TWI250621B - Semiconductor package singulating system and method - Google Patents
Semiconductor package singulating system and method Download PDFInfo
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- TWI250621B TWI250621B TW093127237A TW93127237A TWI250621B TW I250621 B TWI250621 B TW I250621B TW 093127237 A TW093127237 A TW 093127237A TW 93127237 A TW93127237 A TW 93127237A TW I250621 B TWI250621 B TW I250621B
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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Description
1250621 -—-- 五、發明說明(1) 【發明所屬之技術領域】 本發明-般是關於一種半導體切割系統,特別是關於 種用以切割結構上為可彈性施力的拓樸(— y )平坦表面的半導體封裝之半導體切割系統。 【先前技術】 牙貝體電路(I C )晶片是由多個典型被排列在一單一基 板上的1 c晶片組裝而成。在傳統IC晶片製程中,矽晶粒 (silicon dies)最初是經由晶粒接合(die b〇nding) 、打線接合裝置( wire b〇nding )或覆晶黏著(f 1 ip c i p mount 1 ng )被結合在導線架的襯墊上,隨後封膠在 塑封材料中以取得一單一基板,最後為切割以從中獲取分 離獨立的I C晶片封裝。 形成基板的封裂通常是使用切割機(謂)、晶圓切 割機U1C1ng saw)或這類切斷裝置分離。基板通常由一 橡膠墊或此類支持物支撐,橡膠墊接合基板鱼 。然後空氣經由成形在橡膠墊中的複數個孔抽離,由此創 造出真空。真空使得基板在分離封裝之前及之後,以及在 切割期間皆能牢固在切割機夾具上。 美國專利第 6, 6 3 8, 7 9 1 B2 (Tleber 丨)、6 1 87 79 1 B1 (Tieber 2) 、6,165,232 (Tleber 3)和6,;21 ;39 B1 (ROBERTS)揭示此種真空固定方法。了 ’ T i e b e r 2和T i e b e r 3說明使用一種去斤其化α 元。巢狀排列單元具有複數個自桌狀排列單 的基座。經由成形在每-基座中的通之柵格突出 ^屋生之真空使基BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention generally relates to a semiconductor cutting system, and more particularly to a topology for elastically applying force on a cutting structure (-y A semiconductor packaged semiconductor cutting system with a flat surface. [Prior Art] A dental shell circuit (IC) wafer is assembled from a plurality of 1 c wafers typically arranged on a single substrate. In the conventional IC wafer process, silicon dies are initially bonded via die bonding, wire b〇nding or flip-chip bonding (f 1 ip cip mount 1 ng ). Bonded to the liner of the leadframe, then encapsulated in a molding compound to obtain a single substrate, and finally cut to obtain a separate IC package from which to be separated. The formation of the substrate is usually separated by a cutting machine (say), a wafer cutter U1C1ng saw or such a cutting device. The substrate is typically supported by a rubber pad or support such that the rubber pad engages the substrate fish. The air is then evacuated through a plurality of holes formed in the rubber mat, thereby creating a vacuum. The vacuum allows the substrate to be securely attached to the cutter fixture before and after the separation package, as well as during cutting. U.S. Patent Nos. 6, 6 3 8, 7 9 1 B2 (Tleber 丨), 6 1 87 79 1 B1 (Tieber 2), 6, 165, 232 (Tleber 3) and 6, 21; 39 B1 (ROBERTS) Vacuum fixing method. 'T i e b e r 2 and T i e b e r 3 indicate the use of a kind of agglomerated alpha element. The nested array unit has a plurality of pedestals arranged in a table shape. Through the grid formed in each of the pedestals
INVENT20040901PI50.ptd 1250621 五、發明說明(2) 板牢固在巢狀排列單元上以供之後的晶粒切割。ROBERTS 說明一種類似的固定系統,不需使用保持板來將基板自巢 狀排列單元移除。INVENT20040901PI50.ptd 1250621 V. INSTRUCTIONS (2) The plate is firmly fixed on the nesting unit for subsequent grain cutting. The ROBERTS describes a similar fixing system that does not require the use of a retaining plate to remove the substrate from the nesting unit.
隨著半導體封裝體積的縮小’較小封裝的需求隨之增 加。然而,上述傳統經由橡膠墊達到真空的方法,如 Tieber 1 、Tieber 2 、Tieber 3 和Roberts 所揭露的,不 再能迎合這些較小封裝的牢固需要。雖然封裝的體積縮小 了,其分離(例如晶粒切割過程)時所導入的切削力仍舊 沒有改變。晶粒切割是一種會產生巨大力量(例如切向力 或橫向力)的接觸切割過程。 因此,將基板固定在切割機夾具的保持力以及在橡膠 墊與獨立封裝之間所提供的摩擦力必須能克服切割刀片的 側邊切削力以避免封裝在切割期間移動。在封裝的尺寸縮 小時,產生摩擦力的實際區域也縮小了 ,因而使得晶粒切 割過程因封裝的移動或飛離而失敗。 為了改善在橡膠墊的摩擦力,美國專利第6,3 4 4,4 〇 2 B1號(Sekiya )及第6, 5 94, 8 9〇 β2號(紅以)揭露使用一 種取代橡膠墊的黏著墊。As the size of semiconductor packages shrinks, the need for smaller packages has increased. However, the above-mentioned conventional methods of achieving vacuum via rubber pads, such as those disclosed by Tieber 1, Tieber 2, Tieber 3, and Roberts, no longer cater to the robust needs of these smaller packages. Although the package is reduced in size, the cutting force introduced during separation (such as the die cutting process) remains unchanged. Grain cutting is a contact cutting process that produces tremendous forces, such as tangential or lateral forces. Therefore, the holding force of the substrate to be fixed to the cutter jig and the frictional force provided between the rubber pad and the individual package must overcome the side cutting force of the cutting blade to prevent the package from moving during cutting. When the size of the package is reduced, the actual area where the friction is generated is also reduced, thereby causing the die cutting process to fail due to the movement or flying away of the package. In order to improve the friction on the rubber mat, U.S. Patent Nos. 6, 3 4 4, 4 〇 2 B1 (Sekiya) and 6, 5 94, 8 9 〇 β2 (Red) disclose the use of a rubber mat to replace the adhesive. pad.
Arai s兄明使用一種其中成形有毛孔之黏著墊。放置Arai s brothers use an adhesive pad in which pores are formed. Place
Ϊ I Ϊ上的半導體晶圓不僅經由黏著塾的黏著力撐托, 、、二由通過毛孔產生的真空之吸力鈇 用其他加熱器的步驟,以脾針从办f …、而 另外而要 導體晶圓自黏著塾分離。將黏者墊加熱至預設溫度來使The semiconductor wafer on the Ϊ I 不仅 is not only supported by the adhesive force of the adhesive ,, but also by the suction of the vacuum generated by the pores, the steps of the other heaters, the spleen needles, and the other conductors. The wafer is separated from the adhesive. Heat the pad to a preset temperature to make
SeUya說明使用—種結合膠帶及真空以使半導體晶SeUya explains the use of a combination of tape and vacuum to make the semiconductor crystal
INVENT20040901PI50.ptd 第9頁 1250621 五、發明說明(3) 黏附於框架上。然而在S e k i y a的揭露中亦需要另外的步驟 ,使用一種氣流將切割的半導體晶圓撞出框架,該氣流是 從起初是做為創造真空的表面射出。 此外,使用黏著劑或膠帶來固定半導體封裝是無效的 。在後續處理已切割的半導體封裝需要另一個步驟乾淨地 移除每個切割好的半導體封裝的黏著劑或膠帶。 美國專利第3, 9 7 6, 2 8 8號(Cuomo )說明一種在切割過 程中維持半導體晶圓定位的裝置。此裝置具有一個平坦晶 圓,沿著容納區域平面形成有一冽凹槽。基座單元是用以 支撐其上方之半導體晶圓。基座單元更進一步具有複數個 成形於其中之通道,以產生真空。Cuomo進一步說明一種 具有複數只肋條之蓋體,每一肋條附加有可壓縮材料。每 對相鄰肋條彼此相間隔以使切割刀片更加容易自其間穿過 〇 因為半導體晶圓典型為平面、易碎,且實質上為平坦 表面的拓撲結構,Cuomo中的基座單元之平面、堅固的容 納區域是做為確保真空密封並防止脆弱的晶圓彎曲。然而 ,若將此種裝置應用在半導體封裝切割上,特別是四邊扁 平無引腳(quad flat no - lead,QFN)封裝或此類具有銅 製導線架之小型封裝,此種半導體封裝基板之翹曲(w a r -page )將導致真空沿著半導體封裝與基座單元堅硬平坦的 容納區域之接合面漏出。INVENT20040901PI50.ptd Page 9 1250621 V. Description of invention (3) Adhesive to the frame. However, in the disclosure of S e k i y a, an additional step is required to use a gas stream to deflect the cut semiconductor wafer out of the frame, which is emitted from the surface which was originally created as a vacuum. In addition, the use of an adhesive or tape to fix the semiconductor package is ineffective. Subsequent processing of the diced semiconductor package requires another step to cleanly remove the adhesive or tape from each of the diced semiconductor packages. U.S. Patent No. 3,9,7,8,8,8 (Cuomo) describes a device for maintaining the positioning of a semiconductor wafer during the cutting process. The device has a flat crystal with a groove formed along the plane of the receiving area. The pedestal unit is used to support the semiconductor wafer above it. The base unit further has a plurality of channels formed therein to create a vacuum. Cuomo further describes a cover having a plurality of ribs, each rib being provided with a compressible material. Each pair of adjacent ribs are spaced apart from one another to make the cutting blade easier to pass between them. Because the semiconductor wafer is typically planar, fragile, and essentially a flat surface topology, the base unit of the Cuomo is flat and sturdy. The containment area is designed to ensure a vacuum seal and prevent fragile wafer bending. However, if such a device is applied to semiconductor package cutting, especially a quad flat no-lead (QFN) package or such a small package with a copper lead frame, the warpage of such a semiconductor package substrate (war -page ) will cause the vacuum to leak along the interface of the semiconductor package and the hard and flat receiving area of the base unit.
INVENT20040901PI50.ptd 第 10 頁 1250621 五、發明說明(4) 來 …、可迻免使得每一肋條的橫斷面變厚以確保結構上 足夠堅硬以杈~ &較長間距。然而,典型的切割刀片裝 ,有V形襯套並气承於v形襯套之間。由於切割刀片徑向較 薄’徑向突出於每對相鄰肋條的切割刀片之總和很小。所 以,通過每對相鄰肋條的切割刀片延伸太遠將導致V形襯 套與肋條相碰彳里。所以在(:11〇111〇中,肋條向外面對可壓縮 材料的部份為斜切成符合並容納v形襯套以防止在切割刀 片插入母對相郅肋條之間時所引起的損害。斑微型半導體 相較,肋條的尺寸相對較大,故具V形斜切面的肋條其厚 橫斷面在使用在微型半導體封裝的切割上是不適用的。 此外,在Cu〇mo基座單元中必須成形有凹槽以允許在 切割晶圓時切割刀片能越過半導體晶體並朝向基座單元, 而在基座單元中製造凹槽不僅耗時且花錢。 因此,明顯需要一種改善的半導體封裝切割系統。 【發明内容】 本發明之具體貫施是提供_種吸力與夾持力之結合以 在切割時固定基板。基板由一可壓縮支持墊支撐,該可壓 縮支持墊具有產生真空並依此將吸力導入基板之通道。支 持塾結合有一基底板。當夾持件置放於切割機夾具以將基 板夾持於其間時,夾持力即被施加於基板上。 "I【ϊ,ΐ ί本發明之第—目的’揭示-種半導體封裝 切割糸統,包含: -切:機夾具,具有—支撐基板的 具施加吸力於基板上,以使基板固定在切割機爽具上,ίINVENT20040901PI50.ptd Page 10 1250621 V. INSTRUCTIONS (4) ..., can be removed so that the cross section of each rib is thickened to ensure that the structure is sufficiently rigid to have a longer spacing. However, a typical cutting blade assembly has a V-shaped bushing and is entrained between the v-shaped bushings. Since the cutting blade is radially thinner, the sum of the cutting blades that protrude radially from each pair of adjacent ribs is small. Therefore, extending too far through the cutting blades of each pair of adjacent ribs will cause the V-shaped bushing to collide with the ribs. Therefore, in (:11〇111〇, the portion of the rib facing outward toward the compressible material is chamfered to conform to and accommodate the v-shaped bushing to prevent damage caused when the cutting blade is inserted between the mother and the opposing ribs. Compared with plaque micro-semiconductors, the ribs are relatively large in size, so the ribs with V-shaped chamfered surfaces are not suitable for use in the cutting of micro-semiconductor packages. In addition, the Cu〇mo base unit is not suitable. A recess must be formed to allow the cutting blade to pass over the semiconductor crystal and toward the base unit when the wafer is being diced, and making the recess in the base unit is time consuming and costly. Therefore, there is a clear need for an improved semiconductor package. The present invention is directed to providing a combination of suction and clamping force to secure a substrate during cutting. The substrate is supported by a compressible support pad having a vacuum and The suction force is introduced into the passage of the substrate. The support jaw is coupled to a base plate. When the clamp member is placed on the cutter jig to hold the substrate therebetween, the clamping force is applied to the substrate. "I [ϊ,ΐ 本 the first object of the present invention] discloses a semiconductor package cutting system comprising: - cutting: a machine fixture having a support substrate with a suction applied to the substrate to fix the substrate in the cutting On the cool, ί
INVENT20040901PI50.ptdINVENT20040901PI50.ptd
第11 頁 1250621 ,基板 及第二 割機夾 於基板 基板被 入基板 由切割 板上的 基板上 止基板 二目的 件,與切 持力施加 而不會在 割刀片進 在切削力 施加於基 ’施加於 移除時防 〇 發明之第 下步驟: 種具有支 定位於支 割機夾具 支持墊為 裝且基板 件與切割 持力於基 會在基板 片進入基 在切削力 施加於基 持墊之切 持墊上; 施加吸力 具彈性恢 包含有第 機夾具合 板上以進 被夾持於 板的至少 由切割刀 板上的吸 的至少一部 部份;以及 具合作以將 上以進一步 夾持於切割 的至少一個 刀片導入基 吸力與夾持 的吸力進一 的第一部份 五、發明說明(5) 持墊為具彈性恢復力 基板包含有第一部份 一夾持 夾持件將失 機夾具上, 間時阻礙切 依此, 一部份時, 位移,其中 基板或自其 個部份位移 根據本 法’包括以 提供一 將基板 藉由切 割機夾具, 為半導體封 使夾持 持件施加夾 具上,而不 阻礙切割刀 依此, 二部份時, 份為半導體封裝且 基板夾持於其中, 使基板固定於切割 機夾具與失持件之 部份; 板以分開第一及第 力大體上能避免其 步在失持件作用於 或苐_'部份至少一 揭露一種半導體封裝切割方 割機夾具; 於 基 板 上 以 將 基 板 固 定 於 切 復 力 基 板 的 至 少 一 個 部 份 部 份 及 第 二 部 份 以 及 作 將 基 板 夾 持 於 其 間 , 該 夾 一 步 使 基 板 牢 固 於 切 割 機 夾 切 割機 夾 豆 與 夾 持 件 之 間 時 個 部 份 片 導 入 基 板 以 分 開 第 , 明 及 第 力 與 夾 持 力 大 體 避 免 其 位 移Page 11 1250621, the substrate and the second cutter are clamped on the substrate substrate into the substrate, and the substrate is stopped by the substrate on the cutting board, and the substrate is applied with a holding force without applying a cutting force to the base in the cutting blade. The first step of the invention is applied to the removal of the tamper-evident invention: the support has a support for the support fixture of the cutter, and the substrate member and the cutting force are applied to the substrate at the substrate. Holding the pad; applying the suction force elastically to recover the at least one portion of the first jig ply plate to be clamped to the plate at least by the cutting blade; and cooperate to further clamp the upper portion The first portion of the cut at least one blade is introduced into the base suction force and the suction force of the clamp. 5. (5) The pad is an elastic restoring force. The substrate comprises a first portion, and the clamping clamp member will be a lost clamp. The upper and lower obstructions are cut according to this, and a part of the displacement, in which the substrate or part of the displacement is according to this method 'includes to provide a substrate by the cutter fixture, for half The body seal enables the clamping member to be applied to the clamp without hindering the cutting blade. In the second part, the portion is a semiconductor package and the substrate is clamped therein to fix the substrate to the cutter fixture and the missing component; The board is separated from the first and the first force to substantially prevent the step from acting on the yoke portion or at least one of the semiconductor package cutting square cutter fixtures; and the substrate is fixed on the substrate to fix the substrate to the tangential force substrate At least one partial portion and a second portion are used to sandwich the substrate therebetween, and the clamping step is to make the substrate firmly between the cutter clip cutter and the clamping member, and the partial portion is introduced into the substrate to separate The first, the first and the third force and the clamping force generally avoid the displacement
1250621 五、發明說明(6) ,其中,施加於基板上的吸力進一步在夾持件作用於基板 或自其移除時防止基板的第一部份或第二部份至少一個部 份位移。 根據本發明之第三目的,揭露一種半導體切割系統, 包含: 一切割機夾具,包括一支撐基板的支持墊,切割機夾 具施加吸力於基板上以將基板固定於切割機夾具,支持墊 為具彈性恢復力且基板包含: 一第一半導體封裝; 一未與第一半導體封裝分離之第二半導體封裝; 及 一成形在第一半導體封裝與第二半導體封裝之間 的第一分隔線;以及 一第一夾持件,與切割機夾具合作以將基板夾持與其 間,第一夾持件施加夾持力於基板上,以進一步使基板固 定於切割機夾具上,而不會在基板被夾持於切割機夾具與 夾持件之間時阻礙切割刀片進入基板的至少一個部份; 依此,當大體沿著第一分隔線切割以將第一半導體封 裝與第二半導體封裝分隔,在切削力由切割刀片導入基板 以分開基板時,施加於基板上的吸力與夾持力大體避免其 位移, 其中,在第一半導體封裝自第二半導體封裝分離後, 施加於基板的吸力進一步在夾持件作用於基板或自其移除 時防止第一半導體封裝及第二半導體位移。1250621 5. The invention (6), wherein the suction applied to the substrate further prevents at least one portion of the first portion or the second portion of the substrate from being displaced when the clamping member acts on or is removed from the substrate. According to a third object of the present invention, a semiconductor cutting system includes: a cutter fixture including a support pad supporting a substrate, the cutter fixture applying a suction force on the substrate to fix the substrate to the cutter fixture, and the support pad is The elastic restoring force and the substrate comprises: a first semiconductor package; a second semiconductor package not separated from the first semiconductor package; and a first dividing line formed between the first semiconductor package and the second semiconductor package; a first clamping member cooperates with the cutter fixture to sandwich the substrate therebetween, and the first clamping member applies a clamping force to the substrate to further fix the substrate to the cutter fixture without being clamped on the substrate Holding between the cutter clamp and the clamping member, obstructing the cutting blade from entering at least one portion of the substrate; thereby, when substantially cutting along the first dividing line to separate the first semiconductor package from the second semiconductor package, in cutting When the force is introduced into the substrate by the cutting blade to separate the substrate, the suction force and the clamping force applied to the substrate substantially avoid the displacement thereof, wherein, in the first Since the second suction semiconductor package separate semiconductor package, is further applied to the substrate holding member acts to prevent the substrate or from the first semiconductor package and the second semiconductor remove their displacement.
INVENT20040901PI50.ptd 第13頁 1250621 五、發明說明(7) 【實施方式】 :種如後所述之半導體封裝系統,可解決前述問題。 ΐ:之第一具體實施’—種半導體封裝切割系統 ,以半導體切割系統之立體圖如第一之a圖所示,哼 半導體封裝切割系統(2G)之局部剖面圖如第二圖所示。 半導體封裝切割系統(20),如第一之3圖所示,包含 T 機夾具(22)及一夾持件(24)。該切割機夾具(22) $代為使一基板(26)支撐於上。切割機夾具(22)包含有一 = = (28)做為支撐基板(26),及一支持墊(3Q)做為接合INVENT20040901PI50.ptd Page 13 1250621 V. INSTRUCTION DESCRIPTION (7) [Embodiment] A semiconductor package system as described later can solve the aforementioned problems. ΐ: The first embodiment is a semiconductor package cutting system, the perspective view of the semiconductor cutting system is shown in the first figure a, and the partial cross-sectional view of the semiconductor package cutting system (2G) is shown in the second figure. The semiconductor package cutting system (20), as shown in the first figure 3, includes a T machine clamp (22) and a clamping member (24). The cutter jig (22) is replaced by a substrate (26). The cutter clamp (22) includes a == (28) as a support substrate (26) and a support pad (3Q) as a joint
土板(26)與基底板(28)。支持墊(3〇)為具有彈性恢復力並 施加摩擦抓力於基板(2 6 )。 如第一之a圖及更明確的第二圖所示,支持墊(3〇)包 含有複數只墊通道(32),自支持墊(3〇)的第一面延伸至第 一面。支持墊(30)大體上為平面,具有面向外側的第一面 及第二面。當基板(26)由切割機夾具(22)支撐而基板(26) 與支持墊(30)的第一面相鄰時,真空經由該複數只通道 (32)產生以大體使基板(2β)與支持墊(3〇)真空結合。 、、基底板(2 8 )包含有一成形於内的凹處(3 6 )及複數只板Earth plate (26) and base plate (28). The support pad (3 〇) has an elastic restoring force and applies a frictional grip to the substrate (26). As shown in the first diagram a and the more detailed second diagram, the support pad (3 inch) package includes a plurality of pad channels (32) extending from the first side of the support pad (3 turns) to the first side. The support pad (30) is generally planar with a first side and a second side facing outward. When the substrate (26) is supported by the cutter jig (22) and the substrate (26) is adjacent to the first side of the support pad (30), vacuum is generated via the plurality of channels (32) to substantially cause the substrate (2β) and Support pad (3 〇) vacuum combination. The base plate (28) includes a recess (3 6 ) formed therein and a plurality of plates
通道(38)。板通道(38)自基底板(28)的凹處(36)延伸向板 面(40)。當支持墊(3〇)與基底板(28)結合時,基底板(28) 的板面(40)與支持墊(30)的第二面密合。每一板通道(38) 與相應墊通道(32)對齊以使凹處(36)與墊通道(32)間的氣 體交流更加容易。 基板(26)包含一導線架(42)及複數個未切割的半導體Channel (38). The plate passage (38) extends from the recess (36) of the base plate (28) toward the plate surface (40). When the support pad (3) is combined with the base plate (28), the plate surface (40) of the base plate (28) is in close contact with the second surface of the support pad (30). Each plate channel (38) is aligned with the corresponding pad channel (32) to facilitate gas communication between the recess (36) and the pad channel (32). The substrate (26) includes a lead frame (42) and a plurality of uncut semiconductors
1250621 發明說明(8) _ 封裝(44a),其具有拓樸 (4 6 )。後文中,半導體 表面且被排列並分類成區段1250621 DESCRIPTION OF THE INVENTION (8) _ Package (44a), which has a topology (4 6 ). In the following, the semiconductor surfaces are arranged and classified into sections.
平無引腳(QF N )封裝|上义切割系統(2 0 )是應用至四邊扁 應用並不只局限於三然而,半導體封裝切割系統之 封裝(44a)的一部份,自:^導線架(42)形成未切割的QFN 及的導線架(42)僅為自AH6)的周圍延伸。之後所提 部份。每一QFN封 丑/〇者區段U6)周圍延伸的外露 形狀及尺寸是H 半導體裝置。導線架(42)典型的 (46)。3一方面1 +—之⑽所示之箭頭安排並分隔區段 個區段(圖中未示)封裝(44a)可只被分組為- 製模,依此來封裝已被二人經由製模取得,例如聚合物 (26)為平面H已被黏合至導線架⑷)的晶粒。基板 支持塾(3 0 )是由橡膠、 恢復力之材質之一或其組合 力不只提供沿著平面的摩擦 (2 6 )被壓縮於其間時適應區 支持墊(3 0 )使用黏著劑 (28)上。支持墊(30)定義出 區段(46)。因此支持墊(3〇) 的所有區段(4 6 )。另一方面 個以上的支持墊以支撐基板 每一支持墊的尺寸及面積是 相應區段(4 6 )。 彈性體、聚合物及此類具彈性 製成。支持墊(3 0 )的彈性恢復 阻力’亦可彈性變形以在基板 段(4 6 )的拓樸結構與翹曲。 或此類結合工具架設於基底板 一容納區域以放置基板(2 6 )的 的尺寸是按照可容納基板(2 6 ) 亦可如第一之b圖所示使用—— 。當使用一個以上支持墊時, 按照僅可容納基板(2 6 )的一個 基板定位銷(4 8 a)自基底板(2 8 )延伸並與成形在基板Flat No-Pin (QF N) Package | The Upper Sense Cutting System (20) is applied to a four-sided flat application and is not limited to only three. However, a part of the package (44a) of the semiconductor package cutting system, from: ^ lead frame (42) The lead frame (42) forming the uncut QFN and only extends from the periphery of AH6). After that, mention the part. The exposed shape and size extending around each QFN smear/U.S. section U6) is an H semiconductor device. The lead frame (42) is typically (46). 3 On the one hand, the arrow shown in (10) is arranged and divided into sections (not shown). The package (44a) can be grouped into only - molding, whereby the package has been molded by two people. It is obtained, for example, that the polymer (26) is a grain in which the plane H has been bonded to the lead frame (4). The substrate support 塾 (30) is made of rubber, one of the materials of the restoring force or a combination thereof. The force is not only provided along the plane of the friction (2 6 ) is compressed during the adaptation zone support pad (30) using the adhesive (28) )on. The support pad (30) defines a section (46). Therefore all sections of the pad (3〇) are supported (4 6 ). On the other hand, more than one support pad supports the substrate. The size and area of each support pad are the corresponding segments (46). Elastomers, polymers and these are made of elastic. The elastic recovery resistance of the support pad (30) can also be elastically deformed to have a topography and warpage in the substrate section (46). Or such a bonding tool is mounted on a receiving area of the base plate to place the substrate (26) in a size according to the accommodating substrate (26) or as shown in the first figure b. When more than one support pad is used, a substrate positioning pin (48 a) extending only from the substrate (26) extends from the substrate plate (28) and is formed on the substrate.
INVENT20040901PI50.ptd 第15頁 1250621 五、發明說明(9) (2 6 )的導線架(4 2 )中之定位孔(4 8 b )或缺口 (圖中未示) 相對應。當每一基板定位銷(4 8 a )穿過相應定位孔時,基 板(2 6 )與切剔機失具(2 2 )對齊,將基板(2 6 )與切割機夹具 (22)對齊即能使基板(26)的區段(46)與支持墊(3〇)對齊。 切割機夾具(2 2 )被架設在結構上提供支撐的切割桌 (5 0 )上。真空幫浦(圖中未示),結構上最好與切割桌(5 〇 ) 一體成形,經由第二圖所示之真空埠(52)與基底板(28)的 凹處(36)結合。基底(28)中的凹處(36)之功能為板通道 (38)與其所結合的真空埠(52)之間的空氣匯合點。因此真 空幫浦可操作來創造凹處(36)中及隨後通過板通道(38)與 塾通道(32)的真空。 根據第二、四之a、四之b圖,切割機夾具(2 2 )進一步 〃夾持件(2 4 )合作以將基板(2 6 )失持於其間。切割機夾具 (22) j夾持件(24)施加夾持力於基板(26)的至少一個部份 以f步固定。夾持件(2 4 )包含一凸緣(5 8 ),其形狀及尺 寸疋依可延伸連接導線架(⑵的外目,及一列自凸緣⑼) 延伸之肋條(6 〇 )。間隙(6 2 )成形於每對相鄰肋條(6 0 )之間 1基板(26)之每一區段(46)中,未切割的QFN封裝 々=置為袼柵構造,包含如第五圖所示之行與列。 月,6 0)與格柵構造行列中的-行或列相對應。格柵 構造之行與列定義屮装 r 〆 ,ΩΩ λ . 出基板(26)母一區段(46)上的x-分隔線 =)與y-分隔線(66b)。參考第五、六、七、八圖,基板 ()的&段(46)—開始最好沿χ—分隔線(66a)切割以取得INVENT20040901PI50.ptd Page 15 1250621 V. Invention description (9) (2 6 ) The positioning holes (4 8 b ) or notches (not shown) in the lead frame (4 2 ) correspond to each other. When each of the substrate positioning pins (48 a) passes through the corresponding positioning holes, the substrate (26) is aligned with the cutter miss (2 2 ), and the substrate (26) is aligned with the cutter clamp (22). The section (46) of the substrate (26) can be aligned with the support pad (3 turns). The cutter clamp (2 2 ) is mounted on a cutting table (50) that is structurally supported. The vacuum pump (not shown) is preferably integrally formed with the cutting table (5 〇) and joined to the recess (36) of the base plate (28) via a vacuum crucible (52) as shown in the second figure. The function of the recess (36) in the substrate (28) is the point of convergence of the air between the plate channel (38) and the vacuum port (52) to which it is coupled. Thus the vacuum pump can be operated to create a vacuum in the recess (36) and subsequently through the plate channel (38) and the channel (32). According to the second, fourth, and fourth figures, the cutter clamp (2 2 ) further cooperates with the clamping members (24) to hold the substrate (26) therebetween. The cutter clamp (22) j clamp member (24) applies a clamping force to at least a portion of the substrate (26) to be fixed in step f. The clamping member (24) includes a flange (58) that is shaped and dimensioned to extend the rib (6 〇) extending the lead frame (the outer eye of (2) and a row from the flange (9)). A gap (6 2 ) is formed in each section (46) of each of the adjacent substrates (26) between adjacent pairs of ribs (60), and the uncut QFN package 々= is set as a grid structure, including as the fifth The rows and columns shown in the figure. Month, 60) corresponds to the -row or column in the grid construction row. The row and column definitions of the grid construction are r 〆 , Ω Ω λ . The x-separation line on the substrate (26) section (46) =) and the y-separation line (66b). Referring to Figures 5, 6, 7, and 8, the & section (46) of the substrate () is preferably cut along the χ-divide line (66a) to obtain
INVENT20040901PI50.ptd 第16頁 1250621 發明說明(10) 分隔線切割以取得切割 )大體與y -分隔線(6 6 b )相 半切割的QFN封裝(44b),之後沿 的QFN封裝(44c) °x-分隔線(66a 互垂直。INVENT20040901PI50.ptd Page 16 1250621 DESCRIPTION OF THE INVENTION (10) Dividing the wire to obtain a cut) A QFN package (44b) that is substantially half-cut with a y-divider (6 6 b), followed by a QFN package (44c) °x - Separation lines (66a are perpendicular to each other.
持件(24)利用螺栓、彈簧式固定件、液壓式固定件 、軋壓式固定件、電磁鐵、5金力磁鐵裝或是此類結人穿置 可設置於㈣機夾具(22)±。夾持件(24)進—步包含^持 件定位銷(圖中未示)穿過成形在夾持件(24)中之相應定 位通道(66c)及成形在切割機夾具(22)中之定位通道“Μ )。夾持定位銷與定位通道(66c、66d)合作以使夾持 )與切割機夾具(22)對齊。當夾持件(24)置於切割機夾具 (2 2 )上同時基板(2 6 )被保持於其間時,每一肋條(6 〇 )將 切割的Q F N封裝(4 4 a )相對應之一列壓至支持墊(3 q )上。 肋條(60)進一步被塑形為形成一凹面(67),如第三圖 所不’以在夾持件(24 )置於切割機夾具(2 2 )時容納基板回 (2 6、)的區段(4 6 )。如第二圖之說明,間隙(6 2 )之形狀及尺 $為可使切割刀片(68)從中穿過。此外,間隙(62)以使χ — 分隔線(66a)或y -分隔線(6 6b)之一露出至切割刀片(68) 式對齊。 ^The holding member (24) is provided by bolts, spring-type fixing members, hydraulic fixing members, rolling-type fixing members, electromagnets, 5 gold-powered magnets, or the like. The wearing can be set in the (4) machine clamp (22) ± . The clamping member (24) further includes a holder positioning pin (not shown) passing through the corresponding positioning passage (66c) formed in the clamping member (24) and formed in the cutter fixture (22) Positioning channel "Μ". The clamping locating pin cooperates with the positioning channel (66c, 66d) to align the clamping with the cutter clamp (22). When the clamping member (24) is placed on the cutter fixture (2 2 ) While the substrate (26) is held therebetween, each rib (6 〇) presses one of the cut QFN packages (4 4 a ) onto the support pad (3 q ). The ribs (60) are further molded. Formed as a concave surface (67), as shown in the third figure, to accommodate the section (46) of the substrate back (26) when the clamp (24) is placed in the cutter clamp (2 2 ). As illustrated in the second figure, the shape of the gap (6 2 ) and the ruler $ are such that the cutting blade (68) can pass therethrough. Further, the gap (62) is such that the χ - dividing line (66a) or the y - dividing line ( 6 6b) One of the exposed to the cutting blade (68) is aligned. ^
文持件(24)通常分為兩種型式’亦即如第九圖所示之 X -夾持件(70a)以及如第一圖所示之y-夾持件(7〇b) 夹 持件(7〇a)具有依使1分隔線(66a)露出的方式對齊的間隙 (62 )’而y —夾持件(70b)具有依使y -分隔線(66 b)露出的方 式對齊的間隙(62)。基板(26)的區段(46)沿著大體上平行 X—分隔線(66a)平行之軸設置。因此,X-夾持件(7〇a)之每The holding member (24) is generally divided into two types 'i.e., the X-clamping member (70a) as shown in the ninth figure and the y-clamping member (7〇b) as shown in the first figure. The member (7〇a) has a gap (62)' aligned in such a manner that the 1 dividing line (66a) is exposed, and y - the holding member (70b) is aligned in such a manner that the y-dividing line (66b) is exposed Clearance (62). The sections (46) of the substrate (26) are disposed along an axis parallel to the substantially parallel X-dividing lines (66a). Therefore, each of the X-clamps (7〇a)
INVENT2〇〇4〇9〇ipi5〇.ptdINVENT2〇〇4〇9〇ipi5〇.ptd
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、一肋條(60)延伸出—段較長之距離 ),相較之下y-夾持件(7〇b)之每一 個區段(4 6 )。 ’超過所有的區段(4 6 肋條(6 0 )只延伸超出一 X〜夾持件(7 O.a )相對輕# r n、丄 結構上較脆弱。x-失持件過於懸吊, 橫向延伸過肋條(60)的支柱( /巴3 一個或多個 條,如第九圖所示。柱(72)以在結構上支持並加強肋 (26)ί ίί::當夾持件(24)置於切割機央具(22)而基板 放置,、間日守,形成一夾持件平面(74)、一凸緣平面 76)及一支持平面(78)。夾持件(24)、任’夾持件(心A rib (60) extends out of the longer section of the section, in contrast to each section (4 6) of the y-clamping member (7〇b). 'Exceeding all sections (4 6 ribs (60) extend only beyond an X~ clamp (7 Oa) is relatively light # rn, 丄 is structurally weak. x-missed parts are too suspended, laterally extended The rib (60) of the struts (/bar 3 one or more strips, as shown in the ninth figure. The column (72) to support and strengthen the ribs (26) ί ίί: when the clamping member (24) The substrate is placed on the cutting machine center (22), and the substrate is placed together to form a clamping member plane (74), a flange plane 76) and a supporting plane (78). The clamping member (24), any ' Clamping piece
或y-夾持件(70b)之肋條(60)沿著夾持件 J (,區段⑷)相接鄰。凸緣平面(爾支持塾上 点ς者凸緣(58)向外面對凹面(67)與切割機夾具(22)的面 成形。基板(26)的區段(46)沿支持平面(78)與支持墊(3〇) 相接鄰。 夾持件(24)的肋條(60)之形狀與尺寸進一步依在空間 上相互置換夾持件平面(74)與凸緣平面(76)。支持平面 (、7 8 )成形在凸緣平面(7 6 )與夾持件平面(7 4 )之間。夾持件 =面(74 )與凸緣平面(7 6 )間的空間相互置換使基板(2 6 )更 合易被切斷,以依此在切割刀片(6 8)被穿插過每一間隙 (62),沿X-分隔線(66a)&y—分隔線(66b)分離未切割的 QFN封裝(44a)時不與凸緣(58)接觸。 §切割刀片(6 8 )被插入夾持件(2 4 )的每一間隙(6 2 )以 切斷基板(26)的相應區段(46)時,切割刀片(68)與支持塾Or the ribs (60) of the y-clamping member (70b) are adjacent to each other along the clamping member J (, section (4)). The flange plane (the upper support flange (58) faces the concave surface (67) and the face of the cutter clamp (22) is formed. The section (46) of the substrate (26) is along the support plane (78) ) is adjacent to the support pad (3〇). The shape and size of the ribs (60) of the clamping member (24) further spatially replace the clamping member plane (74) and the flange plane (76). The plane (, 7 8 ) is formed between the flange plane (76) and the clamping member plane (74). The space between the clamping member=face (74) and the flange plane (76) is mutually displaced to the substrate. (2 6 ) is more easily cut off so that the cutting blade (68) is inserted through each gap (62) and separated along the X-separation line (66a) & y-dividing line (66b) The cut QFN package (44a) is not in contact with the flange (58). § The cutting blade (6 8 ) is inserted into each gap (6 2 ) of the holder (2 4 ) to cut the corresponding portion of the substrate (26) Cutting blade (68) and support when section (46)
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五、發明說明(12) (3 0 )重疊以切斷其一個部份。 參第十圖’半導體封裝切割系統(20)乃做為執行半導 體封裝切割方法(1 0 0 )’半導體封裝切割方法(1 〇 〇 )中,基 板(2 6 )在步驟< 1 1 0 >首先被定位在切割機夾具(2 2 )的支持 塾(30)上,最好是使用一種取放裝置(圖中未示)。、 該取放裝置是做為拾取、處理以及在最後釋放基板 (2 6 )。當基板(2 6 )被拾起以傳送至切割機夾具(2 2 )時,取 放裝置上的定位工具(圖中未示)與基板(2β)接合以使基 板(2 6 )與抓取單元對齊。取放裝置預先與切割機夾具(2 2 ) 對齊。因此,當取放裝置在步驟<1 1〇>將基板(26)定位在 支持墊(30)上時,基板(26)已經對齊支持墊(3〇)。 步驟<1 10>之後的下一步驟<11 2>中,真空幫浦被啟動 來將基板(2 6 )抓取至切割機夾具(2 2 )。接著在步驟< 1 1 3 > 中,基板(26)由切割刀片(68)部份切割以自基板(26)的區 段(4 6 )分離導線架(4 2 )。步驟< 1 1 3 >之後,在步驟< 1 1 4 >中 ’ X-夾持件(70a)被設置於切割機夾具(22)上以將基板(26 )夾持於其間。一旦導線架(4 2 )自區段(4 6 )分離,在每對 相鄰區段(4 6 )之間便創造出一空間以在步驟< 1 1 4〉中X -夾 持件(7 0 a)被設置於切割機夾具(2 2 )上時更好容納X -夾持 件(7 0 a)的相應支柱(7 2 )。 另一方面,當基板(26)包含只有一個區段(46)之一 (圖中未示)且一個以上的區段具有縮小的外圍間隔時, X -夾持件(70a)便不需要支柱(72)。在X-夾持件(70a)不具 支柱(7 2 )時,預先切割基板(2 6 )的步驟< 1 1 3 >便可跳過,5. Invention Description (12) (3 0 ) Overlap to cut off one part. Referring to the tenth figure, the semiconductor package cutting system (20) is used to perform the semiconductor package cutting method (1 0 0 ) 'semiconductor package cutting method (1 〇〇), the substrate (2 6 ) is in the step < 1 1 0 > First, it is positioned on the support cymbal (30) of the cutter clamp (2 2 ), preferably using a pick-and-place device (not shown). The pick and place device is used for picking up, processing, and finally releasing the substrate (2 6 ). When the substrate (26) is picked up for transfer to the cutter jig (2 2 ), a positioning tool (not shown) on the pick and place device is engaged with the substrate (2β) to cause the substrate (26) to be grasped Unit alignment. The pick and place device is pre-aligned with the cutter clamp (2 2 ). Therefore, when the pick-and-place device positions the substrate (26) on the support pad (30) in step <1 1>, the substrate (26) has been aligned with the support pad (3). In the next step <11 2> after the step <1 10>, the vacuum pump is activated to grasp the substrate (26) to the cutter jig (2 2 ). Next, in step <1 1 3 >, the substrate (26) is partially cut by the cutting blade (68) to separate the lead frame (42) from the section (46) of the substrate (26). After the step < 1 1 3 >, in step <1 1 4 >, the 'X-clamping member (70a) is placed on the cutter jig (22) to sandwich the substrate (26) therebetween. Once the leadframe (42) is separated from the section (46), a space is created between each pair of adjacent sections (46) to X-clamp in step <1<1> 7 0 a) When placed on the cutter clamp (2 2 ), it better accommodates the corresponding strut (72) of the X-clamp (70 a). On the other hand, when the substrate (26) contains only one of the segments (46) (not shown) and more than one segment has a reduced peripheral spacing, the X-clamping member (70a) does not require a post (72). When the X-clamping member (70a) does not have the support (72), the step of cutting the substrate (26) in advance <1 1 3 > can be skipped.
INVENT20040901PI50.ptd 第19頁 1250621 五、發明說明(13) 以允許步驟< 1 1 4 >可接在步驟< 1 1 2 >執行。 一旦基板(26)被牢牢夹持在切割;夾具(22)與r 件(7 0 a )之間,在步驟< 1 1 6 >中,切宝,丨爽持 σ刀片(6 8 )便被引導、s 過x-夾持件(70a)的每一間隙(62)。V通 ’ 礎過每一間隙Γ Fi ?、 切割刀片(68)首先被裝入未切割的qFn封裝(44a)'、,一 ’ 沿著z-軸(80),之後沿著X-分隔線(66a)以,。 QFN封裝(44b)。 卞干“彳的 , ‘ 交 半切割的QFN封奘 (44b)仍沿著y分隔列(66b)連接,,估γ 土 衣 (44a)大體上能不因切割刀片在切割湘 #刀口』期間導入的切削力 脫離其預放位置。因此X -夾持件(7 〇以ΑΑ丄ν / 、 ^ , 寸什WUa)的肋條(60)的形狀 及大小能選擇做成如同指狀件(82),自1夾持件(7〇a) 支柱(72)延伸,並如第十一圖所示用以按壓基板(26)每— 區段(4 6 )的僅只一個部份。 另夕卜丄當每一未切割的_封裝(44a)大體上未微型化 時,當沿著X-分隔線(66a)切割時可以不使用χ_夾持件 (7〇a)來夾持基板(26)。然而每一未切割的QFN封裝(44a) 的尺寸必須製造為能使真空產生的吸力通過墊通道(32), 並使基板(2 6 )結構完整的部份橫轉至未切割y _分隔線 (66b)以在切割刀片(68)切割期間大體固定基板(26)。雖 然在這種情形下可不使用x_失持件(7〇a) ’仍是必需使用 y-夾持件(70b)來沿y -分隔線(66b)切割。 在取得半切割的QFN封裝(44b)後,步驟<118> —夾 持件(7〇a)自切割機夾具(22)卸下。之後在步驟<12〇>中,INVENT20040901PI50.ptd Page 19 1250621 V. Description of the invention (13) to allow the step < 1 1 4 > to be performed in the step < 1 1 2 > Once the substrate (26) is firmly clamped between the cutting; the clamp (22) and the r piece (70 a), in the step <1 1 6 >, the cut treasure, the shuang s holding σ blade (6 8 ) is guided, s through each gap (62) of the x-clamp (70a). V through 'through each gap Γ Fi ?, the cutting blade (68) is first loaded into the uncut qFn package (44a)', a ' along the z-axis (80), and then along the X-divide (66a) to,. QFN package (44b).卞 彳 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The introduced cutting force is separated from its pre-positioning position. Therefore, the shape and size of the rib (60) of the X-clamping member (7 〇 ΑΑ丄 / /, ^, inch WUa) can be selected to be like a finger (82). ), extending from a clamping member (7〇a) strut (72) and pressing only one portion of each section (4 6 ) of the substrate (26) as shown in FIG.每一When each uncut _package (44a) is substantially not miniaturized, the 基板_clamping member (7〇a) may be used to clamp the substrate when cutting along the X-dividing line (66a) (26) However, each uncut QFN package (44a) must be sized to allow vacuum to generate suction through the pad channel (32) and to traverse the structurally intact portion of the substrate (26) to uncut y _ The dividing line (66b) substantially fixes the substrate (26) during cutting of the cutting blade (68). Although in this case the x_missing member (7〇a) may not be used, it is still necessary to use the y-clamping member. (70b) to cut along the y-divider line (66b). After the half-cut QFN package (44b) is taken, the step <118>-clamping member (7〇a) is detached from the cutter jig (22). Then in step <12〇>,
1250621 五、發明說明(14) y一夹持件(70b)被設置於切割機夾具(22)上以將半切割的 QFN封裝(44b)夾持於其間。切割刀片(68)然後在步驟〈122 >中〜著z -軸(8 0 )插入半切割的q f? N封裝(4 4 b ),隨後沿著 每一條y -分隔線(66b)從中取得切割的qfn封裝。來自墊通 道(32)的吸力與來自y —夾持件(7〇b)的夾持力在沿著乂—分 1¾線(66b)切割時導入切削力時,避免半切割的QFN封裝 (4 4 b )可以移動及離位。 z-軸(80)大體與X—分隔線(66a)及[分隔線(66b)垂 直。因為支持塾(3 〇 )具彈性恢復力,減少了在步驟< 1丨6 > 中切割未切割的Q F N封裝(4 4 a )以及步驟< 1 2 2 >中切割半切 割的QFN封裝(44b)期間切割刀片(68)沿著z_軸(8〇)被導向 支持墊(30)時,切割刀片(68)的切削力所產生的顫動。 步驟<124>中,Υ-夾持件(70b)自切割機夾具(22)卸下 以使切割的QFN封裝(44c)顯露出。來自墊通道(32)的吸力 進一步防止切割的QFN封裝(44(:)在¥—夾持件(7〇b)自切割 機夾具(2 2 )卸下期間及之後位移。 半導體封裝切割方法(100)的步驟<114>到步驟<124> 說明在沿著y -分隔線(66b)切割之前先沿著^分隔線(66a) 切割’以由未切割的QFN封裝(44a)取得切割的QFN封裝 (4 4 c )。然而’步驟< 1 1 4 >到步驟< 1 2 4 >可重新排列為使沿 著y -分隔線(6 6b)切割的y_夾持件設置為在沿著χ_分隔線 (66a)切割的X-夾持件設置之前,以由此取得切割的QFN封 裝(44c)。當基板首先使用y_夹持件來沿著y—分隔線(66b) 切割時,既然在y -失持件(7 〇 b )上未成形有支柱(7 2 ),預1250621 V. INSTRUCTION DESCRIPTION (14) A y-clamp (70b) is placed on the cutter jig (22) to hold the half-cut QFN package (44b) therebetween. The cutting blade (68) is then inserted into the half-cut qf? N package (4 4 b ) in step <122 > to the z-axis (8 0 ), and then taken along each y-divider line (66b) Cut qfn package. The suction from the pad channel (32) and the clamping force from the y-clamp (7〇b) are cut into the cutting force when cutting along the 乂-dividal line (66b), avoiding the half-cut QFN package (4) 4 b ) can move and leave. The z-axis (80) is generally perpendicular to the X-dividing line (66a) and the [dividing line (66b). Since the support 塾(3 〇) has elastic restoring force, the cutting of the uncut QFN package (4 4 a ) in the step < 1 丨 6 > and the cutting of the half-cut QFN in the step < 1 2 2 > are reduced. During the encapsulation (44b), the cutting blade (68) is deflected by the cutting force of the cutting blade (68) when it is guided along the z-axis (8 turns) to the support pad (30). In the step <124>, the Υ-clamping member (70b) is detached from the cutter jig (22) to expose the cut QFN package (44c). The suction from the pad channel (32) further prevents the cut QFN package (44(:) from being displaced during and after the removal of the ¥-clamp (7〇b) from the cutter jig (2 2 ). Semiconductor package cutting method ( 100) Step <114> to Step <124> Description Cutting along the ^ dividing line (66a) before cutting along the y-dividing line (66b) to take the cut by the uncut QFN package (44a) QFN package (4 4 c ). However, the 'steps < 1 1 4 > to step < 1 2 4 > can be rearranged to make the y_clamps cut along the y-divider line (6 6b) It is arranged to take the cut QFN package (44c) before the X-clamp member cut along the χ_ separation line (66a). When the substrate first uses the y_clamping member along the y-separation line (66b) When cutting, since the struts (7 2 ) are not formed on the y-lost piece (7 〇b),
INVENT20040901PI50.ptd 第21頁 1250621 五、發明說明(15) 定切割基板的步驟< 1 1 3 >可以省略,因此在步驟< Π 3〉中不 需由相鄰區段(4 6 )之間創造出的間隔做空間調節。一旦基 板(2 6 )被沿著y -分隔線(6 6 b )切割,在基板(2 6 )沿X -分隔 線(66a)切割前,區段(46)之間的導線架(42)便被引入的 水沖離。 步驟< 1 2 4 >之後,步驟< 1 2 6 >中取放裝置(圖中未示) 的抓取單元銜接並抓取切割的qF N封裝。然後在步驟< 1 2 8 > 中真空幫浦不再運轉,之後在步驟< 1 3 0 >中抓取器將切割 的QFN封裝(44c)自切割機夾具(22)移除以便後續處理。 在步驟<130〉中,抓取器將切割的QFN封裝(44c)放置 於一框架内。該框架與其内切割的q F N封裝(4 4 c ) 一開始是 處在沖洗程序以移除碎片及灰塵,之後則為乾燥程序。洗 淨乾燥後的切割的Q F N封裝(4 4 c)被分類並置入台座、台架 或此類半導體封裝儲存組件中。 種如第 圖所不的千INVENT20040901PI50.ptd Page 21 1250621 V. DESCRIPTION OF THE INVENTION (15) The step of cutting the substrate <1 1 3 > can be omitted, so that it is not necessary to be adjacent to the segment (4 6 ) in the step < Π 3> The space created between them makes room adjustments. Once the substrate (26) is cut along the y-dividing line (6 6 b ), the lead frame (42) between the segments (46) before the substrate (26) is cut along the X-dividing line (66a) The water that was introduced was washed away. After the step < 1 2 4 >, the grab unit of the pick-and-place device (not shown) in step < 1 2 6 > engages and grabs the cut qF N package. Then the vacuum pump is no longer operated in step < 1 2 8 >, after which the gripper removes the cut QFN package (44c) from the cutter clamp (22) in step <1 3 0 > Follow-up processing. In step <130>, the gripper places the cut QFN package (44c) in a frame. The frame and its internally cut q F N package (4 4 c ) are initially in the rinsing process to remove debris and dust, followed by a drying process. The cleaned, cut Q F N package (4 4 c) is sorted and placed in a pedestal, gantry or such semiconductor package storage assembly. Kind as the thousand
本發明的第二具體實施Second embodiment of the present invention
體封裝切割系統,包含有三個主要元件:一切割機夾具 (22) ’ 一夾持件(24),成形有複數只肋條(6〇)。第一之& 、、 之b、一、二圖相關的基板(2 6 )、基底板(2 8 )、墊通 道(32)、複數只肋條(6〇)及2—軸(8〇)的結構組成及彼此^ 的位置關係整合說明如後。 在第一貝轭中,母一肋條(β Q )包含有一堅固橫樑(g 2 及-可壓縮層(94)。該堅固橫樑(92)包含有一在夾持件 (2 4 )被置於切割機夾呈(2 2 )昧而剩·士从 、外π ^ L 戍人時面對支持墊(30)的内面(96 )。该可壓縮層(9 4)杲、;儿|兮μ m w , 曰以叼疋〜者遠堅固橫樑(92)的内面(g6)成The body package cutting system consists of three main components: a cutter clamp (22) ‘ a clamping member (24) formed with a plurality of ribs (6 turns). The first substrate (2 6 ), the base plate (28), the pad channel (32), the plurality of ribs (6〇), and the 2-axis (8〇) associated with the first & The structural composition and the positional relationship of each other are explained as follows. In the first bead yoke, the female rib (β Q ) comprises a solid beam (g 2 and a compressible layer (94). The solid beam (92) comprises a cutting member (24) placed in the cutting The machine clamp is (2 2 ), and the inner surface (96) of the support pad (30) faces the outer and outer π ^ L. The compressible layer (9 4) 杲, ; 兮 | 兮 μ mw , the inner surface (g6) of the sturdy beam (92)
1250621 i '發明說明(16). 形或者與其結合。可壓縮層(9 4 )由橡膠、彈性體、聚合物 或此類彈性恢復材質製成。當基板(26 )被保持在夾持; (24)與切割機夾具(22)之間時,可壓縮層(94)形成一位在 堅固橫樑(92)與基板(26)之間接合面,而失持件平面(γ4) 大體沿著可壓縮層(94)與基板(26)之間的接合面成形。 雖然在本發明的此一實施中只討論了 QFn ,/ 體封裝切割系統與半導體切割方法皆無排 、衣’、 墓鰱#姑+處印_ 傅除其他形式的半 導 晶1250621 i 'Inventive description (16). Shape or combination with it. The compressible layer (9 4 ) is made of rubber, elastomer, polymer or such elastic recovery material. When the substrate (26) is held between the clamping; (24) and the cutter clamp (22), the compressible layer (94) forms a joint between the solid beam (92) and the substrate (26). The missing member plane (γ4) is generally formed along the joint between the compressible layer (94) and the substrate (26). Although only QFn is discussed in this embodiment of the present invention, the body-package cutting system and the semiconductor cutting method are not arranged, the clothing, the tomb, and the other forms of semi-conductive crystal.
在前述做法中, 體封裝切割方法的 粒系統及裝置的缺 一個熟知本項技術 或修改仍無背離本 根據本發明的二具 半導體封裝切割系 點。雖然本發明中 者明顯根據本揭露 發明之範疇及精神 體實施說明執行半 統以處理習用切割 只說明了二種實施 可做出多項變化及In the foregoing practice, the absence of a granulating system and apparatus for a bulk encapsulation method is well known in the art or modifications without departing from the two semiconductor package cutting dicings according to the present invention. Although the present invention clearly exemplifies the implementation of the conventional processing in accordance with the scope and spirit of the disclosed invention, only two implementations are described.
1250621 圖式簡單說明 【圖示簡單說明 第一之a圖 一種半導體封裝切割系統具有單一支持 墊之立體分解圖,一 y -夾持件置放於切 割機夾具及基板上。 第一之b圖:為第一之a圖之半導體封裝切割系統具有 多片支持墊之立體分體圖。 第二圖:為第一之a圖之半導體封裝切割系統之局部 剖面圖,具有置於切割機夾具上之X-夾持 件,以將半切割之QF N封裝夾持於其間。 第三圖:為第一之圖之半導體封裝切割系統之局部剖 面圖。 苐四之a圖·為第^一之a圖之y -夹持件之別視圖。 第四之b圖··為第四之a圖之y-夾持件中’ A’之局部前 視圖。 第五圖:形成第一之a圖基板之一區段之未切割QFN封 裝之局部平面圖,具有X -分隔線及y -分隔線 第六圖:沿著第五圖未切割QFN封裝之X-分隔線切割 所取得之半切割QFN封裝之局部平面圖。 第七圖··沿著第六圖半切割QFN封裝之y -分隔線切割 所取得之切割QF N封裝之局部平面圖。 第八圖:為第二圖半導體封裝切割系統之局部剖面圖 ,具有一置於切割機夾具之X-夾持件以將切 割的QFN封裝夾持於其間。1250621 Brief description of the diagram [Simplified illustration of the diagram. Figure 1 a. A semiconductor package cutting system has an exploded view of a single support pad. A y-clamp is placed on the cutter fixture and the substrate. First b diagram: The semiconductor package cutting system of the first diagram has a three-dimensional split diagram of a plurality of support pads. Second: A partial cross-sectional view of the semiconductor package cutting system of the first figure, with an X-clamp placed on the cutter jig to hold the half-cut QF N package therebetween. Figure 3: A partial cross-sectional view of the semiconductor package cutting system of the first figure. a四之图· is the view of the y-clamp of the figure i. The fourth b-picture is a partial front view of the 'A' in the y-clamp of the fourth figure a. Figure 5: A partial plan view of an uncut QFN package forming a segment of the first a substrate, having an X-divider line and a y-divider line. Figure 6: X-cut along the uncut QFN package of Figure 5. A partial plan view of a half-cut QFN package obtained by dividing the wire. Figure 7 · Partial plan view of the cut QF N package taken along the y-divider cut of the half-cut QFN package in Figure 6. Figure 8 is a partial cross-sectional view of the second embodiment of the semiconductor package cutting system with an X-clamp placed in the cutter jig to hold the cut QFN package therebetween.
第24頁 INVENT20040901PI50.ptd 1250621 圖式簡單說明 第九圖:為第二圖 緣延伸, 第十圖:可由第一 之半導體 第十一圖:為第九 如指狀 第十二圖:為第一 X-夾持件之平面圖,具有肋條自凸 結構上並由支柱支撐。 之a圖之半導體封裝切割系統執行 封裝切割方法流程圖。 圖X -夾持件之平面圖,肋條之形狀 ,自凸緣或支柱至少一處延伸。 之a圖之半導體封裝切割系統之局 部剖面圖,其中每一肋條與一堅固橫樑及 可壓縮層成形。 主要元件符號說明】 (2 2 )切割機夾具 (2 6 )基板 (3 0 )支持墊 (36)凹處 (4 0 )板面 (44a)未"t刀害|J的QFN I寸裝 (44c)切割的QFN封裝 (4 8 a )基板定位銷 (5 0 )切割桌 (5 8 )凸緣 (6 2 )間隙 (6 6 b ) y -分隔線 (6 7 )凹面 (70a)x-夾持件 (2 0 )半導體封裝切割系統 (24)夾持件 (28)基底板 (32)墊通道 (3 8 )板通道 (42)導線架 (44b)半切割的QFN封裝 (4 6 )區段 (4 8 b)定位孔 (52)真空埠 (6 0 )肋條 (6 6 a) X -分隔線 (66c、66d)定位通道 (6 8 )切割刀片Page 24 INVENT20040901PI50.ptd 1250621 Schematic description of the ninth figure: for the second picture edge extension, the tenth picture: the first semiconductor can be eleventh picture: for the ninth as the finger twelfth picture: for the first A plan view of the X-clamp having ribs on the self-convex structure and supported by the struts. The semiconductor package cutting system of Figure a performs a flow chart of the package cutting method. Figure X - Plan view of the gripping member, the shape of the rib extending from at least one of the flange or post. A partial cross-sectional view of the semiconductor package cutting system of Figure a, wherein each rib is formed with a solid beam and a compressible layer. Main component symbol description] (2 2) Cutter fixture (2 6) Substrate (30) Support pad (36) Recess (40) Plate surface (44a) Not "t knife damage|J's QFN I inch (44c) cut QFN package (4 8 a) substrate positioning pin (50) cutting table (5 8) flange (6 2 ) gap (6 6 b ) y - dividing line (6 7 ) concave surface (70a) x - Clamping member (20) Semiconductor package cutting system (24) Clamping member (28) Base plate (32) Pad channel (38) Plate channel (42) Lead frame (44b) Half-cut QFN package (4 6 Section (4 8 b) positioning hole (52) vacuum 埠 (60) rib (6 6 a) X - dividing line (66c, 66d) positioning channel (6 8) cutting blade
INVENT20040901PI50.ptd 第25頁 1250621 圖式簡單說明 (7 2 )支柱 (7 6 )凸緣平面 (8 0 ) z -軸 (9 2 )堅固橫樑 (9 6 )内面 〈1 1 0 >定位基板 < Π 3 >預先切割基板 (70b)y-夾持件 (74)夾持件平面 (78)支持平面 (8 2 )指狀件. (9 4 )可壓縮層 (1 0 0 )半導體封裝切割方法 < 1 1 2 >啟動真空幫浦 < 1 1 4 >放置X -夾持件於切割機夾具上 < 1 1 6 >沿X -分隔線切割 < 1 1 8 >卸下X -夾持件 _ < 1 2 0 >放置y -央持件於切割機夾具上 < 1 2 2 >沿y -分隔線切割 < 1 2 4 >卸下y -夾持件 <126〉抓取切割白勺QFN封裝 <128〉停止真空幫浦 <130〉自切割機夾具移除切割的QFN封裝做後續處理INVENT20040901PI50.ptd Page 25 1250621 Brief description of the diagram (7 2 ) Pillar (7 6 ) Flange plane (8 0 ) z - Axis (9 2 ) Solid beam (9 6 ) Inner surface <1 1 0 > Positioning substrate < ; Π 3 > pre-cut substrate (70b) y-clamping member (74) clamping member plane (78) supporting plane (8 2 ) fingers. (9 4 ) compressible layer (1 0 0 ) semiconductor package Cutting method < 1 1 2 > Start vacuum pump < 1 1 4 > Place X - grip on the cutter jig < 1 1 6 > Cut along the X-separation line < 1 1 8 > ; Remove the X-clamp _ < 1 2 0 > Place the y - the holder on the cutter jig < 1 2 2 > Cut along the y - divider line < 1 2 4 > Unload y - Clamping piece <126> Grab and cut QFN package <128> Stop vacuum pump <130> Remove the cut QFN package from the cutting machine fixture for subsequent processing
INVENT20040901PI50.ptd 第26頁INVENT20040901PI50.ptd第26页
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CN102658394B (en) * | 2012-04-25 | 2014-03-26 | 深南电路有限公司 | Method and device for profile forming of packaging substrate |
CN102903679B (en) * | 2012-11-09 | 2014-11-05 | 日月光半导体制造股份有限公司 | Incision fixing fixture |
US9082681B2 (en) | 2013-03-29 | 2015-07-14 | Stmicroelectronics Pte Ltd. | Adhesive bonding technique for use with capacitive micro-sensors |
US9618653B2 (en) | 2013-03-29 | 2017-04-11 | Stmicroelectronics Pte Ltd. | Microelectronic environmental sensing module |
US10254261B2 (en) | 2016-07-18 | 2019-04-09 | Stmicroelectronics Pte Ltd | Integrated air quality sensor that detects multiple gas species |
US10429330B2 (en) | 2016-07-18 | 2019-10-01 | Stmicroelectronics Pte Ltd | Gas analyzer that detects gases, humidity, and temperature |
US10557812B2 (en) | 2016-12-01 | 2020-02-11 | Stmicroelectronics Pte Ltd | Gas sensors |
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US3976288A (en) * | 1975-11-24 | 1976-08-24 | Ibm Corporation | Semiconductor wafer dicing fixture |
US6165232A (en) * | 1998-03-13 | 2000-12-26 | Towa Corporation | Method and apparatus for securely holding a substrate during dicing |
US6150240A (en) * | 1998-07-27 | 2000-11-21 | Motorola, Inc. | Method and apparatus for singulating semiconductor devices |
TW423113B (en) * | 1998-09-18 | 2001-02-21 | Towa Corp | Arrangement configured to support substrate during dicing process, and apparatus and method for cutting tapeless substrate using the arrangement |
US6688300B2 (en) * | 1999-04-08 | 2004-02-10 | Intercon Technologies, Inc. | Techniques for dicing substrates during integrated circuit fabrication |
JP4680362B2 (en) * | 2000-09-22 | 2011-05-11 | 株式会社石井工作研究所 | Electronic component manufacturing method and manufacturing apparatus |
US20020185121A1 (en) * | 2001-06-06 | 2002-12-12 | Farnworth Warren M. | Group encapsulated dicing chuck |
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