為15-30公尺/分鐘,且該高壓砂 粒之壓力為0.003兆帕(MPA)~0.3兆帕(MPA)。 The method for leveling a laser processing crater according to claim 3, wherein the high pressure sand has a traveling speed of 15-30 meters/minute, and the high pressure sand The pressure of the granules is from 0.003 MPa (MPA) to 0.3 MPa (MPA). 如請求項1所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一研磨工具研磨該基材之該外表面。 The method for leveling a laser processing crater according to claim 1, wherein the step of removing the protrusion of each of the micro-recess holes comprises: grinding the outer surface of the substrate by an abrasive tool. 一種雷射加工火山口之平整方法,適於製作一光學微結構圖案,該方法包含:提供一基材,其中該基材為一印壓模具;依據一圖案設計,對該基材之一外表面進行雷射加工,以致該基材之該外表面形成多個微型凹孔,其中每一該些微型凹孔之開口周緣具有至少一個突起物;以及於雷射加工完畢後,移除每一該些微型凹孔開口周緣之該突起物,以致平整化該微型凹孔之周緣,該印壓模具之該些微型凹孔用以對一導光板之該外表面印壓出該光學微結構圖案。 A method for leveling a laser processing crater, which is suitable for fabricating an optical microstructure pattern, the method comprising: providing a substrate, wherein the substrate is a stamping die; according to a pattern design, one of the substrates is outside The surface is subjected to laser processing such that the outer surface of the substrate forms a plurality of micro-recessed holes, wherein each of the micro-recessed holes has at least one protrusion on the periphery of the opening; and after the laser processing is completed, each is removed The protrusions of the periphery of the micro-recess openings open the periphery of the micro-recess holes, and the micro-recess holes of the stamping die are used to print the optical microstructure pattern on the outer surface of a light guide plate. . 如請求項6所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一刀具切除該微型凹孔周緣之該突起物,其係使該刀具沿平行該基材之該外表面之方向,刨除該基材之該外表面之厚度範圍為1微米~5微米,以切除該基材之該外表面包含該微型凹孔周緣之該突起物。 The method for leveling a laser processing crater according to claim 6, wherein the step of removing the protrusion of each of the micro-recess holes comprises: cutting the protrusion of the periphery of the micro-recess by a cutter Providing the tool in a direction parallel to the outer surface of the substrate, the outer surface of the substrate being cut to a thickness ranging from 1 micrometer to 5 micrometers, to remove the outer surface of the substrate comprising the micro recess The protrusion of the circumference. 如請求項6所述之雷射加工火山口之平整方法,其 中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一酸性溶液侵蝕該微型凹孔周緣之該突起物,其係將該基材浸泡於一磷酸溶液中,其中該磷酸溶液之濃度為10%。 a method for leveling a laser processing crater as described in claim 6 The step of removing the protrusions on the periphery of each of the micro-recess holes comprises: etching the protrusions on the periphery of the micro-recess holes by an acidic solution, wherein the substrate is immersed in a phosphoric acid solution, wherein The concentration of the phosphoric acid solution was 10%. 如請求項6所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:噴出高壓砂粒以撞擊該基材之表面,其中該高壓砂粒為玻璃砂、金剛砂、白砂或紅砂。 The method for leveling a laser processing crater according to claim 6, wherein the step of removing the protrusion of each of the micro-recess holes comprises: spraying high-pressure sand particles to strike a surface of the substrate, wherein the high voltage The sand is glass sand, corundum, white sand or red sand. 如請求項9所述之雷射加工火山口之平整方法,其中該高壓砂粒之行進速度為15-30公尺/分鐘,且其中該高壓砂粒之壓力為0.003-0.3兆帕(MPA)。 The method for leveling a laser processing crater according to claim 9, wherein the high pressure sand has a traveling speed of 15 to 30 meters per minute, and wherein the pressure of the high pressure sand is 0.003 to 0.3 megapascals (MPA). 如請求項6所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一研磨工具研磨該基材之該外表面。 The method for leveling a laser processing crater according to claim 6, wherein the step of removing the protrusion of each of the micro-recess holes comprises: grinding the outer surface of the substrate by an abrasive tool. 如請求項6所述之雷射加工火山口之平整方法,其中移除每一該些微型凹孔周緣之該突起物之步驟,包含:藉由一壓迫工具貼合於該基材之該外表面;以及使該壓迫工具開始沿一垂直該基材之該外表面之方向壓迫該基材之該外表面,以致壓扁該微型凹孔周緣之該突起物。The method for leveling a laser processing crater according to claim 6, wherein the step of removing the protrusion of each of the micro-recess holes comprises: attaching the substrate to the substrate by a pressing tool a surface; and causing the compression tool to begin pressing the outer surface of the substrate in a direction perpendicular to the outer surface of the substrate such that the protrusion of the periphery of the micro-recess is flattened.
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0890265A (en) * 1994-09-19 1996-04-09 Sumitomo Metal Ind Ltd Tube manufacturing method by laser beam welding
JP2010221262A (en) * 2009-03-24 2010-10-07 Honda Motor Co Ltd Method for forming texture

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0890265A (en) * 1994-09-19 1996-04-09 Sumitomo Metal Ind Ltd Tube manufacturing method by laser beam welding
JP2010221262A (en) * 2009-03-24 2010-10-07 Honda Motor Co Ltd Method for forming texture

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