Claims (1)
1254747 十、申請專利範圍: 1. 一種導電薄膜保護層用之合金靶材,至少包含銅 (Cu)、鎳(Ni)以及鋅(Zn); /、中銅含量為50至80重量百分比,鎳含量為5至2〇重 里百分比,鋅含量為15至3〇重量百分比,且合金靶材之總 重量百分比為100%。 人八2·如申請專利範圍第1項所述之導電薄膜保護層用之 合金靶材,其中銅最佳含量為60至70重量百分比。 10 入八3·如申請專利範圍第1項所述之導電薄膜保護層用之 合金乾材’其中鎳最佳含量為10至15重量百分比。曰 八八4.如申請專利範圍第1項所述之導電薄膜保護層用之 α至靶材,其中鋅最佳含量為20至25重量百分比。 人八【如申請專利範圍第1項所述之導電薄膜保護層用之 15 ::::之更一包含貴金屬’其係選自翻(pt)、金(心)及鈀㈣ 合金申請專利範圍第5項所述之導電薄膜保護層用之 7 ’其中貴金屬含量為0.1至5.0重量百分比。 合全革巴叔如申請專利範圍第6項所述之導電薄膜保護層用之 2。量百分比:其中貴金屬為罐)’其最佳含量為。·。重 合二:申Λ專主利範圍第6項所述之導電薄膜保護層用之 重量百分比:、中貴金屬為金(AU)’其最佳含量為0.5至1.0 12 1254747 9 κ 合金 °申請專利範圍第6項所述之導電薄膜保護層用之 番旦材其中貴金屬為鈀(Pd),其最佳含量為〇5至1〇 里里百分比。 · 合金乾〇材如,申請專利範圍第1項所述之導電薄膜保護層用之 、h ,更包含耐蝕性金屬,其係選自鈦、鋁、鈷、鉻 /、物至少其中之一。 之合:广申請專利範圍第1〇項所述之導電薄膜保護層用 比。土巴材,其中耐蝕性金屬含量為〇·〇1至1.0重量百分 10 之合申請專利範圍第11項所述之導電薄膜保護層用 〇·2重量百八匕其中耐蝕性金屬為鈦,其最佳含量為0·〇5至 之合::材申?:胸第11項所述之導電薄膜保護層用 μ 〇2重量百:比其中耐㈣金屬為銘,其最佳含量為〇〇5至 之合請範圍第11項所述之導電薄膜保護層用 u重量純金屬絲,其最佳含量為⑽至 20 入^如中請專利範圍第η項所述之導電薄膜保護層用 之口盘靶材,其中耐蝕性金屬為絡 a 0.2重量百分比。 K土 3!為0.05至 16·如申請專·圍第丨項所述之導 合金乾材,其係應用於半導體或平面顯示器:面蒦= 板,於導線、電極或辅助電極上形成保護層。 s 土 13 1254747 17· —種導電薄膜用之合金靶材,至少包含鋼(c^、錄 (Ni)以及鋅(Zn); 其中銅含量為50至80重量百分比,鎳含量為5至2〇重1254747 X. Patent application scope: 1. An alloy target for conductive film protective layer containing at least copper (Cu), nickel (Ni) and zinc (Zn); /, medium copper content of 50 to 80% by weight, nickel The content is 5 to 2 weight percent, the zinc content is 15 to 3 weight percent, and the total weight percentage of the alloy target is 100%. The alloy target for an electroconductive thin film protective layer according to claim 1, wherein the optimum content of copper is 60 to 70% by weight. 10 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。八 八。 4. The α to target for the conductive film protective layer according to claim 1, wherein the optimum content of zinc is 20 to 25 weight percent. [8] [15] The conductive film protective layer described in the first paragraph of the patent application is as follows: 15::: The other one contains precious metals, which are selected from the patents of pt, gold, and palladium. The conductive film protective layer according to Item 5, wherein the noble metal content is from 0.1 to 5.0% by weight. For the purpose of applying for the protective layer of conductive film as described in item 6 of the patent application. Percentage: wherein the precious metal is a can). The optimum content is . ·. Coincidence 2: The weight percentage of the conductive film protective layer mentioned in item 6 of the application scope of the application: the medium precious metal is gold (AU)', and the optimum content is 0.5 to 1.0 12 1254747 9 κ alloy ° patent application range In the conductive film protective layer according to Item 6, the noble metal is palladium (Pd), and the optimum content thereof is 〇5 to 1 〇. The alloy dry coffin is, for example, the conductive film protective layer according to the first aspect of the patent application, h, further comprising a corrosion-resistant metal selected from at least one of titanium, aluminum, cobalt, chromium/. The combination of the conductive film protective layer described in the first application of the patent application scope. Tuba material, wherein the corrosion resistant metal content is 〇·〇1 to 1.0 weight percent 10, and the conductive film protective layer described in Item 11 is 〇·2 weight hundred 匕, wherein the corrosion resistant metal is titanium. The optimum content is 0·〇5 to the combination:: material application? : The conductive film protective layer described in Item 11 of the chest is used for μ 〇 2 weight: compared with the resistance of (4) metal, the optimum content is 〇〇5 to the range of the conductive film protective layer described in item 11 The U-weight pure metal wire has an optimum content of (10) to 20, which is a disk target for a conductive film protective layer as described in the above-mentioned patent scope, wherein the corrosion-resistant metal is 0.2 by weight. K soil 3! is 0.05 to 16 · As applied in the special alloy dry material described in the article, it is applied to semiconductor or flat panel display: surface 蒦 = plate, forming a protective layer on the wire, electrode or auxiliary electrode . s Earth 13 1254747 17·—A kind of alloy target for conductive film, containing at least steel (c^, Ni (Ni) and zinc (Zn); wherein the copper content is 50 to 80% by weight, and the nickel content is 5 to 2〇 weight
10 15 量百分比,鋅含量為15至30重量百分比,且合金耙材之總 重量百分比為100%。 18.如申請專利範圍第17項所述之導電薄膜用之合金 革巴材’其中銅最佳含量為60至70重量百分比。 19·如申請專利範圍第17項所述之導電薄膜用之合金 革巴材’其中鎳最佳含量為1〇至15重量百分比。 口 2〇·如申請專利範圍第17項所述之導電薄膜用之合金 1巴材’其中鋅最佳含量為20至25重量百分比。 21·如申請專利範圍第17項所述之導電薄膜用之合金 ^ ’更包含貴金屬,其係選自銘(Pt)、金(Au)及把(pd) 夕其中之—。 22.如申請專利範圍第21項所述之導電薄膜用之合金 巴材,其中貴金屬含量為〇1至5.〇重量百分比。 靶材23Π^專利範圍第22項所述之導電薄膜用之合金 八,其中貴金屬為鉑(pt),其最佳含量為0.5至1〇重量百 • 20 · °曱請專利範圍第22項所述之導電薄膜用之 yV ,其中貴金屬為金(An),其最佳含量為0.5至丨〇重 分比。 土丄⑴里 14 1254747 25.如中請專利範圍第22項所述之導電薄膜用之合金 八’其中貴金屬為麵(Pd),其最佳含量為〇5至1〇重量百 刀比。 26·如中請專利範圍第17項所述之導電薄膜用之合金 ,更包含耐蝕性金屬,其係選自鈦、在呂、鈷、鉻及其 心合物至少其中之_。 27·如巾請專利範圍第%項所述之導電薄膜用之合金 % 材,其中耐蝕性金屬含量為重量百分比。 1 28·如中請專利範圍第27項所述之導電薄膜用之合金 才其中耐钱性金屬為鈦,其最佳含量為〇〇5至〇2重量 百分比。 · 29·如t請專利範圍第27項所述之導電薄膜用之合金 材其中耐蝕性金屬為鋁,其最佳含量為〇 〇5至〇.2重量 百分比。 15 ^ 〇·如申睛專利範圍第27項所述之導電薄膜用之合金 才其中耐蝕性金屬為鈷,其最佳含量為〇 〇5至〇·2重量 百分比。 萆巴3 1 ·如申喷專利範圍第27項所述之導電薄膜用之合金 2〇 ,其中耐蝕性金屬為鉻,其最佳含量為0.05至0.2重量 乾32·如申睛專利範圍第17項所述之導電薄膜用之合金 =材’其係應用於半導體或平面顯示器之面板或基板形成 ^線、電極或輔助電極。 15 1254747 之合=°材2,專圍第33項所述之導電薄膜保護層用 其係選自鈇、ΓΓ’其中步驟(A)更加人耐㈣金屬, 鈦鋁、鈷、鉻及其混合物至少其中之一。 之人々 U利乾圍第39項所述之導電薄膜保護層用 :::材之製造方法’其中耐蝕性金屬含量為0.01至10 垔里百分比。 之人t如中請專利範圍第4G項所述之導電薄膜保護層用 旦:i巴材之製造方法’其中耐蝕性金屬為鈦,其最佳含 里為0.05至0.2重量百分比。 ίο 15 20 之合專/=圍第4G項所述之導㈣膜保護層用 量為二耐錄仙 =·如申請專利範圍第40項所述之導電薄膜保護層用 旦。金㈣之製造方法,其中耐錄金屬域,其最佳 里為0.05至0.2重量百分比。 44. 如申請專利範圍第4〇項所述之導電薄膜保護層用 曰^金㈣之製造方法,其切純金屬為鉻, 夏為0.05至0.2重量百分比。 45. —種如申請專利範圍第17項所述 之合金㈣之製造方法,包含下財驟: $_用 料,㈧將銅(CU)、鎳㈤)以及鋅(Zn)依適當比例混合備 二置於真工中以電孤溶化,且利用一溶煉方法製成一 k ’其中該輯方法為真空溶煉法或真空精煉法;以及 17 1254747 (B)將該料進行_熱機加工 .材’其中該熱機加工程序包含 ^一合金乾 組合。 …,袞〔、熱處理及其 4 6 ·如申請專利銘固# λ p y • 5靶材之f造方法,工、所述之導電薄膜用之合金 」 中步驟(Α)更加入貴金屬,1传選自始 (Pt)、金(Au)及鈀(Pd)至少其中之一。 ,、係k自鉑 4 7 ·如申請專利簕笛“ s 靶材…方ή: 所述之導電薄膜用之合金 才之“方法,其中貴金屬含量為0」至5.0重量百分比 ίο 革巴材4之 專^圍第47項所述之導電薄膜用之合金 年巴材之製造方法,其中眚令 工 幻.0重量百分比。胃“為_,其最佳含量為〇.5 49·如申請專利範圍第47:ι:百&、+、々、皆^ •材之製造方法,其中薄膜用之合金 至U)重量百分比。η屬為金㈣,其最佳含量為0.5 15 50·如申請專利範圍第47項所述之導電薄膜用之合金 靶材之製造方法,其中貴金屬為鈀(Pd), 幻.0重量百分比。 ϋ土含I為0·5 20 51•如申請專利範圍第45項所述之導電薄膜用之人全 靶材之製造方法’其中步驟⑷更加入耐蝕性金屬,其:選 自鈦、鋁、鈷、鉻及其混合物至少其中之—。 “ k 52_如申請專利範圍第51項所述之導電薄膜用之合金 靶材之製造方法,其中耐蝕性金屬含量為〇 〇 1至丨旦 分比。 $百 18 1254747 靶材之萝迕方去苴 、之v电缚膜用之合金 爻衣k方法,其中耐蝕性金屬為鈦,其 王 至〇·2重量百分比。 3里為0.05 54.如申請專利範圍第52項所述之導電薄膜用之合八 靶材之製造方法,其中耐蝕性金屬為鋁,其最佳人旦。金 裏0.2重量百分比。 4-()5 55·如申請專利範圍第52項所述之導電薄膜用之合八 粑材之製仏方去,其中耐蝕性金屬為鈷,其最佳含旦5 I 灵〇·2重量百分比。 里4〇·05 10 56·如申請專利範圍第52項所述之導電薄膜用之合八 粑材之製造方法,其中耐蝕性金屬為鉻,其最佳含"金 至_〇.2重量百分比。 ''' 〇·〇5 1510 15 % by weight, the zinc content is 15 to 30 weight percent, and the total weight percentage of the alloy coffin is 100%. 18. The alloy leather material for an electroconductive film according to claim 17, wherein the copper content is from 60 to 70% by weight. 19. The alloy leather material for an electroconductive film according to claim 17, wherein the optimum content of nickel is from 1 Torr to 15% by weight. Port 2〇 The alloy for the conductive film according to claim 17 of the patent application, wherein the optimum content of zinc is 20 to 25 weight percent. 21· The alloy for conductive film according to claim 17 of the patent application is further comprising a precious metal selected from the group consisting of Ming (Pt), gold (Au) and (pd). 22. The alloy material for an electroconductive film according to claim 21, wherein the precious metal content is 〇1 to 5. 〇 by weight. The target material 23 Π ^ alloy of the conductive film described in Item 22 of the patent range, wherein the precious metal is platinum (pt), and the optimum content is 0.5 to 1 〇, and the weight is 100 • 20 ° °. The yV used for the conductive film, wherein the noble metal is gold (An), and the optimum content thereof is 0.5 to 丨〇 by weight. In the soil (1) 14 1254747 25. The alloy for the conductive film described in the 22nd paragraph of the patent application, wherein the noble metal is the surface (Pd), the optimum content is 〇5 to 1 〇 by weight. 26. The alloy for an electroconductive film according to claim 17, further comprising a corrosion-resistant metal selected from the group consisting of titanium, at least ruthenium, cobalt, chromium and a composite thereof. 27· For the towel, please use the alloy % material for the conductive film mentioned in the scope of the patent item, wherein the corrosion-resistant metal content is percentage by weight. 1 28. The alloy for conductive film according to item 27 of the patent application is wherein the nitrimetric metal is titanium, and the optimum content is 〇〇5 to 〇2 by weight. · 29· If you want to use the alloy for conductive film described in item 27 of the patent scope, the corrosion-resistant metal is aluminum, and the optimum content is 〇5 to 〇.2 by weight. 15 ^ 〇 · The alloy for conductive film described in the scope of patent application No. 27, wherein the corrosion-resistant metal is cobalt, and the optimum content is 〇 5 to 〇 2 by weight.萆巴3 1 · The alloy for conductive film according to item 27 of the patent application scope, in which the corrosion-resistant metal is chromium, the optimum content is 0.05 to 0.2 weight dry 32. The alloy for the conductive film described in the article is applied to a panel or substrate of a semiconductor or flat panel display to form a wire, an electrode or an auxiliary electrode. 15 1254747 combination = ° material 2, specifically for the conductive film protective layer described in item 33, which is selected from the group consisting of 鈇, ΓΓ', wherein step (A) is more resistant to humans (tetra), titanium aluminum, cobalt, chromium and mixtures thereof At least one of them. The manufacturing method of the conductive film protective layer described in Item 39 of Ulikanwei, the corrosion-resistant metal content is 0.01 to 10 垔. The person who has the conductive film protective layer described in the fourth paragraph of the patent scope uses the method of manufacturing the material of the invention, wherein the corrosion-resistant metal is titanium, and the optimum content thereof is 0.05 to 0.2% by weight. Ίο 15 20 / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / The manufacturing method of the gold (four), wherein the metallurgical domain is preferably 0.05 to 0.2% by weight. 44. The method for producing a conductive film protective layer according to the invention of claim 4, wherein the cut metal is chromium and the summer is 0.05 to 0.2 weight percent. 45. A manufacturing method for alloy (4) as described in claim 17 of the patent application, comprising the following fiscal rules: $_material, (8) mixing copper (CU), nickel (5), and zinc (Zn) in appropriate proportions The second is placed in the real work to be dissolved by electricity, and a k' is made by a melting method, wherein the method is vacuum melting or vacuum refining; and 17 1254747 (B) is subjected to heat processing. The material 'where the thermal machining program comprises a dry combination of alloys. ..., 衮 [, heat treatment and its 4 6 · If you apply for the patent Ming Gu # λ py • 5 target material manufacturing method, the alloy used in the conductive film described in the step (Α) added precious metals, 1 pass It is selected from at least one of the first (Pt), the gold (Au) and the palladium (Pd). ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, The manufacturing method of the alloy annual bake material for the conductive film described in Item 47, wherein the weight is 0% by weight. The stomach is "y", and its optimum content is 〇.5 49. As in the patent application range 47: ι: 100 &, +, 々, ^, the manufacturing method of the material, wherein the alloy for the film to U) weight percentage η is a gold (four), the optimum content of which is 0.5 15 50. The method for producing an alloy target for an electroconductive film according to claim 47, wherein the noble metal is palladium (Pd), imaginary. 0% by weight The alumina containing I is 0·5 20 51. The method for producing a full-object for a conductive film according to claim 45 of the patent application, wherein the step (4) further comprises a corrosion-resistant metal, which is selected from the group consisting of titanium and aluminum. And a mixture of cobalt, chromium and a mixture thereof. The method for producing an alloy target for an electroconductive film according to claim 51, wherein the corrosion resistant metal content is 〇〇1 to 丨1 ratio. $100 18 1254747 The target of the radish 苴 苴 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 In the case of 3, it is 0.05 54. The method for producing a composite target for an electroconductive film according to claim 52, wherein the corrosion-resistant metal is aluminum, which is the best one. Gold is 0.2% by weight. 4-()5 55· As described in claim 52, the conductive film for the conductive film is made of bismuth, wherein the corrosion-resistant metal is cobalt, and the optimum contains 5 〇 〇 2 2 weight percentage.里 4〇·05 10 56· The manufacturing method of the octagonal material for the electroconductive film according to claim 52, wherein the corrosion-resistant metal is chromium, and the best contains "gold to _〇.2 weight percentage. ''' 〇·〇5 15
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