TWI405608B - Surface modification method and surface-modified article - Google Patents
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- TWI405608B TWI405608B TW095110248A TW95110248A TWI405608B TW I405608 B TWI405608 B TW I405608B TW 095110248 A TW095110248 A TW 095110248A TW 95110248 A TW95110248 A TW 95110248A TW I405608 B TWI405608 B TW I405608B
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D65/00—Accessories or auxiliary operations, in general, for separation processes or apparatus using semi-permeable membranes
- B01D65/02—Membrane cleaning or sterilisation ; Membrane regeneration
-
- A—HUMAN NECESSITIES
- A62—LIFE-SAVING; FIRE-FIGHTING
- A62D—CHEMICAL MEANS FOR EXTINGUISHING FIRES OR FOR COMBATING OR PROTECTING AGAINST HARMFUL CHEMICAL AGENTS; CHEMICAL MATERIALS FOR USE IN BREATHING APPARATUS
- A62D3/00—Processes for making harmful chemical substances harmless or less harmful, by effecting a chemical change in the substances
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D67/00—Processes specially adapted for manufacturing semi-permeable membranes for separation processes or apparatus
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G5/00—Cleaning or de-greasing metallic material by other methods; Apparatus for cleaning or de-greasing metallic material with organic solvents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02054—Cleaning before device manufacture, i.e. Begin-Of-Line process combining dry and wet cleaning steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02299—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment
- H01L21/02312—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour
- H01L21/02315—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour treatment by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61L—METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL; DISINFECTION, STERILISATION OR DEODORISATION OF AIR; CHEMICAL ASPECTS OF BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES; MATERIALS FOR BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES
- A61L2/00—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
- A61L2/02—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor using physical phenomena
- A61L2/14—Plasma, i.e. ionised gases
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2321/00—Details relating to membrane cleaning, regeneration, sterilization or to the prevention of fouling
- B01D2321/20—By influencing the flow
- B01D2321/2066—Pulsated flow
- B01D2321/2075—Ultrasonic treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Toxicology (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Business, Economics & Management (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Emergency Management (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Surface Treatment Of Glass (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Weting (AREA)
- Fuel Cell (AREA)
- Cleaning In General (AREA)
- ing And Chemical Polishing (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
本發明是關於一種具有親水性表面之物品的表面處理方法、以及利用此方法被表面處理的物品。The present invention relates to a surface treatment method for an article having a hydrophilic surface, and an article surface treated by the method.
本申請案根據2005年3月25日提出申請的日本專利特願2005-089631號而主張優先權,並將其內容引用於本發明。The present application claims priority from Japanese Patent Application No. 2005-089631, filed on March 25, 2005, the content of which is incorporated herein.
作為利用電漿分解或者去除有機物的方法,眾所周知例如有以下方法。As a method of decomposing or removing organic substances by plasma, for example, the following methods are known.
(I)知悉有如下方法:於大氣壓下,使氧氣或者氬氣為電漿狀態,並將該電漿噴附於矽晶圓、液晶用玻璃基板等基板的表面,去除附著於該基板表面的有機物(參照專利文獻1、2)。又,使該方法實用化的常壓電漿表面處理裝置已被製品化。(I) It is known that the oxygen or argon gas is in a plasma state at atmospheric pressure, and the plasma is sprayed on the surface of a substrate such as a silicon wafer or a liquid crystal glass substrate to remove the surface attached to the substrate. Organic matter (see Patent Documents 1 and 2). Moreover, the normal piezoelectric slurry surface treatment apparatus which puts this method practical has been manufactured.
(Ⅱ)提出有如下方法:對包含有機物的有機溶劑等液體照射超聲波,使液體中產生氣泡,其次對該氣泡照射電磁波,使氣泡內產生電漿,以作為電漿氣泡,並由該電漿氣泡將分散於液體中的有機物分解(參照專利文獻3)。(II) A method is proposed in which a liquid such as an organic solvent containing an organic substance is irradiated with an ultrasonic wave to generate a bubble in the liquid, and then the electromagnetic wave is irradiated to the bubble to generate a plasma in the bubble to serve as a plasma bubble, and the plasma is used. The bubbles decompose the organic matter dispersed in the liquid (see Patent Document 3).
(Ⅲ)於專利文獻4~9中揭示有如下技術:將氧、空氣等氣體供給至水中,以使水中產生氣泡,並對該氣泡施加高電壓脈衝,使氣泡內部瞬間成為電漿狀態,並利用電漿分解水中的有機物。(III) Patent Literatures 4 to 9 disclose a technique of supplying a gas such as oxygen or air to water to generate bubbles in the water, and applying a high voltage pulse to the bubble to instantaneously become a plasma state inside the bubble. Use plasma to break down organic matter in water.
(Ⅳ)於專利文獻10中揭示有:使高溫電漿氣泡產生於液體中,並使由電漿氣泡產生的化合物附著於纖維表面,對該纖維表面實施凹凸形狀等表面重組(surface reforming)的技術,以及由此技術所獲得的功能化纖維。(IV) Patent Document 10 discloses that a high-temperature plasma bubble is generated in a liquid, and a compound generated by the plasma bubble is adhered to the surface of the fiber, and surface re-formation such as a concavo-convex shape is applied to the surface of the fiber. Technology, and functionalized fibers obtained by this technology.
(I)的方法中,存有如下問題:(1)雖然可利用電漿分解或去除無機材料等耐熱性物品表面的有機物,但導致分解物或未反應的有機物飄浮於大氣中;(2)雖然可產生高能量的電漿氣體,但因物品表面溫度非常高,故難以適用於有機高分子材料。In the method of (I), there are the following problems: (1) Although the plasma can be used to decompose or remove organic substances on the surface of a heat-resistant article such as an inorganic material, the decomposition product or unreacted organic matter floats in the atmosphere; (2) Although a high-energy plasma gas can be produced, it is difficult to apply to an organic polymer material because the surface temperature of the article is extremely high.
(Ⅱ)的方法中,(1)雖然可分解分散於液體中之有機物,但是不清楚是否適於去除附著於物品表面之有機物,(2)相反地,即使讓氣泡中之電漿接觸物品而分解有機物,亦與(1)之方法同樣地,由於物品表面溫度變高,而難以適用於有機高分子材料。In the method of (II), (1) although the organic substance dispersed in the liquid can be decomposed, it is not clear whether it is suitable for removing the organic substance attached to the surface of the article, and (2) conversely, even if the plasma in the bubble contacts the article In the same manner as in the method of (1), the decomposition of the organic substance is difficult to apply to the organic polymer material because the surface temperature of the article becomes high.
(Ⅲ)的方法中,與上述(Ⅱ)同樣地,(1)雖然可分解分散於液體中的有機物,但是不清楚是否適於去除附著於物品表面的有機物。而且,(2)由於電漿狀態僅短時間維持,故當電漿狀態下的氣泡(以下稱為電漿氣泡)與欲分解的有機物的接觸頻率較低時,難以有效分解。In the method of (III), similarly to the above (II), (1) although the organic substance dispersed in the liquid can be decomposed, it is not clear whether it is suitable for removing the organic substance adhering to the surface of the article. Further, (2) since the plasma state is maintained only for a short period of time, when the frequency of contact between the bubbles in the plasma state (hereinafter referred to as plasma bubbles) and the organic substance to be decomposed is low, it is difficult to effectively decompose.
於(Ⅳ)之專利文獻10的說明書中揭示有,若使電漿氣泡接觸纖維,則可進行纖維的表面重組。纖維素材未加以特別限定。然而,如(Ⅱ)之專利文獻3所述,對於電漿氣泡溫度約為5000K的高溫,通常有機高分子材料不具有可承受如此高溫的充分耐熱性。又,當材料熔點或軟化點低於電漿氣泡的溫度時,預想當接觸電漿氣泡時,材料溶解並產生流動,或者導致熱分解或破壞,故而難以使電漿氣泡適用於使用如此材料的纖維中。又,使用如此耐熱性差的材料時,預想與其賦予表面凹凸功能,莫如纖維形態其本身遭受破壞。又,實施例中列舉有碳纖維,但考慮到碳纖維其纖維非常纖細,並且取決於纖維表面的褶皺形狀或表面石墨的構造程度、耐焰化程度,但部分接觸高溫電漿氣泡的纖維部分,由於熱導致過度石墨化,使纖維局部變脆,纖維全體的機械特性下降。又,使用耐熱性差的材料時,關於是否可不改變其表面形態而清洗,並無任何揭示。於專利文獻10的說明書中,如上關於材料選擇方面無任何揭示。The specification of Patent Document 10 of (IV) discloses that the surface recombination of the fibers can be carried out by bringing the plasma bubbles into contact with the fibers. The fiber material is not particularly limited. However, as described in Patent Document 3 of (II), for a high temperature at which the plasma bubble temperature is about 5000 K, the organic polymer material generally does not have sufficient heat resistance to withstand such a high temperature. Moreover, when the melting point or softening point of the material is lower than the temperature of the plasma bubble, it is expected that when the plasma bubble is contacted, the material dissolves and generates a flow, or causes thermal decomposition or destruction, so that it is difficult to make the plasma bubble suitable for use of such a material. In the fiber. Further, when such a material having poor heat resistance is used, it is expected that the surface unevenness function is imparted thereto, as the fiber form itself is damaged. Further, carbon fibers are exemplified in the examples, but in view of the fact that the carbon fibers are very fine, and depending on the wrinkle shape of the fiber surface or the degree of construction of the surface graphite and the degree of flame resistance, the fiber portion partially contacting the high-temperature plasma bubbles is The heat causes excessive graphitization, causing the fibers to become locally brittle, and the mechanical properties of the entire fiber are degraded. Further, when a material having poor heat resistance is used, there is no disclosure as to whether or not the surface can be cleaned without changing its surface morphology. In the specification of Patent Document 10, there is no disclosure as far as the material selection is concerned.
【專利文獻1】日本專利特開2002-143795號公報【專利文獻2】日本專利特開2004-311838號公報【專利文獻3】日本專利特開2004-306029號公報【專利文獻4】日本專利特表2005-502456號公報【專利文獻5】日本專利特開2005-58887號公報【專利文獻6】日本專利特開2005-21869號公報【專利文獻7】日本專利特開2005-13858號公報【專利文獻8】日本專利特開2004-268003號公報【專利文獻9】日本專利特開2002-272825號公報【專利文獻10】日本專利特開2005-105465號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. JP-A No. 2004-311838 (Patent Document 2) Japanese Patent Laid-Open No. 2004-311838 (Patent Document 3) Japanese Patent Laid-Open Publication No. 2004-306029 (Patent Document 4) [Patent Document 5] Japanese Patent Laid-Open Publication No. 2005-58887 [Patent Document 6] Japanese Patent Laid-Open Publication No. 2005-21869 (Patent Document 7) Japanese Patent Laid-Open Publication No. 2005-13858 Japanese Patent Laid-Open Publication No. Hei. No. Hei. No. Hei. No. 2002-272825.
本發明之目的在於提供一種分解或去除附著於物品的污垢等有機物而不使其飛散至大氣中,並且抑制物品受損的表面處理方法;一面抑制物品受損一面蝕刻物品表面的表面處理方法;以及將表面高度清洗,對幾乎未受損的物品或表面進行蝕刻,並且無損傷的物品。An object of the present invention is to provide a surface treatment method for decomposing or removing an organic substance such as dirt attached to an article without scattering it to the atmosphere and suppressing damage of the article; and a surface treatment method for etching the surface of the article while suppressing damage of the article; And items that are highly cleaned on the surface, etched on almost undamaged items or surfaces, and are not damaged.
本發明的表面處理方法,其特徵在於:使含水液體中水蒸氣氣泡內產生的電漿,於該液體中,接觸對水的接觸角小於等於90度的材料。The surface treatment method of the present invention is characterized in that a plasma generated in a water vapor bubble in an aqueous liquid is brought into contact with a material having a contact angle with water of 90 degrees or less in the liquid.
又,本發明的物品是利用上述表面處理方法進行表面處理的物品。Further, the article of the present invention is an article which is surface-treated by the above surface treatment method.
根據本發明的表面處理方法,可分解或者去除附著於物品的有機物,而不使其飛散至大氣中,並且抑制物品受損。而且,可一面抑制物品受損,一面蝕刻物品表面。根據本發明的表面處理方法所獲得的物品,其表面被高度清洗或者蝕刻,而且幾乎無損傷。According to the surface treatment method of the present invention, the organic matter attached to the article can be decomposed or removed without being scattered to the atmosphere, and the article is prevented from being damaged. Moreover, the surface of the article can be etched while suppressing damage to the article. The article obtained by the surface treatment method according to the present invention has a surface which is highly cleaned or etched and which is almost free from damage.
本發明的表面處理方法是使含水液體中水蒸氣氣泡內產生的電漿,於該液體中接觸具有親水性表面之物品的方法。本發明中親水性材料的指標,是對水的接觸角小於等於90度的材料。The surface treatment method of the present invention is a method of bringing a plasma generated in a water vapor bubble in an aqueous liquid into contact with an article having a hydrophilic surface in the liquid. The index of the hydrophilic material in the present invention is a material having a contact angle with water of 90 degrees or less.
作為用於本發明之電漿產生裝置,可使用揭示於日本專利特開2003-297598號公報、日本專利特開2004-152523號公報的電漿產生裝置。As the plasma generating apparatus used in the present invention, a plasma generating apparatus disclosed in Japanese Laid-Open Patent Publication No. 2003-297598 and Japanese Patent Laid-Open No. 2004-152523 can be used.
以下,以具體的電漿產生裝置為例,說明本發明的表面處理方法。Hereinafter, a surface treatment method of the present invention will be described by taking a specific plasma generating apparatus as an example.
圖1是表示用於本發明之表面處理方法的電漿產生裝置之一例的概略構成圖。該電漿產生裝置10是包括如下各部分而概略構成,即儲存液體11的容器12;配置於該容器12內用以放射電磁波的電極13;對向配置於該電極13的對向電極14;將物品15固定於電極13與對向電極14之間的支持具16;連接於電極13及對向電極14的電磁波電源(例如高頻率電源)(省略圖示);以及調整容器12內液體11上方的空氣相19(氣相)之壓力的真空泵(省略圖示)。Fig. 1 is a schematic block diagram showing an example of a plasma generating apparatus used in the surface treating method of the present invention. The plasma generating device 10 is a container 12 having a schematic configuration, that is, a container 12 for storing the liquid 11, an electrode 13 disposed in the container 12 for radiating electromagnetic waves, and a counter electrode 14 disposed opposite to the electrode 13; The article 15 is fixed to the support member 16 between the electrode 13 and the counter electrode 14; an electromagnetic wave power source (for example, a high frequency power source) (not shown) connected to the electrode 13 and the counter electrode 14; and the liquid 11 in the container 12 is adjusted. A vacuum pump (not shown) that presses the air phase 19 (gas phase) above.
於電漿產生裝置10中,電極13連接於可供給高頻率/高電壓的電磁波電源。對電極13供給該電源的電磁能量,可使電極加熱,電極周圍的液體11氣化,並於電極周圍附著有以水蒸氣為主成分的水蒸氣氣泡17。In the plasma generating apparatus 10, the electrode 13 is connected to an electromagnetic wave power source that can supply a high frequency/high voltage. When the electromagnetic energy of the power source is supplied to the electrode 13, the electrode can be heated, and the liquid 11 around the electrode is vaporized, and water vapor bubbles 17 containing water vapor as a main component are adhered around the electrode.
當對附著於電極的水蒸氣氣泡施加高頻率/高電壓時,氣泡內部水分子的分子運動激烈,並且自構成水分子的原子中逐出電子,產生正電荷氣體與電子。被逐出的電子產生連續攻擊其他水蒸氣的連鎖反應,並陸續產生正電荷氣體與電子,使水蒸氣氣泡內部成為電漿狀態。When a high frequency/high voltage is applied to the water vapor bubbles attached to the electrodes, the molecular motion of the water molecules inside the bubbles is intense, and electrons are ejected from the atoms constituting the water molecules, generating positively charged gases and electrons. The evicted electrons generate a chain reaction that continuously attacks other water vapors, and successively generate positively charged gases and electrons, causing the inside of the water vapor bubbles to become a plasma state.
由電漿狀態下的水蒸氣氣泡(以下稱為水蒸氣氣泡電漿),於特定波長域發光。由該發光光譜可瞭解,電漿氣泡內部產生的氣體種類。表1中記錄水蒸氣氣泡電漿的發光光譜之波長與作為發光原因的氣體種類之歸屬。Water vapor bubbles (hereinafter referred to as steam bubble plasma) in a plasma state emit light in a specific wavelength range. From the luminescence spectrum, the type of gas generated inside the plasma bubble can be known. Table 1 records the wavelength of the luminescence spectrum of the vapor bubble plasma and the species of the gas which is the cause of luminescence.
當電極周圍的水蒸氣氣泡電漿接觸由浸於液體11中之物品15表面之有機物所構成的污垢時,利用(1)水蒸氣氣泡電漿之熱引起的熱分解作用、(2)水蒸氣氣泡電漿中OH自由基的氧化作用此兩個作用,分解或者去除污垢。When the water vapor bubble plasma around the electrode contacts the dirt composed of the organic matter immersed in the surface of the article 15 in the liquid 11, the thermal decomposition caused by (1) the heat of the steam bubble plasma, (2) water vapor is utilized. The oxidation of OH radicals in the bubble plasma serves to separate or decompose the dirt.
以下詳細說明,本表面處理中,當物品具有親水性時,物品周圍的水蒸發,並由於蒸發潛熱使物品表面冷卻,並降低(1)中水蒸氣氣泡電漿之熱引起的熱分解。As will be described in detail below, in the surface treatment, when the article is hydrophilic, water around the article evaporates, and the surface of the article is cooled by the latent heat of vaporization, and thermal decomposition caused by heat of the plasma of the water vapor bubble in (1) is lowered.
作為液體11,可為含水的液體,例如可列舉含有水、與水混合之有機溶劑的水溶液,水中溶解有電解質離子的水溶液等。The liquid 11 may be an aqueous liquid, and examples thereof include an aqueous solution containing water and an organic solvent mixed with water, and an aqueous solution in which electrolyte ions are dissolved in water.
作為可與水混合的有機溶劑,可列舉甲醇、乙醇、異丙醇、丁醇等種類的醇以及丙酮等。作為電解質離子,可列舉Mg2 + 、Ca2 + 、Na+ 、Fe2 + 、Fe3 + 、Cl- 、NO3 - 、NO2 、OH- 等。Examples of the organic solvent that can be mixed with water include alcohols such as methanol, ethanol, isopropanol, and butanol, and acetone. Examples of the electrolyte ions include Mg 2 + , Ca 2 + , Na + , Fe 2 + , Fe 3 + , Cl - , NO 3 - , NO 2 , OH - and the like.
因液體11中存在電解質離子,放水的電氣傳導度提高,於產生電漿時,電弧放電電流易自放射電磁波的電極13流向對向電極14。有機溶劑因電漿而碳化,其碳化物可能附著於物品15上。又,液體成分中,水的體積分率下降時,如下所述,水對物品15表面的冷卻效果下降,並且物品15的表面易受損。因此,液體11較好的是盡可能不含有有機溶劑,尤其好的是完全不含有。更好的是,使用半導體的製造製程等所使用的純水、超純水較為理想。Since the electrolyte ions are present in the liquid 11, the electrical conductivity of the water discharge is improved, and when the plasma is generated, the arc discharge current easily flows from the electrode 13 for radiating electromagnetic waves to the counter electrode 14. The organic solvent is carbonized by the plasma, and its carbide may adhere to the article 15. Further, when the volume fraction of water in the liquid component is lowered, as described below, the cooling effect of water on the surface of the article 15 is lowered, and the surface of the article 15 is easily damaged. Therefore, the liquid 11 is preferably as free from an organic solvent as possible, and particularly preferably not contained at all. More preferably, pure water or ultrapure water used in a semiconductor manufacturing process or the like is preferable.
水蒸氣氣泡17的產生,並非限定於加熱電極13的方法,亦可採用如下方法:另外設置超聲波產生裝置,根據來自超聲波產生裝置的超聲波,使液體11中產生空蝕氣泡,並於該氣泡內使周圍液體11氣化為蒸氣,形成水蒸氣氣泡17。The generation of the water vapor bubbles 17 is not limited to the method of heating the electrode 13, and a method may be employed in which an ultrasonic generating device is additionally provided, and cavitation bubbles are generated in the liquid 11 in accordance with the ultrasonic waves from the ultrasonic generating device, and in the bubbles The surrounding liquid 11 is vaporized into a vapor to form a water vapor bubble 17.
照射至水蒸氣氣泡17的電磁波頻率,可按照用途,於1 MHz~100 GHz範圍內選擇。The frequency of the electromagnetic wave that is irradiated to the water vapor bubble 17 can be selected in the range of 1 MHz to 100 GHz depending on the application.
產生水蒸氣氣泡17時,亦可利用真空泵將容器12內的空氣相19減壓。當對容器12內的空氣相19減壓時,液體11的沸點降低,故易產生水蒸氣,且水蒸氣氣泡內部的蒸氣壓增加,並且達到電漿產生的水蒸氣分子數增加,因此電漿放電容易。當水蒸氣氣泡內部一次達到電漿狀態時,其後即使停止真空泵,將空氣相19的壓力恢復為大氣壓,氣泡內部仍會繼續產生電漿。When the water vapor bubbles 17 are generated, the air phase 19 in the container 12 can also be decompressed by a vacuum pump. When the air phase 19 in the container 12 is decompressed, the boiling point of the liquid 11 is lowered, so that water vapor is easily generated, and the vapor pressure inside the water vapor bubble is increased, and the number of water vapor molecules generated by the plasma is increased, so the plasma is increased. Easy to discharge. When the inside of the water vapor bubble reaches the plasma state once, even if the vacuum pump is stopped, the pressure of the air phase 19 is returned to the atmospheric pressure, and the plasma continues to be generated inside the bubble.
作為物品15,具有親水性表面的物品較佳,具體可列舉親水性有機高分子材料、玻璃、陶瓷,矽晶圓、金屬(例如,鋁、銅、鎢等)、石墨、碳纖維等。As the article 15, an article having a hydrophilic surface is preferable, and specific examples thereof include a hydrophilic organic polymer material, glass, ceramics, a ruthenium wafer, a metal (for example, aluminum, copper, tungsten, etc.), graphite, carbon fiber, or the like.
於本發明中,「親水性表面」是以圖2所定義之接觸角θ的值加以定義。本發明中「親水性表面」是在25℃時,水(水滴18)對物品15表面之接觸角θ小於等於90度的表面。水對親水性表面的接觸角越小越好,具體而言,更好的是小於等於80度,進而好的是70度~0度之範圍。In the present invention, the "hydrophilic surface" is defined by the value of the contact angle θ defined in Fig. 2. In the present invention, the "hydrophilic surface" is a surface at which the contact angle θ of water (water droplets 18) to the surface of the article 15 is 90 or less at 25 °C. The smaller the contact angle of water with respect to the hydrophilic surface, the better. Specifically, it is preferably 80 degrees or less, and more preferably 70 degrees to 0 degrees.
本發明中接觸角θ的定義,是與材料對普通水之濕潤指標的接觸角相同。作為關於接觸角的參考書,引用揭示於村川亨男所著「金屬機能表面」,近代編集社發行,1984年p.133的事項。根據該書,於平滑表面滴下與該表面不反應的液滴,液滴與表面保持某接觸角處於平衡狀態時,圖2中下式(1)成立。The contact angle θ in the present invention is defined as the same contact angle with the wetting index of the material to ordinary water. As a reference book on the contact angle, the quotation is disclosed in the "Metal Function Surface" by Murakami Hiroshi, published by the Modern Co., Ltd., and 1984 p.133. According to this document, when droplets which do not react with the surface are dropped on the smooth surface, and the droplet maintains a certain contact angle with the surface, the following formula (1) holds.
[數1]γS V =γS L +γL V cosθ (1)γS V 與液體處於蒸氣吸附平衡的固體的表面張力γS L 固體與液體的界面張力γL V 與蒸氣處於平衡狀態之液體的表面張力[Number 1] γ S V = γ S L + γ L V cos θ (1) γ S V is the surface tension of the solid in which the liquid is in vapor adsorption equilibrium γ S L The interfacial tension γ L V between the solid and the liquid is in equilibrium with the vapor Surface tension of liquid
若將式(1)如下式(2)表示,則其左邊表示固體表面被液體濕潤時之表面能量的減少。When the formula (1) is represented by the following formula (2), the left side thereof indicates a decrease in surface energy when the solid surface is wetted by the liquid.
[數2]γS V -γS L =γL V cosθ (2)[Number 2] γ S V -γ S L =γ L V cosθ (2)
該能量由於是表面自由能量,故其減少量γL V cosθ越大,越容易濕潤,γL V 固定時,θ越小濕潤性越好。為將濕潤性定量,所使用的水滴接觸角θ取決於式(2)。於本發明中液體為水,γL V 於20℃時,為72.8 dyn/cm(「理科年表」、丸善株式會社,1993年,p.449)。Since this energy is the surface free energy, the larger the amount of decrease γ L V cos θ is, the easier it is to wet, and the smaller the θ is, the better the wettability is when γ L V is fixed. In order to quantify the wettability, the water droplet contact angle θ used depends on the formula (2). In the present invention, the liquid is water, and when γ L V is 20 ° C, it is 72.8 dyn/cm ("Science chronology", Maruzen Co., Ltd., 1993, p. 449).
於本發明中,準備平滑的材料表面,並使該表面保持水平,於表面滴下水滴,利用接觸角計量測(θ/2),求出圖2中的接觸角θ。當材料表面為多孔質或者具有凹凸時,準備相同材料的平滑面,求出該平滑面的θ角。於有機高分子、金屬、玻璃或者陶瓷中,當表面具有凹凸時,藉以使相同材料熔融而可獲得平滑面。當為碳纖維等無法熔融的材料時,預先製作包含其前驅體素材(例如,聚丙烯腈或聚醯亞胺)的平滑薄板,將其燒成,以獲得包含碳材料且具有平滑面的薄板。於該薄板上滴下水滴,測定接觸角。測定接觸角時所使用的水是超純水、離子交換水等純淨水。In the present invention, a smooth material surface is prepared, and the surface is kept horizontal, water droplets are dropped on the surface, and the contact angle θ in Fig. 2 is obtained by contact angle measurement (θ/2). When the surface of the material is porous or has irregularities, a smooth surface of the same material is prepared, and the angle θ of the smooth surface is obtained. In an organic polymer, metal, glass or ceramic, when the surface has irregularities, a smooth surface can be obtained by melting the same material. In the case of a material which cannot be melted such as carbon fiber, a smooth sheet containing a precursor material thereof (for example, polyacrylonitrile or polyimide) is previously prepared and fired to obtain a sheet having a smooth surface including a carbon material. Water droplets were dropped on the sheet and the contact angle was measured. The water used for measuring the contact angle is pure water such as ultrapure water or ion exchange water.
水對代表性有機高分子材料及無機材料的接觸角θ(25℃),於表2及表3所示(文獻a:「化學便覽改訂4版基礎編Ⅱ」,丸善株式會社,1993年Ⅱ-83 7.1.3接觸角,文獻b:石井淑夫、小石真純、角田光雄編集「 技術」、株式會社Techno-System,2001年,b1:p.418,b2:p.92,b3:p.96,b4:p.102~103,b5:p.161,b6:p.198)。The contact angle θ (25 ° C) of water to representative organic polymer materials and inorganic materials is shown in Table 2 and Table 3 (Document a: "Chemical Fact Sheets Revised 4 Edition Basic Series II", Maruzen Co., Ltd., 1993 II -83 7.1.3 Contact angle, document b: Edited by Ishii Shuo, Koishi Shino, and Kakuda Kakuo technology , Techno-System, Inc., 2001, b1: p. 418, b2: p. 92, b3: p. 96, b4: p. 102-103, b5: p. 161, b6: p. 198).
又,「金屬表面便覽」,日刊工業新聞,於1988年p.183中揭示有,「純淨金屬表面用水濕潤,接觸角為零。若有污垢,則該部分水的濕潤不良」。根據村川亨男著「金屬機能表面」,近代編集社1984年p.134-136,揭示為如下:γ-Fe的固體表面張力,根據高溫下熔融狀態的測定結果,為1670-2127 dyn/cm,銅的固體表面張力,根據高溫下熔融狀態的測定結果,約為1500 dyn/cm,遠大於高分子的表面張力。另一方面,水的表面張力為72.8 dyn/cm。亦即,純淨的金屬表面是非常容易被水濕潤的表面。具有高表面能量的純淨金屬材料亦可適用本發明之表面處理。In addition, the "Metal Surface Handbook", Nikkan Kogyo Shimbun, p. 183, 1988, states that "the surface of pure metal is wet with water and the contact angle is zero. If there is dirt, the moisture of this part of the water is poor." According to Murakami Hiroshi's "Metal Functional Surface", the modern compilation society 1984 p.134-136, revealed as follows: γ-Fe solid surface tension, according to the measurement results of the molten state at high temperature, 1670-2127 dyn/cm The solid surface tension of copper is about 1500 dyn/cm according to the measurement result of the molten state at a high temperature, which is much larger than the surface tension of the polymer. On the other hand, the surface tension of water is 72.8 dyn/cm. That is, a pure metal surface is a surface that is very wettable by water. Pure metal materials having a high surface energy can also be applied to the surface treatment of the present invention.
於本發明中,若為滿足θ90度的材料,則亦可適用有機高分子材料、玻璃、陶瓷、金屬、石墨碳素材、碳纖維等任一種材料。In the present invention, if θ is satisfied For materials of 90 degrees, any material such as organic polymer materials, glass, ceramics, metals, graphite carbon materials, and carbon fibers can also be used.
將水蒸氣氣泡內電漿中的原子態氫(Hα:656 nm)的波長換算為溫度,約為5000K的高溫,若使上述高溫電漿氣體接觸包含普通有機高分予材料所構成的物品,則瞬間被破壞地無蹤跡。此處,本發明者們發現:當使用含有滿足θ90度之親水性材料的物品時,可僅將物品表面的有機物分解或者去除並清洗,而幾乎不損傷物品表面,並可蝕刻其表面,而不破壞已清洗乾淨的物品。The wavelength of atomic hydrogen (Hα: 656 nm) in the plasma in the water vapor bubble is converted into a temperature of about 5000 K, and if the high-temperature plasma gas is brought into contact with an article comprising a common organic high-concentration material, Then there is no trace of destruction in an instant. Here, the inventors have found that when the use contains θ In the case of a 90 degree hydrophilic material, only the organic matter on the surface of the article can be decomposed or removed and cleaned, and the surface of the article is hardly damaged, and the surface thereof can be etched without damaging the cleaned article.
圖3模式地表示本發明之避免熱分解的觀點。可以發現:如圖3所示,於水中使材料接觸水蒸氣氣泡時,若該材料對水的接觸角θ小於等於90度,則因熱產生的熱分解而引起蝕刻的作用變小,若大於90度,則因熱分解而引起蝕刻的作用增大。對此現象付以如下理由。Fig. 3 schematically shows the viewpoint of the present invention to avoid thermal decomposition. It can be found that, as shown in FIG. 3, when the material is brought into contact with water vapor bubbles in water, if the contact angle θ of the material with water is less than or equal to 90 degrees, the effect of etching due to thermal decomposition by heat becomes smaller, if larger than At 90 degrees, the effect of etching due to thermal decomposition increases. The following reasons are attached to this phenomenon.
θ小於等於90度的材料,於含水液體中,表面由水層覆蓋,即使水蒸氣氣泡電漿接近,材料表面的水亦會蒸發氣化,從材料周圍奪走蒸發潛熱,並且不斷向親水性表面供給水,故而持續的冷卻效果作用於材料表面,抑制物品的溫度上升。其結果,物品表面溫度不超過材料的耐熱溫度,熱分解之蝕刻作用減小,抑制材料受損。該效果於碳纖維的表面處理中,亦可有效防止電漿之熱造成局部過度的石墨化。The material with θ less than or equal to 90 degrees, in the aqueous liquid, the surface is covered by the water layer. Even if the plasma of the water vapor bubble is close, the water on the surface of the material will vaporize and vaporize, and the latent heat of evaporation is taken away from the material, and the hydrophilicity is continuously Water is supplied to the surface, so that a continuous cooling effect acts on the surface of the material to suppress an increase in the temperature of the article. As a result, the surface temperature of the article does not exceed the heat-resistant temperature of the material, and the etching action of thermal decomposition is reduced to suppress the damage of the material. This effect can also effectively prevent the local excessive graphitization caused by the heat of the plasma in the surface treatment of the carbon fiber.
已被瞭解的是,當親水性物品表面附著有污垢等有機物時,與原先的親水性表面相比,疏水性表面的水濕潤性產生變化。例如,根據石井淑夫、小石真純、角田光雄編著的「技術」,株式會社科技系統,2001年p.83-84揭示有:純粹的金屬表面容易被水濕潤,但若將其放置於有機物質存在的環境中,則因有機物質逐漸附著於金屬表面,使金屬表面隨著時間推移而疏水化。同樣地,親水性有機材料及陶瓷表面,亦由於有機物的污染,產生疏水化傾向。It has been known that when an organic substance such as dirt adheres to the surface of the hydrophilic article, the water wettability of the hydrophobic surface changes as compared with the original hydrophilic surface. For example, according to "Ishii Shuo, Koishi Shino, and Kakuda Kakuo" technology Technology Systems, Inc., 2001 p.83-84 reveals that pure metal surfaces are easily wetted by water, but if they are placed in an environment where organic substances are present, organic substances gradually adhere to the metal surface. The metal surface is hydrophobized over time. Similarly, hydrophilic organic materials and ceramic surfaces also have a tendency to hydrophobize due to contamination of organic matter.
根據圖3,材料表面的污垢受到水蒸氣氣泡電漿之熱的熱分解與OH自由基之氧化分解作用而被分解,當污垢逐漸消失時,素材表面更顯親水性,利用上述水的冷卻效果,使熱分解受到抑制,並獲得具有較小損傷的材料表面。According to Fig. 3, the dirt on the surface of the material is decomposed by the thermal decomposition of the vapor of the water vapor bubble and the oxidative decomposition of the OH radical. When the dirt gradually disappears, the surface of the material is more hydrophilic, and the cooling effect of the water is utilized. , the thermal decomposition is suppressed, and the surface of the material with less damage is obtained.
當為接觸角小於等於90的親水性材料時,可抑制熱分解引起的蝕刻,利用OH自由基之氧化分解而可逐漸蝕刻材料。利用該蝕刻,可蝕刻表示親水性的各種材料。例如,可蝕刻親水性高分子材料、金屬材料、陶瓷或者顯現親水性的玻璃、顯現親水性的碳材料等。When it is a hydrophilic material having a contact angle of 90 or less, etching by thermal decomposition can be suppressed, and the material can be gradually etched by oxidative decomposition of OH radicals. By this etching, various materials representing hydrophilicity can be etched. For example, a hydrophilic polymer material, a metal material, a ceramic or a glass exhibiting hydrophilicity, a carbon material exhibiting hydrophilicity, or the like can be etched.
本發明的表面處理中,使物品15接觸水蒸氣氣泡電漿的時間(以下記作接觸時間),可考慮物品15的耐熱溫度、氣泡電漿內部溫度、物品表面產生的水之冷卻效果、以及污垢程度而進行適宜調整。In the surface treatment of the present invention, the time during which the article 15 is brought into contact with the water vapor bubble plasma (hereinafter referred to as the contact time) may be considered in consideration of the heat resistance temperature of the article 15, the internal temperature of the bubble plasma, the cooling effect of water generated on the surface of the article, and Adjust the degree of dirt to make appropriate adjustments.
當接觸時間過長時,因水蒸氣氣泡電漿而使物品15表面的水分過度蒸發,造成物品15表面上水分不足,且材料表面溫度暫時超出耐熱溫度,或者OH自由基的氧化作用過強,對物品造成損傷。When the contact time is too long, the moisture on the surface of the article 15 is excessively evaporated due to the vapor bubble of the water vapor, resulting in insufficient moisture on the surface of the article 15, and the surface temperature of the material temporarily exceeds the heat-resistant temperature, or the oxidation of the OH radical is too strong. Injury to the item.
當接觸時間過短時,OH自由基的氧化作用變弱,容易造成物品表面的清洗或蝕刻不充分。When the contact time is too short, the oxidation of the OH radical becomes weak, which tends to cause insufficient cleaning or etching of the surface of the article.
本發明中「接觸時間」定義為,在物品15靜止時,對電極13及對向電極14施加電壓,使水蒸氣氣泡17內產生電漿的時間,以及在物品15向固定方向移動時,定義如下。In the present invention, the "contact time" is defined as the time during which the voltage is applied to the electrode 13 and the counter electrode 14 when the article 15 is stationary, and the plasma is generated in the water vapor bubble 17, and when the article 15 is moved in the fixed direction, as follows.
接觸時聞(s)=電漿產生區域物品15之移動方向的長度(mm)/物品15的移動速度(mm/s)When contacting (s) = length of the moving direction of the article 15 in the plasma generating region (mm) / moving speed of the article 15 (mm/s)
材料的耐熱溫度根據材料種類,其指標有所不同,本發明中以可維持材料形態的溫度定義為耐熱溫度。The heat-resistant temperature of the material differs depending on the kind of the material. In the present invention, the temperature at which the form of the material can be maintained is defined as the heat-resistant temperature.
於有機高分子材料中,具有結晶性的材料是以熔點設置耐熱溫度的指標,非晶性材料是以玻璃轉移溫度設置耐熱溫度的指標。具代表性的結晶性有機高分子材料的玻璃轉移溫度(Tg)及熔點(Tm)於表4所示。(Joel R,Fried著,「Polymer Science and Technology」Prentice Hall,1995年,p.140)Among the organic polymer materials, the material having crystallinity is an index for setting the heat resistance temperature at the melting point, and the amorphous material is an index for setting the heat resistance temperature at the glass transition temperature. The glass transition temperature (Tg) and melting point (Tm) of a representative crystalline organic polymer material are shown in Table 4. (Joel R, Fried, "Polymer Science and Technology" Prentice Hall, 1995, p. 140)
於陶瓷中,以熔點設置耐熱溫度的指標。具代表性的陶瓷熔點(Tm)於表5所示。(Marcel Mulder著「Basic Principles of Membrane Technology」,2nd Edition,Kluwer Academic Publishers,1996年p.60)In ceramics, the index of the heat resistance temperature is set at the melting point. Representative ceramic melting points (Tm) are shown in Table 5. (Marcel Mulder, "Basic Principles of Membrane Technology", 2nd Edition, Kluwer Academic Publishers, 1996 p. 60)
於光學玻璃材料中,以玻璃轉移溫度設置耐熱溫度的指標。具代表性的光學玻璃類玻璃轉移溫度如表6所示。(光應用技術講習會教材,「光學材料Ⅲ-9」,社團法人Japan Optomechatronics Association,1988年p.30)In the optical glass material, the index of the heat resistance temperature is set at the glass transition temperature. Representative optical glass-like glass transition temperatures are shown in Table 6. (Light Application Technology Workshop Textbook, "Optical Materials III-9", Corporate Legal Corporation Japan Optomechatronics Association, 1988 p.30)
於光學結晶材料中,以材料熔點設置耐熱溫度指標。具代表性的光學結晶材料之熔點於表7所示。(光應用技術講習會教材,「光學材料Ⅲ-9」,社團法人Japan Optomechatronics Association,1988年p.55)In the optically crystalline material, the heat resistance temperature index is set at the melting point of the material. The melting points of representative optically crystalline materials are shown in Table 7. (Light Application Technology Workshop Textbook, "Optical Materials III-9", Corporate Optomechatronics Association, 1988 p.55)
於金屬類、矽晶圓(矽)等中,以熔點設置耐熱溫度的指標。具代表性的金屬類熔點於表8所示。(國立天文臺編,「理科年表」,丸善株式會社,1993年p.469)In metal, tantalum wafers, etc., the index of the heat resistance temperature is set at the melting point. Representative metal melting points are shown in Table 8. (Edited by the National Astronomical Observatory, "Science Yearbook", Maruzen Co., Ltd., p.469, 1993)
於碳材料中,既已隨溫度進行碳化-石墨化,並難以確定明確的耐熱溫度,故而將關聯材料的石墨單晶熔點即3550℃,作為碳材料的構造相轉移指標。碳纖維時,由於結晶化度低,並且時常難以明確區別非晶部與結晶部,或者難以確定明確的結晶構造相轉移點,故而將維持纖維形態的溫度作為耐熱溫度。In the carbon material, carbonization-graphitization has been carried out with temperature, and it is difficult to determine a clear heat-resistant temperature. Therefore, the melting point of the graphite single crystal of the related material, that is, 3550 ° C, is used as a structural phase transfer index of the carbon material. In the case of carbon fiber, since the degree of crystallization is low, and it is often difficult to clearly distinguish the amorphous portion from the crystal portion, or it is difficult to specify a clear crystal structure phase transition point, the temperature at which the fiber morphology is maintained is taken as the heat-resistant temperature.
本發明的表面處理方法,可應用於(1)材料表面上附著(堆積)有污垢等有機物的物品之清洗;(2)親水性材料表面的蝕刻加工;以及(3)賦予材料表面凹凸的加工。The surface treatment method of the present invention can be applied to (1) cleaning of an article having an organic substance such as dirt adhered (stacked) on the surface of the material; (2) etching processing of the surface of the hydrophilic material; and (3) processing of the unevenness of the surface of the material. .
就(1)的清洗加以說明。作為有機物,可列舉病毒、細菌、酵母、黴、藻類、原生動物、蛋白質、血液與血液成分、動物或植物細胞、頭髮、生活垃圾、廚房垃圾、排水等中所含的有機物、肥料成分等,日常生活中常見的所有有機物。The cleaning of (1) will be explained. Examples of the organic substance include organic substances and fertilizer components contained in viruses, bacteria, yeasts, molds, algae, protozoa, proteins, blood and blood components, animals or plant cells, hair, household garbage, kitchen garbage, and drainage. All the organic things that are common in everyday life.
作為按照本發明表面處理方法的物品清洗例,可列舉以下例。清洗對象並非限於以下例,任何水的接觸角θ小於等於90度的親水性材料均可,適當選定適於電漿氣泡溫度、冷卻效果條件的製程,即可清洗。As an example of the article cleaning according to the surface treatment method of the present invention, the following examples are mentioned. The object to be cleaned is not limited to the following examples, and any hydrophilic material having a contact angle θ of water of 90 degrees or less may be selected, and a process suitable for plasma bubble temperature and cooling effect conditions may be appropriately selected to be cleaned.
(a)使電漿接觸過濾處理中使用的具有親水性表面的多孔質膜,利用熱分解(或碳化)或OH自由基的氧化作用,分解去除附著於膜面的由有機物構成的過濾堆積物,使多孔質膜再生。(a) contacting the plasma with a porous film having a hydrophilic surface used in the filtration treatment, and decomposing and removing the filter deposit composed of organic substances adhering to the membrane surface by thermal decomposition (or carbonization) or oxidation of OH radicals. The porous membrane is regenerated.
(b)使埋入人體後自人體取出的具有親水性表面的有機體適合性材料與電漿接觸,利用熱分解(或碳化)或者OH自由基的氧化作用,分解去除附著於有機體適合性材料表面的有機物,使有機體適合性材料再生。作為有機體適合性材料,可列舉聚甲基丙烯酸甲酯、聚乳酸樹脂、聚氨脂、水凝膠、纖維素、聚乙烯醇、羥磷石灰等。(b) contacting the organic suitable material having a hydrophilic surface taken out from the human body after being buried in the human body with the plasma, and decomposing and removing the surface of the suitable material of the organism by thermal decomposition (or carbonization) or oxidation of OH radicals. The organic matter that regenerates the organism's suitability material. Examples of the organic suitable material include polymethyl methacrylate, polylactic acid resin, polyurethane, hydrogel, cellulose, polyvinyl alcohol, hydroxyphosphorus lime, and the like.
(c)使電漿接觸自人體取出的具有親水性表面的臟器,利用熱分解(或碳化)或者OH自由基的氧化作用,分解去除存在於臟器中的癌細胞。(c) The plasma is brought into contact with an organ having a hydrophilic surface taken out from the human body, and the cancer cells present in the organ are decomposed and removed by thermal decomposition (or carbonization) or oxidation of OH radicals.
(d)使電漿接觸具有親水性表面的隱形眼鏡,利用熱分解(或碳化)或者OH自由基的氧化作用,分解去除附著於隱形眼鏡上的蛋白質等有機物。(d) Contacting the plasma with a contact lens having a hydrophilic surface, and decomposing and removing organic substances such as proteins attached to the contact lens by thermal decomposition (or carbonization) or oxidation of OH radicals.
(e)使電漿接觸埋入人體前具有親水性表面的導管或者人工血管,對導管或者人工血管進行除菌,或使電漿接觸自人體取出的具有親水性表面的導管或人工血管,利用熱分解(或碳化)或者OH自由基的氧化作用分解去除。分解去除後,安全廢棄導管或者人工血管。(e) contacting the plasma with a catheter or an artificial blood vessel having a hydrophilic surface before being buried in the human body, sterilizing the catheter or the artificial blood vessel, or contacting the plasma with a catheter or artificial blood vessel having a hydrophilic surface taken out from the human body, and utilizing Thermal decomposition (or carbonization) or oxidation of OH radicals is removed by decomposition. After disassembly and removal, the catheter or artificial blood vessel is safely discarded.
(f)使電漿接觸使用前或使用後之具有親水性表面的DNA檢體檢出裝置,利用熱分解(或碳化)或者OH自由基之氧化作用,分解去除該裝置表面的有機物。(f) A DNA sample detecting device having a hydrophilic surface before or after use of the plasma is used to decompose and remove the organic matter on the surface of the device by thermal decomposition (or carbonization) or oxidation of OH radicals.
(g)使電漿接觸具有親水性表面的不織布,利用熱分解(或碳化)或者OH自由基的氧化作用,分解去除附著於不織布表面的有機物。(g) contacting the plasma with a non-woven fabric having a hydrophilic surface, and decomposing and removing the organic matter adhering to the surface of the nonwoven fabric by thermal decomposition (or carbonization) or oxidation of OH radicals.
(h)使水蒸氣氣泡電漿接觸表面塗敷有光阻薄膜等微影材料的矽晶圓表面,去除薄膜。或者,使水蒸氣氣泡電漿接觸表面附著有污垢的矽晶圓,清洗矽晶圓上的污垢。(h) The surface of the silicon wafer to which the vapor bubble plasma is applied is coated with a lithographic material such as a photoresist film to remove the film. Alternatively, the vapor bubble plasma is brought into contact with the ruthenium wafer to which the surface is attached, and the dirt on the ruthenium wafer is cleaned.
(i)於清洗玻璃板,尤其是清洗用於液晶單元的玻璃板或光碟的母碟處理製程中使用的玻璃原盤的表面時,要求高純淨性。先前,一直採用使用藥液的RCA清洗技術,但耗費藥液的排水處理成本,故要求不使用藥液進行清洗。利用本技術,於清洗玻璃板時,使自電漿氣泡產生的OH自由基接觸玻璃板,適當設定接觸時間,藉此可不損害玻璃板表面而分解污垢。分解物成為碳化物或二氧化碳、水,亦不會產生有害的廢液。(i) High purity is required when cleaning the glass plate, especially the surface of the glass master used in the mastering process for cleaning the glass plate or the optical disk for the liquid crystal cell. Previously, the RCA cleaning technique using a chemical solution has been used, but the cost of draining the chemical solution is required, so it is required to wash without using a chemical solution. According to the present technology, when the glass plate is cleaned, the OH radical generated from the plasma bubbles is brought into contact with the glass plate, and the contact time is appropriately set, whereby the scale can be decomposed without damaging the surface of the glass plate. The decomposition product becomes carbide or carbon dioxide, water, and does not produce harmful waste liquid.
(j)利用本技術,清洗具有親水性表面的Al2 O3 陶瓷面磚等陶瓷製品表面的污垢。(j) Using the present technology, the dirt on the surface of a ceramic article such as an Al 2 O 3 ceramic tile having a hydrophilic surface is cleaned.
(k)利用本技術,清洗具有親水性表面且塗佈有氧化鈦粒子的光觸媒面磚產品之表面。光觸媒表面堆積有污垢而使紫外線無法射入時,可對其清洗並再生光觸媒功能。(k) Using the present technique, the surface of a photocatalytic tile product having a hydrophilic surface and coated with titanium oxide particles is cleaned. When the surface of the photocatalyst is contaminated with dirt and the ultraviolet light cannot be injected, it can be cleaned and regenerated.
(l)利用本技術,清洗重組為親水性表面的碳電極表面。尤其是,於使用電解質離子的二次電池電極時,依據某些情況使用親水性電極。由於反覆充放電,有時電解液中會產生污垢,使電極表面產生污垢。利用本發明,可清洗附著有污垢的碳電極。(l) Using the present technique, the surface of the carbon electrode recombined into a hydrophilic surface is cleaned. In particular, when a secondary battery electrode using electrolyte ions is used, a hydrophilic electrode is used depending on some cases. Due to the reverse charging and discharging, dirt may be generated in the electrolyte to cause fouling on the surface of the electrode. With the present invention, the carbon electrode to which the dirt is attached can be cleaned.
(m)用作固體電解質膜的氟系電解質膜(例如,杜邦(Dupont)公司產品Nafion膜),其疏水性強。於該情形時,將電解質膜浸於水中,用水使其膨潤時,膜的含水率增加,並且對水的接觸角降低。利用本發明技術,可清洗接觸角小於等於90度的膜表面。(m) A fluorine-based electrolyte membrane (for example, a Nafion membrane of Dupont Co., Ltd.) used as a solid electrolyte membrane, which is highly hydrophobic. In this case, when the electrolyte membrane is immersed in water and swelled with water, the moisture content of the membrane increases, and the contact angle with water decreases. With the technique of the present invention, the surface of the film having a contact angle of 90 degrees or less can be cleaned.
作為對上述(2)親水性材料表面蝕刻加工之例,可列舉以下例。As an example of the surface etching processing of the above (2) hydrophilic material, the following examples are mentioned.
(n)於半導體的多層布線步驟中,亦可利用下述金屬鑲嵌製程(Damascene process):絕緣膜上設置槽,埋入銅、鋁、鎢、鈦等金屬膜,去除絕緣膜上無需的金屬膜。圖4中表示金屬鑲嵌製程的模式圖。圖4中,按a→b→c推進製程,於c時形成有布線用金屬的圖案。(n) In the multilayer wiring step of the semiconductor, the following damascene process may be utilized: a trench is provided on the insulating film, and a metal film such as copper, aluminum, tungsten, or titanium is buried, and the insulating film is not required. Metal film. A schematic view of the damascene process is shown in FIG. In Fig. 4, the process is advanced by a → b → c, and a pattern of a metal for wiring is formed at c.
如上所述,因純淨的金屬膜具有親水性,故在本發明中,利用自水蒸氣氣泡電漿產生的原子態氫、OH自由基與金屬原子的電氣化學性反應,於原子級去除金屬原子,並進行精密加工。此時,必須適當控制因OH自由基引起的蝕刻之速度。As described above, since the pure metal film is hydrophilic, in the present invention, the atomic acid is removed at the atomic level by electrochemical reaction of atomic hydrogen and OH radical generated from the vapor plasma of the water vapor with the metal atom. And carry out precision machining. At this time, the speed of etching due to OH radicals must be appropriately controlled.
大阪大學大學院工學研究科後藤英和、廣瀨喜久治、稻田敬、森勇藏等人,於精密工學會刊,VOL.69,No.9,2003年p.1332-1336中既已揭示有,利用觸媒使超純水中的水分子解離為H與OH,形成OH負離子,並利用該OH負離子與被加工物表面原子的化學反應而開發的新型超精密/超清洗加工法。於陰極使用Al(001)時,關於基本過程(elementary process)的該文獻報告中揭示有:(1)當Al(001)表面原子上結合有OH時,表面第1層-第2層原子間的結合強度下降,(2)於H終端化的Al(001)表面,利用OH與H作用,Al表面原子間的結合全部被切斷,Al表面原子被去除加工作為AlH2 (OH)分子。該文獻中,由觸媒生成H與OH,並利用該OH的電氣化學反應,但由水蒸氣氣泡電漿而產生的OH自由基的研究成果並未提及。另一方面,本發明者們主張,純淨的金屬對水具有親水性,使本發明之水蒸氣氣泡電漿所產生的OH自由基作用於金屬,藉此與上述精密工學會刊的文獻同樣地,本技術亦可應用於切斷金屬表面原子的化學結合,並自材料中逐漸去除金屬的精密蝕刻步驟。The University of Osaka Graduate School of Engineering, Goto Hideyoshi, Hiroaki Hiroshi, Inada, Mori, and others, have been revealed in the Journal of Precision Engineering, VOL.69, No.9, 2003, p.1332-1336 A new ultra-precision/ultra-cleaning method developed by using a catalyst to dissociate water molecules in ultrapure water into H and OH, forming OH anions, and utilizing the chemical reaction of the OH anions with the atoms on the surface of the workpiece. When Al(001) is used for the cathode, the literature report on the elementary process reveals: (1) when the OH is bonded to the surface of the Al(001) surface, the first layer to the second layer of the surface are inter The bonding strength decreases, and (2) on the H-terminated Al(001) surface, the interaction between the atoms on the Al surface is completely cut by the action of OH and H, and the Al surface atoms are removed and processed as AlH 2 (OH) molecules. In this document, H and OH are generated from a catalyst, and the electrochemical reaction of the OH is utilized, but the research results of the OH radical generated by the vapor bubble plasma are not mentioned. On the other hand, the present inventors have claimed that a pure metal is hydrophilic to water, and the OH radical generated by the steam bubble plasma of the present invention acts on the metal, thereby being similar to the literature published by the Society of Precision Engineering. This technique can also be applied to the precise etching step of cutting off the chemical bonding of atoms on the metal surface and gradually removing the metal from the material.
(o)服部毅於「電子材料」附刊,2005年12月p.93-101中,揭示有矽晶圓的清洗技術。該文獻中,介紹有利用RCA清洗對矽晶圓表面進行清洗的濕式清洗;以及使晶圓一面旋轉轉動,一面利用酸、鹼、稀氫氟酸、臭氧水清洗的濕式清洗。另一方面,使用本發明之技術,可利用較臭氧水清洗具有更強氧化力的OH自由基清洗晶圓。根據山部長兵衛著「水中微小気泡內放電水質環境改善」,平成12-14年度科學研究費輔助金 基礎研究,平成15年3月(A)(2)研究成果報告書可瞭解:OH自由基的標準氧化電位為2.84 eV,另一方面臭氧的標準氧化電位為2.07 eV,OH自由基較臭氧具有更強的氧化能力。(o) Hattori is in the "Electronic Materials" supplement, December 2005 p.93-101, which discloses the cleaning technology for silicon wafers. In this document, wet cleaning for cleaning the surface of a silicon wafer by RCA cleaning and wet cleaning using an acid, alkali, dilute hydrofluoric acid or ozone water for rotating the wafer while rotating the wafer are described. On the other hand, using the technique of the present invention, it is possible to clean the wafer by cleaning the OH radical having a stronger oxidizing power than ozone water. According to the Minister of the Mountain, the guardian of the water Water quality environment "Improvement", the basic research of the research grants of the 12-14 years of the research, the report of the research results of the March (A) (2) study shows that the standard oxidation potential of OH radicals is 2.84 eV, on the other hand, ozone The standard oxidation potential is 2.07 eV, and OH radicals have stronger oxidizing power than ozone.
具體而言,於圖1所示反應裝置的水中浸有被污染的矽晶圓,使該矽晶圓在水中旋轉,並使矽晶圓接觸水蒸氣氣泡電漿,藉此可清洗矽晶圓。Specifically, the contaminated germanium wafer is immersed in the water of the reaction device shown in FIG. 1 to rotate the germanium wafer in water, and the germanium wafer is contacted with the vapor bubble plasma, thereby cleaning the germanium wafer. .
以下,作為物品清洗例,於上述(a)所述之使用於過濾處理以後,對堵塞的多孔質膜的清洗加以說明。作為多孔質膜,可列舉經親水化處理的聚乙烯製中空絲膜、平板膜、管狀膜等。Hereinafter, as an article cleaning example, after the filtration treatment described in the above (a), the cleaning of the clogging porous membrane will be described. Examples of the porous membrane include a hydrophilic hollow fiber membrane made of polyethylene, a flat membrane, a tubular membrane, and the like.
將污染的多孔質膜浸於水中,固定於放射電磁波的電極附近。自電極放射電磁波時,電極周圍產生水蒸氣氣泡,同時水蒸氣氣泡內產生電漿。使水蒸氣氣泡內產生的電漿,以特定接觸時間接觸多孔質膜的膜面時,附著於膜面的有機物因電漿而被熱分解,四處飛散。有機物飛散後露出的親水性表面易被水濕潤,故由水層覆蓋,而難以受到電漿的損壞,因此形成於多孔質膜的細孔構造基本可維持。接觸時間較好的是1~5分鐘。當接觸時間不足1分鐘時,可能無法充分去除附著於多孔質膜表面的污垢等有機物,當接觸時間超過5分鐘時,多孔質膜表面的一部分開始熔融。以上就(a)的具體例加以說明,對於(a)~(m)的各例,亦可同樣地清洗污垢。又,本發明亦可適用於(n)~(o)的蝕刻。The contaminated porous membrane is immersed in water and fixed near the electrode that emits electromagnetic waves. When the electromagnetic wave is radiated from the electrode, water vapor bubbles are generated around the electrode, and plasma is generated in the water vapor bubble. When the plasma generated in the water vapor bubbles contacts the film surface of the porous film at a specific contact time, the organic substances adhering to the film surface are thermally decomposed by the plasma and scattered around. Since the hydrophilic surface exposed by the organic matter is easily wetted by water, it is covered by the water layer and is hardly damaged by the plasma, so that the pore structure formed in the porous film can be maintained substantially. The contact time is preferably 1 to 5 minutes. When the contact time is less than 1 minute, organic substances such as dirt adhering to the surface of the porous film may not be sufficiently removed, and when the contact time exceeds 5 minutes, a part of the surface of the porous film starts to melt. The above is a specific example of (a), and the stains can be cleaned in the same manner for each of the examples (a) to (m). Further, the present invention is also applicable to the etching of (n) to (o).
進而,本發明的表面處理方法亦可應用於物品的部分蝕刻。即,使電漿於水中接觸具有疏水性表面(θ>90度)與親水性表面(θ90度)兩者的物品時,疏水性表面的蝕刻速度變大,於物品表面形成凹凸。Further, the surface treatment method of the present invention can also be applied to partial etching of articles. That is, the plasma is brought into contact with water having a hydrophobic surface (θ>90 degrees) and a hydrophilic surface (θ At 90 degrees), the etching speed of the hydrophobic surface becomes large, and irregularities are formed on the surface of the article.
為形成凹凸表面,必須適當選定材料與水蒸氣氣泡電漿的接觸時間。In order to form the uneven surface, the contact time of the material with the vapor bubble plasma must be appropriately selected.
該凹凸形成技術,用於在半導體微影步驟的材料蝕刻、塑膠材料的微細凹凸加工(例如,用以防止於透明樹脂板表面映入影像而賦予其無眩光(Nonglare)功能的加工)方面。This unevenness forming technique is used for material etching in the semiconductor lithography step and fine uneven processing of the plastic material (for example, processing for preventing the glare-free function from being reflected on the surface of the transparent resin sheet).
根據以上說明的本發明之表面處理方法,於液體中,使水蒸氣氣泡電漿接觸物品表面,故而來自物品的污垢分解物不會飛散至大氣中。尤其是,可於水中安全地分解去除,而不會使病毒、有害有機物等飛散至大氣中。轉移至水中的分解物由吸附過濾器等回收,可自水中安全地取出。尤其是,廢棄醫院等醫療現場、食品製造現場使用的物品(例如:導管、人工血管、DNA檢體檢出裝置、具有捕獲病毒功能的不織布、透析用過濾膜、精密過濾膜、氣體分離膜等)時,必須使附著於物品表面的雜菌、病毒等有機物安全無害化,而本發明對於實現此目的有效。According to the surface treatment method of the present invention described above, the vapor bubble plasma is brought into contact with the surface of the article in the liquid, so that the scale decomposition product from the article does not fly to the atmosphere. In particular, it can be safely decomposed and removed in water without causing viruses, harmful organic substances, etc. to fly into the atmosphere. The decomposition product transferred to the water is recovered by an adsorption filter or the like and can be safely taken out from the water. In particular, items used in medical sites such as abandoned hospitals and food manufacturing sites (for example, catheters, artificial blood vessels, DNA sample detection devices, non-woven fabrics with virus-capturing functions, dialysis filter membranes, precision filtration membranes, gas separation membranes, etc.) At the time, it is necessary to make the organic matter such as bacteria and viruses attached to the surface of the article safe and harmless, and the present invention is effective for achieving this object.
又,本發明之表面處理的材料蝕刻中,不使用電解液或硫酸、鹽酸、氟化氫水等藥品,而是利用水產生的OH自由基的分解,故而反應後,不會產生藥品廢液。又,於金屬蝕刻時,金屬氫氧化物沈澱,但因其不溶於水中,故可進行固液分離,不會產生對環境有害的廢液。Further, in the etching of the surface-treated material of the present invention, the electrolyte solution or a chemical such as sulfuric acid, hydrochloric acid or hydrogen fluoride water is not used, but the decomposition of the OH radical generated by the water is used, so that no chemical waste liquid is generated after the reaction. Further, in the case of metal etching, the metal hydroxide precipitates, but since it is insoluble in water, solid-liquid separation can be performed, and waste liquid harmful to the environment is not generated.
使用適於本發明的碳纖維進行表面處理時,可抑制水蒸氣氣泡電漿高溫造成的過度石墨化,並可連續製造碳纖維,該碳纖維是維持穩定碳化的纖維,並且於遍及纖維全體均等地進行因OH自由基引起的蝕刻或清洗等表面處理方面,工業附加價值較高。When the surface treatment is carried out using carbon fibers suitable for the present invention, excessive graphitization due to high temperature of the steam bubble plasma can be suppressed, and carbon fibers can be continuously produced, and the carbon fibers are fibers which maintain stable carbonization and are uniformly distributed throughout the fibers. Industrial added value is high in surface treatment such as etching or cleaning caused by OH radicals.
準備三菱麗陽(Rayon)(株式會社)製造的家庭用淨水器(商品名:CLEANSUI 02)。該淨水器的過濾盒中,使用經親水化處理的聚乙烯製中空絲膜(經親水化的素材對水的接觸角(25℃)=55度)。該中空絲膜是三菱麗陽(株式)製造之內徑270 μm、膜厚55 μm的中空系膜,其具有如下狹縫形的細孔構造:由聚乙烯所構成的纖維配向於中空絲膜的纖維方向,於膜的厚度方向堆疊有多個該纖維。Prepared a household water purifier (trade name: CLEANSUI 02) manufactured by Mitsubishi Rayon (trade name). In the filter cartridge of the water purifier, a hydrophilized polyethylene hollow fiber membrane (contact angle of hydrophilic material to water (25 ° C) = 55 °) was used. The hollow fiber membrane is a hollow membrane having an inner diameter of 270 μm and a membrane thickness of 55 μm manufactured by Mitsubishi Rayon Co., Ltd., and has a slit-like pore structure in which a fiber composed of polyethylene is aligned with a hollow fiber membrane. In the fiber direction, a plurality of the fibers are stacked in the thickness direction of the film.
將該淨水器安裝於家庭自來水龍頭上,斷斷續續一年時間,對過濾盒通入自來水(岩國市三笠町),引起過濾盒堵塞,過濾盒內的中空絲膜表面變化為淡灰色。將引起堵塞的過濾盒自淨水器本體取下,進而自過濾盒上去除活性碳,取得堵塞的中空絲膜樣本。用電子顯微鏡觀察該堵塞的中空絲膜表面。電子顯微鏡照片於圖6所示。堵塞的中空絲膜,其膜表面的狹縫形細孔被有機物堵塞。The water purifier was installed on a household tap, and the tap water was passed to the filter box (Sanke-cho, Iwakuni City) for a period of one year. The filter box was clogged, and the surface of the hollow fiber membrane in the filter box changed to light gray. The filter box causing the clogging is removed from the water purifier body, and the activated carbon is removed from the filter cartridge to obtain a blocked hollow fiber membrane sample. The surface of the blocked hollow fiber membrane was observed with an electron microscope. An electron microscope photograph is shown in Fig. 6. In the blocked hollow fiber membrane, the slit-shaped pores on the surface of the membrane are blocked by the organic matter.
以下述方式清洗堵塞的中空絲膜。The blocked hollow fiber membrane was washed in the following manner.
因堵塞的中空絲膜樣本的長度為50 mm左右較短,故於經親水化處理的長度為150 mm的中空絲膜(三菱麗陽製造,EX-540V聚乙烯中空纖維膜)上,捆上堵塞的中空系膜樣本,準備實驗用樣品。The length of the hollow fiber membrane sample that was blocked was about 50 mm, so it was bundled on a 150 mm long hollow fiber membrane (manufactured by Mitsubishi Rayon, EX-540V polyethylene hollow fiber membrane). The blocked hollow mesangial sample was prepared for the experimental sample.
作為電漿產生裝置,使用圖1所示之裝置。作為RF電源,使用THAMWAY公司製造的T161-5766LQ型,作為匹配箱,使用THAMWAY公司製造的T0202-5766LQ型。As the plasma generating device, the device shown in Fig. 1 was used. As the RF power source, the T161-5766LQ model manufactured by THAMWAY Co., Ltd. was used as the matching box, and the T0202-5766LQ model manufactured by THAMWAY Co., Ltd. was used.
首先,將實驗用樣品浸於裝有水的容器內,以支持具固定於電極附近。利用電極發熱加熱水,該熱引起水中產生水蒸氣氣泡。圖1中,於氣相壓力為30 hPa的減壓環境下,以300 W的輸出功率對水蒸氣氣泡照射電磁波(27.1 MHz),使氣泡內的水蒸氣電漿化,其次,使壓力為大氣壓,並使水蒸氣氣泡電漿繼續產生。氣相側為大氣壓時,來自水蒸氣氣泡電漿的發光光譜如圖5所示。該分光光譜於圖1的反應裝置中,使用浜松PHOTONICS製造的PMA-11 C-7473-36型Czerney-Turner型小型多色儀與背面照射型CCD線型影像感測器,對來自發光氣泡的光,以波長為單位量測求出光譜強度。光檢測元件數為1024,波長域為200~950 mn,曝光時間為19 ms。使用經波長感度不均校正與波長軸校正的多色儀與線型影像感測器進行量測。First, the experimental sample was immersed in a container filled with water so that the support member was fixed near the electrode. The electrode is used to heat the water, which causes water vapor bubbles to be generated in the water. In Fig. 1, an electromagnetic wave (27.1 MHz) is irradiated to a water vapor bubble at a discharge power of 300 W at a gas pressure of 30 hPa to vaporize water vapor in the bubble, and secondly, the pressure is atmospheric pressure. And make the vapor bubble plasma continue to be produced. When the gas phase side is at atmospheric pressure, the luminescence spectrum from the water vapor bubble plasma is as shown in FIG. The spectroscopic spectrum was carried out in the reaction apparatus of Fig. 1 using a PZ-11 C-7473-36 Czerney-Turner type small polychromator manufactured by PHOTONICS and a back-illuminated CCD line image sensor for light from the luminescent bubble. The spectral intensity is determined by measuring in wavelength. The number of photodetecting elements is 1024, the wavelength range is 200 to 950 mn, and the exposure time is 19 ms. Measurements were performed using a polychromator with a wavelength sensitivity unevenness correction and a wavelength axis correction and a line image sensor.
氣相側為大氣壓的狀況下,使水蒸氣氣泡電漿接觸實驗用樣品3分鐘。用電子顯微鏡觀察表面處理後的中空絲膜樣本表面。電子顯微鏡照片如圖7所示,堵塞的有機物大致完全去除。又,中空絲膜樣本表面幾乎不見損傷,故細孔構造維持原先形狀。The vapor bubble plasma was brought into contact with the experimental sample for 3 minutes while the gas phase side was at atmospheric pressure. The surface of the surface treated hollow fiber membrane sample was observed with an electron microscope. The electron micrograph is shown in Figure 7. The blocked organic matter is almost completely removed. Moreover, the surface of the hollow fiber membrane sample was hardly damaged, so the pore structure maintained its original shape.
使用與實施例1相同的電漿產生裝置,將實驗用樣品浸於裝有水的容器內,以支持具固定於電極附近。除使用表9所示的乙烯-乙烯醇共聚物薄膜(以下,有時亦稱為EVAL薄膜)作為樣品以外,其餘以與實施例1相同的條件,產生水蒸氣氣泡電漿,並使該電漿接觸樣品3分鐘。任何薄膜於電漿接觸前對水的接觸角均在64~71度範圍內,顯示出親水性。上述多個薄膜均可承受水蒸氣氣泡電漿之熱,並維持其形態。Using the same plasma generating apparatus as in Example 1, the test sample was immersed in a container filled with water so that the support member was fixed in the vicinity of the electrode. The vapor-bubble plasma was generated under the same conditions as in Example 1 except that the ethylene-vinyl alcohol copolymer film (hereinafter sometimes referred to as EVAL film) shown in Table 9 was used as the sample, and the electricity was generated. The slurry was contacted with the sample for 3 minutes. The contact angle of any film to water before the plasma contact is in the range of 64 to 71 degrees, showing hydrophilicity. The plurality of films can withstand the heat of the vapor bubble plasma and maintain its morphology.
1)乙烯:乙烯含有率2)θ/2=接觸角計的讀取數值。接觸角計中,使用協和界面科學製造的CA-DT。純水的液滴體積為1 μL。3)θ:接觸角4)T:測定室的溫度5)RH:測定室的濕度6)所謂「電漿耐久性」,是指水中對水蒸氣氣泡電漿的耐久性。7)所謂「氣相為大氣壓」是指圖1中,水面上方的氣相為大氣壓之空氣,使水蒸氣氣泡電漿於該狀態下產生。8)所謂「具有耐久性」,是指未破裂,維持原先形態。9)所謂「無耐久性」,是指破裂後因電漿之熱而產生熱分解。1) Ethylene: ethylene content rate 2) θ/2 = reading value of the contact angle meter. In the contact angle meter, CA-DT manufactured by Concord Interface Science was used. The droplet volume of pure water is 1 μL. 3) θ: contact angle 4) T: temperature of measurement chamber 5) RH: humidity of measurement chamber 6) "plasma durability" means durability of water vapor plasma in water. 7) The term "gas phase is atmospheric pressure" means that the gas phase above the water surface is atmospheric pressure, and the water vapor bubble plasma is generated in this state. 8) The term "having durability" means not breaking and maintaining the original form. 9) The term "no durability" refers to thermal decomposition caused by the heat of plasma after rupture.
以下所示表10及表11中,對於與1)~9)相同的記號或用語,具有相同的含意。In Tables 10 and 11 shown below, the same symbols or terms as those of 1) to 9) have the same meanings.
又,於樣品DC3203F的薄膜表面,使用油性墨水進行標記。將標記部分接觸電漿,則油性墨水被電漿分解,未殘留於薄膜上。清洗後的薄膜面以目視觀察時較為平滑。Further, the surface of the film of the sample DC3203F was marked with an oily ink. When the marked portion is brought into contact with the plasma, the oily ink is decomposed by the plasma and does not remain on the film. The surface of the film after washing was smoother when visually observed.
將杜邦公司製造的Nafion 112及Nafion 1035薄膜浸於25℃離子交換水中5分鐘,水使膜膨潤後將其取出,測定接觸角其為表10所示的接觸角。使用表10所示的Nafion 112及Nafion 1035作為電漿處理的樣品。The Nafion 112 and Nafion 1035 films manufactured by DuPont were immersed in ion-exchanged water at 25 ° C for 5 minutes, and the film was swollen with water, and then taken out, and the contact angle was measured as the contact angle shown in Table 10. Nafion 112 and Nafion 1035 shown in Table 10 were used as samples for plasma treatment.
使用與實施例1相同的電漿產生裝置,將樣品浸於裝有水的容器內,以支持具將樣品固定於電極附近。其次,在與實施例1相同的條件下,使水蒸氣氣泡電漿產生,並使該電漿接觸樣品3分鐘。如表10所示,經水膨潤的Nafion 112及Nafion 1035一同承受水蒸氣氣泡電漿的熱,維持其形態。Using the same plasma generating apparatus as in Example 1, the sample was immersed in a container containing water to support the sample to be fixed near the electrode. Next, under the same conditions as in Example 1, steam bubble plasma was generated, and the plasma was brought into contact with the sample for 3 minutes. As shown in Table 10, the water-swelled Nafion 112 and Nafion 1035 were subjected to the heat of the steam bubble plasma to maintain their morphology.
又,於Nafion 112薄膜的表面,以油性墨水進行標記。標記可緊靠並固著於薄膜上。將標記部分於水中接觸水蒸氣氣泡電漿3分鐘後,以目視觀察,此時油性墨水被電漿分解並未殘留於樣品上。清洗後的薄膜面以目視觀察較為平滑。Further, the surface of the Nafion 112 film was marked with an oil-based ink. The markings can be placed against and secured to the film. The marked portion was exposed to water vapor bubble plasma in water for 3 minutes, and visually observed, at which time the oily ink was decomposed by the plasma and did not remain on the sample. The cleaned film surface was smoothed by visual observation.
使用與實施例1相同的電漿產生裝置,將樣品浸於裝有水的容器內,以支持具固定於電極附近。除使用經光學研磨的玻璃板(厚度為5 mm、100 mm×100 mm)作為樣品以外,在與實施例1相同的條件下,使水蒸氣氣泡電漿產生,並使該電漿接觸玻璃板3分鐘。玻璃板承受水蒸氣氣泡電漿之熱,並維持其形態。接觸電漿之前的玻璃板對水的接觸角約為35度。Using the same plasma generating apparatus as in Example 1, the sample was immersed in a container filled with water so that the support member was fixed in the vicinity of the electrode. A water vapor bubble was generated under the same conditions as in Example 1 except that an optically polished glass plate (thickness: 5 mm, 100 mm × 100 mm) was used as the sample, and the plasma was brought into contact with the glass plate. 3 minutes. The glass plate is subjected to the heat of the water vapor bubble plasma and maintains its shape. The contact angle of the glass plate before contact with the plasma to water is about 35 degrees.
又,於玻璃板表面以油性墨水進行標記,並將標記部分於水中接觸水蒸氣氣泡電漿3分鐘以後,目視觀察。油性墨水被電漿分解而未殘留於玻璃板上。清洗後的玻璃板以目視觀察時較為平滑。Further, the surface of the glass plate was marked with oily ink, and the marked portion was exposed to water vapor bubble plasma in water for 3 minutes, and then visually observed. The oily ink is decomposed by the plasma and does not remain on the glass plate. The cleaned glass plate is smoother when viewed visually.
使用與實施例1相同的電漿產生裝置,將實驗用樣品浸於裝有水的容器內,以支持具固定於電極附近。除使用氧化鋁陶瓷薄板(γ-Al2 O3 薄板,厚度為3 mm,100 mm×100 mm)作為樣品以外,在與實施例1相同的條件下,使水蒸氣氣泡電漿產生,並使該電漿接觸玻璃板3分鐘。接觸後的氧化鋁陶瓷薄板承受水蒸氣氣泡電漿之熱,維持原先的形態。接觸電漿之前的氧化鋁陶瓷薄板對水的接觸角約為55度。Using the same plasma generating apparatus as in Example 1, the test sample was immersed in a container filled with water so that the support member was fixed in the vicinity of the electrode. The vapor bubble plasma was generated under the same conditions as in Example 1 except that an alumina ceramic thin plate (γ-Al 2 O 3 thin plate, thickness: 3 mm, 100 mm × 100 mm) was used as the sample, and The plasma was in contact with the glass for 3 minutes. The contacted alumina ceramic sheet is subjected to the heat of the water vapor bubble plasma to maintain the original shape. The contact angle of the alumina ceramic sheet before contact with the plasma is about 55 degrees.
又,於氧化鋁陶瓷薄板表面,以油性墨水進行標記,並使標記部分於水中接觸水蒸氣氣泡電漿3分鐘後,目視觀察。油性墨水被電漿分解而未殘留於氧化鋁陶瓷薄板上。清洗後的氧化鋁陶瓷薄板以目視觀察時較為平滑。Further, the surface of the alumina ceramic thin plate was marked with an oil-based ink, and the mark portion was exposed to water vapor bubble plasma in water for 3 minutes, and then visually observed. The oily ink is decomposed by the plasma and does not remain on the alumina ceramic sheet. The cleaned alumina ceramic sheet was smoother when viewed visually.
使用與實施例1相同的電漿產生裝置,將實驗用樣品浸於裝有水的容器內,以支持具固定於電極附近。Using the same plasma generating apparatus as in Example 1, the test sample was immersed in a container filled with water so that the support member was fixed in the vicinity of the electrode.
以乙烯-乙烯醇共聚物薄膜(乙烯含有率為32 mol%)為基材(厚度為3 mm,100 mm×100 mm),利用熱熔固,於該基材上間隔5 mm貼附聚乙烯薄膜(厚度為0.5 mm,100 mm×100 mm),並準備包括親水性部分具有5 mm寬度、疏水性部分具有5 mm寬度的親水性表面/疏水性表面的樣品。乙烯-乙烯醇共聚物薄膜(乙烯含有率為32 mol%)對水的接觸角為67度,聚乙烯薄膜對水的接觸角為95度。A polyethylene-vinyl alcohol copolymer film (ethylene content: 32 mol%) was used as a substrate (thickness: 3 mm, 100 mm × 100 mm), and a polyethylene was attached to the substrate at a distance of 5 mm by heat fusion. A film (thickness 0.5 mm, 100 mm x 100 mm) was prepared and included a sample having a hydrophilic portion having a 5 mm width and a hydrophobic portion having a hydrophilic surface/hydrophobic surface of 5 mm width. The ethylene-vinyl alcohol copolymer film (ethylene content: 32 mol%) had a contact angle with water of 67 degrees, and the polyethylene film had a contact angle with water of 95 degrees.
除使所用準備的樣品以外,以與實施例1相同的方法,使水蒸氣氣泡電漿產生,並使該電漿接觸樣品全體3分鐘。接觸後,自反應容器中取出樣品,則作為疏水部分的聚乙烯薄膜因電漿而被蝕刻,平均厚度成為0.1 mm,但乙烯-乙烯醇共聚物薄膜基材維持最初的平滑表面。結果,僅疏水部分被電漿蝕刻。A steam bubble plasma was generated in the same manner as in Example 1 except that the prepared sample was used, and the plasma was brought into contact with the sample for 3 minutes. After the contact, the sample was taken out from the reaction vessel, and the polyethylene film as a hydrophobic portion was etched by plasma to have an average thickness of 0.1 mm, but the ethylene-vinyl alcohol copolymer film substrate maintained the initial smooth surface. As a result, only the hydrophobic portion is etched by the plasma.
作為物品,準備未經親水化處理的厚度100 μm之聚四氟化乙烯薄膜(對水的接觸角(25℃)=110度)、聚乙烯薄膜(對水的接觸角(25℃)=95度)、聚丙烯薄膜(對水的接觸角(25℃)=96度)。於上述多個薄膜表面未附著污垢等有機物。對於上述多個薄膜,以與實施例1相同的方法進行表面處理。任何薄膜,均在與電漿接觸的瞬間,因電漿的高溫而產生熱分解,導致破裂。As an article, a 100 μm thick polytetrafluoroethylene film (contact angle to water (25 ° C) = 110 °) and a polyethylene film (contact angle to water (25 ° C) = 95) were prepared without hydrophilization. Degree), polypropylene film (contact angle to water (25 ° C) = 96 degrees). Organic substances such as dirt are not adhered to the surface of the plurality of films. The above-mentioned plurality of films were subjected to surface treatment in the same manner as in Example 1. Any film, at the moment of contact with the plasma, thermally decomposes due to the high temperature of the plasma, causing cracking.
作為物品,準備未經親水化處理且厚度為50 μm的有機高分子多孔質平板膜(millipore公司製造,疏水性聚四氟化乙烯薄膜,對水的接觸角(25℃)=110度,平均細孔徑為1 μm)、厚度為100 μm的有機高分子多孔質平板膜(millipore公司製造,疏水性聚乙烯薄膜,對水的接觸角(25℃)=94度,平均細孔徑為1 μm)。於上述多個高分子多孔質平板膜表面,未附著污垢等有機物。對於上述多個高分子多孔質平板膜,以與實施例1同樣的方法進行表面處理。任何平板膜,均在與電漿接觸瞬間,因電漿的高溫而產生熱分解,導致破裂。As an article, an organic polymer porous flat membrane (manufactured by Millipore Co., Ltd., hydrophobic polytetrafluoroethylene film, having a hydrophilicity of 50 μm) was prepared, and the contact angle with water (25 ° C) was 1,10 °, average. Organic polymer porous flat membrane with a pore diameter of 1 μm and a thickness of 100 μm (manufactured by Millipore, a hydrophobic polyethylene film with a contact angle to water (25 ° C) = 94 ° and an average pore diameter of 1 μm) . On the surface of the plurality of polymer porous flat membranes, organic substances such as dirt are not adhered. The above-mentioned plurality of polymer porous flat films were subjected to surface treatment in the same manner as in Example 1. Any flat film is thermally decomposed due to the high temperature of the plasma at the moment of contact with the plasma, resulting in cracking.
除使用在25℃、55%RH環境中放置一週的杜邦公司製造的兩種Nafion薄膜(Nafion 112、Nafion 1035)作為樣品以外,在以與實施例3相同的條件下,使水蒸氣氣泡電漿接觸該樣品。Water vapor bubble plasma was used under the same conditions as in Example 3 except that two Nafion films (Nafion 112, Nafion 1035) manufactured by DuPont Co., Ltd., which were left in a 25 ° C, 55% RH atmosphere, were used as the sample. Contact the sample.
電漿接觸前的Nafion 112、Nafion 1035對於水的接觸角為表11所示之數值。接觸電漿的瞬間,兩種Nafion薄膜均因電漿的高溫產生熱分解而導致破裂。The contact angles of Nafion 112 and Nafion 1035 for water before the plasma contact were as shown in Table 11. At the moment of contact with the plasma, both Nafion films are thermally decomposed by the high temperature of the plasma to cause cracking.
於300 mL容量的燒杯中準備純水200 mL,將實施例1所使用的堵塞的中空絲膜浸於25℃純水中,於利用輸出為100 W、20 KHz的超聲波清洗器清洗中空絲膜1小時。將清洗後的膜用電子顯微鏡觀察,發現堵塞於膜面上的有機物並未被去除。Prepare 200 mL of pure water in a 300 mL-capacity beaker, immerse the blocked hollow fiber membrane used in Example 1 in pure water at 25 ° C, and clean the hollow fiber membrane with an ultrasonic cleaner with an output of 100 W and 20 KHz. 1 hour. The cleaned film was observed with an electron microscope, and it was found that the organic substances clogged on the film surface were not removed.
於實施例1中,使反應裝置的電極過熱,產生非電漿狀態的水蒸氣氣泡,並使該水蒸氣氣泡接觸堵塞的中空絲膜樣品3分鐘,此時堵塞於膜面上的有機物並未被去除。In Example 1, the electrode of the reaction apparatus was superheated to generate a water vapor bubble in a non-plasma state, and the water vapor bubble was brought into contact with the blocked hollow fiber membrane sample for 3 minutes, at which time the organic matter blocked on the membrane surface was not Was removed.
本發明是一種表面處理技術,其使水蒸氣氣泡內產生的電漿在水中與具有親水性表面的物品相接觸,藉此可分解或者去除附著於物品上的有機物,而對物品不造成損傷。該表面處理技術,例如在家庭用淨水器、產業排水用過濾、空氣過濾中所使用的有機高分子多孔質膜、陶瓷多孔質膜的再生,多孔質膜的安全廢棄方面較為有用。尤其是,作為安全地再生或廢棄如下膜的方法而有效:醫院中洗手用水的過濾膜、醫院中院內感染預防用空氣過濾膜、消毒室用空氣過濾膜等、因含有細菌類的物質而被污染或堵塞的膜。The present invention is a surface treatment technique which causes a plasma generated in a water vapor bubble to come into contact with an article having a hydrophilic surface in water, whereby the organic matter attached to the article can be decomposed or removed without causing damage to the article. This surface treatment technique is useful, for example, in the regeneration of the organic polymer porous membrane and the ceramic porous membrane used in household water purifiers, industrial drainage filters, air filtration, and safety disposal of porous membranes. In particular, it is effective as a method of safely regenerating or discarding the following membranes: a filter membrane for hand washing water in a hospital, an air filter membrane for in-hospital infection prevention in a hospital, an air filter membrane for a disinfection chamber, and the like, and is contained by a substance containing bacteria. Contaminated or clogged membrane.
又,本發明的表面處理方法適用於如下處理:將有機體適合性材料埋入體內並使用,在其使用後,使材料表面的細菌等有機物熱分解或者碳化,用於安全地廢棄材料的處理;使與臟器共存的癌細胞熱分解或者碳化,用於對生命安全有效的處理;使附著於使用完的隱形眼鏡上的細菌、血液、蛋白質等有機物熱分解或者碳化,用於安全廢棄的處理等。進而,本發明的表面處理方法,亦可適用於如下處理:將導管、人工血管等埋設於體內以前的除菌,自有機體取出後所附著的菌類等的滅菌;自DNA檢體檢出裝置對檢查對象以外細菌的去除處理;用以安全廢棄使用完的DNA檢體檢出裝置的處理;使附著於空氣過濾器、遮罩等所使用的不織布上的菌類等熱分解或者碳化,用於安全廢棄的處理等。Further, the surface treatment method of the present invention is suitably applied to a method in which an organism-suitable material is embedded in a body and used, and after use, an organic substance such as bacteria on the surface of the material is thermally decomposed or carbonized for safe disposal of the material; The cancer cells coexisting with the organs are thermally decomposed or carbonized for safe and effective treatment; the organic substances such as bacteria, blood, and proteins attached to the used contact lenses are thermally decomposed or carbonized for safe disposal. Wait. Furthermore, the surface treatment method of the present invention can also be applied to a treatment in which a catheter, an artificial blood vessel, or the like is immersed in a body before sterilization, and bacteria adhering to the organism after being taken out from the organism are sterilized; Removal of bacteria other than the target; treatment for safely discarding the used DNA sample detection device; thermal decomposition or carbonization of fungi attached to the nonwoven fabric used in air filters, masks, etc., for safe disposal Processing and so on.
又,本發明的蝕刻技術,亦可利用於防窺護目鏡的加工,該防窺護目鏡是賦予親水性透明有機材料的表面微細的凹凸,並發現光學用途上的反射防止功能,或者發現僅於特定視野角度的視認性。進而,可僅以源自水分子的化學類蝕刻金屬膜表面,於半導體裝置中高密度多層布線的金屬鑲嵌製程中,可降低廢液處理的費用,故可有效降低製造成本。Further, the etching technique of the present invention can also be applied to the processing of an anti-slip goggle which imparts fine irregularities to the surface of the hydrophilic transparent organic material, and exhibits an anti-reflection function for optical use, or finds that only Visibility at a specific viewing angle. Further, the surface of the metal film can be etched only by the chemical substance derived from the water molecules, and the cost of the waste liquid processing can be reduced in the damascene process of the high-density multilayer wiring in the semiconductor device, so that the manufacturing cost can be effectively reduced.
又,近年來半導體多層布線裝置中,布線密度變高,必須更加微細的加工,於此情形時,絕緣膜方面,提出含有多孔質矽膜的低介電常數材料。該絕緣膜的細孔容積大,材料對水的接觸角為疏水性,故而通常的化學機械研磨製程中,研磨液受絕緣膜排斥,切割金屬膜以後,難以使整體平坦。另一方面,使用本發明的方法,可選定對水的接觸角小於等於90度的材料作為低介電常數膜,藉此水蒸氣氣泡電漿中OH自由基蝕刻低介電常數膜,故而可獲得平坦的絕緣膜/多層布線金屬的構造體。Further, in the semiconductor multilayer wiring device in recent years, the wiring density is increased, and it is necessary to perform finer processing. In this case, a low dielectric constant material containing a porous tantalum film is proposed as the insulating film. The insulating film has a large pore volume, and the contact angle of the material with water is hydrophobic. Therefore, in a usual chemical mechanical polishing process, the polishing liquid is repelled by the insulating film, and after the metal film is cut, it is difficult to make the whole flat. On the other hand, by using the method of the present invention, a material having a contact angle of water of 90 degrees or less can be selected as the low dielectric constant film, whereby the OH radical in the vapor bubble plasma etches the low dielectric constant film, so that A structure of a flat insulating film/multilayer wiring metal is obtained.
又,本發明的蝕刻技術可控制與水蒸氣氣泡電漿的接觸時間,並設為短時間,故可選擇地蝕刻僅疏水性部分。該技術對於兼具親水性表面與疏水性表面兩部分的有機材料、無機材料、碳材料等各種材料,可於選擇地蝕刻疏水性部分時適用。尤其是,碳材料、矽晶圓等材料,其耐熱溫度較高,故表面加工困難,但利用本技術可容易地進行蝕刻加工。Further, the etching technique of the present invention can control the contact time with the vapor bubble plasma and set it as a short time, so that only the hydrophobic portion can be selectively etched. This technique is applicable to various materials such as an organic material, an inorganic material, and a carbon material which have both a hydrophilic surface and a hydrophobic surface, and can selectively etch a hydrophobic portion. In particular, materials such as carbon materials and tantalum wafers have high heat resistance temperatures, so surface processing is difficult, but etching can be easily performed by this technique.
10...電漿產生裝置10. . . Plasma generating device
11...液體11. . . liquid
12...容器12. . . container
13...電極13. . . electrode
14...對向電極14. . . Counter electrode
15...物品15. . . article
16...支持具16. . . Support
17...水蒸氣氣泡17. . . Water vapor bubble
18...水滴18. . . Water droplets
19...空氣相19. . . Air phase
γS V ...與液體(水)的蒸氣處於吸附平衡的固體之表面張力(室溫、大氣壓)γ S V . . . Surface tension of solids in equilibrium with liquid (water) vapor (room temperature, atmospheric pressure)
γS L ...固體與液體的界面張力γ S L . . . Interfacial tension between solid and liquid
γL v ...與該蒸氣(水蒸氣)處於平衡的液體(水)之表面張力γ L v . . . Surface tension of liquid (water) in equilibrium with the vapor (water vapor)
圖1是表示電漿產生裝置之一例的概略構成圖。Fig. 1 is a schematic block diagram showing an example of a plasma generating apparatus.
圖2是水對物品表面之接觸角的表示圖。Figure 2 is a representation of the contact angle of water on the surface of the article.
圖3是電漿狀態下水蒸氣氣泡(以下稱為水蒸氣氣泡電漿)之蝕刻速度的接觸角依存性表示圖。Fig. 3 is a graph showing the dependence of the contact angle of the etching rate of water vapor bubbles (hereinafter referred to as steam bubble plasma) in a plasma state.
圖4是多層布線金屬鑲嵌製程的模式圖。4 is a schematic view of a multilayer wiring damascene process.
圖5是來自水蒸氣氣泡電漿之發光光譜的表示圖。(實施例1)Fig. 5 is a graph showing the luminescence spectrum of a slurry of water vapor bubbles. (Example 1)
圖6是堵塞的中空絲膜樣本表面的電子顯微鏡照片。Figure 6 is an electron micrograph of the surface of a blocked hollow fiber membrane sample.
圖7是表面處理後的中空絲膜樣本表面的電子顯微鏡照片。Fig. 7 is an electron micrograph of the surface of the hollow fiber membrane sample after surface treatment.
10...電漿產生裝置10. . . Plasma generating device
11...液體11. . . liquid
12...容器12. . . container
13...電極13. . . electrode
14...對向電極14. . . Counter electrode
15...物品15. . . article
16...支持具16. . . Support
17...水蒸氣氣泡17. . . Water vapor bubble
19...空氣相19. . . Air phase
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JP5696447B2 (en) * | 2010-11-25 | 2015-04-08 | Jfeスチール株式会社 | Method for producing surface-treated metal material |
JP5645163B2 (en) * | 2011-01-26 | 2014-12-24 | 国立大学法人大阪大学 | Surface modification method of fluororesin material and laminate of fluororesin material and metal material |
KR101405721B1 (en) * | 2011-04-29 | 2014-06-13 | 한국과학기술연구원 | A porous media with enhanced hydrophobicity and a fabrication method thereof |
KR101349075B1 (en) * | 2011-10-10 | 2014-01-16 | 한국과학기술연구원 | Fuel Cell with Enhanced Mass Transport Capability |
US9809493B2 (en) | 2015-04-27 | 2017-11-07 | Ford Global Technologies, Llc | Surface treatment of glass bubbles |
JP2019029333A (en) * | 2017-07-26 | 2019-02-21 | 東芝メモリ株式会社 | Plasma processing apparatus and method of manufacturing semiconductor device |
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