TWI362498B - - Google Patents

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Publication number
TWI362498B
TWI362498B TW97130934A TW97130934A TWI362498B TW I362498 B TWI362498 B TW I362498B TW 97130934 A TW97130934 A TW 97130934A TW 97130934 A TW97130934 A TW 97130934A TW I362498 B TWI362498 B TW I362498B
Authority
TW
Taiwan
Prior art keywords
test
wafer
temperature control
simulating system
system testing
Prior art date
Application number
TW97130934A
Other languages
English (en)
Chinese (zh)
Other versions
TW201007188A (en
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW97130934A priority Critical patent/TW201007188A/zh
Publication of TW201007188A publication Critical patent/TW201007188A/zh
Application granted granted Critical
Publication of TWI362498B publication Critical patent/TWI362498B/zh

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW97130934A 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test TW201007188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

Publications (2)

Publication Number Publication Date
TW201007188A TW201007188A (en) 2010-02-16
TWI362498B true TWI362498B (enExample) 2012-04-21

Family

ID=44826954

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97130934A TW201007188A (en) 2008-08-14 2008-08-14 Chip testing and sorting machine capable of simulating a system test

Country Status (1)

Country Link
TW (1) TW201007188A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI626446B (zh) * 2017-01-13 2018-06-11 崇碁科技股份有限公司 晶片燒錄測試設備及方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104181456A (zh) * 2013-05-27 2014-12-03 海洋王（东莞）照明科技有限公司 印刷电路板测试方法
TWI546874B (zh) 2014-02-10 2016-08-21 致茂電子股份有限公司 Test Equipment for Stacked Semiconductor Packaging Components and Test Methods
CN107300668A (zh) * 2016-04-14 2017-10-27 深圳市三联光智能设备股份有限公司 贴片轻触开关测试机构和贴片轻触开关编带机
CN106405376A (zh) * 2016-09-08 2017-02-15 深圳市燕麦科技股份有限公司 柔性电路板测试装置
CN109283405B (zh) * 2017-07-20 2021-01-29 泰克元有限公司 用于测试电子部件的分选机
KR102440374B1 (ko) * 2017-07-20 2022-09-06 (주)테크윙 전자부품 테스트용 핸들러
CN112485645A (zh) * 2020-11-30 2021-03-12 海光信息技术股份有限公司 芯片测试温度控制方法、控制系统、温控板卡及测试系统
CN114690024B (zh) * 2022-05-31 2022-08-26 广东东博自动化设备有限公司 一种全自动芯片测试机

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI626446B (zh) * 2017-01-13 2018-06-11 崇碁科技股份有限公司 晶片燒錄測試設備及方法

Also Published As

Publication number Publication date
TW201007188A (en) 2010-02-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees