200819749 九、發明說明： 【發明所屬之技術領域】 本發明係與電子產品製程有關，特別是指一種對電子 產品進行測試作業之方法。 5【先前技術】 • ★在-般電子產品(如··快閃記憶體)的製造流程中，該等 械品或是钱品狀放胁承载錄ay)中進行 _ 製造程序之各流程。 、般的承載盤32，請參閱第二圖所示，為一由塑膠一 1〇 =成形^矩形盤體，其上具有若干以凸肋所圈圍出之承載 口=4，每-承載部34之形狀與電子產品(圖示中顯示為記 L 38)相似，但尺寸較大，可供一電子產品％放置於其 中，而不會任意移動。且該承載盤32之周緣具有—呈矩環 形之凸條36。 15 t記憶卡製作完成後，需進行測試作#，以檢測記憶 • +的電路。一般的測試作業是將記憶卡24由承載盤20取 v 料放4於—測試盤(未顯示Η。接著將制試盤放置於一 f測機(未顯示）中。該檢測機具有若干探針卡，可壓抵於記 • 彳思卡之金手指，藉以檢測記憶卡的電路。 20 一般將記憶卡由承載盤轉移至測試盤的程序有以人工 與自動化機械二種。以人工方式進行者是以操作員用手一 個-個將記憶卡由承載盤取出再放置於測試盤，這樣的操 作十分費時。以自動化機械進行者是利用機械手臂承载盤 中之記憶卡抓取至測試盤，然自動化機械的成本高。 200819749 【發明内容】 作鞏之主要目的在於提供一種對電子產品進行測試 由承載*轉移5以成本低廉的方式’將電子產品快速地 :现轉：至測試盤，以進行測試作業。 進行測述之發明目的，本發明所提供之對電子產品 載盤以頂^之方法，、包含訂列步驟：首先將—測試承 上Ϊ载有若，蓋在一承載盤上，其中該承载盤 t之盤位於該測試承載盤之上方，藉以使該承 =之$子產—认該測試承載盤中；接著 載盤，以對該等電子產品進行賴作業。 Μ承 【實施方式】 15 為了詳細說明本發明之構造及特點所在，轉 較佳貫施例並配合圖式說明如后： 之 請參閱第-圖所示，本發明第_實 ;置10主要是由-基座12、-測試承載盤：及5 盤32所組成。 以及—承載 該基座12具有—矩形底板16，其 的側牆18 ’而該侧牆18頂端之水平段定義二择里 ，此圈圍出-上方具有—矩形開口之容置空間22了=座 12在沒有侧牆之一側形成一出入口。 土座 該測試承載盤Η是由若干測試盤24所組成，每—測 20 200819749 5200819749 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to an electronic product process, and more particularly to a method of testing an electronic product. 5 [Prior technology] • In the manufacturing process of general-purpose electronic products (such as flash memory), the processes of the manufacturing process are carried out in the goods or in the form of money. The general carrier tray 32, as shown in the second figure, is a plastic disk 1 〇 = shaped ^ rectangular disk body, which has a plurality of bearing ports surrounded by ribs = 4, each - bearing portion The shape of 34 is similar to that of an electronic product (shown as L 38 in the drawing), but the size is large, and an electronic product can be placed therein without any movement. And the periphery of the carrier 32 has a ridge 63 which is a ring-shaped ring. After the 15 t memory card is created, it is necessary to test ## to detect the memory + + circuit. The general test operation is to take the memory card 24 from the carrier tray 20 to the test tray (the 盘 is not shown. Then the test tray is placed in a f-test machine (not shown). The detector has several probes. The needle card can be pressed against the gold finger of the memory card to detect the circuit of the memory card. 20 Generally, the program for transferring the memory card from the carrier disk to the test disk is manually and automatically. The operation is very time-consuming by the operator taking out the memory card from the carrier tray one by one, and the operation is very time consuming. The automated mechanical player uses the memory card in the mechanical arm carrier to capture the test disk. However, the cost of automated machinery is high. 200819749 [Summary of the Invention] The main purpose of the work is to provide a test for electronic products by carrying * transfer 5 in a low-cost way to 'electronic products quickly: now: to the test disk, Performing the test operation. For the purpose of the invention, the method for the electronic product carrier provided by the present invention includes the steps of the order: firstly, the test carrier is loaded with Covered on a carrier tray, wherein the tray of the carrier tray t is located above the test carrier tray, so that the handset of the carrier is recognized in the test carrier; then the carrier is loaded to the electronic product In order to explain the structure and characteristics of the present invention in detail, the preferred embodiment is described with reference to the following description: The set 10 is mainly composed of a - base 12, a test carrier: and a 5 disk 32. And - the carrier 12 has a rectangular bottom plate 16 with a side wall 18' and the top of the side wall 18 In the definition of the segment, the ring encloses an upper accommodating space 22 having a rectangular opening. The seat 12 forms an entrance and exit on one side of the side wall. The earth bearing test tray is composed of a plurality of test disks 24 Composition, each - test 20 200819749 5
I:、有2排承載部26’可供容置電子產品38(圖中夸-兔 該等承載部26為設置於該等測試㈣上之二 =成漏巧’亦即’該等承栽部26之頂端開口處的八尺 、乂 而底端的尺寸較小（第四圖參照;）。該等Mu、 =該基座12W該容^ ;二24之—側邊緣位於該垣部20的下方，藉《使 式盤二4不會自基座12上方之開口脫出。 n則 田預疋數里（圖不中顯不為8個）之測試盤24插 ^ 12之容置空間22中後，可將—塞件28自該基座= =口插人，並頂抵最外侧之職盤14。該塞件烈之 =垣部30 ’其與該基底10之垣部2〇等高，以盘兮義 底1〇之垣部2G組合成—矩形之粒部。 ’…基 該承載盤32為習用之承載盤，其上 I供容置記憶卡38,週緣具有—凸條％。 表㈣ 15 當記憶卡38製造完成後’其纽置在該承載盤32之 承載部34中。首先將該基座12(該等測試盤以容裝於其中） 以=面朝下之方式覆蓋在該承雜32上(如第三圖所示）。 ^日守名承載盤32的凸條36會與該基座1〇之垣部2〇對 合，如此可令各該測試盤24之承載部26對準該承载盤32 20 =承載部34 (如第四圖所示），此動作可稱為定位步驟。接 著，進行翻轉動作，使該承載盤32位於該測試承載盤14 的上方。此時會造成該承載盤32的承载部34中的記憶卡 38會落入該測試承载盤10之承载部24中（如第五圖所示）。 接著’移開該承載盤32(如第六圖所示)後，取下該塞 6 200819749 件28’再--取出該等測試盤24，放置於一測試機(未顯示） 下進行測試。操作員以人工取出未通過測試之記憶卡％， 然後再將測試完畢之職盤24插回該基座1G中，再插入 該塞件26。 _ 5 下一個步驟是將該承載盤32以頂面朝下的方式覆蓋在 - 該基座=上(如第五圖所示），然後同樣進行翻轉(如第=圖 _ 所示），藉以將通過測試作業之記憶卡38轉移回該承載盤 _ 32上。最後即可將該承載盤32送走以進行後續之流程。 在此要提出說明的是··該等測試盤14之承載部26頂 1〇端開口處的尺寸與該承載盤32的承載部34近似，藉以使 記憶卡38可順利地由該承載盤32的承載部34掉落至該等 測試盤24之承載部26中；而該等測試盤24之承载部26 底端的尺寸僅略大於記憶卡38,藉以將記憶卡38拘束於一 定位，避免當進行測試作業時，因記憶卡偏離預定位置而 15 造成的誤測。 _ 另外’由於一般的承載盤32有15排的承載部34，而 本發明之測試盤24具有2排承載部26。為將承載盤32上 所有的§己憶卡38 —次轉移至測試承載盤14,因此我們提供 1 了 8個測試盤24(共16排承載部），在轉移程序完成後，會 2〇有一測試盤24僅一排承載部26中具有記憶卡（第六圖中最 内側的測試盤14)，但此一測試盤24並不會造成測試作業 發生問題。當然，測試盤也可設計為具有1排、3排或更多 排的承载部，其主要是配合測試機的規格。 請參閱第七圖所示，本發明第二實施例所提供之移轉 7 200819749 裝置4〇包含有一基座42、一測試承載盤14以及一承載盤 32 ’其中該第一與承載盤14, 32與前相同，故不重複敘述。 該基座42為一矩形框架，其一側端具有一出入口，頂 側與底側為摟空狀，在該出入口二侧的邊牆44内側具有一 5第一滑軌46以及二第二滑執48位於該第一滑軌46之二 側。該第—與第二滑轨46, 48為邊牆上的凹槽，分別供該 第一與承载盤14, 32插入，並沿著該等滑轨46, 48移動而 收容於該基座42中。 在使用時，首先將該測試承載盤14之測試盤24，以承 W载部26朝下的方式，一 一插入該基座42之第一滑執46中 (弟七圖所示）。接著將該承載盤32插入該基座42位於下方 之第二滑執48中（第八圖所示），此時，該測試承載盤14位 於該承載盤32之上方，且該等測試盤24之承載部26對準 該承载盤32之承載部34。接著翻轉該基座42(第九圖所 15示），使該承载盤32位於上方，而測試承載盤14位於下方， 此時會造成承載盤32上之記憶卡38落入該測試承载盤μ 之承载部26中。最後逐一取出該等測試盤24(第十圖所 示），將其移動至測試機中進行測試作業。 測試完畢之測試盤24再一一插回該基座42中，然後 2〇翻轉該基座42 ’使該測试承載盤14位於上方，而承载盤 32位於下方，如此即可將測試承載盤14中之記憶卡38再 次移轉回該承載盤32。最後將該承載盤32取出，以進行下 —製程。… 以上的所揭之測試承载盤均是由複數個測試盤所組 200819749 务著私口為要合現有減機的規格所致。當缺知a 承載盤也可為一個整體，翻 田“、、忒測武 ，= 轉後直接移至測試機下進_ 的。-㈣測試機必須是配合測試承载盤的相關規格 優點在於利用簡單的襄置，即可使用人工將 大里5¾子產品（如記憶卡)在二不同功能的承 用之承賴與-般製造用承健)之畴移，=；(在= 的成本下，執行大量製造之功能。 200819749 【圖式簡單說明】 第一圖為本發明第一較佳實施例之立體圖，— 上 示基座 與測試承載盤， 第二圖為本發明第一較佳實施例之立體圖，一 嘴不基座 5 與測試承載盤以及承載盤； 第三圖為本發明第一較佳實施例之立體圖，顯厂、 與測試承載盤準備覆蓋在承载盤上； 、不土主I: There are two rows of load-bearing portions 26' for accommodating electronic products 38 (in the figure, the load-bearing portions 26 are provided on the test (four), and the two are placed on the test (four). The top end of the portion 26 is eight feet long and the bottom end is small in size (refer to the fourth figure;). The Mu, the base 12W, and the side edge of the second portion are located at the crotch portion 20. Below, by "the disc 2 4 will not come out from the opening above the pedestal 12. n The field of the pre- 疋 ( ( (not shown in the figure is not 8) test disk 24 inserted ^ 12 accommodation space 22 Afterwards, the plug 28 can be inserted from the base == port and the top end of the service plate 14. The plug is strong = the crotch portion 30' and the crotch portion of the base 10, etc. High, the 2G of the 兮 底 底 组合 组合 组合 组合 组合 — 矩形 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' Table (4) 15 When the memory card 38 is manufactured, its button is placed in the carrying portion 34 of the carrier 32. First, the susceptor 12 (the test trays are accommodated therein) is placed face down. Covered on the bearing 32 (such as the third The ridges 36 of the idling carrier 32 are aligned with the ridges 2 of the base 1 so that the carrier 26 of each test tray 24 is aligned with the carrier 32 20 = The loading portion 34 (as shown in the fourth figure), this action may be referred to as a positioning step. Then, the flipping operation is performed such that the carrier 32 is located above the test carrier 14. At this time, the carrier 32 is loaded. The memory card 38 in the portion 34 will fall into the carrying portion 24 of the test carrier 10 (as shown in the fifth figure). Then, after removing the carrier 32 (as shown in the sixth figure), the Plug 6 200819749 piece 28' again - take out the test tray 24 and place it on a test machine (not shown) for testing. The operator manually removes the memory card that failed the test, and then the test is completed. 24 is inserted back into the base 1G, and the plug 26 is inserted. _ 5 The next step is to cover the carrier 32 with the top surface facing down - the base = (as shown in the fifth figure) Then, the flipping is also performed (as shown in Fig. _), whereby the memory card 38 passing the test job is transferred back to the carrier tray _32. The carrier tray 32 can then be sent away for subsequent processing. The dimensions of the top end opening of the bearing portion 26 of the test disc 14 and the bearing portion of the carrier tray 32 are described. 34 approximation whereby the memory card 38 can be smoothly dropped from the carrier portion 34 of the carrier tray 32 into the carrier portion 26 of the test tray 24; and the bottom end of the carrier portion 26 of the test tray 24 is only slightly larger in size The memory card 38 is used to constrain the memory card 38 to a position to avoid misdetection caused by the memory card deviating from the predetermined position when the test operation is performed. _ In addition, since the general carrier tray 32 has 15 rows of carriers 34 The test disc 24 of the present invention has two rows of load-bearing portions 26. In order to transfer all the § memories 38 on the carrier 32 to the test carrier 14, we have provided 8 test disks 24 (a total of 16 rows of carriers), and after the transfer process is completed, there will be one The test disk 24 has only one row of the carrying portion 26 with a memory card (the innermost test disk 14 in the sixth figure), but this test disk 24 does not cause a problem in the test operation. Of course, the test disc can also be designed as a carrier having 1 row, 3 rows or more rows, which is mainly adapted to the specifications of the test machine. Referring to the seventh embodiment, the second embodiment of the present invention provides a transfer base 7 200819749. The device 4 includes a base 42 , a test carrier 14 , and a carrier tray 32 ′ wherein the first and carrier trays 14 32 is the same as before, so the description is not repeated. The base 42 is a rectangular frame having an entrance and exit at one end, and a hollow shape on the top side and the bottom side. The side wall 44 on the two sides of the entrance and exit has a fifth first slide rail 46 and two second slides. The handle 48 is located on two sides of the first slide rail 46. The first and second slide rails 46, 48 are grooves on the side wall, and the first and the carrier trays 14, 32 are respectively inserted and moved along the rails 46, 48 to be received in the base 42. in. In use, the test disc 24 of the test carrier 14 is first inserted into the first slide 46 of the base 42 in a manner that the load carrying portion 26 faces downward (shown in Figure 7). The carrier tray 32 is then inserted into the second slider 48 of the base 42 (shown in FIG. 8). At this time, the test carrier 14 is located above the carrier tray 32, and the test trays 24 are The carrier portion 26 is aligned with the carrier portion 34 of the carrier disk 32. Then, the susceptor 42 is turned over (the ninth diagram is shown in FIG. 15), so that the carrier 32 is located above, and the test carrier 14 is located below, which causes the memory card 38 on the carrier 32 to fall into the test carrier. In the bearing portion 26. Finally, the test discs 24 (shown in the tenth figure) are taken one by one and moved to the test machine for testing. The tested test discs 24 are then inserted back into the base 42 one by one, and then the base 42' is flipped 2' so that the test tray 14 is located above, and the carrier tray 32 is located below, so that the test tray can be tested. The memory card 38 in 14 is again transferred back to the carrier tray 32. Finally, the carrier tray 32 is taken out for the next process. ... The above test bearers are all made up of a number of test discs. 200819749 The private port is due to the specifications of the existing reducer. When the lack of a carrier disk can also be a whole, turn the field ",, 忒 test, = turn directly to the test machine under the _. - (four) test machine must be in conjunction with the test carrier disk specifications, the advantages are in the use With a simple setup, you can use the manual to move the large-scale 53⁄4 sub-products (such as memory cards) in the domain of the two different functions and the manufacturing-based bearing, =; (at the cost of = The first figure is a perspective view of a first preferred embodiment of the present invention, the base and the test carrier are shown, and the second figure is a first preferred embodiment of the present invention. a perspective view, a nozzleless base 5 and a test carrier and a carrier tray; the third figure is a perspective view of the first preferred embodiment of the present invention, the display factory and the test carrier are prepared to be covered on the carrier tray;
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第四圖為本發明第一較佳實施例之剖視圖，顯示 承載盤在上，承載盤在下； 不^ 第五圖為本發明第一較佳實施例之剖視圖，顯示翻轉 第六圖為本發明第一較佳實施例之立體圖，顯示記憶 卡轉?至承賴巾，並取出―測試盤輯行測試作業；。 第七圖與第八圖為本發明第二較佳實施例之立體圖； 库第九圖為本發明第二較佳實施例之示意圖，顯示翻轉 枉斤，以及 ’顯示反轉 第十圖為本發明第二較佳實施例之立體圖 後取出測試承載盤。 200819749 【主要元件符號說明】 10轉移裝置 12基座 14測試承載盤 16底板 18側牆 20垣部 22容置空間 24測試盤 26承載部 28塞件 30垣部 32承載盤 34承載部 36凸條 38記憶卡 4〇轉移裝置 42基座 44邊踏 46第一滑軌 48第二滑軌 114 is a cross-sectional view of the first preferred embodiment of the present invention, showing the carrier tray on top and the carrier tray being under; FIG. 5 is a cross-sectional view showing the first preferred embodiment of the present invention, showing a sixth embodiment of the present invention. A perspective view of the first preferred embodiment shows that the memory card is transferred to the refitting towel and the "testing disk" test operation is taken out. 7 and 8 are perspective views of a second preferred embodiment of the present invention; FIG. 9 is a schematic view showing a second preferred embodiment of the present invention, showing a flipping pinch and a display inversion of the tenth figure After the perspective view of the second preferred embodiment is invented, the test carrier is taken out. 200819749 [Description of main components] 10 Transfer device 12 Base 14 Test carrier 16 Base plate 18 Side wall 20 垣 22 accommodating space 24 Test disk 26 Bearing portion 28 Plug 30 垣 32 Carrier plate 34 Bearing portion 36 rib 38 memory card 4 〇 transfer device 42 pedestal 44 side step 46 first slide rail 48 second slide rail 11