TWI343464B - - Google Patents
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- Publication number
- TWI343464B TWI343464B TW094112680A TW94112680A TWI343464B TW I343464 B TWI343464 B TW I343464B TW 094112680 A TW094112680 A TW 094112680A TW 94112680 A TW94112680 A TW 94112680A TW I343464 B TWI343464 B TW I343464B
- Authority
- TW
- Taiwan
- Prior art keywords
- gas
- unit
- flow path
- support member
- fixing plate
- Prior art date
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F17—STORING OR DISTRIBUTING GASES OR LIQUIDS
- F17D—PIPE-LINE SYSTEMS; PIPE-LINES
- F17D1/00—Pipe-line systems
- F17D1/02—Pipe-line systems for gases or vapours
- F17D1/04—Pipe-line systems for gases or vapours for distribution of gas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/34—Hydrogen distribution
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Details Of Valves (AREA)
- Valve Housings (AREA)
- Pipeline Systems (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004140039A JP4567370B2 (ja) | 2004-05-10 | 2004-05-10 | ガス供給集積ユニット |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200538678A TW200538678A (en) | 2005-12-01 |
TWI343464B true TWI343464B (fr) | 2011-06-11 |
Family
ID=35320469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094112680A TW200538678A (en) | 2004-05-10 | 2005-04-21 | Gas supply integration unit |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4567370B2 (fr) |
KR (1) | KR101074265B1 (fr) |
CN (1) | CN100440454C (fr) |
TW (1) | TW200538678A (fr) |
WO (1) | WO2005109482A1 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4753173B2 (ja) * | 2005-06-17 | 2011-08-24 | 株式会社フジキン | 流体制御装置 |
JP2008014390A (ja) * | 2006-07-05 | 2008-01-24 | Hitachi Metals Ltd | 集積形流体制御装置 |
US7807222B2 (en) * | 2007-09-17 | 2010-10-05 | Asm International N.V. | Semiconductor processing parts having apertures with deposited coatings and methods for forming the same |
JP5000469B2 (ja) * | 2007-12-05 | 2012-08-15 | 株式会社キッツエスシーティー | 容器用ブロックバルブ |
JP5410173B2 (ja) * | 2009-06-30 | 2014-02-05 | Ckd株式会社 | ガス供給装置 |
JP5775696B2 (ja) * | 2011-01-31 | 2015-09-09 | 株式会社フジキン | 流体制御装置 |
JP5559842B2 (ja) * | 2012-06-18 | 2014-07-23 | 株式会社テムテック研究所 | 集積ガス供給装置用の平面発熱板およびその製造方法 |
JP5753831B2 (ja) * | 2012-11-29 | 2015-07-22 | 株式会社フジキン | 流体制御装置 |
JP6966499B2 (ja) * | 2019-03-06 | 2021-11-17 | Ckd株式会社 | ガス供給ユニット及びガス供給方法 |
JP7482533B2 (ja) * | 2019-06-28 | 2024-05-14 | 株式会社フジキン | 流体制御装置 |
WO2023120402A1 (fr) * | 2021-12-22 | 2023-06-29 | 株式会社プロテリアル | Vaporisateur |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5964254A (en) * | 1997-07-11 | 1999-10-12 | Advanced Delivery & Chemical Systems, Ltd. | Delivery system and manifold |
AU4548999A (en) | 1998-06-08 | 1999-12-30 | Advanced Delivery & Chemical Systems, Ltd. | Chemical delivery system having purge system utilizing multiple purge techniques |
JP2001073144A (ja) * | 1999-09-03 | 2001-03-21 | Pioneer Electronic Corp | 化学気相成長法における原料供給装置 |
JP2002173777A (ja) * | 2000-12-01 | 2002-06-21 | C Bui Res:Kk | Cvd装置の金属液体気化ユニット及び気化方法 |
JP3767897B2 (ja) * | 2004-03-01 | 2006-04-19 | シーケーディ株式会社 | ガス供給集積ユニット |
-
2004
- 2004-05-10 JP JP2004140039A patent/JP4567370B2/ja not_active Expired - Fee Related
-
2005
- 2005-04-15 KR KR1020067025097A patent/KR101074265B1/ko active IP Right Grant
- 2005-04-15 WO PCT/JP2005/007308 patent/WO2005109482A1/fr active Application Filing
- 2005-04-15 CN CNB2005800149890A patent/CN100440454C/zh not_active Expired - Fee Related
- 2005-04-21 TW TW094112680A patent/TW200538678A/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP4567370B2 (ja) | 2010-10-20 |
CN1950931A (zh) | 2007-04-18 |
KR20070011549A (ko) | 2007-01-24 |
KR101074265B1 (ko) | 2011-10-19 |
CN100440454C (zh) | 2008-12-03 |
WO2005109482A1 (fr) | 2005-11-17 |
TW200538678A (en) | 2005-12-01 |
JP2005322797A (ja) | 2005-11-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |