TWI394725B - Glass manufacturing method - Google Patents

Glass manufacturing method Download PDF

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TWI394725B
TWI394725B TW096132080A TW96132080A TWI394725B TW I394725 B TWI394725 B TW I394725B TW 096132080 A TW096132080 A TW 096132080A TW 96132080 A TW96132080 A TW 96132080A TW I394725 B TWI394725 B TW I394725B
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vacuum degassing
gas
water vapor
glass
vacuum
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TW096132080A
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TW200835660A (en
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Hideki Kushitani
Toshiyasu Kawaguchi
Shingo Urata
Hajime Itoh
Kenta Saito
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Asahi Glass Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/089Glass compositions containing silica with 40% to 90% silica, by weight containing boron
    • C03C3/091Glass compositions containing silica with 40% to 90% silica, by weight containing boron containing aluminium
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B5/00Melting in furnaces; Furnaces so far as specially adapted for glass manufacture
    • C03B5/16Special features of the melting process; Auxiliary means specially adapted for glass-melting furnaces
    • C03B5/225Refining
    • C03B5/2252Refining under reduced pressure, e.g. with vacuum refiners
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B5/00Melting in furnaces; Furnaces so far as specially adapted for glass manufacture
    • C03B5/16Special features of the melting process; Auxiliary means specially adapted for glass-melting furnaces
    • C03B5/225Refining
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Glass Compositions (AREA)
  • Degasification And Air Bubble Elimination (AREA)

Description

玻璃之製造方法Glass manufacturing method

本發明係關於具備真空除氣步驟的玻璃製造方法,調整真空除氣槽內之上部空間之水蒸氣濃度的方法,及真空除氣裝置。The present invention relates to a glass manufacturing method including a vacuum degassing step, a method of adjusting a water vapor concentration in an upper space in a vacuum degassing tank, and a vacuum degassing apparatus.

自以往,為了提高所成形之玻璃製品的品質,乃於以成形裝置將熔融爐溶解原料之熔融玻璃予以成形前,利用將熔融玻璃內所發生的氣泡予以除去的澄清步驟。Conventionally, in order to improve the quality of the formed glass product, a clarification step of removing bubbles generated in the molten glass is performed before the molten glass in which the molten material is dissolved in the melting furnace is molded by a molding apparatus.

已知此澄清步驟中,於真空氛圍氣內導入熔融玻璃,並於此真空氛圍氣下,令連續流入之熔融玻璃流內的氣泡大為成長並使熔融玻璃內所含之氣體浮起,並且破泡除去,其後由真空氛圍氣中排出的減壓除氣方法。It is known that in the clarification step, the molten glass is introduced into the vacuum atmosphere, and under the vacuum atmosphere, the bubbles in the continuously flowing molten glass flow are greatly grown and the gas contained in the molten glass is floated, and A decompression degassing method in which a bubble is removed and then discharged from a vacuum atmosphere.

於此類真空除氣方法中,為了達成適當的真空除氣條件,乃提案規定真空除氣槽內之壓力和溫度的方法(參照專利文獻1、專利文獻2)。In such a vacuum degassing method, in order to achieve an appropriate vacuum degassing condition, a method of specifying the pressure and temperature in the vacuum degassing tank is proposed (see Patent Document 1 and Patent Document 2).

專利文獻1:特開2000-128422號公報專利文獻2:國際公開第02/098810號公報Patent Document 1: JP-A-2000-128422, Patent Document 2: International Publication No. 02/098810

但是,例如即使於如上述較佳之真空除氣條件下進行真空除氣,於真空除氣處理中,通常以10mm以下左右存在於熔融玻璃表面的泡層,亦朝向10mm~數百mm肥大化,發生所謂突沸之情況。所謂突沸,係指通常隨著時間消滅而到達玻璃表面的氣泡,並未破泡且變成層並長期安定存在,導致熔融玻璃界面(熔融玻璃表面)上升的現象。其結果,發生真空除氣後之熔融玻璃中殘存氣泡的問題。However, for example, even if vacuum degassing is performed under the vacuum degassing condition as described above, in the vacuum degassing treatment, the bubble layer existing on the surface of the molten glass is usually about 10 mm or less, and is also enlarged toward 10 mm to several hundreds of mm. The so-called sudden boiling occurs. The term "bumping" refers to a bubble that reaches the surface of the glass, which usually disappears with time, does not break into bubbles, and becomes a layer and settles for a long period of time, resulting in a phenomenon in which the molten glass interface (the surface of the molten glass) rises. As a result, there is a problem that bubbles remain in the molten glass after vacuum degassing.

又,即使未發生突沸,亦因泡層肥大化之結果,於玻璃製品中殘存氣泡並且發生缺陷。Further, even if no sudden boiling occurs, bubbles are left in the glass product as a result of the enlargement of the bubble layer, and defects occur.

又,例如即使於如上述較佳之真空除氣條件下進行真空除氣,亦因熔融玻璃中特定的成份(硼等)揮散,且玻璃組成變化,結果令所製造之玻璃素板的平坦度惡化。Further, for example, even if vacuum degassing is performed under the vacuum degassing condition as described above, the specific component (boron or the like) in the molten glass is volatilized, and the glass composition is changed, resulting in deterioration of the flatness of the produced glass plate. .

本發明之目的為在於提供幾乎不會發生突沸下進行真空除氣的玻璃製造方法。It is an object of the present invention to provide a glass manufacturing method which performs vacuum degassing under sudden boiling.

又,提供幾乎不會發生來自泡層肥大化之玻璃製品中的氣泡殘存,進行真空除氣之玻璃製造方法。Further, a glass production method in which bubbles are left in the glass product from which the bubble layer is enlarged and vacuum degassing is performed is provided.

又,提供抑制熔融玻璃中之特定成份(硼等)揮散,進行真空除氣的玻璃製造方法。Further, a glass production method for suppressing volatilization of a specific component (boron or the like) in the molten glass and performing vacuum degassing is provided.

更且,提供此類真空除氣下較佳應用之調整真空除氣槽之氛圍氣體之水蒸氣濃度的方法,及可進行此類真空除氣之熔融玻璃的真空除氣裝置。Moreover, a method for adjusting the water vapor concentration of the atmosphere gas of the vacuum degassing tank which is preferably used under such vacuum degassing, and a vacuum degassing apparatus for the molten glass which can be vacuum degassed are provided.

本發明者對於真空除氣槽內之熔融玻璃表面泡層肥大化的現象,所謂產生突沸且產生缺陷情況的真空除氣處理條件進行詳細檢討。其後,發現真空除氣槽內之氛圍氣體的水蒸氣濃度為超過特定值時,泡層為肥大化並且於玻璃製品中殘存許多氣泡。又,前述水蒸氣濃度為比此特定值超過更高之其他特定值時,發現泡層進一步肥大化並突沸,令玻璃製品中氣泡殘存更多。其後,發現以此些特定值以下之真空除氣條件進行真空除氣的玻璃製造方法,可以此類條件真空除氣之熔融玻璃的真空除氣裝置,及調整此類裝置之真空除氣槽內之氛圍氣體之水蒸氣濃度的方法可解決上述課題,並且完成本發明。The inventors of the present invention conducted a detailed review of the phenomenon that the surface of the molten glass surface in the vacuum degassing tank is enlarged, and the vacuum degassing treatment condition which causes a sudden boiling and defects. Thereafter, when the water vapor concentration of the atmosphere gas in the vacuum degassing tank was found to exceed a certain value, the bubble layer was enlarged and many bubbles remained in the glass product. Further, when the water vapor concentration is a specific value higher than the specific value, it is found that the bubble layer is further enlarged and swelled, so that bubbles remain in the glass product. Thereafter, a glass manufacturing method for vacuum degassing under vacuum degassing conditions below the specific value is found, a vacuum degassing device for molten glass which can be vacuum degassed under such conditions, and a vacuum degassing tank for adjusting such a device The method of the water vapor concentration of the atmosphere gas therein can solve the above problems and complete the present invention.

本發明為提供下列之(1)~(8)。The present invention provides the following (1) to (8).

(1)一種玻璃之製造方法,其特徵為具備,使真空除氣(vacuum degassing)槽之氛圍氣體之水蒸氣濃度為60mol%以下,使熔融玻璃(molten glass)真空除氣之步驟。(1) A method for producing a glass, comprising the step of vacuum-degreasing a molten glass by a water vapor concentration of an atmosphere gas in a vacuum degassing tank of 60 mol% or less.

(2)如上述(1)之玻璃之製造方法,其中藉由低水分(low moisture content)氣體之導入於該真空除氣槽之氛圍氣體,使得該氛圍氣體之水蒸氣濃度為60mol%以下。(2) The method for producing a glass according to the above (1), wherein the atmosphere gas introduced into the vacuum degassing tank by a low moisture content gas has a water vapor concentration of 60 mol% or less.

(3)如上述(1)或(2)之玻璃之製造方法,其中使該氛圍氣體之水蒸氣濃度為30mol%以下。(3) The method for producing a glass according to the above (1) or (2), wherein the ambient gas has a water vapor concentration of 30 mol% or less.

(4)如上述(2)或(3)之玻璃之製造方法,其中該低水分氣體之氧濃度(體積%)低於空氣中氧濃度(體積%)。(4) The method for producing a glass according to the above (2) or (3), wherein the oxygen concentration (% by volume) of the low moisture gas is lower than the oxygen concentration (% by volume) in the air.

(5)如上述(4)之玻璃之製造方法,其中該低水分氣體之氧濃度(體積%)為15體積%以下。(5) The method for producing a glass according to the above (4), wherein the low moisture gas has an oxygen concentration (% by volume) of 15% by volume or less.

6.一種玻璃之製造方法,其特徵為,測定對熔融玻璃進行真空除氣之真空除氣槽的氛圍氣體之水蒸氣濃度,根據該水蒸氣濃度之測定結果,使低水分氣體導入於該真空除氣槽之該氛圍氣體,由此將該真空除氣槽之該氛圍氣體之水蒸氣濃度調整於60mol%以下。A method for producing a glass, characterized in that a water vapor concentration of an atmosphere of a vacuum degassing tank for vacuum degassing molten glass is measured, and a low moisture gas is introduced into the vacuum based on a measurement result of the water vapor concentration. The atmosphere gas of the degassing tank is adjusted to adjust the water vapor concentration of the atmosphere gas in the vacuum degassing tank to 60 mol% or less.

7.一種熔融玻璃之真空除氣裝置,其為具有:被真空吸引之真空外罩(housing);設置於該真空外罩內,進行熔融玻璃之真空除氣的真空除氣槽;與此真空除氣槽相連通而設置,將真空除氣前之熔融玻璃導入於該真空除氣槽之導入手段;與該真空除氣槽相連通而設置,將真空除氣後之熔融玻璃自該真空除氣槽導出之導出手段的熔融玻璃之真空除氣裝置,其特徵為,進而具備:測定該真空除氣槽之氛圍氣體之水蒸氣濃度的水蒸氣濃度測定手段;導入低水分氣體於該真空除氣槽內部之上部空間的低水分氣體導入手段。A vacuum degassing device for molten glass, comprising: a vacuum housing that is vacuum-attracted; a vacuum degassing tank disposed in the vacuum enclosure for vacuum degassing of the molten glass; and the vacuum degassing The grooves are connected to each other, and the molten glass before the vacuum degassing is introduced into the vacuum degassing tank; the vacuum degassing tank is connected to the vacuum degassing tank, and the vacuum degassed glass is removed from the vacuum degassing tank. A vacuum degassing device for molten glass according to the derivation means, further comprising: a water vapor concentration measuring means for measuring a water vapor concentration of the atmosphere gas in the vacuum degassing tank; and introducing a low moisture gas into the vacuum degassing tank A low moisture gas introduction means for the inner upper space.

8.如上述(7)之真空除氣裝置,其中在該真空除氣裝置進而具備,可控制該氛圍氣體之水蒸氣濃度成為所期望之值的水蒸氣濃度控制手段;藉由來自該控制手段之信號來控制低水分氣體之導入量的氣體量控制手段者。8. The vacuum degassing device according to (7) above, wherein the vacuum degassing device further comprises: a water vapor concentration control means capable of controlling a concentration of water vapor of the atmosphere gas to a desired value; The signal is used to control the amount of gas introduced by the low moisture gas.

9.如上述(7)或(8)之熔融玻璃之真空除氣裝置,其中該低水分氣體導入手段係設置於真空除氣槽之上流側者。9. The vacuum degassing apparatus for molten glass according to (7) or (8) above, wherein the low-moisture gas introduction means is provided on a flow side of the vacuum degassing tank.

本發明之玻璃製造方法為具備將熔融玻璃真空除氣令真空除氣槽內之氛圍氣體的水蒸氣濃度為60莫耳%以下的步驟,如此,達到不會發生突沸並可進行熔融玻璃之真空除氣的效果。進而,達到不會發生玻璃製品因突沸殘存氣泡產生缺陷的效果。又,由於本發明之玻璃製造方法可防止突沸,故可安定繼續玻璃製造。The glass manufacturing method of the present invention comprises the steps of vacuum degassing the molten glass so that the water vapor concentration of the atmosphere gas in the vacuum degassing tank is 60 mol% or less, so that the boiling of the molten glass can be prevented from occurring. Degassing effect. Further, it is possible to achieve an effect that the glass product does not cause defects due to bubbles remaining in the boiling water. Further, since the glass manufacturing method of the present invention can prevent the boiling, it is possible to continue the glass production in stability.

此「安定製造」,對於不問晝夜進行運轉的玻璃製造裝置而言,於品質管理上為非常重要的要素。若品質一旦惡化,則因修理和調整而必須令設備停止。又,因為可抑制突沸之熔融玻璃對於真空除氣槽的壁和天井附著以附著物,故其落下可抑制玻璃製品形成缺陷,並且圖謀提高品質。This "stable manufacturing" is a very important factor in quality management for glass manufacturing equipment that does not require day and night operation. If the quality deteriorates, the equipment must be stopped due to repairs and adjustments. Further, since the molten glass which can suppress the sudden boiling adheres to the wall and the ceiling of the vacuum degassing tank, the falling of the glass can suppress the formation of defects in the glass product, and the quality is improved.

又,本發明之玻璃製造方法,因為可減低助長特定成份(硼等)揮散之氛圍氣中水分,故達到抑制熔融玻璃中之特定成份(硼等)揮散的效果。於製造玻璃素板的情形中,可抑制其平坦度惡化。特別液晶用之玻璃等之顯示器用玻璃,由於其特性的要求而嚴格規定組成的規格,另一方面,由於硼為非常容易揮散,故必須嚴格調整硼含量。因此,若根據本發明之玻璃製造方法,則可有效率製造具有規格範圍內之組成和平坦度的玻璃。Further, in the method for producing a glass of the present invention, since the moisture in the atmosphere which promotes the volatilization of a specific component (boron or the like) can be reduced, the effect of suppressing the volatilization of a specific component (boron or the like) in the molten glass is achieved. In the case of producing a glass plate, deterioration in flatness can be suppressed. In particular, glass for displays such as glass for liquid crystals has strict specifications for composition because of its characteristics. On the other hand, since boron is very easily volatilized, it is necessary to strictly adjust the boron content. Therefore, according to the glass manufacturing method of the present invention, it is possible to efficiently manufacture a glass having a composition and flatness within a specification range.

又,本發明之玻璃製造方法為令前述水蒸氣濃度為30莫耳%以下為佳。如此,如上述不會產生突沸,加上可抑制泡層的肥大化,達到抑制玻璃製品產生許多缺陷(具體而言玻璃製品之每單位質量、0.5個/公斤以下之氣泡)的效果。Further, the glass production method of the present invention is preferably such that the water vapor concentration is 30 mol% or less. Thus, as described above, no sudden boiling occurs, and the enlargement of the bubble layer can be suppressed, and the effect of suppressing many defects of the glass product (specifically, the mass per unit mass of the glass product and 0.5 bubbles/kg or less) can be achieved.

又,本發明之真空除氣裝置可提供進行此類本發明之玻璃製造方法之合適的真空除氣裝置。Further, the vacuum degassing apparatus of the present invention can provide a suitable vacuum degassing apparatus for carrying out the glass manufacturing method of the present invention.

說明關於本發明之玻璃製造方法。A method of manufacturing a glass according to the present invention will be described.

本發明之玻璃製造方法為具備使真空除氣槽之氛圍氣體之水蒸氣濃度為60mol%以下,使熔融玻璃真空除氣之步驟(以下,亦稱為「本發明之真空除氣步驟」)。其次,具備原料熔融步驟作為前步驟為佳,且具備成形步驟作為後步驟為佳。此些原料熔融步驟及成形步驟並無特別限定,例如亦可為先前公知的步驟。此些步驟以外亦可具備其他步驟。In the glass production method of the present invention, the water vapor concentration of the atmosphere gas in the vacuum degassing vessel is set to 60 mol% or less, and the molten glass is vacuum-degassed (hereinafter also referred to as "the vacuum degassing step of the present invention"). Next, it is preferable to have the raw material melting step as the pre-step, and it is preferable to have the forming step as the subsequent step. The raw material melting step and the forming step are not particularly limited, and may be, for example, a previously known step. There are other steps besides these steps.

另外,於本發明中所謂之「氛圍氣體」,係意指充滿真空除氣槽內部之熔融玻璃上部空間(上部空間)的氛圍氣體。In addition, the term "ambient gas" as used in the present invention means an atmosphere gas which is filled in the upper space (upper space) of the molten glass inside the vacuum degassing tank.

於本發明之玻璃製造方法中,本發明之真空除氣步驟為經由對內部真空狀態之真空除氣槽內流入熔融玻璃,將此熔融玻璃中之氣泡脫泡的步驟,若為將前述真空除氣槽內之氛圍氣體之水蒸氣濃度為60莫耳%以下的真空除氣步驟,則無特定限定。In the glass manufacturing method of the present invention, the vacuum degassing step of the present invention is a step of defoaming bubbles in the molten glass by flowing into the molten glass in a vacuum degassing tank in an internal vacuum state, if the vacuum is removed The vacuum degassing step of the atmospheric gas in the gas tank having a water vapor concentration of 60 mol% or less is not particularly limited.

例如,測定真空除氣裝置中之真空除氣槽之氛圍氣體的水蒸氣濃度,並且根據水蒸氣濃度的測定結果,應用經由將後述低水分氣體導入前述上部空間,調整此真空除氣裝置之真空除氣槽內部之前述氛圍氣體之水蒸氣濃度的方法(以下,亦稱為「本發明之水分調整方法」),將此氛圍氣體之水蒸氣濃度調整至60mol%以下,則可進行本發明之真空除氣步驟。前述低水分氣體可連續導入或者間歇性導入亦可。For example, the water vapor concentration of the atmosphere gas in the vacuum degassing tank in the vacuum degassing apparatus is measured, and based on the measurement result of the water vapor concentration, the vacuum of the vacuum deaerator is adjusted by introducing a low moisture gas to be described later into the upper space. The method of the present invention can be carried out by adjusting the water vapor concentration of the atmosphere gas in the inside of the gas tank (hereinafter also referred to as "the moisture adjustment method of the present invention") by adjusting the water vapor concentration of the atmosphere gas to 60 mol% or less. Vacuum degassing step. The low moisture gas may be continuously introduced or intermittently introduced.

應用此類本發明之水分調整方法之本發明的真空除氣步驟,例如可使用本發明之真空除氣裝置進行。The vacuum degassing step of the present invention to which such a moisture adjusting method of the present invention is applied can be carried out, for example, using the vacuum degassing apparatus of the present invention.

說明關於本發明之真空除氣裝置。A vacuum deaeration device according to the present invention will be described.

本發明之真空除氣裝置為將熔融玻璃真空除氣的真空除氣裝置,具有:於真空狀態之內部流入熔融玻璃,並將此熔融玻璃中之氣泡除氣的真空除氣槽,和測定前述真空除氣槽內之氛圍氣體之水蒸氣濃度的水蒸氣濃度測定手段,和將低水分氣體導入前述上部空間的低水分氣體導入手段,減低前述氛圍氣體之水蒸氣濃度,將前述熔融玻璃真空除氣的真空除氣裝置,例如,圖1所示之真空除氣裝置。The vacuum degassing device of the present invention is a vacuum degassing device for vacuum degassing molten glass, and has a vacuum degassing tank that flows into the molten glass inside the vacuum state and degases the bubbles in the molten glass, and measures the foregoing a water vapor concentration measuring means for measuring the water vapor concentration of the atmosphere gas in the vacuum degassing tank, and a low moisture gas introducing means for introducing the low moisture gas into the upper space, reducing the water vapor concentration of the atmosphere gas, and vacuum removing the molten glass A vacuum degassing device, such as the vacuum degassing device shown in FIG.

說明圖1。圖1為示出本發明之真空除氣裝置之一構成例之真空除氣裝置1之圖,示出本發明之真空除氣裝置所具有的真空除氣槽12,和水蒸氣濃度測定手段30,和低水分氣體導入手段40。Explain Figure 1. 1 is a view showing a vacuum degassing apparatus 1 which is a configuration example of a vacuum degassing apparatus of the present invention, and shows a vacuum degassing tank 12 and a water vapor concentration measuring means 30 which the vacuum degassing apparatus of the present invention has. And a low moisture gas introduction means 40.

首先關於此真空除氣槽12,使用圖2加以說明。圖2為例示包含真空除氣槽12之本發明之真空除氣裝置10(未記載水蒸氣濃度測定手段及低水分氣體導入手段)之圖(剖面圖)。First, this vacuum degassing tank 12 will be described using FIG. FIG. 2 is a view (cross-sectional view) illustrating the vacuum degassing apparatus 10 of the present invention including the vacuum degassing tank 12 (the water vapor concentration measuring means and the low moisture gas introducing means are not described).

於圖2所示之真空除氣裝置10中,作成圓筒形狀的真空除氣槽12為以其長軸水平方向上配向並且被收納配置於真空外罩11。於真空除氣槽12之一端下面以垂直方向配向的上升管13,以其另一端的下面安裝下降管14。上升管13及下降管14以其一部份位於真空外罩11內。In the vacuum degassing apparatus 10 shown in FIG. 2, the vacuum degassing tank 12 which is formed in a cylindrical shape is aligned in the horizontal direction of the long axis, and is accommodated in the vacuum envelope 11. The riser 13 which is vertically aligned below one end of the vacuum degassing tank 12 and the downcomer 14 are installed below the other end. The riser 13 and the downcomer 14 are located in the vacuum enclosure 11 with a portion thereof.

其次於真空除氣槽12的上面具有多數開口,通過至少一個開口6,可由真空外罩11的外部往真空除氣槽12之內部的上部空間5導入低水分氣體7。又,真空外罩11所形成的開口8為連接至泵等之減壓手段(於圖2中未示出。圖1中以泵28示出),將充滿上部空間5的氛圍氣體3往真空外罩11外排出(所排出者以氛圍氣體3’表示),則可將真空除氣槽12的內部減壓。另外,開口6及開口8的場所,並非限定於圖2所示之開口6及開口8之場所,以開口6為設置於真空除氣槽12的上游側,開口8為設置於其下游側為佳。將構成低水分氣體導入手段之一部份的開口6設置於真空除氣槽12的上游側,則可令開口6朝向真空除氣槽12內部之上部空間5所導入的低水分氣體7,由真空除氣槽12之上游側朝向設置開口8之下游側流動,使得真空除氣槽12之內部的上部空間5可作成均勻的低水蒸氣濃度氛圍氣體。Next, a plurality of openings are formed in the upper surface of the vacuum degassing tank 12, and the low moisture gas 7 can be introduced into the upper space 5 inside the vacuum degassing tank 12 through the outside of the vacuum envelope 11 through the at least one opening 6. Further, the opening 8 formed by the vacuum envelope 11 is a decompression means (not shown in Fig. 2, shown by the pump 28 in Fig. 1) connected to a pump or the like, and the atmosphere gas 3 filled in the upper space 5 is evacuated to the vacuum envelope. When the outer discharge is 11 (the discharge is indicated by the atmosphere gas 3'), the inside of the vacuum degassing tank 12 can be decompressed. Further, the openings 6 and the openings 8 are not limited to the openings 6 and the openings 8 shown in FIG. 2, and the openings 6 are provided on the upstream side of the vacuum degassing tank 12, and the openings 8 are provided on the downstream side thereof. good. The opening 6 constituting a part of the low-moisture gas introduction means is disposed on the upstream side of the vacuum degassing tank 12, so that the opening 6 is directed toward the low-moisture gas 7 introduced into the upper space 5 inside the vacuum degassing tank 12, The upstream side of the vacuum degassing tank 12 flows toward the downstream side of the installation opening 8, so that the upper space 5 inside the vacuum degassing tank 12 can be made into a uniform low water vapor concentration atmosphere.

又,於真空除氣槽12的內部,設置可測定氛圍氣體3之壓力(P1 )及溫度(T1 )之例如公知的壓力計及溫度計(未予圖示)。Further, inside the vacuum degassing tank 12, for example, a known pressure gauge and a thermometer (not shown) capable of measuring the pressure (P 1 ) and temperature (T 1 ) of the atmosphere gas 3 are provided.

又,如圖2所示般,上升管13為與真空除氣槽12連通,將來自溶解槽20的熔融玻璃G導入真空除氣槽12的導入手段。因此,上升管13的下端部被嵌入上游坑22的開口端,並且被此上游坑22內的熔融玻璃G浸漬。Moreover, as shown in FIG. 2, the riser pipe 13 is an introduction means that communicates with the vacuum degassing tank 12 and introduces the molten glass G from the dissolution tank 20 into the vacuum degassing tank 12. Therefore, the lower end portion of the riser pipe 13 is fitted into the open end of the upstream pit 22, and is impregnated by the molten glass G in the upstream pit 22.

下降管14為連通至真空除氣槽12,係將真空除氣後的熔融玻璃G由真空除氣槽12下降並於後步驟之處理槽(未予圖示)導出的導出手段。因此,下降管14的下端部被嵌入下游坑24的開口端,並且被此下游坑24內的熔融玻璃G浸漬。The downcomer 14 is a deriving means that is connected to the vacuum degassing tank 12, and is a vacuum degassing glass G which is evacuated by the vacuum degassing tank 12 and which is led out in a processing tank (not shown) in the subsequent step. Therefore, the lower end portion of the downcomer 14 is fitted into the open end of the downstream pit 24, and is impregnated by the molten glass G in the downstream pit 24.

於真空外罩11內,於真空除氣槽12、上升管13及下降管14之周圍,配設將其隔熱覆被的隔熱用磚等之隔熱材15。In the vacuum envelope 11, a heat insulating material 15 such as a heat insulating brick which is thermally insulated and covered is disposed around the vacuum degassing tank 12, the riser pipe 13, and the down pipe 14.

於圖2所示之真空除氣裝置10中,真空除氣槽12、上升管13及下降管14為熔融玻璃G的導管,故使用對於耐熱性及熔融玻璃之耐蝕性優良的材料予以製作。若列舉一例,則為鉑或鉑合金製之中空管。鉑合金之具體例可列舉鉑-金合金、鉑-銠合金。又,若列舉另一例,則為陶瓷系之非金屬無機材料製,即,緻密質耐火物製之中空管。緻密質耐火物的具體例可列舉例如,氧化鋁系電鑄耐火物、二氧化鋯系電鑄耐火物、氧化鋁-二氧化鋯-二氧化矽系電鑄耐火物等之電鑄耐火物、及緻密質氧化鋁系耐火物、緻密質二氧化鋯-二氧化矽系耐火物及緻密質氧化鋁-二氧化鋯-二氧化矽系耐火物等之緻密質煅燒耐火物。In the vacuum degassing apparatus 10 shown in FIG. 2, since the vacuum degassing tank 12, the riser pipe 13, and the downcomer 14 are the ducts of the molten glass G, it is manufactured using the material excellent in the heat resistance and the corrosion resistance of the molten glass. When an example is given, it is a hollow tube made of platinum or a platinum alloy. Specific examples of the platinum alloy include a platinum-gold alloy and a platinum-rhodium alloy. Moreover, as another example, it is a ceramic-type non-metal inorganic material, that is, a hollow tube made of a dense refractory. Specific examples of the dense refractory include an electroformed refractory such as an alumina-based electroformed refractory, a zirconia-based electroformed refractory, or an alumina-zirconia-ceria-based electroforming refractory. And a dense calcined refractory such as a dense alumina refractory, a dense zirconium dioxide-cerium oxide refractory, and a dense alumina-zirconia-ceria-based refractory.

此類真空除氣裝置10之各構成要素的尺寸可視需要適當選擇。真空除氣槽12的尺寸,不論真空除氣槽12為鉑製或鉑合金製、或緻密質耐火物製,可根據所使用之真空除氣裝置適當選擇。圖2所示之真空除氣槽12之情況,其尺寸的具體例為如下。The size of each component of such a vacuum degassing device 10 can be appropriately selected as needed. The size of the vacuum degassing tank 12 can be appropriately selected depending on the vacuum deaerator used, regardless of whether the vacuum degassing tank 12 is made of platinum or a platinum alloy or a dense refractory. In the case of the vacuum degassing tank 12 shown in Fig. 2, specific examples of the dimensions thereof are as follows.

水平方向中的長度:1~20m內徑:0.2~3m(剖面圓形)Length in the horizontal direction: 1~20m inner diameter: 0.2~3m (cross section)

真空除氣槽12為鉑製或鉑合金製時,厚度為4mm以下為佳,且較佳為0.5~1.2mm。When the vacuum degassing tank 12 is made of platinum or a platinum alloy, the thickness is preferably 4 mm or less, and preferably 0.5 to 1.2 mm.

真空外罩11為金屬製,例如不鏽鋼製,具有可收藏真空除氣槽的形狀及尺寸。The vacuum envelope 11 is made of metal, for example, made of stainless steel, and has a shape and a size that can accommodate a vacuum degassing tank.

上升管13及下降管14不論為鉑製或鉑合金製、或緻密質耐火物製,可根據所使用之真空除氣裝置適當選擇。例如,上升管13及下降管14的尺寸為如下構成。The riser pipe 13 and the downcomer pipe 14 are made of platinum or a platinum alloy or a compact refractory, and can be appropriately selected depending on the vacuum degassing device to be used. For example, the sizes of the riser 13 and the downcomer 14 are configured as follows.

內徑:0.05~0.8m、較佳為0.1~0.6m長度:0.2~6m、較佳為0.4~4mInner diameter: 0.05 to 0.8 m, preferably 0.1 to 0.6 m Length: 0.2 to 6 m, preferably 0.4 to 4 m

上升管13及下降管14為鉑製或鉑合金製時,厚度為0.4~5mm為佳,且較佳為0.8~4mm。When the riser pipe 13 and the downcomer pipe 14 are made of platinum or a platinum alloy, the thickness is preferably 0.4 to 5 mm, and preferably 0.8 to 4 mm.

本發明之真空除氣裝置所具有的真空除氣槽例如為具備此類構成的真空除氣槽12。The vacuum degassing tank provided in the vacuum degassing apparatus of the present invention is, for example, a vacuum degassing tank 12 having such a configuration.

其次,說明關於本發明之真空除氣裝置所具有的水蒸氣濃度測定手段30。Next, the water vapor concentration measuring means 30 included in the vacuum degassing apparatus of the present invention will be described.

圖1中之水蒸氣濃度測定手段30為與真空除氣槽12的下游側以配管等連繫,並再於其下游側連繫減壓手段的泵28。經由此泵28,則可將真空除氣槽12所排出的氛圍氣體3’送往水蒸氣濃度測定手段30。由泵28所排出的氛圍氣體3’視情況予以淨化處理並且放散至大氣。The water vapor concentration measuring means 30 in Fig. 1 is a pump 28 that is connected to a downstream side of the vacuum degassing tank 12 by piping or the like, and is connected to a downstream side of the decompression means. By the pump 28, the atmosphere gas 3' discharged from the vacuum degassing tank 12 can be sent to the steam concentration measuring means 30. The atmosphere gas 3' discharged from the pump 28 is treated as it is and discharged to the atmosphere.

水蒸氣濃度測定手段30可為市售的露點計,且亦可為測定真空除氣槽12所排出之氛圍氣體3’的壓力、溫度、及氣體流量的測定手段。各個測定手段可使用例如先前公知之壓力計、溫度計、及氣體流量計。水蒸氣濃度為表示氛圍氣體全體中所含之水蒸氣量之值。The water vapor concentration measuring means 30 may be a commercially available dew point meter, and may be a measuring means for measuring the pressure, temperature, and gas flow rate of the atmosphere gas 3' discharged from the vacuum degassing tank 12. For each measurement means, for example, a previously known pressure gauge, a thermometer, and a gas flow meter can be used. The water vapor concentration is a value indicating the amount of water vapor contained in the entire atmosphere.

氛圍氣體3’之水蒸氣濃度(C)[莫耳%]可為使用市售之露點計測定,且亦可令氛圍氣體3’中所含之水析出,測定其量(W)[克]並且概算亦可。例如,將真空除氣槽12所排出之氛圍氣體3’的氣體流量視為Fout [m3 /h]、氣體流出時間視為tout [h],再將水蒸氣濃度測定手段30中計測之氛圍氣體3’的壓力及溫度視為P2 [Pa]及T2 [K]時,氛圍氣體3’中的水蒸氣濃度(C)[mol%]為以下式(1)表示。The water vapor concentration (C) [mole %] of the atmosphere gas 3' can be measured using a commercially available dew point meter, and the water contained in the atmosphere 3' can be precipitated, and the amount (W) [g] is measured. And the estimate is also possible. For example, the gas flow rate of the atmosphere gas 3' discharged from the vacuum degassing tank 12 is regarded as F out [m 3 /h], the gas outflow time is regarded as t out [h], and the water vapor concentration measuring means 30 is measured. When the pressure and temperature of the atmosphere gas 3' are regarded as P 2 [Pa] and T 2 [K], the water vapor concentration (C) [mol%] in the atmosphere gas 3' is represented by the following formula (1).

式(1)所算出之水蒸氣濃度為60mol%以下,則可在不會發生突沸下進行熔融玻璃的真空除氣,達到不會產生因玻璃製品突沸殘存氣泡所發生的缺陷之效果。When the water vapor concentration calculated by the formula (1) is 60 mol% or less, the vacuum degassing of the molten glass can be performed without causing ablation, and the effect of causing no defects due to bubbles remaining in the glass product can be obtained.

各個單位為如下。The individual units are as follows.

C:mol%、W:g、T2 :K、P2 :Pa、Fout :m3 /h、tout :h、R(氣體常數):J.K/molC: mol%, W: g, T 2 : K, P 2 : Pa, F out : m 3 /h, t out : h, R (gas constant): J. K/mol

其次,說明關於本發明之真空除氣裝置所具有的低水分氣體導入手段40。Next, the low-moisture gas introduction means 40 of the vacuum degassing apparatus of the present invention will be described.

圖1中低水分氣體導入手段40為與真空除氣槽12的上游側以配管等連繫。其次,通過此配管等,可由低水分氣體導入手段40導入低水分氣體7。The low-moisture gas introduction means 40 in Fig. 1 is connected to a pipe or the like on the upstream side of the vacuum degassing tank 12. Then, the low-moisture gas 7 can be introduced by the low-moisture gas introduction means 40 by the piping or the like.

低水分氣體導入手段40為例如如圖1所示般,將低水分氣體發生裝置41與真空除氣槽12以配管等連繫,可將低水分氣體生裝置41所發生的低水分氣體7導入真空除氣槽12的上部空間5。其次,於低水分氣體發生裝置41至真空除氣槽12為止之間,依序具備流量控制閥42及流量計44,可藉其調整低水分氣體7的導入量。In the low-moisture gas introduction means 40, for example, the low-moisture gas generating device 41 and the vacuum degassing tank 12 are connected by piping or the like, and the low-moisture gas 7 generated by the low-moisture gas generating device 41 can be introduced. The upper space 5 of the vacuum degassing tank 12. Next, between the low-moisture gas generating device 41 and the vacuum degassing tank 12, a flow rate control valve 42 and a flow meter 44 are sequentially provided, whereby the introduction amount of the low-moisture gas 7 can be adjusted.

另外,流量控制閥42及流量計44的配置亦可相反。In addition, the arrangement of the flow control valve 42 and the flow meter 44 may be reversed.

此處,低水分氣體導入手段40亦可具有將低水分氣體7往真空除氣槽12的上部空間5積極導入的導入手段(例如,高壓扇等)。此時,因為可將低水分氣體7有效導入上部空間5故為佳。Here, the low-moisture gas introduction means 40 may have an introduction means (for example, a high-pressure fan or the like) for actively introducing the low-moisture gas 7 into the upper space 5 of the vacuum degassing tank 12. At this time, since the low-moisture gas 7 can be efficiently introduced into the upper space 5, it is preferable.

又,若使用大氣作為低水分氣體7,則不必要上述的低水分氣體發生裝置41。例如連繫上部空間5的配管等之一端為經由流量控制閥42的開閉而於大氣中開放,大氣為透過此配管減壓並且導入上部空間5即可。Moreover, when the atmosphere is used as the low-moisture gas 7, the above-described low-moisture gas generator 41 is unnecessary. For example, one of the pipes connecting the upper space 5 and the like is opened in the atmosphere via the opening and closing of the flow rate control valve 42, and the atmosphere may be decompressed through the pipe and introduced into the upper space 5.

又,使用大氣以外之例如惰性氣體等作為低水分氣體7時,上述之水蒸氣濃度測定手段30以具有可測定上部空間5所排出之氛圍氣體3’之氣體成份的氣體成份測定計為佳。In addition, when the inert gas or the like other than the atmosphere is used as the low-moisture gas 7, the above-described water vapor concentration measuring means 30 is preferably a gas component measuring instrument having a gas component capable of measuring the atmospheric gas 3' discharged from the upper space 5.

另外,本發明中所謂的低水分氣體,係意指比上部空間5中之氛圍氣體3更低水分(水蒸氣濃度)的氣體。低水分氣體可列舉大氣、乾燥空氣、N2 和Ar般之惰性氣體等,可僅為一種,且亦可多數種類。低水分氣體的水蒸氣濃度為0~20mol%為佳,以0~5mol%為更佳,且以0~1mol%為再佳。另外,低水分氣體的水蒸氣濃度可使用市售的露點計等加以測定。Further, the term "low moisture gas" as used in the present invention means a gas having a lower moisture (water vapor concentration) than the atmosphere gas 3 in the upper space 5. Examples of the low moisture gas include air, dry air, inert gas such as N 2 and Ar, and the like, and may be one type or plural types. The water vapor concentration of the low moisture gas is preferably 0 to 20 mol%, more preferably 0 to 5 mol%, and further preferably 0 to 1 mol%. Further, the water vapor concentration of the low moisture gas can be measured using a commercially available dew point meter or the like.

本發明之真空除氣裝置為例如具有此類真空除氣槽12與水蒸氣濃度測定手段30與低水分氣體導入手段40的真空除氣裝置1。The vacuum degassing device of the present invention is, for example, a vacuum degassing device 1 having such a vacuum degassing tank 12, a water vapor concentration measuring means 30, and a low moisture gas introducing means 40.

於此類本發明之真空除氣裝置中,以水蒸氣濃度測定手段測定上部空間中的氛圍氣體水蒸氣濃度,並且在比所欲之水蒸氣濃度更高時,以低水分氣體導入手段導入低水分氣體,適當重複調整,則可將上部空間中的氛圍氣體水蒸氣濃度調整至所欲之濃度。In the vacuum degassing apparatus of the present invention, the concentration of the ambient gas water vapor in the upper space is measured by the water vapor concentration measuring means, and when the concentration is higher than the desired water vapor concentration, the low moisture gas introduction means is introduced low. The moisture gas can be adjusted to the desired concentration in the upper space by appropriately repeating the adjustment.

例如上述式(1)所求出之水蒸氣濃度(C),與目標水蒸氣濃度(C1 )為具有下式(2)之關係,故在調整低水分氣體對於上部空間的導入量(Fin )及導入時間(tin )、氛圍氣體由上部空間的排出量(Fout )及排出時間(tout ),及低水分氣體的水蒸氣濃度(S)[mol%]下,則可將水蒸氣濃度作成目標值。For example, the water vapor concentration (C) obtained by the above formula (1) and the target water vapor concentration (C 1 ) have the relationship of the following formula (2), so that the introduction amount of the low moisture gas into the upper space is adjusted (F) In ) and the introduction time (t in ), the amount of ambient gas discharged from the upper space (F out ) and the discharge time (t out ), and the water vapor concentration (S) [mol%] of the low moisture gas, The water vapor concentration is set to a target value.

各記號之意義及單位如下:C1 :[mol%]、V(上部空間的容積):[m3 ]、Vin :[m3 ]、Vout :[m3 ]The meaning and unit of each mark are as follows: C 1 : [mol%], V (volume of the upper space): [m 3 ], V in : [m 3 ], V out : [m 3 ]

此處,Vin 為以流量計44所測定之導入量(Fin [m3 /h])與導入時間(tin [h])所求出之導入氣體體積(Fin ×tin )[m3 ]之上部空間的溫度及壓力的換算量。同樣地,Vout 為以水蒸氣濃度測定手段30所含之流量計所測定之排出量(Fout 〔m3 /h〕)與排出時間(tout 〔h〕)所求出之排出氣體體積(Fout ×tout )〔m3 〕之上部空間的溫度及壓力的換算值。Here, V in is the introduced gas volume (F in ×t in ) obtained by the introduction amount (F in [m 3 /h]) and the introduction time (t in [h]) measured by the flow meter 44 [ m 3 ] The amount of temperature and pressure converted in the upper space. Similarly, V out is the discharge gas volume determined by the discharge amount (F out [m 3 /h]) and the discharge time (t out [h]) measured by the flow meter included in the water vapor concentration measuring means 30. (F out ×t out ) [m 3 ] The converted value of the temperature and pressure in the upper space.

又,令上部空間的壓力保持一定時,必須Vin =VoutAlso, when the pressure in the upper space is kept constant, V in = V out must be used.

例如,令體積(V)=1m3 之上部空間的水蒸氣濃度(C)=20mol%減低至目標之水蒸氣濃度(C1 )=10mol%,於Vin =Vout 時,低水分氣體的導入量(Vin )=0.53m3For example, the water vapor concentration (C) = 20 mol% in the upper space of the volume (V) = 1 m 3 is reduced to the target water vapor concentration (C 1 ) = 10 mol%, and when V in = V out , the low moisture gas The amount of introduction (V in ) = 0.53 m 3 .

因此,上部空間之溫度(T1 )=1673K、壓力(P1 )=25kPa時,流量計44位置的導入氣體溫度(T3 )=298K、壓力(P3 )=101kPa,則導入氣體體積(Fin ×tin )為0.023[m3 ]。Therefore, when the temperature of the upper space (T 1 )=1673K and the pressure (P 1 )=25 kPa, the introduction gas temperature (T 3 )=298K and the pressure (P 3 )=101 kPa at the position of the flow meter 44 introduce the gas volume ( F in × t in ) is 0.023 [m 3 ].

實際上,因為引起來自熔融玻璃及裝置構成材料等之水分蒸發,或因漏氣而引起水蒸氣濃度之變化,故必須不斷進行調整。Actually, since the water from the molten glass and the constituent material of the device evaporates or the water vapor concentration changes due to the air leakage, it is necessary to continuously adjust.

另外,於玻璃製品的製造中,經常監視此水蒸氣濃度,並且加以控制為佳。具體而言,於前述真空除氣裝置,具有可將前述氛圍氣體的水蒸氣濃度控制於所欲值的水蒸氣濃度控制手段為佳,且進一步具有根據來自前述控制手段之信號控制低水分氣體之導入量的氣體量控制手段為佳。In addition, in the manufacture of glass products, this water vapor concentration is often monitored and controlled. Specifically, it is preferable that the vacuum degassing device has a water vapor concentration control means capable of controlling a water vapor concentration of the atmosphere gas to a desired value, and further has a method of controlling a low moisture gas based on a signal from the control means. The amount of gas to be introduced is preferably controlled.

例如,令本發明之真空除氣裝置具有恆定測定T2 、P2 、Fout 、tout 、W2 、S、Fin 及tin ,並將此些數據收集於電腦,根據此電腦將上部空間的水蒸氣濃度控制於所欲值的水蒸氣濃度控制手段為佳。又,令本發明之真空除氣裝置具有以此電腦控制流量控制閥42的開閉,再將流量計44的數據輸入此電腦的氣體量控制手段為佳。更且,為了將生產性能保持一定,期望一邊控制於所欲之壓力一邊調整流量。For example, the vacuum degassing device of the present invention has constant measurements T 2 , P 2 , F out , t out , W 2 , S, F in and t in , and collects such data on a computer, according to which the computer will be upper It is preferred that the water vapor concentration of the space is controlled to a desired value of the water vapor concentration. Further, it is preferable that the vacuum deaerator of the present invention has a gas amount control means for controlling the opening and closing of the flow rate control valve 42 by this computer and inputting the data of the flow meter 44 to the computer. Moreover, in order to keep the production performance constant, it is desirable to adjust the flow rate while controlling the desired pressure.

本發明之玻璃製造方法使用此類本發明之真空除氣裝置進行為佳,但亦可應用其他方法。例如,並非必要如本發明之真空除氣裝置於真空除氣槽內的上部空間導入氣體,於真空除氣槽內與真空外罩內之氛圍氣連接時,若減低真空外罩內的氣體水蒸氣濃度即可。The glass manufacturing method of the present invention is preferably carried out using such a vacuum degassing device of the present invention, but other methods may be applied. For example, it is not necessary to introduce a gas into the upper space in the vacuum degassing tank according to the vacuum degassing device of the present invention, and to reduce the concentration of the gas water vapor in the vacuum envelope when the vacuum degassing tank is connected to the atmosphere in the vacuum enclosure. Just fine.

於本發明之玻璃製造方法中,真空除氣處理條件若為通常之範圍則無特別限定。所謂通常之真空減壓條件,係指真空除氣槽內部之上部空間中氛圍氣體的壓力(P1 )為38~460mmHg(51~613hPa),且溫度(T1 )為1100℃~1500℃,特別為1250℃~1450℃進行真空除氣處理的處理條件。In the glass production method of the present invention, the vacuum degassing treatment conditions are not particularly limited as long as they are in the usual range. The normal vacuum decompression condition means that the pressure (P 1 ) of the atmosphere in the upper space inside the vacuum degassing tank is 38 to 460 mmHg (51 to 613 hPa), and the temperature (T 1 ) is 1100 ° C to 1500 ° C. In particular, the treatment conditions for vacuum degassing treatment are carried out at 1250 ° C to 1450 ° C.

本發明之玻璃製造方法所具備之本發明的真空除氣步驟中,令真空除氣槽內部之氛圍氣體的水蒸氣濃度為60mol%以下。若為如此,則可在所謂不會發生突沸下於真空條件下進行熔融玻璃中之氣泡的除氣。In the vacuum degassing step of the present invention provided in the glass production method of the present invention, the water vapor concentration of the atmosphere inside the vacuum degassing tank is 60 mol% or less. If so, the degassing of the bubbles in the molten glass can be carried out under vacuum conditions without causing a sudden boiling.

又,此水蒸氣濃度愈低則泡層有變薄的傾向,故真空除氣槽內部之氛圍氣體的水蒸氣濃度為50mol%以下為佳,且以40mol%以下為更佳。若水蒸氣濃度為30mol%以下,則泡層有變得更薄的傾向,故為不佳。又,根據玻璃組成,一個一個氣泡有時收縮或破泡,如此令泡層變得更薄,故為佳。更且,因為難殘存被視為玻璃製品缺陷程度大小的氣泡故為佳。若進一步降低此水蒸氣濃度,則玻璃製品產生缺陷的或然率更低故為佳,以25mol%以下為較佳,以20mol%以下為更佳,以15mol%以下為再佳,以10mol%以下為再更佳,且以5mol%以下為最佳。Further, the lower the water vapor concentration, the smaller the foam layer tends to be. Therefore, the water vapor concentration of the atmosphere inside the vacuum degassing tank is preferably 50 mol% or less, and more preferably 40 mol% or less. When the water vapor concentration is 30 mol% or less, the foam layer tends to be thinner, which is not preferable. Further, depending on the glass composition, one bubble sometimes shrinks or breaks, so that the bubble layer becomes thinner, so it is preferable. Further, it is preferable that it is difficult to remain a bubble which is considered to be a defect in the degree of defects in the glass product. When the water vapor concentration is further lowered, the probability of occurrence of defects in the glass product is preferably lower, preferably 25 mol% or less, more preferably 20 mol% or less, still more preferably 15 mol% or less, and 10 mol% or less. More preferably, it is preferably 5 mol% or less.

又,本發明者為除了上述,加上發現此類氣泡的收縮為在特定組成之熔融玻璃特別顯著表現的現象。Further, the present inventors have found that, in addition to the above, the shrinkage of such bubbles is found to be particularly remarkable in the molten glass of a specific composition.

具體而言,熔融玻璃為全矽酸鹽玻璃時,若水蒸氣濃度為30mol%以下,則氣泡有顯著收縮的傾向。因此,本發明之玻璃製造方法,本發明之真空除氣裝置及本發明之水分調整方法為在製造全矽酸鹽玻璃時更佳使用。Specifically, when the molten glass is total tellurite glass, if the water vapor concentration is 30 mol% or less, the bubbles tend to shrink significantly. Therefore, the glass manufacturing method of the present invention, the vacuum degassing apparatus of the present invention and the moisture adjusting method of the present invention are more preferably used in the production of perrhensilicate glass.

此處所謂的全矽酸鹽玻璃為如下之組成。The so-called total tellurite glass here has the following composition.

組成之範圍:SiO2 :55~74、Al2 O3 :10~20、B2 O3 :5~12、Al2 O3 /B2 O3 :1.5~3、MgO:0~5、CaO:0~5、SrO:0~12、BaO:0~12、SrO+BaO:6~12(單位為質量%)。Composition range: SiO 2 : 55 to 74, Al 2 O 3 : 10 to 20, B 2 O 3 : 5 to 12, Al 2 O 3 / B 2 O 3 : 1.5 to 3, MgO: 0 to 5, CaO : 0~5, SrO: 0~12, BaO: 0~12, SrO+BaO: 6~12 (unit is mass%).

於先前雖已提示較佳之真空除氣槽內的壓力、溫度條件,並無關於水蒸氣濃度的檢討例。本發明者為對於即使以先前提示之真空除氣條件進行除氣,亦會突沸、泡層肥大化之原因進行致力檢討,並且著眼於先前未著眼的水蒸氣濃度,發現可解決此類問題。There has been no review of the water vapor concentration in the pressure and temperature conditions in the vacuum degassing tank which has been suggested above. The present inventors have made efforts to review the cause of sudden boiling and bubble layer hypertrophy even if degassing under the previously suggested vacuum degassing condition, and have found that the problem can be solved by focusing on the previously unfocused water vapor concentration.

又,本發明者亦發現令水蒸氣濃度為60mol%以下,則可達到抑制熔融玻璃中之特定成份(硼等)揮散的效果。經由抑制硼等成份的揮發,則可防止硼等的組成變動,並且可抑制起因於組成變動的平坦度惡化。Moreover, the present inventors have found that when the water vapor concentration is 60 mol% or less, the effect of suppressing the volatilization of a specific component (boron or the like) in the molten glass can be achieved. By suppressing the volatilization of a component such as boron, the composition fluctuation of boron or the like can be prevented, and the deterioration of the flatness due to the composition variation can be suppressed.

又,易揮發之成份,例如,Cl、F、S等之揮散亦可抑制,故可防止此等成份的組成變動,並且可抑制起因於組成變動的平坦度惡化。Further, the volatile component, for example, the volatilization of Cl, F, S or the like can be suppressed, so that the composition variation of these components can be prevented, and the deterioration of the flatness due to the composition variation can be suppressed.

此些Cl、F、S等成份大受水分揮發所影響。例如,F為以HF型式、S為以H2 SO4 型式揮發。因此,令真空除氣槽內之水分濃度為某一定份量以下,則可抑制水分揮發所伴隨之揮散上述成份的變動。These Cl, F, S and other components are greatly affected by water volatilization. For example, F is in the HF type and S is in the H 2 SO 4 type. Therefore, when the water concentration in the vacuum degassing tank is equal to or less than a certain amount, the fluctuation of the above-mentioned components accompanying the evaporation of water can be suppressed.

又,玻璃的特性為根據其用途而存在非常細的規格,並且以合適此規格般取代決定非常詳細的玻璃組成。例如,關於硼的含量亦存在當然的規格,但於先前之方法中,因為硼揮散,故必須使用許多硼作為原料。又,以往,硼的揮散量為根據條件而異,視情況,硼含量之規格有超出的可能性。於本發明中,解決此類問題,為有用的。Further, the characteristics of the glass are very fine specifications depending on the use thereof, and a glass composition having a very detailed structure is appropriately substituted for such a specification. For example, there is of course a specification regarding the content of boron, but in the prior method, since boron is volatilized, it is necessary to use a large amount of boron as a raw material. Further, conventionally, the amount of boron to be volatilized varies depending on conditions, and as the case may be, the specification of the boron content may exceed. In the present invention, it is useful to solve such problems.

由此點而言,本發明之玻璃製造方法,本發明之真空除氣裝置及本發明之水分調整方法當然不使可使用於普通之玻璃,且特別於製造全矽酸鹽玻璃時為較佳使用。From this point of view, the glass manufacturing method of the present invention, the vacuum degassing device of the present invention and the moisture adjusting method of the present invention are of course not preferred for use in ordinary glass, and particularly for the production of perrhenate glass. use.

又,於本發明中,朝向真空除氣槽內部之上部空間導入的低水分氣體,其氧濃度為比空氣中之氧濃度更低的氣體為佳。此氧濃度為15體積%以下為佳,且以10體積%為更佳,以5體積%以下為再佳。又,前述低水分氣體為不含有氧之氣體,例如N2 氣體、Ar氣體、CO2 等為佳。Further, in the present invention, the low moisture gas introduced into the upper space inside the vacuum degassing tank preferably has a lower oxygen concentration than the oxygen concentration in the air. The oxygen concentration is preferably 15% by volume or less, more preferably 10% by volume, and even more preferably 5% by volume or less. Further, the low moisture gas is preferably a gas containing no oxygen, such as N 2 gas, Ar gas, CO 2 or the like.

朝向前述上部空間導入之前述低水分氣體的氧濃度若為此類值,則可如上述之泡層薄層化,加上使用鉑或鉑合金作為真空除氣槽之材質時,可抑制其鉑氧化,延長真空除氣槽之壽命,更且,於玻璃製品中,可抑制來自此鉑之缺陷生成,故為佳。When the oxygen concentration of the low-moisture gas introduced into the upper space is such a value, the foam layer can be thinned as described above, and when platinum or a platinum alloy is used as the material of the vacuum degassing tank, the platinum can be suppressed. Oxidation, prolonging the life of the vacuum degassing tank, and further suppressing the formation of defects from the platinum in the glass product is preferable.

如上述,本發明之玻璃製造方法為具備本發明之真空除氣步驟,且具備原料熔融步驟及成形步驟作為前步驟及後步驟為佳。此原料熔融步驟例如可為先前公知之步驟,例如根據玻璃之種類於約1400℃以上加熱令原料熔融之步驟。所使用之原材料亦若適於所製造玻璃的原材料,則無特別限定,例如可使用將矽酸、硼酸、石灰石等之先前公知物質配合最終玻璃製品之組成所調合的原材料。此原材料亦可含有所欲的澄清劑。又,此成形步驟例如可為先前公知步驟,可列舉例如浮成形步驟、滾出成形步驟、熔合成形步驟等。As described above, the glass production method of the present invention is preferably provided with the vacuum degassing step of the present invention, and includes a raw material melting step and a forming step as the pre-step and the post-step. This raw material melting step can be, for example, a previously known step, for example, a step of melting the raw material by heating at about 1400 ° C or more depending on the type of glass. The raw material to be used is not particularly limited as long as it is suitable for the raw material of the glass to be produced. For example, a raw material obtained by blending a previously known substance such as tannic acid, boric acid or limestone with a composition of the final glass product can be used. This raw material may also contain the desired clarifying agent. Further, the forming step may be, for example, a previously known step, and examples thereof include a float forming step, a roll-out forming step, a melt forming step, and the like.

實施例Example

以下,根據實施例具體說明本發明。但,本發明不被其所限定。Hereinafter, the present invention will be specifically described based on examples. However, the invention is not limited thereto.

<實施例1>為了令實施真空除氣的氛圍氣再現,乃將放入玻璃原料的鉑製坩堝配置於真空減壓容器內。將坩堝加熱令玻璃熔融,令熔融玻璃的溫度為1420℃。其後,真空減壓容器內的絕對壓力為26.7kPa。<Example 1> In order to reproduce an atmosphere which was subjected to vacuum degassing, a platinum crucible containing a glass raw material was placed in a vacuum decompression vessel. The crucible was heated to melt the glass so that the temperature of the molten glass was 1420 °C. Thereafter, the absolute pressure in the vacuum decompression vessel was 26.7 kPa.

此處,所用之玻璃原料組成為如下。Here, the composition of the glass raw materials used is as follows.

SiO2 :59.4%、Al2 O3 :17.6%、B2 O3 :7.9%、MgO:3.2%、CaO:3.7%、SrO:7.9%、BaO:0.1%。SiO 2 : 59.4%, Al 2 O 3 : 17.6%, B 2 O 3 : 7.9%, MgO: 3.2%, CaO: 3.7%, SrO: 7.9%, and BaO: 0.1%.

另外,實施例1~3為使用放入熔融玻璃的鉑製坦堝代替圖1中的真空除氣槽12進行實驗,此坩堝的實驗結果可視為與圖1中之真空除氣槽12的結果同等。Further, Examples 1 to 3 were carried out by using a platinum tantalum placed in molten glass instead of the vacuum degassing tank 12 in Fig. 1, and the experimental results of this crucible can be regarded as the result of the vacuum degassing tank 12 in Fig. 1. Equivalent.

其次,將調整至所欲水蒸氣濃度的大氣導入上述真空減壓容器內,令真空減壓容器內之氛圍氣的水蒸氣濃度(mol%)以各式各樣的數值變化調整。關於各個水蒸氣濃度,由真空減壓裝置中所設置的觀察窗使用CCD相機攝影熔融玻璃中的氣泡。經過30分鐘後,令坩堝內的熔融玻璃急冷固化,測定固化後樣品中存在的氣泡(計數直徑100μm以上者)的數目並求出氣泡密度(個/kg)。此處,熔融玻璃的質量為5.0kg,減壓前之玻璃中的氣泡數為於各個水蒸氣濃度之情況為大約相同值。Next, the atmosphere adjusted to the desired water vapor concentration is introduced into the vacuum decompression vessel, and the water vapor concentration (mol%) of the atmosphere in the vacuum decompression vessel is adjusted in various numerical values. Regarding the respective water vapor concentrations, bubbles in the molten glass were photographed using a CCD camera from an observation window provided in the vacuum decompression device. After 30 minutes passed, the molten glass in the crucible was quenched and solidified, and the number of bubbles (counting diameters of 100 μm or more) present in the sample after curing was measured, and the bubble density (number/kg) was determined. Here, the mass of the molten glass is 5.0 kg, and the number of the bubbles in the glass before the pressure reduction is about the same value in the case of the respective water vapor concentrations.

結果示於圖3。The results are shown in Figure 3.

由圖3確認,真空減壓容器內之氛圍氣的水蒸氣濃度愈高,則氣泡愈殘存。於圖3中,橫軸為表示氛圍氣的水蒸氣(水分)濃度,縱軸為以Log表示氣泡數之值。It is confirmed from Fig. 3 that the higher the water vapor concentration of the atmosphere in the vacuum decompression container, the more the bubbles remain. In FIG. 3, the horizontal axis represents the water vapor (moisture) concentration of the atmosphere, and the vertical axis represents the value of the number of bubbles represented by Log.

另外,水蒸氣濃度為超過60mol%時,以CCD相機觀察時熔融玻璃界面急劇上升,發生所謂的突沸現象。Further, when the water vapor concentration is more than 60 mol%, the interface of the molten glass sharply rises when observed by a CCD camera, and a so-called sudden boiling phenomenon occurs.

<實施例2>其次,使用與上述實施例1同樣之裝置,令真空減壓容器內之氛圍氣的水蒸氣濃度為70mol%、47mol%、31mol%、3mol%測定泡層之厚度。更且,實施例1中大氣之低水分氣體為N2 、CO2 、Ar,且真空減壓容器內之氛圍氣的水蒸氣濃度分別未滿1mol%,進行同樣之試驗。玻璃組成為與實施例1相同。<Example 2> Next, the thickness of the bubble layer was measured using the apparatus similar to the above-mentioned Example 1, and the water vapor density of the atmosphere in the vacuum pressure reduction container was 70 mol%, 47 mol%, 31 mol%, and 3 mol%. Further, in the first embodiment, the low-moisture gas in the atmosphere was N 2 , CO 2 , and Ar, and the water vapor concentration in the atmosphere in the vacuum decompression vessel was less than 1 mol%, respectively, and the same test was carried out. The glass composition was the same as in Example 1.

結果示於表1。The results are shown in Table 1.

如此,若水蒸氣濃度為70mol%則泡層的厚度為20mm以上,確認所謂的突沸。又,若水蒸氣濃度為3~47mol%,雖形成1~2mm左右厚度之泡層,但未確認突沸。更且,若氛圍氣為N2 、CO2 或Ar(水蒸氣濃度為未滿1mol%),則不產生泡層。由上述之結果,水蒸氣濃度必須為60mol%以下。又,泡層的厚度為15mm以下左右為佳。As described above, when the water vapor concentration is 70 mol%, the thickness of the bubble layer is 20 mm or more, and the so-called sudden boiling is confirmed. Further, when the water vapor concentration is 3 to 47 mol%, a bubble layer having a thickness of about 1 to 2 mm is formed, but no sudden boiling is confirmed. Further, if the atmosphere is N 2 , CO 2 or Ar (the water vapor concentration is less than 1 mol%), no bubble layer is formed. From the above results, the water vapor concentration must be 60 mol% or less. Further, the thickness of the bubble layer is preferably about 15 mm or less.

<實施例3>於實施例2同樣之試驗中,測定各種氛圍氣之泡層內的氣泡收縮速度。此處,熔融玻璃為使用與實施例1同樣之矽酸鹽玻璃。<Example 3> In the same test as in Example 2, the bubble shrinkage rate in the bubble layer of various atmospheres was measured. Here, the molten glass was the same as the silicate glass of Example 1.

結果示於圖4。另外,於圖4之泡徑為示出規格化之值。所謂規格化,係指熔融玻璃內部之氣泡上升到達泡層時之氣泡徑相對於各時間的氣泡徑之比。因此,氣泡到達泡層時為經過時間Os,此時之泡徑為1.0。The results are shown in Figure 4. In addition, the bubble diameter in FIG. 4 is a value which shows normalization. The term "normalization" refers to the ratio of the diameter of the bubble in the interior of the molten glass reaching the bubble layer to the diameter of the bubble at each time. Therefore, when the bubble reaches the bubble layer, the elapsed time Os is obtained, and the bubble diameter at this time is 1.0.

由圖4,相對於水蒸氣濃度為31mol%之大氣情形,水蒸氣濃度為3mol%之大氣,及水蒸氣濃度為1mol%以下之N2 、CO2 或Ar之情形為氣泡收縮速度變快。4, in the case of an atmosphere having a water vapor concentration of 31 mol%, an atmosphere having a water vapor concentration of 3 mol%, and a water vapor concentration of 1 mol% or less of N 2 , CO 2 or Ar, the bubble shrinkage speed is increased.

由此結果,判知氛圍氣中之水蒸氣濃度愈低則氣泡愈易收縮,即氣泡易消失且佳。As a result, it is judged that the lower the water vapor concentration in the atmosphere, the more easily the bubble shrinks, that is, the bubble easily disappears.

<實施例4>其次,經由真空除氣處理令氣泡浮上至熔融玻璃表面且其後破泡、消滅的樣子,以各種氛圍氣水蒸氣濃度(1mol%、9mol%、13mol%、19mol%、22mol%、35mol%、70mol%)及玻璃組成(鹼石灰玻璃:組成A、組成B、組成C)測定。此處,使用50cc之透明石英玻璃燒杯作為容器以觀察氣泡的樣子,並且測定約50克玻璃溶解時的泡層厚度。又,以CCD相機觀察熔融玻璃表面浮起之氣泡數(Bs個)及到達熔融玻璃表面且破泡、消滅之泡數(BB 個)並且計數,算出破泡率之值(BB /BS %)。泡層之厚度(mm)及破泡率(%)示於下述表2。<Example 4> Next, the bubble was floated up to the surface of the molten glass by vacuum degassing treatment, and then foamed and destroyed, and the water vapor concentration (1 mol%, 9 mol%, 13 mol%, 19 mol%, 22 mol) was used in various atmospheres. %, 35 mol%, 70 mol%) and glass composition (soda lime glass: composition A, composition B, composition C) were measured. Here, a 50 cc transparent quartz glass beaker was used as a container to observe the appearance of the bubbles, and the thickness of the bubble layer when about 50 g of the glass was dissolved was measured. Further, the number of bubbles (Bs) floating on the surface of the molten glass and the number of bubbles (B B ) which reached the surface of the molten glass and broke and disappeared were counted by a CCD camera, and the value of the bubble breaking rate (B B /B) was calculated. S %). The thickness (mm) of the foam layer and the foam breaking rate (%) are shown in Table 2 below.

另外,任何樣品均將熔融玻璃之溫度於1200℃中加熱。容器內的絕對壓力於組成A之情況為18.7kPa、組成B之情況為10.3kPa、組成C之情況為14.4kPa。又,組成A、組成B、組成C中各成份的含有率為如下述表3中所示。表3中之%為表示質量%。In addition, any sample heated the temperature of the molten glass at 1200 °C. The absolute pressure in the container was 18.7 kPa in the case of composition A, 10.3 kPa in the case of composition B, and 14.4 kPa in the case of composition C. Further, the content ratios of the components A in the composition A, the composition B, and the composition C are as shown in Table 3 below. The % in Table 3 indicates the mass %.

由表2確認,容器內之氛圍氣的水蒸氣濃度愈高則破泡率愈低,且殘存氣泡。具體而言,若氛圍氣之水蒸氣濃度為超過60mol%,則泡層為20mm以上之厚度,若為60mol%以下則可確認泡層變薄。另外,水蒸氣濃度為超過60mol%時,以CCD相機觀察時熔融玻璃界面急劇上升,發生所謂的突沸現象。又,容器內之氛圍氣的水蒸氣濃度為未滿15mol%時,破泡率變高,可知為佳。即,若容器內之氛圍氣的水蒸氣濃度為60mol%以下,則可防止突沸現象且泡層可變薄,並且若前述水蒸氣濃度進一步降低,則得知破泡率變高且氣泡消滅。It is confirmed from Table 2 that the higher the water vapor concentration of the atmosphere in the container, the lower the bubble breaking rate and the remaining bubbles. Specifically, when the water vapor concentration of the atmosphere is more than 60 mol%, the foam layer has a thickness of 20 mm or more, and when it is 60 mol% or less, it is confirmed that the bubble layer is thin. Further, when the water vapor concentration is more than 60 mol%, the interface of the molten glass sharply rises when observed by a CCD camera, and a so-called sudden boiling phenomenon occurs. Moreover, when the water vapor concentration of the atmosphere in the container is less than 15 mol%, the foam breaking rate is high, and it is known that it is preferable. In other words, when the water vapor concentration of the atmosphere in the container is 60 mol% or less, the phenomenon of bumping can be prevented and the bubble layer can be made thin, and if the water vapor concentration is further lowered, the bubble breaking rate is increased and the bubbles are eliminated.

[產業上之可利用性][Industrial availability]

本發明可應用於具備熔融玻璃之真空除氣裝置及真空除氣步驟的玻璃製造方法,且特別適於氣泡少之高品質顯示用玻璃的製造。The present invention can be applied to a glass manufacturing method including a vacuum degassing device for molten glass and a vacuum degassing step, and is particularly suitable for the production of high quality display glass having few bubbles.

另外,2006年8月30日所申請之日本專利申請2006-233441號說明書、申請專利範圍、圖面及摘要的全部內容於此處引用,且以本發明說明書之揭示型式倂入。In addition, the entire contents of the specification, the patent application, the drawings and the abstract of the Japanese Patent Application No. 2006-233441, filed on August 30, 2006, are hereby incorporated by reference.

1...真空除氣裝置1. . . Vacuum degassing device

3...氛圍氣體3. . . Atmosphere gas

3’...所排出之氛圍氣體3’. . . Exhausted atmosphere

5...上部空間5. . . Upper space

6...開口6. . . Opening

7...低水分氣體7. . . Low moisture gas

8...開口8. . . Opening

9...開口9. . . Opening

10...真空除氣裝置10. . . Vacuum degassing device

11...真空外罩11. . . Vacuum cover

12...真空除氣槽12. . . Vacuum degassing tank

13...上升管13. . . Riser

14...下降管14. . . Drop tube

15...隔熱材15. . . Insulation material

20...溶解槽20. . . Dissolution tank

22...上流坑twenty two. . . Upflow pit

23...下流坑twenty three. . . Downflow pit

28...泵28. . . Pump

30...水蒸氣濃度測定手段30. . . Water vapor concentration measuring means

40...低水分氣體導入手段40. . . Low moisture gas introduction means

41...低水分氣體發生裝置41. . . Low moisture gas generating device

42...流量控制閥42. . . Flow control valve

44...流量計44. . . Flow meter

G...溶解玻璃G. . . Dissolved glass

圖1為示出本發明之真空除氣裝置之一構成例的圖。Fig. 1 is a view showing a configuration example of a vacuum degassing apparatus of the present invention.

圖2為示出本發明之真空除氣裝置等圖。Fig. 2 is a view showing a vacuum degassing apparatus and the like of the present invention.

圖3為示出本發明之實施例1之結果圖。Fig. 3 is a view showing the result of Example 1 of the present invention.

圖4為示出本發明之實施例3之結果圖。Fig. 4 is a view showing the result of Example 3 of the present invention.

Claims (10)

一種玻璃之製造方法,其特徵為具備,藉由往真空除氣(vacuum degassing)槽之氛圍氣體導入低水分氣體,前述氛圍氣體之水蒸氣濃度為60mol%以下,使熔融玻璃(molten glass)真空除氣之步驟。 A method for producing a glass, comprising: introducing a low-moisture gas into an atmosphere gas in a vacuum degassing tank, wherein a water vapor concentration of the atmosphere gas is 60 mol% or less, and vacuuming the molten glass The step of degassing. 如申請專利範圍第1項之玻璃之製造方法,前述低水分(low moisture content)氣體為氮氣、氬氣、二氧化碳或大氣。 The method for producing a glass according to claim 1, wherein the low moisture content gas is nitrogen, argon, carbon dioxide or the atmosphere. 如申請專利範圍第1或2項之玻璃之製造方法,其中使該氛圍氣體之水蒸氣濃度為30mol%以下。 The method for producing a glass according to claim 1 or 2, wherein the ambient gas has a water vapor concentration of 30 mol% or less. 如申請專利範圍第1或2項之玻璃之製造方法,其中該低水分氣體之氧濃度(體積%)低於空氣中氧濃度(體積%)。 The method for producing a glass according to claim 1 or 2, wherein an oxygen concentration (% by volume) of the low moisture gas is lower than an oxygen concentration (% by volume) in the air. 如申請專利範圍第4項之玻璃之製造方法,其中該低水分氣體之氧濃度(體積%)為15體積%以下。 The method for producing a glass according to the fourth aspect of the invention, wherein the low-moisture gas has an oxygen concentration (% by volume) of 15% by volume or less. 一種玻璃之製造方法,其特徵為,測定對熔融玻璃進行真空除氣之真空除氣槽的氛圍氣體之水蒸氣濃度,根據該水蒸氣濃度之測定結果,使低水分氣體導入於該真空除氣槽之該氛圍氣體,由此將該真空除氣槽之該氛圍氣體之水蒸氣濃度調整於60mol%以下。 A method for producing glass, characterized in that a water vapor concentration of an atmosphere of a vacuum degassing tank for vacuum degassing molten glass is measured, and a low moisture gas is introduced into the vacuum degassing according to a measurement result of the water vapor concentration. The atmosphere gas in the tank is adjusted so that the water vapor concentration of the atmosphere gas in the vacuum degassing tank is 60 mol% or less. 如申請專利範圍第6項之玻璃之製造方法,前述低水分(low moisture content)氣體為氮氣、氬氣、二氧 化碳或大氣。 The method for manufacturing glass according to item 6 of the patent application, the low moisture content gas is nitrogen, argon, and dioxane. Carbon or atmosphere. 一種熔融玻璃之真空除氣裝置,其為具有:被真空吸引之真空外罩(housing);設置於該真空外罩內,進行熔融玻璃之真空除氣的真空除氣槽;與此真空除氣槽相連通而設置,將真空除氣前之熔融玻璃導入於該真空除氣槽之導入手段;與該真空除氣槽相連通而設置,將真空除氣後之熔融玻璃自該真空除氣槽導出之導出手段的熔融玻璃之真空除氣裝置,其特徵為,進而具備:測定該真空除氣槽之氛圍氣體之水蒸氣濃度的水蒸氣濃度測定手段;導入低水分氣體於該真空除氣槽內部之上部空間的低水分氣體導入手段。 A vacuum degassing device for molten glass, comprising: a vacuum housing that is vacuum-attracted; a vacuum degassing tank disposed in the vacuum enclosure for vacuum degassing of the molten glass; and the vacuum degassing tank is connected thereto And an introduction means for introducing the molten glass before vacuum degassing into the vacuum degassing tank; and being disposed in communication with the vacuum degassing tank, the molten glass after vacuum degassing is derived from the vacuum degassing tank A vacuum degassing device for molten glass according to the present invention, further comprising: a water vapor concentration measuring means for measuring a water vapor concentration of the atmosphere gas in the vacuum degassing tank; and introducing a low moisture gas into the vacuum degassing tank Low moisture gas introduction means in the upper space. 如申請專利範圍第8項之真空除氣裝置,前述低水分(low moisture content)氣體為氮氣、氬氣、二氧化碳或大氣。 The vacuum degassing device of claim 8, wherein the low moisture content gas is nitrogen, argon, carbon dioxide or the atmosphere. 如申請專利範圍第8或9項之熔融玻璃之真空除氣裝置,前述低水份(low moisture content)氣體之導入方法為,設置於真空除氣槽之上流側。 The vacuum degassing device for molten glass according to claim 8 or 9, wherein the low moisture content gas is introduced into the flow side of the vacuum degassing tank.
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