TWI245909B - Test method and test equipment for examining electronic products - Google Patents

Abstract

A test method and test equipment for examining electronic products are disclosed. The equipment comprises an automatic sorting machine and a circulating test platform. The circulating test platform has a multilayer frame and an elevator. The multilayer frame is for carrying a plurality of carriers used to test the electronic products. The elevator is for driving the multilayer frame to move up and down to make the carrier circulate. When the circulating test platform and the automatic sorting machine meet each other, the automatic sorting machine can take out or put in the carrier from the multilayer frame. When this procedure is processed, the automatic sorting machine operates, and the electronic product on the carrier via the multilayer frame is tested or burn in.

Description

1245909 _ Case No. 93117369_ Year Month Date ^ _ V. Description of the Invention (1) [Technical Field to which the Invention belongs] The present invention relates to a test or programming device and method for an electronic product, and more particularly to an application in electronics Cyclic testing or programming equipment for products and methods thereof. Take the industry as an example to test the over-production of the industry. 矣 C shall be (I, Luqian power plant production and production system. The quantity and rate of Daliang is guaranteed before holding 1 product of dimensional maintenance and technical quality. [ΐ, for the purpose of recording, recording refers to the special features of burning others. If only recorded, burning tests or tests on the test of the test industry, the test solution is as complete as one, Middle finger § The general term of the book says that more than one J line is being tested. The test is performed on the machine. The machine is moved to the machine. 1C of the mold. It is the undertaking of the load industry. It will test and test the test items on the test item and install the complete 1C item. After the weighing is completed, it will refer to the test of the previous model. After each car company advances and sends it, it will then be pushed on the car and pushed to the test to unload or load, the test department will test the whole line will be recombined. He Zai Ren unloaded / c concurrently loaded C II mounted on the pallet tray to support the workshop during the work of the industry. This project is being promoted to move. For each machine, one station will test and test the entire station. How many of the single stations will still be used for the record? This is a good change, but the output is improved. For the 1C power test, there is one J1 on the test side of the test surface, and the other is not. First, the test of the test letter is to be tested at no time. The required test plate must be made as expected because the production must be high and the equipment must be provided for the establishment of the business. The time is the same as the test of the empty machine room test plant.

1245909 Case No. 93117369 Λ_η Amendment 5. Description of the invention (2) Limited by foreign equipment manufacturers, resulting in extremely low gross profit and high risk of memory. As an example, the current semiconductor technology level has a high yield. In terms of cost, In addition to testing and programming on expensive fixtures, some products do not undergo complete testing but are directly programmed after a simple test. In addition to the stand-alone programming or auto-recorder, this part can also be used for crashing. Taking the collapse system as an example, its working mode basically includes the first stage of processing on an automatic sorting machine, the second stage when it is loaded on a cart, and the third stage when it is programmed on the collapse system. The job can process a large number of 1C in batches, but there is no job on the loading / stilling of the IC on the pallet, so it is still a waste of time. And a large number of crash systems also cost higher costs. Therefore, an improvement on the testing or programming of electronic products is desired. In other words, the three sections of the test system of the type test are sent to the system. Although the unloading is a lot of non-volatile, due to the test machine test, try and advance, and the equipment must be prepared during the crash programming.

1245909 _Case No. 93117369 Amended on the Month of Day ___ V. Description of the invention (3) The purpose of circulating these vehicles, when the circulating test platform is combined with the automatic classifier, the automatic classifier can be removed from the multilayer frame Remove or feed the vehicle. In this manual, for the convenience of explanation, the "vehicle with a test function" of the present invention is simply referred to as "vehicle", which is different from the commonly known carrier. During operation of the automatic sorter, the carriers in the multi-layer frame can be used to test the electronic products thereon.

The automatic sorting machine further comprises a movable arm for taking the carrier out of the multi-layer frame to the automatic sorting machine, or feeding the vehicle from the automatic sorting machine into the multi-layer frame. Preferably, the carrier is plate-shaped. The circular test platform further includes a power connector and a signal connector that can be connected to one or more carriers in the multilayer frame. The test equipment further includes a power supply to supply power to the carriers in the multi-layer frame. The test equipment further includes a computer system to supply test data to the carriers in the multi-layer frame, and to control the operation of the system related to the test operations of the carriers.

The carrier further includes a power contact and a signal contact to receive power and test data, thereby generating a test signal to supply the electronic products carried thereon. The lifting device has a coupler sleeved on a rod, and the coupler links the multi-layer frame, and the multi-layer frame is raised and lowered by moving up and down on the rod to achieve the purpose of circulating the carriers in the multi-layer frame. In one embodiment, the circulating test platform further has a closed chamber.

Page 7 1245909 _Case No. 93117369 Amendment V. Description of the invention (4) Circulating gas should be used. This package can be used to include the cold ring. In the guide to the fan industry. Use the wind. For testing and installation, fan test mode, test of heat upwind, warming table with induction test, flat package guide, low test, private room test more, more closed test. High spirits or. Enclosed lowering, row one. The sub-carrier with the looper into the reusable hot-tool is used in the sub-carrier used in the warm-up production tool to house the room. For the closed body on the frame, the gas seal on the platform is better. The test leads the chamber load to be closer to the sealed test conductor as the closed body gas seal for the test. The. The measurement unit sets that. Single solid unloading test, the upper solid unloading test, the upper group. A model, a multi-machine test layer or a test machine with a plate, which should be fixed, should be included from the solid can be packaged with a group of components with a mold The load test measures the right and the wrong, yyff, and the better and the better. Than. The tuples are installed separately from the multi-machine carrier layer, and the combined test and multi-unit test fixtures are separately tested. The tester should include the movement of the unit and its self-contained flat source. The letter-based test kit is available for testing with test loop load; the test tool's follow-up unit is a multi-product production unit, which should be installed in a sub-test station, and the dynamic test level is supplied from the kind. The test can be carried or carried out, a test frame out of the middle, the frame is taken and the ring frame is used. Sending through multiple frames; in fact, this product is layer by layer. It is very productive. It is more productive at the root class. This sub-frame can be expected from the power supply at the moving layer.

1245909 __Case No. 93117369_ Year Month Revision_ V. Description of the Invention (5) The better, the method further includes lifting the multi-layer frame to achieve the purpose of circulating the vehicle. Preferably, the method further comprises positioning the multilayer frame so that the automatic sorter can take a carrier out of it or put a carrier into a vacant space therein. Preferably, the method further includes pre-testing the vehicle in the multilayer frame to confirm that it functions properly. [Embodiment] In order to understand the convenience of the present invention, the embodiment designed in this specification is exemplified by a test machine for an integrated circuit device, but the present invention is not limited to this. In test applications, the present invention is also applicable. In the present invention, "test" refers to a test or programming generally known, and "vehicle" refers to a vehicle having a test function. The first figure is a schematic plan view of an embodiment of a testing device for an electronic product according to the present invention. The testing device 10 for an electronic product includes an automatic classifier 12 and a circulating test platform 32, both of which can be separated or combined. Like the general automatic sorting machine, this automatic sorting machine 12 includes a carrier table 14 for placing a carrier, and a robot arm 16 in front of the carrier table 14 is equipped with a suction head. When the carrier is moved below the robot arm 16 At this time, the suction head can pick up the 1C device from the carrier or place the 1C device on the carrier. Robot arms 16 have robot arms 1 8 on both outer sides, and both can slide on the track 20. A pick-up head is mounted on the robotic arm 18, and when the tray on the loading station 22 is moved below the robotic arm 18, the pick-up head can lift the 1C device from the tray to the load at the center.

1245909 _ Case No. 93117369_ Modification of the year and month _ V. Description of the invention (6) 1C device on the tool, or reversely sucked from the carrier and transferred to the tray, the robot arm 16 between 6 and 18 and is scheduled The positioning mechanism 24 allows the pick-up head of the robotic arm 18 to quickly lower the 1C device and then suck it up, to avoid misalignment of the IC device when placing the IC device on the tray due to the difference in the placement distance between the 1C device and the carrier. A defective product placing table 2 5 is further provided between the robotic arms 16 and 18, and the defective product 1 C carried thereon will be transferred to the defective product tray 2 6 and a suction head is installed on the robotic arm 2 8. When the defective product placing table 2 5 is pushed to both sides of the defective product tray 2 6, the robotic arm 2 8 moves the defective product IC from the defective product placing table 2 5 to the defective product tray 26. The empty pallets under the robotic arm 18 or the pallets carrying the IC device can be moved to the unloading station 30 for unloading. The devices on the left and right sides of this automatic sorter 12 can be loaded or unloaded simultaneously, or one side, loaded and unloaded on the other side. The devices, operations, and functions of these automatic sorters 12 are conventional techniques and are not the characteristics of the present invention. The specific composition of the automatic sorting machine 12 may vary depending on the design of the machine, but it does not affect the application of the present invention. The second figure is a schematic plan view of a generalized embodiment of a testing device according to the present invention. The testing device 10 of the present invention includes an automatic sorting machine 12 and a circulating test platform 3 2. The automatic sorting machine 12 has a carrier on it. The automatic sorting machine 12 and the circulating test platform 32 can be separated or combined. When the automatic sorting machine 12 is combined with the circulating test platform 32, the carrier platform 1 4 is adjacent to the circulating test platform 32. Regardless of the arrangement of the various devices on the automatic classifier 12, it does not affect the operation of the circular test platform 32 and the interaction between the automatic classifier 12 and the circular test platform 32. In other words, the present invention is quite flexible and can be applied to various types of automatic classifiers. The third and fourth figures are three-dimensional schematic diagrams of the testing equipment 10, and in the third figure, the automatic classifier 12 and the circulating test platform 32 are in a separated state.

Page 10 1245909: _ Case No. 93117369 ____ V. Description of the invention (7) In the fourth figure, the automatic classifier 12 and the circulating test platform 3 2 are in a combined state. Follow

The ring-type test platform 3 2 has a multi-layer frame 3 6. The coupling 38 in the lifting device is linked with the multi-layer frame 36. The coupling 3 8 is set on the rod 40, and the coupling 3 8 is on the rod 40. Moving up and down drives the multi-layer frame 36 to rise and fall to achieve the purpose of vehicle circulation. The multi-layer frame 3 6 can be used to place multiple carriers 4 2. The automatic sorter 1 2 has a movable arm 3 4. When the circulating test platform 3 2 is combined with the automatic sorter 1 2, the movable arm 3 4 can The carrier 42 is taken out of the multi-layer frame 36 and moved to the carrier table 14, or is carried from the carrier table 14 into the multi-layer frame 36. The circular test platform 3 2 is further provided with a signal connector 4 4 and a power connector 4 6 which can be connected to one or more carriers 4 2 in the multilayer frame 3 6, and the power connector 4 6 is connected to the power supply through a power cord 4 8 The supplier 50 supplies power to the vehicle 4 in the multilayer frame 36, and the signal connector 4 4 is connected to the computer system 5 4 through the signal line 5 2 to supply test data to the vehicle 4 in the multilayer frame 36. 2. Furthermore, a test signal is generated on the carrier 42 and provided to the electronic products carried thereon. Similarly, the computer system 54 can also transmit a control signal to the carrier 42 through the signal line 52 and the signal connector 44, so that Control the operation of the system related to the testing of these vehicles 42. During the operation of the automatic sorter 12, the carrier 4 2 in the multilayer frame 36 can test the electronic products carried thereon. The circular test platform 3 2 can circulate the carrier 42 to load / unload electronic products by raising and lowering the multilayer frame 36. The carrier 4 2 can also be used as a tool for transporting the carried electronic products. Operation, when the automatic sorting machine 12 is picking up and moving the electronic products, the electronic products already on the carrier 4 2 in the multilayer frame 36 can perform the test operation at the same time, even if the automatic sorting machine 12 is

Page 11 1245909, _Case No. 93117369, year, month, and day of the amendment V. Description of the invention (8) When the carrier 42 is loaded / unloaded on the layer frame 36, electronic products already on the carrier 4 2 in the multilayer frame 36 may also be used. Test operations are performed simultaneously without interruption. Because each vehicle 4 2 is loaded onto the multilayer frame 36 at different points in time, the test operations between the vehicles 4 2 may not be synchronized. The vehicle 42 loaded on the multilayer frame 36 is first tested. Operation, the vehicle 4 2 that has completed the test operation can wait or be removed and then load another vehicle 4 2, that is, the test operation is a cyclic operation, and the operation of the cyclic test platform 3 2 can be repeated indefinitely. , Its capacity can reach the limit of automatic sorting machine 1 2. Due to the cyclic operation mode, the cyclic test platform 3 2 can process the entire batch of electronic products without a pause in the manufacturing process. Electronic products do not need to be pushed far away, and can be tested while waiting, so the process time is greatly reduced and the efficiency is improved. Even when the circular test platform 32 is testing the electronic products on it, the circular test platform 32 can be separated or moved from the automatic sorting machine 12 without interrupting work. Therefore, the automatic sorting machine 12 is in operation. It can also replace the cyclic test platform 32. On the other hand, because the electronic products are directly tested in-situ, it eliminates the need to purchase a large number of test machines or burners, saving costs and plant space. The tests between the vehicles 4 2 do not need to be synchronized, which means that parallel or pipeline (pi p e 1 i n e) processing can be used, so the computer system 5 4 does not need to use a large or high-level system. The fifth diagram is an operation diagram of the multilayer frame 36. There are multiple vehicles 4 2 in the multi-layer frame 36, and each time the automatic sorting machine 12 takes out the carriers 4 2 from the multi-frame 3 36, the computer system 5 4 controls the multi-frame 3 6 to rise or fall.

1245909 on page 12 _Case No. 93117369_ Revised Year of the Month _ V. Description of the invention (9) Lower it so that it is positioned so that one of the carriers 4 2 is aligned with the carrier platform 1 4 so that the automatic sorter 12 The movable arm 34 takes it out. When the automatic sorting machine 12 is to return the carrier 4 2 to the multi-layer frame 36, the computer system 5 4 controls the multi-layer frame 36 to rise or fall to position it so that the vacant spaces therein are aligned with the carrier 1 4. So that the movable arm 3 4 on the automatic sorting machine 12 is put into the carrier 4 2. Preferably, when the carrier 42 is taken out or replaced, the computer system 54 records it so as to grasp the vacancy in the multi-layer frame 36 and the taken-out carrier 4 2, but the taken-out carrier 4 2 can be used in the future. It is not necessary to return to the original position, but to place it in another vacant position. One of the features of the present invention is that there are only two positioning points, one occurs on the automatic classifier 12 and the other occurs on the multilayer frame 36. Preferably, before each time the vehicle 42 is taken out, the computer system 5 4 performs a self-test on the vehicle 42 to be taken out in advance. For example, the computer system 54 sends a control signal to the vehicle 42. The vehicle 42 generates a specific signal in response to the computer system 5 4 to confirm that the function of the vehicle 42 is normal. The multiple vehicles 42 in the multi-layer frame 36 perform simultaneous but unsynchronized test operations. Each vehicle 42 is provided with test data by the computer system 54, and a test signal is generated on the vehicle 42 to the vehicle 42. The electronic product and returns the test result to the computer system 54. The sixth figure provides an embodiment of a circular test platform 32, which includes a closed chamber to seal the carrier 42 in the multilayer frame 36. This enclosed room can be further used to perform the temperature resistance test of electronic products. A line 56 is installed on the enclosure of the closed chamber. One end is connected to the joint 58 and a duct 60 is provided to introduce liquid nitrogen or other inert gas as a cooling gas. A controller 62 is provided on the line 5 6 to control the conduction of the cooling gas. And flow, this set of gas guiding and guiding devices can

Page 13 1245909 ___Case No. 93117369_Year Month Day Amend_ V. Description of the Invention (10) The low temperature test is performed on the electronic products on the vehicle 42. Installing a heater 64 in an enclosed room can increase the temperature of the enclosed room for high temperature testing. The enclosed room further includes a fan, which can promote gas circulation in the enclosed room and achieve a uniform temperature effect. Such high- and low-temperature testing operations use local isolation, and only the electronic products under test are subjected to temperature rise and fall. Devices that are not within the scope of the test, such as power supply 50, are not within the scope of partial isolation. The seventh figure provides an embodiment of the vehicle 42, which is essentially plate-shaped, and has power contacts 6 8 and signal contacts 70 on one end surface, which can be coupled to the power connector 4 on the back of the multilayer frame 36. 6 与 信号 连接 器 4 4. The carrier 4 2 has a fixing mechanism 7 3, which can be fitted with one or more test modules 7 2. Each test module 7 2 has one or more test units 7 8 fitted into the fixing mechanism 80, and the test unit 7 8 has a substrate 7 4 and a connector 7 6 mounted on the substrate 7 4. The connector 76 is used for inserting the electronic products to be tested. According to different types or types of test objects, only the test unit 78 needs to be replaced. The vehicle 4 2 and the test module 7 2 have a buried line to connect the power contact 6 8 and the signal contact 70 to the connector 76. Different test devices can be implemented on the cyclic test platform 32, so its scope of application is extremely large and very flexible. In different embodiments, the types of the vehicle 42 ′ test module 72 and the test unit 78 and the types of cooperation between them may be changed. The eighth figure is another embodiment of the test module, which includes a multi-layer board structure. There are lines on the substrate 8 2 and a plurality of connectors 76 are installed. Each connector 76 can be used to insert an electronic product on the circuit board 84. There are lines and a plurality of connectors 86 to combine the substrate 82, and a circuit board 88 has lines and a plurality of connectors 90 to combine the circuit board 84. For different electronic products, just replace different connectors

Page 14 1245909 _Case No. 93117369_ Year Month Day Amendment _ V. Description of the invention (11) 7 6 or circuit board 8 4 Compared with the collapse system, the device 10 of the present invention has a higher efficiency. The loading / unloading device of the collapse system is in the automatic feeding device, and the electronic products being carried do not perform any action, so the idle time can not be avoided, but the electronic load carried by the circular test platform 32 of the present invention The product is connected to the system, and each of the circular test platforms 32 and the carriers on it operate the system instructions or autonomous actions respectively, without wasting time. Compared with the current mass production type testing or programming equipment, the device 10 of the present invention also has higher efficiency. If the testing or programming time of the electronic product is longer than the time of the current production-type equipment running dry (only for loading / unloading), its hourly output will be limited by the testing or programming speed of the electronic product. This is because the device can only hold a single test station. However, the circulating test platform 32 of the present invention can increase the number of test modules, so that the load / unload device can have electronic products tested or burned at any time to maintain the maximum output of the device, thereby improving efficiency. The above description of the preferred embodiments of the present invention is for the purpose of clarification, and is not intended to limit the present invention to exactly the disclosed form. Modifications or changes are possible based on the above teachings or learning from the embodiments of the present invention. The embodiments are selected and described in order to explain the principle of the present invention and allow those skilled in the art to use the present invention in practical applications in various embodiments. The technical idea of the present invention is intended to be based on the scope of the following patent applications and their equivalents. Decide.

Page 15 1245909 Case No. 93117369 Revised schema Brief description of the multi-body representation of the vertical combination of the vertical separation of the above-mentioned flat plane and the schematic diagram 5 that familiarizes you with this technique This view is not intended, the diagram is based on this intent, the diagram is based on this intent, of which j is based on this intent, of which 1 is based on this frame and the following is based on this picture From the perspective of the first aspect, the second aspect, the third aspect, the fourth aspect, the fifth layer, the sixth intention, the seventh, the eighth, and the figure 0, the present invention will be more clearly understood from the detailed description of the following. The point will become more obvious, among which: Inventive electronic product test equipment embodiment General invention test equipment generalized embodiment Inventive electronic product test equipment embodiment Automatic classification machine and circular test platform are invented Embodiment of the testing equipment for electronic products The automatic sorter and the circular test platform are examples of the testing equipment for electronic products invented Schematic; perspective schematic view of an embodiment of a circulating carrier platform test stand invention embodiment of the invention; FIG numbers exploded perspective embodiment of a test module of the invention, electronic test equipment 10

Page 16 1245909 • _ case number 93117369 _ year month day _ amendment simple illustration

Page 17 12 1 Moving sorter 14 Carrier table 16 Robot arm 18 Robot arm 20 Aisle 22 Loading station 24 Pre-positioning mechanism 2 5 Defective product placement table 26 Defective product tray 28 Robotic arm 30 Unloading station 32 Cyclic test platform 34 Movable arm 36 Multi-layer frame 38 Coupling 40 Rod 42 Carrier 44 Signal connector 46 Power connector 48 Power cable 50 Power supply 52 Signal cable 54 Computer system 56 Piping 1245909 _ Case No. 93117369_year month day_correction scheme Brief description 5 8 Connector 60 Conduit controller 64 Heater 6 6 Fan 6 8 Power contact 7 0 Signal contact 7 2 Test module 7 3 Fixing mechanism

7 4 base board 7 6 connector 7 8 test unit 80 fixing mechanism 8 2 base board 84 circuit board 86 connector 8 8 circuit board 90 connector

Page 18

Claims (1)

1245909 _Case No. 93117369 _ Year, Month, and Day Amendment_ 6. Scope of Patent Application · 1. An electronic product testing equipment, including: an automatic sorter; and a circular test platform, which can be separated or combined with the automatic sorter, the cycle The test platform has a multi-layer frame and a lifting device. The multi-layer frame can be used to house multiple carriers. The lifting device is used to drive the multi-layer frame to rise or fall. When the circular test platform is combined with the automatic sorter, The automatic sorter can be taken out of the multilayer frame or fed into the vehicle. 2. The device according to item 1 of the patent application scope, wherein the automatic sorting machine has a movable arm for taking the carrier out of the multilayer frame to the automatic sorting machine, or feeding the vehicle from the automatic sorting machine to the multilayer In the frame. 3. The device according to item 1 of the patent application scope, wherein the circular test platform is further provided with a power connector and a signal connector which can be connected to one or more carriers in the multilayer frame. 4. The device according to item 3 of the scope of patent application, further comprising a power supply coupled to the power connector to supply power to the carrier in the multilayer frame. 5. If the device in the scope of patent application No. 3, further includes a computer system coupled to the signal connector to supply test data to the carrier in the multi-layer frame, according to which a test signal is generated on the carrier to bear on it Electronics. 6. The device according to item 5 of the scope of patent application, wherein during operation of the automatic sorter, the carrier in the multilayer frame can be tested for electricity on it. Page 19 1245909 _Case No. 93117369_ Amendment Date 6 、 Patent application scope Product sub-machines are transferred from the item provided in the 5th section Fan Li specially requested to apply for the layer of the sub-frame electric frame during the production period As many test-loading releases as possible in the test can be used to load the center or frame of the center frame. From the goods to equipment installation, the item f1 of its provision is A. The offender is tnj. Please apply for the application such as 8 borrowed at the time, the frame to the frame. There are many layers in the frame, and the upper rod is connected to the lower sleeve of the movable coupling. The test rod has the test type I which is provided in the second I. Fanli 0 special month / ff = 如 环 in the mouth · ί 9 Circulation sealed with a closed chamber with a closed mouth with flat perimeter Fan Li, please apply as ο An Qi hot. A number of more and more ′ racking and framing layers with a carrier package are added to this product. This pair of products is used to carry out a flat test. The temperature of the test loop test should be high during the installation. Fan Li specially requested to apply such a method to induce the conductor into the gas but the gas produced by the cold sub-package is more conductive. The above spare equipment is provided. The platform is tested for the 8th test, the cycle is under the loop, the temperature is installed in the room, the package is closed, the test temperature is low, the wind is included, and the item 8 is provided by the official. At the point where the source is connected to the electrical tester, please send a letter with a serial number at point h in the low letter ^ ^ β line. The device is connected to the device in the body, and the item to the ring is connected to the electrical seal of the room source. # 围 # The temple fan tester has the item 11 provided in the device. Please apply Page 20 1245909 _ Case No. 93117369 _iMz_ VI. Scope of patent application One or more test modules. 15. The device according to item 14 of the scope of patent application, wherein the carrier has a fixing mechanism to install the test module. 16 · If the device is under the scope of patent application No. 14, the test module can be removed from the carrier. 1 7 · The device as claimed in item 14 of the patent application, wherein the test module includes a multilayer board. 18. The device according to item 14 of the scope of patent application, wherein the test module has one or more test units. 19. The device according to item 18 of the scope of patent application, wherein the test unit can be removed from the test module. 20. The device according to item 18 of the scope of patent application, wherein the test unit has a substrate and a connector is mounted on the substrate. 2 1. The device according to item 20 of the scope of patent application, wherein the test module has a fixing mechanism 'to mount the substrate. 2 2. If the device in the scope of the patent application is the first item, wherein the carrier is a board 2 3. A test method for electronic products, including the following steps: Combining an automatic classifier with a circular test platform, the circular test platform has Multi-layer frame, which can be used to house multiple vehicles. The automatic sorter can take out or feed the vehicle from the multi-layer frame; supply power and test data to the carriers in the multi-layer frame to generate test signals to Electronic products carried thereon; and 1245909 _ Case No. 931Π369 _ Year Month Day Amendment _ 6. Scope of Patent Application During the operation of the automatic sorter, the electronic products on the carrier in the multilayer frame are tested. 24. The method according to item 23 of the scope of patent application further includes lifting the multi-layer frame to achieve the purpose of vehicle circulation. 25. The method according to item 23 of the scope of patent application, further comprising positioning the multi-layer frame so that the automatic sorter can take a carrier out of it or put a carrier into an empty space therein. 26. The method according to item 23 of the scope of patent application further includes pre-self-testing the carrier in the multilayer frame to confirm that it functions properly. 27. The method according to item 23 of the scope of patent application, wherein the vehicle generates an anchor point only once on the automatic classifier and the multi-layer frame.