TWI402509B - Flat head probe test socket - Google Patents

Description

Flat head probe test connector

IC electrical testing is to understand the quality of IC manufacturing and is an indispensable part of semiconductor component manufacturing. The connector is a conductive connection that provides a connection between the test system and the IC under test. This is used to achieve the purpose of signal measurement. However, it is also used in other areas of electrical connection, such as the connection of mobile phone batteries and mobile phone antennas.

When measuring low-resistance circuits, Kelvin connections are often used. The circuit diagram is shown in Figure 12. Simply speaking, the two pins are used to measure the electrical properties on the same pin, thereby correcting or eliminating the line. Or the impedance introduced during contact increases the accuracy of the measurement. The schematic diagram of the conventional one is as shown in the first figure.

Please refer to the eleventh figure. This figure is a representative diagram of various test probes. The data is from patent search and the patent number is attached to the figure. In general, these probes have the following similar characteristics:

1. Both are cylindrical.

2. Provide the restoring force and contact force with a spring.

3. The probe head diameter is smaller than the bobbin.

4. The probe is rotatable in the holder.

When these probes are connected to Kelvin, as shown in the first figure. At this time, the two probes 101 on the same side need to contact the same leg, T1 is the inner edge spacing of the probe head, and L1 is the foot length of the component to be tested. So if T1 is smaller, the chances of two probe heads touching L1 at the same time are greater, and vice versa. Since the probe head diameter D1 is smaller than the bobbins 712, 722 (seventh image), T1 depends on the center distance of the two probes of P1, and the diameter of the probe head is subtracted. Therefore, the T1 spacing has its limitations. In practical operation, the design requires high alignment accuracy, and the element to be tested If the position deviation is too much, the test cannot be performed correctly, that is, the test yield is affected.

These probes, when performing a general connection, as shown in the second figure, the general connection of the test is that each probe 101 corresponds to a separate pin and is connected to the test system for testing. In the direction of the arrangement of the pins, as shown in the second B, the position sensitivity in this direction is also high due to the factor of D1. When the position of the device to be tested is too much, the test cannot be performed correctly, and the test yield is also affected.

It is a primary object of the present invention to provide a side trial connector that is less sensitive to position, thereby increasing the yield of the test.

The connector needs to have the function of transmitting electronic signals. In general, the relative position of the connector to the component under test needs to be correct in order to obtain good contact quality. In the case of a general connection, the larger the contactable area of the connector, the easier it is to get good contact with the component to be tested. When the Kelvin connection is implemented, the closer the two contact points that need to be contacted at the same time, the more easily the good contact position is obtained by the element to be tested, which also means the improvement of the test yield.

The connector includes a plurality of probes and a set of probe holders that differ from the characteristics of a conventional conventional holder due to changes in the design concept of the probe.

In general, the probe is a basic component of the connector. The probe holder is designed according to the characteristic size of the probe and the position of the pin of the object to be tested. When combined, it is a connector.

There are two types of probes. The two-stage probe is a combination of a bobbin and a probe head, and a spring is placed inside the bobbin to provide a restoring force. The probe head of the three-stage probe is located at both ends and combined with the bobbin, and a spring is placed inside the bobbin to provide a restoring force. These two types of probes work in roughly the same way. Conventional probes are mostly designed for the package of ball array package (BGA), so the probe heads are all cylindrical, and then the geometry of the contact points changes to adapt to different contact situations, such as crown or sharp vertex. .

When the contact point of the contacted component is planar, such as a SOL package with two rows of Gull Wing or a QFP package with four rows of seagull wings, these common probe head shapes are limited. The restrictions are as shown in the [Prior Art].

In order to solve this limitation, the present invention makes a design change by utilizing the functional features of the contact end of the component, so that the probe and the retainer have an irreversible relative relationship, and then the non-rotating property is utilized to design a suitable component contact. end.

Whether it is a two-stage probe or a three-stage probe, it is not distinguished in the present invention because its working principle and the features of the present invention are simultaneously applicable.

The flat head probe of the present invention has a rectangular structure at the contact end with the element to be tested, the long side of the rectangular structure is greater than or equal to the diameter of the bobbin, the short side is smaller than the diameter of the bobbin, and the difference between the short side and the circumference of the bobbin is A shoulder formed to abut the edge of the elongated hole in the upper portion of the probe holder. The shoulder formed by the difference between the long side and the circumference of the bobbin is used to abut the edge of the round hole in the lower portion of the probe holder. The segments are also rotatable relative to one another when the probe is not loaded into the holder. The retainer needs to have a gap at the required edge of the shoulders to allow the probe head to move up and down. Therefore, after the flat head probe is loaded into the holder, it can only be moved up and down due to the restriction of the long hole, and cannot be rotated. Since the probe head is not rotatable, the long sides are effective contactable ranges, which are larger than conventional cylindrical probes.

The flat head probe can be made to meet the contact characteristics of the component to be tested as follows:

Bevel

2. Plane

3. Round surface

4. V-shaped groove (two directions)

5. Double V trench

6. Double bevel (pointed)

7. Braille

8. L shape

The side surface is interlaced with the adjacent probes to make the contact points staggered and can be made into:

Double bevel

2. Double bevel (concave)

3. Wave type

4. Arc shape

In response to the alignment requirements of adjacent probes, an insulating layer may also be applied to adjacent adjacent faces of the probe head (perpendicular to the component contact faces) to isolate adjacent probes.

Another type of the invention is called a wide-headed probe, and has a rectangular structure at the contact end with the element to be tested. The length of both sides of the rectangular structure is greater than or equal to the diameter of the bobbin, and one side has a convex shape with the lower edge of the opposite side. The edge of the flange is formed to abut the edge of the elongated hole in the upper portion of the probe holder. The shoulder formed by the difference between the length of the rectangular side and the circumference of the bobbin is used to abut the edge of the round hole in the lower portion of the probe holder. The segments are also rotatable relative to one another when the probe is not loaded into the holder. The retainer needs to have a gap at the required edge of the shoulders to allow the probe head to move up and down. Therefore, after the wide-head probe is loaded into the holder, it can only be moved up and down due to the limitation of the long hole, and cannot be rotated. Since the probe head is not rotatable, the side length is an effective contact range, which is larger than the conventional round head probe.

The wide-head probe can be made to meet the contact characteristics of the component to be tested as follows:

Bevel

2. Plane

3. Round surface

4. V-shaped groove (two directions)

5. Double V trench

6. Double bevel (pointed)

7. Braille

8. L shape

In response to the alignment requirements of adjacent probes, an insulating layer may also be applied to adjacent adjacent faces of the probe head (perpendicular to the component contact faces) to isolate adjacent probes.

The probe holder is used for the device probe so that the probe can correctly correspond to the circuit of the device under test and the test instrument.

There are two types of holders for the flat head probe, one is a Kelvin connection and the other is a general connection.

The flat head probe Kelvin is connected to the holder, which is divided into upper and lower layers. The upper layer is arranged with a plurality of long grooves corresponding to the joints of the elements to be tested for placing the probe head, and the lower layer is arranged with a plurality of corresponding ones to be tested. The round hole of the component contact is used for placing the bobbin, and the space between the two interlayers is such that the probe head can move up and down, and each of the components to be tested has two probes corresponding to the pin. The upper plane in which the plurality of circular holes are arranged in the lower layer can increase the long groove, so that the flat head probe can be aligned in the direction of the probe head during assembly to facilitate the installation of the upper layer of the holder.

The flat head probe is generally connected to the holder, which is divided into upper and lower layers. The upper layer is arranged with a plurality of long grooves corresponding to the joints of the components to be tested for placing the probe head, and the lower layer is arranged with a plurality of corresponding ones to be tested. The round hole of the component contact is used to place the bobbin, and the space between the two interlayers allows the probe head to move up and down. The upper plane in which the plurality of circular holes are arranged in the lower layer can increase the long groove, so that the flat head probe can be aligned in the direction of the probe head during assembly to facilitate the installation of the upper layer of the holder.

The holder for the wide-head probe is divided into upper and lower layers, and the upper layer is arranged with a plurality of long grooves corresponding to the entire array of contacts of the component to be tested for placing the probe The head and the lower layer are arranged with a plurality of circular holes corresponding to the joints of the components to be tested for placing the bobbin, and the space between the two interlayers allows the probe head to move up and down.

When the probe head is convex or L-shaped, the upper groove of the probe holder can be turned into a groove that is not completely penetrated, and a slit is opened to extend the probe head. Thus, the yaw of the probe head during operation can be limited to the range of the groove.

Place the flat-head probe into the Kelvin-connected holder, which becomes the flat-head probe Kelvin connector.

Put the flat head probe into the generally connected holder, which becomes the flat connector general connector.

Put the wide-head probe into the holder of the wide-head probe, which becomes the general connector of the wide-head probe.

In order to provide a more detailed and clear understanding of the purpose, function and structural features of the present invention, the following preferred embodiments are illustrated as follows:

Since the connection method of the test is divided into a Kelvin connection and a general connection, the probe conventionally has two segments and three segments, and the present invention is divided into a flat head and a wide head. In this list, the names used are summarized so that they are clearly distinguished from the main component symbol descriptions in the text, the simple description of the drawings, and the table is as follows:

The flat head probe is as shown in the seventh AB diagram. The two probes have upper and lower contact heads 711, 713, 721, and 723 connected by bobbins 712 and 722. The springs 716 and 726 provide contact force in the bobbin to contact. surface. The upper probe heads 711, 721 are used to contact the component under test 104. Its long side L2 is greater than or equal to the bobbin diameter D2, this The difference forms shoulders 714, 724 that can be overlapped with the retainer so that the probe can be placed in the retainer. Its short side W3 is greater than or equal to the bobbin diameter D2, and this difference forms shoulders 715, 725 which can be overlapped with the retainer so that the probe can be placed in the holder.

The wide-head probe is as shown in the seventh CD. The two probes have upper and lower contact heads 717, 713, 727, and 723 connected by bobbins 712 and 722. The springs 716 and 726 provide contact force in the bobbin to contact. surface. The upper probe heads 717, 727 are used to contact the component under test 104. The long sides L3, W2 are greater than or equal to the diameter D2 of the bobbin, wherein one side has a flange 718, 728 on the lower edge of the opposite end of the head, the flange can be overlapped with the retainer, so that the probe can be installed In the holder.

The holder of the flat Kelvin test connector is divided into two layers as shown in the third B. The upper layer 302 has a plurality of elongated grooves 304 corresponding to the pins for accommodating the probe head 711 and having a space 307. The probe head can be moved up and down. The lower layer 301 has a plurality of circular holes 305 corresponding to the pins for accommodating the probe bobbin 712, and the upper plane of the lower layer also has a long groove 306, which allows the probe to be mounted at the time of loading The orientation can be aligned first, making the upper retainer easy to install.

The holder of the flat head general test connector is divided into two layers as shown in FIG. 5B, and the upper layer 502 has a plurality of long grooves 506 corresponding to the pins for accommodating the probe head 711 and having a space 505. The probe head can be moved up and down. The lower layer 501 has a plurality of circular holes 503 corresponding to the pins for accommodating the probe bobbin 712, and the upper plane of the lower layer also has a long groove 504, which enables the probe to be mounted at the time of loading The orientation can be aligned first, making the upper retainer easy to install.

When the flat head probe type is convex or L-shaped, as shown in the tenth C. The upper layer 302 has a plurality of long grooves 304 and 506 corresponding to the pins, and is changed into a groove which is completely penetrated, and the upper surface is formed as a groove 1003, so that the probe head can be extended therefrom and connected with the component to be tested. Foot contact.

The holder of the wide head general test connector is divided into two layers as shown in FIG. 6C. The upper layer 602 has a plurality of elongated grooves 605 corresponding to the pins for accommodating the probe head 717 and having a space 604. The probe head can be moved up and down. The lower layer 601 has a plurality of circular holes 606 corresponding to the pins for receiving the probe bobbin 712.

When the wide head probe head type is convex or L-shaped, as shown in the tenth AB diagram. The upper layer 602 has a plurality of long grooves 605 corresponding to the pins, and is changed into a groove which is completely penetrated, and the upper surface is formed as a groove 1001, so that the probe head can be extended therefrom and is in contact with the pins of the component to be tested. .

Flat Kelvin Test Connector As in Figures A and 4, the flat head probe 303 is loaded into the holders 301, 302 of the flat Kelvin test connector, which is a flat Kelvin test connector. The distance between the probe heads of this connector is G1, G2, G3. Since the long side of the probe head is larger than the diameter of the bobbin, the spacings G1, G2, and G3 can be very close, and even G1, G2, and G3 = 0 can be contacted. If the adjacent sides of the probe head are made into a pointed shape and a concave shape, as in the ninth DH diagram, the contact points may be interlaced with O1. To completely isolate adjacent probe heads, apply an insulating material to the adjacent faces.

Flat Head General Test Connector As shown in FIG. 5A, the flat head probe 303 is loaded into the flat head general test connector holders 501, 502, which is a flat head general test connector. Since the long side of the probe head is larger than the diameter of the bobbin, the area L2 which can be contacted left and right is large.

The wide head general test connector, as in the sixth AB diagram, mounts the wide head probe 603 into the wide head general test connector holders 601, 602, which is a wide head general test connector. The probe head of the connector is isolated from the adjacent probe head without the holder, so the side length of the probe head can be close to the pitch of the pin, so that the contactable range of the element to be tested in the pitch direction is increased. To completely isolate adjacent probe heads, apply an insulating material to the adjacent faces.

The above embodiments are described only as a preferred embodiment of the present invention, and those skilled in the art can explain the above embodiments according to the present invention. And for all other improvements and changes. However, all of the improvements and variations made in accordance with the present embodiment are still within the scope of the creative spirit and definition of the present invention.

101‧‧‧Traditional probe

102‧‧‧The lower part of the probe holder (Kelvin)

103‧‧‧Upper probe holder (Kelvin)

104‧‧‧Device under test

L1‧‧‧The length of the component to be tested

T1‧‧‧ probe head contact point spacing

P1‧‧‧ probe center distance

201‧‧‧The lower part of the probe holder

202‧‧‧Upper probe holder

D1‧‧‧ probe head diameter

W1‧‧‧Measured component foot width

301‧‧‧ probe holder lower part (Kelvin test connector type 1)

302‧‧‧Upper probe holder (Kelvin test connector type 1)

303‧‧‧ flat head probe (two-stage)

304‧‧‧ accommodates the long hole of the probe head

305‧‧‧round hole for the probe bobbin

306‧‧‧The long hole of the probe head alignment

307‧‧‧Space of the probe head up and down

G1‧‧‧ probe head contact point spacing

401‧‧‧ probe holder lower part (Kelvin test connector type 2)

402‧‧‧Upper probe holder (Kelvin test connector type 2)

403‧‧‧ flat head probe (three-stage)

404‧‧‧ flat head probe head (three-stage)

405‧‧‧Long hole with probe head alignment (Kelvin test connector type 2)

Overlap distance of O1‧‧‧ probe head

G2‧‧‧Distance between probe head contacts (overlapping type)

G3‧‧‧Distance between probe head contacts (no overlap)

501‧‧‧ Probe holder lower part (general test connector type 1)

502‧‧‧ probe holder upper part (general test connector type 1)

503‧‧‧round hole for the probe bobbin

504‧‧‧The long hole of the probe head alignment

505‧‧‧Space of the probe head up and down

506‧‧‧ accommodated the long hole of the probe head

L2‧‧‧ flat head probe head width

601‧‧‧ probe holder lower part (general test connector type 2)

602‧‧‧Upper probe holder (general test connector type 2)

603‧‧‧ Wide Head Probe (General Test Connector Type 2)

604‧‧‧Space of the probe head up and down

605‧‧‧Long hole for wide probe head

606‧‧‧round hole for the probe bobbin

W2‧‧‧ wide head probe head width

L3‧‧‧ wide head probe head thickness

711‧‧‧flat head two-stage probe head

712‧‧‧Blank two-stage probe bobbin

713‧‧‧ Flat head two-stage probe lower probe head

714‧‧‧B flat-headed two-stage probe head under the shoulder

715‧‧‧ flat head two-stage probe bobbin upper shoulder

716‧‧‧flat head two-stage probe spring

717‧‧‧ Wide head two-stage probe head

718‧‧‧ Wide head two-stage probe head flange

721‧‧‧flat head three-stage probe head

722‧‧‧flat head three-stage probe bobbin

723‧‧‧ flat head three-stage probe lower probe head

724‧‧‧ flat head three-stage probe head lower shoulder

725‧‧‧flat head three-stage probe bobbin upper shoulder

726‧‧‧flat head three-stage probe spring

727‧‧‧ Wide head three-stage probe head

728‧‧‧ Wide head three-stage probe head flange

W3‧‧‧ flat head probe thickness

801‧‧‧ Wide head probe insulation coated surface

901‧‧‧ Flat head probe insulation coated surface

1001‧‧‧ Wide head probe retainer upper groove

1002‧‧‧Brax wide head probe head

1003‧‧‧Slots on the upper part of the flat head probe holder

The first picture is a cross-section of the Kelvin test connector.

Figure 2 is a cross-sectional view of a conventional test connector.

Third A Figure A cross-sectional view of a first type of a Kelvin test connector of the present invention.

Figure 3B is a perspective view of a probe holder of the first type of Kelvin test connector of the present invention.

Figure 4A is a cross-sectional view of a second type of Kelvin test connector of the present invention (Case 1).

Figure 4B is a cross-sectional view of a second type of Kelvin test connector of the present invention (Case 2).

Figure 5A is a cross-sectional view of a first type of a general test connector of the present invention.

Fig. 5B is a perspective view of the probe holder of the first type of the general test connector of the present invention.

Figure 6A is a front elevational cross-sectional view of a second type of test connector of the present invention.

Figure 6B is a side cross-sectional view of a second type of a general test connector of the present invention.

Fig. 6C is a perspective view of the probe holder of the second type of the general test connector of the present invention.

Figure 7A Flat-headed two-stage probe structure

Figure 7B Flat-head three-stage probe structure

Seventh C diagram Wide head two-stage probe structure diagram

The seventh D picture wide head three-stage probe structure diagram

Figure 8 Various probe types for wide-head probes

Figure 9 Various probe types of flat head probes

Figure 10A A perspective view of the wide head embossed probe and the upper layer of the holder

Figure 10B Sectional view of the wide head embossed probe and the upper layer of the holder

Figure 10 C. Stereogram of the upper layer of the holder of the flat-headed convex probe

Figure 11 Prior Art

Twelfth picture prior art

104‧‧‧Device under test

303‧‧‧ flat head probe (two-stage)

501‧‧‧ Probe holder lower part (general test connector type 1)

502‧‧‧ probe holder upper part (general test connector type 1)

503‧‧‧round hole for the probe bobbin

505‧‧‧Space of the probe head up and down

506‧‧‧ accommodated the long hole of the probe head

L1‧‧‧The length of the component to be tested

L2‧‧‧ flat head probe head width

Claims (16)

A probe for an electrical test connector, comprising: upper and lower contact ends for contacting the object to be tested and the test device, and connected by a bobbin, and the two ends are extended by the spring in the bobbin; the probe is The contact end of the object to be tested is flat, and the long side of the flat shape is greater than or equal to the diameter of the bobbin, and the short side is smaller than the diameter of the bobbin; the contact ends of the probes can mutually rotate in the axial direction. The probe according to claim 1, wherein the contact surface of the contact end of the object to be tested is a slope, a plane, a circular surface, a V-shaped groove, a double V-shaped groove or a double inclined surface. The probe according to claim 1, wherein the contact surface of the contact end of the object to be tested is in a convex shape. The probe according to the first aspect of the invention, wherein the contact surface of the contact end of the object to be tested is an L-shape. The probe according to claim 1, wherein the side of the contact end of the object to be tested is a pointed double slope. The probe of claim 1, wherein the side of the contact end of the object to be tested is a concave double slope. The probe according to the first aspect of the invention, wherein the side of the contact end of the object to be tested has a circular arc shape. The probe according to claim 1, wherein the side of the contact end of the object to be tested is coated with an insulating coating. A probe for an electrical test connector, comprising: upper and lower contact ends for contacting the object to be tested and the test device, and connected by a bobbin, and the two ends are extended by the spring in the bobbin; the probe is The contact end of the object to be tested is a rectangular structure, the length of both sides of the rectangular structure is greater than or equal to the diameter of the bobbin, wherein one side has a flange with the lower edge of the opposite side; The contact ends of the probes are rotatable relative to each other in the axial direction. The probe according to claim 9, wherein the contact surface of the contact end of the object to be tested is a slope, a plane, a circular surface, a V-shaped groove, a double V-shaped groove or a double inclined surface. The probe according to claim 9, wherein the contact surface of the contact end of the object to be tested is in a convex shape. The probe according to claim 9, wherein the contact surface of the contact end of the object to be tested is an L-shape. The probe according to claim 9, wherein the side of the contact end of the object to be tested is coated with an insulating coating. An electrical test connector comprising: a probe holder: providing a space for the probe to be arranged at a relative position of a contact point of the object to be tested; the upper portion of the holder is arranged with a plurality of elongated holes, and the lower portion is arranged with a plurality of round holes For arranging the probes; a plurality of probes: the probe has upper and lower contact ends and is connected by a bobbin, and the two ends are extended and contracted by springs in the bobbin, and the probe is flat at the contact end of the object to be tested. The flat long side is greater than or equal to the diameter of the bobbin, and the short side is smaller than the bobbin diameter. The test connector of claim 14, wherein the probes are arranged such that one of the components to be tested has two probes. An electrical test connector comprising: a probe holder: providing a space for the probe to be arranged at a relative position of a contact point of the object to be tested; the upper portion of the holder is arranged with a plurality of elongated holes, and the lower portion is arranged with a plurality of round holes For arranging the probes; a plurality of probes: the probe has upper and lower contact ends and is connected by a bobbin, and the two ends are extended and contracted by springs in the bobbin, and the probe is at a moment of contact of the object to be tested. The shape of the two sides of the rectangular structure is greater than or equal to the diameter of the bobbin, wherein one side has a flange with the lower edge of the opposite side.