TWI299534B - - Google Patents

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Publication number
TWI299534B
TWI299534B TW91120761A TW91120761A TWI299534B TW I299534 B TWI299534 B TW I299534B TW 91120761 A TW91120761 A TW 91120761A TW 91120761 A TW91120761 A TW 91120761A TW I299534 B TWI299534 B TW I299534B
Authority
TW
Taiwan
Prior art keywords
state
wafer
dies
die
test
Prior art date
Application number
TW91120761A
Other languages
English (en)
Chinese (zh)
Inventor
Tseng Ming-Song
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Priority to TW91120761A priority Critical patent/TWI299534B/zh
Application granted granted Critical
Publication of TWI299534B publication Critical patent/TWI299534B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW91120761A 2002-09-11 2002-09-11 TWI299534B (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW91120761A TWI299534B (OSRAM) 2002-09-11 2002-09-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW91120761A TWI299534B (OSRAM) 2002-09-11 2002-09-11

Publications (1)

Publication Number Publication Date
TWI299534B true TWI299534B (OSRAM) 2008-08-01

Family

ID=45069716

Family Applications (1)

Application Number Title Priority Date Filing Date
TW91120761A TWI299534B (OSRAM) 2002-09-11 2002-09-11

Country Status (1)

Country Link
TW (1) TWI299534B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI473972B (zh) * 2012-05-04 2015-02-21 Mpi Corp 半導體檢測系統的使用者介面的顯示方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI473972B (zh) * 2012-05-04 2015-02-21 Mpi Corp 半導體檢測系統的使用者介面的顯示方法

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