TWI278028B - Method for fabricating polishing pad using laser beam and mask - Google Patents

Method for fabricating polishing pad using laser beam and mask Download PDF

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Publication number
TWI278028B
TWI278028B TW91133413A TW91133413A TWI278028B TW I278028 B TWI278028 B TW I278028B TW 91133413 A TW91133413 A TW 91133413A TW 91133413 A TW91133413 A TW 91133413A TW I278028 B TWI278028 B TW I278028B
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Taiwan
Prior art keywords
polishing pad
laser beam
grooves
pattern
perforations
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TW91133413A
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Chinese (zh)
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TW200402782A (en
Inventor
Jae-Seok Kim
Ju-Yeol Lee
Geon Kim
Jong-Myeong Lee
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Skc Co Ltd
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Priority claimed from KR10-2002-0045832A external-priority patent/KR100442807B1/en
Application filed by Skc Co Ltd filed Critical Skc Co Ltd
Publication of TW200402782A publication Critical patent/TW200402782A/en
Application granted granted Critical
Publication of TWI278028B publication Critical patent/TWI278028B/en

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  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Laser Beam Processing (AREA)

Abstract

Disclosed is a method for forming micro-holes, perforated holes, and/or grooves on a polishing pad using a laser beam and a mask. This method involves the steps, of determining a pattern of micro-holes, grooves, and/or perforated holes to be formed on a polishing pad, inputting the determined pattern to a computer numerical control (CNC) controller, selecting a mask corresponding to the determined pattern, positioning the mask under a laser device, parallel to the polishing pad, and driving the laser device adapted to irradiate the laser beam and a table adapted to conduct a three-dimensional movement and rotation while supporting the polishing pad, under the control of the CNC controller, thereby irradiating the laser beam from the laser device through the mask onto the polishing pad according to the inputted pattern.

Description

1278028 玖、發明說明 (發明說明應敘明:發明所屬之技術領域、先前技術、内容、實施方式及圖式簡單說明) 【發明所屬之技術領域3 發明領域 本發明是關於一種被使用在化學機械研磨方法中的拋 5 光墊,更特別的是關於一種使用雷射光束及光罩在拋光墊 上形成微孔、齒孔及/或凹槽的方法。 C先前技術3 發明背景 在半導體元件製造方法中化學機械研磨(CMP)通常是 1〇 種被用·於獲付球狀平坦化之兩精準/鏡面的表面抛光方 法。依照此CMP,在拋光墊與將被拋光的晶圓之間有一漿 液長:供’以便化學餘刻该晶圓的表面。使用該抛光塾,該 晶圓的I虫刻表面會被機械拋光。 參考第1圖,示意說明一種典型的化學機械研磨機械 15 ,其以數標1表示。一種使用該化學機械研磨機械1的化學 機械研磨方法也被示意說明於第2圖中。該化學機械研磨 方法包括一化學蝕刻反應處理與一機械研磨處理,其是使 用包含於:該化學機械研磨機械中之該拋光墊1〇進行。該化 學蝕刻反應是藉由漿液42進行。也就是該漿液42適用於與 2〇將被拋光之晶圓30表面進行化學反應,藉此使它可能在該 化學蝕刻反應之後,可以輕易地進行該機械研磨處理。在 該機械拋光處理中,該被穩固地固定在一平臺2〇上的拋光 塾1〇會旋轉。被-護圈環32穩固支撐該晶圓3〇旋轉的同時 會震動。藉由-渡液供應工具4〇將研磨粒子的聚液供應至 1278028 坎、發明說明 "亥抛光墊10 °該供應的漿液被引至該拋光墊10與該晶圓30 之間。所引進的研磨粒子會藉由該拋光墊1〇與該晶圓3〇之 間的相對旋轉速度差而與該晶圓摩擦接觸’以使它們進行 機械抛光。該漿液42是一種包含具有顆粒大小為奈米尺度 5之研磨顆粒的膠態液體。在拋光處理期間,此漿液42被散 佈在該拋光墊10上。在拋光處理期間,當該拋光墊1〇旋轉 時,由於該拋光墊1〇旋轉產生的離心力,被供應至該拋光 塾1 〇的桌液疋由该抛光墊1 〇的周邊向外排出。為了達到提 升拋光效率,相當大量的研磨粒子在該拋光墊的上表面維 10持一段令人滿意的漫長時間,以便它們進行該晶圓的拋光 。也就是,該拋光墊10應該盡可能使該漿液42在其表面上 保持一段長時間。 為了使該漿液保持在該拋光墊上一段長的時間,一種 形成微米(#m)大小的球狀微胞的方法或者在該拋光墊的 15表面上形成齒孔與凹槽的方法可能被使用。在該拋光處理 期間,此些微胞、齒孔與凹槽用作控制該連續被供應之漿 液的流置與分配。 照慣例,在該拋光墊之該些微胞的形成可以使用一種 物理方法或-種化學方法達成。每一個都有一空腔的中空 20微元件(microe丨ements)被併入一聚合體基質以形成微胞的 方法可以作為該物理方法。利用化學形成的泡泡而形成微 胞的發泡方法可以作為該化學方法。 在-聚合體基質中該為元件的併入可以藉由使該些微 元件均勻地分佈在該聚合體基質中的型式,於一聚合體基 7 1278028 玖、發明說明 騰浸大量之每-個都有-空腔的中空微元件,藉此形 …而達成。该聚合體基質是藉由將-固化劑與諸如聚 ♦酗、鼠化碳氫化合物或其混合物混合來製備。對 於該些微元件而言,無機鹽類、糖、水溶性膠、樹脂或其 5種或更夕種混合物可以被使用。此微元件是由聚乙烯醇 、果驭、聚乙烯比咯酮、聚乙二醇、聚胺酯或其組合做成 4 一 U 7G件有大約8G微米的平均直徑。該些微元件是依 據--向剪切混合方法均勻地分佈在該聚合體基質上,這 樣它們可以形成均勻的微胞。參考第3圖,使用該些微元 10件形成的微胞將被圖示說曰月。然I,具有上面提提的方式 形成的微胞之該墊被切割成每一個都具有需要之厚度的片 段,以獲得拋光墊。在每一切片中,無規地分佈在該墊中 之微胞在該切片的切面處是開放的,這樣在該切片的切面 處匕們會顯路出圓形或擴圓形截面的形狀。在每一拋光墊 15之該拋光表面處暴露之該些微胞截面的大小與位置是無規 的。禮暴疼的微胞截面之如此無規的大小與位置會使該此 拋光墊中所需要的均勻性變差。 依據該化學方法’其中該些微胞(cells)是使用發泡方 法形成’聚合體基質是耩由混合固化劑與一液相聚胺醋形 20 成物質而形成。水與具有低沸點且直接參與化學反應而產 生氣體的液化氣體也可以被使用作為發泡劑,藉此產生氣 泡而在該聚合體基質中形成微胞。該些泡泡的生成是經由 高剪切混合操作造成之成核方式達成。作為獲得表面張力 降低的界面活性劑也可以被使用,以調整該些微泡的大小 1278028 玖、發明說明 ’因而獲得所需要之微泡均勻性。第4圖是顯示使用該方 泡方法形成之微胞的照片。不過依據該發泡方法形成的微 胞有一個問題,該些微胞太大而無法被塗佈在該化學機械 研磨塾上,那些微胞有不均勾的分佈,而且方法可以調整 5 該些微胞的大小與分佈。 该些微胞是使用每一個都具有空腔的微元件或者一種 具有圓形或橢圓形截面形狀之球體結構的發泡方法形成。 由於如此的形狀,該些微胞具有一在該拋光墊厚度方向會 改變的截面。基於這個原因,在拋光處理期間,在該拋光 10墊的拋光面上暴露之每一個微泡的截面會隨著該拋光墊的 磨損而被改變。換句話說,當拋光程序進行時,暴露在該 拋光墊的拋光面上之圓形或橢圓形微泡直徑會逐漸縮小, 而且最後會消失。最後,存在於該拋光墊之表面下沒有被 暴露的微胞應該會重新在該拋光墊的拋光表面被暴露。 15 目此,每一個在該拋光墊之拋光表面被暴露的微胞之 截面在拋光處理期間厚度會改變。由於這個理由,會有拋 光速率不一致的問題產生。 為了在該拋光墊之拋光表面形成齒孔或凹槽,使用切 割或研磨處理的機械加工方法已經被使用。 參考第5a圖,用於形成凹槽之切割機%被圖示說明。 當使用安裝在車床上之切割機7G的刀具壓模機械加工拋光 塾’在該拋光塾的上表面會形成同心圓形狀的凹槽,如第 5b圖所示。第5c圖是沿著第5b圖之a_a線的戴面圖示。灸 考第5bWc圖’使用該切割機而形成的凹槽之示範型式將 20 1278028 玖、發明說明 被圖不說明。在第5c圖中,該些凹槽以數標75表示。具有 同心圓形式之凹槽的實施例被揭示於美國專利第5894769 號中。 參考第6a圖,其顯示依水平研磨的機械81,切割鋸以 5舆間隔物(SpaCerS)83被安裝在其中。該切割鋸82被建構成 在X軸方㊉上移動。將被機械加工的拋光墊1〇是在y軸方向 移動。根據這些運動’在第—方向延伸的凹槽85是形成在 該拋光墊10的上表面。在該些凹槽85形成之後,該抛光塾 1〇被旋轉9〇。。在此情況中,當該拋光㈣在y軸方向移動 10時,在垂直於該第一方向之第二方向上延伸的凹槽會被形 成。因此,以格柵型式配置之凹槽是形成在該抛光表面上 ’如第6b與6c圖所示。 —參考弟7a圖,作為在拋光塾形成齒孔的齒孔检將被圖 示說明。當在該拋光墊是在y軸方向移動的條件下使用該 些齒孔栓進行打孔操作時,在該抛光㈣該拋光表面上會 形成齒孔’如第7b圖所示。該些齒孔的實施例被揭示於美 國專利第58533 17號中。 201278028 玖 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明A polishing pad in a grinding method, more particularly a method of forming micropores, perforations and/or grooves in a polishing pad using a laser beam and a reticle. C. Prior Art 3 Background of the Invention In the method of manufacturing a semiconductor device, chemical mechanical polishing (CMP) is usually used for two precision/mirror surface polishing methods which are used for spherical planarization. According to this CMP, there is a slurry length between the polishing pad and the wafer to be polished: for chemical etching of the surface of the wafer. Using this polishing pad, the surface of the I-insert of the wafer is mechanically polished. Referring to Fig. 1, a typical chemical mechanical polishing machine 15 is schematically illustrated, which is indicated by numeral 1. A chemical mechanical polishing method using the chemical mechanical polishing machine 1 is also schematically illustrated in Fig. 2. The chemical mechanical polishing method includes a chemical etching reaction treatment and a mechanical polishing treatment which are carried out using the polishing pad included in the chemical mechanical polishing machine. This chemical etching reaction is carried out by slurry 42. That is, the slurry 42 is adapted to chemically react with the surface of the wafer 30 to be polished, whereby it may be easily subjected to the mechanical polishing treatment after the chemical etching reaction. In the mechanical polishing process, the polishing crucible 1 steadily fixed on a stage 2 turns. The bezel ring 32 securely supports the wafer 3 while rotating and vibrates. The liquid of the abrasive particles is supplied to the 1278028 by the liquid supply tool 4, and the slurry is supplied to the polishing pad 10 and the wafer 30. The introduced abrasive particles are in frictional contact with the wafer by the relative rotational speed difference between the polishing pad 1 and the wafer 3 to mechanically polish them. The slurry 42 is a colloidal liquid comprising abrasive particles having a particle size of nanometer scale 5. This slurry 42 is spread on the polishing pad 10 during the polishing process. During the polishing process, when the polishing pad 1 is rotated, due to the centrifugal force generated by the rotation of the polishing pad 1 , the table liquid supplied to the polishing pad 1 is discharged outward from the periphery of the polishing pad 1 . In order to achieve improved polishing efficiency, a relatively large amount of abrasive particles are maintained on the upper surface of the polishing pad for a satisfactory period of time so that they perform polishing of the wafer. That is, the polishing pad 10 should keep the slurry 42 on its surface for as long as possible. In order to maintain the slurry on the polishing pad for a long period of time, a method of forming micron (#m) sized spherical micelles or a method of forming perforations and grooves on the surface of the polishing pad 15 may be used. During the polishing process, the micelles, perforations and grooves serve to control the flow and distribution of the continuously supplied slurry. Conventionally, the formation of the micelles in the polishing pad can be achieved using a physical method or a chemical method. A method in which each of the hollow 20 microelements having a cavity is incorporated into a polymer matrix to form micelles can be used as the physical method. A foaming method of forming a microparticle using a chemically formed bubble can be used as the chemical method. In the polymer matrix, the incorporation of the elements can be achieved by uniformly distributing the micro-elements in the polymer matrix, in a polymer base 7 1278028 玖, the invention describes a large amount of each A hollow micro-element with a cavity is achieved by this shape. The polymer matrix is prepared by mixing a curing agent with, for example, polyfluorene, a murine hydrocarbon or a mixture thereof. For the microcomponents, inorganic salts, sugars, water-soluble gums, resins or a mixture of five or more of them may be used. The microcomponent is made of polyvinyl alcohol, candied fruit, polyethylene thiopyrone, polyethylene glycol, polyurethane or a combination thereof. The 4-U 7G member has an average diameter of about 8 G microns. The microelements are uniformly distributed on the polymer matrix according to a shear mixing method so that they can form uniform micelles. Referring to Fig. 3, the micelles formed using the micro-elements of 10 pieces will be illustrated as the moon. However, the pad of the micelle formed in the manner described above is cut into segments each having a desired thickness to obtain a polishing pad. In each slice, the micelles randomly distributed in the pad are open at the section of the slice so that at the section of the slice we will show the shape of a circular or circular cross section. The size and location of the sections of the microcells exposed at the polishing surface of each polishing pad 15 are random. The random size and position of the cross-section of the micro-cells will make the uniformity required in the polishing pad worse. According to the chemical method, wherein the cells are formed by using a foaming method, the polymer matrix is formed by mixing a curing agent with a liquid phase polyamine. Water and a liquefied gas having a low boiling point and directly participating in a chemical reaction to generate a gas can also be used as a blowing agent, thereby generating bubbles to form micelles in the polymer matrix. The generation of these bubbles is achieved by a nucleation method caused by a high shear mixing operation. Surfactants which have a reduced surface tension can also be used to adjust the size of the microbubbles 1278028 玖, the invention's description thus obtaining the desired microbubble uniformity. Fig. 4 is a photograph showing the micelles formed by the method of the bubble. However, there is a problem with the microcells formed according to the foaming method, the microcells are too large to be coated on the chemical mechanical polishing crucible, and the microcells have a non-uniform distribution, and the method can adjust 5 the microcells. The size and distribution. The micelles are formed using a foaming method each having a micro-cavity having a cavity or a spherical structure having a circular or elliptical cross-sectional shape. Due to such a shape, the micelles have a section which changes in the thickness direction of the polishing pad. For this reason, the cross section of each of the microbubbles exposed on the polishing surface of the polishing pad during the polishing process is changed as the polishing pad is worn. In other words, as the polishing process proceeds, the diameter of the circular or elliptical microbubbles exposed on the polishing surface of the polishing pad will gradually decrease and eventually disappear. Finally, the cells that are not exposed under the surface of the polishing pad should be re-exposed on the polishing surface of the polishing pad. 15 Thus, the cross-section of each of the cells that are exposed at the polishing surface of the polishing pad changes during the polishing process. For this reason, there is a problem that the polishing rate is inconsistent. In order to form perforations or grooves in the polishing surface of the polishing pad, a machining method using a cutting or grinding process has been used. Referring to Figure 5a, the % cutter for forming the grooves is illustrated. When a polishing tool 抛光' is machined using a cutter press 7G mounted on a lathe, a concentric circular groove is formed on the upper surface of the polishing crucible as shown in Fig. 5b. Figure 5c is a representation of the wear along line a_a of Figure 5b. Moxibustion test 5bWc diagram 'The exemplary form of the groove formed by using the cutting machine will be 20 1278028 玖, the description of the invention is not illustrated. In Figure 5c, the grooves are indicated by numeral 75. An embodiment having a concentric circular groove is disclosed in U.S. Patent No. 5,894,769. Referring to Fig. 6a, which shows a horizontally ground machine 81, a dicing saw is mounted therein with a 5 舆 spacer (SpaCerS) 83. The dicing saw 82 is constructed to move on the X-axis side ten. The polishing pad 1 that is to be machined is moved in the y-axis direction. A groove 85 extending in the first direction according to these movements is formed on the upper surface of the polishing pad 10. After the grooves 85 are formed, the polishing crucible 1 is rotated by 9 turns. . In this case, when the polishing (4) is moved 10 in the y-axis direction, a groove extending in a second direction perpendicular to the first direction is formed. Therefore, the grooves arranged in the grid pattern are formed on the polishing surface as shown in Figs. 6b and 6c. - Referring to Figure 7a, a perforation inspection for forming a perforation in a polished crucible will be illustrated. When the perforating pins are used for the punching operation under the condition that the polishing pad is moved in the y-axis direction, the perforations are formed on the polishing surface (b) as shown in Fig. 7b. Examples of such perforations are disclosed in U.S. Patent No. 5,853,317. 20

因為該些被使心在拋光墊形成齒孔或凹槽之該別 統的方法是藉由-車床或研磨進行切割程序,該此凹心 諸如同心圓或格栅之固定圖案。由於這個原因,要形心 以有效地控制漿液流動的凹 7曰圖案疋困難的。依據使用i 孔栓而形成齒孔的方法,哕此 μ二㈣孔有固定的形狀。當該^ 孔栓是簡單地在X或y軸方向 m y軸方向移動時,該些齒孔也會被开 h 。基於這個原因,該些齒? 有間早且固定的圖案。因此 10 1278028 玖、發明說明 它很難獲得在化學機械研磨程序中需要的有效孔洞圖案。 在被使用機械具機械加卫而具有凹槽或齒孔的抛光 墊中,在基謝加工處理期間形成的碎屑可能留在該此凹样 或齒孔中。在該化學機械研磨料«,該些碎屑可_ 抛光的表面上形成刮痕。 示 同時’美國專利第5900164號和第5578362號分別揭 利用照射雷射光束J甘形成凹样 彳日的方法。依據這些方法,一 有黏性的光罩被使用以消除g 以除累積在拋光塾上的蒸汽痕跡。 不過,這些方法是複雜的,因 10 15 马该先罩應該與該拋光墊泰 合。此外,有一個問題是不交 疋不奋卉该有黏性的光罩黏著1』 的塾不能被使用。即便是在該光罩去除之後,該光罩的招 著劑也可能由於雷射光束的機械操作之熱量而留該塾上。 基於這個原因’它需要額外使用―用以除去該殘留的接著 劑之方法。當該有純的光㈣时該闕,該塾與該有 黏性的光罩之該接著劑層之間可能形成氣泡。在此情況中 ,當雷射光束騎在該些氣泡上時,它不可能形成具有等 同於設計的凹槽尺寸之大小的凹槽。 、 I[發明内容]1 發明概要 因此,為了解決包含使用每-個都具有空腔的微元件 或-發泡方法形成微泡,以及使„械方法形成凹槽或齒 孔’本發明已經被完成。本發明擁有—難夠輕易地在抛 先墊上形成具有有效且分散的圖案之微孔洞、凹槽及/或 齒孔的方法。 20 1278028 玖、發明說明 為了 4除包含傳統使用每_個都具有空腔的微 方法的缺點,也就是,結果會產生拋光處理之抛先 、&低或不—致性之微胞尺寸與分 明的一個目的日担祝從 本發 個目的^供—種料形成與微胞具有相同功能, _具有—受控制的均勾分佈與受控制的均勾尺寸之微孔 洞0 本發明的另-個目的是為了消除包含傳統的機械方法 之該些缺點,也就是,由於凹槽或齒孔之固定形狀或圖案 ,不適於控制該漿液的流動’而提供一種在拋光處理期間 10,用於形成具有多種不同的形狀、尺寸與圖案以有效地控 制漿液流動的方法。 本^月的另一個目的是提供一種用於形成凹槽的方法 ,其不僅能夠消除任-種有黏性的光罩的使用,藉此包含 隨著雷射光束使用一有黏性的光罩的情況,那就是整個製 15程的複雜性以及需要額外的黏著劑去除程序的問題會被消 除,當使用多種不同的拋光墊的同時,也可以獲得該凹槽 形成之準確性的改善。 為了完成這些目的,依照雷射機械加工原理與光罩, 本發明提供-種用於在拋光墊上形成具有使用者想要的各 20種不同圖案之微孔、凹槽及/或齒孔的方法。 依據本發明的一實施例,其提供一種用於製造一拋光 墊的方法,包含步驟:決定將被形成在拋光墊上之微孔、 凹槽及/或齒孔的圖案;將決定的圖案輸入電腦數位控制 (CNC)控制器;選擇具有相當於該輸入圖案的微孔、凹槽 12 1278028 玖、發明說明 及/或齒孔之圖案的光罩;與當根據該輸入 闺累而在該 拋光墊上,以便具有相當於該已確定圖案之圖案的微孔 凹槽及/或齒孔被形成在該拋光墊上。 圖式簡單說明 CNC控制器的控制下支撐該拋光墊的同時,驅動、高入 、 雷射光束的雷射裝置與適合進行三維移動及旋轉的工 ' ,藉此由該雷射裝置將雷射光束發射至被該工作台支撐2 第1圖是說明一典型的化學機械研磨機械之構形與使 用該化學機械研磨機械進行拋光方法之示意圖; 10 第2圖是說明一種化學機械研磨之概念的示意圖; 第3圖是依據傳統方法使用每一個都有一空腔的微元 件而形成之微胞的照片; 第4圖是使用傳統發泡方法形成的微胞的照片; 第5a圖是說明用於形成凹槽之傳統切割機的示意圖; 15 第5 b圖是說明一種具有使用該傳統的切割機形成同心 圓形式的凹槽之拋光墊; 第5c圖是沿著第5b圖之A-A線的截面圖示; 第6a圖是說明藉由安裝傳統切割鋸與間袼器之傳統的 水平研磨機械,而形成含有具格柵圖案之凹槽的拋光墊的 2〇 示意說明圖; 第6b圖是說明藉由第6a圖之傳統的水平研磨機械形成 之一具有格柵型式的凹槽之拋光墊示意圖; 第6g圖說明藉由傳統的水平研磨機械形成的一種袼栅 形狀凹槽的截面圖示; 13 1278028 玖、發明說明 弟7 a圖是說明適合在一彻朵執μ丑/ & 牡拋先墊上形成齒孔之傳統齒孔 栓的透視圖; 第7b圖是說明-含有藉由第〜圖的傳統齒孔检而形成 齒孔之拋光墊的平面圖示; 第7c圖是說明具有利用傳統的齒孔检形成之齒孔的& 光墊之截面圖示; 雷 第8a圖是說明使用在依據本發明之機械加工方法的 射系統之示意圖;This method of forming the perforations or grooves in the polishing pad is performed by a lathe or grinding, such as a concentric circle or a fixed pattern of the grid. For this reason, it is difficult to form a concave pattern to effectively control the flow of the slurry. According to the method of forming the perforations using the i-hole plug, the μ (four) holes have a fixed shape. When the hole plug is simply moved in the direction of the m y axis in the X or y axis direction, the holes are also opened h. For this reason, these teeth? There are early and fixed patterns. Therefore 10 1278028 玖, invention description It is difficult to obtain the effective hole pattern required in the chemical mechanical polishing process. In a polishing pad that is mechanically reinforced with a mechanical or mechanical tool and has a groove or perforation, debris formed during the Kie processing may remain in the concave or perforation. On the chemical mechanical abrasive «, the debris can be scratched on the polished surface. At the same time, U.S. Patent Nos. 5,9001,064 and 5,587,362 respectively disclose the use of a laser beam to form a concave pattern. According to these methods, a viscous reticle is used to eliminate g to remove traces of vapor accumulated on the polishing crucible. However, these methods are complicated because the hood should be compatible with the polishing pad. In addition, there is a problem that the 塾 疋 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不 不Even after the reticle is removed, the reticle of the reticle may remain on the enamel due to the heat of mechanical operation of the laser beam. For this reason 'it requires additional use' to remove the residual adhesive. When the pure light (four) is present, bubbles may form between the crucible and the adhesive layer of the viscous mask. In this case, when the laser beam rides on the bubbles, it is impossible to form a groove having a size equivalent to the groove size of the design. I [SUMMARY OF THE INVENTION] SUMMARY OF THE INVENTION Accordingly, in order to solve the problem of forming microbubbles using a micro-component or a foaming method each having a cavity, and to form a groove or perforation by the mechanical method, the present invention has been The present invention has a method of forming microvoids, grooves and/or perforations having an effective and dispersed pattern on the first mat. 20 1278028 发明, invention description The disadvantages of micro-methods that have cavities, that is, the result is that the polishing process is preemptive, & low or non-small cell size and a distinct purpose. - the formation of the seed material has the same function as the micelle, the _ has a controlled uniform hook distribution and the controlled size of the micro-holes 0. Another object of the invention is to eliminate the inclusion of conventional mechanical methods Disadvantages, that is, due to the fixed shape or pattern of the grooves or perforations, are not suitable for controlling the flow of the slurry' while providing a pattern 10 for forming a variety of different shapes, sizes and patterns during the polishing process. A method for effectively controlling the flow of a slurry. Another object of the present invention is to provide a method for forming a groove which not only eliminates the use of any viscous reticle, thereby including a laser beam In the case of a viscous reticle, the complexity of the entire process and the need for additional adhesive removal procedures are eliminated, and can be obtained while using a variety of different polishing pads. Improvements in the accuracy of the formation. To accomplish these objectives, in accordance with the principles of laser machining and reticle, the present invention provides microvoids and grooves for forming 20 different patterns desired by a user on a polishing pad. And/or a method of perforating. According to an embodiment of the invention, there is provided a method for manufacturing a polishing pad comprising the steps of: determining micropores, grooves and/or perforations to be formed on a polishing pad. a pattern; inputting the determined pattern into a computer numerical control (CNC) controller; selecting light having a microhole corresponding to the input pattern, a groove 12 1278028 玖, a description of the invention, and/or a pattern of perforations And microporous grooves and/or perforations on the polishing pad according to the input so as to have a pattern corresponding to the determined pattern are formed on the polishing pad. The drawing briefly illustrates the control of the CNC controller While supporting the polishing pad, the laser device for driving, high-in, and laser beams is adapted to perform three-dimensional movement and rotation, whereby the laser beam is emitted by the laser device to be supported by the table 2 1 is a schematic view showing a configuration of a typical chemical mechanical polishing machine and a polishing method using the chemical mechanical polishing machine; 10 FIG. 2 is a schematic view illustrating a concept of chemical mechanical polishing; and FIG. 3 is a conventional method according to a conventional method. Photograph of the micelles formed using each of the micro-elements having a cavity; Figure 4 is a photograph of the micelles formed using a conventional foaming method; Figure 5a is a schematic view illustrating a conventional cutting machine for forming the grooves 15b is a polishing pad having a groove forming a concentric circular shape using the conventional cutter; FIG. 5c is a cross-sectional view taken along line AA of FIG. 5b; Figure 6a is a schematic diagram showing the formation of a polishing pad having a groove having a grid pattern by a conventional horizontal grinding machine for mounting a conventional dicing saw and a squeegee; Figure 6b is a view showing the 6a The conventional horizontal grinding machine of the drawing forms a schematic view of a polishing pad having a groove type groove; and FIG. 6g illustrates a sectional view of a ridge-shaped groove formed by a conventional horizontal grinding machine; 13 1278028 玖, BRIEF DESCRIPTION OF THE DRAWINGS The Fig. 7a is a perspective view illustrating a conventional perforated plug that is suitable for forming a perforation on a mat before the ugly and ugly pad; and Fig. 7b is an illustration - a conventional tooth containing the first figure A plan view of a polishing pad forming a perforation by hole inspection; Fig. 7c is a cross-sectional view showing a & optical pad having a perforation formed by a conventional perforation inspection; Ray 8a is a description of the use in accordance with the present Schematic diagram of the firing system of the inventive machining method;

第8b圖是說明將雷射光束照射在依據本發明之機械加 10工方法中·使用的光罩上的條件之示意圖; 第9a圖是顯示在只使用雷射光束的情況中所形成之微 孔的平面圖結構之照片; 第9b圖是顯示具有以雷射光束穿透利用依據本發明之 較佳實施例形成帶有多數圓形圖案之光罩的情況中,所形 15 成之微孔的拋光墊之平面圖結構的照片;Figure 8b is a schematic view showing the condition of irradiating a laser beam onto a reticle used in the mechanical addition method according to the present invention; Fig. 9a is a diagram showing the formation in the case where only a laser beam is used. Photograph of the plan view structure of the hole; Figure 9b is a view showing the microporous shape formed by laser beam penetration using a photomask having a plurality of circular patterns in accordance with a preferred embodiment of the present invention. a photograph of the plan view structure of the polishing pad;

第9c圖是顯示具有以雷射光束穿透利用依據本發明之 車父佳實施例形成帶有五角形圖案之光罩的情況中,所形成 之微孔的拋光墊之平面圖結構的照片; 第10圖是說明具有藉由依據本發明之較佳實施例的雷 20 射形成之微孔的拋光墊的示意圖; 第Π圖是說明具有藉由依據本發明之另一較佳實施例 的雷射形成之齒孔的拋光墊的示意圖; 第12圖是說明具有藉由依據本發明之另一較佳實施例 的雷射形成之凹槽的拋光墊的示意圖。 14 1278028 玖、發明說明 t 】 進行本發明之最佳模式 現在’將參考該些附錄的圖示而就本發明的構造與功 能做詳細的說明。 10Figure 9c is a photograph showing a plan view structure of a polishing pad having micropores formed in the case where a laser beam having a pentagonal pattern is formed by laser beam penetration according to the embodiment of the present invention; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view showing a polishing pad having micropores formed by a lightning strike according to a preferred embodiment of the present invention; and FIG. 1 is a view showing laser formation by another preferred embodiment in accordance with the present invention. Schematic diagram of a polishing pad for a perforated hole; Fig. 12 is a schematic view showing a polishing pad having a groove formed by a laser according to another preferred embodiment of the present invention. 14 1278028 发明, INSTRUCTION DESCRIPTION t 】 Best Mode for Carrying Out the Invention Now, the construction and function of the present invention will be described in detail with reference to the drawings of the appendices. 10

本發明利用雷射光束加工原理於抛光塾上微孔、㈣ 及/或齒孔的形成。該雷射機械加工方法有一減少層中承 受熱變形之區域的特性。該雷射機械加工也是以非接觸型 式進灯,所以沒有工具磨耗。該雷射機械加工也能夠精準 地加工有複雜形狀的物件、消除雜音與震動的產生並且維 持-清潔的工作環境。當雷射光束照射在抛光塾的抛光表 面上時’它會然地增加該拋光墊的表面溫度。結果,該拋 光墊的材料在被該雷射光束照射的抛光塾上之表面區域會 被熔解及蒸發。當該拋光墊的材料由上面說明的型式在被 雷射照射的區域被移除時,微孔、凹槽及/或齒孔的機械 加工即被完成。The present invention utilizes the principle of laser beam processing to polish the formation of micropores, (four) and/or perforations. The laser machining method has a property of reducing the area of the layer subjected to thermal deformation. The laser machining also uses a non-contact type to enter the lamp, so there is no tool wear. This laser machining also accurately processes objects with complex shapes, eliminates noise and vibration, and maintains a clean working environment. When the laser beam is incident on the polished surface of the polishing crucible, it will increase the surface temperature of the polishing pad. As a result, the material of the polishing pad is melted and evaporated in the surface area on the polishing pad illuminated by the laser beam. Machining of the microholes, grooves and/or perforations is accomplished when the material of the polishing pad is removed from the area illuminated by the laser by the pattern described above.

參考第8a圖,其說明被使用於進行依據本發發明之雷 射機械加工方法的雷射機械加工系統。如第8a圖所示,該 詒射加工系統包含用於照射一雷射光束的雷射裝置1 〇 〇、 光罩101、用於進行旋轉運動以3維運動的工作台1〇4和用 2〇於控制該雷射裝置100與該工作台1〇4之電腦數位控制 (CNC)控制器102。該將被拋光的拋光墊是安裝在該工作台 104 上。 操作員可以自由地決定將被形成在該拋光墊上的微孔 、凹槽及/或齒孔的圖案,那就是,那些微孔、凹槽及/或 15 1278028 玖、發明說明 齒孔的大小、深度與空間。 下面僅就微孔的形成做說明。當然,凹槽或齒孔的形 成可以使用類適於微孔的形成方式進行。 刼作員可以由各種形狀,諸如圓形、橢圓形、三角形 5與矩形或正方形之各種形狀選擇所需要之微孔形狀。該操 作員也可以自由地決定該些微孔的直徑、寬度或深度。該 些微孔對於該拋光表面的傾斜度以及該些微孔的配置也可 以由該操作員決定。 由忒插作員決定之微孔的圖案被輸入該cnc控制器 10 1G2中。該圖案輸人可以使用掃猫方法、電腦辅助設計 (⑽)或其他方法完成。該CNC控制器1()2會辨識該輸入的 圖案,並且控制該雷射裝置1〇〇與該工作台ι〇4。由該操作 員決定的該微孔圖案被直接設計在光罩材料上。舉例來說 所而要的圖案可以依據光微影技術,而被形成在由玻璃 15基材與電鑛在該玻璃基材上的鉻層組成之光罩上。另外, 2射遮蔽材料薄膜可以依據切割方法而被圖案化。根據此 一結構,可以達到雷射光束之選擇性穿透,如第朴圖所示 。因此雷射光束被照射在該墊之表面的選擇部分,以形成 -需要的圖案。在使用此_光罩處,可能會形成難以用 20 C:形,的微圖案。因此,在該CNC與該光罩結合使用處 /二可月匕形成難以由傳統機械加工方法形成的圖案。舉例 " 隹…、傳土使用的雷射機械加工方法被限制於圓點或 連續線的生成,依據本發明其可能會生成矩形或五角形的 16 1278028 玖、發明說明 依據上面說明而設計的光罩以剛好是在該拋光墊10的 上方’同時平行於該拋光墊10之型式被安裝在該雷射裝置 100的下端。 當該雷射裝置100與工作台104在該CNC控制器1〇2的 控制之下被驅動時,雷射光束照射通過安裝在該工作台 104上的光罩101上,藉此在該拋光墊上形成具有相當於被 輸入該CNC控制器102的圖案之圖案的微孔。 10 15 20Referring to Fig. 8a, there is illustrated a laser machining system that is used in performing the laser machining method in accordance with the present invention. As shown in Fig. 8a, the laser processing system includes a laser device 1 照射 for illuminating a laser beam, a reticle 101, a table 1 〇 4 for performing a 3D movement for rotational motion, and 2 A computer digital control (CNC) controller 102 that controls the laser device 100 and the table 1〇4. The polishing pad to be polished is mounted on the table 104. The operator is free to determine the pattern of micro-holes, grooves and/or perforations to be formed on the polishing pad, that is, those micro-holes, grooves and/or 15 1278028 玖, the invention describes the size of the perforations, Depth and space. Only the formation of micropores will be described below. Of course, the formation of the grooves or perforations can be carried out using a type suitable for the formation of micropores. The creator can select the desired micropore shape from various shapes, such as a circle, an ellipse, a triangle 5, and a rectangular or square shape. The operator is also free to determine the diameter, width or depth of the micropores. The inclination of the micropores to the polishing surface and the configuration of the microholes can also be determined by the operator. The pattern of the micro holes determined by the inserter is input to the cnc controller 10 1G2. The pattern input can be done using the sweeping cat method, computer aided design ((10)) or other methods. The CNC controller 1() 2 recognizes the pattern of the input and controls the laser device 1 and the table ι4. The microvia pattern determined by the operator is designed directly onto the reticle material. For example, the desired pattern can be formed on a reticle composed of a glass 15 substrate and a chrome layer of an electric ore on the glass substrate in accordance with photolithography. In addition, the film of the two-shot masking material can be patterned according to the cutting method. According to this configuration, selective penetration of the laser beam can be achieved, as shown in the first diagram. The laser beam is thus illuminated at selected portions of the surface of the pad to form the desired pattern. At the use of this reticle, a micropattern that is difficult to use 20 C: shape may be formed. Therefore, in the case where the CNC is used in combination with the reticle, a pattern which is difficult to form by a conventional machining method is formed. For example, the laser machining method used for soil transfer is limited to the generation of dots or continuous lines. According to the invention, it may generate a rectangle or a pentagon. 16 1278028 发明, the invention describes the light designed according to the above description. A cover is mounted on the lower end of the laser device 100 in a pattern that is just above the polishing pad 10 while being parallel to the polishing pad 10. When the laser device 100 and the table 104 are driven under the control of the CNC controller 1〇2, the laser beam is irradiated through the photomask 101 mounted on the table 104, thereby being on the polishing pad. Micropores having a pattern corresponding to the pattern input to the CNC controller 102 are formed. 10 15 20

那就是’在該CNC控制器1 〇2的控制之下,該雷射裝 置10 0會在该拋光墊1 〇上形成具有一形狀、大小與空間分 別相當於那些輸入至該CNC控制器102的圖案之微孔。每 一微孔的形狀,諸如圓形、正方形或五角形可以藉由調整 聚焦在該拋光墊丨〇上的雷射點形狀而被決定。將被形成在 α玄抛光塾1 〇上的母一微孔的直徑或寬度可以藉由調整該雷 射光點的大小而被控制。舉例來說,當該雷射點的大小被 调整至10至150微米時,具有1至1〇〇微米之直徑的微恐可 以被形成。每一微孔的長度與在該雷射光束行進方向中彼 此相夕#配置的Μ孔之間的空間也可以藉由控制該雷射光束 的連、、男/間歇知、射期間而被調整。每一微孔的深度可以藉 由控制該雷射光束的能量而被調整。 同%,該拋光墊10安裝其上的該工作台1〇4可以在 維方向上移動那就轴方向移動’同時對於_ 旋轉。根據該輸入的微孔圖案’在該CNC控制器酬 制之下,依據該工作台⑽沿著該x、y和續的三維運動 及該工作台104的旋轉所需要的微孔圖案可以藉由雷射 17 1278028 玖、發明說明 束的照射而形成在該拋光墊10上。該些微孔對於該拋光表 面可以具有想要的角度。該些微孔的密度與配置也可以藉 由控制該工作台104的移動與旋轉速度而被調整。 因此,具有由各種圖案選出之所需要的圖案的微孔可 5以依據對於雷射裝置1〇〇的控制、對於該光罩101的控制與 對於孩工作台1 〇4的控制之結合而被形成在該拋光墊上。 β亥凹槽或齒孔的形成是使用與該些微孔形成所用的相同方 法。此些微孔、凹槽及/或齒孔可以被選擇性地形成在該 也光墊10上。另外’它們可以形成組合圖案型式。在後者 1〇的^况中,該些微孔、凹槽及/或齒孔可能是循序地或同 時地被形成。 该光罩10 1 —般可以藉由在一透明的玻璃基材上形成 鉻層,並且依據光微影方法圖案化該鉻層而被製造。該光 罩101可以由塑膠、金屬、聚合物或紙做成。 15 第91)與9(:圖分別顯示依據本發明的方法形成之微孔的 照片。 第9c圖的微孔是藉由在5至10瓦特能量下震盪具有197 至248奈米波長的雷射光束,並且選擇性地照射該震盪的 田射光束,同時允許該雷射光束通過該光罩的圖案而形成 在此日卞"亥些彳放孔的深度是藉由將該雷射光束照射時間 铨制在0.1至10秒’同時在相同的位置重複該雷射光束照 射而被控制。那界是,該雷射光束照射的控制不僅是依照 該照射時間,也根據照射的次數來完成。 如第9a、9b和9c圖所示,依據本發明而形成的該些微 18 1278028 玖、發明說明 10 15 20 孔具有一致的直徑與均勻的分佈,同時具有平滑的表面。 該些微孔也可以被形成具有準確的以及各種不同的圖案。 不過’只使用雷射光束照射形成的該些傳統微孔9a可能具 有粗的表面,因為母一個微孔9 a的表面由於接近該被形 成的微孔處之區域的雷射光束照射熱量而被熔融。依據傳 統的方法:,使用每一個都具有空腔的微元件或一發泡方法 形成第3與4圖之微胞,具有分均勻的分不與不均勻的大小 。基於這個理由,當胎拋光程序進行時,該些暴露的該些 U胞會具有不均勻的截面。本發明之該些微孔具有與傳統 的微包相同之功能,其中它們可以供應研磨的粒子同時可 以收集該研磨處理期間產生的碎屬,同時當該拋光墊被在 凋理日寸回排出收集的碎屑。除此之外,本發明的該些微孔 /、有均勻.的刀佈亚且有均勻的大小。因此,本發明的微孔 具有比該傳統的微包更好之非常優異的效果。依據本發明 丄如果需要,該微孔的分佈、密度與大小可以被自由地決 、/光罩被簡單地安裝在該雷射裝置的夏端兒沒有被接 合㈣據本發明之該拋光墊上。因此,整個方法是簡單的 °它也可能不需要使用任一額外的處理,舉例來說,黏著 劑去除程序。除此之外,本發明的方法有一優點是其也可 以應用在任-種有黏性的光罩不能被使用的情況中。 弟3圖中顯不的照片之右下部分的對角傾斜區域使用 傳統齒孔栓而形成在該抛光墊上的_齒孔。如第3圖所示 °亥齒孔具有因為碎屬造成並保持在該齒孔中的粗糙表面 。在該化學機械研磨處理期間,此些碎屬可能在將被抛光 19 1278028 5 10 15 玖、發明說明 、 形成刮痕。不過,依據本發明而形成的齒孔或凹槽 不會吝4 。產生此一問題,因為藉由雷射機械加工處理,該齒孔 或凹槽具有平滑的表面。依據本發明,如果需要,具有各 種不同圖案的齒孔或凹槽可以被自由地形成。 、第10、11和12圖分別是說明依據本發明而形成之微孔 回孔或凹槽的實施例之示意圖。 Θ第_是說明一抛光墊的示意圖。在其上有依據本發 明而形成的微孔配置。第1〇圖中顯示該些微孔在不同的拋 ,墊半徑區域具有不同的密度。在每一半徑區域中,該些 微孔具有均勻的密度與均勻的大小。 第U圖是說明一抛光墊的示意圖,在其上有依據本發 明而形成的齒孔配置。第12圖是說明一拋光墊的示意圖, ;在其上有依據本發明而形成的凹槽配置。在第11或12圖中 也明的情況中,該機械加工處理是藉由在與方向移動 β工作㈣時選轉該工作台來進行。雖然依據傳統的機械 加工方法只能夠形成一固定的圖帛,如第%、讣或几圖所 依據本^明使用一 CNC控制器、雷射光束與光罩可以 自由地形成沒有固定、各種不同的微孔、齒孔或凹槽的圖 案0That is, under the control of the CNC controller 1 〇 2, the laser device 100 will be formed on the polishing pad 1 具有 having a shape, a size and a space corresponding to those inputs to the CNC controller 102, respectively. Micropores of the pattern. The shape of each micropore, such as a circle, square or pentagon, can be determined by adjusting the shape of the laser spot focused on the polishing pad. The diameter or width of the mother-microwell to be formed on the alpha-polio 塾1 可以 can be controlled by adjusting the size of the laser spot. For example, when the size of the laser spot is adjusted to 10 to 150 μm, micro-terrorism having a diameter of 1 to 1 μm can be formed. The space between the length of each micropore and the pupil arranged in the direction of travel of the laser beam can also be adjusted by controlling the connection of the laser beam, the male/intermittent, and the firing period. . The depth of each microwell can be adjusted by controlling the energy of the laser beam. In the same %, the table 1 4 on which the polishing pad 10 is mounted can be moved in the dimension direction, and then moved in the axial direction ' while rotating for _. According to the input micropore pattern, under the CNC controller, the micropore pattern required according to the x, y, and continued three-dimensional motion of the table (10) and the rotation of the table 104 can be used. Laser 17 1278028 玖, the invention describes the irradiation of the beam formed on the polishing pad 10. The micropores can have a desired angle for the polished surface. The density and configuration of the microholes can also be adjusted by controlling the movement and rotational speed of the table 104. Therefore, the micropores 5 having the desired pattern selected by the various patterns can be used in accordance with the control of the laser device 1 , the control of the reticle 101 and the control of the child table 1 〇 4 Formed on the polishing pad. The formation of the pits or perforations is the same as that used for the formation of the micropores. Such micropores, grooves and/or perforations may be selectively formed on the optical pad 10. In addition, they can form a combined pattern pattern. In the latter case, the micropores, grooves and/or perforations may be formed sequentially or simultaneously. The reticle 10 1 can generally be fabricated by forming a chrome layer on a transparent glass substrate and patterning the chrome layer in accordance with photolithography. The reticle 101 can be made of plastic, metal, polymer or paper. 15 91) and 9 (: graphs showing photographs of micropores formed according to the method of the present invention, respectively. The micropores of Fig. 9c are lasers having a wavelength of 197 to 248 nm by oscillating at 5 to 10 watts of energy. a beam of light, and selectively illuminating the oscillating field beam while allowing the laser beam to pass through the pattern of the reticle to form a depth at which the depth of the hole is illuminated by the laser beam The time tanning is controlled at 0.1 while 10 seconds while repeating the laser beam illumination at the same position. That is, the control of the laser beam illumination is not only performed according to the irradiation time but also according to the number of irradiations. As shown in Figures 9a, 9b and 9c, the micro- 18 1278028 依据 according to the invention, the invention 10 15 20 holes have a uniform diameter and a uniform distribution, while having a smooth surface. It is formed with accurate and various patterns. However, the conventional micropores 9a formed by only using laser beam irradiation may have a rough surface because the surface of one micropore 9 a of the mother is close to the formed micro The laser beam in the region of the hole is melted by the heat of the heat. According to the conventional method, the microcells having the cavity and the foaming method are used to form the microcells of Figs. 3 and 4, which have a uniform score. Not for the uneven size. For this reason, the exposed U cells may have a non-uniform cross section when the tire polishing process is performed. The micropores of the present invention have the same functions as the conventional micro-packets. Wherein they can supply the ground particles while collecting the debris generated during the grinding process, while the polishing pad is discharged back to the collected debris on the day of the same. In addition, the micropores of the present invention/ There is a uniform knives and a uniform size. Therefore, the micropores of the present invention have a much better effect than the conventional microcapsules. According to the present invention, the distribution and density of the micropores are required if desired. And the size can be freely determined, / the mask is simply mounted on the summer end of the laser device is not joined (four) according to the polishing pad of the present invention. Therefore, the whole method is simple ° it may not be required With any additional treatment, for example, an adhesive removal procedure, in addition to this, the method of the present invention has the advantage that it can also be used in situations where any viscous reticle cannot be used. The diagonally inclined portion of the lower right portion of the photograph shown in the figure forms a _ perforation on the polishing pad using a conventional perforated plug. As shown in Fig. 3, the HF hole has a cause due to the genus and remains in the Rough surface in the perforations. During the chemical mechanical polishing process, such fragments may be polished 19 1278028 5 10 15 玖, invention instructions, forming scratches. However, perforations or depressions formed in accordance with the present invention The groove does not 吝 4. This problem arises because the perforations or grooves have a smooth surface by laser machining. According to the present invention, perforations or grooves having various patterns can be Freely formed. 10, 11 and 12 are schematic views respectively showing an embodiment of a microporous hole or groove formed in accordance with the present invention. Θ第_ is a schematic diagram illustrating a polishing pad. There is a micropore configuration formed in accordance with the present invention. It is shown in Figure 1 that the micropores have different densities in different throw and pad radius regions. The micropores have a uniform density and a uniform size in each radius region. Figure U is a schematic view showing a polishing pad having a perforation configuration formed in accordance with the present invention. Figure 12 is a schematic view showing a polishing pad having a groove configuration formed in accordance with the present invention. In the case of the same as in the eleventh or twelfth aspect, the machining process is performed by selecting the table when moving (moving) with the direction (4). Although only a fixed pattern can be formed according to the conventional machining method, for example, the first, the 讣 or the several figures are based on the use of a CNC controller, the laser beam and the reticle can be freely formed without fixing, various Pattern of micropores, perforations or grooves

20 &據本电明,该拋光墊可以具有各種不同圖案的微孔 、齒孔或凹槽’而不僅限於第10、圖中說明的圖案 。該拋光塾也可以具有微孔、齒孔或凹槽圖案之組合的圖案。舉例來說,該抛光塾可具有微孔與齒孔、微孔與凹槽 或微孔、齒孔和凹槽之組合圖案。 20 1278028 玖、發明說明 工業的應.用性 由上面的說明顯見,本發明提供一種能夠藉由雷射光 束與光罩而輕易地形成微孔、齒孔及/或凹槽的方法。當 與具有不均勻的微胞之傳統的拋光墊相比,依據本發明, 5具有均勻分佈與均勻大小的微孔可以藉由雷射光束形成在 拋光墊上,藉此可以最大化該拋光墊的拋光效率。本發明 也提供在機械加工效率上,以及在生產成本降低上可以產 生提升的效果。依據本發明,具有準確的以及各種不同的 圖案之齒孔與凹槽可以被形成。因此,它可能有效地控制 10在該拋光墊上之漿液的流動。 依據本發明,所需要之具有各種不同形狀、大小與深 度之微孔、齒孔及凹槽的圖案以及其之組合,可以藉由雷 射光束與光罩在短時間根據給定的拋光條件而被形成在拋 光墊上。因此,它能夠達成製造效率提升與製造成本降低 15 〇 ^ 雖;、、、:關於用在製造形成具有微孔、齒孔及/或凹槽之 拋光墊的方法的說明目的之本發明之該些較佳實施例已經 被揭示那些々悉该技藝者將會領會到在不偏離於伴隨的 申請專利範圍中揭示知本發明的範圍與精神下,可能進行 2〇各種不同的修正、附加與替代。 【H0式簡單說明】 第1圖是說明一典型的化學機械研磨機械之構形與使 用"玄化學機械研磨機械進行拋光方法之示意圖; 第2圖疋說明一種化學機械研磨之概念的示意圖; 21 1278028 玖、發明說明 每一個都有一空腔的微元 第3圖是依據傳統方法使用 件而形成之微胞的照片; 第4圖是使用傳統發泡方法形成的微胞的照片; 第5&圖是說明用於形成凹槽之傳統切割機的示意圖; 第5 b圖是說明-種具有使用該傳統的切割機形成同心 圓形式的凹槽之拋光墊; 第5c圖是沿著第5b圖之A-A線的截面圖示; 第6 a圖是說明藉由安裝傳統切割鋸與間格器之傳統的 水平研磨機械,而形成含有具格柵圖案之凹槽的拋光墊的 10 示意說明圖; 第6b圖是說明藉由第6a圖之傳統的水平研磨機械形成 之一具有格柵型式的凹槽之拋光墊示意圖; 第6c圖說明藉由傳統的水平研磨機械形成的一種袼栅 形狀凹槽的截面圖示; 15 第7a圖是說明適合在一拋光墊上形成齒孔之傳統齒孔 栓的透視圖; 第7b圖是說明一含有藉由第7a圖的傳統齒孔栓而形成 齒孔之拋光墊的平面圖示; 第7c圖是說明具有利用傳統的齒孔栓形成之齒孔的拋 20 光墊之截面圖示; 第8a圖是說明使用在依據本發明之機械加工方法的雷 射系統之示意圖; 第8b圖是說明將雷射光束照射在依據本發明之機械加 工方法中使用的光罩上的條件之示意圖; 22 1278028 玫、發明說明 第9a圖是顯示在只使用雷身十古 田射先束的情況中所形成之微 孔的平面圖結構之照片; 第9b圖是顯示具有以雷射光束穿透利用依據本發明之 較佳實施例形成帶有多數圓形圖案之光罩的情況中,所形 5成之微孔的拋光墊之平面圖結構的照片; 第9c圖是顯示具有以雷射光束穿透利用依據本發明之 較㈣施例形成帶有五角形圖案之光罩的情況中,所形成 之微孔的拋光墊之平面圖結構的照片; ,第_是說明具有藉由依據本發明之較佳實施例的雷 1〇射形成之微孔的拋光墊的示意圖; 第11圖是說明具有藉由依據本發明之另—較佳實施例 的雷射形成之齒孔的拋光墊的示意圖; 第12圖是說明具有藉由依據本發明之另一較佳實施例 的雷射形成之凹槽的拋光墊的示意圖。 【圖式之主要元件代表符號表】 1···化學機械研磨機械 81···水平研磨的機械 10···拋光墊 82.·.切割器 3 〇 · · ·晶圓 32·.·護圈環 40···漿液供應工具 42···漿液 7〇.··切割器 75··.凹槽. 83···間隔器 85·.·凹槽 1〇〇···雷射裝置 101 · · ·光罩 102...電腦數位控制控制器 104···工作台 2320 & According to the present invention, the polishing pad may have micropores, perforations or grooves of various patterns, and is not limited to the pattern illustrated in Fig. 10 and the drawings. The polishing crucible can also have a pattern of combinations of micropores, perforations or groove patterns. For example, the polishing crucible can have a combination of micropores and perforations, micropores and grooves or micropores, perforations, and grooves. 20 1278028 DESCRIPTION OF THE INVENTION Industrial Applicability As apparent from the above description, the present invention provides a method of easily forming micropores, perforations and/or grooves by means of a laser beam and a reticle. In accordance with the present invention, micropores having a uniform distribution and uniform size can be formed on the polishing pad by a laser beam, thereby maximizing the polishing pad, as compared to conventional polishing pads having non-uniform cells. Polishing efficiency. The present invention also provides an effect that can be improved in terms of machining efficiency and reduction in production cost. According to the present invention, perforations and grooves having accurate and various patterns can be formed. Therefore, it is possible to effectively control the flow of the slurry on the polishing pad. According to the present invention, the pattern of micropores, perforations and grooves having various shapes, sizes and depths, and combinations thereof, can be obtained by a laser beam and a reticle in a short time according to a given polishing condition. It is formed on a polishing pad. Therefore, it is possible to achieve a reduction in manufacturing efficiency and a reduction in manufacturing cost. However, the present invention relates to the purpose of the description for the method of manufacturing a polishing pad having micropores, perforations and/or grooves. It is to be understood that those skilled in the art will appreciate that various modifications, additions and substitutions may be made without departing from the scope and spirit of the invention. . [H0 type simple description] Fig. 1 is a schematic view showing the configuration of a typical chemical mechanical polishing machine and the polishing method using the "Xuan chemical mechanical polishing machine"; Fig. 2 is a schematic view showing the concept of a chemical mechanical polishing; 21 1278028 玖, Invention Description Each micro-element with a cavity Figure 3 is a photograph of a microcell formed using a conventional method; Figure 4 is a photograph of a microcell formed using a conventional foaming method; 5& Figure 5 is a schematic view showing a conventional cutting machine for forming a groove; Figure 5b is a polishing pad having a groove for forming a concentric circular shape using the conventional cutting machine; Figure 5c is along the 5th Figure 7A is a cross-sectional view of the AA line; Figure 6a is a schematic illustration of a polishing pad forming a groove containing a grid pattern by a conventional horizontal grinding machine that mounts a conventional dicing saw and a spacer. Figure 6b is a schematic view showing a polishing pad having a groove pattern of a grid type formed by a conventional horizontal grinding machine of Fig. 6a; Fig. 6c is a view showing a conventional horizontal grinding machine A cross-sectional view of a grid-shaped groove; 15 Figure 7a is a perspective view illustrating a conventional perforated plug suitable for forming a perforation in a polishing pad; Figure 7b is a view showing a conventional perforation having a Figure 7a A plan view of a polishing pad that is plugged to form a perforation; Figure 7c is a cross-sectional illustration of a polishing pad having a perforation formed using a conventional perforated plug; Figure 8a is a diagram illustrating use in accordance with the present invention Schematic diagram of a laser system for machining methods; Fig. 8b is a schematic view showing conditions for irradiating a laser beam onto a reticle used in the machining method according to the present invention; 22 1278028, Fig. 9a is a display A photograph of a plan view of a micropore formed in the case where only the first beam of the ray body is used; FIG. 9b is a view showing the formation with a majority of the circle according to the preferred embodiment of the present invention. In the case of a reticle of a patterned pattern, a photograph of a plan view structure of a polishing pad having a shape of a microporous shape; and Fig. 9c is a view showing the use of a laser beam penetrating using a fourth embodiment according to the present invention. In the case of a patterned reticle, a photograph of a plan view structure of the microporous polishing pad formed; and _ is a polishing having micropores formed by Ray 1 ray according to a preferred embodiment of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 11 is a schematic view showing a polishing pad having a perforation formed by laser according to another preferred embodiment of the present invention; and Fig. 12 is a view showing another comparison by means of the present invention. A schematic representation of a polishing pad for a laser formed groove of a preferred embodiment. [Main component representative symbol table of the drawing] 1···Chemical mechanical polishing machine 81···Horizontal grinding machine 10···Polishing pad 82··.Cutter 3 〇· · · Wafer 32··· Ring 40···Slurry supply tool 42···Slurry 7〇··Cutter 75··. Groove. 83···Spacer 85··· Groove 1〇〇···Laser device 101 · · · Photomask 102... Computer Digital Control Controller 104···Workbench 23

Claims (1)

1278028 拾、申請專利範圍 1· 一種用於製造拋光墊的方法,包含步驟: 決定將被形成在拋光墊上之微孔、凹槽及/或齒孔 的圖案; 將决疋的圖案輸入電腦數位控制(CNc)控制器; 5 選擇具有相當於該輸入圖案的微孔、凹槽及/或齒 孔之圖案的光罩;和 在該CNC控制器的控制下根據該輸入的圖案而支 撐該拋光墊的同時’驅動適合發射雷射光束的雷射裝 置與適合進行三維移動及旋轉的工作台,藉此由 1〇 Μ置將雷射光束發射至被該卫作台支撐的抛光塾上 ,同時依據該輸入的圖案移動該工作#,以便具有相 當於該已確定圖案之圖案的微孔、凹槽及/或齒孔被形 成在該抛光塾上。 2·如申請專利範項的方法,其中該由該雷射光束形 成在省拋光墊上的該光束點尺寸被調整,以調整被形 成在:亥拋光墊上之該些微孔、凹槽及/或齒孔的直徑或 深度: 3·如申請專利範圍第i項的方法,其中該雷射光束之連續 與間歇的照射週期被控制,以調整被形成在該拋光墊 上之孩二U孔、凹槽及/或齒孔的長度,以及在該雷射 光束行進方向中彼此相鄰配置之該些微孔、凹槽及/或 齒孔之間的空間。 4.如申請專利範圍第卜員的方法,其中該雷射光束的能量 被控制,以調整被形成在該拋光墊上之該些微孔、凹 24 1278028 拾、申請專利範圍 槽及/或齒孔的深度。 5·如申請專利範圍第1項 貝的方法,其中該工作台在X-、y_ 與z-轴方向私動’以調整被形成在該拋光墊上之該些 微孔、凹槽及/或齒孔對於該拋光墊的拋光面所定義的 5 角度。 251278028 Pick, Patent Application 1 1. A method for manufacturing a polishing pad, comprising the steps of: determining a pattern of micropores, grooves and/or perforations to be formed on a polishing pad; inputting a pattern of the decision into a computer digital control (CNc) controller; 5 selecting a mask having a pattern corresponding to the microholes, grooves and/or perforations of the input pattern; and supporting the polishing pad according to the input pattern under the control of the CNC controller Simultaneously 'driving a laser device suitable for emitting a laser beam and a table suitable for three-dimensional movement and rotation, whereby the laser beam is emitted by a device to the polishing pad supported by the table, and The input pattern moves the work # such that micropores, grooves and/or perforations having a pattern corresponding to the determined pattern are formed on the polishing pad. 2. The method of claim 1, wherein the beam spot formed by the laser beam on the polishing pad is sized to adjust the microvias, grooves, and/or formed on the polishing pad. Diameter or depth of the perforation: 3. The method of claim i, wherein the continuous and intermittent illumination periods of the laser beam are controlled to adjust the U-holes and grooves formed on the polishing pad And/or the length of the perforations, and the spaces between the microholes, grooves and/or perforations disposed adjacent to each other in the direction of travel of the laser beam. 4. The method of claim 2, wherein the energy of the laser beam is controlled to adjust the microholes, recesses, 12,128,2828, and the perforations of the patented range formed on the polishing pad. depth. 5. The method of claim 1, wherein the table is privately moved in the X-, y- and z-axis directions to adjust the microvias, grooves and/or teeth formed on the polishing pad. The hole is defined by the angle of 5 on the polished side of the polishing pad. 25
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