200925589 九、發明說明： 【發明所屬之技術領域】 本發明係與檢測玻璃基板有關，特別是指一種可同時 檢測上、下玻璃基板之方法與設備。 5【先前技術】 液晶面板主要係由二片導電玻璃之間設有液晶材料所 組成’在導電玻璃的製造過程中，通常是先製造出一片面 β 積較大的玻璃基板，然後再將大面積之玻璃基板切割成數 片小面積玻璃基板，使切割後的各玻璃基板可對應於液晶 10 面板之尺寸，以便於使用在後續的液晶面板製程。 但是，在上述小面積玻璃基板切割完成之後，必須以 檢查人員目視觀察基板的邊緣是否具有缺角或是其他瑕 疵’而檢查人員在檢視的過程中，也必須先針對玻璃之一 側表面進行觀察後，再將玻璃翻至另一面，才能繼續進行 I5檢視，使得檢視玻璃基板的過程較長，檢測程序也較為複 ⑩ 雜與麻煩。另外’若是玻璃基板具有細微的結構瑕疫， 以人工目視之方式也不易發現，影響整體檢測品質。 【發明内容】 20 因此’本發明之主要目的乃在於提供一種玻璃檢測方200925589 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD The present invention relates to detecting a glass substrate, and more particularly to a method and apparatus for simultaneously detecting upper and lower glass substrates. 5 [Prior Art] The liquid crystal panel is mainly composed of a liquid crystal material between two conductive glasses. In the manufacturing process of conductive glass, a glass substrate with a large surface β is usually produced first, and then large. The glass substrate of the area is cut into a plurality of small-area glass substrates, so that the glass substrates after cutting can correspond to the size of the liquid crystal 10 panel, so as to be used in the subsequent liquid crystal panel process. However, after the above-mentioned small-area glass substrate is cut, it is necessary to visually observe whether the edge of the substrate has a corner or other flaws by the inspector, and the inspector must observe the side surface of the glass first during the inspection. After that, the glass is turned to the other side to continue the I5 inspection, so that the process of inspecting the glass substrate is long, and the detection procedure is complicated and troublesome. In addition, if the glass substrate has a fine structure plague, it is not easy to find by manual visual inspection, which affects the overall detection quality. SUMMARY OF THE INVENTION Therefore, the main object of the present invention is to provide a glass detector.
法’其可同時檢測上、下玻璃之邊緣’提高檢測速度與口 質。 I 本發明之另一目的則在於提供一種玻螭檢測設備，其 可同時進行上、下玻璃之檢測工作。 一 200925589 為達成前揭目的，本發明所提供之玻璃檢測方法，包 含有：一、先放置一玻璃基板，使該玻璃基板之邊緣對準 一取像器；二、使一第一光源自該玻璃基板之上方朝該玻 璃基板發出光線，並使一第二光源自該玻璃基板之下方朝 該玻璃基板發出光線；三、移動該玻璃基板或該取像器，The method 'can simultaneously detect the edges of the upper and lower glass' to improve the detection speed and the mouth quality. I Another object of the present invention is to provide a glass ray detecting apparatus which can simultaneously perform inspection of upper and lower glass. In order to achieve the foregoing, the present invention provides a glass detecting method comprising: first, placing a glass substrate such that an edge of the glass substrate is aligned with an image finder; and second, making a first light source The glass substrate emits light toward the glass substrate, and a second light source emits light from the lower side of the glass substrate toward the glass substrate; 3. moving the glass substrate or the image capturing device,
10 使該取像器摘取該破璃基板之邊緣影像；以及四、判斷該 取像器所取得之影像。而應用該玻璃檢測方法之設備則包 含有：一基座；一設於該基座之取像器；一承載台可移動 地設於該取像器之下方；一第一光源設於該取像器與該承 載台之間’用以朝該承載台發出光線；以及一第二光源設 於該承載台之下方，用以朝該承載台發出光線。藉此，應 用本發明所提供之檢測方法與設備，即可達成同時檢測 上、下玻璃基板之邊緣，提高檢測速度與品質等目的。 15【實施方式】 以下’兹配合圖式列舉一較佳實施例，用以說明本發 明之詳細結構與功效。 請參閱第一圖所示’係為本發明一較佳實施例所提供 之玻璃檢測設備(10)，其包含一基座(2〇)、一取像器(3〇)、 2〇 —承載台(40)、一第一光源(6〇)，以及一第二光源(70)。 取像器（30)係為線掃描式感光耦合元件（charge Coupled Device，CCD)，取像器(30)設於基座(2〇)之頂側。承 載台（40)可移動地設於取像器（30)下方。第一光源(6〇)設於 基座(20)，且位於取像器(3〇)之一鏡頭(32)與承載台（40)之 200925589 環狀:势光:、(:〇)係為同軸光源，亦即第-光源(60)為中空 方向二光錄—ί源(6〇)可自承载台(4〇)上方朝承載台(4〇) (4Q) 線。苐二光源(70)設於基座(20),且位於承載台 第一光源(70)係為穿透光，第二光源(70)可自承 5 。^下方朝承載台州方向發出光線。 Ο ❹ 當欲應用本發明所提供之玻璃檢測設備⑽檢測一玻 璃土板(80) ’主要係依照下列方法進行檢測： L將玻璃基板(80)放置於承載台(40)，使玻璃基板(80) 邊緣對準取像器(30)之鏡頭(32)下方。 1〇 2.使第一光源(60)與第二光源(70)產生出光線，第一光 源(6〇)向下朝玻璃基板(8〇)發出光線，第二光源(70)則向上 朝玻璃基板(80)發出光線。第一光源(6〇)所投射出之光線在 接觸到玻璃基板(80)後隨即反射，進而再穿過第一光源(6〇) 中央成像於取像器(30)，第二光源(7〇)所投射出的光線則會 15穿過玻璃基板(80)與第一光源(60)中央而也成像於取像器 (3〇)。 3.藉由承載台(40)移動玻璃基板(8〇)，取像器(3〇)即可 擷取到第一光源(60)與第二光源(70)投射於基板(8〇)邊緣的 光線，亦即使取像器(30)取得玻璃基板(8〇)邊緣之影像。 2〇 4.當取像器(30)取得玻璃基板(80)的數位影像之後，利 用一資料處理裝置以如第五圖所示之演算流程分析取像器 (30)取得之影像資料，用以判斷出玻璃基板(80)邊緣的結構 特性。 藉由玻璃檢測設備（10)與上述檢測方法檢測玻璃基板 6 200925589 (80)時’如第二圖所示意之狀態，第一光源(6〇)發出的光線 (62)係直接朝玻璃基板(80)投射，光線(62)接觸到基板(8〇) 的上表面之後會反射而穿經第一光源(60)中央，然後再進入 取像器（30)之鏡頭(32)内。第二光源(70)所發出的光線(72) 5則可穿過基板(80)與第一光源(60)中央，也進入取像器(3〇) 的鏡頭(32)内。若是基板(80)的上、下表面都呈平整狀，由 於經過玻璃基板(80)反射之第一光源(60)的光線(62)與穿透 ® 過基板(8〇)之第二光源(70)的光線(72)皆完整地成像於取像 器(30)，使取像器(30)擷取到的影像資料係為基板(80)之上 10下表面皆呈平整狀的成像資料。 如第三圖所示’若是基板(80)之上表面邊緣具有一缺角 (82)，第一光源(60)朝玻璃基板(80)射出的部分光線在接觸 到缺角（82)表面之後會反射而呈散射光，第二光源(7〇)朝玻 璃基板(80)射出的部分光線穿經基板(8〇)之缺角（82)後亦呈 15散射光。由於第一光源(60)與第二光源(70)投射於缺角（82) ❹ 位置之光線都成為散射光，進而無法成像於取像器(3〇)，取 像器（30)在取得影像資料之後，藉由如第五圖所示之影像資 料演算流程，先將瑕庇影像抽出之後，再分析瑕疫影像之 特徵值’然後將瑕疲影像進行分類，資料處理裝置即可辨 2〇別第一光源(60)之部分成像資料與第二光源(7〇)的部份成 像資料，進而判斷出玻璃基板(80)於上表面具有缺角（82)。 再如第四圖所示’若是基板(8〇)之下表面邊緣具有缺角 (84)時’第一光源(6〇)投射於基板(80)的光線可不受影響地 反射進入取像器(30)，但第二光源(70)投射於基板(8〇)的部 7 200925589 分光線，則會在接觸到缺角（84)表面之後呈散射光而無法成 像於取像器(30)，使得取像器(3〇)擷取到的影像資料只有第 一光源(60)的完整成像影像與部份第二光源(7〇)的成像資 料，進而即可辨別出缺角（84)出現於基板(8〇)之下表面。 5 經由本發明所提供之檢測方法與設備，當基板(80)之缺 角（84)的存在位置不同時，第一光源(6〇)與第二光源(7〇)成 像於取像器(30)的影像資料即會隨之改變，再搭配影像資料 © 的處理與判斷，即可同時檢測基板(80)的上表面或是下表 面。另外，利用不同成像狀態產生不同的影像資料，可以 10進而辨別出基板(80)具有缺角、裂痕、或者是破損等問題， 即便裂痕或是缺角非常細微也能檢查出來。而應用本發明 之方法與設備，可以在短時間内檢測不同尺寸之LCD或是 玻璃基板，*且應關單的檢測程序與時間就可完成檢測。 藉此，本發明即達成同時檢測上、下玻璃之邊緣，' 15 高檢測速度與品質等目的。 8 200925589 【圖式簡單說明】 第一圖係本發明一較佳實施例之示意圖，主要顯示檢 測設備之狀態。 第二圖係本發明一較佳實施例之示意圖，主要顯示檢 測一平整玻璃基板之狀態。 第三圖係本發明一較佳實施例之示意圖，主要顯示檢 測玻璃基板之上表面具有缺角的狀態。 第四圖係本發明一較佳實施例之示意圖，主要顯示檢 測玻璃基板之下表面具有缺角的狀態。 第五圖係本發明一較佳實施例之檢測演算流程圖。 【主要元件符號說明】 10玻璃檢測設備 20基座 30取像器 32鏡頭 15 40承載台 60第一光源 ❹ 62光線 70第二光源 72光線 80玻璃基板 82缺角 84缺角10: taking the image picker to extract an edge image of the glass substrate; and fourth, determining an image obtained by the image capture device. The device for applying the glass detecting method comprises: a pedestal; an image finder disposed on the pedestal; a carrier movably disposed under the image finder; a first light source is disposed at the finder The image between the imager and the carrier is configured to emit light toward the carrier; and a second light source is disposed under the carrier for emitting light toward the carrier. Thereby, the detection method and the device provided by the invention can achieve the purpose of simultaneously detecting the edges of the upper and lower glass substrates, and improving the detection speed and quality. [Embodiment] Hereinafter, a preferred embodiment will be described with reference to the drawings to explain the detailed structure and function of the present invention. Please refer to the first figure as a glass detecting device (10) provided by a preferred embodiment of the present invention, which comprises a base (2〇), an image finder (3〇), 2〇-bearing A stage (40), a first light source (6 inches), and a second light source (70). The image pickup device (30) is a line scanning type photosensitive coupler (CCD), and the image pickup unit (30) is provided on the top side of the base (2). The loading platform (40) is movably disposed below the image finder (30). The first light source (6 〇) is disposed on the pedestal (20), and is located at one of the lens (32) of the image finder (3) and the bearing platform (40). 200925589 Ring: Potential light: (: 〇) For the coaxial light source, that is, the first light source (60) is a hollow direction, the light source (6 〇) can be self-supported (4 上方) above the carrying platform (4 〇) (4Q) line. The second light source (70) is disposed on the base (20), and is located at the carrying platform. The first light source (70) is transparent light, and the second light source (70) is self-supporting. ^The light is emitted towards the direction of Taizhou. ❹ ❹ When a glass detecting device (10) to be applied by the present invention is used to detect a glass earth plate (80) 'mainly tested according to the following method: L. The glass substrate (80) is placed on the carrying table (40) to make the glass substrate ( 80) Align the edge under the lens (32) of the imager (30). 1〇2. The first light source (60) and the second light source (70) generate light, the first light source (6〇) emits light downward toward the glass substrate (8〇), and the second light source (70) upwards The glass substrate (80) emits light. The light projected by the first light source (6〇) is reflected after contacting the glass substrate (80), and then passes through the first light source (6〇) to form a central image on the image finder (30), and the second light source (7)投射) The projected light 15 passes through the glass substrate (80) and the center of the first light source (60) and is also imaged on the image finder (3 〇). 3. The glass substrate (8〇) is moved by the carrying platform (40), and the image capturing device (3〇) can be drawn to the edge of the substrate (8〇) by the first light source (60) and the second light source (70). The light is also obtained even if the image capture device (30) takes an image of the edge of the glass substrate (8 inches). 2〇4. After the image capture device (30) obtains the digital image of the glass substrate (80), the image data obtained by the image capture device (30) is analyzed by a data processing device using a data processing device as shown in FIG. To determine the structural characteristics of the edge of the glass substrate (80). When the glass substrate 6 200925589 (80) is detected by the glass detecting device (10) and the above detecting method, as shown in the second figure, the light (62) emitted by the first light source (6 系) directly faces the glass substrate ( 80) Projection, after the light (62) contacts the upper surface of the substrate (8〇), it will reflect and pass through the center of the first light source (60), and then enter the lens (32) of the image finder (30). The light (72) 5 emitted by the second light source (70) can pass through the center of the substrate (80) and the first light source (60) and also into the lens (32) of the image pickup unit (3). If the upper and lower surfaces of the substrate (80) are flat, the light source (62) of the first light source (60) reflected by the glass substrate (80) and the second light source of the penetrating substrate (8 inch) are 70) The light (72) is completely imaged on the image finder (30), so that the image data captured by the image finder (30) is the image data of the substrate (80) which has a flat surface on the lower surface of the substrate (80). . As shown in the third figure, if the surface edge of the substrate (80) has a notch (82), part of the light emitted by the first light source (60) toward the glass substrate (80) is in contact with the surface of the notch (82). Reflected light is reflected, and part of the light emitted by the second light source (7〇) toward the glass substrate (80) passes through the notch (82) of the substrate (8〇) and is also 15 scattered light. Since the light of the first light source (60) and the second light source (70) projected at the notch (82) ❹ position becomes scattered light, and thus cannot be imaged in the image pickup device (3〇), the image pickup device (30) is obtained. After the image data, by the image data calculation process as shown in the fifth figure, the image of the plague image is extracted first, and then the characteristic value of the plague image is analyzed, and then the image of the fatigue image is classified, and the data processing device can identify 2 A part of the imaging data of the first light source (60) and a part of the imaging data of the second light source (7〇) are discriminated, and it is determined that the glass substrate (80) has a notch on the upper surface (82). As shown in the fourth figure, if the surface edge of the substrate (8 〇) has a notch (84), the light of the first light source (6 投射) projected on the substrate (80) can be reflected into the image finder without being affected. (30), but the second light source (70) is projected onto the portion 7 of the substrate (8〇) 200925589, and the light is scattered after contacting the surface of the notch (84) and cannot be imaged to the image finder (30). Therefore, the image data captured by the image capturing device (3〇) is only the image of the complete image of the first light source (60) and the image of the second light source (7〇), so that the missing corner (84) can be identified. On the surface below the substrate (8〇). 5 Through the detection method and apparatus provided by the present invention, when the positions of the missing corners (84) of the substrate (80) are different, the first light source (6〇) and the second light source (7〇) are imaged on the image finder ( 30) The image data will change accordingly, and with the processing and judgment of the image data ©, the upper surface or the lower surface of the substrate (80) can be simultaneously detected. In addition, by using different imaging states to generate different image data, it is possible to discriminate that the substrate (80) has problems such as lack of corners, cracks, or breakage, and even if the crack or the corner is very fine, it can be inspected. By applying the method and device of the present invention, different sizes of LCD or glass substrates can be detected in a short time, and the detection process and time should be completed. Thereby, the invention achieves the purpose of simultaneously detecting the edge of the upper and lower glass, '15 high detection speed and quality. 8 200925589 [Simple Description of the Drawings] The first drawing is a schematic view of a preferred embodiment of the present invention, mainly showing the state of the detecting device. The second drawing is a schematic view of a preferred embodiment of the present invention, which mainly shows the state of detecting a flat glass substrate. The third drawing is a schematic view of a preferred embodiment of the present invention, which mainly shows a state in which the upper surface of the glass substrate is detected to have a missing angle. The fourth drawing is a schematic view of a preferred embodiment of the present invention, which mainly shows a state in which the lower surface of the glass substrate is detected to have a missing angle. The fifth figure is a flow chart of the detection algorithm of a preferred embodiment of the present invention. [Main component symbol description] 10 glass inspection equipment 20 pedestal 30 image finder 32 lens 15 40 carrier 60 first light source ❹ 62 light 70 second light source 72 light 80 glass substrate 82 notched angle 84 angle