TWI224718B - Positive photosensitive coating composition, preparation method of positive photosensitive resin and pattern-forming method - Google Patents

Positive photosensitive coating composition, preparation method of positive photosensitive resin and pattern-forming method Download PDF

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TWI224718B
TWI224718B TW92107685A TW92107685A TWI224718B TW I224718 B TWI224718 B TW I224718B TW 92107685 A TW92107685 A TW 92107685A TW 92107685 A TW92107685 A TW 92107685A TW I224718 B TWI224718 B TW I224718B
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positive
resin
parts
pattern
group
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TW92107685A
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TW200401167A (en
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Kazuo Yamanaka
Sinsuke Oonisi
Kenji Miyagawa
Kenji Seko
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Kansai Paint Co Ltd
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Abstract

The present application provides a positive type coating composition and forming method of pattern by using the said coating composition. The positive type sensitivity coating according to the present invention is characterized in that contains specific modified quinonediazido-sulfonamide as union based on the 100 parts by weight in one molecular, making the structure unit containing 0.1 to 0.9 mole concentration in 1 kg resin, and using the specific carboxylic sulfonamide derivative as the structure unit, which in 1 kg resin the structure unit containing 0.2 to 0.4 mole concentration positive type sensitivity resin with 1 to 50 parts by weight at least one component selected from the group of phenol resin phenol derivative and catechol.

Description

1224718 玖、發明說明 (發明說明應敘明:發明所屬之技術領域、先前技術、內容、實施方式及圖式簡單說明) (一) 發明所屬之技術領域 本發明係有關一種運轉安定性優異、導體映像形成之 信賴性高的光阻劑,特別是適於作爲印刷電路基板製造用 蝕刻光阻劑之正型感光性塗料組成物,以及有關一種使用 該正型感光性塗料組成物之印刷電路基板等之圖案形成方 法。 (二) 先前技術 電子機器等使用的印刷電路基板係主要是在表面上具 有導體層之絕緣基板上藉由篩網印刷的圖案印刷法、或利 用使用感光性乾性薄膜之微影術形成的電路圖案之減層法 製造。 最近,印刷電路基板伴隨高密度化、高精度化,進行 電路圖案之微細化。其次,可對應於該要求之製造方法, 提案有利用正型感光性電沈積光阻劑的方法。 上述正型感光性電沈積光阻劑所使用的正型感光性塗 料組成物係爲使含有異氰酸酯之單體共聚物的異氰酸酯加 成感光性物質及苯甲酸製得(參照特願2000 - 0 5 6264號)。 該正型感光性塗料組成物因曝光呈現對鹼顯像液而言之曝 光部與未曝光部的溶解性差,藉此可以顯像·。然而,使感 光性物質之加成量增加時會有感度降低的問題,反之,使 加成量減少時雖感度提高、惟對鹼顯像液之溶解性差不充 1224718 分、致使圖案形成形降低的問題。 (三)發明內容 本發明目的係爲係開發一種高感度且鹼顯像液溶解性 差充分的正型感光性塗料組成物及使用該塗料組成物之圖 案形成方法。 【發明之揭示】 本發明人等爲解決習知的問題時,再三深入硏究的結 果發現藉由在特定的正型感光性樹脂中配合酚樹脂、酚衍 生物、或兒茶酚衍生物,可以保持感度且提高圖案形成性 ,遂而完成本發明。 換言之,本發明係有關 1 · 一種正型感光性塗料組成物,其特徵爲對丨〇 〇重量份在 一分子中含有下述通式(1 )所示改性醌二疊氮基磺胺胺 爲構造單位’使該構造單位在丨公斤樹脂中含有〇 .丨〜〇 . 9 莫耳之濃度,且在1公斤樹脂中含有〇.2〜4.0莫耳濃 度之下述通式(2)所示構造單位之正型感光性樹脂而言 配合1〜5 0重量份至少一種選自於酚樹脂、酚衍生物及 兒茶酚衍生物之成分, 通式(1 )1224718 发明 Description of the invention (the description of the invention should state: the technical field, prior art, content, embodiments, and drawings of the invention briefly) (1) the technical field to which the invention belongs The invention relates to a conductor with excellent operation stability and a conductor Reliable photoresist for image formation, in particular, a positive photosensitive coating composition suitable as an etching resist for printed circuit board manufacturing, and a printed circuit board using the positive photosensitive coating composition And other pattern formation methods. (2) The printed circuit board used in the prior art electronic equipment is mainly a circuit formed by a screen printing method or an lithography using a photosensitive dry film on an insulating substrate having a conductive layer on the surface. Manufacture of patterns by subtractive layers. Recently, printed circuit boards have been miniaturized with increasing density and accuracy. Next, a manufacturing method corresponding to this requirement is proposed, and a method using a positive-type photosensitive electrodeposition photoresist is proposed. The positive photosensitive coating composition used for the positive photosensitive electrodeposition photoresist is prepared by adding an isocyanate of an isocyanate-containing monomer copolymer to a photosensitive substance and benzoic acid (see Japanese Patent Application No. 2000-0 5). 6264). This positive-type photosensitive coating composition exhibits poor solubility in the exposed portion and the unexposed portion of the alkali developing solution due to exposure, whereby development can be performed. However, when the additive amount of the photosensitive substance is increased, there is a problem that sensitivity is reduced. On the contrary, when the additive amount is decreased, the sensitivity is increased, but the solubility of the alkali developing solution is poor, which is not 1224718 points, resulting in a reduction in pattern formation. The problem. (3) Summary of the Invention The object of the present invention is to develop a positive photosensitive coating composition with high sensitivity and poor solubility in an alkali developer, and a pattern forming method using the same. [Disclosure of the Invention] When the present inventors and the like intensively studied to solve a conventional problem, they found that by blending a phenol resin, a phenol derivative, or a catechol derivative with a specific positive photosensitive resin, The present invention can complete the invention while maintaining sensitivity and improving pattern formation. In other words, the present invention relates to 1. A positive-type photosensitive coating composition, characterized in that a molecule containing a modified quinonediazide sulfonamide represented by the following general formula (1) in one part by weight is: The structural unit 'is such that the structural unit contains a concentration of from 0.1 to 0.9 moles in 丨 kg of resin and a concentration of 0.2 to 4.0 moles in 1 kg of resin, as shown by the following general formula (2) The positive photosensitive resin of the structural unit is blended with 1 to 50 parts by weight of at least one component selected from the group consisting of a phenol resin, a phenol derivative, and a catechol derivative, and the general formula (1)

-7- 1224718 (一中’ I係表示氫原子、直鏈或支鏈院基、芳香 族經基、或脂環族烴基) 通式(2 ) 【化4】-7- 1224718 (One of the "I" represents a hydrogen atom, a straight or branched chain radical, an aromatic meridian group, or an alicyclic hydrocarbon group) General formula (2) [Chemical formula 4]

R3——NR3——N

(其中’ R2、r3係各表示氫原子、直鏈或支鏈烷基、 芳香族烴基、或脂環族烴基)。 2· —種圖案形成方法,其特徵爲包含 (1 )在基板上塗覆如上述1項之正型感光性塗料組成物 ’形成正型感光性塗膜之步驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步 驟, (3 )以驗性顯像液除去曝光部之塗膜以形成圖案的步驟 〇 3 · —種圖案形成方法,其特徵爲 (1 )在基板上塗覆如上述1項之正型感光性塗料組成物 ,形成正型感光性塗膜之步驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步 驟, (3 )以鹼性顯像液除去曝光部之塗膜以形成圖案的步驟 - 8 — 1224718 (4 )使曝光的導電性被膜或金屬板表面鈾刻的步驟, (5 )除去圖案上之光阻塗膜的步驟。 4 .如上述2或3項之圖案形成方法,其中使如上述1項之 感光性塗料組成物藉由電沈積塗覆於具有導電性皮膜之 基板或金屬板上。 (四)實施方式 首先,詳細說明有關本發明之正型感光性塗料組成物 〇 本發明之正型感光性塗料組成物,其特徵爲對1 〇〇重 量份如上述之正型感光性樹脂而言配合i〜5 〇重量份至少 一種選自於酚樹脂、酚衍生物、及兒茶酚衍生物(以下簡稱 爲「酚系成分」)之成分。其次,說明有關構成正型感光性 樹脂之各成分。 正型感光件樹脂 正型感光性樹脂成分係爲在一分子中含有上述通式(1) 所示改性醌二疊氮基磺胺胺爲構造單位,使該構造單位在 1公斤樹脂中含有0.1〜0.9莫耳之濃度,且在1公斤樹脂 中含有0.2〜4.0莫耳濃度之上述通式(2)所示構造單位的 正型感光性樹脂。 該樹β曰之感光丨生基濃度沒有特別的限制,惟就感光性 、顯像性、塗覆作業性等點而言在1公斤樹脂固體成分中 改性醋一疊氮擴胺構造單位之含量爲〇 · 1〜〇 . 9莫耳較佳、 更佳者爲0.2〜0.5莫耳。 一 9~ 1224718 於通式(i)所示改性醌二疊氮磺胺感光基中,h爲一價 有機基。R!爲直鏈或支鏈烷基包含甲基、乙基、正丙基、 異丙基等。而且,R!爲芳香族烴基包含苯基、甲苯基、二 甲苯基等。另外,R,爲脂環族烴基包含環己基等。 改性醌二疊氮磺胺感光性基在1公斤樹脂中含有〇 .丨 〜〇 . 9莫耳、較佳者爲〇 . 2〜0 . 5莫耳。若含量小於〇 ·!莫 耳時感光性、顯像性等之性能不佳,而若大於0 · 9莫耳日寺 感度降低。 於通式(2 )所示構造單位中,R2及R3爲一價有機基。 及R3例如與上述R,相同的直鏈或支鏈烷基、芳香族烴基、 及脂環族烴基。 通式(2 )所示構造單位在1公斤正型感光性樹脂(固體 成分)中含有0.2〜4.0莫耳、較佳者爲0.6〜1.5莫耳。若 含量小於0 · 2莫耳時鹼溶解性不佳,而若大於4 . 0莫耳時 耐驗性不佳。 本發明使用的正型感光性樹脂只要是具有上述構成者 即可,沒有特別的限制,可使用習知物。 該正型感光性樹脂例如包含使醌二疊氮磺胺(以下稱爲 感光性基)以及在一分子內具有胺基與羧基之化合物(以下 稱爲胺基酸化合物)藉由下述步驟(I )、( I I )、或(I I I )加成 於樹脂中者。 步驟(I ): (1 )使含具有含異氰酸酯基之聚合性乙烯基的不飽和性單 體之不飽和單體游離基共聚合。 - 1 0 - 1224718 (2 )然後,使含羥基之醌二疊氮化合物藉由胺甲酸酯化反 應加成。 (3 )然後,使胺基酸化合物以尿素化反應加成予以製造。 步驟(I I ): (1 )使含羥基之醌二疊氮化合物藉由胺甲酸酯化反應加成 、且使胺基酸化合物藉由尿素化反應加成於具有含異 氰酸酯基之聚合性乙烯基之不飽和單體,形成各官能 性單體。 (2 )然後,使含有(1 )合成的單體之聚合性不飽和單體游離 基共聚合予以製造。 步驟(I I I ): (1 )使含經基之醒二疊氮化合物藉由胺甲酸酯鍵結加成、 且使胺基酸化合物藉由尿素鍵結加成於具有含異氰酸 酯基之聚合性乙烯基的不飽和單體形成各官能性單體。 (2 )然後,使具有(1 )所得單體與含異氰酸酯基之聚合性乙 烯基的單體、以及視其所需其他的單體游離基共聚合。 (3 )然後,藉由使胺基酸化合物藉由尿素化反應加成予以 製造。 而且,爲使上述製造步驟(1)(2)中與含羥基之二疊氮 化合物反應、於製造步驟(1 )( 3 )中與胺基酸化合物反應、 或製造步驟(I I )( 1 )中含經基之二疊氮化合物及胺基酸化合 物反應、或製造步驟(I 1 1 )( 2 )中與胺基酸化合物反應時使 用的含異氰酸酯基之乙烯基單體,例如下述所示者。 1224718 通式(3 ) CH2二 c; 7R4(Wherein "R2 and r3" each represent a hydrogen atom, a linear or branched alkyl group, an aromatic hydrocarbon group, or an alicyclic hydrocarbon group). 2. A pattern forming method, characterized in that it comprises (1) a step of forming a positive photosensitive coating film by applying a positive photosensitive coating composition as described in 1 above on a substrate, and (2) directly or via a pattern light A step of exposing the positive photosensitive coating film, (3) a step of removing the coating film of the exposed portion with a test imaging solution to form a pattern, a pattern forming method, characterized in that (1) the substrate is A step of applying a positive photosensitive coating composition as described in the above item 1 to form a positive photosensitive coating film, (2) a step of exposing the positive photosensitive coating film directly or via a pattern mask, (3) using Step of removing the coating film of the exposed part to form a pattern with an alkaline developing solution-8-1224718 (4) Step of engraving the exposed conductive film or metal plate with uranium, (5) Removing the photoresist coating film on the pattern step. 4. The pattern forming method according to item 2 or 3 above, wherein the photosensitive coating composition according to item 1 above is applied to a substrate or a metal plate having a conductive film by electrodeposition. (IV) Embodiment First, the positive-type photosensitive coating composition of the present invention will be described in detail. The positive-type photosensitive coating composition of the present invention is characterized in that, for 1,000 parts by weight of the positive-type photosensitive resin described above, In other words, at least one component selected from a phenol resin, a phenol derivative, and a catechol derivative (hereinafter simply referred to as a "phenol-based component") is blended i to 50 parts by weight. Next, each component constituting the positive photosensitive resin will be described. Positive-type photosensitive resin The positive-type photosensitive resin component contains a modified quinonediazide sulfaminamide represented by the general formula (1) in one molecule as a structural unit, and the structural unit contains 0.1 in 1 kg of resin. A positive photosensitive resin having a concentration of ~ 0.9 mol and containing 0.2 to 4.0 mol in the structural unit represented by the above-mentioned general formula (2) in 1 kg of resin. The photosensitivity of the tree β is not specifically limited, but in terms of photosensitivity, developability, coating workability, etc., it is a modified unit of acetic acid and azide diammine in 1 kg of resin solid content. The content is preferably from 0.1 to 0.9 moles, and more preferably from 0.2 to 0.5 moles. 9 ~ 1224718 In the modified quinonediazide sulfonamide photosensitive group represented by general formula (i), h is a monovalent organic group. R! Is a linear or branched alkyl group including methyl, ethyl, n-propyl, isopropyl, and the like. R! Is an aromatic hydrocarbon group including phenyl, tolyl, xylyl, and the like. R is an alicyclic hydrocarbon group including cyclohexyl and the like. The modified quinonediazide sulfonamide photosensitive group contains 0.1 mol to 0.9 mol, preferably 0.2 mol to 0.5 mol in 1 kg of resin. If the content is less than 0 ·! Mor, the performance of the photosensitivity and developability is not good, and if it is more than 0.9 Moore, the sensitivity decreases. In the structural unit represented by the general formula (2), R2 and R3 are monovalent organic groups. And R3 are, for example, the same as the above-mentioned R, a linear or branched alkyl group, an aromatic hydrocarbon group, and an alicyclic hydrocarbon group. The structural unit represented by the general formula (2) contains 0.2 to 4.0 moles, preferably 0.6 to 1.5 moles, in 1 kg of a positive photosensitive resin (solid content). If the content is less than 0.2 mol, the alkali solubility is not good, and if it is more than 4.0 mol, the resistance is poor. The positive-type photosensitive resin used in the present invention is not particularly limited as long as it has the above-mentioned constitution, and conventional materials can be used. The positive-type photosensitive resin contains, for example, a compound having a quinonediazide sulfonamide (hereinafter referred to as a photosensitive group) and an amine group and a carboxyl group (hereinafter referred to as an amino acid compound) in one molecule by the following steps (I ), (II), or (III) added to the resin. Step (I): (1) copolymerizing an unsaturated monomer radical containing an unsaturated monomer having a polymerizable vinyl group containing an isocyanate group. -1 0-1224718 (2) Then, a hydroxy-containing quinone diazide compound is added by a urethane reaction. (3) Then, the amino acid compound is produced by addition reaction with a urea reaction. Step (II): (1) Adding a hydroxy-containing quinone diazide compound through a urethanation reaction and adding an amino acid compound through a urea reaction to a polymerizable ethylene having an isocyanate group Unsaturated monomers of various groups form various functional monomers. (2) Then, a polymerizable unsaturated monomer containing the synthesized monomer (1) is copolymerized with a free radical to produce it. Step (III): (1) Adding an amino group-containing diazide compound via a urethane bond and adding an amino acid compound via a urea bond to a polymerizable polymer having an isocyanate group Vinyl unsaturated monomers form various functional monomers. (2) Then, the monomer having (1) obtained is copolymerized with an isocyanate group-containing polymerizable vinyl group monomer and other monomer free radicals as necessary. (3) Then, it is produced by adding an amino acid compound to a urea reaction. In addition, in order to react the hydroxyl group-containing diazide compound in the above-mentioned production steps (1) (2), react with an amino acid compound in the production steps (1) (3), or the production step (II) (1) The isocyanate group-containing vinyl monomer used in the reaction of a diazide compound and an amino acid compound containing a hydroxyl group, or a reaction with an amino acid compound in the manufacturing step (I 1 1) (2), such as the following Show. 1224718 general formula (3) CH2 di c; 7R4

、G—〇—CnH2n—NCO (其中,r4係爲氫原子或甲基,n係爲1〜8之整數) 所示單體,例如二異氰酸酯(甲基)丙烯酸乙酯等。 通式(4 ) 【化6】 /R5, G-0-CnH2n-NCO (wherein, r4 is a hydrogen atom or a methyl group, and n is an integer of 1 to 8), such as diisocyanate (ethyl methacrylate) and the like. Formula (4) [Chemical Formula 6] / R5

(其中,R5係爲氫原子或甲基,η係爲1〜8之整數,R6 係爲氫原子或碳數1〜5之直鏈或支鏈烷基,R6係爲與上述 相同的直鏈或支鏈烷基、適當選自於碳數1〜5者) 所示單體,例如m -丙烯基-α,α -二甲基苄基異氰酸酯 等。 通式(5 ) 【化7】(Wherein R5 is a hydrogen atom or a methyl group, η is an integer of 1 to 8, R6 is a hydrogen atom or a linear or branched alkyl group having 1 to 5 carbon atoms, and R6 is the same linear chain as above Or a branched alkyl group, suitably selected from monomers having 1 to 5 carbon atoms), such as m-propenyl-α, α-dimethylbenzyl isocyanate, and the like. General formula (5) [Chemical formula 7]

—〇一CnH2rv~0H 1224718 (其中,R?係爲氫原子或甲基,n係爲1〜8之擊數) 所示含羥基之(甲基)丙烯酸酯系單體1莫耳與二異气 酸酯化合物1莫耳反應所得的單體。 上述通式(5 )所示單體例如2 _羥乙基(甲基)丙烯酸酯 、2 -經丙基(甲基)丙烯酸酯、4 _羥丁基(甲基)丙烯酸酯等 〇 此外,二異氰酸酯化合物例如六伸甲基二異氰酸酯或 三甲基六伸甲基二異氰酸酯之脂肪族二異氰酸酯類;加氫 之伸二甲苯基二異氰酸酯或異佛爾酮二異氰酸酯之脂環狀 脂肪族一異氰酸酯類;伸甲苯基二異氰酸酯或4,4,-二苯 基甲院二異氰酸酯之芳香族二異氰酸類之有機二異氰酸酯 本身、或此等各有機二異氰酸酯與多元醇、與低分子量聚 酯樹脂或水等之加成物、或如上述之各有機二異氰酸酯間 之環化聚合物、以及異氰酸酯•縮二脲等。 於此等之中以具有2個反應性不同的異氰酸酯之伸甲 苯基二異氰酸酯、異佛爾酮二異氰酸酯、甲基環己烷、2,4 _ 二異氰酸酯、間伸二甲苯基二異氰酸酯、1,3 -二異氰酸酯 甲基環己烷等爲宜。 上述含異氰酸酯之乙烯基單體與含羥基之醌二麵氮化 合物之反應,例如於惰性有機溶劑中對1莫耳含異氰酸酯 之乙烯基單體而言以約1莫耳含羥基之醌二疊氮在窆溫、 80°C(較佳者爲60°C)下保持0.5〜20小時予以進行。該反 應藉由以紅外線光譜分析、測定在22 50 cm·1附近異氰酸酯 基之吸收,可以監視。此處所使用的溶劑可使用與輕氰酸 -13- !224718 醋基及羥基不反應的惰性有機溶劑,例如酮系、酯系、芳 香族系、脂肪族系、醚系等之溶劑。此等之溶劑於反應後 可取代醇系水性溶劑作爲脫溶劑。而且,上述含異氰酸酯 基之乙烯基單體與含羥基之醌二疊氮反應所得的單體化合 物可以與具有鹽形成性官能基之不飽和單體共聚合。 上述製造步驟(I ) ( 3 )、( I I ) ( 1 )、( I I I ) ( 3 )中使用的胺 基酸化合物例如下述通式(6 )所示者。 通式(6 ) 【化8】 NHR8—〇-CnH2rv ~ 0H 1224718 (where R? Is a hydrogen atom or a methyl group, and n is a stroke number of 1 to 8) The hydroxyl group-containing (meth) acrylate monomer 1 mole and diiso Monomer obtained from the moire reaction of the gas acid compound 1. The monomer represented by the general formula (5) is, for example, 2-hydroxyethyl (meth) acrylate, 2-transpropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, etc. Diisocyanate compounds such as aliphatic diisocyanates of hexamethylene diisocyanate or trimethylhexamethylene diisocyanate; alicyclic aliphatic monoisocyanates of hydrogenated xylenyl diisocyanate or isophorone diisocyanate Class; methylbenzene diisocyanate or 4,4, -diphenyl methyl diisocyanate aromatic diisocyanate organic diisocyanate itself, or each of these organic diisocyanates and polyols, and low molecular weight polyester resins Or adducts such as water, or cyclic polymers between the organic diisocyanates as described above, and isocyanates and biurets. Among these are tolyl diisocyanate, isophorone diisocyanate, methylcyclohexane, 2,4-diisocyanate, m-xylylene diisocyanate, 1, which have two isocyanates with different reactivity. 3-Diisocyanate methylcyclohexane and the like are preferred. The reaction of the isocyanate-containing vinyl monomer with a hydroxyl-containing quinone diside nitrogen compound is, for example, about 1 mole of hydroxyl-containing quinone diester for 1 mole of isocyanate-containing vinyl monomer in an inert organic solvent. Nitrogen is carried out at a temperature of 80 ° C (preferably 60 ° C) for 0.5 to 20 hours. This reaction can be monitored by infrared spectrum analysis and measurement of the absorption of isocyanate groups around 22 50 cm · 1. The solvent used here may be an inert organic solvent which does not react with cyanic acid -13-! 224718 acetic acid group and hydroxyl group, such as ketone-based, ester-based, aromatic-based, aliphatic-based, ether-based solvents. These solvents can replace alcohol-based aqueous solvents as desolvents after the reaction. Further, the monomer compound obtained by reacting the isocyanate group-containing vinyl monomer and the hydroxy group-containing quinonediazide may be copolymerized with an unsaturated monomer having a salt-forming functional group. Examples of the amino acid compound used in the production steps (I) (3), (I I) (1), and (I I I) (3) are shown by the following general formula (6). General formula (6) [Chemical formula 8] NHR8

(其中’ R8係爲氫原子、碳數1〜15(較佳者爲1〜5、 更佳者爲1 )、亦可爲支鏈之烷基、芳香族烴基、之環族烴 基,R 9係爲氫、碳數1〜1 5、亦可爲支鏈之烷基、或羥基 等。而且,胺基之取代基例如間位、鄰位或對位。r9係爲 適當選自於與上述R!相同的直鏈或支鏈烷基的碳數1〜i 5 者。此外’ Rs係爲適當選自於與上述Ri相同的直鏈或支鏈 烷基的碳數1〜1 5者、及芳香族烴基、脂環族烴基) 該物之具體例如對胺基苯甲酸、間甲基胺基苯甲酸等 〇 上述製造#驟(1)(1)中含有含異氰酸酯之單體的單體 一 1 4 一 1224718 共聚合反應,通常在惰性有機溶劑中使單體之 偶氮雙甲氧基丁腈、苯甲醯基過氧化物等之游 起始劑存在下,在約8 0〜1 5 0 °C下約反應1〜2 0 行。適當的有機溶劑具有溶解性、且限制於不 。作爲電沈積塗料使用時以親水性有機溶劑爲 溶劑例如二乙二醇二甲醚、二丙二醇二甲醚等 基乙酮、環己酮等之酮系、二甲基碳酸酯、二 、丙烯基碳酸酯等之碳酸酯系、N -甲基吡咯烷 於上述製造步驟(1)(2)中,與含異氰酸酯 的含羥基之醌二疊氮反應係在錫系觸媒存在下、 °C (較佳者爲約5 0〜8 0 °C )下持續進行約3 0分鐘 較佳者爲1〜2小時。 上述製法(1)(3)、(111)(3)中,與含異氰 反應的胺基酸化合物的反應約在2 0〜1 0 0 °C、較1 〜8 0 °C下持續進行反應約2〜1 0小時、較佳者負 〇 上述製法(11)(1)、(111)(1)中,含異氰酸 基單體與感光性基反應係在錫系觸媒存在、約 較佳者約爲50〜80°c)下、持續進行反應約30 時、較佳者爲1〜2小時。 於上述製法(II )( 1 )中,含異氰酸酯基之乙 胺基酸化合物反應係在錫系觸媒存在、約20〜 者爲約50〜80°C)下持續進行反應約30分鐘〜 混合物在有 離基聚合性 小時予以進 含活性氫者 宜。該有機 之醚系、甲 乙基碳酸酯 酮等之醯胺 之樹脂反應 約20〜1〇〇 〜3小時、 酸酯之樹脂 [圭者約爲4 0 ί 3〜4小時 酯基之乙烯 2 0 〜1 0 〇 °C ( 分鐘〜3小 烯基單體與 1 0 0 °C (較佳 3小時、較 -15- 1224718 佳者爲1〜2小時。 以上述製法所得的含羧基之感光性丙烯酸樹脂單體的 配合比例沒有特別的限制,對1公斤樹脂而言配合0 .1〜0,9 莫耳醌二疊基、且對1公斤樹脂而言配合0.2〜0.4莫耳竣 基。藉由該製法可得的含羧基之感光性丙烯酸樹脂的分子 量,以數平均分子量約爲1〇〇〇〜!〇〇,〇〇〇、較佳者爲3, 〇〇〇 〜50,000 〇 該樹脂之羧基濃度小於〇 · 2莫耳時,於顯像步驟中對 曝光部之顯像液而言溶解性不充分,無法形成映像。另外 ,一般而言不易使樹脂中和、溶解或分散於水中,無法製 得安定的電沈積塗料浴。而且,對1公斤樹脂而言大於4 . 〇 旲耳時’於顯像步驟中¥彳未曝光部之顯像液而言耐溶解性 降低、不充分,無法形成映像。而且,電沈積塗覆時塗覆 效率(庫倫回收量)容易降低,且所得的光阻膜表面上容易 產生水跡等之塗膜異常情形。 該樹脂之感光性濃度沒有特別的限制,就感光性、顯 像性、塗覆作業性而言對1公斤樹脂固體成分而言改性醌 —疊氮磺胺構造單位之含量爲0.1〜0.9莫耳、特別是0.2 〜0 · 5莫耳較佳。 酚系成分: 本發明所使用的酚系成分係爲提高對未曝光部塗膜之 顯像液而言耐溶解性使用,即抑制對顯像液之耐溶解性的 添加劑,在不會降低感度下可形成映像形成性優異的圖案 -16- 1224718 酚系成分之酚樹脂例如聚乙烯基酚、乙烯基酚與其他 丙烯酸單體之共聚物、酚醛淸漆樹脂等。該酚樹脂以在i 公斤樹脂中含有4〜9 . 4莫耳酚性羥基較佳。 此外,酚衍生物、及兒茶酚衍生物可使用習知者,特 別是如 4,4,,5 -三羥基-2,3,,5,-三甲基二苯基甲烷之 2核體酉分類、2,6 -雙(2,4 -二經基苯甲基)-4 -甲基酉分、雙 [4 -羥基- 3- (4 -羥基-2-甲基苯甲基)-5 -甲基苯基]甲烷、雙 [4 -羥基- 3- (2 -羥基-5-甲基苯甲基)-5 -甲基苯基]甲烷、雙 [4 -羥基- 3- (2,4 -二羥基苯甲基)-5 -甲基苯基]甲烷之直鏈 狀酚類、雙(4,5 -二羥基-2-甲基苯基)苯基甲烷、雙(4,5- 二羥基-2 -甲基苯基)-3,4 -二羥基苯基甲烷之放射狀酚類 〇 酚系成分之分子量以數平均分子量約爲500〜100,000 、較佳者爲1,〇〇〇〜20,000。 酚系成分之添加量對1 00重量份正型感光性樹脂而言 以1〜5 0重量份較佳。若小於1重量份時未曝光部之顯像 液溶解性不充分,無法製得良好的圖案形成性。若大於50 重量份時酚系成分之遮光效果大、光阻膜之光透過性降低 、成爲曝光部殘膜之原因,且感度降低。 本發明之正型感光性塗料組成物可藉由配合上述正型 感光性樹脂及酚系成分製造,視其所需可配合增感劑、染 料、溶劑、中和劑、塡充劑、及其他添加劑等。 而且,本發明之正型感光性塗料組成物,可使用作爲 在上述正型感光性樹脂及酚系成分之配合物中配合正型感 455 1224718 光性樹脂用鹼性中和劑,且分散於水中之水性正型感光性 塗料組成物。而且,該物可使用作爲陰離子電沈積用正型 感光性塗料組成物。 該中和劑例如單乙醇胺、二乙醇胺、三乙醇胺等之鏈 烷醇胺類;單乙胺、二乙胺、三乙胺、三甲胺、二異丁胺 等之烷胺類;二甲基胺基乙醇胺等烷基鏈烷醇胺類;環己 胺等之脂環族胺類;苛性鈉、苛性鉀等之鹼金屬氫氧化物 ;銨等,此等可單獨使用或作爲混合物使用。 於本發明中爲更提高水溶化、或水分散化的電沈積塗 料之流動性時可加入親水性溶劑,例如異丙醇、正丁醇、 第3-丁醇、甲氧基乙醇、乙氧基乙醇、丁氧基乙醇、乙二 醇二甲醚、二乙二醇、甲醚、二噚烷、四氫呋喃等。此等 之親水性溶劑對1 00重量份電沈積塗料組成物而言通常可 使用100重量份以下。而且,爲使被塗物之塗覆量增多時 可加入疏水性溶劑、例如甲苯、二甲苯等之石油系溶劑; 甲基乙酮、甲基異丁酮等之酮類;醋酸乙酯、醋酸丁酯等 之酯類;2 -乙基己醇、苯甲醇等之疏水性醇類;乙二醇二 丁醚、二乙二醇二丁醚、丙二醇苯醚等之疏水性醚類等。 此等疏水性溶劑之使用量對丨〇 〇重量份電沈積塗料組成物 之固體成分而言通常爲30重量份以下。 另視其所需配合除上述外之樹脂,可適當調整電沈積 塗料、另可添加染料或顔料等。 本發明之正型感光性塗料組成物可使用於習知之用途 ,例如微影術關係之用途。 - 18- 1224718 其次’說明有關本發明之圖案形成方法。 本發明之圖案形成方法,其特徵爲包含 (1 )在基板上塗覆如上述之正型感光性塗料組成物,形成 正型感光性塗膜之步驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步驟 (3 )以驗性顯像液除去曝光部之塗膜以形成圖案的步驟。 而且’亦包含一種圖案形成方法,其特徵爲 (1 )在基板上塗覆如上述之正型感光性塗料組成物,形成 正型感光性塗膜之步驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步驟 (3 )以鹼性顯像液除去曝光部之塗膜以形成圖案的步驟, (4 )使曝光的導電性被膜或金屬板表面蝕刻的步驟, (5 )除去圖案上之光阻塗膜的步驟。 於上述(1 )之步驟中基板例如貼銅之積層板(印刷電路 基板等)等之具有導電性皮膜的基板等。 而且,塗覆例如可藉由電沈積塗覆、輥塗覆、噴霧塗 覆、簾幕塗覆、浸漬塗覆等予以塗覆。 上述電沈積塗覆係藉由以印刷配線基板作爲陽極浸漬 於電沈積塗覆浴中(浴固體成分濃度:3〜3 0重量% )中,最 高外加電壓20〜400V下直流電流通電進行。通電時間爲30 秒〜5分鐘。電沈積塗覆後,自電沈積浴引取被塗物予以 水洗後,使電沈積塗膜中所含的水分以熱風等除去。 -19- 1224718 正型感光性塗料組成物之塗覆膜厚在乾燥膜厚爲1〜 100 μΐΏ、較佳者爲3〜20 μΐΏ。上述電沈積塗覆外之塗覆方法 ’亦可以塗覆後使塗面以熱風等乾燥,除去溶劑、水等以 形成塗膜。 上述(2 )步驟係在以(1 )步驟所形成的正型感光性塗膜 面上直接或經由圖案光罩(照片正型)照射可視光線、紫外 線等之活性光線予以曝光。曝光所使用的活性光線爲具有 3 00〜450nm波長之光線。此等光源例如太陽光、水銀燈、 氣氣燈、電弧燈等。活性光線之照射通常爲50〜8〇〇m〗cm-2 ’於本發明中爲減低感光性基濃度時在3〇〜3〇〇mjcm·2之 範圍內進行。 上述(3)步驟之顯像處理通常藉由在塗膜面上噴上稀鹼 水’洗淨塗膜之感光部分予以進行。稀鹼水通常可使用與 pH値8〜1 2之苛性鈉、苛性鉀、矽酸鈉、碳酸鈉、銨水等 塗膜中具有的游離羧酸中和,可賦予水溶性之習知者。 於上述(4 )步驟中藉由顯像處理露出基板上之銅箔部分 (非電路部分)再藉由例如使用三氯化鐵水溶液等一般蝕刻 處理予以除去。然後,電路圖案上未曝光部分藉由乙基溶 纖劑、乙基溶纖劑乙酸酯等之溶纖劑系溶劑;甲苯、二甲 苯等芳香族烴系溶劑;甲基乙酮、甲基異丁酮等之酮系溶 劑;醋酸乙酯、醋酸丁酯等之醋酸酯系溶劑;三氯乙烷等 之氯系溶劑,或使用陰離子性電沈積塗料時,可藉由pH値 1 1以上之苛性鈉水溶液、苛性鉀水溶液等予以溶解除去, 在基板上形成印刷電路。 -20- 1224718 【發明之效果】 本發明之正型感光性塗料組成物,可在由該物所形成 的正型感光性塗膜面上藉由照射可視光線、紫外線等之活 性光線照射曝光,經曝光的部分之萘醌二疊氮化合物,由 於經由乙烯酮形成羧酸,可藉由鹼水溶液等之顯像液顯像 處理予以除去’另外藉由未曝光部之萘醌二疊氮部分形成 所配合的酚系成分與氫鍵、可維持其構造,且對鹼顯像液 具有耐溶解性。結果,藉由步驟(丨)〜(3 )所形成的光阻劑 可發揮形成微細的高解像度圖案之顯著效果。 【實施例】 於下述中藉由實施例等更具體地說明本發明。「份」 及「%」以重量爲基準。本發明不受此等所限制。 有關下述化學物質使用下述簡稱。此等之內容如下所 述。 IEM :異氰基乙基甲基丙烯酸酯 DNFDG :二丙二醇二甲醚 ADVN : 2,2’-偶氮雙(2,4 -二甲基戊腈) NAU-8 : 1,2-萘醌-2-二疊氮-5-磺酸甲基(2-羥 基乙基)醯胺(東洋合成股份有限公司製) NMP : N -甲基-2-比咯烷酮 DBTDL :二丁基錫二月桂酸酯 PABA :對胺基苯甲酸 正型感光性樹脂之製造 製造例1 -21- 1224718 在氮氣氣流下、在4 口燒瓶中加入3 3 5份DMFDG且予 以攪拌,昇溫至11 71後,在3小時內滴入 苯乙烯 6 0份 甲基丙烯酸甲酯 1 5 0份 正丁基丙烯酸酯 1 1 5份 正丁基甲基丙烯酸酯 3 3份 異氰基乙基甲基丙烯酸酯1 42份 ADVN 17 份 之混合物,然後在3小時內滴入45份ADVN、1 80份DMFDG 之混合物,保持1小時。使溫度降至6 0 °C後,加入8 5份NAU - 8 、125 份 DMFDG、130 份 NMP 並攪拌 1 小時,加入 500PPM DBTDL 且另攪拌1小時。然後,加入85份PABA、70份DMFDG、1 5 份NMP並攪拌4小時,製得樹脂固體成分52%、加德納黏 度Z3Z4之正型感光性樹脂溶液。所得樹脂之酸價(K0Hmg/g 、以下相同)爲5 1、DNQ濃度(二偶氮萘醌莫耳濃度、以下 相冋)爲0.40吴耳/公斤、數平均分子量爲20700。 製造例2 在氮氣氣流下、在4 口燒瓶中加入3 3 5份DMFDG且予 以攪拌,昇溫至1 1 7 °C後,在3小時內滴入 苯乙烯 6〇份 甲基丙烯酸甲酯 150份 正丁基丙烯酸酯 1 15份 正丁基甲基丙烯酸酯 40份 異氰基乙基甲基丙燒酸酯 135份 ADVN 17份 1224718 之混合物,然後在3小時內滴入45份ADVN、1 80份DMFDG 之混合物,保持1小時。使溫度降至6 0 °C後,加入7 4份N A U - 8 、1 1 6 份 DMFDG、1 28 份 NMP 並攪拌 1 小時,加入 5 00PPM DBTDL 且另攪拌1小時。然後,加入85份PABA、70份DMFDG、1 5 份NMP並攪拌4小時,製得樹脂固體成分5 1 %、加德納黏 度Z4之正型感光性樹脂溶液。所得樹脂之酸價爲5 2、DNQ 濃度爲0.35莫耳/公斤、數平均分子量爲22000。 製造例3 在氮氣氣流下、在4 口燒瓶中加入3 3 5份DMFDG且予 以攪拌,昇溫至1 1 7 °C後,在3小時內滴入 苯乙燃 60份 甲基丙烯酸甲酯 150份 正丁基丙烯酸酯 1 1 5份 正丁基甲基丙烯酸酯 4 8份 異氰基乙基甲基丙烯酸酯 127份 ADVN 25 份 之混合物,然後在3小時內滴入45份ADVN、1 80份DMFDG 之混合物,保持1小時。使溫度降至6 0 °C後,加入6 0份NAU - 8 、125 份 DMFDG、130 份 NMP 並攪拌 1 小時,加入 5 00PPM DBTDL 且另攪拌1小時。然後,加入85份PABA、70份DMFDG、1 5 份NMP並攪拌4小時,製得樹脂固體成分5 1 %、加德納黏 度Z3之正型感光性樹脂溶液。所得樹脂之酸價爲5 1、DNQ _度爲0.30莫耳/公斤、數平均分子量爲19000。 製造例4 -23 - 1224718 在氮氣氣流下、在4 口燒瓶中加入3 3 5份DMFDG且予 以攪拌,昇溫至1 1 7 °C後,在3小時內滴入 苯乙烯 6 0份 甲基丙烯酸甲酯 1 5 0份 正丁基丙烯酸酯 1 1 5份 正丁基甲基丙烯酸酯 2 5份 異氰基乙基甲基丙烯酸酯 1 50份 ADVN 17 份 之混合物,然後在3小時內滴入45份ADVN、1 80份DMFDG 之混合物,保持1小時。使溫度降至60 °C後,加入85份NAU-8 、1 25 份 DMFDG、1 30 份 NMP 並攪拌 1 小時,加入 5 00PPM DBTDL 且另攪拌1小時。然後,加入85份PABA、70份DMFDG、1 5 份NMP並攪拌4小時,製得樹脂固體成分50%、加德納黏 度Z3之正型感光性樹脂溶液。所得樹脂之酸價爲49、DNQ 濃度爲0.45莫耳/公斤、數平均分子量爲21000。 實施例1 對1 0 0重量份(固體成分)製造例1所示正型感光性樹 脂而言混合2 . 5重量份重量平均分子量4000、羥基價 (KOHmg/g)ll〇之酚酚醛樹脂,加入對羧基而言ο."當量 MDEA予以中和後,加入脫離子水使固體成分爲丨〇%,製得 貫施例1之電沈積塗料溶液。 實施例2〜1 0 與實施例1相同地,以表1所示配合比各製得實施例 2〜1 0之電沈積塗覆溶液。 實施例1 1 1224718 使製造例1所示正型感光性樹脂以表1所示配合比配 合酚樹脂,製得實施例π之液狀光阻劑。 比較例1 在製造例1所示正型感光性樹脂中加入對羧基而言 〇 . 40當量MDEA予以中和後,加入脫離子水使固體成分爲1 〇% ,製成電沈積塗覆溶液。 比較例2 對1 00重量份製造例1所示正型感光性樹脂而言混合 60重量份重量平均分子量4000、羥基價(KOHmg/g)110之 酚酚醛樹脂,加入羧基而言0.35當量MDEA予以中和後, 加入脫離子水使固體成分爲1 0%,製成電沈積塗覆溶液。 實施例1 2 對10 0重量份(固體成分)製造例1所示正型感光性樹 脂而言混合固體成分5 . 0重量份兒茶酚衍生物溶液33%雙(4 ,5-二羥基-2-甲基苯基)苯基甲烷/DMFDG,加入對羧基而 言0 . 40當量之MDEA予以中和後,加入脫離子水使固體成 分爲1 0%,製得實施例1 2之電沈積塗覆溶液。 實施例1 3〜2 1 與實施例1 2相同地以表2所示配合比,各製得實施例 1 3〜2 1之電沈積塗覆溶液。 比較例3 以表2所示之配合比,製得各比較例3之電沈積塗覆 溶液。 試驗結果 - 25- 1224718 使印刷電線用鋼張積層板浸漬於實施例1〜10、12〜21 所示電沈積塗覆溶液作爲陽極,在浴溫35°c下使500Am_2 之直流電流通電6 5秒予以電沈積塗覆。使塗膜水洗、在 9 (TC下乾燥10分鐘以形成厚度8μηι之不具黏合性、平滑的 感光膜。 以實施例1 1所視光阻液塗覆於印刷配線用鋼張積層板 ,在90°C下乾燥10分鐘以形成厚度8μπι之不具黏合性、 平滑的感光膜。 然後,使正型薄膜以真空裝置密接於該塗面上,使用 1 Okw之超高壓水銀燈,兩面各照射300(Ηιώ - 2。其次,使曝 光部以1 %碳酸鈉水溶液洗出以進行顯像,水洗後以三氯化 鐵水溶液使銅箔蝕刻處理予以除去,然後藉由使未曝光部 以5 %氫氧化鈉水溶液除去,製得圖案。此等之評估如表丄 之結果。(Wherein 'R8 is a hydrogen atom, carbon number 1 to 15 (preferably 1 to 5, more preferably 1), branched alkyl group, aromatic hydrocarbon group, cyclic hydrocarbon group, R 9 It is hydrogen, a carbon number of 1 to 15, or a branched alkyl group, or a hydroxyl group, etc. In addition, the substituent of the amine group is, for example, meta, ortho or para. R9 is appropriately selected from the above R! The number of carbon atoms of the same linear or branched alkyl group is 1 to i 5. In addition, 'Rs is appropriately selected from the number of carbon atoms of 1 to 15 the same linear or branched alkyl group as the above Ri, And aromatic hydrocarbon group, alicyclic hydrocarbon group) Specific examples of the substance include, for example, p-aminobenzoic acid, m-methylaminobenzoic acid, etc. The above-mentioned production #Step (1) (1) A monomer containing an isocyanate-containing monomer One 1 4 one 1224718 copolymerization reaction, usually in the presence of a monomer starting agent such as azobismethoxybutyronitrile, benzamyl peroxide, etc. in an inert organic solvent, at about 80 ~ 1 The reaction takes about 1-20 rows at 50 ° C. Appropriate organic solvents are soluble and are not limited. When used as an electrodeposition coating, a hydrophilic organic solvent is used as the solvent, for example, ethyl ketones such as diethylene glycol dimethyl ether, dipropylene glycol dimethyl ether, and ketones such as cyclohexanone, dimethyl carbonate, di, and propenyl. Carbonate and other carbonate-based, N-methylpyrrolidine are reacted with isocyanate-containing hydroxyl-containing quinonediazide in the presence of tin-based catalyst in the production steps (1) (2) above, ° C ( It is preferably performed at about 50 to 80 ° C. for about 30 minutes, and more preferably 1 to 2 hours. In the above production methods (1), (3) and (111) (3), the reaction with the isocyanate-containing amino acid compound is continued at about 20 to 100 ° C, which is more than 1 to 80 ° C. The reaction takes about 2 to 10 hours, preferably negative. In the above production methods (11) (1), (111) (1), the reaction between the isocyanate-containing monomer and the photosensitive group is in the presence of a tin-based catalyst, It is preferably about 50 to 80 ° C), and the reaction is continued for about 30 hours, and preferably about 1 to 2 hours. In the above-mentioned production method (II) (1), the reaction of the ethylamino acid compound containing an isocyanate group is continued in the presence of a tin-based catalyst (about 20 to about 50 to 80 ° C) for about 30 minutes to the mixture It is advisable to add active hydrogen when the radical polymerizability is small. The organic ether type, methylamine ketone, and other resins such as ammonium amines have a reaction time of about 20 to 100 to 3 hours, and the resins of the acid esters are about 40 to 3-4 to 4 hours. ~ 100 ° C (minutes ~ 3 small alkenyl monomers and 100 ° C (preferably 3 hours, -15-1224718 is better) 1 ~ 2 hours. The carboxyl group-containing photosensitivity obtained by the above method The blending ratio of the acrylic resin monomer is not particularly limited. For 1 kg of the resin, 0.1 to 0,9 molquinone diester, and for 1 kg of the resin, 0.2 to 0.4 mol. The molecular weight of the carboxyl group-containing photosensitive acrylic resin obtainable by this production method is a number-average molecular weight of about 10,000 to 100,000, preferably 3,000 to 50,000. When the carboxyl group concentration of the resin is less than 0.2 mol, the developing solution in the exposed portion is insufficiently soluble in the developing step and cannot form an image. In addition, it is generally difficult to neutralize, dissolve or disperse the resin in the developing step. In water, a stable electrodeposition coating bath cannot be made. Moreover, it is larger than 4.0 ohms for 1 kg of resin. 'In the developing step, the developing solution of the unexposed part has poor solubility resistance, is insufficient, and cannot form an image. In addition, the coating efficiency (coulomb recovery amount) is easily reduced during electrodeposition coating, and the obtained The photoresist film surface is prone to abnormal coating films such as water marks. The photosensitive concentration of this resin is not particularly limited. In terms of photosensitivity, developability, and coating workability, it is improved for 1 kg of resin solid content. The content of the structural unit of the quinone-azidesulfonamide is preferably 0.1 to 0.9 mol, especially 0.2 to 0.5 mol. Phenol-based component: The phenol-based component used in the present invention is to improve the coating film on the unexposed part. The developer is used for the solubility resistance of the developing solution, that is, an additive that suppresses the solubility of the developing solution, and can form a pattern with excellent image formation without reducing sensitivity. -16-1224718 A phenolic resin such as polyphenol Vinyl phenol, copolymers of vinyl phenol and other acrylic monomers, phenolic lacquer resin, etc. The phenol resin preferably contains 4 to 9.4 mole phenolic hydroxyl groups in 1 kg of resin. In addition, phenol derivatives Catechol-derived The substance can be used by a person skilled in the art, in particular, such as a 4,2,5-trihydroxy-2,3,5, -trimethyldiphenylmethane 2-nucleus tritium classification, 2,6-bis (2, 4-Dioxetylbenzyl) -4 -methylamidine, bis [4-hydroxy-3-(4-hydroxy-2-methylbenzyl) -5 -methylphenyl] methane, bis [ 4-hydroxy-3- (2-hydroxy-5-methylbenzyl) -5 -methylphenyl] methane, bis [4-hydroxy-3 (2,4-dihydroxybenzyl) -5 -Methylphenyl] linear phenols of methane, bis (4,5-dihydroxy-2-methylphenyl) phenylmethane, bis (4,5-dihydroxy-2-methylphenyl) The molecular weight of the radial phenolic phenol-based component of -3,4-dihydroxyphenylmethane is about 500 to 100,000, and more preferably 1,000 to 20,000. The addition amount of the phenol-based component is preferably 1 to 50 parts by weight based on 100 parts by weight of the positive photosensitive resin. If it is less than 1 part by weight, the solubility of the developer in the unexposed portion is insufficient, and good pattern formation properties cannot be obtained. If it is more than 50 parts by weight, the light-shielding effect of the phenolic component is large, the light transmittance of the photoresist film is reduced, it is the cause of the residual film in the exposed portion, and the sensitivity is reduced. The positive-type photosensitive coating composition of the present invention can be manufactured by blending the above-mentioned positive-type photosensitive resin and phenol-based component, and can be compounded with a sensitizer, a dye, a solvent, a neutralizing agent, an extender, and others as needed. Additives, etc. In addition, the positive photosensitive coating composition of the present invention can be used as a basic neutralizing agent for a positive resin 455 1224718 photosensitive resin, and dispersed in a mixture of the positive photosensitive resin and a phenol-based component, and dispersed in Water-based positive photosensitive coating composition in water. This material can be used as a positive photosensitive coating composition for anion electrodeposition. The neutralizing agent is, for example, alkanolamines such as monoethanolamine, diethanolamine, and triethanolamine; alkylamines such as monoethylamine, diethylamine, triethylamine, trimethylamine, and diisobutylamine; dimethylamine Alkyl alkanolamines such as ethanolamine; cycloaliphatic amines such as cyclohexylamine; alkali metal hydroxides such as caustic soda and caustic potassium; ammonium and the like, which can be used alone or as a mixture. In the present invention, in order to improve the fluidity of water-solubilized or water-dispersible electrodeposition coatings, a hydrophilic solvent may be added, such as isopropanol, n-butanol, 3-butanol, methoxyethanol, and ethoxylate. Ethyl alcohol, butoxy ethanol, ethylene glycol dimethyl ether, diethylene glycol, methyl ether, dioxane, tetrahydrofuran and the like. These hydrophilic solvents are usually used in an amount of 100 parts by weight or less for 100 parts by weight of the electrodeposition coating composition. In addition, in order to increase the coating amount of the coating object, a hydrophobic solvent such as toluene, xylene and other petroleum solvents can be added; ketones such as methyl ethyl ketone and methyl isobutyl ketone; ethyl acetate and acetic acid Esters such as butyl ester; hydrophobic alcohols such as 2-ethylhexanol, benzyl alcohol; and hydrophobic ethers such as ethylene glycol dibutyl ether, diethylene glycol dibutyl ether, and propylene glycol phenyl ether. The use amount of these hydrophobic solvents is usually 30 parts by weight or less based on the solid content of the electrodeposition coating composition. Depending on the resins required in addition to the above, the electrodeposition coating can be adjusted appropriately, and dyes or pigments can be added. The positive photosensitive coating composition of the present invention can be used for conventional applications, such as lithography applications. -18- 1224718 Next, the pattern forming method of the present invention will be described. The pattern forming method of the present invention is characterized by including (1) a step of applying a positive-type photosensitive coating composition as described above on a substrate to form a positive-type photosensitive coating film, and (2) directly or through a pattern mask. The step (3) of exposing the positive photosensitive coating film to a pattern by removing the coating film of the exposed portion with a diagnostic developer. And 'also includes a pattern forming method, which is characterized by (1) a step of applying a positive photosensitive coating composition as described above on a substrate to form a positive photosensitive coating film, and (2) directly or through a patterned photomask The step of exposing the positive photosensitive coating film (3) a step of removing the coating film of the exposed portion with an alkaline developer to form a pattern, (4) a step of etching the surface of the exposed conductive film or metal plate, (5) Step of removing the photoresist coating film on the pattern. In the step (1), the substrate is, for example, a substrate having a conductive film such as a copper-clad laminated board (printed circuit board, etc.). The coating can be applied by, for example, electrodeposition coating, roll coating, spray coating, curtain coating, dip coating, or the like. The above electrodeposition coating is performed by immersing a printed wiring board as an anode in an electrodeposition coating bath (bath solid content concentration: 3 to 30% by weight), and energizing with a direct current at a maximum applied voltage of 20 to 400V. The power-on time is 30 seconds to 5 minutes. After the electrodeposition coating, the object to be coated is drawn from the electrodeposition bath and washed with water, and then the water contained in the electrodeposition coating film is removed by hot air or the like. -19- 1224718 The coating film thickness of the positive photosensitive coating composition is 1 to 100 μΐΏ, preferably 3 to 20 μΐΏ in dry film thickness. The coating method other than the above-mentioned electrodeposition coating may be followed by drying the coated surface with hot air or the like, and removing the solvent and water to form a coating film. The above step (2) is to expose active light rays such as visible light and ultraviolet rays directly or through a patterned mask (photo positive type) on the surface of the positive-type photosensitive coating film formed in step (1) for exposure. The active light used for the exposure is light having a wavelength of 300 to 450 nm. Such light sources are, for example, sunlight, mercury lamps, gas lamps, arc lamps, and the like. Irradiation of active light is usually 50 to 800 m 2 cm-2 'in the present invention to reduce the concentration of the photosensitive group within the range of 30 to 300 mjcm · 2. The developing process in the above step (3) is usually performed by spraying dilute alkali water 'on the coating film surface to clean the photosensitive portion of the coating film. Dilute alkaline water can usually be neutralized with caustic soda, caustic potassium, sodium silicate, sodium carbonate, ammonium water and other free carboxylic acids in the coating film with pH 値 8 ~ 12, which can impart water solubility to those skilled in the art. In the step (4) above, the copper foil portion (non-circuit portion) on the substrate is exposed by the development process and then removed by a general etching process such as using an aqueous ferric chloride solution. Then, the unexposed portion of the circuit pattern is made of a cellosolve solvent such as ethyl cellosolve, ethylcellosolve acetate; aromatic hydrocarbon solvents such as toluene and xylene; methyl ethyl ketone, methyl Ketone-based solvents such as isobutyl ketone; acetate-based solvents such as ethyl acetate and butyl acetate; chlorine-based solvents such as trichloroethane, or when using anionic electrodeposition coatings, pH ≥ 1 1 or higher A caustic soda aqueous solution, a caustic potassium aqueous solution, etc. are dissolved and removed to form a printed circuit on a substrate. -20- 1224718 [Effect of the invention] The positive-type photosensitive coating composition of the present invention can be exposed to active light such as visible light and ultraviolet rays on the positive-type photosensitive coating film surface formed by the object. The exposed naphthoquinonediazide compound can form a carboxylic acid through ketene, and can be removed by developing solution such as an aqueous alkali solution. In addition, it is formed by the naphthoquinonediazide portion of the unexposed part. The compounded phenolic component is hydrogen-bonded, maintains its structure, and has solubility resistance to an alkali developing solution. As a result, the photoresist formed in steps (丨) to (3) can exert a remarkable effect of forming a fine high-resolution pattern. [Examples] The present invention will be described more specifically with examples and the like in the following. "Parts" and "%" are based on weight. The invention is not limited by these. The following abbreviations are used for the following chemical substances. These are described below. IEM: isocyanoethyl methacrylate DNDDG: dipropylene glycol dimethyl ether ADVN: 2,2'-azobis (2,4-dimethylvaleronitrile) NAU-8: 1,2-naphthoquinone- 2-Diazide-5-sulfonic acid methyl (2-hydroxyethyl) amidamine (manufactured by Toyo Sangyo Co., Ltd.) NMP: N-methyl-2-pyrrolidone DBTDL: dibutyltin dilaurate PABA: Production of p-aminobenzoic acid positive-type photosensitive resin Manufacturing Example 1 -21-1224718 Add 3 3 5 parts of DFDDG to a 4-necked flask under a nitrogen gas stream and stir, and raise the temperature to 11 71 after 3 hours 60 parts of styrene 60 parts of methyl methacrylate 150 parts of n-butyl acrylate 1 15 parts of n-butyl methacrylate 3 3 parts of isocyanoethyl methacrylate 1 42 parts of ADVN The mixture was then added dropwise with a mixture of 45 parts of ADVN and 180 parts of DFDDG over 3 hours and held for 1 hour. After reducing the temperature to 60 ° C, add 85 parts of NAU-8, 125 parts of DMFDG, 130 parts of NMP and stir for 1 hour, add 500PPM DBTDL and stir for another hour. Then, 85 parts of PABA, 70 parts of DFDDG, and 15 parts of NMP were added and stirred for 4 hours to prepare a positive-type photosensitive resin solution having a resin solid content of 52% and a Gardner viscosity of Z3Z4. The acid value (K0Hmg / g, the same below) of the obtained resin was 51. The DNQ concentration (diazonaphthoquinone mole concentration, below) was 0.40 ng / kg, and the number average molecular weight was 20,700. Production Example 2 In a 4-necked flask, 3, 3 and 5 parts of DFDDG were added and stirred under a nitrogen gas flow, and the temperature was raised to 17 ° C. Then, 60 parts of styrene and 150 parts of methyl methacrylate were added dropwise within 3 hours. N-butyl acrylate 1 15 parts n-butyl methacrylate 40 parts isocyanoethyl methyl propionate 135 parts ADVN 17 parts 1224718 A mixture, then 45 parts ADVN, 180 parts DFMDG are added dropwise within 3 hours The mixture was held for 1 hour. After reducing the temperature to 60 ° C, add 74 parts of N A U-8, 116 parts of DMFDG, 1 28 parts of NMP and stir for 1 hour, add 5 00PPM DBTDL and stir for another hour. Then, 85 parts of PABA, 70 parts of DFDDG, and 15 parts of NMP were added and stirred for 4 hours to prepare a positive-type photosensitive resin solution having a resin solid content of 51% and Gardner viscosity Z4. The acid value of the obtained resin was 5 2. The DNQ concentration was 0.35 mol / kg and the number average molecular weight was 22,000. Production Example 3 In a 4-necked flask, 3, 3 and 5 parts of DFMDG were added and stirred under a nitrogen gas flow, and the temperature was raised to 17 ° C. Then, 60 parts of styrene and 150 parts of methyl methacrylate were added dropwise within 3 hours. N-butyl acrylate 1 1 5 parts n-butyl methacrylate 4 8 parts isocyanoethyl methacrylate 127 parts ADVN 25 parts mixture, then 45 parts ADVN, 1 80 parts DMFDG are added dropwise within 3 hours The mixture was held for 1 hour. After reducing the temperature to 60 ° C, add 60 parts of NAU-8, 125 parts of DMFDG, 130 parts of NMP and stir for 1 hour, add 500PPM DBTDL and stir for another hour. Then, 85 parts of PABA, 70 parts of DFDDG, and 15 parts of NMP were added and stirred for 4 hours to prepare a positive-type photosensitive resin solution having a resin solid content of 51% and Gardner viscosity Z3. The obtained resin had an acid value of 51, a DNQ degree of 0.30 mol / kg, and a number average molecular weight of 19,000. Production Example 4 -23-1224718 Add 3 3 5 parts of DFDDG to a 4-necked flask under a stream of nitrogen and stir. After raising the temperature to 1 17 ° C, 60 parts of styrene methacrylic acid was added dropwise within 3 hours. Methyl ester 150 parts of n-butyl acrylate 1 15 parts of n-butyl methacrylate 2 5 parts of isocyanoethyl methacrylate 1 50 parts of ADVN 17 parts of the mixture, and then 45 parts are added dropwise within 3 hours Mixture of ADVN, 180 parts of DFDDG, hold for 1 hour. After reducing the temperature to 60 ° C, add 85 parts of NAU-8, 1 25 parts of DMFDG, 1 30 parts of NMP and stir for 1 hour, add 5 00PPM DBTDL and stir for another hour. Then, 85 parts of PABA, 70 parts of DFDDG, and 15 parts of NMP were added and stirred for 4 hours to prepare a positive-type photosensitive resin solution having a resin solid content of 50% and a Gardner viscosity Z3. The obtained resin had an acid value of 49, a DNQ concentration of 0.45 mol / kg, and a number average molecular weight of 21,000. Example 1 For 100 parts by weight (solid content) of the positive photosensitive resin shown in Production Example 1, 2.5 parts by weight of a phenol novolac resin having a weight average molecular weight of 4000 and a hydroxyl value (KOHmg / g) of 110 were mixed. After adding the equivalent of MDEA to the carboxyl group for neutralization, deionized water was added to make the solid content be 0% to prepare the electrodeposition coating solution of Example 1. Examples 2 to 10 In the same manner as in Example 1, the electrodeposition coating solutions of Examples 2 to 10 were prepared at the mixing ratios shown in Table 1, respectively. Example 1 1 1224718 The positive-type photosensitive resin shown in Production Example 1 was mixed with a phenol resin at the compounding ratio shown in Table 1 to prepare a liquid photoresist of Example π. Comparative Example 1 After adding 40 equivalents of MDEA to the positive photosensitive resin shown in Production Example 1 to neutralize the carboxyl group, deionized water was added to make the solid content 10% to prepare an electrodeposition coating solution. Comparative Example 2 For 100 parts by weight of the positive photosensitive resin shown in Production Example 1, 60 parts by weight of a phenol novolac resin having an average molecular weight of 4000 and a hydroxyl value (KOHmg / g) of 110 were mixed, and 0.35 equivalents of MDEA was added to the carboxyl group. After neutralization, deionized water was added so that the solid content was 10% to prepare an electrodeposition coating solution. Example 1 2 For 100 parts by weight (solid content) of the positive-type photosensitive resin shown in Production Example 1, 5.0 parts by weight of a catechol derivative solution 33% bis (4,5-dihydroxy- 2-methylphenyl) phenylmethane / DMFDG, after adding 0.440 equivalents of MDEA to the carboxyl group to neutralize it, deionized water was added to make the solid content 10%, and the electrodeposition of Example 12 was obtained. Coating solution. Examples 1 to 2 1 were prepared in the same manner as in Example 12 at the compounding ratios shown in Table 2 to prepare electrodeposition coating solutions of Examples 1 to 3 to 21. Comparative Example 3 An electrodeposition coating solution of each Comparative Example 3 was prepared at the compounding ratio shown in Table 2. Test results-25- 1224718 The steel laminate for printed wires was immersed in the electrodeposition coating solution shown in Examples 1 to 10 and 12 to 21 as an anode, and a direct current of 500 Am_2 was energized at a bath temperature of 35 ° C 6 5 Electrodeposition was applied in seconds. The coating film was washed with water and dried at 9 ° C. for 10 minutes to form a non-adhesive, smooth photosensitive film with a thickness of 8 μm. The photoresist liquid observed in Example 11 was applied to a steel laminate for printing and wiring at 90 ° C. Dry at 10 ° C for 10 minutes to form a non-adhesive, smooth photosensitive film with a thickness of 8 μm. Then, make a positive film tightly adhere to the coating surface with a vacuum device, and use an ultra-high pressure mercury lamp of 1 Okw, irradiate 300 on each side -2. Next, the exposed portion was washed out with a 1% sodium carbonate aqueous solution for development, and after washing with water, the copper foil was etched with an aqueous solution of ferric chloride to remove the unexposed portion by 5% sodium hydroxide. The aqueous solution was removed to produce a pattern. These evaluations are as shown in Table 丄.

- 2 6 - 4 Μ 1224718 表1 配合量(固體成分比) 評估結果 感光ΰ 三樹脂 酚樹脂* 製造例1 製造例2 製造例3 製造例4 A B C D 感度 畫線形成性 實施例 1 100.0 2.5 〇 〇 2 100.0 2.5 〇 〇 3 100.0 2.5 〇 〇 4 100.0 2.5 〇 〇 5 100.0 2.5 〇 〇 6 100.0 2.5 〇 〇 7 100.0 2.5 〇 〇 8 100.0 5.0 〇 〇 9 100.0 7.5 〇 〇 10 100.0 10.2 〇 〇 11 100.0 2.5 〇 〇 比較例 1 100.0 〇 X 2 100.0 60.0 X 〇-2 6-4 Μ 1224718 Table 1 Compounding amount (solid content ratio) Evaluation results Photosensitive ΰ Tri-resin phenol resin * Manufacturing Example 1 Manufacturing Example 2 Manufacturing Example 3 Manufacturing Example 4 ABCD Sensitivity Line Forming Example 1 100.0 2.5 〇〇 2 100.0 2.5 〇〇3 100.0 2.5 〇〇4 100.0 2.5 〇〇5 100.0 2.5 〇〇6 100.0 2.5 〇〇10 10 2.5 Comparative Example 1 100.0 〇 X 2 100.0 60.0 X 〇

*酚樹脂 重量平均分子量 羥基價(KOHmg/g) A :酚淸漆樹脂 4000 110 B :甲酚酚醛淸漆樹脂 8800 120 (甲基對混合物) C :聚乙烯基酚樹脂 4200 460 D :聚乙烯基酚 4800 230 共聚合樹脂(苯乙烯共聚合)* Phenol resin weight average molecular weight hydroxyl value (KOHmg / g) A: Phenol resin lacquer 4000 4000 B: Cresol novolac resin 8800 120 (Methyl para-mixture) C: Polyvinyl phenol resin 4200 460 D: Polyethylene 4800 230 copolymer resin (styrene copolymerization)

27 1224718 表2 _ 配合量(固體成分比) 評估結果 感光性樹脂 酚樹 脂* 製造例1 製造例2 製造例3 製造例4 A B C D 感度 畫線形成性 實施例 12 100.0 5.0 〇 〇 13 100.0 5.0 〇 〇 14 100.0 5.0 〇 〇 15 100.0 5.0 〇 〇 16 100.0 5.0 〇 〇 17 100.0 一 5.0 〇 〇 18 100.0 5.0 〇 〇 19 100.0 2.5 〇 〇 20 100.0 10.0 〇 〇 21 100.0 5.0 〇 〇 比較例 3 100.0 60.0 X 〇27 1224718 Table 2 _ Compounding amount (solid content ratio) Evaluation results Photosensitive resin phenol resin * Manufacturing Example 1 Manufacturing Example 2 Manufacturing Example 3 Manufacturing Example 4 ABCD Sensitivity Line Forming Example 12 100.0 5.0 〇〇13 100.0 5.0 〇〇 14 100.0 5.0 〇〇15 100.0 5.0 〇〇16 100.0 5.0 〇〇17 100.0-5.0 〇〇18 100.0 5.0 〇〇19 100.0 2.5 〇20 100.0 10.0 〇〇21 100.0 5.0 〇〇 Comparative Example 3 100.0 60.0 X 〇

*酚樹脂 A:雙(4,5-二羥基-2-甲基苯基)苯基甲烷* Phenol resin A: bis (4,5-dihydroxy-2-methylphenyl) phenylmethane

• 4,4,5、三羥基_2,3,,三甲基二苯基甲烷 C·雙(4 -羥基_3-(2 -羥基-2-甲基苯甲基)-5 -甲基苯基)甲烷 D •雙(4 -羥基·3-(4 -羥基-2-甲基苯甲基)-5 -甲基苯基)甲烷 評估結果 感度··使史頓法(譯音)製分級薄片(2 1段)重疊於塗膜 上’曝光後顯像,以其段數評估。感度佳者爲〇、感度不 佳者爲X。 畫線形成性:使用線與空間圖案薄膜,曝光後顯像、 畫線狀態以光學及SEM觀察。畫線形成性佳者爲〇、不佳 -28- 1224718 者爲χ。 另外,使該電沈積塗覆浴在30°C下進行儲藏促進試驗 1個月後,觀察塗覆浴之外觀變化。結果,塗覆浴完全沒 有樹脂成分沉澱、凝聚等異常情形、係良好。另外,使用 進行該儲藏促進試驗之塗覆浴,乙與上述相同的方法作成 印刷電路板。結果,於實施例1〜1 0、1 2〜2 1中,與初期 相同、可得良好、鮮明圖案之印刷電路板。 (五)圖式簡單說明:無• 4,4,5, trihydroxy_2,3,, trimethyldiphenylmethane C · bis (4-hydroxy_3- (2-hydroxy-2-methylbenzyl) -5-methyl Phenyl) methane D • Bis (4-hydroxy · 3- (4-hydroxy-2-methylbenzyl) -5 -methylphenyl) methane Evaluation Results Sensitivity ·· Stone system classification Sheets (21 segments) were superimposed on the coating film and developed after exposure. The number of segments was evaluated. The sensitivity is 0, and the sensitivity is X. Formability of line drawing: Use line and space pattern film, visualize after exposure, draw line state by optical and SEM observation. Line drawing is good for 0, poor -28-1224718 is χ. In addition, the electrodeposition coating bath was subjected to a storage promotion test at 30 ° C. for one month, and then the appearance change of the coating bath was observed. As a result, the coating bath was completely free from abnormalities such as precipitation and agglomeration of resin components, and the coating system was good. A printed circuit board was prepared in the same manner as described above by using the coating bath subjected to the storage promotion test. As a result, in Examples 1 to 10 and 12 to 21, printed circuit boards having a good pattern and a good pattern were obtained in the same manner as in the initial stage. (V) Schematic description: None

-29--29-

Claims (1)

1224718 拾、申請專利範圍 第92 1 07685號「正型感光性塗料組成物、正型感光性樹脂之 製法及圖案形成方法」專利案 (93 t 4月1日‘修正丨本) 1 . 一種正型感光性塗料組成物,其特徵爲相對於1 0¾ 份 之正型感光性樹脂而言,配合1〜50重量份選自於酚樹 月旨、酚衍生物及兒茶酚衍生物之酚成分,其中在該正型 感光性樹脂一分子中含有下述通式(1 )所示改性醌二疊氮 基磺醯胺爲構造單位、使該構造單位在1公斤樹脂中含 有0.1〜0.9莫耳之濃度,且在1公斤樹脂中含有〇.2〜 4.0莫耳濃度之下述通式(2)所示構造單位, 【化1】 Q1224718, patent application range 92 1 07685 "Positive photosensitive coating composition, manufacturing method and pattern forming method of positive photosensitive resin" patent case (93 t April 1 'revised' version) 1. A positive Type photosensitive coating composition, characterized in that 1 to 50 parts by weight of a positive type photosensitive resin is blended with 1 to 50 parts by weight of a phenol component selected from the group consisting of a phenol tree, a phenol derivative, and a catechol derivative. Wherein, one molecule of the positive photosensitive resin contains a modified quinonediazidosulfonamide as a structural unit, and the structural unit contains 0.1 to 0.9 moles in 1 kg of resin. Concentration of the ear and a structural unit represented by the following general formula (2) at a concentration of 0.2 to 4.0 moles in 1 kg of resin, [化 1] Q (其中,Rl係表示氫原子、直鏈或支鏈Ci6烷基、C6-8 芳香族烴基、或c3_6脂環族烴基) 【化2】 R3—N(Wherein R1 represents a hydrogen atom, a linear or branched Ci6 alkyl group, a C6-8 aromatic hydrocarbon group, or a c3-6 alicyclic hydrocarbon group) [Chemical Formula 2] R3—N 1224718 (其中,I、I係各表示氫原子、直鏈或支鏈6烷基 f 、芳香族烴基、或c3 6脂環族烴基)^ 2 · —種圖案形成方法,其特徵爲包含 (1 )在基板上塗覆如申請專利範圍第1項之正型感光性塗 料組成物,形成正型感光性塗膜之步驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步驟 (3 )以鹼性顯像液除去曝光部之塗膜以形成圖案的步驟。 . 3·—種圖案形成方法,其特徵爲 φ (1 )在導電性被膜或金屬板上塗覆如申請專利範圍第1項 之正型感光性塗料組成物,形成正型感光性塗膜之步 驟, (2 )直接或經由圖案光罩使該正型感光性塗膜曝光的步驟 (3 )以鹼性顯像液除去曝光部之塗膜以形成圖案的步驟, (4 )使曝光的導電性被膜或金屬板表面蝕刻的步驟, (5 )除去圖案上之光阻塗膜的步驟。 φ 4 .如申請專利範圍第2或3項之圖案形成方法,其中使如 申請專利範圍第1項之感光性塗料組成物藉由電沈積塗 覆於具有導電性皮膜之基板或金屬板上。 5 . —種正型感光性樹脂之製法,其特徵爲 ^ 依序由下述步驟所成: 步驟(I ):依序包括 ①使包括具有含異氰酸酯基之聚合性乙烯基的不飽和 -2- 1224718 性單體的不飽和單體混合物,在自由基聚合起始劑存在 下自由基共聚合的步驟、②使含經基之酿二疊氮化合物 在錫系觸媒存在下’藉由胺甲酸酯化反應加成的步驟、 以及③使胺基酸化合物於2 0〜1 〇 〇 °C之溫度下以尿素化反 應加成的步驟; 步驟(I I ):依序包括 ①對具有含異氰酸酯基之聚合性乙烯基的不飽和單體 在各個錫系觸媒存在下反應,藉由胺甲酸酯鍵結加成含 羥基之醌二疊氮化合物、藉由尿素鍵結加成胺基酸化合 物而形成各官能性單體、②含所得單體之聚合性不飽和 單體混合物在自由基聚合起始劑存在下,自由基共聚合 的步驟;或 步驟(I I I ):依序包括 ①對具有含異氰酸酯基之聚合性乙烯基的不飽和單體 在錫系觸媒存在下反應,藉由胺甲酸酯鍵結加成含羥基 之醌二疊氮化合物而形成官能性單體,②含有所得之單 體與含異氰酸酯基之聚合性乙烯基的單體,及視需要的 其他聚合性不飽和單體,在自由基起始劑存在下自由基 共聚合,③使胺基酸化合物在錫系觸媒存在下以尿素化 反應加成的步驟。1224718 (wherein I and I each represent a hydrogen atom, a linear or branched 6-alkyl f group, an aromatic hydrocarbon group, or a c3 6 cycloaliphatic hydrocarbon group) ^ 2 A pattern forming method including (1 ) Coating the substrate with a positive photosensitive coating composition as described in the first patent application to form a positive photosensitive coating film, (2) exposing the positive photosensitive coating film directly or via a pattern mask Step (3) A step of removing a coating film of the exposed portion with an alkaline developing solution to form a pattern. 3. A pattern forming method, characterized in that φ (1) a step of applying a positive-type photosensitive coating composition such as item 1 of the scope of patent application on a conductive film or metal plate to form a positive-type photosensitive coating film (2) the step of exposing the positive photosensitive coating film directly or via a pattern mask (3) the step of removing the coating film of the exposed portion with an alkaline developer to form a pattern, and (4) the conductive conductivity of the exposure (5) a step of removing the photoresist coating film on the pattern. φ 4. The pattern forming method according to the second or third item of the patent application, wherein the photosensitive coating composition as the first item of the patent application is applied to a substrate or a metal plate having a conductive film by electrodeposition. 5. A method for producing a positive-type photosensitive resin, characterized in that ^ is sequentially formed by the following steps: Step (I): sequentially includes ① making unsaturated unsaturated polymerizable vinyl groups having a polymerizable vinyl group containing an isocyanate group-2 -Unsaturated monomer mixture of 1224718 monomer, the step of radical copolymerization in the presence of a radical polymerization initiator, ② the radical-containing diazide compound in the presence of a tin catalyst 'through amine The formate formation reaction addition step, and ③ the amino acid compound is added at a temperature of 20 to 100 ° C with a urea formation reaction addition step; step (II): sequentially including ① Isocyanate-based polymerizable vinyl unsaturated monomers react in the presence of various tin-based catalysts to add hydroxy-containing quinone diazide compounds through urethane bonding and amine groups through urea bonding. An acid compound to form each functional monomer, ② a step of radical copolymerization of a polymerizable unsaturated monomer mixture containing the obtained monomer in the presence of a radical polymerization initiator; or step (III): sequentially including ① For polymers with isocyanate groups Unsaturated vinyl monomers react in the presence of tin-based catalysts to form functional monomers through the addition of urethane bonds to hydroxy-containing quinone diazide compounds. ② The obtained monomers and Isocyanate-based polymerizable vinyl monomers and other polymerizable unsaturated monomers, if necessary, are radically copolymerized in the presence of a radical initiator. ③ The amino acid compound is reacted in the presence of a tin-based catalyst. Step of urea addition reaction.
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JP2006162668A (en) * 2004-12-02 2006-06-22 Daicel Chem Ind Ltd Resist composition
JP4806988B2 (en) * 2005-07-26 2011-11-02 Jnc株式会社 Varnish composition
JP5576024B2 (en) * 2008-02-28 2014-08-20 富士フイルム株式会社 Photoresist liquid and etching method using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI395055B (en) * 2005-06-16 2013-05-01 Jsr Corp Radiation sensitive composition, method of forming a color filter using said composition, color filter and color liquid crystal display panel

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