TWI375057B - Detecting apparatus and detecting method for the detecting apparatus - Google Patents

Detecting apparatus and detecting method for the detecting apparatus Download PDF

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TWI375057B
TWI375057B TW97150145A TW97150145A TWI375057B TW I375057 B TWI375057 B TW I375057B TW 97150145 A TW97150145 A TW 97150145A TW 97150145 A TW97150145 A TW 97150145A TW I375057 B TWI375057 B TW I375057B
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light sensing
substrate
sensing element
module
light
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TW97150145A
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TW201024829A (en
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Hsien Yi Chang
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Au Optronics Corp
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Ϊ375057 六、發明說明: 【發明所屬之技術領域】 本發明是有關於一種檢測裝置,且特別是有關於一種用於 檢測基板之缺陷的檢測裝置以及用於此檢測裝置的檢測方法。 【先前技術】 5 隨著液·晶顯示技術的進步加上液晶顯示裝置具有重量輕 且體積小等優點,液晶顯示裝置已廣泛地應用於多種電子產 品’如數位相機、個人數位助理(personal digital assistant, PDA)、行動電話、筆記型電腦(notebook computer)以及平 面薄型化電視等。液晶顯示裝置包括液晶顯示面板與背光模 ' 組’其中背光模組用以提供面光源至液晶顯示面板,以使液晶 ·- 顯示面板能顯示彩色畫面。 - 承上述,液晶顯示面板包括二基板以及配置於此二基板之 間的液晶層,此二基板其中之一為彩色濾光基板,而彩色濾光 基板是使液晶顯示面板能顯示彩色晝面的重要構件。彩色濾光G 基板的品質與液晶顯示面板的顯示品質息息相關,因此檢測出, 彩色濾光基板的缺陷就顯得重要。 # 圖1是習知一種檢測裝置的示意圖。請參照圖1,習知檢 測裝置100是用以檢測玻璃基板50上的缺陷53。此玻璃基板 50上形成有多個彩色濾光單元52。每一個彩色濾光單元52及 其下方的玻璃基板50構成液晶顯示面板中的彩色濾光基板。 檢測裝置1〇〇是用以檢測每一個彩色渡光單元52是否有缺陷 53 ° 榀測叢置100包括移動平台11〇、掃瞄模組12〇以及複檢 模f 130。掃瞄模組120配置於移動平台11〇上方且沿著χ 3 軸橫跨移動平台110。複檢模組13〇配置於移動平台ιι〇上方, 且位於掃猫模組120旁。此外’移動平台u〇包括沿γ 4 13750^7 列的多個運輸滾筒112。藉由控制運輸滾筒112的轉動方向,/ 可使放置於運輸滾筒112上的玻璃基板5〇沿著Y軸往左移動 或往右移動。掃瞄模組120包括沿著χ轴排列的多個電荷耦 合元件 122 (charge coupled device,CCD) ’ 所以掃瞄模組 120 的視場(field ofview,FOV)能沿著X方向橫跨移動平台11〇。产 複檢模組130包括沿X方向橫跨移動平台u〇的執道132以 ,適於在此軌道132上移動的電荷耦合元件134。習知技術是 藉由疋位精度較佳的線性馬達(liner m〇t〇r)來驅使電荷輕合Ϊ375057 VI. Description of the Invention: [Technical Field] The present invention relates to a detecting device, and more particularly to a detecting device for detecting a defect of a substrate and a detecting method for the detecting device. [Prior Art] 5 With the advancement of liquid crystal display technology and the advantages of light weight and small size of liquid crystal display devices, liquid crystal display devices have been widely used in various electronic products such as digital cameras and personal digital assistants (personal digital Assistant, PDA), mobile phones, notebook computers, and flat-panel TVs. The liquid crystal display device includes a liquid crystal display panel and a backlight module 'group', wherein the backlight module is used to provide a surface light source to the liquid crystal display panel, so that the liquid crystal display panel can display a color picture. In the above, the liquid crystal display panel comprises two substrates and a liquid crystal layer disposed between the two substrates. One of the two substrates is a color filter substrate, and the color filter substrate is such that the liquid crystal display panel can display a color surface. Important components. The quality of the color filter G substrate is closely related to the display quality of the liquid crystal display panel. Therefore, it is detected that the defect of the color filter substrate is important. # Figure 1 is a schematic diagram of a conventional detection device. Referring to Figure 1, the conventional detecting device 100 is for detecting defects 53 on the glass substrate 50. A plurality of color filter units 52 are formed on the glass substrate 50. Each of the color filter units 52 and the glass substrate 50 therebelow constitute a color filter substrate in the liquid crystal display panel. The detecting device 1A is for detecting whether each of the color light-emitting units 52 is defective. The detecting unit 100 includes a moving platform 11A, a scanning module 12A, and a rechecking mold f130. The scanning module 120 is disposed above the mobile platform 11A and spans the mobile platform 110 along the χ3 axis. The re-inspection module 13 is disposed above the mobile platform ιι〇 and located beside the sweeping cat module 120. In addition, the mobile platform u〇 includes a plurality of transport rollers 112 along the γ 4 13750^7 column. By controlling the direction of rotation of the transport roller 112, / the glass substrate 5 placed on the transport roller 112 can be moved to the left or to the right along the Y-axis. The scan module 120 includes a plurality of charge coupled devices (CCDs) arranged along the x-axis. Therefore, the field of view (FOV) of the scan module 120 can traverse the mobile platform along the X direction. 11〇. The re-inspection module 130 includes a trajectory 132 that traverses the mobile platform u 沿 in the X direction, and a charge coupled element 134 adapted to move over the track 132. The prior art is to drive the charge to be lightly coupled by a linear motor (liner m〇t〇r) with better clamping accuracy.

元件134移動。此外,電荷耦合元件134包括一個放大倍率為 八倍的鏡頭,所以電荷耦合元件134的視場約為丨8公釐χ2丨〜 公羞。 'Κ 在習知技術中,檢測玻璃基板5〇的方法是先將玻璃基板 50放置於移動平台110的運輸滾筒112上,以藉由運輸滚筒 112使玻璃基板50沿Υ轴向右移動。接著,當玻璃基板5〇行 經掃猫且i20下方時,掃賴組12_電荷搞合元件m會 偵測玻璃基板50上的每-彩色渡光單元52是否有缺陷^並 債測缺陷63的位置’且將偵測的結果回饋至移動平台ιι〇盘 ^檢模組no。之後,移動平台11〇會將缺陷53移動至複檢 模組130的軌道132下方,而複檢模組130的電荷耗合元件 134則會沿著軌道i32移動至缺陷53上方 ^Element 134 moves. Further, the charge coupled device 134 includes a lens having a magnification of eight times, so the field of view of the charge coupled device 134 is approximately 公8 mm χ 2 丨 公 公. In the prior art, the method of detecting the glass substrate 5 is to first place the glass substrate 50 on the transport roller 112 of the moving platform 110 to move the glass substrate 50 to the right in the x-axis direction by the transport roller 112. Then, when the glass substrate 5 is swept by the sweeping cat and under the i20, the buffing group 12_charge engaging component m detects whether the per-color light-emitting unit 52 on the glass substrate 50 has defects and the defect 63 is defective. Location 'and the result of the detection is fed back to the mobile platform ιι〇盘^检 module no. Thereafter, the mobile platform 11 moves the defect 53 below the track 132 of the recheck module 130, and the charge consuming element 134 of the recheck module 130 moves along the track i32 to above the defect 53.

進而判斷缺⑽的類型,以找出缺陷53發生的^缺W 1 U而運輸浪同112的定位精度約介於2公釐至1〇公釐 由於運輸滾筒m蚊位精度較差,所以常 ^ 2元:134無法自動檢測到缺陷53的情形。如二 〆 耗費人力與時間尋找缺陷53,導致檢測時間大 而 5 t 【發明内容】 本發明提供一種檢測裝置,以提升檢測效率。 本發明另提供一種檢測方法,以提升檢測效率。 - 為達上述優點,本發明提出一種檢測裝置,其適於檢測基 • 、上,缺陷。此檢測裝置包括移動平台、掃瞄模組、複檢模組 以及定位杈組。移動平台適於使基板沿第一方向來回移動。掃 晦模組配置於移動平台上方,且掃猫模組之視場沿第二方向橫 f移動平台’其中第-方向與第二方向之間存有夾角。複檢模 _,·且配置於移鮮台上方,且位於掃㈣組旁。複檢模組包括沿 第二方向橫跨移動平台的第一軌道以及適於在第一執道上移 動的第一影像感測元件。定位模組配置於移動平台侧邊,且定 位模組包括平行第一方向的第二執道以及適於在第二軌道上 -移動的光感測元件組。此光感測元件組包括沿第一方向排列的 至少二光感測元件。此外,掃瞄模組用以偵測缺陷的位置,定 位模組適於根據缺陷的位置使光感測元件組從預設位置朝接 近複檢模組的方向移動至適當位置。移動平台在光感測元件其 中之一感測到基板之平行第二方向的第一側邊時減速,且移動 馨平台在光感測元件其中另一感測到基板的第一側邊時停止。複 檢模組適於根據缺陷之位置移動第一影像感測元件以複檢基 板上的缺陷。 在本發明之一實施例中’上述之第—方向垂直於第二方 向。 在本發明之一實施例中,上述之掃瞄模組包括沿第二方向 排列的多個第二影像感測元件。 在本發明之一實施例中,上述之移動平台包括沿第一方向 平行排列的多個運輸滚筒。 6 ^/^057 在本發明之一實施例中,上述之光感測元件之間的間距介 於200公釐至5〇〇公釐之間。 在本發明之一實施例中,上述之光感測元件組位於預設位 置時’光感測元件組與複檢模組之間的距離約等於基板之平行 第一方向的第二侧邊的長度。 在本發明之一實施例中’上述之預設位置與適當位置之間 的距離等於第二側邊的長度減去缺陷與第一侧邊之間的最短 距離。 在本發明之一實施例中,上述之光感測元件包括第一光感 元件與第一光感測元件,其中第一光感測元件位於第二光感 測元件與複檢模組之間。當定位模組位於預設位置或適當位置 時,移動平台在第一光感測元件感測到基板的第一側邊時減 速且移動平台在第二光感測元件感測到基板的第一側邊時停 止〇Furthermore, the type of the missing (10) is judged to find out the defect W1 U of the defect 53 and the positioning accuracy of the transport wave with the 112 is about 2 mm to 1 〇 mm. Because the transport roller m mosquito bit accuracy is poor, so often ^ 2 yuan: 134 can not automatically detect the situation of defect 53. For example, it takes a lot of manpower and time to find the defect 53, which results in a large detection time and 5 t. [Invention] The present invention provides a detecting device to improve detection efficiency. The invention further provides a detection method to improve detection efficiency. In order to achieve the above advantages, the present invention proposes a detecting device which is suitable for detecting a base, an upper, and a defect. The detecting device comprises a mobile platform, a scanning module, a rechecking module and a positioning set. The mobile platform is adapted to move the substrate back and forth in a first direction. The broom module is disposed above the mobile platform, and the field of view of the swept cat module moves along the second direction transversely f. The platform has an angle between the first direction and the second direction. The inspection mode _, · is placed above the shifting table and next to the sweep (four) group. The retest module includes a first track that traverses the mobile platform in a second direction and a first image sensing element adapted to move on the first track. The positioning module is disposed on a side of the mobile platform, and the positioning module includes a second lane parallel to the first direction and a light sensing component group adapted to move on the second track. The set of light sensing elements includes at least two light sensing elements arranged in a first direction. In addition, the scanning module is configured to detect the position of the defect, and the positioning module is adapted to move the light sensing component group from the preset position to the appropriate position in the direction of approaching the rechecking module according to the position of the defect. The mobile platform decelerates when one of the light sensing elements senses the first side of the parallel direction of the substrate, and the moving platform stops when the other of the light sensing elements senses the first side of the substrate . The recheck module is adapted to move the first image sensing element according to the position of the defect to recheck the defect on the substrate. In an embodiment of the invention, the first direction is perpendicular to the second direction. In an embodiment of the invention, the scan module includes a plurality of second image sensing elements arranged in a second direction. In an embodiment of the invention, the moving platform comprises a plurality of transport rollers arranged in parallel along the first direction. 6 ^/^057 In one embodiment of the invention, the spacing between the photo sensing elements described above is between 200 mm and 5 mm. In an embodiment of the invention, when the light sensing component group is located at a preset position, the distance between the light sensing component group and the rechecking module is approximately equal to the second side of the parallel first direction of the substrate. length. In one embodiment of the invention, the distance between the predetermined position and the appropriate position is equal to the length of the second side minus the shortest distance between the defect and the first side. In an embodiment of the invention, the light sensing component comprises a first light sensing component and a first light sensing component, wherein the first light sensing component is located between the second light sensing component and the rechecking module . When the positioning module is at the preset position or the appropriate position, the moving platform decelerates when the first light sensing element senses the first side of the substrate and the moving platform senses the first of the substrate at the second light sensing element Stop when you are on the side

在本發明之一實施例中’上述之光感測元件包括依序排列 的第-光感測元件、第二光感麻件、第三光感測元件以及第 ^光感測元件,其巾第-光感測元件位於第二域岐件與複 檢模組之間。當定位模組位於預設位置時,移動平台在第三光 ,測元件感測到基板的第-侧邊時減速,且移動平台在第= 感測元件感_基㈣第-靖時停止。t定位模組位於適當 位置時’移動平台在第一光感測树感測到基板的第—側邊: ,速’且移動平台在第二域測猶感測到基板的第—側邊時 為達上述優點,本發明另提出-種用於上述之 檢測方法,其包括下列步驟:首先,藉由 装,置* -方向往前移動。接著’藉由掃瞒模組價測基:的:陷::: 7 1375057 • i 置。之後’藉由位於預設位置的光感測元件組來感測基板,且 使移動平台根據光感測元件組的感測結果減速停止。然後,使 光感測元件組朝接近複檢模組的方向移動至適當位置,並藉由 移動平台使基板往後移動,以脫離光感測元件組的感測範圍。 接著,藉由移動平台使基板沿第一方向往前移動。之後,藉由 光感測元件組來感測基板,且使移動平台根據光感測元件組的 感測結果減速停止,以使基板上的缺陷位於複檢模組檢測範圍In one embodiment of the present invention, the light sensing element includes a first-light sensing element, a second light-sensing element, a third light-sensing element, and a photo-sensing element, which are sequentially arranged. The first light sensing component is located between the second domain component and the retest module. When the positioning module is at the preset position, the moving platform decelerates when the measuring element senses the first side of the substrate, and the moving platform stops when the sensing element senses the base (four). When the positioning module is in the proper position, the mobile platform senses the first side of the substrate in the first light sensing tree: speed, and the moving platform senses the first side of the substrate in the second domain. In order to achieve the above advantages, the present invention further provides a detection method for the above, which comprises the following steps: First, by loading, the *-direction is moved forward. Then 'by the broom module price base::::: 7 1375057 • i set. Thereafter, the substrate is sensed by the light sensing element group located at the preset position, and the moving platform is decelerated to stop according to the sensing result of the light sensing element group. Then, the photo sensing element group is moved to an appropriate position in the direction of approaching the rechecking module, and the substrate is moved backward by the moving platform to be separated from the sensing range of the photo sensing element group. Then, the substrate is moved forward in the first direction by moving the platform. Then, the substrate is sensed by the light sensing component group, and the moving platform is decelerated and stopped according to the sensing result of the light sensing component group, so that the defect on the substrate is located in the detection range of the rechecking module.

内。然後,根據缺陷之位置移動複檢模組的第一影像感測元件 以複檢基板上的缺陷。 在本發明之一實施例中,當光感測元件組位於預設位置 時,光感測元件組與複檢模組之間的距離約等於基板之 一方向的第二側邊的長度。 在本發明之一實施例中,上述之預設位置與適當位置之間 的距離等於第二側邊的長度減去㈣與第—側邊之間的最短 距雜。 本發明之一實施例中,上述之使移動平台根據光感測元 、,且的感測結果減速停止的方法包括下列步驟:首先當光感 組之域測元件其中之—感測到基板之第—側邊時,移 、':減速。接著,當光感測元件組之光感測元件其中另一 測到基板之第i邊時,移動平台停止。. ^ 測元明之—實施例中,上述之光感測元件包括第一光感 、 Υ、— 一光感測元件,其中第一光感測元件位於第二光感 時疋移動if =間。技位模組位於預設位置或適當位置 速, °第一光感測元件感測到基板的第一側邊時減 止。動平台在第二光感測元件感測到基板的第一侧邊時停 8 1375057 在本發明之一實施例中,上述之光感測元件包括依序排列 的第一光感測元件、第二光感測元件、第三光感測元件以及第 四光感測元件,其中第一光感測元件位於第二光感測元件與複 檢模組之間。當定位模組位於預設位置時,移動平台在第三光 感/則元件感測到基板的第一側邊時減速,且移動平台在第四光 感測元件感測到基板的第一側邊時停止。當定位模組位於適當 位置時,移動平台在第一光感測元件感測到基板的第一側邊時 減速,且移動平台在第二光感測元件感測到基板的第一側邊時 停止。 在本發明之檢測裝置中,由於定位模組的光感測元件組可 將感測結果回饋至移動平台,以使移動平台在停止之前先減 速’所以犯將基板上的缺陷精確地定位在複檢模組的檢測範圍 内。因此,本發明之檢測裝置能有效提升檢測效率。此外,本 發明之檢測方法是先根據缺陷的位置將定位模組移動至適當 位置,之後再藉由定位模組將感測結果回饋至移動平台,以使 ,動平台在停止之前先減速。如此,能將基板上的缺陷精確地 定位在複檢模組的檢測範圍内,以提升檢測效率。Inside. Then, the first image sensing element of the recheck module is moved according to the position of the defect to recheck the defect on the substrate. In an embodiment of the invention, when the photo sensing element group is at the preset position, the distance between the photo sensing element group and the rechecking module is approximately equal to the length of the second side of the substrate. In one embodiment of the invention, the distance between the predetermined position and the appropriate position is equal to the length of the second side minus the shortest distance between the (four) and the first side. In an embodiment of the present invention, the method for causing the mobile platform to decelerate and stop according to the sensing result of the light sensing element includes the following steps: first, when the sensing component of the light sensing group detects the substrate When the first side is moved, ': decelerate. Then, when the other of the light sensing elements of the light sensing element group detects the i-th side of the substrate, the moving platform stops. In the embodiment, the light sensing element comprises a first light sensing element, a first light sensing element, wherein the first light sensing element is located in the second light sense and moves if =. The skill module is located at a preset position or a suitable position speed, and is reduced when the first light sensing element senses the first side of the substrate. The movable platform stops when the second light sensing element senses the first side of the substrate. 1 1375057 In an embodiment of the invention, the light sensing component comprises a first light sensing component arranged in sequence, The second light sensing component, the third light sensing component, and the fourth light sensing component, wherein the first light sensing component is located between the second light sensing component and the rechecking module. When the positioning module is at the preset position, the moving platform decelerates when the third light sensor/then element senses the first side of the substrate, and the moving platform senses the first side of the substrate at the fourth light sensing element Stop while you are on the side. When the positioning module is in the proper position, the moving platform decelerates when the first light sensing element senses the first side of the substrate, and the moving platform senses the first side of the substrate when the second light sensing element senses stop. In the detecting device of the present invention, since the light sensing component group of the positioning module can feed the sensing result back to the mobile platform, so that the mobile platform decelerates before stopping, it is determined that the defect on the substrate is accurately positioned in the complex Within the detection range of the inspection module. Therefore, the detecting device of the present invention can effectively improve the detection efficiency. In addition, the detecting method of the present invention firstly moves the positioning module to an appropriate position according to the position of the defect, and then returns the sensing result to the mobile platform by the positioning module, so that the moving platform decelerates before stopping. In this way, the defects on the substrate can be accurately positioned within the detection range of the re-inspection module to improve the detection efficiency.

〃為讓本發明之上述和其他目的、特徵和優點能更明顯易 懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。 【實施方式】 圖2是本發明一實施例之一種檢測裝置的示意圖。請參照 圖2’本實施例之檢測裝置2〇〇適於檢測基板6〇上的缺陷幻。 此基,60例如是玻璃基板’且基板6〇上例如形成有多個彩色 渡光單元62。每—個彩色濾光單元62及其下方的基板6〇構 ^液晶顯示面板中的彩色㈣基板。檢測裝置200是用以檢測 每-個彩色攄光單元Μ是否有缺陷Μ,並進—步檢測缺陷幻 9 1375057 * } 的類型。 檢測裝置200包括移動平台21〇、掃瞄模組220、複檢模 組230以及定位模組24〇。移動平台21〇適於使基板6〇沿第 方向(如Y軸)來回移動。更詳細地說,移動平台21〇例 如包括沿第一方向(γ軸)平行排列的多個運輸滾筒212,而 基板60是放置於運輸滾筒212上。藉由控制運輸滾筒212的 轉動方向,可使放置於運輸滚筒212上的基板60沿著Y軸向 左移動或向右移動。 ~%模組220配置於移動平台21〇上方,且掃瞒模組220 之視場沿第二方向(如X軸)橫跨移動平台21〇,其中第一方 ,(Y軸)與第二方向(X軸)之間存有夾角,而此夾角例如 疋90度。此外,掃瞄模組220例如包括沿第二方向(χ軸) 排列的多個第二影像感測元件222,而這些第三影像感測元件 222例如是電荷耦合元件。上述之掃瞄模組22〇的視場是由這 些影像感測元件222的視場所構成。 複檢模組230配置於移動平台21〇上方,且位於掃瞄模組 220旁。複檢模組230包括沿第二方向(χ軸)橫跨移動平台 210的第一軌道232以及適於在第一軌道232上移動的第一影 像感測元件234。此第一影像感測元件234例如是電荷耦合元 件,而本實施例例如是藉由定位精度較佳的線性馬達來驅使第 一影像感測元件234移動。此外,第一影像感測元件234可包 括一個鏡頭,此鏡頭的放大倍率例如是八倍,所以第一影像感 測π件234的視場例如是〇公釐χ21公釐。需注意的是,上 述之鏡頭的放大倍率及第一影像感測元件234的視場僅為舉 例之用,並非用以限制本發明。 定位模組240配置於移動平台21〇侧邊,且定位模組24〇 1375057 « i i括平行帛$向(γ轴)的第二軌道242以及適於在第二轨 上移動的光感測元件組244。本實施例例如是藉由定位 較佳的線性馬達來驅使光感測元件組244移動。此光感測 7G件,244包^第_方向(γ轴)排列的至少二光感測元件, 排列的第—光感測元件245、第二光感測元件246、第 =光感測元件247以及第四光感測林248。第—光感測元件 5配置於第二光感測元件246與複檢模组23〇之間。此外, 相鄰兩光感測元件之間的間距例如是介於200公爱至5〇0公釐 之間。The above and other objects, features, and advantages of the present invention will become more apparent and understood. Embodiments Fig. 2 is a schematic diagram of a detecting device according to an embodiment of the present invention. Referring to Fig. 2', the detecting device 2 of the present embodiment is adapted to detect a defect illusion on the substrate 6. This base 60 is, for example, a glass substrate', and a plurality of color light-receiving units 62 are formed, for example, on the substrate 6. Each of the color filter units 62 and the substrate 6 therebelowly constitute a color (four) substrate in the liquid crystal display panel. The detecting device 200 is configured to detect whether each of the color light-emitting units is defective, and to detect the type of the defect illusion 9 1375057 * }. The detecting device 200 includes a moving platform 21A, a scanning module 220, a rechecking module 230, and a positioning module 24A. The moving platform 21 is adapted to move the substrate 6 来回 back and forth in the first direction (e.g., the Y-axis). In more detail, the moving platform 21 includes, for example, a plurality of transport rollers 212 arranged in parallel in the first direction (γ axis), and the substrate 60 is placed on the transport roller 212. By controlling the rotational direction of the transport roller 212, the substrate 60 placed on the transport roller 212 can be moved leftward or rightward along the Y-axis. The ~% module 220 is disposed above the mobile platform 21A, and the field of view of the broom module 220 traverses the mobile platform 21〇 in the second direction (such as the X axis), wherein the first side, (Y axis) and the second There is an angle between the directions (X-axis), and the angle is, for example, 疋90 degrees. In addition, the scan module 220 includes, for example, a plurality of second image sensing elements 222 arranged in a second direction (the x-axis), and the third image sensing elements 222 are, for example, charge coupled elements. The field of view of the scanning module 22 is formed by the field of view of the image sensing elements 222. The re-inspection module 230 is disposed above the mobile platform 21A and is located beside the scanning module 220. The retest module 230 includes a first track 232 that spans the mobile platform 210 in a second direction (the x-axis) and a first image sensing element 234 that is adapted to move over the first track 232. The first image sensing element 234 is, for example, a charge coupled device, and the present embodiment drives the first image sensing element 234 to move, for example, by a linear motor with better positioning accuracy. In addition, the first image sensing element 234 can include a lens whose magnification is, for example, eight times, so that the field of view of the first image sensing π member 234 is, for example, 〇 χ 21 mm. It should be noted that the magnification of the above lens and the field of view of the first image sensing element 234 are for illustrative purposes only and are not intended to limit the invention. The positioning module 240 is disposed on the side of the moving platform 21 , and the positioning module 24 〇 1375057 « ii includes a second track 242 parallel to the 向 (axis) and a light sensing element adapted to move on the second track Group 244. This embodiment, for example, drives the light sensing element group 244 to move by positioning a preferred linear motor. The light sensing 7G piece, 244 packs of at least two light sensing elements arranged in a _ direction (γ axis), the arranged first light sensing element 245, the second light sensing element 246, and the third light sensing element 247 and fourth light sensing forest 248. The first light sensing element 5 is disposed between the second light sensing element 246 and the recheck module 23A. In addition, the spacing between adjacent two light sensing elements is, for example, between 200 ohms and 5,000 angstroms.

在本實施例中,當基板60經過掃瞄模組22〇下方時,掃 瞎模組22G可_基板6G上的彩色渡光單元62是否有缺陷 63,偵測缺陷63的位置’且將偵測的結果回饋至複檢模組顶 二疋位模、·且240。疋位模組240適於根據缺陷幻的位置使光 感測兀件組244從預設位置朝接近複檢模組23〇的方向移動 (即向左移動)至適當位置。移動平台21〇在光感測元件犯、 246、247、248其中之-感測到基板6〇之平行第二方向的第 一側邊64時減速,且移動平台21〇在光感測元件245、246、 247 248其中另一感測到基板6〇的第—側邊64時停止。複 檢模組230適於根據缺陷63之位置移動第一影像感測元件 234 ’以複檢基板6〇上的缺陷63。 此外,當光感測元件組244位於預設位置時(如圖2所 示),光感測元件組244與複檢模組230之間的距離約等於基 板60之平行第一方向(Y軸)的第二側邊的的長度。更詳二 地說,當光感測元件組244位於預設位置時,光感測元件組 244與複檢模組230之間的距離例如是複檢模組23〇之第一轨 道232至光感測元件組244的其中一光感測元件(如第四光感 1375057 • i ,兀件248)的距離。另外’預設位置與適當位置之間的距離 等於第二側邊66的長度減去缺陷63與基板6〇之第—側邊64 之間的最短距離。舉例來說,若基板6〇之第二側邊66的長度 • 為2250公釐’缺陷幻與基板60之第一側邊64之間的最短^ 1700公羞,則預設位置與適當位置之間的距離等於55〇 公釐。換言之,使光感測元件組244從預設位置朝接近複檢模 組230的方向移動55〇公釐即到達適當位置。 以下將詳細介紹用於上述之檢測裝置2〇〇的檢測方法。請 鲁參照圖3A至圖%,其為本發明一實施例之檢測方法的流程 圖。本實施例之用於檢測裝置2〇〇的檢測方法包括下列步驟: 首先,如圖3A所示,藉由移動平台21〇使基板6〇沿第一方 • 1 (Y軸)往前移動(即向右移動)。接著,在基板6〇經過 掃猫模組220下方時,藉由掃瞒模組22〇偵測基板6〇的缺陷 63的位置,崎賴組22G會將制的結果回駐複檢模组 230與定位模組240。 之後’如圖3B與3C所示,藉由位於預設位置的光感測 元件組244來感測基板60,且使移動平纟21〇根據光感測元 鲁件組244的感測結果減速停止。更詳細地說,使移動平台21〇 根據光感測元件組244的感測結果減速停止的方法包括口下列 步驟:首先,如圖3B所示,當光感測元件組244之第三光感 測元件247制到基板60之第一側邊64時,移動平台21〇減 速。接著’如圖3C所示,當光感測元件組2料之第四光感測 元件248感測到基板60之第一侧邊64時,移動平台21〇停止。 然後’如圖3D所示,使光感測元件組撕朝接近複7檢模 組230的方向移動(即向左移動)至適當位置,並藉由移動平 台2H)使基板60往後移動(即向左移動)’以脫離光感測元 12 } 1375057 件組244的感测範圍。有關於如何使光感測元件組244朝接近 複檢核組230的方向移動至適當位置的方法已於上文說明 過,在此將不再重述。 接著,如圖3E所示,藉由移動平台21〇使基板6〇沿第 一方向(Y軸)往前移動(即向右移動)。之後,藉由光感測 元件組244來感測基板60,且使移動平台21〇根據光感測元 件組244的感測結果減速停止’以使基板6〇上的缺陷63位於 複檢模組230檢測範圍内。具體而言,當光感測元件組244之 第光感測元件245感測到基板60的第'一侧邊64時,移動平 台210減速。此外,如圖3F所示,當光感測元件組245之第 一光感測元件246感測到基板60的第一側邊64時,移動平台 • 210停止。 . 然後,如圖3G所示,根據缺陷63之位置移動複檢模組 240的第一影像感測元件244以複檢基板60上的缺陷63。更 詳細地說,根據缺陷63之位置使第一影像感測元件244沿著 第一軌道242移動至缺陷63的上方,以使缺陷63位於第一影 像感測元件244的視場内。如此,可藉由第一影像感測元件 φ 244對缺陷63做進一步的檢測,以判斷缺陷63類型,進而找 出缺陷63發生的原因。 由於定位模組240的光感測元件組244可將感測結果回饋 至移動平台210 ’以使移動平台210在停止之前先減速,所以 能提升移動平台210的定位精度,進而將基板60上的缺陷63 精破地定位在複檢模組230的檢測範圍内。具體而言,若相鄰 兩光感測元件之間的間距為0.5公釐,則本實施例可將移動平 台210的定位精度提升至1公釐以内。若第一影像感測元件 234的視場為1>8公釐χ2j公釐,由於移動平台210的定位精 13 1375057 • i 度已提升至1公釐以内’所以可確保複檢模組230能自動檢測 到缺陷63。如此,不需另外耗費人力與時間尋找缺陷63,因 此能提升檢測效率。In this embodiment, when the substrate 60 passes under the scanning module 22, the broom module 22G can detect whether the color illuminating unit 62 on the substrate 6G has a defect 63, and detects the position of the defect 63. The result of the test is fed back to the top two clamp mode of the recheck module, and 240. The clamp module 240 is adapted to move (i.e., move to the left) the light sensing element set 244 from the preset position toward the appropriate position based on the position of the defective phantom. The mobile platform 21 is decelerated when the light sensing component commits, 246, 247, 248, senses the first side 64 of the parallel direction of the substrate 6〇, and the mobile platform 21 is hovering at the light sensing element 245. 246, 247 248, wherein the other side of the substrate 6A is sensed to stop. The re-inspection module 230 is adapted to move the first image sensing element 234' according to the position of the defect 63 to re-examine the defect 63 on the substrate 6. In addition, when the light sensing element group 244 is at the preset position (as shown in FIG. 2 ), the distance between the light sensing element group 244 and the recheck module 230 is approximately equal to the parallel first direction of the substrate 60 (Y axis) The length of the second side of the ). In more detail, when the light sensing component group 244 is at the preset position, the distance between the light sensing component group 244 and the recheck module 230 is, for example, the first track 232 to the light of the recheck module 23〇. The distance of one of the light sensing elements (eg, the fourth light sense 1375057 • i , the jaw 248) of the sensing element group 244. Further, the distance between the predetermined position and the appropriate position is equal to the length of the second side 66 minus the shortest distance between the defect 63 and the first side 64 of the substrate 6〇. For example, if the length of the second side 66 of the substrate 6 is 2250 mm, and the shortest between the defect side and the first side 64 of the substrate 60 is 1700, the preset position and the appropriate position are The distance between them is equal to 55 mm. In other words, the light sensing element group 244 is moved from the preset position toward the direction close to the rechecking mode group 230 by 55 〇 to reach the appropriate position. The detection method for the above-described detecting device 2A will be described in detail below. Please refer to FIG. 3A to FIG. 3, which are flowcharts of a detecting method according to an embodiment of the present invention. The detecting method for the detecting device 2〇〇 of the embodiment includes the following steps: First, as shown in FIG. 3A, the substrate 6 is moved forward along the first side (1) (Y axis) by moving the platform 21 ( That is to move to the right). Then, when the substrate 6 is passed under the brush module 220, the position of the defect 63 of the substrate 6 is detected by the broom module 22, and the result of the chip 22G is returned to the recheck module 230. And positioning module 240. Thereafter, as shown in FIGS. 3B and 3C, the substrate 60 is sensed by the light sensing element group 244 at a preset position, and the moving plate 21 is decelerated according to the sensing result of the light sensing element group 244. stop. In more detail, the method for causing the mobile platform 21 to decelerate and stop according to the sensing result of the photo sensing element group 244 includes the following steps: First, as shown in FIG. 3B, when the third sensing light of the photo sensing element group 244 When the measuring element 247 is fabricated to the first side 64 of the substrate 60, the moving platform 21 is decelerated. Next, as shown in Fig. 3C, when the fourth light sensing element 248 of the light sensing element group 2 senses the first side 64 of the substrate 60, the moving platform 21 is stopped. Then, as shown in FIG. 3D, the light sensing element group is moved away from the direction of the complex inspection module 230 (ie, moved to the left) to an appropriate position, and the substrate 60 is moved backward by the moving platform 2H) ( That is, moving to the left) 'to escape the sensing range of the light sensing element 12} 1375057 piece set 244. The method of how to move the light sensing element group 244 toward the position close to the recheck core group 230 has been described above and will not be repeated here. Next, as shown in Fig. 3E, the substrate 6 is moved forward in the first direction (Y-axis) by moving the stage 21 (i.e., moved to the right). Thereafter, the substrate 60 is sensed by the light sensing component group 244, and the moving platform 21〇 is decelerated and stopped according to the sensing result of the light sensing component group 244 so that the defect 63 on the substrate 6 is located in the rechecking module. 230 detection range. In particular, when the first light sensing element 245 of the light sensing element group 244 senses the first side 64 of the substrate 60, the moving platform 210 decelerates. In addition, as shown in FIG. 3F, when the first light sensing element 246 of the light sensing element group 245 senses the first side 64 of the substrate 60, the moving platform 210 stops. Then, as shown in FIG. 3G, the first image sensing element 244 of the recheck module 240 is moved according to the position of the defect 63 to recheck the defect 63 on the substrate 60. In more detail, the first image sensing element 244 is moved along the first track 242 above the defect 63 in accordance with the position of the defect 63 such that the defect 63 is within the field of view of the first image sensing element 244. Thus, the defect 63 can be further detected by the first image sensing element φ 244 to determine the type of the defect 63, thereby finding the cause of the defect 63. Since the light sensing component group 244 of the positioning module 240 can feed back the sensing result to the mobile platform 210 ′ to decelerate the mobile platform 210 before stopping, the positioning accuracy of the mobile platform 210 can be improved, and then the substrate 60 can be The defect 63 is finely positioned within the detection range of the retest module 230. Specifically, if the pitch between adjacent two light sensing elements is 0.5 mm, the present embodiment can improve the positioning accuracy of the moving platform 210 to within 1 mm. If the field of view of the first image sensing element 234 is 1 > 8 mm 2 2 mm, since the positioning precision of the mobile platform 210 is 13 1375057 • the degree of i has been increased to within 1 mm, the re-inspection module 230 can be ensured. Defect 63 is automatically detected. In this way, no additional labor and time are required to find the defect 63, so the detection efficiency can be improved.

鵃注思的疋,在本發明中,相鄰兩光感測元件之間的間距 可視第一影像感測元件234的視場而調整。此外,雖然上述之 實施例中,光感測元件組244的第一光感測元件245、第二光 感測元件246、第三光感測元件247以及第四光感測元件248 分別有不同的功能,但在其他實施例中,光感測元件組244亦 可僅使用兩個光感測元件(如第一光感測元件245與第二光咸 測,件246),而其餘的光感測元件(如第三光感測元件247 與第四光感測元件248)可作為備用的光感測元件。換言之, 在另一實施例尹,光感測元件組244亦可僅包括第一光^測元 件245與第二光感測元件246。 々承上述,在光感測元件組244僅使用第一光感測元件245 與第二光感測元件246的實施例中,當定位模組24〇位於預設 位置或適當位置時,移動平台210在第一光感測元件撕感測 到基板60的第一側邊64時減速,且移動平台21〇在第二光感 測兀件246感測到基板60的第一側邊64時停止。 綜上所述,林發明巾,由於定位模組的光躺元件組可 將感測結果回饋至移動平台,以使移動平台在停止之前先減 ^ =以能提高移動平台的定位精準度,以將基板上的缺陷精 確,=在複檢模組的檢測範圍内。如此,不需另外浪費人力 間哥找缺陷,所以本發明之檢測裝置及其檢測方法能有效 提升檢測效率。 本 幻〇57 明之精神和範圍内,當可作些許之更動與潤飾,因此本 之保護範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 …° 圖1是習知一種檢測裝置的示意圖。 圖2是本發明一實施例之一種檢測裝置的示音圖 圖 圖3A至圖3G為本發明一實施例之檢測方 a 【主要元件符號說明】 叼程 5〇 :玻璃基板In the present invention, the spacing between adjacent two light sensing elements can be adjusted depending on the field of view of the first image sensing element 234. In addition, in the above embodiments, the first photo sensing element 245, the second photo sensing element 246, the third photo sensing element 247, and the fourth photo sensing element 248 of the photo sensing element group 244 are different. Function, but in other embodiments, the light sensing component group 244 can also use only two light sensing components (such as the first light sensing component 245 and the second light sensing component, 246), while the rest of the light Sensing elements, such as third light sensing element 247 and fourth light sensing element 248, can serve as alternate light sensing elements. In other words, in another embodiment, the light sensing element group 244 may also include only the first light sensing element 245 and the second light sensing element 246. As described above, in the embodiment in which the first light sensing element 245 and the second light sensing element 246 are used only in the light sensing element group 244, when the positioning module 24 is at a preset position or an appropriate position, the mobile platform 210 decelerates as the first light sensing element tears the first side 64 of the substrate 60, and the moving platform 21 停止 stops when the second light sensing element 246 senses the first side 64 of the substrate 60 . In summary, the invention towel, because the positioning component of the positioning module can feedback the sensing result to the mobile platform, so that the mobile platform can reduce the positioning accuracy before stopping, so as to improve the positioning accuracy of the mobile platform, Defects on the substrate are accurate, = within the detection range of the retest module. In this way, the detection device and the detection method thereof of the present invention can effectively improve the detection efficiency without separately wasting the manpower to find the defect. In the spirit and scope of this illusion, there may be some changes and refinements, and the scope of this protection shall be subject to the definition of the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view of a conventional detecting device. 2 is a sound diagram of a detecting apparatus according to an embodiment of the present invention. FIGS. 3A to 3G are diagrams of a detecting unit according to an embodiment of the present invention. [Description of main component symbols] Process 5: Glass substrate

52、 62 :彩色濾光單元 53、 63 :缺陷 60 :基板 64 :第一側邊 66 :第二側邊 100、200 :檢測裝置 110、210 :移動平台 112、212:運輪滾筒 120、220 :掃瞄模組 122、134 :電荷耦合元件 130、230 :複檢模組 Π2 :軌道 222 :第二影像感測元件 232 :第一執道 234 :第—影像感測元件 240 :定位模組 242 :第二軌道 244 :光感測元件級 15 1375057 245 ··第一光感測元件 246 :第二光感測元件 247 ··第三光感測元件 248 :第四光感測元件52, 62: color filter unit 53, 63: defect 60: substrate 64: first side 66: second side 100, 200: detecting device 110, 210: moving platform 112, 212: roller drum 120, 220 Scan module 122, 134: charge coupled component 130, 230: recheck module Π 2: track 222: second image sensing component 232: first trajectory 234: first image sensing component 240: positioning module 242: second track 244: light sensing element level 15 1375057 245 · first light sensing element 246: second light sensing element 247 · · third light sensing element 248: fourth light sensing element

Claims (1)

1375057 七、申請專利範圍: 1.一種檢測裝置,適於檢測一基板上的 置包括: 一移動平台, 101年7月23 a修正替換頁 —缺陷,該檢測裝 一秒動平口,適於使該基板沿一第一方向來回移動;1375057 VII. Patent application scope: 1. A detecting device suitable for detecting a substrate on a substrate comprises: a mobile platform, a modified replacement page-defect on July 23, 2011, the detection is equipped with a one-second moving flat, suitable for making The substrate moves back and forth along a first direction; 一複檢做,配置於該義平台上方,且位於該掃猫模缸 旁,該複檢模組包括沿該第二方向橫跨該移動平台的一第一軌 道以及,於在該第一執道上移動的一第一影像感測元件;以及 一疋位模組,配置於該移動平台侧邊,該定位模組包括平 行該第一方向的一第二軌道以及適於在該第二執道上移動的 一光感測元件組,該光感測元件組包括沿該第一方向排列的至 少二光感測元件, 其中,該掃瞄模組用以偵測該缺陷的位置,該定位模組適 於根據該掃瞄模組所偵測到的該缺陷的位置使該光感測元件 組從一預設位置朝接近該複檢模組的方向移動至一適當位 置,該移動平台在該些光感測元件其中之一感測到該基板之平 行該第二方向的一第一侧邊時減速,且該移動平台在該些光咸 測元件其中另一感測到該基板的該第一侧邊時停止,該複檢模 組適於根據該缺陷之位置移動該第一影像感測元件以複檢該 基板上的該缺陷。 2. 如申請專利範圍第1項所述之檢測裝置,其中該第一方 向垂直於該第二方向。 3. 如申請專利範圍第1項所述之檢測裝置,其中該掃瞄模 組包括沿該第二方向排列的多個第二影像感測元件。 4. 如申請專利範圍第1項所述之檢測裝置,其中該移動平 17 1375057 .» 101年7月23曰修正替換頁 台包括沿該第一方向平行排列的多個運輪滾^ 5. 如申請專利範圍第丨項所述之檢測裝置,其中該些光感 測元件之間的間距介於.200公釐與500公釐之間。 6. 如申请專利範圍第i項所述之檢測裝置,其中該光感測 元件組位於該預設位置時,該光感測元件組與該複檢模組之間 的距離約等於該基板之平行該第一方向的一第二側邊的長度。 7. 如申請專利範圍第6項所述之檢測裝置,其中該預設位 置與該適當位置之間的距離等於該第二側邊的長度減去該缺 φ 陷與該第一侧邊之間的最短距離。 8. 如申請專利範圍第1項所述之檢測裝置,其中該些光感 測兀件包括一第一光感測元件與一第二光感測元件,該第一光 感測元件位於該第二光感測元件與該複檢模組之間,當該定位 模組位於該預設位置或該適當位置時,該移動平台在該第一光 感測元件感測到該基板的該第一侧邊時減速,且該移動平台在 該第二光感測元件感測到該基板的該第一侧邊時停止。 9. 如申請專利範圍第1項所述之檢測裝置,其中該些光感 測元件包括依序排列的一第一光感測元件、一第二光感測元 件、一第二光感測元件以及一第四光感測元件,該第一光感測 元件位於該第二光感測元件與該複檢模組之間,當該定位模組 位於該預設位置時’該移動平台在該第三光感測元件感測到該 基板的該第一側邊時減速,且該移動平台在該第四光感測元件 感測到該基板的該第一側邊時停止,當該定位模組位於該適當 位置時,該移動平台在該第一光感測元件感測到該基板的該第 一側邊時減速’且該移動平台在該第二光感測元件感測到該基 板的該第一侧邊時停止。 10·—種用於申請專利範圍第1項所述之檢測裝置的檢測 1375057 f 101年7月23日修正替換頁 方法’包括: 藉由該移動平台使該基板沿該第一方向往前移動; ,由該掃瞄模組偵測該基板的該缺陷的位置; 措由位於該預設位置的該光感測元件組來感測該基板且 使該移動平錄據該域測元件組的感聽果減速停止; 根據該掃瞄模組所偵測到該基板的該缺陷的位置使該光 感測兀件組雛賴複檢馳的方向移動至該適當位置,並藉a re-inspection, disposed above the platform, and located beside the sweeping mold cylinder, the re-inspection module includes a first track spanning the mobile platform along the second direction and a first image sensing component that moves on the track; and a clamping module disposed on a side of the mobile platform, the positioning module includes a second track parallel to the first direction and adapted to move on the second lane The light sensing component group includes at least two light sensing elements arranged along the first direction, wherein the scanning module is configured to detect the position of the defect, and the positioning module is suitable The light sensing component group is moved from a predetermined position toward a position close to the rechecking module to an appropriate position according to the position of the defect detected by the scanning module, and the moving platform is in the light Decelerating when one of the sensing elements senses a first side of the substrate parallel to the second direction, and the moving platform senses the first side of the substrate in the other light sensing elements Stopping at the side, the retest module is adapted to be based on the defect The position moves the first image sensing element to recheck the defect on the substrate. 2. The detecting device of claim 1, wherein the first direction is perpendicular to the second direction. 3. The detecting device of claim 1, wherein the scanning module comprises a plurality of second image sensing elements arranged along the second direction. 4. The detecting device according to claim 1, wherein the moving flat 17 1375057 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . The detecting device of claim 2, wherein the distance between the light sensing elements is between .200 mm and 500 mm. 6. The detecting device of claim i, wherein when the photo sensing element group is located at the preset position, a distance between the photo sensing element group and the rechecking module is approximately equal to the substrate Parallel to the length of a second side of the first direction. 7. The detecting device of claim 6, wherein the distance between the preset position and the appropriate position is equal to the length of the second side minus the gap between the first side and the first side The shortest distance. 8. The detecting device of claim 1, wherein the light sensing elements comprise a first light sensing element and a second light sensing element, wherein the first light sensing element is located at the first Between the second light sensing component and the rechecking module, when the positioning module is located at the preset position or the proper position, the mobile platform senses the first of the substrate at the first light sensing component The side is decelerated, and the moving platform stops when the second light sensing element senses the first side of the substrate. 9. The detecting device of claim 1, wherein the light sensing elements comprise a first light sensing element, a second light sensing element, and a second light sensing element arranged in sequence. And a fourth light sensing component, the first light sensing component is located between the second light sensing component and the rechecking module, and when the positioning module is located at the preset position, the mobile platform is The third light sensing element decelerates when the first side of the substrate is sensed, and the moving platform stops when the fourth light sensing element senses the first side of the substrate, when the positioning mode When the group is in the proper position, the mobile platform decelerates when the first light sensing element senses the first side of the substrate and the moving platform senses the substrate at the second light sensing element The first side stops. 10. The detection of the detection device described in claim 1 of the patent scope 1371057 f. The method of modifying the replacement page on July 23, 101' includes: moving the substrate forward in the first direction by the moving platform Detecting the position of the defect of the substrate by the scanning module; sensing the substrate by the light sensing component group located at the preset position and recording the movement to the group of the measuring component The sensing fruit is decelerated and stopped; according to the position of the defect detected by the scanning module, the light sensing element group moves to the appropriate position in the direction of the retrieving, and borrows 由該移動平自使該基板往後移動’峨離該域測元件組的^ 测範圍; 〜 藉由該移動平台使該基板沿該第一方向往前移動; 藉由該光感測元件組來感測該基板,且使該移動平台根據 該光感測元件__結果減速停止,贿職板^ 位於該複檢模組檢測範圍内;以及 根據該缺陷之位置移動該模組的該第一影像感測元 件以複檢該基板上的該缺陷。 長度 11.如申請專利範圍第10項所述之檢測方法,其中當該光 感測元件錄於該職位置時,該光制元件組與該複檢模組 之間的距離約料該基板之平行該第—方向的—第二側邊的 12. 如申請專利範圍第u項所述之檢測方法,其中該預設 位置與該適當位置之間的距離等於該第二侧邊; 缺陷與該第一側邊之間的最短距離。 又減去以 13. 如申請專利範圍帛10項所述之檢測方法,其中使該移 動平台根據該光感測元件組的感測結果減速停止的方法包^ ·· 當該光感測元件組之該些光感測元件其中之一感測到該 基板之該第一側邊時,該移動平台減速;以及 〜 ^ 19 1375057 , 101年7 a 23日修正替換頁 當該光感測元件組之該些光感測元件其 基板之該第一側邊時,該移動平台停止。 5λ 1—4.如申請專利範圍第.13.項所述之檢測方法,其中該 感測元件包括H感測元件與—第二光感測元件該^ — 光感測元件位㈣第二光感測元件與該複檢模組之間,卷該— 位模組位於關設位置_適#位置時,該移動平 ,測元件感測到該基板的該第—側邊時減速且二移=二 在該第二光制元件感測到該基板的該第—側邊時停止。° 15.如f料利範圍第13項所述之檢測方法,1中該此 感測元件包括依序排列的一第一光感 ;;;先 元件位於今第-本“ ^先感測70件,該第-光感測. = = :’該移動平台在該第三光二 第四光感測元件 位置時,該移動平△ _^止自叙位模組位於該適當 -侧邊時減速,且:移二j感測兀件感_該基板的該第 板的該第-側邊時停止第二光感測元件感測到該基 20Moving the substrate backward by the movement to remove the measurement range of the field detecting component group; moving the substrate forward in the first direction by the moving platform; by using the light sensing component group Sensing the substrate, and causing the mobile platform to decelerate and stop according to the photo sensing element__, the bribe board is located within the detection range of the rechecking module; and moving the module according to the position of the defect An image sensing element retests the defect on the substrate. The method of claim 10, wherein when the light sensing component is recorded in the position, the distance between the light component group and the recheck module is about the substrate The method of detecting the second aspect of the first aspect of the first aspect of the invention, wherein the distance between the predetermined position and the appropriate position is equal to the second side; The shortest distance between the first side. Further, the method of detecting the method according to claim 10, wherein the moving platform is decelerated and stopped according to the sensing result of the light sensing element group is included in the light sensing element group When the one of the light sensing elements senses the first side of the substrate, the moving platform is decelerated; and ~ ^ 19 1375057, 101 years 7 a 23 modified replacement page when the light sensing component group When the light sensing elements have the first side of the substrate, the moving platform stops. 5λ 1-4. The detection method of claim 13, wherein the sensing element comprises an H sensing element and a second light sensing element, the light sensing element (four), the second light Between the sensing component and the re-inspection module, when the volume module is located at the position of the closed position, the movement is flat, and the measuring component senses the first side of the substrate and decelerates and shifts twice. = two stops when the second light element senses the first side of the substrate. ° 15. The detection method according to item 13 of the f-profit range, wherein the sensing element comprises a first light sensation arranged in sequence;; the first component is located in the present-first "^ first sensing 70" The first light sensing. = = : 'When the mobile platform is in the position of the third light and the fourth light sensing component, the moving flat Δ _ ^ is decelerated when the positioning module is located at the appropriate side And: shifting the sense of the element _ the first side of the first plate of the substrate stops the second light sensing element from sensing the base 20
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