TWI310087B - - Google Patents
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- Publication number
- TWI310087B TWI310087B TW95138916A TW95138916A TWI310087B TW I310087 B TWI310087 B TW I310087B TW 95138916 A TW95138916 A TW 95138916A TW 95138916 A TW95138916 A TW 95138916A TW I310087 B TWI310087 B TW I310087B
- Authority
- TW
- Taiwan
- Prior art keywords
- carrier
- test
- tray
- carrying
- disk
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 86
- 238000000034 method Methods 0.000 claims description 7
- 238000010998 test method Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims 1
- 239000000047 product Substances 0.000 description 9
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 7
- 238000012546 transfer Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000000969 carrier Substances 0.000 description 1
- 239000012050 conventional carrier Substances 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010977 jade Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
Landscapes
- Automatic Analysis And Handling Materials Therefor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95138916A TW200819749A (en) | 2006-10-20 | 2006-10-20 | Method to test electronic product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95138916A TW200819749A (en) | 2006-10-20 | 2006-10-20 | Method to test electronic product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200819749A TW200819749A (en) | 2008-05-01 |
| TWI310087B true TWI310087B (enrdf_load_html_response) | 2009-05-21 |
Family
ID=44769918
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95138916A TW200819749A (en) | 2006-10-20 | 2006-10-20 | Method to test electronic product |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200819749A (enrdf_load_html_response) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI465746B (zh) * | 2011-12-28 | 2014-12-21 | Advantest Corp | Electronic component testing device |
-
2006
- 2006-10-20 TW TW95138916A patent/TW200819749A/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI465746B (zh) * | 2011-12-28 | 2014-12-21 | Advantest Corp | Electronic component testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200819749A (en) | 2008-05-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |