1362489 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種快速檢驗鏡頭缺陷之方法。 【先前技術】 主隨著多媒體技術之飛速發展’數位相機、攝影機越來越為廣大消費者 月睞’在人們餘位減、攝影機輯出物體之影像質量提出更高要 同時，對數位相機、攝影機等産品需求量亦在增加。 數位相機、攝織等攝難置巾，光學元件係不可缺少之部件。在數 =2、攝影機量産之方案中’高折射率光學娜材料射出成型光學元 成為數位相機、攝影機光學元件之主流。 在鏡片自射出成型之後，需將鏡片進行檢驗。然，在現有生産中仍以 I工鏡下翻動鏡片仔細檢查來挑出缺陷為主。由於光學透鏡較細 不超過5mm，以人讀查需耗時較久，且容易産生遺漏，因 此而要一種快速檢驗鏡片缺陷之方法。 【發明内容】 法 有馨於此’有必要提供-種可提高製觀率讀速檢驗制缺陷之方 —種快速檢驗鏡#賴之方法，縣檢驗鏡片， :顯ϊίί=ι=取裝置及一承載部，其中該影像擷取裝置整 像榻取裝置阶η，㈣t將鏡片置該承載部之容置孔内；使用影 裝置滅与二二描之圖像傳送至數據處理裝置；數據處理 g根據以_取裝置傳送之圖像判別衫有缺陷，記錄缺陷鏡片之 縮短·檢叙_，l刚找驗置，從而 【實施方式】 施方編㈣法較佳實 及-承載轉所述快速檢驗鏡片缺陷之;法用鏡-片真= 1362489 : ’光學部500位於基座502之中 該鏡片50包括一光學部5〇〇及一基座5〇2 部，其係球面或非球面。 明一併參閱第二圖至第六圓，所述鏡片5〇放置於承載部4〇上本實 施例中’該承載部40 $一載盤，該承載部40為-薄板，其上開設複數容 =42 ’該複數容置孔42驗容置並固持鏡片5〇，其按一定規律排列於 承載部4〇 ’且數據處理裝置1〇可藉由座標或其他形式記錄各個容置孔π 之位置。該容置孔42為-台階狀通孔，包括同轴設置之容置部42〇和通光 部422，且該通光部422之直徑小於該容置部42〇之直徑而於兩者銜接處 形成台階。該通光部422之直徑與鏡片50之光學部5〇〇之直徑相當，該容 置部420之直徑與鏡片5〇之基座5〇2外圓直徑相當，鏡片5〇放置於該容1362489 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to a method for quickly detecting lens defects. [Prior Art] With the rapid development of multimedia technology, 'digital cameras and video cameras are increasingly favored by consumers'. In the case of people's residual position, the image quality of the cameras is higher, and the digital camera, Demand for products such as cameras is also increasing. Digital cameras, photographic and other difficult to wear towels, optical components are indispensable parts. In the case of the number = 2, the mass production of the camera, the high refractive index optical material injection molding optical element becomes the mainstream of the digital camera and the optical component of the camera. After the lens has been self-injected, the lens needs to be inspected. However, in the existing production, I still use the mirror under the mirror to check the defects to pick out the defects. Since the optical lens is thinner than 5 mm, it takes a long time for the person to read it, and it is prone to omission, so a method for quickly detecting the lens defect is required. [Summary of the Invention] The method has a sweetness here. It is necessary to provide a kind of method that can improve the defect rate of the reading speed test system - a kind of rapid inspection mirror #赖之方法, county inspection lens, : display ϊ ίί = ι = take the device and a carrying portion, wherein the image capturing device is integrated with the step η of the image taking device, (4) t placing the lens in the receiving hole of the carrying portion; and transferring the image of the second and second images to the data processing device by using the shadow device; data processing g judges that the shirt is defective according to the image transmitted by the device, records the shortening and profiling of the defective lens, and immediately finds the inspection, so that the method is better and the carrier is transferred. Quickly inspect lens defects; method mirror-sheet true = 1362489: 'The optical portion 500 is located in the base 502. The lens 50 includes an optical portion 5〇〇 and a base 5〇2 portion, which is spherical or aspherical. . Referring to the second to sixth circles, the lens 5 is placed on the carrying portion 4 ' in the embodiment, the carrying portion 40 is a carrier, and the carrying portion 40 is a thin plate. Capacitance = 42 ' The plurality of accommodating holes 42 are accommodating and holding the lens 5 〇, which are arranged in a certain regular pattern on the carrying portion 4 〇 ' and the data processing device 1 记录 can record each accommodating hole π by coordinates or other forms position. The accommodating hole 42 is a stepped through hole, and includes a coaxially disposed accommodating portion 42 〇 and a light passing portion 422, and the diameter of the light passing portion 422 is smaller than the diameter of the accommodating portion 42 而Form a step. The diameter of the light passing portion 422 is equivalent to the diameter of the optical portion 5A of the lens 50. The diameter of the receiving portion 420 is equivalent to the outer diameter of the base 5〇2 of the lens 5〇, and the lens 5〇 is placed in the volume.
置孔42時，基座502位於容置部420内，光學部5〇〇可以透過通光部422 ^出’以便對鏡片50進行檢驗。通光部422，亦可為一飢狀圓孔，即其與 容置部420連接之-端直徑與鏡片5◦之光學部5⑽直徑相當另—端^ 偏大。 二 所述數據處理裝置10在該較佳實施方式中為一台電腦，其内部程式可 識別圖像資訊，並對有關數據進行處理從而輸出結果。 影像擷取裝置20為-整合顯微鏡(圖未示)及影像感測器(圖未示 體之裝置’該影像擷取裝置20可以調焦，以獲取多個不同之對声面24，該 影像擷取裝置2G與麟處理裝置1G電連接，並將所獲取之圖;|象資訊傳輸 至數據處理裝置10。承載部40兩側分別設一可旋轉升降且水平伸縮之支架 22，將影像擷取裝置20安裝於承載部4〇 一側之支架22上可影 ^ 裝置20位於承載部40之正上方，旋轉、升降或於水平方向伸縮該支架22 可使影像棟取裝置2G在承載部40上方移動，以便影軸取裝置2〇對承載 部40上之所有鏡片50進行掃描。 真空吸筆30與數據處理裝置10電連接，其與鏡片5〇大小相配合並 可根據數據處理裝置1〇指示之數據吸附鏡片5〇 ;且吸筆 另-側之支架22上，旋轉、升降或於水平方向伸縮t架0 30位於承載部40上方，並能吸附承載部4〇上所有鏡片5〇。 快速檢驗鏡片50缺陷之方法包括如下步驟：將承載部4〇之具有通光 部422之表面向下放置於平台上，複數鏡片5〇分別放置於該承載部4〇之 ，數容置孔42内，此時，鏡片50之基座502位於承載部4〇容置孔42之 容置部420 ’光學部500位於承載部40之容置孔42之通光部422内，且鏡 〇D^489 之光學部500透過該承載部4〇之通光部422露出；再將影像 置20及吸筆30分別與數據處理裝置1〇電連接。 、 置20啟之動董f隹據&處2^=中^相絲式及影像擁取裝置20，將影像擷取裝 底部，再缓緩向上微調，使影_取纟ho 置20掃描承載部4Q上之所有鏡片见影像^ 像傳送至數據處理裝置1Q，纖無缺陷，數據處理裝置 =5〇之均勻圖像，若鏡片5〇中有缺陷時，數據處理裝置崎顯示之 =片50圖像中會顯示出到痕或黑點5〇4，並記錄該有缺陷鏡片％之位 ’/ΐί空吸筆3〇 ’並使其根據數據處理褒置1〇中記錄之不合 格鏡片50之位置資訊將有缺陷之鏡片5〇移除。 片50可^檢驗鏡片缺陷之過財，數據處理裝置10掃描鏡 可移動平臺上，承_ 4〇可分職g直㈣和斜方置= 使影像揭取裝S 20謂触載部4〇上之所有鏡4 5G。ϋ 2〇亦可以從 5G頂部掃描至底部.，不 空; 片50移除，亦可使用其师雜p 及#30將鏡 入，軸之方法係湘絲紐鏡與影像_器相結 。藉由類似斷層城之方法，可快速找到鏡片5〇之缺陷位 鏡片50檢驗之時間，而且準確度較高。 综上所述，本發明符合發明專利要件，妥依法提出專利 上所述者鶴本發明讀佳實細，舉凡熟悉本紐藝之人士 效修飾或變化’㈣包含独KM糊範圍内。When the hole 42 is placed, the base 502 is located in the accommodating portion 420, and the optical portion 5 〇〇 can pass through the light-passing portion 422 to inspect the lens 50. The light-passing portion 422 may also be a hunger-shaped circular hole, that is, the diameter of the end portion connected to the accommodating portion 420 is larger than the diameter of the optical portion 5 (10) of the lens 5 另. In the preferred embodiment, the data processing device 10 is a computer whose internal program can recognize image information and process related data to output a result. The image capturing device 20 is an integrated microscope (not shown) and an image sensor (a device not shown). The image capturing device 20 can focus to obtain a plurality of different pairs of sound planes 24, the image The capturing device 2G is electrically connected to the lining processing device 1G, and transmits the acquired image; the image information to the data processing device 10. Each of the two sides of the carrying portion 40 is provided with a bracket 22 that can be rotated up and down and horizontally stretched, and the image is 撷The device 20 is mounted on the bracket 22 on the side of the carrying portion 4, and the device 20 is located directly above the carrying portion 40. The bracket 22 is rotated, raised or lowered or horizontally extended to enable the image building device 2G to be in the carrying portion 40. The upper side is moved so that the shadow taking device 2 扫描 scans all the lenses 50 on the carrying portion 40. The vacuum pen 30 is electrically connected to the data processing device 10, which is matched with the size of the lens 5 并可 and can be used according to the data processing device 1 The indicated data is adsorbed on the lens 5; and the holder 22 on the other side of the suction pen is rotated, lifted or stretched in the horizontal direction. The frame 0 30 is located above the carrying portion 40 and can absorb all the lenses 5 on the carrying portion 4 . Method for quickly inspecting lens 50 defects The method includes the following steps: placing the surface of the bearing portion 4 having the light-passing portion 422 downward on the platform, and placing the plurality of lenses 5 〇 in the receiving portion 4, and accommodating the holes 42. At this time, the lens 50 The pedestal 502 is located in the accommodating portion 420 of the accommodating portion 4 accommodating hole 42. The optical portion 500 is located in the light transmitting portion 422 of the accommodating hole 42 of the accommodating portion 40, and the optical portion 500 of the mirror D^489 transmits the optical portion 500. The light-passing portion 422 of the carrying portion 4 is exposed; the image display 20 and the suction pen 30 are respectively electrically connected to the data processing device 1 。 。 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 And the image capturing device 20, the image capturing device is mounted on the bottom, and then slowly fine-tuned, so that all the lenses on the scanning carrying portion 4Q are transmitted to the data processing device 1Q, and the fiber is not transferred. Defect, data processing device = 5 〇 uniform image, if there is a defect in the lens 5 ,, the data processing device shows that the film 50 will show a mark or black dot 5〇4, and record the The defective lens % position '/ ΐί empty pen 3 〇 ' and makes it according to the data processing device 1 记录 recorded in the unqualified lens 50 The information will remove the defective lens 5〇. The film 50 can check the lens defect, the data processing device 10 scan mirror can be moved on the platform, the bearing _ 4 〇 can be divided into straight (four) and oblique square = make the image The S 20 is attached to all the mirrors 4 5G on the contact portion 4 ϋ. The ϋ 2 〇 can also be scanned from the top of the 5G to the bottom. It is not empty; the film 50 is removed, and the teacher can also use the p and #30 Mirroring, the method of the axis is the combination of Xiangsi New Mirror and Image _. By means of a method similar to fault city, the time of inspection of the defective lens 50 of the lens can be quickly found, and the accuracy is high. As described above, the present invention conforms to the requirements of the invention patent, and the person described in the patent is properly prepared according to the law. The invention is well-informed, and the person who is familiar with the present invention has modified or changed the '(4) including the exclusive KM paste.
.第一圖係本發明快速檢驗鏡片缺陷之方法較佳實施方式之裝置示意 圖， ，I 第二圖係第一圖沿II處之局部放大圖； 之正$_本發日驗速檢驗鏡片舰之方法健實施方式之無缺陷鏡片 俯圖係本發明快速檢驗鏡片缺陷之方法較佳實施方式之無缺陷鏡片 第五圖係本發明快速檢驗鏡片缺陷之方法較佳實施方式之有缺陷鏡片 1362489 之正視圖； 第六圖係本發明快速檢驗鏡片缺陷之方法較佳實施方式之有缺陷鏡片 之俯視圖； 第七圖係本發明快速檢驗鏡片缺陷之方法較佳實施方式之掃描對焦面 示意圖。 【主要元件符號說明】 數據處理裝置 10 影像擷取裝置 20 支架 22 對焦面 24 吸筆 30 承載部 40 容置孔 42 容置部 420 通光部 422 鏡片 50 光學部 500 基座 502The first figure is a schematic diagram of a device for quickly detecting a lens defect according to a preferred embodiment of the present invention, and the second figure is a partial enlarged view of the first image along the second image; FIELD OF THE INVENTION The present invention is a method for rapidly detecting lens defects. The fifth embodiment of the present invention is a method for rapidly detecting lens defects. The preferred embodiment of the defective lens 1362489 6 is a top view of a defective lens according to a preferred embodiment of the present invention; and FIG. 7 is a schematic view of a scanning focus surface of a preferred embodiment of the method for rapidly detecting a lens defect of the present invention. [Description of main component symbols] Data processing device 10 Image capture device 20 Bracket 22 Focus surface 24 Pen 30 Holder 40 accommodating hole 42 Socket 420 Light 422 Lens 50 Optical part 500 Base 502