TWI310087B - - Google Patents

Description

1310087, 捽I month left-day correction replacement page IX, invention description: 匕-------- [Technical field of invention] The present invention relates to electronic production of ασ, especially to an electronic product The method of testing the job. 5 [Prior Art] In the manufacturing process of general electronic products (such as flash memory), the finished or semi-finished products of these electronic products are placed in the carrier (4)) for the manufacturing process. The general carrier tray 32, as shown in the second figure, is a rectangular disk body formed of a plastic body, and has a plurality of bearing ports 34' per-bearing portion 34 surrounded by ribs. The shape is similar to that of an electronic product (shown as memory card 38 in the illustration), but the size is large, and the memory card is placed in it without any decoration. And the periphery of the bearing 32 has a convex strip 36 which is in the form of a ring. m 15 When the memory card is created, a test job is required to detect the circuit that remembers the card. The usual test operation is to take the memory card 38 from the carrier tray 32 and place it on the tray (detail). Then place the wm disk in the - Detector (not shown). The detector has a plurality of probe cards that can be pressed against the gold fingers of the memory card to detect the circuit of the memory card. 20 Generally, the procedure for transferring a memory card from a carrier disk to a test disk is either manual or automated. In the way of human jade, the singer is the one who takes the memory card out of the carrier and puts it on the test tray. The operation of the robot is to use the mechanical arm to carry the memory card. Grab the test disk, but the cost of automated machinery is high. 4 1310087 % (Monthly/Day Correction Replacement Gong Yiyi·^ [Inventive Content] Job =; == For -f Electronics Test 5 ^哉舨Μ#" Cost-effective way to quickly and electronically Move to the test disc to perform the test operation. For the purpose of the invention described above, the method for the electronic product == under the cover of the present invention covers the product on the carrier tray; _ flip the test carrier and ^ The 吏k carrier disk is located above the test carrier disk, == test bearer... Then, the test operation is performed on the 4 electronic products. [Embodiment]

For a detailed description of the structure and features of the present invention, the preferred embodiment and the accompanying drawings are illustrated as follows: Referring to the first figure, the apparatus 10 provided by the first embodiment of the present invention is mainly composed of The seat 12, the test carrier 14 is composed of a disk 32. The susceptor 12 has a rectangular bottom plate 16 having three sides having a side wall 18 and a horizontal section 18 defined as a 垣 加 加 加 借此 借此 借此 借此 借此 借此 借此 借此 借此 借此 借此 借此 借此 借此The accommodating space 22 丄12 forms an entrance and exit on one side of the side wall. The κ soil sitting test test tray 14 is composed of a plurality of test trays 24, and is replaced by a test tray 24, which has two rows of load-bearing portions 26 for accommodating electronic products (Fig. Displayed as memory card 38). The load-bearing portions 26 are four-holes disposed above the test trays, such as a funnel shape, that is, the size of the top opening of the load-bearing portion 26 is large, and the size of the bottom end is small (the Four figures refer to). The test trays 24 can be inserted into the accommodating space 22 from the entrance and exit of the base 12 such that the two side edges of the test discs 24 are located below the cymbal 2 ,, so that the test discs 24 are not self-supporting. The opening above the seat 12 is released. When a predetermined number 24 (shown as eight in the figure) is inserted into the accommodating space 22 of the pedestal 12, a plug 28 can be inserted from the entrance and exit of the pedestal u and offset. The outermost job is 24. The plug member 28 has a heel portion 30' which is equal to the heel portion 2 of the base 10 to be combined with the heel portion 20 of the base 10 to form a rectangular positioning portion. earth

The carrier tray 32 is a conventional carrier tray having a plurality of 34 thereon for receiving the memory card 38, and the periphery has a ridge %. H 15 When the memory card 38 is manufactured, it is placed in the carrier 3 carrying portion 34. The susceptor 12 (the test discs 24 are already in the process) is first covered on the carrier tray 32 in a top-down manner (as shown). At this time, the ridges 36 of the carrier 32 will be aligned with the cymbals 20 of the susceptor 12, so that the bearing portion of each of the test disks 24 can be aligned with the carrier portion 34 of the =32 (such as the fourth As shown in the figure, this action can be called positioning Ϊ: performing a flipping action to make the carrier touch the test $::2. At this time, the carrying portion of the carrying tray 32 will be caused; the card 8 will be the bearer of the test carrying tray 14 (as shown in the fifth figure 6 20 *! 310087 II -_1 I ~ (monthly correction replacement After the removal of the carrier 32 (as shown in the sixth figure), the plugs 2 are removed, and the test trays 24 are removed one by one and placed in a test machine (not tested). The operator manually removes the memory card 38 that has not passed the test, and then inserts the tested test disk 24 back into the base 12, and then inserts the plug 28.

10

2〇 The next step is to cover the carrier 32 on the base 12 in a top-down manner (as shown in the fifth figure) and then flip it (as shown in the fourth figure), so that it will pass The memory card 38 of the test job is transferred back to the carrier tray 32. Finally, the carrier tray 32 can be sent away for subsequent processing. It should be noted that the size of the top opening of the bearing portion 26 of the test disc 24 is similar to that of the carrying portion 34 of the carrying tray 32, so that the memory card 38 can be smoothly carried by the carrying tray 32. The portion 3 4 is dropped into the load-bearing portion 26 of the test discs 24; and the bottom end of the load-bearing portion 26 of the test discs 24 is only slightly larger than the memory card 38' to constrain the memory card % to a positioning. Mistakes caused by the memory card deviating from the predetermined position when performing a test operation. In addition, since the general carrier tray 32 has 15 rows of carrier portions 34, the test tray 24 of the present invention has two rows of carrier portions 26. In order to transfer all the memory cards 38 on the carrier 32 to the test carrier 14, we have provided 8 test disks 24 (a total of 16 rows of carriers), in the transfer program Druid, the two have - test disk 24 only - The row bearing portion 26 has a test disc 2 sentence "sequence = 22 inner side, but this - the test disc 24 does not cause a problem in the test operation. Of course, the test disc can also be designed to have a row, 3 rows or More rows of load-bearing parts 'mainly match the specifications of the test machine. 7 ' 1310087 Please refer to the seventh figure, the transfer device 40 provided by the second embodiment of the present invention comprises a base 42 and a test carrier 14 and a carrier 32, which makes the test carrier 4 and the carrier 32 the same as before, so the description is not repeated.

10

The base 42 is a rectangular frame having an entrance and exit, and the top side and the bottom side are hollow. One side of the side wall 44 on the two sides of the entrance and exit has a first sliding handle 46 and two second sliding commands. 48 is located on the two sides of the first slipper 46. The first and second slides 46, 48 are the grooves on the side wall 44, and the test carrier tray 14 and the carrier tray 32 are respectively inserted and moved along the slides 46, 48 to be accommodated in the base. Block 42. In use, the test disc 2z carrying portion 26 of the test carrier 14 is first placed in a downwardly directed manner - in the first slip 46 of the base 42 (shown in Figure 7). Then, the carrier tray 32 is inserted into the second dragon 48 (the eighth figure) of the base 42 below. At this time, the test carrier is placed above the carrier 32 and the test trays The carrier portion % of the 24 is aligned with the carrier 32 and the carrier portion 34. Then, the base 42 is turned over (the ninth figure is omitted), so that the carrier tray 32 is located above, and the test carrier tray M is located below, and the memory card 38 on the shelf 32 is dropped onto the test carrier tray. It carries 1 26 towels. Finally, take out the above-mentioned positions and show that the 'shafts are worn (4). (9) Tested in Figure 10, the test disk 24 is inserted again into the base 42. (4) The base 42 is turned over so that the job = 32 is located below, so that the upper part is received, and the load is carried out. Transfer back to the carrier disk 3 ^ test the memory card 38 in the carrier disk 14 and then the disk 32. After the attack, the carrier 32 is taken out to perform the next 8 20 1310087

/Process. The unloaded load carrier is composed of a plurality of gamma test discs, because it is compatible with the specifications of existing test machines. Of course, the test carrier can also be a whole body. After flipping, it can be directly moved to the test machine for 5 test operations. At this time, the test machine must be in accordance with the relevant specifications of the test carrier disk. The advantage of the invention is that it is simple to use. The device can manually transfer a large number of electronic products (such as a memory card) between two different function trays (such as a test carrier tray and a general manufacturing carrier tray), so that the cost can be reduced at a low cost. Perform a large number of manufacturing functions. _ 1310087 10 [Simplified illustration of the drawings] The first figure is a perspective view of the first preferred embodiment of the present invention - the first picture is a perspective view of the first preferred embodiment of the present invention The second figure is a perspective view of the first preferred embodiment of the present invention, and the test carrier is prepared to be covered on the carrier. The fourth figure is a cross-sectional view of the first embodiment of the present invention. The fifth figure is the state after the cross-sectional view of the first preferred embodiment of the present invention; the sixth figure is the perspective view of the first preferred embodiment of the present invention, the gorge 1 card is transferred to the carrier tray, and the test tray is taken out The test operation is performed, and the second embodiment is a second preferred embodiment of the present invention. The ninth embodiment is a schematic view showing a second preferred embodiment of the present invention, and the tenth figure is a second preferred embodiment of the present invention. The perspective view of the example shows that the test carrier is removed afterwards. _ pedestal _ pedestal _ pedestal display test display flip display memory 15 1310087 [main component symbol description] 10 transfer device 12 pedestal 14 test carrier 16 bottom plate 18 side wall 20 22 22 housing space 24 test Disk 26 carrying portion 28 plug member 30 垣 portion 32 carrying tray 34 carrying portion 36 rib 38 memory card 40 transfer device 42 pedestal 44 side wall 46 first slid 48 second rail 11 1310087 q 蝉丨月日修正 replacement page

14 test carrier 28 plug member 34 bearing portion seven, designated representative map: (a) The representative representative map of the case is: (two (two) this representative map symbol symbol simple description 10 transfer device 12 base 20 垣 26 carrying Part 5 30 垣 32 32 carrying tray 36 rib 38 memory card

8. If there is a chemical formula in this case, please disclose the chemical formula that best shows the characteristics of the invention:

Claims (1)

1310087 l·, the scope of application for patents: 1. A method of testing an electronic product, wherein the electronic products are placed in a carrying portion of a carrier; the method comprises the following steps: first, a test carrier Covering the carrier tray in a top-down manner. The test bearing has a plurality of sockets aligned with the bearing portion of the bearing; then the test carrier tray and the carrier tray are flipped so that the carrier tray is located at the far test carrier The upper part of the disk is used to make the electrical load in the carrying portion of the carrying tray test the carrying portion of the carrying tray; then the test carrying tray is taken out to perform a test operation on the electronic product thereon. (4) The sub-product described in item 1 of the Yun Yun Cai (4) sub-products to test the carrier plate to the top of the job, and the program containing the bearing 15 15 is included, so that the parent can follow the == In the carrying portion, the pair of electronic products described in the test item 1 or item 2 is turned over by the ===the carrier disk and the carrier disk is mounted between the base plate; and when: The carrier can be used to set the carrier back to the substrate after measuring the carrier in two rows. There is a method for testing the electronic product according to the first application of the patent application No. 11 1310087, wherein the test carrier is placed directly in a test machine for testing. 6. The method of performing a test operation on an electronic product according to claim 1, wherein the test carrier is covered on the carrier, and further has a positioning step for the test carrier and the carrier The state in which the carrier portion located thereon is aligned. 13