TWI292471B - - Google Patents
Download PDFInfo
- Publication number
- TWI292471B TWI292471B TW95138566A TW95138566A TWI292471B TW I292471 B TWI292471 B TW I292471B TW 95138566 A TW95138566 A TW 95138566A TW 95138566 A TW95138566 A TW 95138566A TW I292471 B TWI292471 B TW I292471B
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- lens
- image
- plane
- optical
- Prior art date
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95138566A TW200819704A (en) | 2006-10-19 | 2006-10-19 | Optical measurement device for out-of-plane displacement and method used thereby |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95138566A TW200819704A (en) | 2006-10-19 | 2006-10-19 | Optical measurement device for out-of-plane displacement and method used thereby |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI292471B true TWI292471B (ko) | 2008-01-11 |
TW200819704A TW200819704A (en) | 2008-05-01 |
Family
ID=44769900
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95138566A TW200819704A (en) | 2006-10-19 | 2006-10-19 | Optical measurement device for out-of-plane displacement and method used thereby |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200819704A (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI408331B (zh) * | 2009-12-17 | 2013-09-11 | Ind Tech Res Inst | 雙面光學膜片量測裝置與方法 |
TWI461650B (zh) * | 2012-04-17 | 2014-11-21 | Univ Nat Taiwan | 影像處理系統及其方法 |
CN107643055A (zh) * | 2017-09-29 | 2018-01-30 | 中国科学院西安光学精密机械研究所 | 基于偏振光束的自参考准直光路系统及计算被测角度方法 |
-
2006
- 2006-10-19 TW TW95138566A patent/TW200819704A/zh unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI408331B (zh) * | 2009-12-17 | 2013-09-11 | Ind Tech Res Inst | 雙面光學膜片量測裝置與方法 |
TWI461650B (zh) * | 2012-04-17 | 2014-11-21 | Univ Nat Taiwan | 影像處理系統及其方法 |
CN107643055A (zh) * | 2017-09-29 | 2018-01-30 | 中国科学院西安光学精密机械研究所 | 基于偏振光束的自参考准直光路系统及计算被测角度方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200819704A (en) | 2008-05-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103328921B (zh) | 单镜头全视场反射相显微镜 | |
JP5112588B2 (ja) | 精密工業部品の形状および幾何学的寸法を測定するための方法並びに装置 | |
JP5087186B1 (ja) | 等光路干渉計 | |
US9644947B2 (en) | Optical interferometric apparatus for real-time full-field thickness inspection and method thereof | |
US7545510B2 (en) | Method of characterizing transparent thin-films using differential optical sectioning interference microscopy | |
JP2014508922A5 (ko) | ||
TWI436029B (zh) | 光學式強度型三維表面形貌與顯微量測裝置及方法 | |
WO2013091584A1 (zh) | 一种检测基质内缺陷的方法及装置 | |
KR100785802B1 (ko) | 입체 형상 측정장치 | |
TWI292471B (ko) | ||
JP4667965B2 (ja) | 光ビーム測定装置 | |
WO2020135891A1 (zh) | 激光平行度检测仪 | |
JP2001235317A (ja) | 光学球面曲率半径測定装置 | |
Dai et al. | Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation | |
CN210155024U (zh) | 一种光学相干层析成像装置以及成像系统 | |
Riebeling et al. | Optical form measurement system using a line-scan interferometer and distance measuring interferometers for run-out compensation of the rotational object stage | |
TWI434021B (zh) | Non - contact optical composite measurement method and system | |
TWI495841B (zh) | High - resolution Reflective Three - dimensional Photoelectric Microscope | |
TWI388817B (zh) | Method and device for measuring the defect of the CCD object by the critical angle method | |
JP5518187B2 (ja) | 変形計測方法 | |
JP7389487B2 (ja) | 干渉撮像装置およびその用途 | |
CN112617760B (zh) | 一种基于3d打印技术的多模态手持式oct系统 | |
Ammann et al. | Enhancing the performance of light field camera by pattern projection | |
JP6193088B2 (ja) | 金属光沢面に塗布される透明樹脂の塗布領域と塗布量を検出する方法及びその光コヒーレンストモグラフィー計測システム | |
TWI708040B (zh) | 外反射式三維形貌測量儀 |