TWI230429B - Testing method and apparatus for circuit substrate - Google Patents

Abstract

A testing method and apparatus for circuit board can be used on 2-wire and 4-wire testing, in which the tested circuit substrate has a plural number of circuits and conductive through holes distributed thereon. This invention provides a first testing board with a plural number of parallel vertical conductive strips densely distributed thereon, which is covered and pasted onto one side of the circuit substrate so that the conductive through holes or the conductive circuits can electrically contact the vertical conductive strips; further provides a second testing board with a plural number of parallel horizontal conductive strips densely distributed thereon, which is covered and pasted onto the other side of the circuit substrate so that the conductive through holes or the conductive circuits can electrically contact the horizontal conductive strips; and subsequently tests electrically physical values such as voltage, current, resistance, etc. between arbitrarily any vertical conductive strip or any horizontal strip, between any two vertical conductive strips or between any two horizontal conductive strips. Therefore, this invention provides a novel testing method, which is totally different from the probe type testing method.

Description

1230429

The present invention relates to a method and device for measuring circuit board ga ^ Θ circuit boards, especially to a high-density acoustic thunder which can be measured. [Technical field to which the invention belongs] pa 佶 & , 丨 t, + degree of circuit board circuit or tiny conductive vias

Summer measurement method and device for resistance value. k J [Previous technology] ▲ Press, due to the advancement of technology, electronic products can become smaller and smaller, and more and more power can be obtained. Electronic products need to use circuit substrates to carry electronics :: and its connection lines, currently the highest There is no density circuit board than the circuit board used in the Ball Grid Array (bga) packaging technology of the central processing unit (CPU). The advantage of this BGA packaging technology is that the circuit board can be connected under the same size area. High-density package Ic with pin count up to 300 pins or more. And because the current operating voltage of electronic products is quite low, such as the new CPU's operating voltage is about 1.3V, at such a low voltage high-density electricity, the micro resistance value of the circuit or conductive via on the substrate is very important. If the resistance of the line is too large, or the micro-hole of the conductive through hole will affect the normal operation of the electronic component, the measurement of the micro-resistance of the bare board of the circuit board is currently shipped by the IC manufacturers before the packaging process or the circuit substrate manufacturers. It must be measured before. There are single-sided, double-sided, or multi-layer circuit boards, and there are two types of circuit boards: hard or soft. The process can be divided into two types: printed and laminated. No matter which circuit board is on it Conductive circuits will be provided to connect electronic components, and conductive circuits will be provided on double-sided or multilayer circuit boards.

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Electrical vias are used to connect the conductive circuits of each layer. To reduce the resistance, gold, silver, or copper plating is applied to the electrical circuits or conductive vias, such as silver glue vias. Hole (hereinafter referred to as the object to be measured) There are two ways to measure the small resistance value. The first is a two-line measurement method and the fourth is a four-line measurement method. First, please refer to the first figure, which is a schematic diagram of the circuit connection of the two-wire measurement. The two probes are mainly used to electrically contact the two ends of the object under test, and then the voltage V is applied to measure the current value. A, you can measure the

Pf value RDUJ = V / A, however, in this two-line measurement method, if the probe or

The closer the resistance value (rl, r2) of the wire of the S measuring instrument and the resistance value (rdut) of the object to be measured, the greater the error in the actual measured resistance value (rMEAS), that is, RMEAS = V / A = rl + r2 + RDUT, so only the ohmic (Ω) circuit board can be measured with energy, that is, the gold-plated, silver-plated, or copper-plated circuit board cannot be measured. Referring again to the second figure, it is a schematic diagram of the circuit connection of a four-wire measurement. The four-wire measurement is a circuit substrate for measuring milliohms. It is necessary to use four probes to electrically The four probes can be defined as S +, M +, S-, and M-. The resistance of each probe and wire is (1 « 1, r2, rml & rm2), at this time a voltage v is applied across M ^ f and M-, respectively, and the current value a is measured at s + and 3-. Because the internal resistance of V is high impedance, the current The current Im + and the voltage V through the voltage V so that the measurement voltage (VMEAS) and the voltage of the object to be measured (VDUT), so the actual measured resistance value (RMEAS) = V / A = resistance of the object to be measured (RDUT ) Without being affected by rl + r2 and rml + rm2.

Page 6 1230429 V. Description of the invention (3) Two measurements must be in contact with two small ends at each end of each object to be measured (for example, the conductive through hole of bga is about 'and the test = the needle is about 0.7m / m It is impossible to use a four-wire measurement method, and the offset of the substrate and the distance between the two probes are taken into consideration, so the edge of the measurement point needs to be left • mm to 0.7m / m is appropriate, otherwise it will be The unit price of penetrating into :: Ϊ: the risk of broken probes. Moreover, the finest probe with this shovel costs two dollars. The measuring point at the right can't cover the cost at all, let alone the use of gold-plated or silver-plated probes. The heart is square. 心; Ζ is a two-wire or four-wire measurement. The conventional probe-type measurement is used to measure a soft circuit board. Requires a gauge to measure, ": often: the precise position of the needle can be used in conjunction with the tester to measure, Λ 1 ^ ί f # of circuit boards made of various different circuits # 皆, all on the test fixture Hundreds or even thousands of pins = pins: So manufacturers are measuring circuit substrates; probes, and measuring jigs are manufactured. 1 U in the US board ^ ancient I case the inventor is In order to determine the above-mentioned current measurement of high-degree circuits = Yes: there are and is missing, we are dedicated to research and cooperate with the school to measure the method of measuring circuit boards without using probes and measuring jigs. The purpose of the resistance value of the circuit board. Measurement [Inventive Content] 1230429 V. Description of the Invention (4) The purpose of the present invention is to provide a universal measurement tape placement method, Wang Xin's circuit board measurement method and quantity The test asks the stomach, and also solves the problem that high-density circuit substrates cannot use four-wire boards. Needless to say, two types of pins are required: soft, hard, and other types of circuit base pins. Because the cost of exploration is not used, the problem of the consumption of wood can greatly reduce the measurement. To achieve the above purpose, a circuit board measurement of wood extrusion is required. The technical feature is to provide at least one conductive through hole for the electrical connection of the power supply line. In this method, the first surface of the substrate is routed, so that the conductor = a measuring board is attached to the electric board, and the second measuring line of the horizontal conductive strip touches "conducting = facing-the straight conducting". Strips and horizontal conductive strips; finally measure any two of the horizontal conductive stripsΗ Xiί ί The guide bar, any two of the direct conductive bars, or a type of electrical physical value: 4 voltage, current, resistance and other electrical physical values, which are the effectiveness of the test instrument. The technical feature of sub-7 is to provide-a two-wire circuit base per lead = 1 method. The circuit substrate is provided with a plurality of conductive lines, and the mother-conductor line is far from electrical + +-dense parallel parallel direct conduct; The method firstly provides the first 1 test board with ^ ^ I conductive% strips, which is affixed to the circuit base to make the conductive through hole or the conductive line electrically contact the straight conductive 1230429 V. Description of the invention (5) And a dense plurality of parallel lateral guides are provided on the circuit substrate to contact the horizontal conductive strips, and any two are directly guided between the conductive strips of the straight conductive strips; the best value is to obtain the probe of the system under test and test the microchip of the present invention. The resistance value is measured on one side of a dense plurality of flat plates of each conductive line to make a strip, and then a circuit board is provided to electrically contact the conductive strip through hole or the conductive strip when the circuit substrate touches any of the lateral conductive spaces of the conductive strip. The circuit substrate can be used as the device of the present invention. Electrically connect at least another noodle; then select an electric strip or any two and measure the current through the conductive through-hole fixture after the horizontal conduction to achieve another technical special method, which is electrically connected to the straight conductive strip and the conductive The through holes are densely arranged on the other side of a plurality of flat, and then a micro-resistance four-wire measurement of the conductive through or horizontal conductive lines between strips is provided. Another technology is arranged on the special substrate-conductive through holes make the guide optional. Between a horizontal conductive strip, the direct conduction or reduced conductivity is the first one with less one in the road substrate, or the horizontal cross guide makes the guide measure the electrical value of the direct conductor or the strip to the effect Symptoms are that there are plural, electrical through holes of the electrical bar and any conductive bars; then a second measurement or the small resistance value of the lateral conduction between the conductive bars and the straight conductive bars is provided. The purpose of this book is to provide the through-hole measurement board with the electrical through-hole voltage of the electrical line of the electrical line and the conductive line current value between the electrical bars to achieve the effect. A four-wire method with a complex guide "the method" is applied to the electrical contact of the second measurement or the conductive line either directly or in any of the two ways; finally, the board to be tested can be used on any board and the line is electrically conductive Measure the voltage or the current of the horizontal bar to replace the circuit-based electrical line. First, provide the circuit-based straight conductive plate and cover the circuit. Electrically connect the conductive bar and the horizontal conductive bar to measure the conductive high density flowing through. The electric circuit provides a circuit substrate for measuring conductive lines, and each conductive line measuring device includes: a first measurement

V. Description of the invention (6) Circuit board :: Yes: J: Parallel straight conductive strips, which can be pasted on the electrical one-straight conductive strips; one = -through holes or the conductive lines electrically contact at least the horizontal Conductive strips can be overlaid: f-plates, which are densely covered with a plurality of parallel holes or the conductive lines 2 to 4; ~ the other side of the circuit substrate to make the conductive

The switch is electrically connected to: contact at least one of the horizontal conductive strips; at least one selection is electrically connected to the straight conductive strip and the horizontal conductive strip;-measure the K conductive strip and any of the 彳 1 ^ thunder f selected by the selection switch Measure the electricity between any of the straight and horizontal conductive strips' :::, between any two of the straight conductive strips, or between any two of the conductive substrates of the circuit board or conduct electricity using a probe, which is the energy measurement [Implementation] The commissioner will further understand the detailed description of the present invention to achieve the detailed description of the toilet 2 and its effects, please refer to the following about the present invention can be derived from: deep :: and: believe the purpose, features and characteristics of the present invention, for examination and explanation It is not used; S understand 'however, the drawings are provided only for reference, please refer to the following to limit the present invention. Schematic diagram of the hardware architecture, the first figure is the circuit board measuring device of the invention, and the fifth figure is the schematic diagram of the use of the invention's quantum cross section. It is a schematic diagram of a complete circuit board. The present invention: The measured circuit board measuring device i is an early-side, double-sided, or multilayer circuit A or soft circuit board, and also-a board surface and-a second board surface 22, on which the circuit board 2 has a first It is provided with a plurality of conductive lines 23, 1230429 --------- V. Description of the invention (7) Each conductive line 23 is electrically conductive and an electrical solder joint 25, and the lightning conductor is connected with at least one The conductive through hole 24 or at least electrically connects the first plate surface 21, J2 to 4: [through: circuit 23, such as a silver glue through hole, and # 罘 一 开关 面 22 or one of the conductive electronic components on the inner plate surface Pin. The μ electrical solder joint 25 can be electrically welded to a measuring device 10 of the present invention. 10 The measuring plate 12, at least one option. A first measuring plate 11 and a second measuring plate 11 Shangmi 5 was measured by Cuiyuan 14. Which can be attached to the circuit board? Numbers of parallel conductive strips ill parallel to each other, the conductive line 23 or 4 are electrically extinguished f9: board surface 21, so that the conductive through hole 24, the electrical strip ⑴ (20.) can be electrically contacted with at least -2: The direct conductive parallel parallel conductive stops 121 are also densely packed with multiple phases so that the conductive leads ΓΪ 二 Λ2 and the second board of the circuit substrate 2 are in electrical contact; ^ i / 1, β π I conductive The circuit 23 or the electrical solder joint 25 can be touched by the rabbit "-the horizontal conductive strip 1 21 (202). In this case, the board 11 and the second measurement board 12 may be-flexible The width of the board 2 can be completely covered on the circuit board 121. The width can be two: cloth "straight conductive strip 111 or the horizontal conductive strip is disgusting" Ima 0 · Olm / H 7m / m two straight Any size between conductive strips or between two adjacent conductive strips is determined by the density of two adjacent adjacent electrical lines, conductive vias, or electrical welding. All Guan 13 series are electrically connected to all the straight conductive strips. Or you can choose any-straight conductive strip ιη (204) and any k guide strip 1 21 (206) as the measurement endpoint, or any two straight strips. Conductive Page 11 1230429-* ------ V. Description of the invention (8) Article 1 U or any horizontal conductive bar as J :::-to-testing instrument, by measuring electricity to = _ 于 心: = = 丄 = Measure Measure-Straight Conductive Strip and Measure: 1 ': The measuring electric plate "3 plate 1 is attached to the conductive through hole of the circuit base 241 or can be touched wide with m electrically contacting such as The rod at 242 :::; road 'can also make the conductive conductivity of the horizontal conductive strip paste = 4;:! Through holes or 232 conductive lines, the conductive lines are all electrically connected ^ U road, 242 conductive The hole and 232 series, and the measurement of conductive + $ $ i connection, so you can take advantage of its electrical connection = the value of the micro-resistance on conductive conductive holes or conductive lines. The sixth figure shows the invention Two-line measurement ίΙ ^ ::: ηΓΤ 134, which is a second selection switch 133 and a fourth selection switch 133 which are electrically connected to any one of the selection switch 131 or the third selection switch 133 Can choose the fourth option: :: Article 111 'And the The second selection switch ⑶ or the second switch is electrically connected to any one of the horizontal conductive strips 121 to form two measurement endpoints of the two-wire measurement. The door measurement unit U provides a voltage source 141 to the first or the second measurement terminal. Three options ^, any one of the straight conductive bars 111 selected by 133, and the second page 1230429

Or the fourth conductive switch 132, 134 selects the horizontal conductive strip 121 to supply a measurement voltage v between the straight conductive strip 11 and the horizontal conductive strip 121, so that energy measurement flows through the straight conductive strip.丨 丨 The current value A ′ between i and the horizontal conductive strip 丨 2 1 can know the straight conductive strip 丨 丨! Electrical resistance 2 electrically connected to the horizontal conductive strip 丨 2 1, conductive through hole 24 or resistance r of the electrical solder joint. _ Please refer to the seventh figure, which is the equivalent intention of the two-line measurement single-sided substrate of the present invention. As shown in the figure, the first or third selection switch 131, 133 and the second or fourth selection switch 132, 134 can be used to select the two straight conductive bars on the first measurement board 11丨 丨 or any two, conductive strip 121, and any two straight conductive strips ηι or any two of the plate conductive strips 1 2 1 are in electrical contact with the conductive through hole 24 or conductive line 23 of the same electrical connection In this way, the two measurement endpoints of the two-line measurement are formed. As shown in FIG. 8, it is an equivalent schematic diagram of the four-line measurement of the double-sided substrate of the present invention. The four-line measurement system Any one of the straight conductive strips 丨 i selected by the first selection switch 31 and the third selection switch 1 32 and those selected by the second selection switch 1 33 and the fourth selection switch 丨 34 Any bismuth conductive strip 1 2 1 is provided with a voltage source 1 41 by the measuring unit 14 to supply a measurement voltage V between the second selection switch 1 32 and the third selection switch 丨 33 to enable By measuring the current value A flowing between the first selection switch 31 and the fourth selection switch 134, the selected direct conduction can be known U1 the horizontal conductive strip 121 is electrically connected to the conductive traces 23, 24, or points of electrical vias molten resistance R. 々 As shown in the ninth figure, it is the equivalent schematic diagram of the four-wire measurement single-sided substrate of the present invention. As shown in the figure, the first and third options 1230429 can be used in this embodiment. 5. Description of the invention (10) The switch 1 3 1, 1 3 3 can select any one of the straight conductive bars 11 or any of the 121, and The second and fourth selection switches 132 and 134 select another one of the straight conductive strips 1 11 or the other of the horizontal conductive strips 丨 2 1, and the selected two straight = electric strip 111 or horizontal conductive strip 121 are electrically Contact the same electrical connection of conductive = hole 24 or conductive line 23, so that the four measurement positions that form a four-wire measurement are new circuit devices, but the use of the type of circuit is unique to the invention, only, where The improvement, the fixed patent, and the substrate measurement of the present invention are compatible with the substrate, the week value, and the advantages of the advantages. It is indeed possible to borrow the method, which is different from the existing pattern artist before the application, which is still different from the application before the application. The current practice is still described in the full replacement tester. Needle and test fixture on the measuring device, and can test any kind of design, can improve the overall or open use, since the patent application has been identified. It is only an embodiment of the present invention. The above description makes other various inventive spirits and the following boundaries. 1230429 I Simple explanation of the diagram ^ ^ ---- / [Simplified explanation of the diagram] / (1) Illustration of the diagram: 丨Schematic diagram of circuit connection for measurement; The first diagram is the schematic diagram of circuit connection for four-wire measurement; the second diagram is the schematic diagram of the hardware architecture of the present invention, and the fourth diagram is a cross-sectional view of the use state of the invention. The fifth diagram is a schematic diagram of the flow i of the measurement circuit substrate of the present invention; the sixth diagram is a double-sided measurement of the two-line measurement of the present invention; the seventh diagram is a diagram of the present invention; the eighth The figure is a diagram of the present invention; and the ninth diagram is a diagram of the present invention. Fig. 0 Two-line measuring single-sided electric four-wire measuring double-sided electric four-wire measuring single-sided circuit board (2) Representative symbols of main parts: Measurement device 1 11 111 12 121 13

First measurement board Straight conductive bar Second measurement board Horizontal conductive bar. Selection switch First selection switch 1 3 ^

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Page 16

Claims (1)

Sixth, the scope of patent application1. A circuit-second board electrical connection includes the following: provide a dense first board surface, straight conduction, provide a dense one board surface, the transverse conductivity measurement between any electric strip or the conductivity 2 · If you apply for the conductive wire straight conductive strip 3 · If you apply for the special electric welding 4 · If you apply for the special circuit base 5 · If you apply for the special substrate 6 The method of measuring the number of Lifan Luke or the Lifan point is the Lifan board, the Lifan board is the Lifan test board, and the circuit board has a first board surface and a plurality of conductive lines. Each conductive line: 'Electric through-holes run through the circuit substrate, and the method at least counts the first-measuring plate of parallel straight conductive strips, which are pasted on the conductive through-holes or the conductive lines electrically contact at least a number of parallel horizontal The first of the conductive strips: the measurement board is affixed to the «Hai conductive through hole or the conductive line is in electrical contact with one and between the conductive strip and any of the horizontal conductive strips, and any two of the direct conductive strips, Electrically connected Physical values of the through hole electrically. The method for measuring a circuit board according to item 1, wherein the electrical connection is at least an electrical solder joint, and the horizontal conductive strip can be electrically contacted. The method of measuring circuit board described in Item 2 of Yantong can solder one pin of an electronic component electrically. The circuit board measurement method described in item 1 may be a hard or soft circuit board. The method for measuring a circuit board described in item 1 may be a multilayer circuit board. The measurement method of the circuit substrate described in item 1 wherein wherein wherein the first summer and the second measurement board are a flexible non-conductive material Page 17 2W47Q _ 6. Scope of patent application: It can be completely covered on the circuit board. The measuring method of the circuit substrate described in the first item of the profit range, wherein the width of the straight V-bar or the horizontal conductive bar can be 0. Bu! 、 Middle 8. The measurement method of the circuit board described in item 1 of the scope: m. The distance between the middle straight conductive strips or the horizontal conductive strips can be 0. Bu /, Middle 9 · The circuit board measurement method described in item 1 of the patent scope! 11 The electrical physical value is the voltage Value, current value, or resistance value / 10. The step of measuring the electrical physical value before the step of measuring the electrical physical value as described on the circuit substrate in the i-item of the patent application includes the following steps. Among them = any-the straight conductive bar and any One of the horizontal conductive strips, any two of the strips, or any two of the horizontal conductive strips. Electricity u. Ershen // Geely strictly measures the circuit board measurement method strip described in item 10 or the step of the horizontal conductive strip 'uses at least -12 · circuit substrate measurement described in item 11 of the scope of patent application The method, wherein the selection switch is more electrically connected to a voltage source and a measuring meter, and the voltage source is to supply a g-conducting through-hole or a conducting line for measuring the voltage electrically connected to the straight conductive bar or the horizontal conductive bar. The measuring meter measures the voltage value, current value or resistance value of the conductive through hole or the conductive line. M 13 · The method for measuring a circuit board according to item 11 of the scope of patent application, wherein the selector switch is further electrically connected to a test instrument for measuring the voltage value, current value, or resistance. 1 4 · A method for measuring a small resistance value of a one-line circuit substrate, the circuit substrate has a first plate surface and a second plate surface, and a plurality of conductive wires are arranged on the circuit substrate Page 18 1230429 6. The scope of the patent application, each: the conductive line is electrically connected to at least one conductive through hole penetrating the substrate, the method includes at least the following steps: X circuit provides-densely parallel multiple parallel straight conductive bars [measurement board: two to make the conductive through The hole or the conductive line is electrically contacted = a second measuring plate provided with a dense plurality of parallel horizontal conductive strips is affixed to the second plate surface, so that the conductive through hole or the conductive line is electrically reduced by two the horizontal Conductive strips; 〃 Provide a measuring voltage between any of the straight conductive strips and any of the horizontal conductive strips, any two of the straight conductive strips, or any two of the horizontal conductive strips, and the conductive vias that are electrically connected. Or the conductive line; and measure the value of the current flowing through the straight conductive bar or the horizontal conductive bar to obtain the small resistance value of the conductive through hole or the conductive line to be measured. 15. The small resistance value of the two-wire circuit board as described in item 14 of the scope of the patent application is $ Measurement f Ϊ 'where the conductive line can be electrically connected to at least one electrical solder joint' can be in electrical contact with the straight conductive bar or the Horizontal conductive strip. XQ Shikou Shengu to * The method for measuring the small resistance of the two-wire circuit board described in item 15 of the Mingli profit range, 4 1 It is recognized that the electrical solder joint can be electrically soldered to an electronic component. foot. 1 7 · As described in Shen Han, the method of measuring the small resistance value of the two-wire circuit board described in item No. 丨 4, β j, α, where the circuit board can be a hard or soft circuit board. board. 1 8 · Shikou Shenshi Taihang Quantity: I is called the two-wire circuit board with a small resistance, as described in item 14 of the profit-seeking range, where the circuit board can be a multi-layer circuit board. Page 19 1230429 six 37 38 39 40 patent application scope 1 test method, wherein the second selection switch and the third selection switch are electrically connected to a voltage source, and the first selection switch and the fourth selection switch are connected A measuring meter is electrically connected to measure the micro-resistance between any one of the straight conductive bars and any one of the horizontal conductive bars. 4. The method for measuring the micro-resistance of a four-wire circuit substrate as described in item 34 of the scope of patent application, wherein any two of the straight conductive strips or any two of the horizontal conductive strips are selected, using a first selection switch and a third A selection switch, and a first selection switch and a fourth selection switch. • Once the four-wire circuit substrate micro-resistance measurement method described in item 37 of the scope of patent application, wherein the second selection switch and the third selection switch are electrically connected to a voltage source, and the first selection switch And the micro-resistance between any of the fourth far-transverse conductive bars. As described in the four-wire circuit substrate micro-resistance value === method described in item 34 of the scope of patent application, wherein the first selection switch, the second selection switch, the & selection switch and the fourth selection switch are all Electrically connected to a tester. First, it is used to measure the micro-resistance of the conductive via or the conductive line. And a kind of measuring device for circuit substrate, the circuit substrate has a first board surface with high electrical conductivity ", which is provided with a plurality of conductive lines, and each conductive line is provided with at least a conductive through hole through the Circuit board, the measurement is densely covered with a plurality of straight conductive strips parallel to each other, and the electric line is electrically pulled & the first plate surface of the earth plate, so that the conductive through hole or the guide contacts at least one straight conductive strip; Page 1230429 _ One can be covered with a plurality of parallel conductive electric lines parallel to each other on G Ϊ j :: μ1: the second plate surface of the slab 'makes the conductive at least one, g contact at least one of the horizontal conductive strips ; This time, the electricity: Select: Off 'is electrically connected to all the straight conductive strips and all the measurement sheets-^ Select the measurement i, electrically connected to the selection _, and close the conductive by the selection door Stop the door; f straight conductive strips and any-the horizontal conductive strips, any: 41. If you apply for the second physical electrical value between the horizontal conductive strips-the amount of circuit board described in Article 40 of this patent The conductive circuit of the measuring point substrate can be electrically connected at least-electrically soldered The electric strip or the horizontal conductive strip. • The circuit board measuring device described in Article 41 of the scope of patent application, and its 43 J electrical solder joint can be electrically soldered to a pin of an electronic component. • Application scope of patent 40 The circuit board measuring device described in Article 2 may be a hard or soft circuit board. 4. The circuit board measuring device described in Article 40 of the scope of patent application, wherein the circuit board is It may be a multi-layer circuit substrate. 45. The circuit substrate measuring device according to Article 40 of the scope of patent application, wherein the first measuring plate and the second measuring plate are a flexible non-conductive, 〇1, so that the circuit board can be completely covered. Material 4 6 · As described in the patent application scope of the circuit board measurement device 40, wherein the width of the straight conductive bar or the horizontal conductive bar may be 〇1 〇1 ~ I 7 m / m 47. The circuit board measuring device m as described in Article 40 of the scope of patent application, wherein the distance between two adjacent straight conductive bars may be 0; [~ 2. 54m / m. 、 1230429 on page 24, patent application scope 4 8 · The circuit board measuring device as described in Article 40 of the patent application scope, in which the distance between two adjacent horizontal conductive strips may be 0 · 1 ~ 2 · 54m / m . 49. The circuit board measuring device according to Article 40 of the scope of patent application, wherein the selection on relationship includes a first / selection switch, a second selection on and off, a third selection switch and a fourth selection switch. . 5 0 · The circuit board measuring device as described in Article 49 of the scope of patent application, wherein the first or third selection switch βH is electrically connected to any of the straight conductive bars, and The four-selection switch is electrically connected to any one of the horizontal conductors for two-wire measurement. 5 1 · The circuit board measuring device according to Article 49 of the scope of patent application, wherein the first or third selection switch and the second or third switch are respectively electrically connected to any two of the straight conductive bars or Any two of the horizontal guides are used as a two-line measurement. • The circuit board measuring device described in Article 49 of the Chinese patent application scope, which is electrically connected to any of the straight conductive bars, bars, f second and fourth selection switches by the second and third selection switches. To any one of the transverse conductive 53 ^ is used as a four-wire measurement. The circuit board measuring device described in Article 49 of the Chinese patent scope, which switches the third selection switch, and the second and fourth selections are used as A; connected to any two of the straight conductive bars or any two of the horizontal Conductive strip, 54. If / ^ is a four-wire measurement. The range of the amount ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ The physical physical value of the circuit board measuring device described in Article 40 is the voltage value and current value. Page 25 1230429 6. Application for patent scope 5 5. The circuit board measurement device as described in Article 40 of the scope of patent application, wherein the measurement unit can provide a voltage source to supply any one of the straight conductive bars and the A voltage is measured between the horizontal conductive strips, between any two of the straight conductive strips, or between any two of the horizontal conductive strips, so that the energy or current value flowing through the conductive through hole or the conductive line is measured. 5 6. The circuit substrate measuring device according to Article 40 of the scope of patent application, wherein the measuring unit is a testing instrument for measuring the current value or resistance value of the conductive via or the conductive line. Page 26